HAT1047R-EL-E [RENESAS]

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HAT1047R-EL-E
型号: HAT1047R-EL-E
厂家: RENESAS TECHNOLOGY CORP    RENESAS TECHNOLOGY CORP
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晶体 开关 晶体管 功率场效应晶体管 脉冲 电源开关 光电二极管
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HAT1047R, HAT1047RJ  
Silicon P Channel Power MOS FET  
High Speed Power Switching  
REJ03G0074-0500Z  
(Previous ADE-208-1545D(Z))  
Rev.5.00  
Aug.27.2003  
Features  
For Automotive Application (at Type Code "J")  
Low on-resistance  
Capable of –4.5 V gate drive  
High density mounting  
Outline  
SOP-8  
5
6
7
8
4
3
5 6  
D D  
7
D
8
D
2
1
4
G
1, 2, 3  
4
Source  
Gate  
5, 6, 7, 8 Drain  
S
1
S
2
S
3
Rev.5.00, Aug.27.2003, page 1 of 9  
HAT1047R, HAT1047RJ  
Absolute Maximum Ratings  
(Ta = 25°C)  
Item  
Symbol  
VDSS  
VGSS  
ID  
Ratings  
–30  
Unit  
V
Drain to source voltage  
Gate to source voltage  
Drain current  
±20  
V
–14  
A
Note1  
Drain peak current  
ID(pulse)  
–112  
–14  
A
Body-drain diode reverse drain current IDR  
A
Note3  
Avalanche current HAT1047R  
HAT1047RJ  
IAP  
A
–14  
Note3  
Avalanche energy HAT1047R  
HAT1047RJ  
EAR  
mJ  
W
°C  
°C  
19.6  
2.5  
Channel dissipation  
Pch Note2  
Tch  
Channel temperature  
150  
Storage temperature  
Tstg  
–55 to +150  
Notes: 1. PW 10 µs, duty cycle 1 %  
2. When using the glass epoxy board (FR4 40 x 40 x 1.6 mm), PW 10s  
3. Value at Tch = 25°C, Rg 50 Ω  
Rev.5.00, Aug.27.2003, page 2 of 9  
HAT1047R, HAT1047RJ  
Electrical Characteristics  
(Ta = 25°C)  
Item  
Symbol Min  
Typ  
Max  
Unit  
V
Test Conditions  
Drain to source breakdown voltage V(BR)DSS –30  
Gate to source breakdown voltage V(BR)GSS ±20  
ID = –10 mA, VGS = 0  
IG = ±100 µA, VDS = 0  
VGS = ± 16V, VDS = 0  
VDS = –30 V, VGS = 0  
VDS = –24 V, VGS = 0  
Ta = 125°C  
mV  
µA  
µA  
µA  
µA  
V
Gate to source leak current  
IGSS  
IDSS  
IDSS  
–1.0  
9.6  
±10  
±1  
Zero gate voltage drain current  
Zero gate voltage  
drain current  
HAT1047R  
HAT1047RJ IDSS  
–20  
–2.5  
12  
25  
Gate to source cutoff voltage  
Static drain to source on state  
resistance  
VGS(off)  
RDS(on)  
RDS(on)  
|yfs|  
VDS = –10 V, ID = –1 mA  
ID = –7 A, VGS = –10 V Note4  
ID = –7 A, VGS = –4.5 V Note4  
ID = –7 A, VDS = –10 V Note4  
VDS = –10 V  
10  
19  
16  
3500  
750  
520  
64  
10  
12  
23  
45  
80  
25  
mΩ  
mΩ  
S
Forward transfer admittance  
Input capacitance  
Ciss  
Coss  
Crss  
Qg  
pF  
pF  
pF  
nc  
nc  
nc  
ns  
ns  
ns  
ns  
V
Output capacitance  
Reverse transfer capacitance  
Total gate charge  
VGS = 0  
f = 1 MHz  
VDD = –10 V  
Gate to source charge  
Gate to drain charge  
Turn-on delay time  
Rise time  
Qgs  
Qgd  
td(on)  
tr  
VGS = –10 V  
ID = –14 A  
VGS = –10 V, ID = –7A  
VDD –10 V  
Turn-off delay time  
Fall time  
td(off)  
tf  
RL = 1.43 Ω  
RL = 4.7 Ω  
IF = –14 A, VGS = 0 Note4  
Body–drain diode forward voltage VDF  
–0.82 –1.07  
45  
Body–drain diode reverse  
recovery time  
trr  
ns  
IF = –14 A, VGS = 0  
diF/ dt = 100 A/µs  
Notes: 4. Pulse test  
Rev.5.00, Aug.27.2003, page 3 of 9  
HAT1047R, HAT1047RJ  
Main Characteristics  
Power vs. Temperature Derating  
Maximum Safe Operation Area  
4.0  
3.0  
2.0  
1.0  
-500  
-100  
Test condition.  
When using the glass epoxy board.  
(FR4 40 x 40 x 1.6 mm), (PW 10s)  
10 µs  
-10  
-1  
Operation in  
this area is  
limited by RDS(on)  
-0.1  
Ta = 25°C  
1 shot Pulse  
-0.01  
0
50  
100  
150  
200  
-0.1  
-0.3  
-1  
-3  
-10 -30 -100  
(V)  
Ambient Temperature Ta (°C)  
Drain to Source Voltage  
V
DS  
Note 1:  
When using the glass epoxy board.  
( FR4 40 x 40 x 1.6 mm)  
Typical Output Characteristics  
Typical Transfer Characteristics  
-50  
-40  
-30  
-20  
-10  
-50  
-40  
-30  
-20  
-10  
-10 V  
-8 V  
Pulse Test  
-4 V  
V
= -10 V  
DS  
Pulse Test  
-3 V  
75°C  
25°C  
Tc = -25°C  
V
= -2 V  
-8  
GS  
0
0
-1  
-2  
-3  
-4  
-5  
-2  
-4  
-6  
-10  
Drain to Source Voltage  
V
(V)  
Gate to Source Voltage  
V
(V)  
DS  
GS  
Rev.5.00, Aug.27.2003, page 4 of 9  
HAT1047R, HAT1047RJ  
Drain to Source Saturation Voltage vs.  
Gate to Source Voltage  
Static Drain to Source on State Resistance  
vs. Drain Current  
100  
-200  
-160  
-120  
-80  
Pulse Test  
I
= -10 A  
D
Pulse Test  
50  
-4.5 V  
20  
10  
5
-5 A  
-2 A  
V
GS  
= -10 V  
-40  
2
1.0  
-12  
Gate to Source Voltage  
0
-4  
-8  
-16  
-20  
-100  
-200  
-10 -20  
-5  
Drain Current I  
D
-50  
-1 -2  
V
(V)  
(A)  
GS  
Static Drain to Source on State Resistance  
vs. Temperature  
Forward Transfer Admittance vs.  
Drain Current  
500  
40  
Pulse Test  
V
= -10 V  
DS  
200 Pulse Test  
-10 A  
32  
24  
16  
100  
50  
Tc = –25°C  
V
= -4.5 V  
GS  
20  
10  
5
I
= -2,-5 A  
D
25°C  
75°C  
-2, -5, -10 A  
120  
2
1.0  
0.5  
8
0
-10 V  
-40  
0
40  
80  
160  
0.1  
1.0  
Drain Current  
10  
100  
Case Temperature Tc (°C)  
I
(A)  
D
Rev.5.00, Aug.27.2003, page 5 of 9  
HAT1047R, HAT1047RJ  
Body-Drain Diode Reverse  
Recovery Time  
Typical Capacitance vs.  
Drain to Source Voltage  
30000  
10000  
500  
V
= 0  
GS  
f = 1 MHz  
200  
100  
Ciss  
50  
1000  
100  
Coss  
Crss  
20  
10  
di / dt = 100 A / µs  
= 0, Ta = 25°C  
V
GS  
-5 -10 -20  
Reverse Drain Current  
-1  
-2  
-50 -100  
(A)  
0
-10  
-20  
-30  
-40  
DS  
-50  
(V)  
I
DR  
Drain to Source Voltage V  
Dynamic Input Characteristics  
Switching Characteristics  
= -10 V, V = -10 V  
1000  
500  
0
0
V
GS  
DD  
V
= - 5 V  
-10 V  
DD  
PW = 5 µs, duty < 1 %  
-25 V  
-10  
-20  
-30  
-40  
-50  
-4  
-8  
-12  
200  
100  
50  
t
V
r
f
DS  
t
d(off)  
V
V
= - 5 V  
-10 V  
GS  
DD  
t
-25 V  
20  
10  
t
d(on)  
-16  
-20  
I
= -14 A  
16  
D
-10 -20  
-0.1 -0.2  
-1 -2  
-0.5  
Drain Current  
-5  
(A)  
0
32  
48  
64  
80  
Gate Charge Qg (nc)  
I
D
Rev.5.00, Aug.27.2003, page 6 of 9  
HAT1047R, HAT1047RJ  
Maximum Avalanche Energy vs.  
Channel Temperature Derating  
Reverse Drain Current vs.  
Source to Drain Voltage  
20  
16  
12  
8
-50  
-40  
-30  
-20  
-10  
I
= -14 A  
AP  
-10 V  
V
= -15 V  
DD  
duty < 0.1 %  
-5V  
Rg > 50  
V
= 0, 5 V  
GS  
4
0
Pulse Test  
0
-0.4  
-0.8  
-1.2  
-1.6  
-2.0  
(V)  
25  
50  
75  
100  
125  
150  
Channel Temperature Tch (°C)  
Source to Drain Voltage  
V
SDF  
Avalanche Test Circuit  
Avalanche Waveform  
V
DSS  
1
2
AP2  
E
=
L I  
AR  
V
- V  
DD  
DSS  
L
V
DS  
Monitor  
I
AP  
Monitor  
V
(BR)DSS  
I
AP  
Rg  
V
V
DD  
D. U. T  
DS  
I
D
Vin  
-15 V  
50Ω  
V
DD  
0
Rev.5.00, Aug.27.2003, page 7 of 9  
HAT1047R, HAT1047RJ  
Normalized Transient Thermal Impedance vs. Pulse Width  
10  
D = 1  
1
0.5  
0.1  
0.1  
θ
θ
γ
θ
ch - f(t) = s (t) x ch - f  
ch - f = 83.3°C/W, Ta = 25°C  
0.01  
0.001  
When using the glass epoxy board  
(FR4 40 x 40 x 1.6 mm)  
PW  
T
P
DM  
D =  
PW  
T
0.0001  
100 µ  
1 m  
10 m  
100 m  
1
10  
100  
1000  
1000  
10 µ  
Pulse Width PW (S)  
Switching Time Test Circuit  
Vin Monitor  
Switching Time Waveform  
10%  
Vout  
Monitor  
Vin  
D.U.T.  
Rg  
R
L
90%  
90%  
10%  
V
DD  
= -10 V  
Vin  
-10 V  
90%  
10%  
Vout  
td(off)  
tr  
td(on)  
t
f
Rev.5.00, Aug.27.2003, page 8 of 9  
HAT1047R, HAT1047RJ  
Package Dimensions  
As of January, 2003  
Unit: mm  
4.90  
5.3 Max  
8
5
1
4
+ 0.10  
– 0.30  
6.10  
0.75 Max  
1.27  
1.08  
0˚ – 8˚  
+ 0.67  
– 0.20  
0.60  
*0.42 0.08  
0.40 0.06  
0.15  
M
0.25  
Package Code  
JEDEC  
JEITA  
FP-8DA  
Conforms  
*Dimension including the plating thickness  
Base material dimension  
Mass (reference value)  
0.085 g  
Rev.5.00, Aug.27.2003, page 9 of 9  
Sales Strategic Planning Div. Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan  
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1. Renesas Technology Corp. puts the maximum effort into making semiconductor products better and more reliable, but there is always the possibility that trouble  
may occur with them. Trouble with semiconductors may lead to personal injury, fire or property damage.  
Remember to give due consideration to safety when making your circuit designs, with appropriate measures such as (i) placement of substitutive, auxiliary  
circuits, (ii) use of nonflammable material or (iii) prevention against any malfunction or mishap.  
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