7705001CX [RAYTHEON]
Phase Locked Loop, CDIP14, CERAMIC, DIP-14;
| 型号： | 7705001CX |
| 厂家： | 
RAYTHEON COMPANY |
| 描述： | Phase Locked Loop, CDIP14, CERAMIC, DIP-14 CD |
| 文件： | 总11页 (文件大小：60K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
REVISIONS
LTR
A
DESCRIPTION
DATE (YR-MO-DA)
87-10-02
APPROVED
R. P. EVANS
Changes to military drawing format. Sole source Raytheon requires electrical
changes in order to supply part.
B
C
D
Changes in accordance with NOR 5962-R046-93.
Changes in accordance with NOR 5962-R192-93.
Updated drawing to reflect current requirements. Redrawn. -rrp
93-01-19
93-07-23
03-11-24
M. A. FRYE
M. A. FRYE
R. MONNIN
THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED.
CURRENT CAGE CODE 67268
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
PMIC N/A
REV
D
1
D
2
D
3
D
4
D
5
D
6
D
7
D
8
D
9
D
SHEET
10
PREPARED BY
A. J. FOLEY
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216
CHECKED BY
STANDARD
MICROCIRCUIT
DRAWING
C. R. JACKSON
http://www.dscc.dla.mil
APPROVED BY
N. A. HAUCK
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
MICROCIRCUIT, LINEAR, PHASE-LOCKED LOOP
SYSTEM, MONOLITHIC SILICON
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
DRAWING APPROVAL DATE
77-12-14
AMSC N/A
REVISION LEVEL
D
SIZE
A
CAGE CODE
77050
14933
SHEET
1
OF
10
DSCC FORM 2233
APR 97
5962-E060-04
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
1. SCOPE
1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in
accordance with MIL-PRF-38535, appendix A.
1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example:
77050
01
C
X
Drawing number
Device type
(see 1.2.1)
Case outline
(see 1.2.2)
Lead finish
(see 1.2.3)
1.2.1 Device type(s). The device type(s) identify the circuit function as follows:
Device type
01
Generic number
2211
Circuit function
Phase-locked loop system
1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
C
Descriptive designator
Terminals
14
Package style
Dual-in-line
GDIP1-T14 or CDIP2-T14
1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A.
1.3 Absolute maximum ratings.
Supply voltage range .................................................................................. 4.5 V to 20 V
Input signal level ......................................................................................... 3 V rms
Storage temperature range ......................................................................... -65°C to +150°C
Maximum power dissipation (PD) ................................................................ 750 mW 1/
Lead temperature (soldering, 10 seconds) ................................................. +300°C
Thermal resistance, junction-to-case (θJC) .................................................. See MIL-STD-1835
Junction temperature (TJ) ........................................................................... +175°C
1.4 Recommended operating conditions.
Ambient operating temperature range ........................................................ -55°C to +125°C
1/ For TA > +25°C, derate linearly 6 mW/°C
SIZE
STANDARD
MICROCIRCUIT DRAWING
77050
A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
D
SHEET
2
DSCC FORM 2234
APR 97
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a
part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed
in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in
the solicitation.
SPECIFICATION
DEPARTMENT OF DEFENSE
MIL-PRF-38535 -- Integrated Circuits, Manufacturing, General Specification for.
STANDARDS
DEPARTMENT OF DEFENSE
MIL-STD-883
-
Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.
HANDBOOKS
DEPARTMENT OF DEFENSE
MIL-HDBK-103 -- List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-
JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer
Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-
PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying
activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan
may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device.
These modifications shall not affect the PIN as described herein. A "Q" or "QML" certification mark in accordance with MIL-
PRF-38535 is required to identify when the QML flow option is used.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as
specified in MIL-PRF-38535, appendix A and herein.
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table I and shall apply over the full ambient operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are described in table I.
SIZE
STANDARD
77050
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
D
SHEET
3
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Conditions
+VCC = +12 V,
Group A
subgroups
Device
type
Limits
Unit
Test
Symbol
RO = 30 kΩ,
CO = 0.033 µF,
-55°C ≤ TA ≤ +125°C
unless otherwise
specified
Min
Max
OSCILLATOR
Supply current
ICC
1
2, 3
4
01
01
9
mA
RO ≥ 10 kΩ
12
±3
±8
±50
Frequency accuracy
fOSC
Deviation from
fO = 1/ROCO
%
5, 6
4, 5, 6
Frequency stability
temperature
coefficient 1/
Power supply
rejection ratio
01
∆f / (t(min) – t(max)
)
RO = 500 kΩ,
ppm/°C
%/V
CO = 2.0 nF
PSRR
4
5, 6
7
01
01
01
0.01
100
0.5
2.0
V+ = 12 ± 1 V,
see figure 3
Upper frequency limit
1 x 103 kHz
∆fOSC(max)
RO = 8.2 kΩ,
CO = 400 pF
Lowest operating
frequency
fOSC(min)
7
0.01
Hz
RO = 2 MΩ, CO = 50 µF
TIMING RESISTOR, RO
See figure 4
Operating range
R01
R02
See figures 2 and 3
See figures 2 and 3
7
7
01
01
5
2000
100
kΩ
kΩ
Recommended
range 1/
15
LOOP PHASE DETECTOR
Peak output current
IOP
Measured at pin 11
Referenced to pin 10
1
01
01
±150
±100
±4
±300
±350
µA
2, 3
1
Maximum swing
VO
V
2, 3
±3.5
QUADRATURE PHASE DETECTOR
Peak output current
Maximum swing
INPUT PREAMP
IOP
VO
Measured at pin 3
1
1
01
01
100
5
750
12
µA
VPP
Input signal (voltage
required to cause
limiting)
VIN(MAX)
1
01
0.1
10
mV(rms)
VOLTAGE COMPARATOR
Voltage gain 1/
AVO
1
1
01
01
55
100
dB
RL = 5.1 kΩ
Output leakage
current
ILOUT
VO = 12 V
0.001 0.1
µA
Output voltage low
VOUT(min)
IC = 1.2 mA
1
01
01
50
500
mV
V
INTERNAL REFERENCE
Voltage level VREF
Measured at pin 10
1
4.9
5.7
2, 3
4.75
5.85
1/ Guaranteed, if not tested to the limits specified herein.
SIZE
STANDARD
77050
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
D
SHEET
4
DSCC FORM 2234
APR 97
Device type
01
Case outline
C
Terminal number
Terminal symbol
1
2
3
4
5
6
+VCC
INPUT
LOCK DETECT FILTER
GND
LOCK DETECT OUTPUT Q
LOCK DETECT OUTPUT Q
DATA OUTPUT
7
8
9
FSK COMP INPUT
NC
10
11
12
13
14
REF VOLTAGE OUT
LOOP φ DET OUT
TIMING RESISTOR
TIMING CAPACITOR
TIMING CAPACITOR
NC = No connect
FIGURE 1. Terminal connections.
FIGURE 2. Typical center frequency drift vs temperature.
SIZE
STANDARD
77050
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
D
SHEET
5
DSCC FORM 2234
APR 97
FIGURE 3. Typical fO vs power supply characteristics.
SIZE
STANDARD
77050
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
D
SHEET
6
DSCC FORM 2234
APR 97
FIGURE 4. VCO frequency vs timing resistor.
SIZE
STANDARD
77050
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
D
SHEET
7
DSCC FORM 2234
APR 97
3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN
listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked as listed in MIL-HDBK-103 (see 6.6 herein). For
packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the
option of not marking the "5962-" on the device.
3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance
to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a "Q" or "QML" certification mark in
accordance with MIL-PRF-38535 to identify when the QML flow option is used.
3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an
approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to
listing as an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-PRF-
38535, appendix A and the requirements herein.
3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided
with each lot of microcircuits delivered to this drawing.
3.8 Notification of change. Notification of change to DSCC-VA shall be required in accordance with MIL-PRF-38535,
appendix A.
3.9 Verification and review. DSCC, DSCC's agent, and the acquiring activity retain the option to review the manufacturer's
facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the
reviewer.
4. QUALITY ASSURANCE PROVISIONS
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,
appendix A.
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
prior to quality conformance inspection. The following additional criteria shall apply:
a. Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A or C. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
test method 1015 of MIL-STD-883.
(2) TA = +125°C, minimum.
b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3.1 Group A inspection.
a. Tests shall be as specified in table II herein.
b. Subgroups 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.
SIZE
STANDARD
77050
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
D
SHEET
8
DSCC FORM 2234
APR 97
TABLE II. Electrical test requirements.
MIL-STD-883 test requirements
Subgroups
(in accordance with
MIL-STD-883, method 5005,
table I)
----
Interim electrical parameters
(method 5004)
Final electrical test parameters
(method 5004)
1*, 2, 3, 4, 5, 6
1, 2, 3, 4, 5, 6, 7
1
Group A test requirements
(method 5005)
Groups C and D end-point
electrical parameters
(method 5005)
* PDA applies to subgroup 1.
4.3.2 Groups C and D inspections.
a. End-point electrical parameters shall be as specified in table II herein.
b. Steady-state life test conditions, method 1005 of MIL-STD-883.
(1) Test condition A or C. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified
in test method 1005 of MIL-STD-883.
(2) TA = +125°C, minimum.
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-
prepared specification or drawing.
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
SIZE
STANDARD
77050
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
D
SHEET
9
DSCC FORM 2234
APR 97
6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus when a system application
requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for
coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962)
should contact DSCC-VA, telephone (614) 692-0544.
6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43216-5000, or telephone
(614) 692-0547.
6.6 Approved sources of supply. Approved sources of supply are listed in MIL-HDBK-103. The vendors listed in MIL-
HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted
by DSCC-VA.
SIZE
STANDARD
77050
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
D
SHEET
10
DSCC FORM 2234
APR 97
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 03-11-24
Approved sources of supply for SMD 77050 are listed below for immediate acquisition information only and shall be
added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised to
include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of
compliance has been submitted to and accepted by DSCC-VA. This bulletin is superseded by the next dated
revision of MIL-HDBK-103 and QML-38535.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
0C7V7
Vendor
similar
PIN 2/
RM2211
7705001CA
1/ The lead finish shown for each PIN representing
a hermetic package is the most readily available
from the manufacturer listed for that part. If the
desired lead finish is not listed contact the vendor
to determine its availability.
2/ Caution. Do not use this number for item
acquisition. Items acquired to this number may not
satisfy the performance requirements of this drawing.
Vendor CAGE
number
Vendor name
and address
0C7V7
QP Semiconductor
2945 Oakmead Village Court
Santa Clara, CA 95051
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.
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