X28HC64JZ-70-T1 [RENESAS]

EEPROM, 8KX8, 70ns, Parallel, CMOS, PQCC32;
X28HC64JZ-70-T1
型号: X28HC64JZ-70-T1
厂家: RENESAS TECHNOLOGY CORP    RENESAS TECHNOLOGY CORP
描述:

EEPROM, 8KX8, 70ns, Parallel, CMOS, PQCC32

可编程只读存储器 电动程控只读存储器 电可擦编程只读存储器
文件: 总18页 (文件大小:436K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
DATASHEET  
64k, 8k x 8-Bit 5 Volt, Byte Alterable EEPROM  
X28HC64  
Features  
The X28HC64 is an 8k x 8 EEPROM, fabricated with Intersil’s  
proprietary, high performance, floating gate CMOS technology.  
Like all Intersil programmable nonvolatile memories, the  
X28HC64 is a 5V only device. It features the JEDEC approved  
pinout for byte-wide memories, compatible with industry  
standard RAMs.  
• 70ns access time  
• Simple byte and page write  
- Single 5V supply  
- No external high voltages or VP-P control circuits  
- Self-timed  
- No erase before write  
The X28HC64 supports a 64-byte page write operation, effectively  
providing a 32µs/byte write cycle, and enabling the entire  
memory to be typically written in 0.25 seconds. The X28HC64  
also features DATA Polling and Toggle Bit Polling, two methods  
providing early end of write detection. In addition, the X28HC64  
includes a user-optional software data protection mode that  
further enhances Intersil’s hardware write protect capability.  
- No complex programming algorithms  
- No overerase problem  
• Low power CMOS  
- 40mA active current maximum  
• 200µA standby current maximum  
• Fast write cycle times  
Intersil EEPROMs are designed and tested for applications  
requiring extended endurance. Inherent data retention is  
greater than 100 years.  
- 64-byte page write operation  
- Byte or page write cycle: 2ms typical  
- Complete memory rewrite: 0.25s typical  
- Effective byte write cycle time: 32µs typical  
• Software data protection  
• End of write detection  
- DATA polling  
- Toggle bit  
• High reliability  
- Endurance: 100,000 cycles  
- Data retention: 100 years  
• JEDEC approved byte-wide pinout  
• Pb-free available (RoHS compliant)  
Pin Configurations  
X28HC64  
(28 LD PDIP, SOIC)  
TOP VIEW  
X28HC64  
(32 LD PLCC)  
TOP VIEW  
1
2
3
4
5
6
7
8
9
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
V
CC  
NC  
WE  
NC  
A
12  
4
3
2
1 32 31 30  
29  
A
A
A
A
A
A
A
A
7
6
5
4
3
2
1
0
A
A
A
A
A
A
A
5
6
7
8
9
A
8
6
5
4
3
2
1
0
A
8
28  
27  
26  
25  
24  
23  
22  
21  
A
9
A
9
A
11  
A
11  
NC  
OE  
OE  
X28HC64  
X28HC64  
A
10  
A
10  
11  
12  
13  
10  
CE  
I/O  
CE  
I/O  
10  
11  
12  
13  
14  
7
NC  
I/O  
7
I/O  
I/O  
I/O  
I/O  
I/O  
I/O  
6
5
4
3
0
1
2
I/O  
0
6
14 15 16 17 18 19 20  
I/O  
V
SS  
June 27, 2016  
FN8109.4  
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.  
1
1-888-INTERSIL or 1-888-468-3774 | Copyright Intersil Americas LLC 2005, 2006, 2009, 2015, 2016. All Rights Reserved  
Intersil (and design) is a trademark owned by Intersil Corporation or one of its subsidiaries.  
All other trademarks mentioned are the property of their respective owners.  
X28HC64  
Ordering Information  
TEMPERATURE  
RANGE (°C)  
ACCESS TIME  
(ns)  
PKG.  
DWG. #  
PART NUMBER  
PART MARKING  
PACKAGE  
32 Ld PLCC  
X28HC64J-70 (Notes 1, 6)  
X28HC64J-70 CY  
0 to +70  
70  
N32.45x55  
(No longer available, recommended  
replacement: X28HC64JZ-70)  
X28HC64JIZ-70 (Notes 1, 4, 6)  
X28HC64JZ-70 (Notes 1, 4, 6)  
X28HC64SIZ-70 (Notes 4, 6)  
X28HC64JI-70 ZCY  
X28HC64J-70 ZCY  
X28HC64SI-70 CYZ  
-40 to +85  
0 to +70  
32 Ld PLCC (RoHS Compliant)  
32 Ld PLCC (RoHS Compliant)  
N32.45x55  
N32.45x55  
M28.3  
-40 to +85  
28 Ld SOIC (300 mil) (RoHS  
Compliant)  
X28HC64SZ-70 (Notes 4, 6)  
X28HC64S-70 CYZ  
X28HC64J-90 CY  
0 to +70  
0 to +70  
28 Ld SOIC (300 mil) (RoHS  
Compliant)  
M28.3  
X28HC64J-90 (Notes 1, 6)  
90  
32 Ld PLCC  
N32.45x55  
(No longer available, recommended  
replacement: X28HC64JIZ-90)  
X28HC64JI-90 (Notes 1, 3, 6)  
(No longer available, recommended  
replacement: X28HC64JIZ-90)  
X28HC64JI-90 CY  
-40 to +85  
32 Ld PLCC  
N32.45x55  
X28HC64JIZ-90 (Notes 1, 4, 6)  
X28HC64PIZ-90 (Notes 4, 5)  
X28HC64PZ-90 (Notes 4, 5)  
X28HC64JI-90 ZCY  
X28HC64PI-90 CYZ  
X28HC64P-90 CYZ  
X28HC64J-12 CY  
-40 to +85  
-40 to +85  
0 to +70  
32 Ld PLCC (RoHS Compliant)  
28 Ld PDIP (RoHS Compliant)  
28 Ld PDIP (RoHS Compliant)  
32 Ld PLCC  
N32.45x55  
E28.6  
E28.6  
X28HC64J-12 (Notes 1, 6)  
0 to +70  
120  
N32.45x55  
(No longer available, recommended  
replacement: X28HC64JZ-12)  
X28HC64JI-12 (Notes 1, 6)  
X28HC64JI-12 CY  
-40 to +85  
32 Ld PLCC  
N32.45x55  
(No longer available, recommended  
replacement: X28HC64JIZ-12)  
X28HC64JIZ-12 (Notes 1, 4, 6)  
X28HC64JZ-12* (Notes 1, 4, 6)  
X28HC64PIZ-12 (Notes 4, 5)  
X28HC64PZ-12 (Notes 4, 5)  
X28HC64SIZ-12 (Notes 2, 4, 6)  
X28HC64JI-12 ZCY  
X28HC64J-12 ZCY  
X28HC64PI-12 CYZ  
X28HC64P-12 CYZ  
X28HC64SI-12 CYZ  
-40 to +85  
0 to +70  
32 Ld PLCC (RoHS Compliant)  
32 Ld PLCC (RoHS Compliant)  
28 Ld PDIP (RoHS Compliant)  
28 Ld PDIP (RoHS Compliant)  
N32.45x55  
N32.45x55  
E28.6  
-40 to +85  
0 to +70  
E28.6  
-40 to +85  
28 Ld SOIC (300 mil) (RoHS  
Compliant)  
M28.3  
X28HC64SZ-12 (Notes 4, 6)  
NOTES:  
X28HC64S-12 CYZ  
0 to +70  
28 Ld SOIC (300 mil) (RoHS  
Compliant)  
M28.3  
1. Add “T1” suffix for 750 unit tape and reel option.  
2. Add “T1” suffix for 1000 unit tape and reel option.  
3. Add “T2” suffix for 750 unit tape and reel option.  
4. These Intersil Pb-free plastic packaged products employ special Pb-free material sets, molding compounds/die attach materials, and 100% matte  
tin plate plus anneal (e3 termination finish, which is RoHS compliant and compatible with both SnPb and Pb-free soldering operations). Intersil Pb-  
free products are MSL classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC J STD-020.  
5. Pb-free PDIPs can be used for through hole wave solder processing only. They are not intended for use in Reflow solder processing applications.  
6. For Moisture Sensitivity Level (MSL), please see product information page for X28HC64. For more information on MSL, please see tech brief TB363.  
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X28HC64  
Write  
Pin Descriptions  
Write operations are initiated when both CE and WE are LOW and  
SYMBOL  
DESCRIPTION  
OE is HIGH. The X28HC64 supports both a CE and WE controlled  
write cycle. That is, the address is latched by the falling edge of  
either CE or WE, whichever occurs last. Similarly, the data is  
latched internally by the rising edge of either CE or WE, whichever  
occurs first. A byte write operation, once initiated, will  
A0-A12  
Address Inputs. The Address inputs  
select an 8-bit memory location  
during a read or write operation.  
I/O0-I/O7  
WE  
Data Input/Output. Data is written  
to or read from the X28HC64  
through the I/O pins.  
automatically continue to completion, typically within 2ms.  
Page Write Operation  
Write Enable. The Write Enable  
input controls the writing of data to  
the X28HC64.  
The page write feature of the X28HC64 allows the entire memory  
to be written in 0.25 seconds. Page write allows two to sixty-four  
bytes of data to be consecutively written to the X28HC64 prior to  
the commencement of the internal programming cycle. The host  
can fetch data from another device within the system during a  
page write operation (change the source address), but the page  
address (A6 through A12) for each subsequent valid write cycle to  
the part during this operation must be the same as the initial page  
address.  
CE  
Chip Enable. The Chip Enable input  
must be LOW to enable all  
read/write operations. When CE is  
HIGH, power consumption is  
reduced.  
OE  
Output Enable. The Output Enable  
input controls the data output  
buffers and is used to initiate read  
operations.  
The page write mode can be initiated during any write operation.  
Following the initial byte write cycle, the host can write an  
additional one to sixty-three bytes in the same manner. Each  
successive byte load cycle, started by the WE HIGH to LOW  
transition, must begin within 100µs of the falling edge of the  
preceding WE. If a subsequent WE HIGH to LOW transition is not  
detected within 100µs, the internal automatic programming  
cycle will commence. There is no page write window limitation.  
Effectively the page write window is infinitely wide, so long as the  
host continues to access the device within the byte load cycle  
time of 100µs.  
VCC  
VSS  
NC  
+5V  
Ground  
No Connect  
Block Diagram  
65,536-BIT  
X BUFFERS  
LATCHES AND  
DECODER  
EEPROM  
ARRAY  
Write Operation Status Bits  
The X28HC64 provides the user two write operation status bits.  
These can be used to optimize a system write cycle time. The  
status bits are mapped onto the I/O bus as shown in Figure 2.  
A –A  
0
12  
ADDRESS  
INPUTS  
Y BUFFERS  
LATCHES  
AND  
I/O BUFFERS  
AND LATCHES  
I/O  
DP  
TB  
5
4
3
2
1
0
DECODER  
RESERVED  
TOGGLE BIT  
DATA POLLING  
CE  
CONTROL  
LOGIC AND  
TIMING  
I/O –I/O  
DATA INPUTS/OUTPUTS  
0
7
OE  
FIGURE 2. STATUS BIT ASSIGNMENT  
WE  
V
CC  
SS  
V
FIGURE 1. BLOCK DIAGRAM  
Device Operation  
Read  
Read operations are initiated by both OE and CE LOW. The read  
operation is terminated by either CE or OE returning HIGH. This  
two line control architecture eliminates bus contention in a  
system environment. The data bus will be in a high impedance  
state when either OE or CE is HIGH.  
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X28HC64  
produce the complement of that data on I/O7 (i.e., write data =  
0xxx xxxx, read data = 1xxx xxxx). Once the programming cycle is  
complete, I/O7 will reflect true data.  
DATA Polling (I/O )  
7
The X28HC64 features DATA Polling as a method to indicate to  
the host system that the byte write or page write cycle has  
completed. DATA Polling allows a simple bit test operation to  
determine the status of the X28HC64, eliminating additional  
interrupt inputs or external hardware. During the internal  
programming cycle, any attempt to read the last byte written will  
DATA Polling can effectively reduce the time for writing to the  
X28HC64. The timing diagram in Figure 3 illustrates the  
sequence of events on the bus. The software flow diagram in  
Figure 4 illustrates one method of implementing the routine.  
LAST  
WRITE  
WE  
CE  
OE  
V
IH  
V
OH  
HIGH Z  
I/O  
7
V
OL  
X28HC64  
READY  
A –A  
0
12  
An  
An  
An  
An  
An  
An  
An  
FIGURE 3. DATA POLLING BUS SEQUENCE  
WRITE DATA  
NO  
WRITES  
COMPLETE?  
YES  
SAVE LAST DATA  
AND ADDRESS  
READ LAST  
ADDRESS  
IO  
NO  
7
COMPARE?  
YES  
READY  
FIGURE 4. DATA POLLING SOFTWARE FLOW  
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X28HC64  
The Toggle Bit can eliminate the chore of saving and fetching the  
Toggle Bit (I/O )  
6
last address and data in order to implement DATA Polling. This  
can be especially helpful in an array comprised of multiple  
X28HC64 memories that is frequently updated. Toggle Bit Polling  
can also provide a method for status checking in multiprocessor  
applications. The timing diagram in Figure 5 illustrates the  
sequence of events on the bus. The software flow diagram in  
Figure 6 illustrates a method for polling the Toggle Bit.  
The X28HC64 also provides another method for determining  
when the internal write cycle is complete. During the internal  
programming cycle I/O6 will toggle from HIGH to LOW and LOW  
to HIGH on subsequent attempts to read the device. When the  
internal cycle is complete, the toggling will cease and the device  
will be accessible for additional read or write operations.  
LAST  
WRITE  
WE  
CE  
OE  
V
OH  
HIGH Z  
I/O  
6
*
*
V
OL  
X28HC64  
READY  
* BEGINNING AND ENDING STATE OF I/O WILL VARY.  
6
FIGURE 5. TOGGLE BIT BUS SEQUENCE  
LAST WRITE  
YES  
LOAD ACCUM  
FROM ADDR N  
COMPARE  
ACCUM WITH  
ADDR N  
NO  
COMPARE  
OK?  
YES  
READY  
FIGURE 6. TOGGLE BIT SOFTWARE FLOW  
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X28HC64  
nonvolatile and will remain set for the life of the device, unless  
the reset command is issued.  
Hardware Data Protection  
The X28HC64 provides two hardware features that protect  
nonvolatile data from inadvertent writes.  
Once the software protection is enabled, the X28HC64 is also  
protected from inadvertent and accidental writes in the  
powered-up state. That is, the software algorithm must be issued  
prior to writing additional data to the device.  
• Default VCC Sense—All write functions are inhibited when VCC is  
3V typically.  
• Write Inhibit—Holding either OE LOW, WE HIGH, or CE HIGH will  
prevent an inadvertent write cycle during power-up and  
power-down, maintaining data integrity.  
Software Algorithm  
Selecting the software data protection mode requires the host  
system to precede data write operations by a series of three write  
operations to three specific addresses. Refer to Figures 7 and 8  
for the sequence. The 3-byte sequence opens the page write  
window, enabling the host to write from 1 to 64 bytes of data.  
Once the page load cycle has been completed, the device will  
automatically be returned to the data protected state.  
Software Data Protection  
The X28HC64 offers a software controlled data protection feature.  
The X28HC64 is shipped from Intersil with the software data  
protection NOT ENABLED; that is, the device will be in the standard  
operating mode. In this mode data should be protected during  
power-up/power-down operations through the use of external  
circuits. The host would then have open read and write access of the  
device once VCC was stable.  
Regardless of whether the device has previously been protected  
or not, once the software data protection algorithm is used, the  
X28HC64 will automatically disable further writes unless another  
command is issued to deactivate it. If no further commands are  
issued, the X28HC64 will be write protected during power-down  
and after any subsequent power-up.  
The X28HC64 can be automatically protected during power-up  
and power-down without the need for external circuits by  
employing the software data protection feature. The internal  
software data protection circuit is enabled after the first write  
operation utilizing the software algorithm. This circuit is  
Note: Once initiated, the sequence of write operations should not  
be interrupted.  
V
CC  
(V  
)
CC  
0V  
DATA  
ADDR  
AAA  
1555  
55  
0AAA  
A0  
1555  
WRITES  
OK  
WRITE  
PROTECTED  
t
WC  
CE  
BYTE  
OR  
PAGE  
≤t  
BLC MAX  
WE  
FIGURE 7. TIMING SEQUENCE—BYTE OR PAGE WRITE  
WRITE DATA AA  
TO ADDRESS  
1555  
WRITE DATA 55  
TO ADDRESS  
0AAA  
WRITE DATA A0  
TO ADDRESS  
1555  
BYTE/PAGE  
LOAD ENABLED  
WRITE DATA XX  
TO ANY  
ADDRESS  
OPTIONAL  
BYTE/PAGE  
LOAD OPERATION  
WRITE LAST  
BYTE TO  
LAST ADDRESS  
AFTER T  
WC  
RE-ENTERS DATA  
PROTECTED STATE  
FIGURE 8. WRITE SEQUENCE FOR SOFTWARE DATA PROTECTION  
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X28HC64  
Resetting Software Data Protection  
V
CC  
AAA  
1555  
55  
0AAA  
80  
1555  
AA  
1555  
55  
0AAA  
20  
1555  
STANDARD  
OPERATING  
MODE  
DATA  
ADDR  
t  
WC  
CE  
WE  
FIGURE 9. RESET SOFTWARE DATA PROTECTION TIMING SEQUENCE  
WRITE DATA AA  
TO ADDRESS  
1555  
WRITE DATA 55  
TO ADDRESS  
0AAA  
WRITE DATA 80  
TO ADDRESS  
1555  
WRITE DATA AA  
ADDRESS  
1555  
WRITE DATA 55  
TO ADDRESS  
0AAA  
WRITE DATA 20  
TO ADDRESS  
1555  
FIGURE 10. SOFTWARE SEQUENCE TO DEACTIVATE SOFTWARE DATA PROTECTION  
In the event the user wants to deactivate the software data  
protection feature for testing or reprogramming in an EEPROM  
programmer, the following six step algorithm will reset the  
internal protection circuit. After tWC, the X28HC64 will be in  
standard operating mode.  
Note: Once initiated, the sequence of write operations should not  
be interrupted.  
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X28HC64  
concern. Enabling CE will cause transient current spikes. The  
System Considerations  
magnitude of these spikes is dependent on the output capacitive  
loading of the I/Os. Therefore, the larger the array sharing a  
common bus, the larger the transient spikes. The voltage peaks  
associated with the current transients can be suppressed by the  
proper selection and placement of decoupling capacitors. As a  
minimum, it is recommended that a 0.1µF high frequency  
ceramic capacitor be used between VCC and VSS at each device.  
Depending on the size of the array, the value of the capacitor  
may have to be larger.  
Because the X28HC64 is frequently used in large memory arrays,  
it is provided with a two-line control architecture for both read  
and write operations. Proper usage can provide the lowest  
possible power dissipation, and eliminate the possibility of  
contention where multiple I/O pins share the same bus.  
To gain the most benefit, it is recommended that CE be decoded  
from the address bus, and be used as the primary device  
selection input. Both OE and WE would then be common among  
all devices in the array. For a read operation, this assures that all  
deselected devices are in their standby mode, and that only the  
selected device(s) is/are outputting data on the bus.  
In addition, it is recommended that a 4.7µF electrolytic bulk  
capacitor be placed between VCC and VSS for each eight devices  
employed in the array. This bulk capacitor is employed to  
overcome the voltage droop caused by the inductive effects of  
the PC board traces.  
Because the X28HC64 has two power modes, standby and  
active, proper decoupling of the memory array is of prime  
1.4  
1.4  
5.5V  
CC  
5.5V  
CC  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
- 55°C  
+ 25°C  
5.0V  
CC  
+ 125°C  
4.5V  
CC  
0M  
10M  
FREQUENCY (Hz)  
20M  
0M  
10M  
FREQUENCY (Hz)  
20M  
FIGURE 12. NORMALIZED ICC(RD) AT 25% OVER THE VCC RANGE  
AND FREQUENCY  
FIGURE 11. NORMALIZED ICC(RD) BY TEMPERATURE  
OVER FREQUENCY DATA PROTECTION  
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X28HC64  
Absolute Maximum Ratings  
Thermal Information  
Temperature Under Bias  
Thermal Resistance (Typical)  
JA (°C/W)  
JC (°C/W)  
X28HC64 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-10°C to +85°C  
X28HC64I . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-65°C to +135°C  
Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-65°C to +150°C  
Voltage on any Pin with Respect to VSS . . . . . . . . . . . . . . . . . . . . .-1V to +7V  
DC Output Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5mA  
32 Ld PLCC Package (Notes 7, 9) . . . . . . .  
28 Ld SOIC Package (Notes 7, 9) . . . . . . . .  
28 Ld PDIP Package (Notes 8, 9). . . . . . . .  
Pb-Free Reflow Profile . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . see TB493  
*Pb-free PDIPs can be used for through hole wave solder processing only.  
They are not intended for use in Reflow solder processing applications.  
41  
46  
53  
19  
19  
21  
Recommended Operating Conditions  
Commercial Temperature Range . . . . . . . . . . . . . . . . . . . . . . 0°C to +70°C  
Industrial Temperature Range . . . . . . . . . . . . . . . . . . . . . . .-40°C to +85°C  
Supply Voltage Range  
X28HC64. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5V ±10%  
CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product  
reliability and result in failures not covered by warranty.  
NOTES:  
7. JA is measured with the component mounted on a high effective thermal conductivity test board in free air. See Tech Brief TB379 for details.  
8. JA is measured with the component mounted on a low effective thermal conductivity test board in free air. See Tech Brief TB379 for details.  
9. For JC, the “case temp” location is taken at the package top center.  
DC Electrical Specifications Over recommended operating conditions, unless otherwise specified.  
MIN  
TYP  
MAX  
PARAMETER  
SYMBOL  
ICC  
TEST CONDITIONS  
(Note 10) (Note 11) (Note 10) UNIT  
V
CC Current (Active) (TTL Inputs)  
CE = OE = VIL, WE = VIH, All I/O’s = open, address  
inputs = TTL levels at f = 10MHz  
15  
40  
mA  
VCC Current (Standby) (TTL Inputs)  
CC Current (Standby) (CMOS Inputs)  
ISB1  
ISB2  
CE = VIH, OE = VIL All I/O’s = open, other inputs = VIH  
1
2
mA  
µA  
V
CE = VCC - 0.3V, OE = GND, All I/O’s = open, other  
inputs = VCC - 0.3V  
100  
200  
Input Leakage Current  
Output Leakage Current  
Input LOW Voltage (Note 12)  
Input HIGH Voltage (Note 12)  
Output LOW Voltage  
Output HIGH Voltage  
NOTES:  
ILI  
ILO  
VIN = VSS to VCC  
±10  
±10  
µA  
µA  
V
VOUT = VSS to VCC, CE = VIH  
VlL  
-1  
2
0.8  
VIH  
VOL  
VOH  
VCC + 1  
0.4  
V
IOL = 5mA  
IOH = -5mA  
V
2.4  
V
10. Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits established by characterization  
and are not production tested.  
11. Typical values are for TA = +25°C and nominal supply voltage.  
12. VIL minimum and VIH maximum are for reference only and are not tested.  
Endurance and Data Retention The endurance and data retention specifications are established by characterization and are not  
production tested.  
PARAMETER  
Minimum Endurance  
MIN  
100,000  
100  
MAX  
UNIT  
Cycles  
Years  
Data Retention  
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Power-Up Timing  
TYP  
PARAMETER  
SYMBOL  
tPUR  
(Note 11)  
UNIT  
µs  
Power-Up to Read Operation (Note 13)  
Power-Up to Write Operation (Note 13)  
100  
5
tPUW  
ms  
Capacitance TA = +25°C, f = 1MHz, VCC = 5V  
PARAMETER  
Input/output Capacitance (Note 13)  
Input Capacitance (Note 13)  
NOTE:  
SYMBOL  
TEST CONDITIONS  
VI/O = 0V  
MAX  
10  
6
UNIT  
pF  
CI/O  
CIN  
VIN = 0V  
pF  
13. This parameter is periodically sampled and not 100% tested.  
Symbol Table  
TABLE 1. AC CONDITIONS OF TEST  
WAVEFORM  
INPUTS  
OUTPUTS  
Input Pulse Levels  
0V to 3V  
5ns  
Input Rise and Fall Times  
Input and Output Timing Levels  
Must be  
steady  
Will be  
steady  
1.5V  
Ma y change  
from LOW  
to HIGH  
Will change  
from LOW  
to HIGH  
TABLE 2. MODE SELECTION  
MODE I/O  
Ma y change  
from HIGH  
to LOW  
Will change  
from HIGH  
to LOW  
CE  
L
OE  
L
WE  
H
POWER  
Active  
Read  
Write  
DOUT  
DIN  
Don’t Care:  
Changes  
Allowed  
Changing:  
State Not  
Known  
L
H
L
Active  
H
X
X
Standby and write High Z  
inhibit  
Standby  
N/A  
Center Line  
is High  
Impedance  
-
X
X
L
X
Write inhibit  
-
-
X
H
Write inhibit  
-
Equivalent AC Load Circuits  
5V  
1.92kΩ  
OUTPUT  
1.37kΩ  
30pF  
FIGURE 13. EQUIVALENT AC LOAD CIRCUITS  
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AC Electrical Specifications  
Read Cycle Limits Over the recommended operating conditions unless otherwise specified.  
X28HC64-70 X28HC64-90  
MIN MAX MIN MAX  
X28HC64-12  
MIN MAX  
PARAMETER  
SYMBOL  
(Note 10) (Note 10) (Note 10) (Note 10) (Note 10) (Note 10)  
UNIT  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Read Cycle Time  
tRC  
70  
90  
120  
Chip Enable Access Time  
Address Access Time  
tCE  
70  
70  
35  
90  
90  
40  
120  
120  
50  
tAA  
Output Enable Access Time  
CE LOW to Active Output (Note 14)  
OE LOW to Active Output (Note 14)  
CE HIGH to High Z Output (Note 14)  
OE HIGH to High Z Output (Note 14)  
Output Hold from Address Change  
NOTE:  
tOE  
tLZ  
0
0
0
0
0
0
tOLZ  
tHZ  
tOHZ  
tOH  
30  
30  
30  
30  
30  
30  
0
0
0
14. tLZ minimum, tHZ, tOLZ minimum, and tOHZ are periodically sampled and not 100% tested. tHZ maximum and tOHZ maximum are measured from the  
point when CE or OE return HIGH (whichever occurs first) to the time when the outputs are no longer driven.  
Read Cycle  
t
RC  
ADDRESS  
t
CE  
CE  
t
OE  
OE  
V
IH  
WE  
t
t
OHZ  
OLZ  
t
t
t
t
LZ  
OH  
AA  
HZ  
HIGH Z  
DATA I/O  
DATA VALID  
DATA VALID  
FIGURE 14. READ CYCLE  
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X28HC64  
Write Cycle Limits  
MIN  
TYP  
MAX  
PARAMETER  
SYMBOL  
tWC  
tAS  
(Note 10)  
(Note 11)  
(Note 10)  
UNIT  
ms  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
µs  
ns  
ns  
µs  
µs  
Write Cycle Time (Note 15)  
Address Set-Up Time  
Address Hold Time  
Write Set-Up Time  
Write Hold Time  
2
5
0
50  
0
tAH  
tCS  
tCH  
0
CE Pulse Width  
tCW  
tOES  
tOEH  
tWP  
tWPH  
tDV  
50  
0
OE High Set-Up Time  
OE High Hold Time  
WE Pulse Width  
0
50  
50  
WE HIGH Recovery (Note 16)  
Data Valid (Note 16)  
Data Setup  
1
tDS  
50  
0
Data Hold  
tDH  
Delay to Next Write (Note 16)  
Byte Load Cycle  
tDW  
tBLC  
10  
0.15  
100  
NOTES:  
15. tWC is the minimum cycle time to be allowed from the system perspective unless polling techniques are used. It is the maximum time the device  
requires to automatically complete the internal write operation.  
16. tWPH and tDW are periodically sampled and not 100% tested.  
WE Controlled Write Cycle  
t
WC  
ADDRESS  
t
t
AH  
AS  
t
t
CS  
CH  
CE  
OE  
t
t
OEH  
OES  
t
WP  
WE  
t
DV  
DATA IN  
DATA OUT  
DATA VALID  
HIGH Z  
t
t
DH  
DS  
FIGURE 15. WE CONTROLLED WRITE CYCLE  
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X28HC64  
t
WC  
ADDRESS  
CE  
t
t
AH  
AS  
t
CW  
t
OES  
OE  
t
OEH  
t
t
CH  
CS  
WE  
t
DV  
DATA VALID  
DATA IN  
t
t
DH  
DS  
HIGH Z  
DATA OUT  
FIGURE 16. CE CONTROLLED WRITE CYCLE  
OE  
Note 17  
CE  
t
t
BLC  
WP  
WE  
t
WPH  
ADDRESS  
Note 18  
LAST BYTE  
Byte n+2  
I/O  
Byte 0  
Byte 1  
Byte 2  
Byte n  
Byte n+1  
t
WC  
*For each successive write within the page write operation, A –A should be the same or  
6
12  
writes to an unknown address could occur.  
FIGURE 17. PAGE WRITE CYCLE  
NOTES:  
17. Between successive byte writes within a page write operation, OE can be strobed LOW: e.g. this can be done with CE and WE HIGH to fetch data from  
another memory device within the system for the next write; or with WE HIGH and CE LOW effectively performing a polling operation.  
18. The timings shown above are unique to page write operations. Individual byte load operations within the page write must conform to either the CE  
or WE controlled write cycle timing.  
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X28HC64  
ADDRESS  
CE  
A
A
A
n
n
n
WE  
t
t
OEH  
OES  
OE  
t
DW  
D
= X  
D
= X  
OUT  
I/O  
7
D
= X  
OUT  
IN  
t
WC  
FIGURE 18. DATA POLLING TIMING DIAGRAM (Note 19)  
CE  
WE  
OE  
t
OES  
t
OEH  
t
DW  
HIGH Z  
I/O*  
*
6
*
t
WC  
* I/O beginning and ending state will vary, depending upon actual t  
6
.
WC  
FIGURE 19. TOGGLE BIT TIMING DIAGRAM (Note 19)  
NOTE:  
19. Polling operations are by definition read cycles and are therefore subject to read cycle timings.  
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Revision History The revision history provided is for informational purposes only and is believed to be accurate, but not warranted.  
Please go to the web to make sure that you have the latest revision.  
DATE  
REVISION  
FN8109.4  
CHANGE  
June 27, 2016  
Updated entire datasheet applying Intersil’s new standards.  
Updated the Ordering Information table by adding Note 2, updated other tape and reel notes, updated all of the  
part marking and added Note 6.  
Added Thermal Information (Theta JA, Theta JC, and applicable notes) on page 9.  
Added “The endurance and data retention specifications are established by characterization and are not  
production tested” to the “Endurance and Data Retention” table.  
August 18, 2015  
FN8109.3  
- Updated Ordering Information Table on page 2.  
- Added Revision History and About Intersil sections.  
- Updated POD M28.3 to latest revision changes are as follow:  
Added land pattern.  
About Intersil  
Intersil Corporation is a leading provider of innovative power management and precision analog solutions. The company's products  
address some of the largest markets within the industrial and infrastructure, mobile computing and high-end consumer markets.  
For the most updated datasheet, application notes, related documentation and related parts, please see the respective product  
information page found at www.intersil.com.  
You may report errors or suggestions for improving this datasheet by visiting www.intersil.com/ask.  
Reliability reports are also available from our website at www.intersil.com/support.  
FN8109.4  
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X28HC64  
Plastic Leaded Chip Carrier Packages (PLCC)  
0.042 (1.07)  
0.056 (1.42)  
PIN (1)  
IDENTIFIER  
0.004 (0.10)  
C
N32.45x55 (JEDEC MS-016AE ISSUE A)  
0.042 (1.07)  
0.048 (1.22)  
32 LEAD PLASTIC LEADED CHIP CARRIER PACKAGE  
0.050 (1.27) TP  
ND  
0.025 (0.64)  
0.045 (1.14)  
R
INCHES  
MILLIMETERS  
C
L
SYMBOL  
A
MIN  
MAX  
MIN  
3.18  
MAX  
3.55  
NOTES  
0.125  
0.060  
0.485  
0.447  
0.188  
0.585  
0.547  
0.238  
0.140  
0.095  
0.495  
0.453  
0.223  
0.595  
0.553  
0.273  
-
A1  
D
1.53  
2.41  
-
D2/E2  
D2/E2  
12.32  
11.36  
4.78  
12.57  
11.50  
5.66  
-
C
L
D1  
D2  
E
3
E1  
E
4, 5  
NE  
14.86  
13.90  
6.05  
15.11  
14.04  
6.93  
-
VIEW “A”  
E1  
E2  
N
3
4, 5  
0.015 (0.38)  
MIN  
28  
7
28  
7
6
A1  
ND  
NE  
7
7
D1  
D
A
9
9
SEATING  
PLANE  
0.020 (0.51) MAX  
3 PLCS  
-C-  
Rev. 0 7/98  
NOTES:  
0.026 (0.66)  
0.032 (0.81)  
0.050 (1.27)  
MIN  
1. Controlling dimension: INCH. Converted millimeter  
dimensions are not necessarily exact.  
2. Dimensions and tolerancing per ANSI Y14.5M-1982.  
3. Dimensions D1 and E1 do not include mold protrusions.  
Allowable mold protrusion is 0.010 inch (0.25mm) per side.  
Dimensions D1 and E1 include mold mismatch and are  
measured at the extreme material condition at the body  
parting line.  
0.013 (0.33)  
0.021 (0.53)  
0.025 (0.64)  
MIN  
(0.12)  
0.005  
M
A S - B S D S  
-C-  
4. To be measured at seating plane  
contact point.  
VIEW “A” TYP.  
5. Centerline to be determined where center leads exit plastic  
body.  
6. “N” is the number of terminal positions.  
7. ND denotes the number of leads on the two shorts sides of the  
package, one of which contains pin #1. NE denotes the  
number of leads on the two long sides of the package.  
FN8109.4  
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X28HC64  
Small Outline Plastic Packages (SOIC)  
M28.3 (JEDEC MS-013-AE ISSUE C)  
28 LEAD WIDE BODY SMALL OUTLINE PLASTIC PACKAGE  
N
INDEX  
0.25(0.010)  
M
B M  
H
AREA  
INCHES MILLIMETERS  
E
SYMBOL  
MIN  
MAX  
MIN  
2.35  
0.10  
0.33  
0.23  
MAX  
2.65  
NOTES  
-B-  
A
A1  
B
0.0926  
0.0040  
0.013  
0.1043  
0.0118  
0.0200  
0.0125  
-
0.30  
-
1
2
3
L
0.51  
9
SEATING PLANE  
A
C
0.0091  
0.6969  
0.2914  
0.32  
-
-A-  
D
E
0.7125 17.70  
18.10  
7.60  
3
h x 45o  
D
0.2992  
7.40  
4
e
0.05 BSC  
1.27 BSC  
-
-C-  
a
0.394  
0.01  
0.419  
0.029  
0.050  
10.00  
0.25  
0.40  
10.65  
0.75  
1.27  
-
H
e
A1  
C
5
h
B
0.10(0.004)  
L
0.016  
6
0.25(0.010) M  
C
A M B S  
N
28  
28  
7
0o  
8o  
0o  
8o  
-
Rev. 1, 1/13  
NOTES:  
1. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of  
Publication Number 95.  
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.  
3. Dimension “D” does not include mold flash, protrusions or gate burrs.  
Mold flash, protrusion and gate burrs shall not exceed 0.15mm (0.006  
inch) per side.  
TYPICAL RECOMMENDED LAND PATTERN  
4. Dimension “E” does not include interlead flash or protrusions. Interlead  
flash and protrusions shall not exceed 0.25mm (0.010 inch) per side.  
(1.50mm)  
5. The chamfer on the body is optional. If it is not present, a visual index  
feature must be located within the crosshatched area.  
(9.38mm)  
6. “L is the length of terminal for soldering to a substrate.  
7. “N” is the number of terminal positions.  
8. Terminal numbers are shown for reference only.  
9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater above  
the seating plane, shall not exceed a maximum value of 0.61mm (0.024  
inch)  
(1.27mm TYP)  
(0.51mm TYP)  
10. Controlling dimension: MILLIMETER. Converted inch dimensions are  
not necessarily exact.  
FN8109.4  
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X28HC64  
Dual-In-Line Plastic Packages (PDIP)  
E28.6 (JEDEC MS-011-AB ISSUE B)  
28 LEAD DUAL-IN-LINE PLASTIC PACKAGE  
N
E1  
INCHES MILLIMETERS  
MIN  
INDEX  
1 2  
3
N/2  
AREA  
SYMBOL  
MAX  
0.250  
-
MIN  
-
MAX  
6.35  
-
NOTES  
-B-  
-C-  
A
A1  
A2  
B
-
4
-A-  
0.015  
0.125  
0.014  
0.030  
0.008  
1.380  
0.005  
0.600  
0.485  
0.39  
3.18  
0.356  
0.77  
0.204  
4
D
E
0.195  
0.022  
0.070  
0.015  
1.565  
-
4.95  
0.558  
1.77  
0.381  
-
BASE  
PLANE  
A2  
A
-
SEATING  
PLANE  
B1  
C
8
L
C
L
-
D1  
B1  
eA  
A1  
A
D1  
e
D
35.1  
39.7  
5
eC  
C
B
D1  
E
0.13  
15.24  
12.32  
-
5
eB  
0.010 (0.25) M  
C
B S  
0.625  
0.580  
15.87  
14.73  
6
NOTES:  
E1  
e
5
1. Controlling Dimensions: INCH. In case of conflict between English and  
Metric dimensions, the inch dimensions control.  
0.100 BSC  
0.600 BSC  
2.54 BSC  
15.24 BSC  
-
eA  
eB  
L
6
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.  
-
0.700  
0.200  
-
17.78  
5.08  
7
3. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of  
Publication No. 95.  
0.115  
2.93  
4
9
4. Dimensions A, A1 and L are measured with the package seated in JEDEC  
seating plane gauge GS-3.  
N
28  
28  
Rev. 1 12/00  
5. D, D1, and E1 dimensions do not include mold flash or protrusions. Mold  
flash or protrusions shall not exceed 0.010 inch (0.25mm).  
eA  
6. E and  
are measured with the leads constrained to be  
-C-  
perpendicular to datum  
.
7. eB and eC are measured at the lead tips with the leads unconstrained. eC  
must be zero or greater.  
8. B1 maximum dimensions do not include dambar protrusions. Dambar  
protrusions shall not exceed 0.010 inch (0.25mm).  
9. N is the maximum number of terminal positions.  
10. Corner leads (1, N, N/2 and N/2 + 1) for E8.3, E16.3, E18.3, E28.3,  
E42.6 will have a B1 dimension of 0.030 - 0.045 inch (0.76 - 1.14mm).  
For additional products, see www.intersil.com/en/products.html  
Intersil products are manufactured, assembled and tested utilizing ISO9001 quality systems as noted  
in the quality certifications found at www.intersil.com/en/support/qualandreliability.html  
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time  
without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be  
accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third  
parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.  
For information regarding Intersil Corporation and its products, see www.intersil.com  
FN8109.4  
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18  

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