NTB27N06 [ONSEMI]

Power MOSFET 27 Amps, 60 Volts N?Channel TO?220 and D2PAK; 功率MOSFET 27安培, 60伏特N'渠道? 220和D2PAK
NTB27N06
型号: NTB27N06
厂家: ONSEMI    ONSEMI
描述:

Power MOSFET 27 Amps, 60 Volts N?Channel TO?220 and D2PAK
功率MOSFET 27安培, 60伏特N'渠道? 220和D2PAK

文件: 总12页 (文件大小:86K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
NTP27N06, NTB27N06  
Power MOSFET  
27 Amps, 60 Volts  
2
N–Channel TO–220 and D PAK  
Designed for low voltage, high speed switching applications in  
power supplies, converters, power motor controls and bridge circuits.  
http://onsemi.com  
Features  
Higher Current Rating  
27 AMPERES  
60 VOLTS  
Lower R  
Lower V  
DS(on)  
DS(on)  
R
= 46 m  
DS(on)  
Lower Capacitances  
Typical Applications  
Power Supplies  
Converters  
N–Channel  
D
Power Motor Controls  
Bridge Circuits  
G
MAXIMUM RATINGS (T = 25°C unless otherwise noted)  
C
4
Rating  
Drain–to–Source Voltage  
Drain–to–Gate Voltage (R  
Symbol  
Value  
60  
Unit  
Vdc  
Vdc  
Vdc  
S
4
V
DSS  
1
2
= 10 M)  
V
DGR  
60  
GS  
3
Gate–to–Source Voltage  
– Continuous  
2
D PAK  
V
V
"20  
"30  
TO–220AB  
CASE 221A  
STYLE 5  
GS  
GS  
CASE 418B  
STYLE 2  
– Non–Repetitive (t v10 ms)  
p
1
Drain Current  
– Continuous @ T = 25°C  
2
I
I
27  
15  
80  
Adc  
Apk  
3
MARKING DIAGRAMS  
& PIN ASSIGNMENTS  
A
D
D
– Continuous @ T 100°C  
A
– Single Pulse (t v10 µs)  
I
p
DM  
4
4
Drain  
Drain  
Total Power Dissipation @ T = 25°C  
Derate above 25°C  
P
D
88.2  
0.59  
W
W/°C  
A
Operating and Storage Temperature Range  
T , T  
J stg  
–55 to  
+175  
°C  
NTx27N06  
LLYWW  
Single Pulse Drain–to–Source Avalanche  
E
109  
mJ  
AS  
NTx27N06  
LLYWW  
Energy – Starting T = 25°C  
J
GS  
(V  
= 50 Vdc, V  
= 10 Vdc,  
1
2
3
DD  
1
Gate  
3
L = 0.3 mH, I (pk) = 27 A,V  
DS  
= 60 Vdc)  
Gate Drain Source  
L
Source  
Thermal Resistance – Junction–to–Case  
R
1.7  
°C/W  
°C  
θJC  
NTx27N06 = Device Code  
2
Maximum Lead Temperature for Soldering  
Purposes, 1/8from case for 10 seconds  
T
260  
L
x
= B or P  
Drain  
LL  
Y
= Location Code  
= Year  
WW  
= Work Week  
ORDERING INFORMATION  
Device  
Package  
Shipping  
NTP27N06  
NTB27N06  
NTB27N06T4  
TO–220AB  
50 Units/Rail  
50 Units/Rail  
2
D PAK  
2
D PAK  
800/Tape & Reel  
Semiconductor Components Industries, LLC, 2001  
1
Publication Order Number:  
August, 2001 – Rev. 2  
NTP27N06/D  
NTP27N06, NTB27N06  
ELECTRICAL CHARACTERISTICS (T = 25°C unless otherwise noted)  
J
Characteristic  
Symbol  
Min  
Typ  
Max  
Unit  
OFF CHARACTERISTICS  
Drain–to–Source Breakdown Voltage (Note 1.)  
(V = 0 Vdc, I = 250 µAdc)  
V
Vdc  
(BR)DSS  
60  
70  
79.4  
GS  
D
Temperature Coefficient (Positive)  
mV/°C  
µAdc  
Zero Gate Voltage Drain Current  
I
DSS  
(V  
DS  
(V  
DS  
= 60 Vdc, V  
= 60 Vdc, V  
= 0 Vdc)  
= 0 Vdc, T = 150°C)  
1.0  
10  
GS  
GS  
J
Gate–Body Leakage Current (V  
= ±20 Vdc, V  
DS  
= 0 Vdc)  
I
±100  
nAdc  
Vdc  
GS  
GSS  
ON CHARACTERISTICS (Note 1.)  
Gate Threshold Voltage (Note 1.)  
V
GS(th)  
(V  
DS  
= V , I = 250 µAdc)  
GS  
2.0  
2.8  
6.9  
4.0  
D
Threshold Temperature Coefficient (Negative)  
mV/°C  
mW  
Static Drain–to–Source On–Resistance (Note 1.)  
R
V
DS(on)  
(V = 10 Vdc, I = 13.5 Adc)  
37.5  
46  
GS  
D
Static Drain–to–Source On–Resistance (Note 1.)  
Vdc  
DS(on)  
(V  
GS  
(V  
GS  
= 10 Vdc, I = 27 Adc)  
1.05  
2.12  
1.5  
D
= 10 Vdc, I = 13.5 Adc, T = 150°C)  
D
J
Forward Transconductance (Note 1.) (V  
= 7.0 Vdc, I = 6.0 Adc)  
g
FS  
13.2  
mhos  
pF  
DS  
D
DYNAMIC CHARACTERISTICS  
Input Capacitance  
C
725  
213  
58  
1015  
300  
iss  
(V  
= 25 Vdc, V  
= 0 Vdc,  
DS  
GS  
f = 1.0 MHz)  
Output Capacitance  
C
oss  
Transfer Capacitance  
C
120  
rss  
SWITCHING CHARACTERISTICS (Note 2.)  
Turn–On Delay Time  
t
13.6  
62.7  
26.6  
70.4  
21.2  
5.6  
30  
125  
60  
140  
30  
ns  
d(on)  
(V  
DD  
= 30 Vdc, I = 27 Adc,  
D
GS  
= 9.1 ) (Note 1.)  
Rise Time  
t
r
V
= 10 Vdc,  
Turn–Off Delay Time  
Fall Time  
t
d(off)  
R
G
t
f
Gate Charge  
Q
T
Q
1
Q
2
nC  
(V  
V
= 48 Vdc, I = 27 Adc,  
D
= 10 Vdc) (Note 1.)  
DS  
GS  
7.3  
SOURCE–DRAIN DIODE CHARACTERISTICS  
Forward On–Voltage  
S
V
Vdc  
ns  
SD  
(I = 27 Adc, V  
= 0 Vdc) (Note 1.)  
1.05  
0.93  
1.25  
GS  
(I = 27 Adc, V  
= 0 Vdc, T = 150°C)  
S
GS  
J
Reverse Recovery Time  
t
42  
26  
rr  
(I = 27 Adc, V  
= 0 Vdc,  
GS  
S
t
a
dI /dt = 100 A/µs) (Note 1.)  
S
t
16  
b
Reverse Recovery Stored Charge  
Q
0.07  
µc  
RR  
1. Pulse Test: Pulse Width 300 µs, Duty Cycle 2%.  
2. Switching characteristics are independent of operating junction temperature.  
http://onsemi.com  
2
NTP27N06, NTB27N06  
56  
48  
56  
V
w 10 V  
7.5 V  
V
= 10 V  
DS  
7 V  
6.5 V  
6 V  
GS  
9 V  
8 V  
48  
40  
32  
24  
16  
8
40  
32  
24  
16  
8
5.5 V  
T = 25°C  
J
5 V  
4.5 V  
T = 100°C  
J
T = –55°C  
J
0
0
2.6  
0
1
2
3
4
5
6
3.4  
4.2  
5
5.8  
6.6  
7.4  
8.2  
V , DRAIN–TO–SOURCE VOLTAGE (VOLTS)  
DS  
V , GATE–TO–SOURCE VOLTAGE (VOLTS)  
GS  
Figure 1. On–Region Characteristics  
Figure 2. Transfer Characteristics  
0.095  
0.085  
0.075  
0.065  
0.095  
0.085  
0.075  
0.065  
V
GS  
= 10 V  
V
GS  
= 15 V  
T = 100°C  
J
T = 100°C  
J
0.055  
0.045  
0.055  
0.045  
T = 25°C  
J
T = 25°C  
J
0.035  
0.025  
0.035  
0.025  
T = –55°C  
J
T = –55°C  
J
0.015  
0.015  
0
8
16  
24  
32  
40  
48  
56  
0
8
16  
24  
32  
40  
48  
56  
I , DRAIN CURRENT (AMPS)  
D
I , DRAIN CURRENT (AMPS)  
D
Figure 3. On–Resistance versus  
Gate–to–Source Voltage  
Figure 4. On–Resistance versus Drain Current  
and Gate Voltage  
2.2  
1.8  
1.4  
1
10000  
1000  
I
V
= 13.5 A  
V
GS  
= 0 V  
D
= 10 V  
GS  
T = 150°C  
J
T = 125°C  
J
100  
10  
T = 100°C  
J
0.6  
–50 –25  
1
0
25  
50  
75 100 125 150 175  
0
10  
20  
30  
40  
50  
60  
T , JUNCTION TEMPERATURE (°C)  
J
V , DRAIN–TO–SOURCE VOLTAGE (VOLTS)  
DS  
Figure 5. On–Resistance Variation with  
Temperature  
Figure 6. Drain–to–Source Leakage Current  
versus Voltage  
http://onsemi.com  
3
NTP27N06, NTB27N06  
POWER MOSFET SWITCHING  
Switching behavior is most easily modeled and predicted  
by recognizing that the power MOSFET is charge  
controlled. The lengths of various switching intervals (t)  
are determined by how fast the FET input capacitance can  
be charged by current from the generator.  
The capacitance (C ) is read from the capacitance curve at  
a voltage corresponding to the off–state condition when  
iss  
calculating t  
and is read at a voltage corresponding to the  
on–state when calculating t  
d(on)  
.
d(off)  
At high switching speeds, parasitic circuit elements  
complicate the analysis. The inductance of the MOSFET  
source lead, inside the package and in the circuit wiring  
which is common to both the drain and gate current paths,  
produces a voltage at the source which reduces the gate drive  
current. The voltage is determined by Ldi/dt, but since di/dt  
is a function of drain current, the mathematical solution is  
complex. The MOSFET output capacitance also  
complicates the mathematics. And finally, MOSFETs have  
finite internal gate resistance which effectively adds to the  
resistance of the driving source, but the internal resistance  
is difficult to measure and, consequently, is not specified.  
The resistive switching time variation versus gate  
resistance (Figure 9) shows how typical switching  
performance is affected by the parasitic circuit elements. If  
the parasitics were not present, the slope of the curves would  
maintain a value of unity regardless of the switching speed.  
The circuit used to obtain the data is constructed to minimize  
common inductance in the drain and gate circuit loops and  
is believed readily achievable with board mounted  
components. Most power electronic loads are inductive; the  
data in the figure is taken with a resistive load, which  
approximates an optimally snubbed inductive load. Power  
MOSFETs may be safely operated into an inductive load;  
however, snubbing reduces switching losses.  
The published capacitance data is difficult to use for  
calculating rise and fall because drain–gate capacitance  
varies greatly with applied voltage. Accordingly, gate  
charge data is used. In most cases, a satisfactory estimate of  
average input current (I  
) can be made from a  
G(AV)  
rudimentary analysis of the drive circuit so that  
t = Q/I  
G(AV)  
During the rise and fall time interval when switching a  
resistive load, V remains virtually constant at a level  
GS  
known as the plateau voltage, V  
. Therefore, rise and fall  
SGP  
times may be approximated by the following:  
t = Q x R /(V  
– V )  
GSP  
r
2
G
GG  
t = Q x R /V  
f
2
G
GSP  
where  
= the gate drive voltage, which varies from zero to V  
V
GG  
= the gate drive resistance  
GG  
R
G
and Q and V  
GSP  
are read from the gate charge curve.  
2
During the turn–on and turn–off delay times, gate current is  
not constant. The simplest calculation uses appropriate  
values from the capacitance curves in a standard equation for  
voltage change in an RC network. The equations are:  
t
t
= R  
C
In [V /(V  
GG GG  
In (V /V  
iss GG GSP  
– V )]  
GSP  
)
d(on)  
d(off)  
G
iss  
= R  
C
G
1800  
1600  
1400  
1200  
V
= 0 V V = 0 V  
GS  
DS  
T = 25°C  
J
C
iss  
1000  
800  
600  
400  
C
rss  
C
iss  
C
oss  
200  
0
C
rss  
10  
5
0
5
10  
15  
20  
25  
V
GS  
V
DS  
GATE–TO–SOURCE OR DRAIN–TO–SOURCE VOLTAGE (VOLTS)  
Figure 7. Capacitance Variation  
http://onsemi.com  
4
NTP27N06, NTB27N06  
1000  
12  
10  
8
Q
T
100  
t
f
V
GS  
Q
Q
2
1
6
t
r
t
d(off)  
4
10  
t
d(on)  
V
= 30 V  
= 27 A  
= 10 V  
DS  
2
0
I
= 27 A  
I
V
D
J
D
T = 25°C  
GS  
1
0
10  
20  
30  
40  
50  
60  
70  
1
10  
R , GATE RESISTANCE ()  
G
100  
Q
, TOTAL GATE CHARGE (nC)  
G
Figure 8. Gate–To–Source and Drain–To–Source  
Voltage versus Total Charge  
Figure 9. Resistive Switching Time  
Variation versus Gate Resistance  
DRAIN–TO–SOURCE DIODE CHARACTERISTICS  
60  
V
= 0 V  
GS  
T = 25°C  
J
50  
40  
30  
20  
10  
0
0.6  
0.68  
0.76  
0.84  
0.92  
1
V
SD  
, SOURCE–TO–DRAIN VOLTAGE (VOLTS)  
Figure 10. Diode Forward Voltage versus Current  
SAFE OPERATING AREA  
The Forward Biased Safe Operating Area curves define  
the maximum simultaneous drain–to–source voltage and  
drain current that a transistor can handle safely when it is  
forward biased. Curves are based upon maximum peak  
reliable operation, the stored energy from circuit inductance  
dissipated in the transistor while in avalanche must be less  
than the rated limit and adjusted for operating conditions  
differing from those specified. Although industry practice is  
to rate in terms of energy, avalanche energy capability is not  
a constant. The energy rating decreases non–linearly with an  
increase of peak current in avalanche and peak junction  
temperature.  
junction temperature and a case temperature (T ) of 25°C.  
C
Peak repetitive pulsed power limits are determined by using  
the thermal response data in conjunction with the procedures  
discussed in AN569, “Transient Thermal Resistance –  
General Data and Its Use.”  
Although many E–FETs can withstand the stress of  
drain–to–source avalanche at currents up to rated pulsed  
Switching between the off–state and the on–state may  
traverse any load line provided neither rated peak current  
current (I  
), the energy rating is specified at rated  
DM  
(I  
) nor rated voltage (V  
) is exceeded and the  
continuous current (I ), in accordance with industry custom.  
DM DSS  
D
transition time (t ,t ) do not exceed 10 µs. In addition the total  
power averaged over a complete switching cycle must not  
The energy rating must be derated for temperature as shown  
in the accompanying graph (Figure 12). Maximum energy at  
r f  
exceed (T  
– T )/(R  
).  
currents below rated continuous I can safely be assumed to  
equal the values indicated.  
J(MAX)  
C
θJC  
D
A Power MOSFET designated E–FET can be safely used  
in switching circuits with unclamped inductive loads. For  
http://onsemi.com  
5
NTP27N06, NTB27N06  
SAFE OPERATING AREA  
100  
10  
1
200  
175  
150  
V
= 20 V  
I
D
= 27 A  
GS  
SINGLE PULSE  
T
C
= 25°C  
125  
100  
10 µs  
100 µs  
75  
50  
1 ms  
R
LIMIT  
DS(on)  
THERMAL LIMIT  
PACKAGE LIMIT  
10 ms  
25  
0
dc  
0.1  
1
10  
100  
25  
50  
75  
100  
125  
150  
175  
V , DRAIN–TO–SOURCE VOLTAGE (VOLTS)  
DS  
T , STARTING JUNCTION TEMPERATURE (°C)  
J
Figure 11. Maximum Rated Forward Biased  
Safe Operating Area  
Figure 12. Maximum Avalanche Energy versus  
Starting Junction Temperature  
1
D = 0.5  
0.2  
0.1  
0.05  
0.01  
SINGLE PULSE  
0.1  
0.0001  
0.001  
0.01  
0.1  
1
10  
t, TIME (s)  
Figure 13. Thermal Response  
di/dt  
I
S
t
rr  
t
a
t
b
TIME  
0.25 I  
t
p
S
I
S
Figure 14. Diode Reverse Recovery Waveform  
http://onsemi.com  
6
NTP27N06, NTB27N06  
2
INFORMATION FOR USING THE D PAK SURFACE MOUNT PACKAGE  
RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS  
Surface mount board layout is a critical portion of the  
total design. The footprint for the semiconductor packages  
must be the correct size to ensure proper solder connection  
interface between the board and the package. With the  
correct pad geometry, the packages will self align when  
subjected to a solder reflow process.  
0.33  
8.38  
0.08  
2.032  
0.24  
0.42  
10.66  
6.096  
0.04  
1.016  
0.12  
3.05  
0.63  
17.02  
inches  
mm  
http://onsemi.com  
7
NTP27N06, NTB27N06  
SOLDER STENCIL GUIDELINES  
Prior to placing surface mount components onto a printed  
pattern of the opening in the stencil for the drain pad is not  
critical as long as it allows approximately 50% of the pad to  
be covered with paste.  
circuit board, solder paste must be applied to the pads.  
Solder stencils are used to screen the optimum amount.  
These stencils are typically 0.008 inches thick and may be  
made of brass or stainless steel. For packages such as the  
SC–59, SC–70/SOT–323, SOD–123, SOT–23, SOT–143,  
SOT–223, SO–8, SO–14, SO–16, and SMB/SMC diode  
packages, the stencil opening should be the same as the pad  
size or a 1:1 registration. This is not the case with the DPAK  
SOLDER PASTE  
OPENINGS  
2
and D PAK packages. If one uses a 1:1 opening to screen  
solder onto the drain pad, misalignment and/or  
“tombstoning” may occur due to an excess of solder. For  
these two packages, the opening in the stencil for the paste  
should be approximately 50% of the tab area. The opening  
for the leads is still a 1:1 registration. Figure 15 shows a  
STENCIL  
Figure 15. Typical Stencil for DPAK and  
2
D PAK Packages  
2
typical stencil for the DPAK and D PAK packages. The  
SOLDERING PRECAUTIONS  
The melting temperature of solder is higher than the rated  
temperature of the device. When the entire device is heated  
to a high temperature, failure to complete soldering within  
a short time could result in device failure. Therefore, the  
following items should always be observed in order to  
minimize the thermal stress to which the devices are  
subjected.  
Always preheat the device.  
The delta temperature between the preheat and  
soldering should be 100°C or less.*  
When shifting from preheating to soldering, the  
maximum temperature gradient shall be 5°C or less.  
After soldering has been completed, the device should  
be allowed to cool naturally for at least three minutes.  
Gradual cooling should be used as the use of forced  
cooling will increase the temperature gradient and  
result in latent failure due to mechanical stress.  
Mechanical stress or shock should not be applied  
during cooling.  
When preheating and soldering, the temperature of the  
leads and the case must not exceed the maximum  
temperature ratings as shown on the data sheet. When  
using infrared heating with the reflow soldering  
method, the difference shall be a maximum of 10°C.  
The soldering temperature and time shall not exceed  
260°C for more than 10 seconds.  
* Soldering a device without preheating can cause  
excessive thermal shock and stress which can result in  
damage to the device.  
* Due to shadowing and the inability to set the wave height  
2
to incorporate other surface mount components, the D PAK  
is not recommended for wave soldering.  
http://onsemi.com  
8
NTP27N06, NTB27N06  
TYPICAL SOLDER HEATING PROFILE  
For any given circuit board, there will be a group of  
The line on the graph shows the actual temperature that  
might be experienced on the surface of a test board at or  
near a central solder joint. The two profiles are based on a  
high density and a low density board. The Vitronics  
SMD310 convection/infrared reflow soldering system was  
used to generate this profile. The type of solder used was  
62/36/2 Tin Lead Silver with a melting point between  
177–189°C. When this type of furnace is used for solder  
reflow work, the circuit boards and solder joints tend to  
heat first. The components on the board are then heated by  
conduction. The circuit board, because it has a large surface  
area, absorbs the thermal energy more efficiently, then  
distributes this energy to the components. Because of this  
effect, the main body of a component may be up to 30  
degrees cooler than the adjacent solder joint.  
control settings that will give the desired heat pattern. The  
operator must set temperatures for several heating zones,  
and a figure for belt speed. Taken together, these control  
settings make up a heating “profile” for that particular  
circuit board. On machines controlled by a computer, the  
computer remembers these profiles from one operating  
session to the next. Figure 16 shows a typical heating  
profile for use when soldering a surface mount device to a  
printed circuit board. This profile will vary among  
soldering systems but it is a good starting point. Factors that  
can affect the profile include the type of soldering system in  
use, density and types of components on the board, type of  
solder used, and the type of board or substrate material  
being used. This profile shows temperature versus time.  
STEP 1  
PREHEAT  
ZONE 1  
“RAMP”  
STEP 2  
VENT  
“SOAK” ZONES 2 & 5  
“RAMP”  
STEP 3  
HEATING  
STEP 4  
HEATING  
ZONES 3 & 6  
“SOAK”  
STEP 5  
HEATING  
ZONES 4 & 7  
“SPIKE”  
STEP 6  
VENT  
STEP 7  
COOLING  
205° TO 219°C  
PEAK AT  
SOLDER  
JOINT  
170°C  
DESIRED CURVE FOR HIGH  
MASS ASSEMBLIES  
200°C  
150°C  
100°C  
5°C  
160°C  
150°C  
SOLDER IS LIQUID FOR  
40 TO 80 SECONDS  
(DEPENDING ON  
100°C  
140°C  
MASS OF ASSEMBLY)  
DESIRED CURVE FOR LOW  
MASS ASSEMBLIES  
TIME (3 TO 7 MINUTES TOTAL)  
T
MAX  
Figure 16. Typical Solder Heating Profile  
http://onsemi.com  
9
NTP27N06, NTB27N06  
PACKAGE DIMENSIONS  
2
D PAK  
CASE 418B–03  
ISSUE D  
C
E
V
–B–  
NOTES:  
1. DIMENSIONING AND TOLERANCING PER ANSI  
Y14.5M, 1982.  
4
2. CONTROLLING DIMENSION: INCH.  
INCHES  
DIM MIN MAX  
MILLIMETERS  
A
MIN  
8.64  
9.65  
4.06  
0.51  
1.14  
MAX  
9.65  
10.29  
4.83  
0.89  
1.40  
A
B
C
D
E
G
H
J
0.340  
0.380  
0.160  
0.020  
0.045  
0.380  
0.405  
0.190  
0.035  
0.055  
S
1
2
3
–T–  
SEATING  
PLANE  
K
0.100 BSC  
2.54 BSC  
0.080  
0.018  
0.090  
0.575  
0.045  
0.110  
0.025  
0.110  
0.625  
0.055  
2.03  
0.46  
2.79  
0.64  
J
G
K
S
V
2.29  
14.60  
1.14  
2.79  
15.88  
1.40  
H
D 3 PL  
M
M
T B  
0.13 (0.005)  
STYLE 2:  
PIN 1. GATE  
2. DRAIN  
3. SOURCE  
4. DRAIN  
http://onsemi.com  
10  
NTP27N06, NTB27N06  
PACKAGE DIMENSIONS  
TO–220  
CASE 221A–09  
ISSUE AA  
NOTES:  
1. DIMENSIONING AND TOLERANCING PER ANSI  
Y14.5M, 1982.  
SEATING  
PLANE  
–T–  
2. CONTROLLING DIMENSION: INCH.  
3. DIMENSION Z DEFINES A ZONE WHERE ALL  
BODY AND LEAD IRREGULARITIES ARE  
ALLOWED.  
C
S
B
F
T
4
INCHES  
DIM MIN MAX  
MILLIMETERS  
MIN  
14.48  
9.66  
4.07  
0.64  
3.61  
2.42  
2.80  
0.46  
12.70  
1.15  
4.83  
2.54  
2.04  
1.15  
5.97  
0.00  
1.15  
---  
MAX  
15.75  
10.28  
4.82  
0.88  
3.73  
2.66  
3.93  
0.64  
14.27  
1.52  
5.33  
3.04  
2.79  
1.39  
6.47  
1.27  
---  
A
K
Q
Z
A
B
C
D
F
0.570  
0.380  
0.160  
0.025  
0.142  
0.095  
0.110  
0.018  
0.500  
0.045  
0.190  
0.100  
0.080  
0.045  
0.235  
0.000  
0.045  
---  
0.620  
0.405  
0.190  
0.035  
0.147  
0.105  
0.155  
0.025  
0.562  
0.060  
0.210  
0.120  
0.110  
0.055  
0.255  
0.050  
---  
1
2
3
U
H
G
H
J
K
L
L
R
J
N
Q
R
S
T
V
G
D
U
V
Z
N
0.080  
2.04  
STYLE 5:  
PIN 1. GATE  
2. DRAIN  
3. SOURCE  
4. DRAIN  
http://onsemi.com  
11  
NTP27N06, NTB27N06  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes  
without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular  
purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability,  
including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or  
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be  
validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights nor the rights of others.  
SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications  
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or  
death may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold  
SCILLC and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable  
attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim  
alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer.  
PUBLICATION ORDERING INFORMATION  
Literature Fulfillment:  
JAPAN: ON Semiconductor, Japan Customer Focus Center  
4–32–1 Nishi–Gotanda, Shinagawa–ku, Tokyo, Japan 141–0031  
Phone: 81–3–5740–2700  
Literature Distribution Center for ON Semiconductor  
P.O. Box 5163, Denver, Colorado 80217 USA  
Phone: 303–675–2175 or 800–344–3860 Toll Free USA/Canada  
Fax: 303–675–2176 or 800–344–3867 Toll Free USA/Canada  
Email: ONlit@hibbertco.com  
Email: r14525@onsemi.com  
ON Semiconductor Website: http://onsemi.com  
For additional information, please contact your local  
Sales Representative.  
N. American Technical Support: 800–282–9855 Toll Free USA/Canada  
NTP27N06/D  

相关型号:

NTB27N06L

TRANSISTOR | MOSFET | N-CHANNEL | 60V V(BR)DSS | 27A I(D) | TO-263AB
ETC

NTB27N06LT4

TRANSISTOR | MOSFET | N-CHANNEL | 60V V(BR)DSS | 27A I(D) | TO-263AB
ETC

NTB27N06T4

Power MOSFET 27 Amps, 60 Volts N?Channel TO?220 and D2PAK
ONSEMI

NTB30N06

Power MOSFET 30 Amps, 60 Volts
ONSEMI

NTB30N06G

Power MOSFET 30 Amps, 60 Volts
ONSEMI

NTB30N06L

Power MOSFET 30 Amps, 60 Volts, Logic Level
ONSEMI

NTB30N06LG

Power MOSFET
ONSEMI

NTB30N06LT4

Power MOSFET 30 Amps, 60 Volts, Logic Level
ONSEMI

NTB30N06LT4G

Power MOSFET 30 Amps, 60 Volts
ONSEMI

NTB30N06T4

Power MOSFET 30 Amps, 60 Volts
ONSEMI

NTB30N06T4G

Power MOSFET 30 Amps, 60 Volts
ONSEMI

NTB30N20

Power MOSFET 30 Amps, 200 Volts N−Channel Enhancement−Mode D2PAK
ONSEMI