X5329S8IZ-4.5A [RENESAS]
CPU Supervisor with 32Kbit SPI EEPROM; SOIC8; Temp Range: See Datasheet;型号: | X5329S8IZ-4.5A |
厂家: | RENESAS TECHNOLOGY CORP |
描述: | CPU Supervisor with 32Kbit SPI EEPROM; SOIC8; Temp Range: See Datasheet 可编程只读存储器 电动程控只读存储器 电可擦编程只读存储器 光电二极管 |
文件: | 总21页 (文件大小:818K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
DATASHEET
X5328, X5329 (Replaces X25328, X25329)
CPU Supervisor with 32Kbit SPI EEPROM
FN8132
Rev 2.00
October 16, 2015
FEATURES
DESCRIPTION
• Low V detection and reset assertion
—Five standard reset threshold voltages
These devices combine three popular functions, Power-
on Reset Control, Supply Voltage Supervision, and Block
Lock Protect Serial EEPROM Memory in one package.
This combination lowers system cost, reduces board
space requirements, and increases reliability.
CC
—Re-program low V reset threshold voltage
CC
using special programming sequence
—Reset signal valid to V = 1V
CC
• Long battery life with low power consumption
—<1µA max standby current
—<400µA max active current during read
• 32Kbits of EEPROM
Applying power to the device activates the power-on
reset circuit which holds RESET/RESET active for a
period of time. This allows the power supply and oscilla-
tor to stabilize before the processor can execute code.
• Built-in inadvertent write protection
—Power-up/power-down protection circuitry
—Protect 0, 1/4, 1/2 or all of EEPROM array with
The device’s low V
detection circuitry protects the
CC
user’s system from low voltage conditions by holding
RESET/RESET active when V falls below a mini-
™
Block Lock protection
CC
—In circuit programmable ROM mode
• 2MHz SPI interface modes (0,0 & 1,1)
• Minimize EEPROM programming time
—32-byte page write mode
mum V trip point. RESET/RESET remains asserted
CC
until V
returns to proper operating level and stabi-
CC
lizes. Five industry standard V
thresholds are
TRIP
available, however, Intersil’s unique circuits allow the
threshold to be reprogrammed to meet custom
requirements or to fine-tune the threshold in applica-
tions requiring higher precision.
—Self-timed write cycle
—5ms write cycle time (typical)
• 2.7V to 5.5V and 4.5V to 5.5V power supply
operation
• Available packages
—14 Ld TSSOP, 8 Ld SOIC, 8 Ld PDIP
• Pb-free plus anneal available (RoHS compliant)
BLOCK DIAGRAM
WP
Protect Logic
SI
Data
Status
Register
Register
SO
Command
Decode &
Control
SCK
CS
8Kbits
8Kbits
Logic
16Kbits
Reset
Timebase
RESET/RESET
Power-on and
Low Voltage
Reset
VCC
+
-
Generation
X5328 = RESET
X5329 = RESET
VTRIP
FN8132 Rev 2.00
October 16, 2015
Page 1 of 21
X5328, X5329 (Replaces X25328, X25329)
Ordering Information
VCC RANGE
(V)
VTRIP
RANGE
TEMP
PACKAGE
PART NUMBER
PART MARKING
RANGE (°C) (RoHS Compliant)
RESET ACTIVE LOW
X5328PZ-4.5A (Note) (No longer available, recommended X5328P Z AL
4.5-5.5
4.5-4.75
0 to 70
8 Ld PDIP
replacement: X5328S8Z-4.5A)
X5328PIZ-4.5A (Note) (No longer available, recommended X5328P Z AM
-40 to 85 8 Ld PDIP
replacement: X5328S8IZ-4.5A)
X5328S8Z-4.5A (Note)
X5328S8IZ-4.5A (Note)
X5328V14Z-4.5A (Note)
X5328 Z AL
X5328 Z AM
X5328V Z AL
X5328P Z
0 to 70
8 Ld SOIC
-40 to 85 8 Ld SOIC
0 to 70
0 to 70
14 Ld TSSOP
8 Ld PDIP
X5328PZ (Note) (No longer available, recommended
replacement: X5328S8Z)
4.5-5.5
2.7-5.5
2.7-5.5
4.25-4.5
2.85-3.0
2.55-2.7
X5328PIZ (Note) (No longer available, recommended
replacement: X5328S8IZ)
X5328P Z I
-40 to 85 8 Ld PDIP
X5328S8Z* (Note)
X5328S8IZ* (Note)
X5328 Z
0 to 70
-40 to 85 8 Ld SOIC
0 to 70 8 Ld PDIP
8 Ld SOIC
X5328 Z I
X5328PZ-2.7A (Note) (No longer available, recommended X5328P Z AN
replacement: X5328S8Z-2.7A)
X5328PIZ-2.7A (Note) (No longer available, recommended X5328P Z AP
replacement: X5328S8IZ-2.7A)
-40 to 85 8 Ld PDIP
X5328S8Z-2.7A (Note)
X5328S8IZ-2.7A (Note)
X5328 Z AN
X5328 Z AP
X5328P Z F
0 to 70
-40 to 85 8 Ld SOIC
0 to 70 8 Ld PDIP
8 Ld SOIC
X5328PZ-2.7 (Note) (No longer available, recommended
replacement: X5328S8Z-2.7)
X5328PIZ-2.7 (Note) (No longer available, recommended
X5328P Z G
-40 to 85 8 Ld PDIP
replacement: X5328S8IZ-2.7)
X5328S8Z-2.7* (Note)
X5328S8IZ-2.7* (Note)
RESET ACTIVE HIGH
X5329S8Z-4.5A (Note)
X5329S8IZ-4.5A (Note)
X5329V14Z-4.5A (Note)
X5329S8Z* (Note)
X5328 Z F
X5328 Z G
0 to 70
8 Ld SOIC
-40 to 85 8 Ld SOIC
X5329 Z AL
X5329 Z AM
X5329V Z AL
X5329 Z
4.5-5.5
4.5-4.75
0 to 70
8 Ld SOIC
-40 to 85 8 Ld SOIC
0 to 70
0 to 70
14 Ld TSSOP
8 Ld SOIC
4.5-5.5
2.7-5.5
4.25-4.5
2.85-3.0
X5329S8IZ* (Note)
X5329 Z I
-40 to 85 8 Ld SOIC
0 to 70 8 Ld SOIC
-40 to 85 8 Ld SOIC
X5329S8Z-2.7A (Note)
X5329 Z AN
X5329S8IZ-2.7A (Note) (No longer available, recommended X5329 Z AP
replacement: X5329S8Z-2.7A)
X5329S8Z-2.7* (Note)
X5329 Z F
2.7-5.5
2.55-2.7
0 to 70
8 Ld SOIC
X5329S8IZ-2.7* (Note) (No longer available, recommended X5329 Z G
-40 to 85 8 Ld SOIC
replacement: X5329S8Z-2.7)
*Add “T1” suffix for tape and reel.
NOTE: Intersil Pb-free plus anneal products employ special Pb-free material sets; molding compounds/die attach materials and 100% matte tin
plate termination finish, which are RoHS compliant and compatible with both SnPb and Pb-free soldering operations. Intersil Pb-free products are
MSL classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC J STD-020.
FN8132 Rev 2.00
October 16, 2015
Page 2 of 21
X5328, X5329 (Replaces X25328, X25329)
PIN DESCRIPTION
Pin
(SOIC/PDIP)
Pin TS-
SOP
Name
Function
1
1
CS
Chip Select Input. CS HIGH, deselects the device and the SO output pin is at a
high impedance state. Unless a nonvolatile write cycle is underway, the device will
be in the standby power mode. CS LOW enables the device, placing it in the ac-
tive power mode. Prior to the start of any operation after power-up, a HIGH to
LOW transition on CS is required.
2
5
2
8
SO
SI
Serial Output. SO is a push/pull serial data output pin. A read cycle shifts data out
on this pin. The falling edge of the serial clock (SCK) clocks the data out.
Serial Input. SI is a serial data input pin. Input all opcodes, byte addresses, and
memory data on this pin. The rising edge of the serial clock (SCK) latches the input
data. Send all opcodes (Table 1), addresses and data MSB first.
6
3
9
6
SCK
WP
Serial Clock. The Serial Clock controls the serial bus timing for data input and out-
put. The rising edge of SCK latches in the opcode, address, or data bits present on
the SI pin. The falling edge of SCK changes the data output on the SO pin.
Write Protect. The WP pin works in conjunction with a nonvolatile WPEN bit to
“lock” the setting of the Watchdog Timer control and the memory write protect bits.
4
8
7
7
VSS
VCC
Ground
14
13
Supply Voltage
RESET/ Reset Output. RESET/RESET is an active LOW/HIGH, open drain output which
RESET
goes active whenever VCC falls below the minimum VCC sense level. It will remain
active until VCC rises above the minimum VCC sense level for 200ms. RESET/RE-
SET goes active on power-up at about 1V and remains active for 200ms after the
power supply stabilizes.
3-5,10-12
NC
No internal connections
PIN CONFIGURATION
14 Ld TSSOP
8 Ld SOIC/PDIP
1
2
3
4
5
6
7
14
13
12
11
10
9
VCC
CS
SO
NC
RESET/RESET
VCC
1
2
3
4
8
7
6
5
CS
SO
NC
NC
NC
SCK
SI
RESET/RESET
NC
NC
X5328/29
X5328/29
WP
SCK
SI
VCC
WP
VSS
8
FN8132 Rev 2.00
October 16, 2015
Page 3 of 21
X5328, X5329 (Replaces X25328, X25329)
PRINCIPLES OF OPERATION
Power-On Reset
Figure 1. Set V
Voltage
TRIP
CS
VP
Application of power to the X5328/X5329 activates a
Power-on Reset Circuit. This circuit goes active at about
1V and pulls the RESET/RESET pin active. This signal
prevents the system microprocessor from starting to
operate with insufficient voltage or prior to stabilization of
SCK
VP
the oscillator. When V
exceeds the device V
CC
TRIP
SI
value for 200ms (nominal) the circuit releases
RESET/RESET, allowing the processor to begin execut-
ing code.
Resetting the V
Voltage
TRIP
Low Voltage Monitoring
This procedure sets the V
to a “native” voltage level.
TRIP
For example, if the current V
is 4.4V and the V
is
During operation, the X5328/X5329 monitors the V
TRIP
TRIP
CC
reset, the new V
is something less than 1.7V. This
level and asserts RESET/RESET if supply voltage falls
TRIP
procedure must be used to set the voltage to a lower
value.
below a preset minimum V
. The RESET/RESET sig-
TRIP
nal prevents the microprocessor from operating in a
power fail or brownout condition. The RESET/RESET
signal remains active until the voltage drops below 1V. It
To reset the V
voltage, apply a voltage between 2.7
TRIP
and 5.5V to the V pin. Tie the CS pin, the WP pin, and
CC
also remains active until V returns and exceeds V
CC
TRIP
the SCK pin HIGH. RESET/RESET and SO pins are left
for 200ms.
unconnected. Then apply the programming voltage V
P
to the SI pin ONLY and pulse CS LOW then HIGH.
Remove V and the sequence is complete.
V
Threshold Reset Procedure
CC
P
The X5328/X5329 has a standard V threshold (V
)
CC
TRIP
voltage. This value will not change over normal operat-
ing and storage conditions. However, in applications
Figure 2. Reset V
Voltage
TRIP
where the standard V
is not exactly right, or for
TRIP
higher precision in the V
threshold may be adjusted.
value, the X5328/X5329
TRIP
CS
VCC
Setting the V Voltage
TRIP
SCK
This procedure sets the V
to a higher voltage value.
TRIP
For example, if the current V
is 4.4V and the new
VP
TRIP
V
is 4.6V, this procedure directly makes the change.
TRIP
SI
If the new setting is lower than the current setting, then it
is necessary to reset the trip point before setting the new
value.
To set the new V
voltage, apply the desired V
TRIP
TRIP
threshold to the V pin and tie the CS pin and the WP
CC
pin HIGH. RESET/RESET and SO pins are left uncon-
nected. Then apply the programming voltage V to both
P
SCK and SI and pulse CS LOW then HIGH. Remove V
and the sequence is complete.
P
FN8132 Rev 2.00
October 16, 2015
Page 4 of 21
X5328, X5329 (Replaces X25328, X25329)
Figure 3. V Programming Sequence Flow Chart
TRIP
VTRIP Programming
Execute
Reset VTRIP
Sequence
Set VCC = VCC Applied =
Desired VTRIP
Execute
Set VTRIP
Sequence
New VCC Applied =
Old VCC Applied + Error
New VCC Applied =
Old VCC Applied - Error
Execute
Reset VTRIP
Sequence
Apply 5V to VCC
Decrement VCC
(VCC = VCC - 10mV)
NO
RESET pin
goes active?
YES
Error Emax
Error > Emax
Measured VTRIP
Desired VTRIP
-
Error < Emax
DONE
Emax = Maximum Desired Error
Figure 4. Sample V
Reset Circuit
TRIP
VP
4.7K
NC
NC
4.7K
RESET
1
2
3
4
8
7
6
5
NC
X5328/29
VTRIP
Adj.
+
Program
Reset VTRIP
Test VTRIP
Set VTRIP
10K
10K
FN8132 Rev 2.00
October 16, 2015
Page 5 of 21
X5328, X5329 (Replaces X25328, X25329)
SPI SERIAL MEMORY
Write Enable Latch
The device contains a Write Enable Latch. This latch
must be SET before a Write Operation is initiated. The
WREN instruction will set the latch and the WRDI
instruction will reset the latch (Figure 3). This latch is
automatically reset upon a power-up condition and after
the completion of a valid Write Cycle.
The memory portion of the device is a CMOS Serial
EEPROM array with Intersil’s block lock protection. The
array is internally organized as x 8. The device features a
Serial Peripheral Interface (SPI) and software protocol
allowing operation on a simple four-wire bus.
™
The device utilizes Intersil’s proprietary Direct Write
cell, providing a minimum endurance of 100,000 cycles
and a minimum data retention of 100 years.
Status Register
The RDSR instruction provides access to the Status
Register. The Status Register may be read at any time,
even during a Write Cycle. The Status Register is for-
matted as follows:
The device is designed to interface directly with the syn-
chronous Serial Peripheral Interface (SPI) of many pop-
ular microcontroller families. It contains an 8-bit
instruction register that is accessed via the SI input, with
data being clocked in on the rising edge of SCK. CS
must be LOW during the entire operation.
7
6
5
4
3
2
1
0
WPEN FLB
1*
1* BL1 BL0 WEL WIP
*Bits (5,4) should be written as ‘1’ only.
All instructions (Table 1), addresses and data are trans-
ferred MSB first. Data input on the SI line is latched on
the first rising edge of SCK after CS goes LOW. Data is
output on the SO line by the falling edge of SCK. SCK is
static, allowing the user to stop the clock and then start it
again to resume operations where left off.
The Write-In-Progress (WIP) bit is a volatile, read only
bit and indicates whether the device is busy with an
internal nonvolatile write operation. The WIP bit is read
using the RDSR instruction. When set to a “1”, a nonvol-
atile write operation is in progress. When set to a “0”, no
write is in progress.
Table 1. Instruction Set
Instruction Name Instruction Format*
Operation
WREN
SFLB
0000 0110
0000 0000
0000 0100
0000 0101
0000 0001
0000 0011
0000 0010
Set the Write Enable Latch (Enable Write Operations)
Set Flag Bit
WRDI/RFLB
RSDR
Reset the Write Enable Latch/Reset Flag Bit
Read Status Register
WRSR
Write Status Register (Block Lock, WPEN & Flag Bits)
Read Data from Memory Array Beginning at Selected Address
Write Data to Memory Array Beginning at Selected Address
READ
WRITE
Note: *Instructions are shown MSB in leftmost position. Instructions are transferred MSB first.
Table 2. Block Protect Matrix
WREN CMD Status Register Device Pin
Block
Block
Status Register
WPEN, BL0, BL1,
WD0, WD1
WEL
WPEN
WP#
Protected Block
Protected
Unprotected Block
Protected
0
1
1
1
X
1
0
X
X
0
X
1
Protected
Protected
Writable
Writable
Protected
Writable
Protected
Writable
Protected
Writable
FN8132 Rev 2.00
October 16, 2015
Page 6 of 21
X5328, X5329 (Replaces X25328, X25329)
The Write Enable Latch (WEL) bit indicates the Status of
the Write Enable Latch. When WEL = 1, the latch is set
HIGH and when WEL = 0 the latch is reset LOW. The
WEL bit is a volatile, read only bit. It can be set by the
WREN instruction and can be reset by the WRDS
instruction.
In Circuit Programmable ROM Mode
This mechanism protects the block lock and Watchdog
bits from inadvertent corruption.
In the locked state (Programmable ROM Mode) the WP pin
is LOW and the nonvolatile bit WPEN is “1”. This mode
disables nonvolatile writes to the device’s Status Register.
The block lock bits, BL0 and BL1, set the level of block
lock protection. These nonvolatile bits are programmed
using the WRSR instruction and allow the user to protect
one quarter, one half, all or none of the EEPROM array.
Any portion of the array that is block lock protected can
be read but not written. It will remain protected until the
BL bits are altered to disable block lock protection of that
portion of memory.
Setting the WP pin LOW while WPEN is a “1” while an
internal write cycle to the Status Register is in progress
will not stop this write operation, but the operation dis-
ables subsequent write attempts to the Status Register.
When WP is HIGH, all functions, including nonvolatile
writes to the Status Register operate normally.
Setting the WPEN bit in the Status Register to “0” blocks
the WP pin function, allowing writes to the Status Register
when WP is HIGH or LOW. Setting the WPEN bit to “1”
while the WP pin is LOW activates the Programmable
ROM mode, thus requiring a change in the WP pin prior to
subsequent Status Register changes. This allows manu-
facturing to install the device in a system with WP pin
grounded and still be able to program the Status Register.
Manufacturing can then load Configuration data, manu-
facturing time and other parameters into the EEPROM,
then set the portion of memory to be protected by setting
the block lock bits, and finally set the “OTP mode” by set-
ting the WPEN bit. Data changes now require a hardware
change.
Status Register Bits Array Addresses Protected
BL1
BL0
X5328/X5329
None
0
0
1
1
0
1
0
1
$0C00-$0FFF
$0800-$0FFF
$0000-$0FFF
The FLAG bit shows the status of a volatile latch that can
be set and reset by the system using the SFLB and RFLB
instructions. The Flag bit is automatically reset upon
power-up.
The nonvolatile WPEN bit is programmed using the
WRSR instruction. This bit works in conjunction with the
WP pin to provide an In-Circuit Programmable ROM func-
tion (Table 2). WP is LOW and WPEN bit programmed
HIGH disables all Status Register Write Operations.
Figure 5. Read EEPROM Array Sequence
CS
0
1
2
3
4
5
6
7
8
9
10
20 21 22 23 24 25 26 27 28 29 30
SCK
SI
Instruction
16 Bit Address
15 14 13
3
2
1
0
Data Out
High Impedance
7
6
5
4
3
2
1
0
SO
MSB
FN8132 Rev 2.00
October 16, 2015
Page 7 of 21
X5328, X5329 (Replaces X25328, X25329)
Read Sequence
For the Page Write Operation (byte or page write) to be
completed, CS can only be brought HIGH after bit 0 of
the last data byte to be written is clocked in. If it is
brought HIGH at any other time, the write operation will
not be completed (Figure 4).
When reading from the EEPROM memory array, CS is
first pulled low to select the device. The 8-bit READ
instruction is transmitted to the device, followed by the
16-bit address. After the READ opcode and address are
sent, the data stored in the memory at the selected
address is shifted out on the SO line. The data stored in
memory at the next address can be read sequentially by
continuing to provide clock pulses. The address is auto-
matically incremented to the next higher address after
each byte of data is shifted out. When the highest
address is reached, the address counter rolls over to
address $0000 allowing the read cycle to be continued
indefinitely. The read operation is terminated by taking
CS high. Refer to the Read EEPROM Array Sequence
(Figure 1).
To write to the Status Register, the WRSR instruction is
followed by the data to be written (Figure 5). Data bits 0
and 1 must be “0”.
While the write is in progress following a Status Register
or EEPROM Sequence, the Status Register may be
read to check the WIP bit. During this time the WIP bit
will be high.
OPERATIONAL NOTES
The device powers-up in the following state:
– The device is in the low power standby state.
To read the Status Register, the CS line is first pulled low
to select the device followed by the 8-bit RDSR instruc-
tion. After the RDSR opcode is sent, the contents of the
Status Register are shifted out on the SO line. Refer to
the Read Status Register Sequence (Figure 2).
– A HIGH to LOW transition on CS is required to enter
an active state and receive an instruction.
– SO pin is high impedance.
– The Write Enable Latch is reset.
– The Flag Bit is reset.
Write Sequence
Prior to any attempt to write data into the device, the
“Write Enable” Latch (WEL) must first be set by issuing
the WREN instruction (Figure 3). CS is first taken LOW,
then the WREN instruction is clocked into the device.
After all eight bits of the instruction are transmitted, CS
must then be taken HIGH. If the user continues the Write
Operation without taking CS HIGH after issuing the
WREN instruction, the Write Operation will be ignored.
– Reset Signal is active for t
.
PURST
Data Protection
The following circuitry has been included to prevent
inadvertent writes:
– A WREN instruction must be issued to set the Write
Enable Latch.
To write data to the EEPROM memory array, the user
then issues the WRITE instruction followed by the 16-bit
address and then the data to be written. Any unused
address bits are specified to be “0’s”. The WRITE opera-
tion minimally takes 32 clocks. CS must go low and
remain low for the duration of the operation. If the
address counter reaches the end of a page and the
clock continues, the counter will roll back to the first
address of the page and overwrite any data that may
have been previously written.
– CS must come HIGH at the proper clock count in order
to start a nonvolatile write cycle.
FN8132 Rev 2.00
October 16, 2015
Page 8 of 21
X5328, X5329 (Replaces X25328, X25329)
Figure 6. Read Status Register Sequence
CS
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14
SCK
Instruction
SI
Data Out
High Impedance
SO
7
6
5
4
3
2
1
0
MSB
Figure 7. Write Enable Latch Sequence
CS
0
1
2
3
4
5
6
7
SCK
SI
High Impedance
SO
Figure 8. Write Sequence
CS
0
1
2
3
4
5
6
7
8
9
10
20 21 22 23 24 25 26 27 28 29 30 31
SCK
Instruction
16 Bit Address
15 14 13
Data Byte 1
3
2
1
0
7
6
5
4
3
2
1
0
SI
CS
32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47
SCK
SI
Data Byte 2
Data Byte 3
Data Byte N
7
6
5
4
3
2
1
0
7
6
5
4
3
2
1
0
6
5
4
3
2
1
0
FN8132 Rev 2.00
October 16, 2015
Page 9 of 21
X5328, X5329 (Replaces X25328, X25329)
Figure 9. Status Register Write Sequence
CS
0
1
2
3
4
5
6
7
8
7
9
6
10 11 12 13 14 15
SCK
Instruction
Data Byte
5
4
3
2
1
0
SI
High Impedance
SO
SYMBOL TABLE
WAVEFORM
INPUTS
OUTPUTS
Must be
steady
Will be
steady
May change
from LOW
to HIGH
Will change
from LOW
to HIGH
May change
from HIGH
to LOW
Will change
from HIGH
to LOW
Don’t Care:
Changes
Allowed
Changing:
State Not
Known
N/A
Center Line
is High
Impedance
FN8132 Rev 2.00
October 16, 2015
Page 10 of 21
X5328, X5329 (Replaces X25328, X25329)
ABSOLUTE MAXIMUM RATINGS
COMMENT
Temperature under bias.................... -65°C to+135°C
Storage temperature ........................ -65°C to+150°C
Voltage on any pin with
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
This is a stress rating only; functional operation of the
device (at these or any other conditions above those
listed in the operational sections of this specification) is
not implied. Exposure to absolute maximum rating condi-
tions for extended periods may affect device reliability.
respect to V ...................................... -1.0V to +7V
SS
D.C. output current...............................................5mA
Lead temperature (soldering, 10s) .................... 300°C
RECOMMENDED OPERATING CONDITIONS
Temperature
Commercial
Industrial
Min.
0°C
Max.
70°C
Voltage Option
-2.7 or -2.7A
Supply Voltage
2.7V to 5.5V
4.5V-5.5V
-40°C
+85°C
BLank or -4.5A
D.C. OPERATING CHARACTERISTICS (Over the recommended operating conditions unless otherwise specified.)
Limits
Symbol
Parameter
Min.
Typ.
Max.
Unit
Test Conditions
ICC1
VCC Write Current (Active)
5
mA SCK = VCC x 0.1/VCC x 0.9 @ 2MHz,
SO = Open
ICC2
ISB
VCC Read Current (Active)
VCC Standby Current
0.4
1
mA SCK = VCC x 0.1/VCC x 0.9 @ 2MHz,
SO = Open
µA
CS = VCC, VIN = VSS or VCC
VCC = 5.5V
,
ILI
Input Leakage Current
Output Leakage Current
Input LOW Voltage
0.1
0.1
10
10
µA
µA
V
VIN = VSS to VCC
ILO
VOUT = VSS to VCC
(1)
VIL
-0.5
VCC x 0.3
VCC + 0.5
0.4
(1)
VIH
Input HIGH Voltage
VCC x 0.7
V
VOL1
VOL2
VOL3
VOH1
VOH2
VOH3
VOLS
Output LOW Voltage
Output LOW Voltage
Output LOW Voltage
Output HIGH Voltage
Output HIGH Voltage
Output HIGH Voltage
Reset Output LOW Voltage
V
VCC > 3.3V, IOL = 2.1mA
0.4
V
2V < VCC 3.3V, IOL = 1mA
VCC 2V, IOL = 0.5mA
VCC > 3.3V, IOH = -1.0mA
2V < VCC 3.3V, IOH = -0.4mA
VCC 2V, IOH = -0.25mA
0.4
V
VCC - 0.8
VCC - 0.4
VCC - 0.2
V
V
V
0.4
V
IOL = 1mA
CAPACITANCE T = +25°C, f = 1MHz, V = 5V
A
CC
Symbol
Test
Max.
Unit
Conditions
VOUT = 0V
VIN = 0V
(2)
COUT
Output Capacitance (SO, RESET, RESET)
Input Capacitance (SCK, SI, CS, WP)
8
6
pF
pF
(2)
CIN
Notes: (1) VIL min. and VIH max. are for reference only and are not tested.
(2) This parameter is periodically sampled and not 100% tested.
FN8132 Rev 2.00
October 16, 2015
Page 11 of 21
X5328, X5329 (Replaces X25328, X25329)
EQUIVALENT A.C. LOAD CIRCUIT AT 5V V
A.C. TEST CONDITIONS
CC
Input pulse levels
VCC x 0.1 to VCC x 0.9
10ns
5V
5V
Input rise and fall times
Input and output timing level
V
CC x0.5
4.6k
2.06k
Output
3.03k
RESET/RESET
30pF
100pF
A.C. CHARACTERISTICS (Over recommended operating conditions, unless otherwise specified)
Serial Input Timing
2.7-5.5V
Symbol
fSCK
tCYC
tLEAD
tLAG
tWH
Parameter
Min.
0
Max.
Unit
MHz
ns
Clock Frequency
Cycle Time
2
500
250
250
200
250
50
CS Lead Time
CS Lag Time
ns
ns
Clock HIGH Time
Clock LOW Time
Data Setup Time
Data Hold Time
Input Rise Time
Input Fall Time
CS Deselect Time
Write Cycle Time
ns
tWL
ns
tSU
ns
tH
50
ns
(3)
tRI
100
100
ns
(3)
tFI
ns
tCS
500
ns
(4)
tWC
10
ms
FN8132 Rev 2.00
October 16, 2015
Page 12 of 21
X5328, X5329 (Replaces X25328, X25329)
Serial Input Timing
tCS
CS
tLEAD
tLAG
SCK
tSU
tH
tRI
tFI
SI
MSB IN
LSB IN
High Impedance
SO
Serial Output Timing
2.7-5.5V
Max.
Symbol
Parameter
Min.
Unit
MHz
ns
fSCK
tDIS
tV
Clock Frequency
Output Disable Time
0
2
250
250
Output Valid from Clock Low
Output Hold Time
ns
tHO
0
ns
(3)
tRO
Output Rise Time
100
100
ns
(3)
tFO
Output Fall Time
ns
Notes: (3) This parameter is periodically sampled and not 100% tested.
(4) tWC is the time from the rising edge of CS after a valid write sequence has been sent to the end of the self-timed internal nonvolatile
write cycle.
Serial Output Timing
CS
SCK
SO
tCYC
tWH
tLAG
tV
tHO
tWL
tDIS
MSB Out
MSB–1 Out
LSB Out
ADDR
LSB IN
SI
FN8132 Rev 2.00
October 16, 2015
Page 13 of 21
X5328, X5329 (Replaces X25328, X25329)
Power-Up and Power-Down Timing
VTRIP
VTRIP
VCC
tPURST
0 Volts
tF
tRPD
tPURST
tR
RESET (X5328)
RESET (X5329)
RESET Output Timing
Symbol
Parameter
Min.
Typ.
Max.
Unit
VTRIP
Reset Trip Point Voltage, X5328-4.5A, X5328-4.5A
Reset Trip Point Voltage, X5328, X5329
Reset Trip Point Voltage, X5328-2.7A, X5329-2.7A
Reset Trip Point Voltage, X5328-2.7, X5329-2.7
4.5
4.63
4.38
2.93
2.63
4.75
4.5
3.0
4.25
2.85
2.55
V
2.7
VTH
VTRIP Hysteresis (HIGH to LOW vs. LOW to HIGH VTRIP voltage)
Power-up Reset Time Out
VCC Detect to Reset/Output
VCC Fall Time
20
mV
ms
ns
µs
µs
V
tPURST
100
200
280
500
(5)
tRPD
(5)
tF
100
100
1
(5)
tR
VCC Rise Time
VRVALID
Reset Valid VCC
Note: (5) This parameter is periodically sampled and not 100% tested.
FN8132 Rev 2.00
October 16, 2015
Page 14 of 21
X5328, X5329 (Replaces X25328, X25329)
V
Set Conditions
TRIP
tTHD
VCC
VTRIP
tTSU
tRP
tP
tVPH
tVPS
CS
tVPO
tVPH
tVPS
VP
SCK
SI
VP
tVPO
V
Reset Conditions
TRIP
VCC
*
tRP
tP
tVP1
tVPS
CS
tVPS
tVPO
tVPH
VCC
SCK
SI
VP
tVPO
*VCC > Programmed VTRIP
FN8132 Rev 2.00
October 16, 2015
Page 15 of 21
X5328, X5329 (Replaces X25328, X25329)
Programming Specifications V = 1.7-5.5V; Temperature = 0°C to 70°C
V
TRIP
CC
Parameter
tVPS
tVPH
tP
Description
SCK VTRIP Program Voltage Setup time
Min. Max. Unit
1
1
µs
µs
µs
µs
ms
ms
ms
ms
V
SCK VTRIP Program Voltage Hold time
VTRIP Program Pulse Width
1
tTSU
tTHD
tWC
VTRIP Level Setup time
10
10
VTRIP Level Hold (stable) time
VTRIP Write Cycle Time
10
tRP
VTRIP Program Cycle Recovery Period (Between successive programming cycles)
SCK VTRIP Program Voltage Off time before next cycle
Programming Voltage
10
0
tVPO
VP
VTRAN
Vta1
15
1.7
18
VTRIP Programed Voltage Range
5.0
V
Initial VTRIP Program Voltage accuracy (VCC applied-VTRIP) (Programmed at 25°C.)
-0.1 +0.4
V
Vta2
Subsequent VTRIP Program Voltage accuracy [(VCC applied-Vta1)-VTRIP
(Programmed at 25°C.)
]
-25
-25
-25
+25
+25
+25
mV
Vtr
VTRIP Program Voltage repeatability (Successive program operations.) (programmed at
25°C)
mV
mV
Vtv
VTRIP Program variation after programming (0-75°C). (programmed at 25°C)
VTRIP programming parameters are periodically sampled and are not 100% tested.
FN8132 Rev 2.00
October 16, 2015
Page 16 of 21
X5328, X5329 (Replaces X25328, X25329)
TYPICAL PERFORMANCE
t
vs. Temperature
V
Supply Current vs. Temperature (I
)
SB
PURST
CC
205
200
195
190
185
180
175
170
165
2
(VCC = 3V, 5V)
1
0
160
-40
25
Degrees °C
90
-40C
25C
Temp°C
90C
V
vs. Temperature (programmed at 25°C)
TRIP
5.025
V
V
TRIP = 5V
5.000
4.975
3.525
3.500
TRIP = 3.5V
3.475
2.525
2.500
2.475
VTRIP = 2.5V
0
25
85
Temperature
FN8132 Rev 2.00
October 16, 2015
Page 17 of 21
X5328, X5329 (Replaces X25328, X25329)
Revision History
The revision history provided is for informational purposes only and is believed to be accurate, but not warranted. Please go to the web to make
sure that you have the latest revision.
DATE
REVISION
CHANGE
Updated the Ordering Information table on page 2.
October 16, 2015
FN8132.2
Added Revision History and About Intersil sections.
Replaced all Package Outline drawings with the most recent versions.
About Intersil
Intersil Corporation is a leading provider of innovative power management and precision analog solutions. The company's products
address some of the largest markets within the industrial and infrastructure, mobile computing and high-end consumer markets.
For the most updated datasheet, application notes, related documentation and related parts, please see the respective product
information page found at www.intersil.com.
You may report errors or suggestions for improving this datasheet by visiting www.intersil.com/ask.
Reliability reports are also available from our website at www.intersil.com/support.
© Copyright Intersil Americas LLC 2005-2015. All Rights Reserved.
All trademarks and registered trademarks are the property of their respective owners.
For additional products, see www.intersil.com/en/products.html
Intersil products are manufactured, assembled and tested utilizing ISO9001 quality systems as noted
in the quality certifications found at www.intersil.com/en/support/qualandreliability.html
Intersil products are sold by description only. Intersil may modify the circuit design and/or specifications of products at any time without notice, provided that such
modification does not, in Intersil's sole judgment, affect the form, fit or function of the product. Accordingly, the reader is cautioned to verify that datasheets are
current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its
subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see www.intersil.com
FN8132 Rev 2.00
October 16, 2015
Page 18 of 21
X5328, X5329 (Replaces X25328, X25329)
Package Outline Drawing
M8.15E
8 LEAD NARROW BODY SMALL OUTLINE PLASTIC PACKAGE
Rev 0, 08/09
4
4.90 ± 0.10
A
DETAIL "A"
0.22 ± 0.03
B
6.0 ± 0.20
3.90 ± 0.10
4
PIN NO.1
ID MARK
5
(0.35) x 45°
4° ± 4°
0.43 ± 0.076
1.27
0.25 M C A B
SIDE VIEW “B”
TOP VIEW
1.75 MAX
1.45 ± 0.1
0.25
GAUGE PLANE
C
SEATING PLANE
0.175 ± 0.075
SIDE VIEW “A
0.10 C
0.63 ±0.23
DETAIL "A"
(0.60)
(1.27)
NOTES:
(1.50)
1. Dimensions are in millimeters.
Dimensions in ( ) for Reference Only.
2. Dimensioning and tolerancing conform to AMSE Y14.5m-1994.
3. Unless otherwise specified, tolerance : Decimal ± 0.05
(5.40)
4. Dimension does not include interlead flash or protrusions.
Interlead flash or protrusions shall not exceed 0.25mm per side.
The pin #1 identifier may be either a mold or mark feature.
Reference to JEDEC MS-012.
5.
6.
TYPICAL RECOMMENDED LAND PATTERN
FN8132 Rev 2.00
October 16, 2015
Page 19 of 21
X5328, X5329 (Replaces X25328, X25329)
Plastic Dual-In-Line Packages (PDIP)
E
N
1
D
PIN #1
INDEX
A2
A
E1
SEATING
PLANE
L
c
A1
NOTE 5
2
N/2
eA
eB
e
b
b2
MDP0031
PLASTIC DUAL-IN-LINE PACKAGE
INCHES
SYMBOL
PDIP8
0.210
0.015
0.130
0.018
0.060
0.010
0.375
0.310
0.250
0.100
0.300
0.345
0.125
8
PDIP14
0.210
0.015
0.130
0.018
0.060
0.010
0.750
0.310
0.250
0.100
0.300
0.345
0.125
14
PDIP16
0.210
0.015
0.130
0.018
0.060
0.010
0.750
0.310
0.250
0.100
0.300
0.345
0.125
16
PDIP18
PDIP20
0.210
0.015
0.130
0.018
0.060
0.010
1.020
0.310
0.250
0.100
0.300
0.345
0.125
20
TOLERANCE
MAX
NOTES
A
A1
A2
b
0.210
0.015
0.130
0.018
0.060
0.010
0.890
0.310
0.250
0.100
0.300
0.345
0.125
18
MIN
±0.005
±0.002
b2
c
+0.010/-0.015
+0.004/-0.002
±0.010
D
1
2
E
+0.015/-0.010
±0.005
E1
e
Basic
eA
eB
L
Basic
±0.025
±0.010
N
Reference
Rev. C 2/07
NOTES:
1. Plastic or metal protrusions of 0.010” maximum per side are not included.
2. Plastic interlead protrusions of 0.010” maximum per side are not included.
3. Dimensions E and eA are measured with the leads constrained perpendicular to the seating plane.
4. Dimension eB is measured with the lead tips unconstrained.
5. 8 and 16 lead packages have half end-leads as shown.
FN8132 Rev 2.00
October 16, 2015
Page 20 of 21
X5328, X5329 (Replaces X25328, X25329)
Package Outline Drawing
M14.173
14 LEAD THIN SHRINK SMALL OUTLINE PACKAGE (TSSOP)
Rev 3, 10/09
A
1
3
5.00 ±0.10
SEE
DETAIL "X"
14
8
6.40
PIN #1
I.D. MARK
4.40 ±0.10
2
3
1
7
0.20 C B A
B
0.65
0.09-0.20
TOP VIEW
END VIEW
1.00 REF
0.05
H
C
0.90 +0.15/-0.10
1.20 MAX
SEATING
PLANE
GAUGE
PLANE
0.25
5
0.25 +0.05/-0.06
0.10 CBA
0°-8°
0.60 ±0.15
0.05 MIN
0.15 MAX
0.10 C
SIDE VIEW
DETAIL "X"
(1.45)
NOTES:
1. Dimension does not include mold flash, protrusions or gate burrs.
Mold flash, protrusions or gate burrs shall not exceed 0.15 per side.
2. Dimension does not include interlead flash or protrusion. Interlead
flash or protrusion shall not exceed 0.25 per side.
(5.65)
3. Dimensions are measured at datum plane H.
4. Dimensioning and tolerancing per ASME Y14.5M-1994.
5. Dimension does not include dambar protrusion. Allowable protrusion
shall be 0.80mm total in excess of dimension at maximum material
condition. Minimum space between protrusion and adjacent lead is 0.07mm.
6. Dimension in ( ) are for reference only.
(0.65 TYP)
(0.35 TYP)
7. Conforms to JEDEC MO-153, variation AB-1.
TYPICAL RECOMMENDED LAND PATTERN
FN8132 Rev 2.00
October 16, 2015
Page 21 of 21
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