NXH80B120MNQ0SNG [ONSEMI]
Full SiC MOSFET Module | EliteSiC Two Channel Full SiC Boost, 1200 V, 80 mohm SiC MOSFET + 1200 V, 20 A SiC Diode;![NXH80B120MNQ0SNG](http://pdffile.icpdf.com/pdf2/p00369/img/icpdf/NXH80B120MNQ_2253633_icpdf.jpg)
型号: | NXH80B120MNQ0SNG |
厂家: | ![]() |
描述: | Full SiC MOSFET Module | EliteSiC Two Channel Full SiC Boost, 1200 V, 80 mohm SiC MOSFET + 1200 V, 20 A SiC Diode |
文件: | 总13页 (文件大小:676K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
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DATA SHEET
www.onsemi.com
Silicon Carbide (SiC)
Module – EliteSiC, 80 mohm
SiC M1 MOSFET, 1200 V +
20 A, 1200 V SiC Diode,
Two Channel Full SiC Boost,
Q0 Package
Q0BOOST
CASE 180AJ
SOLDER PINS
Product Preview
MARKING DIAGRAM
NXH80B120MNQ0SNG
NXH80B120MNQ0SNG
ATYYWW
The NXH80B120MNQ0SNG is a power module containing a dual
boost stage. The integrated SiC MOSFETs and SiC Diodes provide
lower conduction losses and switching losses, enabling designers to
achieve high efficiency and superior reliability.
G
AT
= Pb−Free Package
= Assembly & Test Site Code
YYWW = Year and Work Week Code
Features
• 1200 V 80 mW SiC MOSFETs
• Low Reverse Recovery and Fast Switching SiC Diodes
• 1600 V Bypass and Anti−parallel Diodes
• Low Inductive Layout
PIN CONNECTIONS
• Solderable Pins
• Thermistor
• These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
Typical Applications
• Solar Inverters
• Uninterruptable Power Supplies
ORDERING INFORMATION
See detailed ordering and shipping information on page 4 of
this data sheet.
Figure 1. NXH80B120MNQ0SNG Schematic Diagram
This document contains information on a product under development. onsemi reserves
the right to change or discontinue this product without notice.
© Semiconductor Components Industries, LLC, 2019
1
Publication Order Number:
February, 2023 − Rev. P2
NXH80B120MNQ0/D
NXH80B120MNQ0SNG
ABSOLUTE MAXIMUM RATINGS (Note 1) T = 25°C unless otherwise noted
J
Rating
Symbol
Value
Unit
BOOST MOSFET
Drain−Source Voltage
Gate−Source Voltage
V
V
1200
−15/+25
23
V
V
DS
GS
Continuous Drain Current (@ V = 20 V, T = 80°C)
I
D
A
GS
C
Pulsed Drain Current @ T = 80°C (T = 175_C)
I
D(Pulse)
69
A
C
J
Maximum Power Dissipation @ T = 80°C
P
tot
69
W
°C
°C
C
Minimum Operating Junction Temperature
Maximum Operating Junction Temperature
BOOST DIODE
T
JMIN
−40
T
JMAX
175
Peak Repetitive Reverse Voltage
V
1200
31
V
A
RRM
Continuous Forward Current @ T = 80°C
I
F
C
Surge Forward Current (60 Hz single half−sine wave)
I
93
A
FSM
Maximum Power Dissipation @ T = 80°C (T = 175_C)
P
tot
97
W
C
J
2
2
2
I t − value (60 Hz single half−sine wave)
Minimum Operating Junction Temperature
Maximum Operating Junction Temperature
BYPASS DIODE
I t
19
A s
T
JMIN
−40
175
°C
°C
T
JMAX
Peak Repetitive Reverse Voltage
V
1600
44
V
A
RRM
Continuous Forward Current @ T = 80°C (T = 150°C)
I
F
C
J
Repetitive Peak Forward Current (T = 80°C, t limited by T
)
I
FRM
132
63
A
C
p
Jmax
Power Dissipation Per Diode @ T = 80°C (T = 150°C)
P
tot
W
°C
°C
C
J
Minimum Operating Junction Temperature
T
JMIN
−40
150
Maximum Operating Junction Temperature
THERMAL PROPERTIES
T
JMAX
Storage Temperature range
T
stg
−40 to 125
°C
INSULATION PROPERTIES
Isolation test voltage, t = 1 sec, 60 Hz
Creepage distance
V
is
3000
12.7
V
RMS
mm
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Refer to ELECTRICAL CHARACTERISTICS, RECOMMENDED OPERATING RANGES and/or APPLICATION INFORMATION for Safe
Operating parameters.
RECOMMENDED OPERATING RANGES
Parameter
Symbol
Min
Max
– 25)
JMAX
Unit
Module Operating Junction Temperature
T
J
−40
(T
°C
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
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2
NXH80B120MNQ0SNG
ELECTRICAL CHARACTERISTICS (T = 25°C unless otherwise specified)
J
Characteristic
Test Conditions
Symbol
Min
Typ
Max
Unit
BOOST MOSFET CHARACTERISTICS
Zero Gate Voltage Drain Current
V
V
V
V
V
= 0 V, V = 1200 V, T = 25°C
–
–
–
80
114
2.0
–
100
110
162
4.3
1
I
mA
GS
GS
GS
GS
GS
DS
J
DSS
Static Drain−to−Source On
Resistance
= 20 V, I = 20 A, T = 25°C
D J
R
DS(on)
mW
= 20 V, I = 20 A, T = 150°C
–
D
J
Gate−Source Threshold Voltage
Gate−Source Leakage Current
= V , I = 5 mA
1.8
–
V
V
GS(th)
DS
D
= 25 V, V = 0 V
I
mA
ns
DS
GSS
T = 25°C
Turn−on Delay Time
Rise Time
–
–
–
–
–
13.4
3.6
–
–
–
–
–
t
J
d(on)
V
D
= 700 V, V = 20 V, −5 V
DS
GS
t
r
I
= 30 A, R = 4.7 W
G
Turn−off Delay Time
Fall Time
27.6
10.3
166
t
d(off)
t
f
Turn−on Switching Loss per Pulse
mJ
E
E
on
off
Turn−off Switching Loss per Pulse
–
49.2
–
T = 125°C
Turn−on Delay Time
Rise Time
–
–
–
–
–
13.7
3.5
–
–
–
–
–
ns
t
J
d(on)
V
D
= 700 V, V = 20 V, −5 V
DS
GS
t
r
I
= 30 A, R = 4.7 W
G
Turn−off Delay Time
Fall Time
29.56
10.36
154
t
d(off)
t
f
Turn−on Switching Loss per Pulse
mJ
E
on
E
off
Turn−off Switching Loss per Pulse
Input Capacitance
–
–
–
–
–
46.65
1038.7
95.5
–
–
–
–
–
V
DS
= 800 V, V = 0 V, f = 1 MHz
pF
C
GS
iss
oss
Output Capacitance
C
Reverse Transfer Capacitance
Total Gate Charge
10.9
C
rss
V
DS
V
GS
= 600 V, I = 20 A,
= 20 V, −5 V
Q
g
74.72
nC
D
Thermal grease,
Thermal Resistance − chip−to−case
–
–
1.37
1.94
–
–
K/W
K/W
R
R
thJC
thJH
Thickness = 2.1 Mil 2%
Thermal Resistance − chip−to−
heatsink
l = 2.9 W/mK
BOOST DIODE CHARACTERISTICS
Diode Reverse Leakage Current
Diode Forward Voltage
V
= 1200 V
I
–
–
300
mA
R
R
I = 20 A, T = 25°C
F
V
–
–
–
1.49
2.17
12
1.7
–
V
J
F
I = 20 A, T = 150°C
F
J
T = 25°C
Reverse Recovery Time
–
ns
nC
A
t
J
rr
V
DS
= 700 V, V = 20 V, −5 V
= 30 A, R = 4.7 W
G
GS
Reverse Recovery Charge
Peak Reverse Recovery Current
–
–
–
159
21.2
7240
–
–
–
Q
rr
RRM
I
D
I
Peak Rate of Fall of Recovery
Current
di/dt
A/ms
Reverse Recovery Energy
Reverse Recovery Time
–
–
–
–
–
70
–
–
–
–
–
E
t
mJ
ns
rr
T = 125°C
11.7
153
J
rr
V
DS
= 700 V, V = 20 V, −5 V
GS
Reverse Recovery Charge
Peak Reverse Recovery Current
nC
A
Q
rr
RRM
I
D
= 30 A, R = 4.7 W
G
23.8
8068
I
Peak Rate of Fall of Recovery
Current
di/dt
A/ms
Reverse Recovery Energy
–
66.3
–
E
mJ
rr
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3
NXH80B120MNQ0SNG
ELECTRICAL CHARACTERISTICS (T = 25°C unless otherwise specified) (continued)
J
Characteristic
Test Conditions
Symbol
Min
Typ
Max
Unit
BOOST DIODE CHARACTERISTICS
Thermal grease,
Thermal Resistance − chip−to−case
–
–
0.98
1.33
–
–
K/W
K/W
R
R
thJC
thJH
Thickness = 2.1 Mil 2%
Thermal Resistance −
chip−to−heatsink
l = 2.9 W/mK
BYPASS DIODE CHARACTERISTICS
Diode Reverse Leakage Current
Diode Forward Voltage
V
= 1600 V, T = 25°C
I
–
–
–
–
100
1.4
–
mA
R
J
R
I = 30 A, T = 25°C
F
V
F
1.04
0.94
V
J
I = 30 A, T = 150°C
F
J
Thermal grease,
Thermal Resistance − chip−to−case
–
–
1.12
1.56
–
–
K/W
K/W
R
thJC
thJH
Thickness = 2.1 Mil 2%
Thermal Resistance −
chip−to−heatsink
R
l = 2.9 W/mK
T = 100°C
THERMISTOR CHARACTERISTICS
Nominal resistance
R
–
22
–
kW
25
Nominal resistance
Deviation of R25
Power dissipation
Power dissipation constant
B−value
–
−5
–
1486
–
–
5
–
–
–
–
R
W
%
100
DR/R
P
200
2
mW
mW/K
K
D
–
B(25/50), tolerance 3%
B(25/100), tolerance 3%
–
3950
3998
B−value
–
K
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
ORDERING INFORMATION
Part Number
Marking
Package
Shipping
Q0BOOST − Case 180AJ
(Pb−Free and Halide−Free Solder Pins)
NXH80B120MNQ0SNG
NXH80B120MNQ0SNG
24 Units / Blister Tray
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4
NXH80B120MNQ0SNG
TYPICAL CHARACTERISTICS – MOSFET, BOOST DIODE AND BYPASS DIODE
Figure 2. MOSFET On Region Characteristics
Figure 3. MOSFET On Region Characteristics
Figure 4. MOSFET Transfer Characteristics
Figure 5. Boost Diode Forward Characteristics
Figure 6. Bypass Diode Forward Characteristics
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5
NXH80B120MNQ0SNG
TYPICAL SWITCHING CHARACTERISTICS – MOSFET
Figure 7. Typical Turn On Loss vs. ID
Figure 8. Typical Turn Off Loss vs. ID
Figure 9. Typical Turn On Loss vs. RG
Figure 10. Typical Turn Off Loss vs. RG
Figure 11. Typical Turn On Switching Time vs. ID
Figure 12. Typical Turn Off Switching Time vs. ID
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6
NXH80B120MNQ0SNG
TYPICAL CHARACTERISTICS – MOSFET
Figure 13. Typical Turn On Switching Time vs. RG
Figure 14. Typical Turn Off Switching Time vs. RG
TYPICAL CHARACTERISTICS – BOOST DIODE
Figure 15. Typical Reverse Recovery Energy Loss
Figure 16. Typical Reverse Recovery Energy Loss
vs. RG
vs. ID
Figure 17. Typical Reverse Recovery Time vs. ID
Figure 18. Typical Reverse Recovery Time vs. RG
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7
NXH80B120MNQ0SNG
TYPICAL SWITCHING CHARACTERISTICS – BOOST DIODE
Figure 19. Typical Reverse Recovery Charge vs. ID
Figure 20. Typical Reverse Recovery
Charge vs. RG
Figure 21. Typical Reverse Recovery Peak
Current vs. ID
Figure 22. Typical Reverse Recovery Peak
Current vs. RG
Figure 23. Typical di/dt vs. ID
Figure 24. Typical di/dt vs. RG
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8
NXH80B120MNQ0SNG
TRANSIENT THERMAL IMPEDANCE – MOSFET, BOOST DIODE AND BYPASS DIODE
10
1
0.1
@50% duty cycle
@20% duty cycle
@10% duty cycle
@5% duty cycle
0.01
@2% duty cycle
@1% duty cycle
single pulse
0.001
0.00001
0.0001
0.001
0.01
0.1
1
10
pulse on time [s]
Figure 25. MOSFET Transient Thermal Impedance
10
1
@50% duty cycle
@20% duty cycle
@10% duty cycle
@5% duty cycle
@2% duty cycle
@1% duty cycle
0.1
single pulse
0.01
0.00001
0.0001
0.001
0.01
0.1
1
10
pulse on time [s]
Figure 26. Boost Diode Transient Thermal Impedance
10
1
@50% duty cycle
@20% duty cycle
@10% duty cycle
@5% duty cycle
@2% duty cycle
0.1
0.01
@1% duty cycle
single pulse
0.00001
0.0001
0.001
0.01
0.1
1
10
pulse on time [s]
Figure 27. Bypass Diode Transient Thermal Impedance
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9
NXH80B120MNQ0SNG
GATE CHARGE, CAPACITANCE CHARGE, SOA AND THERMISTOR CHARACTERISTICS
Figure 28. Gate Voltage vs. Gate Charge
Figure 29. Capacitance Charge
Figure 30. FBSOA
Figure 31. RBSOA
Figure 32. Thermistor Characteristics
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10
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
PIM22, 55x32.5 / Q0BOOST
CASE 180AJ
ISSUE B
DATE 08 NOV 2017
GENERIC
MARKING DIAGRAM*
XXXXXXXXXXXXXXXXG
ATYYWW
XXXXX = Specific Device Code
G
= Pb−Free Package
AT
= Assembly & Test Site Code
YYWW = Year and Work Week Code
*This information is generic. Please refer to device data
sheet for actual part marking. Pb−Free indicator, “G” or
microdot “G”, may or may not be present. Some products
may not follow the Generic Marking.
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
DOCUMENT NUMBER:
DESCRIPTION:
98AON63481G
PIM22 55X32.5 / Q0BOOST (SOLDER PIN)
PAGE 1 OF 2
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the
rights of others.
© Semiconductor Components Industries, LLC, 2019
www.onsemi.com
PIM22, 55x32.5 / Q0BOOST
CASE 180AJ
ISSUE B
DATE 08 NOV 2017
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
DOCUMENT NUMBER:
DESCRIPTION:
98AON63481G
PIM22 55X32.5 / Q0BOOST (SOLDER PIN)
PAGE 2 OF 2
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the
rights of others.
© Semiconductor Components Industries, LLC, 2019
www.onsemi.com
onsemi,
, and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates
and/or subsidiaries in the United States and/or other countries. onsemi owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property.
A listing of onsemi’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. onsemi reserves the right to make changes at any time to any
products or information herein, without notice. The information herein is provided “as−is” and onsemi makes no warranty, representation or guarantee regarding the accuracy of the
information, product features, availability, functionality, or suitability of its products for any particular purpose, nor does onsemi assume any liability arising out of the application or use
of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products
and applications using onsemi products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information
provided by onsemi. “Typical” parameters which may be provided in onsemi data sheets and/or specifications can and do vary in different applications and actual performance may
vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. onsemi does not convey any license
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or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should
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