5962-8958102PA_技术文档

REVISIONS

LTR

A

DESCRIPTION

DATE (YR-MO-DA)

91-10-29

APPROVED

M. A. FRYE

Added one vendor, CAGE 1ES66. Made change to table I and figure 1.

Editorial changes throughout.

B

Add device class V and radiation hardness requirements. Make change to

footnote six as specified in table I. Make change to groups C and D endpoints

as specified in table IIA and add table IIB. Delete CAGE 07933. Replace

CAGE 06665 with CAGE 24355. - ro

00-05-31

R. MONNIN

C

D

Add device types 03 and 04. Make changes to 1.2.2 and to output voltage

noise test as specified in table I. - ro

01-02-06

02-04-15

R. MONNIN

Add case outline H. - ro

THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED.

REV

SHEET

REV

SHEET

REV STATUS

OF SHEETS

PMIC N/A

REV

D

1

D

2

D

3

D

4

D

5

D

6

D

7

D

8

D

9

D

SHEET

10

11

12

PREPARED BY

RICK C. OFFICER

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216

CHECKED BY

CHARLES E. BESORE

STANDARD

MICROCIRCUIT

DRAWING

http://www.dscc.dla.mil

APPROVED BY

MICHAEL A. FRYE

THIS DRAWING IS AVAILABLE

FOR USE BY ALL

MICROCIRCUIT, LINEAR, POSITIVE 10-VOLT

ADJUSTABLE PRECISION VOLTAGE

DEPARTMENTS

AND AGENCIES OF THE

DEPARTMENT OF DEFENSE

REFERENCE, MONOLITHIC SILICON

DRAWING APPROVAL DATE

89-07-17

AMSC N/A

REVISION LEVEL

D

SIZE

A

CAGE CODE

5962-89581

67268

SHEET

1

OF

12

DSCC FORM 2233

APR 97

5962-E305-02

DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.

1. SCOPE

1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and

M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the

Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the

PIN.

1.2 PIN. The PIN is as shown in the following examples.

For device classes M and Q:

5962

-

89581

01

G

X

Federal

stock class

designator

\

RHA

designator

(see 1.2.1)

Device

type

(see 1.2.2)

Case

outline

(see 1.2.4)

Lead

finish

(see 1.2.5)

/

\/

Drawing number

For device class V:

5962

R

89581

01

V

G

X

Federal

RHA

designator

(see 1.2.1)

Device

type

(see 1.2.2)

Device

class

designator

(see 1.2.3)

Case

outline

(see 1.2.4)

Lead

finish

(see 1.2.5)

stock class

designator

\

/

\/

Drawing number

1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and

are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A

specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

1.2.2 Device type(s). The device type(s) identify the circuit function as follows:

Device type

Generic number

REF01A

Circuit function

Output voltage noise

01

02

03

04

Precision reference +10-volt

adjustable output

30 µV

P-P

REF01

Precision reference +10-volt

adjustable output

30 µV

REF01A

Precision reference +10-volt

adjustable output

150 µV

REF01

Precision reference +10-volt

adjustable output

SIZE

STANDARD

5962-89581

A

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

REVISION LEVEL

SHEET

D

2

DSCC FORM 2234

APR 97

1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as listed

below. Since the device class designator has been added after the original issuance of this drawing, device classes M and Q

designators will not be included in the PIN and will not be marked on the device.

Device class

M

Device requirements documentation

Vendor self-certification to the requirements for MIL-STD-883 compliant,

non-JAN class level B microcircuits in accordance with MIL-PRF-38535,

appendix A

Q or V

Certification and qualification to MIL-PRF-38535

1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:

Outline letter

Descriptive designator

Terminals

Package style

G

H

P

2

MACY1-X8

8

10

8

Can

Flat pack

Dual-in-line

Square leadless chip carrier

GDFP1-F10 or CDFP2-F10

GDIP1-T8 or CDIP2-T8

CQCC1-N20

20

1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,

appendix A for device class M.

1.3 Absolute maximum ratings. 1/

Input voltage (V ) .......................................................................................... 40 V dc

IN

Power dissipation (P ) ................................................................................... 500 mW 2/

D

Output short circuit duration ........................................................................... Indefinite

Storage temperature range ............................................................................ -65°C to +150°C

Lead temperature (soldering, 10 seconds) ..................................................... +300°C

Junction temperature (T ) ............................................................................... +150°C

J

Thermal resistance, junction-to-case (θ ) .................................................... See MIL-STD-1835

JC

1.4 Recommended operating conditions.

Ambient operating temperature range (T ) .................................................... -55°C to +125°C

A

1.5 Radiation features. 3/

Maximum total dose available (dose rate = 50 – 300 rads(Si)/s) ................... 100 Krads

______

1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the

maximum levels may degrade performance and affect reliability.

2/ Derate above +80°C, 7.1 mW/°C for case outline G. Derate above +75°C, 6.6 mW/°C for case outline P.

Derate above +72°C, 7.8 mW/°C for case outline 2. Derate above +85°C, 5.6 mW/°C for case outline H.

3/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects.

Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883,

method 1019, condition A.

SIZE

STANDARD

5962-89581

A

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

REVISION LEVEL

SHEET

D

3

DSCC FORM 2234

APR 97

2. APPLICABLE DOCUMENTS

2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a

part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in

the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the

solicitation.

SPECIFICATION

DEPARTMENT OF DEFENSE

MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.

STANDARDS

DEPARTMENT OF DEFENSE

MIL-STD-883

-

Test Method Standard Microcircuits.

MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.

HANDBOOKS

DEPARTMENT OF DEFENSE

MIL-HDBK-103 - List of Standard Microcircuit Drawings.

MIL-HDBK-780 - Standard Microcircuit Drawings.

(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization

Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)

2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text

of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a

specific exemption has been obtained.

3. REQUIREMENTS

3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with

MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The

modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for

device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified

herein.

3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified

in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.

3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein.

3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.

3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be as specified on figure 2.

3.3 Electrical performance characteristics and post irradiation parameter limits. Unless otherwise specified herein, the

electrical performance characteristics and post irradiation parameter limits are as specified in table I and shall apply over the

full ambient operating temperature range.

SIZE

STANDARD

5962-89581

A

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

REVISION LEVEL

SHEET

D

4

DSCC FORM 2234

APR 97

TABLE I. Electrical performance characteristics.

Conditions 1/ 2/ 3/

-55°C ≤ T ≤ +125°C

unless otherwise specified

Group A

subgroups

Device

type

Limits

Max

Unit

A

Test

Symbol

Min

Quiescent supply current

No load

1

2,3

1

All

1.4

2.0

1.4

mA

I

SY

M,D,P,L,R

01

All

Output adjustment range

Output voltage

1

%

V

±3.0

∆V

R

= 10 kΩ, 4/

= +25°C

TRIM

P

T

A

1

01,03

02,04

01,03

02,04

01

9.97

9.95

10.03

10.05

V

I = 0 mA

L

OUT

2,3

9.955 10.045

9.905 10.095

M,D,P,L,R

1

9.94

+15

-0.3

10.06

+60

Short circuit current

Sink current

01,03

All

mA

I

V

O

= 0 V, T = +25°C 4/

OS

A

mA

T

A

= +25°C 4/

S

Load regulation

LD reg

01,03

02,04

01

0.008

0.010

0.015

0.012

0.015

0.01

%/mA

I = 0 mA to 10 mA 5/ 6/

L

M,D,P,L,R

1

2,3

01,03

02,04

All

I = 0 mA to 8 mA 5/ 6/

L

Line regulation

LN reg

1

2,3

1

%/V

V

IN

= 13 V to 33 V 5/

0.015

0.03

M,D,P,L,R

T = +25°C 4/ 7/

A

01

All

Load current

1

10

8

mA

I

L

2,3

4

Output voltage noise

0.1 Hz to 10 Hz 4/

01,02

03,04

30

µVp-p

e

np-p

150

See footnotes at end of table.

SIZE

STANDARD

5962-89581

A

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

REVISION LEVEL

SHEET

D

5

DSCC FORM 2234

APR 97

TABLE I. Electrical performance characteristics – Continued.

Conditions 1/ 2/ 3/

-55°C ≤ T ≤ +125°C

unless otherwise specified

Group A

subgroups

Device

type

Limits

Max

Unit

A

Test

Symbol

Min

Output voltage

temperature coefficient

5,6

01,03

02,04

±8.5

ppm/°C

T

CVO

-55°C ≤ T ≤ +125°C 4/ 8/

A

±25

1/ V = 15 V, unless otherwise specified.

IN

2/ Devices supplied to this drawing meet all levels M, D, P, L, and R of irradiation however this device is only tested at the

R level. Pre and post irradiation values are identical unless otherwise specified in table I. When performing post

irradiation electrical measurements for any RHA level, T = +25°C.

A

3/ These parts may be dose rate sensitive in a space environment and may demonstrate low dose rate effects. Radiation end

point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019,

condition A.

4/ Not tested post irradiation.

5/ Line and load regulation specifications include the effect of self-heating.

6/ LD

= (∆V

/ ∆I

) / V

x 100 = % / mA.

reg

OUT

7/ Minimum load current guaranteed by load regulation test.

6

8/ TCV = ABS (( V

– V

) / 10 V) x (1/180°C) x (10 ) where –55°C ≤ T ≤ +125°C.

MIN A

O

MAX

3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical

tests for each subgroup are defined in table I.

3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be

marked as listed in MIL-HDBK-103. For packages where marking of the entire SMD PIN number is not feasible due to space

limitations, the manufacturer has the option of not marking the "5962-" on the device. For RHA product using this option, the

RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535.

Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A.

3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in

MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.

3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535

listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of

compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see

6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this

drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535

and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.

SIZE

STANDARD

5962-89581

A

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

REVISION LEVEL

SHEET

D

6

DSCC FORM 2234

APR 97

Device types

Case outlines

01, 02, 03 and 04

G and P

NC

H

Terminal symbol

NC

2

Terminal

number

1

NC

2

3

V

IN

V

IN

NC

4

GND

TRIM

GND

TRIM

5

V

IN

6

NC

V

OUT

7

NC

---

NC

---

8

NC

9

NC

10

11

12

13

14

15

16

17

18

19

20

GND

NC

---

TRIM

NC

---

NC

---

V

OUT

---

NC

---

NC = No connection

FIGURE 1. Terminal connections.

SIZE

STANDARD

MICROCIRCUIT DRAWING

5962-89581

A

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

REVISION LEVEL

SHEET

D

7

DSCC FORM 2234

APR 97

FIGURE 2. Radiation exposure circuit.

SIZE

STANDARD

5962-89581

A

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

REVISION LEVEL

SHEET

D

8

DSCC FORM 2234

APR 97

3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for

device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.

3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2

herein) involving devices acquired to this drawing is required for any change as defined in MIL-PRF-38535, appendix A.

3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain

the option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made

available onshore at the option of the reviewer.

3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in

microcircuit group number 59 (see MIL-PRF-38535, appendix A).

4. QUALITY ASSURANCE PROVISIONS

4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with

MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan

shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be

in accordance with MIL-PRF-38535, appendix A.

4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted

on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in

accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.

4.2.1 Additional criteria for device class M.

a. Burn-in test, method 1015 of MIL-STD-883.

(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision

level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall

specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in

test method 1015.

(2) T_A= +125°C, minimum.

b. Interim and final electrical test parameters shall be as specified in table IIA herein.

4.2.2 Additional criteria for device classes Q and V.

a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the

device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under

document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with

MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall

specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test

method 1015 of MIL-STD-883.

b. Interim and final electrical test parameters shall be as specified in table IIA herein.

c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in

MIL-PRF-38535, appendix B.

4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in

accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for

groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).

SIZE

STANDARD

5962-89581

A

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

REVISION LEVEL

SHEET

D

9

DSCC FORM 2234

APR 97

TABLE IIA. Electrical test requirements.

Test requirements

Subgroups

(in accordance with

MIL-STD-883,

MIL-PRF-38535, table III)

method 5005, table I)

Device

class M

Device

class Q

Device

class V

Interim electrical

1,2,3

1

parameters (see 4.2)

Final electrical

1,2,3,4 1/

1,2,3,4,5,6 1/ 2/

parameters (see 4.2)

Group A test

1,2,3,4,5,6

requirements (see 4.4)

Group C end-point electrical

parameters (see 4.4)

1

1 2/

1

Group D end-point electrical

parameters (see 4.4)

Group E end-point electrical

parameters (see 4.4)

1

1/ PDA applies to subgroup 1. Delta measurement is excluded from PDA.

2/ Delta limits as specified in table IIB shall be required where specified, and delta limits shall

be computed with reference to the previous endpoint electrical parameters.

TABLE IIB. Delta limits at (+25°C).

Parameter

Device type

End-point

Delta

Max

Unit

V

Min

9.97

Max

01

10.03

±0.006

V

OUT

4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with

MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified herein. Quality conformance inspection for

device class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed

for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections

(see 4.4.1 through 4.4.4).

4.4.1 Group A inspection.

a. Tests shall be as specified in table IIA herein.

b. Subgroups 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.

4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein.

SIZE

STANDARD

5962-89581

A

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

REVISION LEVEL

SHEET

D

10

DSCC FORM 2234

APR 97

4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:

a. Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level

control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify

the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method

1005 of MIL-STD-883.

b.

T = +125°C, minimum.

A

c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.

4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,

or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The

test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with

MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify

the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of

MIL-STD-883.

4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein.

4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured

(see 3.5 herein). RHA levels for device classes M, Q and V shall be as specified in MIL-PRF-38535 and the end-point electrical

parameters shall be as specified in table IIA herein.

4.4.4.1 Total dose irradiation testing. Total dose irradiation testing shall be performed in accordance with MIL-STD-883

method 1019, condition A, and as specified herein.

5. PACKAGING

5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device

classes Q and V or MIL-PRF-38535, appendix A for device class M.

6. NOTES

6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications

(original equipment), design applications, and logistics purposes.

6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a

contractor-prepared specification or drawing.

6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for

the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.

6.3 Record of users. Military and industrial users should inform Defense Supply Center Columbus when a system

application requires configuration control and which SMD's are applicable to that system. DSCC will maintain a record of users

and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering

microelectronic devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0544.

6.4 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43216-5000, or telephone

(614) 692-0547.

6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in

MIL-PRF-38535 and MIL-HDBK-1331.

SIZE

STANDARD

5962-89581

A

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

REVISION LEVEL

SHEET

D

11

DSCC FORM 2234

APR 97

6.6 Sources of supply.

6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in QML-38535.

The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein) to DSCC-VA and have agreed to

this drawing.

6.6.2 Approved sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103.

The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been

submitted to and accepted by DSCC-VA.

SIZE

STANDARD

5962-89581

A

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

REVISION LEVEL

SHEET

D

12

DSCC FORM 2234

APR 97

STANDARD MICROCIRCUIT DRAWING BULLETIN

DATE: 02-04-15

Approved sources of supply for SMD 5962-89581 are listed below for immediate acquisition information only and

shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be

revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a

certificate of compliance has been submitted to and accepted by DSCC-VA. This bulletin is superseded by the next

dated revision of MIL-HDBK-103 and QML-38535.

Standard

microcircuit drawing

PIN 1/

Vendor

CAGE

number

Vendor

similar

PIN 2/

5962-8958101GA

24355

3/

REF01AJ/883C

REF01AH/883B

REF01AT/883B

REF01AJ/883B

REF01AZ/883C

REF01AJ8/883B

REF01AZ/883B

REF01ADE/883B

REF01ARC/883C

REF01ARC/883B

REF01AJ/QMLV

REF01AL/QMLV

REF01AZ/QMLV

REF01ARC/QMLV

REF01AJ/QMLR

REF01AL/QMLR

REF01AZ/QMLR

REF01ARC/QMLR

3/

5962-8958101GC

5962-8958101PA

3/

24355

3/

5962-89581012A

5962-89581012C

24355

3/

5962-8958101VGA

5962-8958101VHA

5962-8958101VPA

5962-8958101V2A

5962R8958101VGA

5962R8958101VHA

5962R8958101VPA

5962R8958101V2A

24355

1 of 3

STANDARD MICROCIRCUIT DRAWING BULLETIN - Continued

Standard

microcircuit drawing

PIN 1/

Vendor

CAGE

number

Vendor

similar

PIN 2/

5962-8958102GA

3/

REF01J/883C

REF01T/883B

REF01J/883B

REF01Z/883C

REF01Z/883B

REF01DE/883B

REF01RC/883C

REF01RC/883B

REF01AJ/883B

REF01AZ/883B

REF01ARC/883B

REF01J/883B

REF01Z/883B

REF01RC/883B

5962-8958102GC

5962-8958102PA

3/

5962-89581022A

5962-89581022C

5962-8958103GC

5962-8958103PA

5962-89581032C

5962-8958104GC

5962-8958104PA

5962-89581042C

24355

3/

1ES66

1/ The lead finish shown for each PIN representing a hermetic

package is the most readily available from the manufacturer

listed for that part. If the desired lead finish is not listed

contact the vendor to determine its availability.

2/ Caution. Do not use this number for item acquisition. Items

acquired to this number may not satisfy the performance

requirements of this drawing.

3/ Not available from approved source of supply.

2 of 3

STANDARD MICROCIRCUIT DRAWING BULLETIN - Continued

Vendor CAGE

number

Vendor name

and address

1ES66

Maxim Integrated Products, Incorporated

120 San Gabriel Drive

Sunnyvale, CA 94086-5125

24355

Analog Devices, Incorporated

Route 1 Industrial Park

P.O. Box 9106

Norwood, MA 02062

Point of contact: 1500 Space Park Drive

P.O. Box 58020

Santa Clara, CA 95050-8020

The information contained herein is disseminated for convenience only and the

Government assumes no liability whatsoever for any inaccuracies in the

information bulletin.

3 of 3


型号：	5962-8958102PA
厂家：	RAYTHEON COMPANY
描述：	Three Terminal Voltage Reference, 1 Output, 10V, Trim/Adjustable, BIPolar, CDIP8, GLASS SEALED, CERDIP-8 CD
文件：	总15页 (文件大小：62K)
中文：	中文翻译
下载：	下载PDF数据表文档文件

5962-8958102PA [RAYTHEON]

相关型号：

5962-8958102PB

5962-8958102PX

5962-8958103GX

5962-8958103PA

5962-8958103PX

5962-89581042C

5962-8958104PA

5962-89582012A

5962-89582012X

5962-8958201EX

5962-8958201FA

5962-8958201FX