MC74LVX50_11 [ONSEMI]

Hex Buffer;
MC74LVX50_11
型号: MC74LVX50_11
厂家: ONSEMI    ONSEMI
描述:

Hex Buffer

文件: 总11页 (文件大小:180K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
MC74LVX50  
Hex Buffer  
The MC74LVX50 is an advanced high speed CMOS buffer  
fabricated with silicon gate CMOS technology.  
The internal circuit is composed of three stages, including a buffered  
output which provides high noise immunity and stable output. The  
inputs tolerate voltages up to 7.0 V, allowing the interface of 5.0 V  
systems to 3.0 V systems.  
http://onsemi.com  
MARKING  
Features  
DIAGRAMS  
High Speed: t = 4.1 ns (Typ) at V = 3.3 V  
PD  
CC  
14  
Low Power Dissipation: I = 2 mA (Max) at T = 25°C  
CC  
A
SOIC14  
D SUFFIX  
CASE 751A  
LVX50G  
AWLYWW  
14  
14  
High Noise Immunity: V  
= V = 28% V  
NIL CC  
NIH  
1
Power Down Protection Provided on Inputs  
Balanced Propagation Delays  
1
Designed for 2.0 V to 3.6 V Operating Range  
14  
LVX  
50  
Low Noise: V  
= 0.5 V (Max)  
OLP  
TSSOP14  
DT SUFFIX  
CASE 948G  
These Devices are PbFree and are RoHS Compliant  
ALYWG  
1
G
1
14  
LVX50  
ALYWG  
SOEIAJ14  
M SUFFIX  
CASE 965  
14  
1
1
LVX50 = Specific Device Code  
= Assembly Location  
WL, L = Wafer Lot  
= Year  
A
Y
WW, W = Work Week  
G or G = PbFree Package  
(Note: Microdot may be in either location)  
ORDERING INFORMATION  
See detailed ordering and shipping information in the package  
dimensions section on page 2 of this data sheet.  
© Semiconductor Components Industries, LLC, 2011  
1
Publication Order Number:  
May, 2011 Rev. 4  
MC74LVX50/D  
MC74LVX50  
1
3
5
2
4
6
A1  
A2  
A3  
Y1  
Y2  
1
1
1
1
1
1
A1  
A2  
A3  
A4  
A5  
A6  
Y1  
Y2  
Y3  
Y4  
Y5  
Y6  
Y3  
Y = A  
Y4  
9
8
A4  
A5  
A6  
11  
13  
10  
12  
Y5  
Y6  
Figure 1. Logic Diagram  
Figure 2. Logic Symbol  
V
CC  
14  
A6  
13  
Y6  
12  
A5  
11  
Y5  
10  
A4  
9
Y4  
8
FUNCTION TABLE  
A Input  
Y Output  
L
L
H
H
1
2
3
4
5
6
7
A1  
Y1  
A2  
Y2  
A3  
Y3 GND  
14Lead Pinout (Top View)  
ORDERING INFORMATION  
Device  
Package  
Shipping  
MC74LVX50DG  
SOIC14  
(PbFree)  
55 Units / Rail  
MC74LVX50DR2G  
SOIC14  
(PbFree)  
2500 Tape & Reel  
MC74LVX50DTG  
MC74LVX50DTR2G  
MC74LVX50MG  
TSSOP14*  
TSSOP14*  
96 Units / Rail  
2500 Tape & Reel  
50 Units / Rail  
SOEIAJ14  
(PbFree)  
MC74LVX50MELG  
SOEIAJ14  
(PbFree)  
2000 Tape & Reel  
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging  
Specifications Brochure, BRD8011/D.  
*This package is inherently PbFree.  
http://onsemi.com  
2
MC74LVX50  
MAXIMUM RATINGS  
Symbol  
Parameter  
Value  
Unit  
V
V
CC  
DC Supply Voltage  
*0.5 to )7.0  
*0.5 to )7.0  
V
IN  
DC Input Voltage  
V
V
OUT  
DC Output Voltage  
*0.5 to V )0.5  
V
CC  
I
DC Input Diode Current  
DC Output Diode Current  
DC Output Sink Current  
DC Supply Current per Supply Pin  
Storage Temperature Range  
V < GND  
*20  
$20  
mA  
mA  
mA  
mA  
_C  
IK  
I
I
V < GND  
O
OK  
I
$25  
OUT  
I
$50  
CC  
T
*65 to )150  
260  
STG  
T
Lead Temperature, 1 mm from Case for 10 Seconds  
Junction Temperature under Bias  
Thermal Resistance  
_C  
L
T
)150  
_C  
_C/W  
J
q
(Note 1)  
SOIC  
TSSOP  
JA  
125  
170  
MSL  
Moisture Sensitivity  
Flammability Rating  
ESD Withstand Voltage  
Level 1  
F
R
Oxygen Index: 30% 35%  
UL 94V0 @ 0.125 in  
V
ESD  
Human Body Model (Note 2)  
Machine Model (Note 3)  
Charged Device Model (Note 4)  
> 2000  
> 200  
2000  
V
I
Latchup Performance  
Above V and Below GND at 85_C (Note 5)  
$300  
mA  
Latchup  
CC  
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit  
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,  
damage may occur and reliability may be affected.  
1. Measured with minimum pad spacing on an FR4 board, using 10 mmby1 inch, 2ounce copper trace with no air flow.  
2. Tested to EIA/JESD22A114A.  
3. Tested to EIA/JESD22A115A.  
4. Tested to JESD22C101A.  
5. Tested to EIA/JESD78.  
RECOMMENDED OPERATING CONDITIONS  
Symbol  
Parameter  
Min  
2.0  
0
Max  
3.6  
Unit  
V
V
CC  
Supply Voltage  
V
I
Input Voltage  
(Note 6)  
5.5  
V
V
O
Output Voltage  
(HIGH or LOW State)  
0
V
CC  
V
T
Operating FreeAir Temperature  
Input Transition Rise or Fall Rate  
*40  
0
)85  
_C  
ns/V  
A
Dt/DV  
V
= 3.0 V $0.3 V  
100  
CC  
6. Unused inputs may not be left open. All inputs must be tied to a highor lowlogic input voltage level.  
NOTE: The q of the package is equal to 1/Derating. Higher junction temperatures may affect the expected lifetime of the device per the table  
JA  
and figure below.  
http://onsemi.com  
3
 
MC74LVX50  
DC ELECTRICAL CHARACTERISTICS  
T
A
= 25°C  
T 85°C  
A
V
CC  
Min  
Typ  
Max  
Min  
Max  
(V)  
Symbol  
Parameter  
Test Conditions  
Unit  
V
IH  
HighLevel Input Voltage  
2.0  
3.0  
3.6  
1.5  
2.0  
2.4  
1.5  
2.0  
2.4  
V
V
LowLevel Input Voltage  
2.0  
3.0  
3.6  
0.5  
0.8  
0.8  
0.5  
0.8  
0.8  
V
V
V
IL  
V
OH  
HighLevel Output Voltage  
I
I
I
= 50 mA  
= 50 mA  
= 4 mA  
2.0  
3.0  
3.0  
1.9  
2.9  
2.58  
2.0  
3.0  
1.9  
2.9  
2.48  
OH  
OH  
OH  
(V = V or V )  
IN  
IH  
IL  
V
OL  
LowLevel Output Voltage  
I
OL  
I
OL  
I
OL  
= 50 mA  
= 50 mA  
= 4 mA  
2.0  
3.0  
3.0  
0.0  
0.0  
0.1  
0.1  
0.36  
0.1  
0.1  
0.44  
(V = V or V )  
IN  
IH  
IL  
I
Input Leakage Current  
V
= 5.5 V or GND  
0 to  
3.6  
0.1  
2.0  
1.0  
mA  
mA  
IN  
IN  
I
Quiescent Supply Current  
V
IN  
= V or GND  
3.6  
20.0  
CC  
CC  
AC ELECTRICAL CHARACTERISTICS Input t = t = 3.0 ns  
r
f
T
A
= 25°C  
T 85°C  
A
Min  
Typ  
Max  
Min  
Max  
Symbol  
Parameter  
Test Conditions  
Unit  
V
V
= 2.7 V  
C = 15 pF  
C = 50 pF  
L
5.4  
7.9  
10.1  
13.6  
1.0  
1.0  
12.5  
16.0  
t
,
Propagation Delay,  
Input A to Y  
ns  
CC  
L
PLH  
t
PHL  
= 3.3 V 0.3 V  
C = 15 pF  
4.1  
6.6  
6.2  
9.7  
1.0  
1.0  
7.5  
11.5  
CC  
L
C = 50 pF  
L
V
V
= 2.7 V  
C = 50 pF  
1.5  
1.5  
10  
1.5  
1.5  
10  
t
t
OutputtoOutput Skew  
(Note 7)  
ns  
CC  
L
OSHL  
OSLH  
= 3.3 V 0.3V  
C = 50 pF  
L
CC  
C
Input Capacitance  
4
pF  
IN  
Typical @ 25°C, V = 3.3 V  
CC  
15  
C
Power Dissipation Capacitance (Note 8)  
pF  
PD  
7. Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device.  
The specification applies to any outputs switching in the same direction, either HIGHtoLOW (t  
) or LOWtoHIGH (t  
); parameter  
OSHL  
OSLH  
guaranteed by design.  
8. C is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load.  
PD  
Average operating current can be obtained by the equation: I  
) = C V f + I . C is used to determine the noload dynamic  
CC(OPR  
PD CC in CC PD  
2
power consumption; P = C V  
f + I V  
.
D
PD  
CC  
in  
CC  
CC  
NOISE CHARACTERISTICS Input t = t = 3.0ns, C = 50pF, V = 3.3 V  
r
f
L
CC  
T
A
= 25°C  
Typ  
Max  
Symbol  
Characteristic  
Unit  
V
V
Quiet Output Maximum Dynamic V  
0.3  
0.5  
0.5  
2.0  
OLP  
OLV  
OL  
V
Quiet Output Minimum Dynamic V  
0.3  
V
OL  
V
IHD  
Minimum High Level Dynamic Input Voltage  
Maximum Low Level Dynamic Input Voltage  
V
V
ILD  
0.8  
V
http://onsemi.com  
4
 
MC74LVX50  
TEST POINT  
OUTPUT  
V
CC  
50%  
A
Y
DEVICE  
UNDER  
TEST  
GND  
t
t
PHL  
PLH  
C *  
L
50% V  
CC  
*Includes all probe and jig capacitance  
Figure 3. Switching Waveforms  
Figure 4. Test Circuit  
INPUT  
Figure 5. Input Equivalent Circuit  
EMBOSSED CARRIER DIMENSIONS (See Notes 9 and 10)  
Tape  
Size  
B
1
Max  
D
D
E
F
K
P
P
0
P
2
R
T
W
1
8 mm  
4.35 mm  
(0.179”)  
1.0 mm  
Min  
3.5 mm  
0.5  
2.4 mm  
Max  
4.0 mm  
0.10  
25 mm  
(0.98”)  
8.3 mm  
(0.327)  
1.5 mm  
+ 0.1  
1.75 mm  
0.1  
4.0 mm  
0.1  
2.0 mm  
0.1  
0.6 mm  
(0.024)  
(0.179”)  
(1.38  
0.002”)  
(0.094”)  
(0.157  
0.004”)  
0.0  
(0.069  
0.004”)  
(0.157  
0.004”)  
(0.079  
0.004”)  
(0.059”  
+0.004  
0.0)  
12 mm  
8.2 mm  
(0.323”)  
5.5 mm  
0.5  
6.4 mm  
Max  
4.0 mm  
0.10  
12.0 mm  
0.3  
1.5 mm  
Min  
30 mm  
(1.18”)  
(0.217  
0.002”)  
(0.252”)  
(0.157  
0.004”)  
8.0 mm  
0.10  
(0.470  
0.012”)  
(0.060)  
(0.315  
0.004”)  
16 mm 12.1 mm  
(0.476”)  
7.5 mm  
0.10  
7.9 mm  
Max  
4.0 mm  
0.10  
16.3 mm  
(0.642)  
(0.295  
0.004”)  
(0.311”)  
(0.157  
0.004”)  
8.0 mm  
0.10  
(0.315  
0.004”)  
12.0 mm  
0.10  
(0.472  
0.004”)  
24 mm 20.1 mm  
(0.791”)  
11.5 mm  
0.10  
11.9 mm  
Max  
16.0 mm  
0.10  
24.3 mm  
(0.957)  
(0.453  
0.004”)  
(0.468”)  
(0.63  
0.004”)  
9. Metric Dimensions GovernEnglish are in parentheses for reference only.  
10.A , B , and K are determined by component size. The clearance between the components and the cavity must be within 0.05 mm min to  
0
0
0
0.50 mm max. The component cannot rotate more than 10° within the determined cavity  
http://onsemi.com  
5
 
MC74LVX50  
10 PITCHES  
CUMULATIVE  
TOLERANCE ON  
TAPE  
0.2 mm  
( 0.008”)  
P
0
K
t
P
2
D
TOP  
COVER  
TAPE  
E
SEE NOTE 11  
A
0
F
W
+
+
+
K
0
B
0
B
1
SEE  
NOTE  
11  
D
1
P
FOR COMPONENTS  
2.0 mm × 1.2 mm  
AND LARGER  
EMBOSSMENT  
USER DIRECTION OF FEED  
CENTER  
LINES  
OF CAVITY  
FOR MACHINE REFERENCE  
ONLY  
INCLUDING DRAFT AND RADII  
CONCENTRIC AROUND B  
0
*TOP COVER  
TAPE THICKNESS (t )  
1
0.10 mm  
(0.004”) MAX.  
R MIN.  
TAPE AND COMPONENTS  
SHALL PASS AROUND RADIUS “R”  
WITHOUT DAMAGE  
EMBOSSED  
CARRIER  
EMBOSSMENT  
BENDING RADIUS  
100 mm  
(3.937”)  
MAXIMUM COMPONENT ROTATION  
10°  
1 mm MAX  
TYPICAL  
COMPONENT CAVITY  
CENTER LINE  
TAPE  
1 mm  
(0.039”) MAX  
250 mm  
(9.843”)  
TYPICAL  
CAMBER (TOP VIEW)  
ALLOWABLE CAMBER TO BE 1 mm/100 mm NONACCUMULATIVE OVER 250 mm  
COMPONENT  
CENTER LINE  
11. A , B , and K are determined by component size. The clearance between the components and the cavity must be within 0.05 mm min to  
0
0
0
0.50 mm max. The component cannot rotate more than 10° within the determined cavity  
Figure 6. Carrier Tape Specifications  
http://onsemi.com  
6
 
MC74LVX50  
t MAX  
13.0 mm 0.2 mm  
(0.512” 0.008”)  
1.5 mm MIN  
(0.06”)  
20.2 mm MIN  
(0.795”)  
50 mm MIN  
(1.969”)  
A
FULL RADIUS  
G
Figure 7. Reel Dimensions  
REEL DIMENSIONS  
Tape Size  
T&R Suffix  
A Max  
G
t Max  
8 mm  
T1, T2  
178 mm  
(7”)  
8.4 mm, +1.5 mm, 0.0  
(0.33” + 0.059”, 0.00)  
14.4 mm  
(0.56”)  
8 mm  
T3, T4  
R2  
330 mm  
(13”)  
8.4 mm, +1.5 mm, 0.0  
(0.33” + 0.059”, 0.00)  
14.4 mm  
(0.56”)  
12 mm  
16 mm  
24 mm  
330 mm  
(13”)  
12.4 mm, +2.0 mm, 0.0  
(0.49” + 0.079”, 0.00)  
18.4 mm  
(0.72”)  
R2  
360 mm  
(14.173”)  
16.4 mm, +2.0 mm, 0.0  
(0.646” + 0.078”, 0.00)  
22.4 mm  
(0.882”)  
R2  
360 mm  
(14.173”)  
24.4 mm, +2.0 mm, 0.0  
(0.961” + 0.078”, 0.00)  
30.4 mm  
(1.197”)  
DIRECTION OF FEED  
BARCODE LABEL  
POCKET  
HOLE  
Figure 8. Reel Winding Direction  
http://onsemi.com  
7
MC74LVX50  
TAPE TRAILER  
(Connected to Reel Hub)  
NO COMPONENTS  
160 mm MIN  
TAPE LEADER  
NO COMPONENTS  
400 mm MIN  
COMPONENTS  
CAVITY TOP TAPE  
TAPE  
DIRECTION OF FEED  
Figure 9. Tape Ends for Finished Goods  
User Direction of Feed  
Figure 10. TSSOP and SOIC R2 Reel Configuration/Orientation  
TAPE UTILIZATION BY PACKAGE  
SC88A / SOT353  
SC88/SOT363  
Tape Size  
8 mm  
SOIC  
TSSOP  
QFN  
5, 6Lead  
12 mm  
16 mm  
24 mm  
8Lead  
8, 14, 16Lead  
20, 24Lead  
48, 56Lead  
8, 14, 16Lead  
20, 24Lead  
48, 56Lead  
14, 16Lead  
18, 20, 24, 28Lead  
http://onsemi.com  
8
MC74LVX50  
PACKAGE DIMENSIONS  
SOIC14  
D SUFFIX  
CASE 751A03  
ISSUE J  
NOTES:  
1. DIMENSIONING AND TOLERANCING PER  
ANSI Y14.5M, 1982.  
2. CONTROLLING DIMENSION: MILLIMETER.  
3. DIMENSIONS A AND B DO NOT INCLUDE  
MOLD PROTRUSION.  
A−  
14  
8
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006)  
PER SIDE.  
5. DIMENSION D DOES NOT INCLUDE  
DAMBAR PROTRUSION. ALLOWABLE  
DAMBAR PROTRUSION SHALL BE 0.127  
(0.005) TOTAL IN EXCESS OF THE D  
DIMENSION AT MAXIMUM MATERIAL  
CONDITION.  
B−  
P 7 PL  
M
M
B
0.25 (0.010)  
7
1
G
MILLIMETERS  
DIM MIN MAX  
INCHES  
MIN MAX  
F
R X 45  
_
C
A
B
C
D
F
8.55  
3.80  
1.35  
0.35  
0.40  
8.75 0.337 0.344  
4.00 0.150 0.157  
1.75 0.054 0.068  
0.49 0.014 0.019  
1.25 0.016 0.049  
T−  
J
M
K
SEATING  
G
J
K
M
P
R
1.27 BSC  
0.050 BSC  
0.25 0.008 0.009  
0.25 0.004 0.009  
_
D 14 PL  
PLANE  
0.19  
0.10  
0
M
S
S
0.25 (0.010)  
T
B
A
7
0
7
_
_
_
5.80  
0.25  
6.20 0.228 0.244  
0.50 0.010 0.019  
SOLDERING FOOTPRINT  
7X  
7.04  
14X  
1.52  
1
14X  
0.58  
1.27  
PITCH  
DIMENSIONS: MILLIMETERS  
http://onsemi.com  
9
MC74LVX50  
PACKAGE DIMENSIONS  
TSSOP14  
DT SUFFIX  
CASE 948G01  
ISSUE B  
NOTES:  
14X K REF  
1. DIMENSIONING AND TOLERANCING PER  
M
S
S
V
ANSI Y14.5M, 1982.  
0.10 (0.004)  
T
U
2. CONTROLLING DIMENSION: MILLIMETER.  
3. DIMENSION A DOES NOT INCLUDE MOLD  
FLASH, PROTRUSIONS OR GATE BURRS.  
MOLD FLASH OR GATE BURRS SHALL NOT  
EXCEED 0.15 (0.006) PER SIDE.  
S
0.15 (0.006) T  
U
N
0.25 (0.010)  
14  
8
4. DIMENSION B DOES NOT INCLUDE  
INTERLEAD FLASH OR PROTRUSION.  
INTERLEAD FLASH OR PROTRUSION SHALL  
NOT EXCEED 0.25 (0.010) PER SIDE.  
5. DIMENSION K DOES NOT INCLUDE  
DAMBAR PROTRUSION. ALLOWABLE  
DAMBAR PROTRUSION SHALL BE 0.08  
(0.003) TOTAL IN EXCESS OF THE K  
DIMENSION AT MAXIMUM MATERIAL  
CONDITION.  
2X L/2  
M
B
L
N
U−  
PIN 1  
IDENT.  
F
7
1
DETAIL E  
6. TERMINAL NUMBERS ARE SHOWN FOR  
REFERENCE ONLY.  
7. DIMENSION A AND B ARE TO BE  
DETERMINED AT DATUM PLANE W.  
S
K
0.15 (0.006) T  
U
A
V−  
K1  
MILLIMETERS  
DIM MIN MAX  
INCHES  
MIN MAX  
A
B
C
D
F
G
H
J
4.90  
4.30  
−−−  
0.05  
0.50  
5.10 0.193 0.200  
4.50 0.169 0.177  
J J1  
1.20  
−−− 0.047  
0.15 0.002 0.006  
0.75 0.020 0.030  
SECTION NN  
0.65 BSC  
0.026 BSC  
0.60 0.020 0.024  
0.20 0.004 0.008  
0.16 0.004 0.006  
0.30 0.007 0.012  
0.25 0.007 0.010  
0.50  
0.09  
0.09  
0.19  
W−  
C
J1  
K
K1 0.19  
0.10 (0.004)  
L
M
6.40 BSC  
0.252 BSC  
SEATING  
PLANE  
T−  
H
G
0
8
0
8
DETAIL E  
_
_
_
_
D
SOLDERING FOOTPRINT  
7.06  
1
0.65  
PITCH  
01.34X6  
14X  
1.26  
DIMENSIONS: MILLIMETERS  
http://onsemi.com  
10  
MC74LVX50  
PACKAGE DIMENSIONS  
SOEIAJ14  
CASE 96501  
ISSUE B  
NOTES:  
ꢀꢁ1. DIMENSIONING AND TOLERANCING PER ANSI  
Y14.5M, 1982.  
ꢀꢁ2. CONTROLLING DIMENSION: MILLIMETER.  
ꢀꢁ3. DIMENSIONS D AND E DO NOT INCLUDE  
MOLD FLASH OR PROTRUSIONS AND ARE  
MEASURED AT THE PARTING LINE. MOLD FLASH  
OR PROTRUSIONS SHALL NOT EXCEED 0.15  
(0.006) PER SIDE.  
L
14  
8
E
Q
1
H
E
_
E
M
ꢀꢁ4. TERMINAL NUMBERS ARE SHOWN FOR  
REFERENCE ONLY.  
L
7
1
ꢀꢁ5. THE LEAD WIDTH DIMENSION (b) DOES NOT  
INCLUDE DAMBAR PROTRUSION. ALLOWABLE  
DAMBAR PROTRUSION SHALL BE 0.08 (0.003)  
TOTAL IN EXCESS OF THE LEAD WIDTH  
DIMENSION AT MAXIMUM MATERIAL CONDITION.  
DAMBAR CANNOT BE LOCATED ON THE LOWER  
RADIUS OR THE FOOT. MINIMUM SPACE  
BETWEEN PROTRUSIONS AND ADJACENT LEAD  
TO BE 0.46 ( 0.018).  
DETAIL P  
Z
D
VIEW P  
A
e
c
MILLIMETERS  
INCHES  
MIN  
---  
DIM MIN  
MAX  
MAX  
0.081  
0.008  
0.020  
0.008  
0.413  
0.215  
A
---  
0.05  
0.35  
0.10  
9.90  
5.10  
2.05  
A
b
A
1
1
b
c
0.20 0.002  
0.50 0.014  
0.20 0.004  
10.50 0.390  
5.45 0.201  
M
0.13 (0.005)  
0.10 (0.004)  
D
E
e
1.27 BSC  
0.050 BSC  
H
7.40  
0.50  
1.10  
8.20 0.291  
0.85 0.020  
1.50 0.043  
0.323  
0.033  
0.059  
E
L
L
E
M
0
10  
0.90 0.028  
10  
_
0.035  
0.056  
0
_
_
_
Q
0.70  
---  
1
Z
1.42  
---  
ON Semiconductor and  
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice  
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability  
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.  
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All  
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights  
nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications  
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should  
Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates,  
and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death  
associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal  
Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.  
PUBLICATION ORDERING INFORMATION  
LITERATURE FULFILLMENT:  
N. American Technical Support: 8002829855 Toll Free  
USA/Canada  
Europe, Middle East and Africa Technical Support:  
Phone: 421 33 790 2910  
Japan Customer Focus Center  
Phone: 81357733850  
ON Semiconductor Website: www.onsemi.com  
Order Literature: http://www.onsemi.com/orderlit  
Literature Distribution Center for ON Semiconductor  
P.O. Box 5163, Denver, Colorado 80217 USA  
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For additional information, please contact your local  
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MC74LVX50/D  

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