MC146012EGR2 [NXP]
IC,SMOKE DETECTOR,SOP,16PIN,PLASTIC;
| 型号： | MC146012EGR2 |
| 厂家： | 
NXP |
| 描述： | IC,SMOKE DETECTOR,SOP,16PIN,PLASTIC 光电二极管 |
| 文件： | 总18页 (文件大小：504K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
Document Number: MC146012
Rev 0, 09/2005
Freescale Semiconductor
Technical Data
Low Power CMOS Photoelectric
Smoke Detector IC
MC146012
The MC146012 is an advanced smoke detector component containing
sophisticated very-low power analog and digital circuitry. The IC, when used with
an infrared photoelectric chamber and a small number of external components,
will detect smoke by sensing scattered light from smoke particles. When
detection occurs, a pulsating alarm is sounded via on-chip push-pull drivers and
an external piezoelectric transducer.
LOW POWER CMOS
PHOTOELECTRIC SMOKE
DETECTOR IC
The MC146012 provides both audible and visual alarms. Upon sensing a
normal smoke level, both alarms will be activated. It is possible to mute the
audible alarm for approximately eight minutes through the Integrated Mute
Function (IMF), although the LED will continue to flash at a high rate. This feature
is resetable through a pushbutton test. The IMF feature will be overridden by
remote smoke, high smoke level, timeout or reset.
The Alarm memory feature will allow for identification of an alarming detector.
Through a pushbutton test, the LED will flash rapidly if there was a previous
alarm condition detected at the unit.
The variable-gain photo amplifier allows direct interface to IR detector
(photodiode). The gain settings are determined by external capacitors and
compensation resistors. A two stage speed-up is incorporated into the smoke
monitor to minimize time and help reduce false triggering. Further reduction of
false triggering is also addressed with the double sample chamber sensitivity and
double I/O sample.
16
1
ED SUFFIX
PLASTIC DIP
CASE 648-08
16
Features
1
•
•
•
•
•
•
•
•
•
•
•
Integrated Mute Function (IMF) to Temporarily Disable Horn
Alarm Memory to Help Identify Alarming Unit
Speed-Up Sampling Rate After First Detection of Smoke
Double Sample for Degraded Chamber Sensitivity Monitor
Digital Noise Filter on the I/O Pin
EG SUFFIX
SOG PACKAGE
CASE 751G-04
Power-Up and Power-Down RESET
Low-Battery Trip Point Set Externally
Temporal Horn Pattern
Operating Temperature: -10 to 75°C
Operating Voltage Range: 6.0 to 12 V
Average Supply Current: 6.5 µA
ORDERING INFORMATION
Device
Temp. Range
-10 to 75°C
-10 to 75°C
Case No.
648-08
Package
Plastic Dip
MC146012ED
MC146012EG
751G-04
SOG Package
© Freescale Semiconductor, Inc., 2005. All rights reserved.
C1 C2
2
1
ALARM,
MUTE,
& RESET
LOGIC
3
-
DETECT
AMP
7
SMOKE
I/O
COMP
V
V
DD - 3.5 V
DD - 4.0 V
+
REF
8
9
GATE
BRASS
SILVER
HORN MODULATOR
12
ON/OFF
AND DRIVER
OSC
OSC
TIMING
LOGIC
13
16
10
6
R1
FEEDBACK
IRED
GATE
TEST
V
DD - 5.0 V
REF
ON/OFF
11
LED
4
STROBE
-
PIN 5 = VDD
PIN 14 = VSS
COMP
15
LOW-SUPPLY
TRIP
+
Figure 1. Block Diagram
1
TEST/MUTE
C1
16
LOW-SUPPLY
TRIP
C2
DETECT
STROBE
VDD
2
3
4
5
15
14
13
12
VSS
R1
OSC
6
7
8
LED
IRED
I/O
11
10
9
FEEDBACK
SILVER
BRASS
Figure 2. Pin Assignment (16-Pin DIP)
MC146012
Sensors
Freescale Semiconductor
2
Table 1. Maximum Ratings(1) (Voltages Referenced to VSS
)
Symbol
VDD
Parameter
Value
Unit
V
DC Supply Voltage
DC Input Voltage
-0.5 to +12
VIN
C1, C2, Detect
Osc, Low-Supply Trip
-0.25 to VDD +0.25
-0.25 to VDD +0.25
-0.25 to VDD +10
-15 to +25
V
I/O
Feedback
Test
-1.0 to VDD +0.25
IIN
IOUT
IDD
DC Input Current, per Pin
DC Output Current, per Pin
±10
±25
mA
mA
mA
DC Supply Current, VDD/VSS pins
(15 Seconds in Reverse Dir.)
+25 Forward
-150 Reverse
PD
Power Dissipation
† in Stil Air, 5 sec.
†† Continuous
1200(2)
350(3)
mW
Tstg
TA
Storage Temperature
Operating Temperature
-55 to +125
-25 to +75
260
°C
°C
°C
TL
Lead Temperature, 1 mm from case for 10 seconds
1. Maximum ratings are those values beyond which damage to the device may occur. Functional operation should be restricted to the limits in
the electrical characteristics tables.
2. Derating: -12 mW/°C from 25°C to 60°C.
3. Derating: -3.5 mW/°C from 25°C to 60°C.
This device contains protection circuitry to guard against
damage due to high static voltages or electric fields.
However, precautions must be taken to avoid applications of
voltages any higher than maximum rated voltages to this
high-impedance circuit. For proper operation, VIN and VOUT
should be constrained to a range of VSS ≤ (VIN or
VOUT) ≤ VDD except for I/O pin which can exceed VDD, and
the Test/Mute input, which can go below VSS
Unused inputs must always be tied to an appropriate logic
voltage level (e.g. either VSS or VDD). Unused outputs and/or
an unused I/O must be left open.
.
Table 2. Electrical Characteristics (Voltages Referenced to VSS, TA = -10 to 60°C unless otherwise indicated.)
Test
Pin
VDD
Symbol
Parameter
Test Condition
Min
Max
Unit
VDD
VTH
IDD
Power Supply Voltage Range
—
—
—
6.0
7.2
12
V
V
Supply Threshold Voltage, Low Supply Alarm
Low Supply Trip: VIN = VDD/3
15
7.8
Average Operating Supply Current
(per Package)
Standby
Configured per Figure 5
—
—
12
9.0
—
—
9.0
7.0
µA
(Does not include Current through D3-IR Emitter)
IDD
Peak Supply Current (per Package)
(Does not include IRED Current into base of Q1)
During Strobe On, IRED Off
Configured per Figure 5
During Strobe On, IRED On
Configured per Figure 5
—
—
12
12
—
—
1.25
2.5
mA
V
VIL
Low Level Input Voltage
I/O
Feedback
Test
7.0
10
16
9.0
9.0
9.0
—
—
—
1.5
2.7
0.5
VIM
VIH
Mid Level Input Voltage
High Level Input Voltage
Test
16
9.0
2.0
VDD-2.0
V
V
I/O
Feedback
Test
7.0
10
16
9.0
9.0
9.0
3.2
6.3
8.5
—
—
—
IIN
Input Current
OSC, Detect
Low-Supply Trip
Feedback
V
IN = VSS or VDD
VIN = VSS or VDD
IN = VSS or VDD
IN = VSS or VDD
3.12
15
10
12
12
12
12
-100
-100
-100
-100
+100
+100
+100
+100
nA
V
V
Test
16
IIL
Test Mode Input Current
VIN = VSS or VDD
16
12
-100
-1.0
µA
MC146012
Sensors
Freescale Semiconductor
3
Table 2. Electrical Characteristics (Voltages Referenced to VSS, TA = -10 to 60°C unless otherwise indicated.) (continued)
Test
Pin
VDD
Symbol
Parameter
Test Condition
Min
Max
Unit
IIH
Pull-Down Current
Test
I/O
VIN = VDD
I/O VIN = VDD
I/O VIN = 17 V
16
7.0
12
9.0
9.0
12
—
0.5
25
—
-1.0
1.0
100
140
µA
µA
VOL
VOH
Low-Level Output Voltage
High-Level Output Voltage
LED
Silver, Brass
IOUT = 10 mA
11
8.9
6.5
6.5
—
—
0.6
1.0
V
I
OUT = 16 mA
Silver, Brass
Strobe
IOUT = -16 mA
8.9
6.5
5.5
—
V
V
VOUT Output Voltage
Inactive, IOUT = 1.0 µA
Active, IOUT = 100 to 500 µA
(Load Regulation)
4.0
9.0
—
9.0
V
V
DD-0.1
DD-5.4 VDD-4.6
—
(For Line Regulation, See Pin Descriptions)
IOH
High-Level Output Current
I/O
Local Smoke, VOUT = 4.5 V
Local Smoke, VOUT = VSS
(Short Circuit Current)
7.0
—
6.5
12
-4.0
—
—
-16
mA
IOZ
VOL
VIC
Off-State Output Leakage Current
Active
LED
VOUT = VSS or VDD
1.0 mA
11
—
—
12
6.5
—
—
—
±100
0.5
nA
V
Common Mode
Voltage Range
C1, C2, Detect
Local Smoke, Pushbutton, or
Chamber Sensitivity Test
VDD-4.0 VDD-2.0
V
VREF Smoke Comparator
Reference Voltage
Internal
Local Smoke, Pushbutton, or
Chamber Sensitivity Test
—
—
—
—
VDD-3.9 VDD -3.1
V
V
VREF-HI High Smoke Comparator
Reference Voltage
Internal
Local Smoke, Pushbutton, or
Chamber Sensitivity Test
VREF
-
VREF-0.48
0.52
* TA = 25°C Only
Table 3. AC Electrical Characteristics (Refer to Timing Diagram Figure 3 and Figure 4. TA = 25°C, VDD = 9.0 V,
Component Values from Figure 5.)
Min(1)
Typ(2)
Max(1)
No. Symbol
Parameter
Oscillator Period
Test Condition
Clocks
Unit
1
2
3
1/fOSC
Free-running Saw tooth
Measured at Pin 12
1.0
7.2
8.0
8.8
ms
tLED
LED Pulse Period
No Local Smoke, and No
Remote Smoke
4096
—
28.8
—
32.4
35.2
—
s
Remote Smoke, but No
Local Smoke
Extinguished
4
5
Local Smoke
256
256
4.0
1.6
1.6
2.0
2.0
32
2.4
2.4
Pushbutton Test
Push button Test with
Alarm Memory
25.6
38.4
ms
—
s
6
tw(LED)
tw(stb)
,
LED Pulse Width and Strobe
Pulse Width
Remote Smoke but No
Local Smoke
1.0
OFF
—
OFF
7
8
(tIRED
)
(IRED Pulse Period)
Smoke Test
1024
4096
7.2
8.1
8.8
Chamber Sensitivity Test,
Without Local Smoke
28.8
32.4
35.2
9
Local Smoke, in Speed-Up
Pushbutton Test
128
128
Tf*
—
0.9
0.9
94
—
1.0
1.0
—
1.1
1.1
116
30
10
11
12
tw(IRED) IRED Pulse Width
µs
µs
µs
tR
tF
—
—
—
—
200
MC146012
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Freescale Semiconductor
Table 3. AC Electrical Characteristics (Refer to Timing Diagram Figure 3 and Figure 4. TA = 25°C, VDD = 9.0 V,
Component Values from Figure 5.) (continued)
Min(1)
0.45
0.45
1.35
28.8
Typ(2)
0.5
Max(1)
0.55
No. Symbol
Parameter
Test Condition
Clocks
64
Unit
13
14
15
16
tON
tOFF
tOFFD
tCH
Silver and Brass Temporal
Modulation Pulse Width
s
64
0.5
0.55
192
1.52
32.4
1.65
Silver and Brass Chirp Pulse
Period
Low Supply or Degraded
Chamber Sensitivity
4096
35.2
s
ms
s
17
18
tW(CH)
tRR
Silver and Brass Chirp Pulse
Width
Low Supply or Degraded
Chamber Sensitivity
1.0
—
7.2
—
8.0
8.8
—
Rising Edge on I/O to Smoke
Alarm Response Time
Remote Smoke, No local
smoke
2.0(3)
19
20
tstb
Strobe Out Pulse Period
Smoke Test
1024
4096
7.2
8.1
8.8
s
s
Chamber Sensitivity Test
Without Local Smoke
28.8
32.4
35.2
21
Low Supply Test Without Local
Smoke
4096
28.8
32.4
35.2
s
22
23
Pushbutton Test/Speed-Up
—
—
—
1.0
8.0
—
s
tMUTE
6.0
11
min
1. Oscillator period T (T = Tr + Tf) is determined by the external components R1, R2 and C3 where Tr = (0.6931)R2*C3 and Tf = (0.6931)R1*C3.
The other timing characteristics are some multiple of the oscillator timing shown in the table. The timing shown should accommodate the
NFPA72, ANSI S3.41, and ISO8201 audible emergency evacuation signals.
2. Typicals are not guaranteed.
3. Time is typical-depends on what point in cycle the signal is applied.
MC146012
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Freescale Semiconductor
5
Figure 3. Typical Standby Timing Diagram MC146012 Device
MC146012
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Freescale Semiconductor
Figure 4. Typical Local Smoke Timing MC146012 Device
MC146012
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Freescale Semiconductor
7
Silence Feature
(Option)
+
C4
22 µF
9.0 V
B1
Reverse
Polarity
Protect.
Circuit
D1
C1
C2
R15
SW1
R8
8.2 kΩ
R14
Pushbutton
Test
1 MΩ
R6
R9
SW2
100 kΩ
C1
C2
R16 = 3.0 M
Ω
5.0 k
Ω
R11
TEST & SILENCE
LOWBATT
Silence
Button
D2
R10
4.7 kΩ
V
DETECT
STROBE
SS
IR Detector
R12
1.0 k
C3 = 1500 pF
Ω
R1
R7
47 kΩ
IR Emitter
D3
MC146012
R1 = 100 k
Ω
R2 = 10 M
Ω
V
DD
C5
100 µF
OSC
D4
Visible
LED
Q1
IRED
R3 = 470
Ω
LED
FEEDBACK
SILVER
IR Current
4.7 to 22
Ω
I/O
R4 = 2.2 M
Ω
C6
HORN
X1
To other
0.01
µF
BRASS
MC146012(s)
Escape light(s)
Auxiliary Alarm(s)
Remote(s)
R5 = 100 k
Ω
And/Or Dialer
Figure 5. Typical Battery Powered Application
# Values for R4, R5 and C6 may differ depending on type of horn used.
* C2 and R13 are used for coarse sensitivity adjustment. Typical values are shown.
† R9 is for fine sensitivity adjustment (optional). If fixed resistors are used, R8 = 12k, R10 is 5.6k to 10k and R9 is eliminated.
** Components necessary to utilize IMF feature.
MC146012
Sensors
8
Freescale Semiconductor
PIN DESCRIPTIONS
output voltage is typically +0.5%/°C from -10 to 60°C. The
C1 (PIN 1)
A capacitor connected to this pin as shown in Figure 5
determines the gain of the on-chip photo amplifier during
pushbutton test and chamber sensitivity test (high gain). The
capacitor value is chosen such that the alarm tripped from
background reflections in the chamber during pushbutton
test.
AV = 1+(C1/10) where C1 is in pF. CAUTION: The value of
the closed-loop gain should not exceed 10,000.
Resistor R15 should be installed in series with C1 for lower
gains. R15 =[1/(12√C1]-680 where R15 is in ohms and C1 is
in farads.
supply-voltage coefficient (line regulation) is ±0.2%/V
maximum from 6.0 to 12 V. The IRED pulse width (active-
high) is determined by external components R1 and C3. With
a 100 kΩ/1500 pF combination, the nominal width is 105 µs.
To minimize noise impact, IRED is active near the end of
strobe pulses for smoke tests, chamber sensitivity test, and
pushbutton test. For the above mentioned width, IRED will be
active for the last 105 µs of strobe pulse.
I/O (PIN 7)
This pin can be used to connect up to 40 units together in
a wired-OR configuration for common signaling. VSS is used
as the return. An on-chip current sink minimizes noise pickup
during non-smoke conditions and eliminates the need for an
external pull-down resistor to complete the wired-OR.
Remote units at lower supply voltages do not draw excessive
current from a sending unit at higher supply voltage.
I/O can also be used to activate escape lights, auxiliary
alarms, remote alarms and/or auto-dialers.
C2 (PIN 2)
A capacitor connected to this pin as shown in Figure 5
determines the gain of the on-chip photo amplifier during
pushbutton test and chamber sensitivity tests.
AV = 1+(C2/10) where C1 is in pF. This gain increases
about 10% during IRED pulse, after two consecutive local
smoke detections.
As an input, this pin feeds a positive-edge-triggered flip-
flop whose output is sampled nominally every 1 second
during standby (using typical component values). Once the
first I/O remote smoke sample is detected, a second sample
approximately 10 ms later will happen to confirm a remote
smoke condition. If both samples are found to be high, the
unit will start sounding an alarm.
I/O is disabled by the on-chip power-on reset to eliminate
nuisance signaling during battery changes or system power-
up.
For proper compensation, resistor R14 must be installed in
series with C2. R14 =[1/(12√C2]-680 where R14 is in ohms
and C1 is in farads.
DETECT (PIN 3)
This input to the high-gain pulse amplifier is tied to the
cathode of an external photodiode. The photodiode should
have low capacitance and low dark leakage current. The
diode must be shunted by a load resistor and is operated at
zero bias.
The Detect input must be ac/dc decoupled from all other
signals, VDD and VSS. Lead length and/or foil traces to this
pin must be minimized also. See Figure 3.
If unused, I/O must be left unconnected.
BRASS (PIN 8)
This half of the push-pull driver output is connected to the
metal support electrode of the piezoelectric audio transducer
and to the horn-starting resistor. A continuous modulated
tone from the transducer is a smoke alarm indicating either
local or remote smoke. A short beep or chirp is a trouble
alarm indicating a low supply or degraded chamber
sensitivity. A series of short beeps or chirps during a
pushbutton test indicate a previous alarm for detected smoke
(Alarm memory feature).
The device has a sampling speed-up mode after the first
smoke sample is detected. The speed-up frequency is one
smoke sample about every 2 seconds for the duration of a
smoke condition. It will take no-smoke samples to return to a
standby mode. Once out of a smoke condition, the IC will
continue to sample for smoke about every 8 seconds.
STROBE (PIN 4)
This output provides the strobed, regulated voltage
referenced to VDD. The temperature coefficient of this voltage
is ±0.2%/°C maximum from -10 to 60°C. The supply-voltage
coefficient (line regulation) is ±0.2%/V maximum from 6.0 to
12 V. Strobe is tied to external resistor string R8, R9 and R10.
SILVER (PIN 9)
This half of the push-pull driver output is connected to the
ceramic electrode of a piezoelectric transducer and to the
horn-starting capacitor.
VDD (PIN 5)
FEEDBACK (PIN 10)
This pin is connected to the positive supply potential and
This input is connected to both the feedback electrode of
a self-resonating piezoelectric transducer and the horn-
starting resistor and capacitor through current limiting resistor
may range from +6.0 to +12 V with respect to VSS
.
CAUTION: In battery-powered applications, reverse-
polarity protection must be provided exter-
nally.
R4. If unused, the pin must be tied to VSS or VDD
.
LED (PIN11)
IRED (PIN 6)
This active-low open drain output directly drives an
external visible LED at the pulse rate indicated below. The
pulse width is equal to the OSC period.
This output provides pulsed base current for external NPN
transistor Q1 used as the infrared emitter driver. Q1 must
have a β ≥ 100. At 10 mA, the temperature coefficient of the
MC146012
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Freescale Semiconductor
9
The load for the low-supply test is non-coincident with the
smoke tests, chamber sensitivity test, pushbutton test, or any
alarm signals.
The LED also provides a visual indication of the detector
status as follows, assuming the component values shown in
Figure 4:
cycle, the amplifier gain returns to normal, thereby removing
the simulated smoke condition. After two additional IRED
pulses, less than three seconds, the IC exits the alarm mode
and returns to standby timing.
The Pushbutton Test will also activate the Alarm Memory
feature. If there was a previous alarm detected by the unit,
the horn will chirp every ¼ second as long as the Test Button
is pressed. Upon releasing of the Test Button, Alarm memory
will be reset. Subsequent pressing of the Test Button will
result in a Pushbutton Test for simulated smoke.
Pressing the Test Button while in the MUTE mode will
result in resetting of MUTE (and additionally a normal
Pushbutton Test).
Standby (includes low-supply and chamber sensitivity
tests) — Pulses every 32.4 seconds.
Local Smoke — Pulses every 2.0 seconds (typical)
Mute — Pulses every 2.0 seconds (typical)
Remote Smoke — No Pulses
Pushbutton test — Pulses every 2.0 seconds
OSC (PIN 12)
The MUTE mode (IMF) is initiated by a mid level voltage
(around ½ VDD) at pin 16. A parallel Mute Button to an
existing Test Button needs to be installed at the test pin. A
smoke condition must be present for the MUTE mode to be
activated. If a no smoke condition gets detected while in the
MUTE mode, the IMF 8 minute window gets reset. The unit
will return to Standby mode.
This pin is used in conjunction with external resistor R2
(7.5 MΩ) to VDD and external capacitor C3 (1500 pF) to VDD
to form an oscillator with a nominal period of 7.9 msec
(typical).
R1 (PIN 13)
Once in the MUTE mode, the audible smoke alarm (horn)
is temporarily disabled for approximately 8 minutes while
smoke condition is being detected. A visual smoke alarm will
remain (LED flashing) during MUTE mode. A high smoke
voltage reference will also be activated at this time.
Simultaneous smoke and high smoke sampling will allow the
unit to enable the horn driver in case a high smoke condition
occurs during MUTE where the high smoke threshold is
crossed.
This pin is use din conjunction with resistor R1(100 kΩ) to
pin 12 and C3 (1500 pF, see pin 12 description) to determine
the IRED pulse width. With this RC combination, the nominal
pulse width is 105 µs.
VSS (PIN 14)
This pin is the negative supply potential and the return for
the I/O pin. Pin 14 is usually tied to Ground.
The MUTE mode can be overridden by the following
conditions: 1) a no smoke condition is detected, 2) high
smoke level detected, 3) remote smoke detected through I/O,
4) reset through test Button, 5) timeout of 8 minute window.
To help prevent a jammed Mute Button condition, the divider
LOW-SUPPLY TRIP (PIN 15)
This pin is connected to an external voltage which
determines the low-supply alarm threshold. The trip voltage
is obtained through a resistor divider connected between the
VDD and LED pins. The low-supply alarm threshold voltage
(in volts) = (5R7/R6)+5 where R6 and R7 are in the same
units.
string on the Mute Button should include a resistor to VDD
,
R15 (around 10 MΩ) and a resistor R16 (4.7 MΩ) and
capacitor, C7 (0.047 mF) in series to VSS
.
TEST/MUTE (PIN 16)
CALIBRATION
This input has an on-chip pull-down device and is used to
manually invoke a test mode, a mute mode, or a calibration
mode.
To facilitate checking the sensitivity and calibrating smoke
detectors, the MC146012 can be placed in Calibration mode.
In this mode, certain device pins are controlled/reconfigured
as shown in Table 4. To place the part in Calibration mode,
Pin 16 (Test/ Mute) must be pulled below VSS pin with 100 µA
continuously drawn out of the pin for at least one cycle of the
OSC pin. To exit this mode, the Test/ Mute pin is floated for at
least one OSC cycle.
In the Calibration mode, the IRED pulse rate is increased.
An IRED pulse occurs every clock cycle. Also, Strobe is
always Active Low. It is recommended to short R12 (Figure 5)
in this mode. This will allow for a similar recovery of the
emitter circuitry as in normal operation. Pin 1, pin 2, and
pin 12 should be buffered with a unity gain amplifier to
measure their outputs.
The Pushbutton Test mode is initiated by a high level at
Pin 16 (usually a depression of a S.P.S.T. normally-open
pushbutton switch to VDD). After one oscillator cycle, the
IRED pulses approximately every 1.0 second, regardless of
the presence of smoke. Additionally, the amplifier gain is
increased by automatic selection of C1. Therefore the
background reflections in the smoke chamber may be
interpreted as smoke, generating a simulated smoke
condition. After the second IRED pulse, a successful test
activates the horn-driver and I/O circuits. The active I/O
allows remote signaling for a system testing. When the
Pushbutton Test switch is released, the Test input returns to
VSS due to the on-chip pull-down device. After one oscillator
MC146012
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10
Freescale Semiconductor
Table 4. MC146012 Test Mode Logic Table
Pin
Function
Type
Logic
Description
Pin 16, TEST
Test Mode 1 Trigger
Input
None Set a –Ve voltage to the pin and source 100 µA from
the pin to start Test Mode 1.
Pin 12, OSC CAP
Clock Input
Input
0
1
Internal clock low
Internal clock high
Pin 5, VDD
Pin 14, VSS
Pin 11, LED
Chip Power
Chip Ground
Built-in-Test for HUSH
Timer
Output
Output pulse active low for 8 Clocks every 128
Clocks.
Pin 4, STROBE
Pin 6, IRED
Analog Ground
IRED
Output
Output
Output low when pin 12 is low.
0
1
Output low when pin 12 is low.
Output high (3.0 V) when pin 12 is high.
NO SMK: VDD-2.5 V – (1/Hi Gain)
SMK: VDD-2.5 V –(1/Low Gain)
Pin 3, DETECT
Smoke Sensing Input
Smoke Latch Indicator
Input
HI SMK: VDD-2.5 V – (2/Low Gain)
Output low when smoke latch not set.
Output high when smoke latch set.
Output low when photo comparator not set.
Pin 8, BRASS
Pin 9, SILVER
Output
Output
0
1
0
Photo-Comparator
Indicator
1
0
Output high when photo comparator set.
Pin 7, I/O
Photo-Amp Routing
Enable
Input
Disable the function of Pin 1, 2, 10 and 15 in Test
Mode 1.
1
Enable photoamplifier output routed to the pins and
enable pins 1, 2, 10 and 15 in test Mode 1.
Pin 15, LOW_BATT
Pin 10, FEEDBACK
Low Battery Trip Point
Feedback
Input
Input
Control photo amp. Gain and output routing
Control hysteresis
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Figure 6. Recommended PCB layout
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PACKAGE DIMENSIONS
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CASE 648-08
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PACKAGE DIMENSIONS
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CASE 751G-04
ISSUE F
SOG PACKAGE
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MC146012
Rev. 0
09/2005
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