MBRB3030CTL [ONSEMI]

SWITCHMODE Power Rectifier; 开关模式电源整流器
MBRB3030CTL
型号: MBRB3030CTL
厂家: ONSEMI    ONSEMI
描述:

SWITCHMODE Power Rectifier
开关模式电源整流器

整流二极管 开关
文件: 总8页 (文件大小:87K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
MBRB3030CTL  
SWITCHMODEt  
Power Rectifier  
These state−of−the−art devices use the Schottky Barrier principle  
with a proprietary barrier metal.  
Features  
http://onsemi.com  
Dual Diode Construction, May be Paralleled for Higher Current Output  
Guard−Ring for Stress Protection  
Low Forward Voltage Drop  
125°C Operating Junction Temperature  
Maximum Die Size  
SCHOTTKY BARRIER  
RECTIFIER  
30 AMPERES, 30 VOLTS  
Short Heat Sink Tab Manufactured − Not Sheared!  
Pb−Free Package is Available  
1
4
3
Mechanical Characteristics  
Case: Epoxy, Molded, Epoxy Meets UL 94 V−0  
Weight: 1.7 Grams (Approximately)  
Finish: All External Surfaces Corrosion Resistant and Terminal  
Leads are Readily Solderable  
4
Lead and Mounting Surface Temperature for Soldering Purposes:  
1
260°C Max. for 10 Seconds  
3
Device Meets MSL1 Requirements  
ESD Ratings: Machine Model, C (>400 V)  
Human Body Model, 3B (>8000 V)  
2
D PAK  
CASE 418B  
PLASTIC  
MAXIMUM RATINGS  
Rating  
Symbol  
Value  
Unit  
MARKING DIAGRAM  
Peak Repetitive Reverse Voltage  
Working Peak Reverse Voltage  
DC Blocking Voltage  
V
30  
V
RRM  
V
RWM  
V
I
R
Average Rectified Forward Current  
15  
30  
A
A
AY WW  
B3030CTLG  
AKA  
O
(At Rated V , T = 115°C) Per Device  
R
C
Peak Repetitive Forward Current  
I
30  
300  
2.0  
FRM  
(At Rated V , Square Wave,  
R
20 kHz, T = 115°C)  
C
Non−Repetitive Peak Surge Current  
(Surge Applied at Rated Load Conditions  
Halfwave, Single Phase, 60 Hz)  
I
A
A
FSM  
A
Y
= Assembly Location  
= Year  
Peak Repetitive Reverse Surge Current  
I
RRM  
(1.0 ms, 1.0 kHz)  
WW  
= Work Week  
Storage Temperature Range  
T
−55 to +150  
−55 to +125  
10,000  
°C  
°C  
stg  
B3030CTL = Device Code  
G
AKA  
Operating Junction Temperature Range  
T
= Pb−Free Package  
= Diode Polarity  
J
Voltage Rate of Change  
dV/dt  
V/ms  
(Rated V , T = 25°C)  
R
J
ORDERING INFORMATION  
Reverse Energy, Unclamped Inductive  
E
224.5  
mJ  
AS  
Surge (T = 25°C, L = 3.0 mH)  
J
Device  
Package  
Shipping  
Maximum ratings are those values beyond which device damage can occur.  
Maximum ratings applied to the device are individual stress limit values (not  
normal operating conditions) and are not valid simultaneously. If these limits are  
exceeded, device functional operation is not implied, damage may occur and  
reliability may be affected.  
2
MBRB3030CTL  
D PAK  
50 Units / Rail  
50 Units / Rail  
2
MBRB3030CTLG  
D PAK  
(Pb−Free)  
©
Semiconductor Components Industries, LLC, 2005  
1
Publication Order Number:  
August, 2005 − Rev. 6  
MBRB3030CTL/D  
MBRB3030CTL  
THERMAL CHARACTERISTICS (All device data is “Per Leg” except where noted.)  
Characteristic  
Thermal Resistance, Junction−to−Ambient (Note 1)  
Thermal Resistance, Junction−to−Case  
Symbol  
Value  
50  
Unit  
°C/W  
°C/W  
R
q
JA  
JC  
R
q
1.0  
ELECTRICAL CHARACTERISTICS  
Maximum Instantaneous Forward Voltage (Note 2)  
V
V
F
(I = 15 A, T = 25°C)  
0.44  
0.51  
F
J
(I = 30 A, T = 25°C)  
F
J
Maximum Instantaneous Reverse Current (Note 2)  
I
mA  
R
(Rated V , T = 25°C)  
2.0  
195  
R
J
(Rated V , T = 125°C)  
R
J
1. Mounted using minimum recommended pad size on FR−4 board.  
2. Pulse Test: Pulse Width = 250 ms, Duty Cycle 2.0%.  
1000  
100  
1000  
100  
T = 125°C  
J
T = 125°C  
J
10  
10  
1.0  
0.1  
75°C  
75°C  
25°C  
25°C  
1.0  
0.1  
0.1  
0.3  
0.5  
0.7  
0.9  
1.1  
0.1  
0.3  
0.5  
0.7  
0.9  
1.1  
V , INSTANTANEOUS FORWARD VOLTAGE (VOLTS)  
F
V , MAXIMUM INSTANTANEOUS FORWARD VOLTAGE (VOLTS)  
F
Figure 1. Typical Forward Voltage  
Figure 2. Maximum Forward Voltage  
1.0E+0  
1.0E+0  
1.0E−1  
1.0E−2  
1.0E−3  
T = 125°C  
J
1.0E−1  
1.0E−2  
1.0E−3  
T = 125°C  
J
75°C  
25°C  
75°C  
25°C  
1.0E−4  
1.0E−5  
1.0E−4  
1.0E−5  
0
5.0  
10  
15  
20  
25  
30  
0
5.0  
10  
15  
20  
25  
30  
V , REVERSE VOLTAGE (VOLTS)  
R
V , REVERSE VOLTAGE (VOLTS)  
R
Figure 3. Typical Reverse Current  
Figure 4. Maximum Reverse Current  
http://onsemi.com  
2
 
MBRB3030CTL  
25  
20  
15  
10  
10  
9.0  
8.0  
7.0  
6.0  
5.0  
4.0  
dc  
dc  
SQUARE  
WAVE  
Ipk/Io = p  
SQUARE WAVE  
Ipk/Io = 5.0  
Ipk/Io = 10  
Ipk/Io = p  
Ipk/Io = 5.0  
Ipk/Io = 20  
3.0  
2.0  
Ipk/Io = 10  
Ipk/Io = 20  
T = 125°C  
J
5.0  
0
FREQ = 20 kHz  
1.0  
0
0
20  
40  
60  
80  
100  
120  
140  
0
5.0  
10  
15  
20  
25  
T , CASE TEMPERATURE (°C)  
C
I , AVERAGE FORWARD CURRENT (AMPS)  
O
Figure 5. Current Derating  
Figure 6. Forward Power Dissipation  
10,000  
1000  
100  
100  
T = 25°C  
J
T = 25°C  
J
10  
0.1  
1.0  
10  
100  
0.00001  
0.0001  
t, TIME (seconds)  
0.001  
0.01  
V , REVERSE VOLTAGE (VOLTS)  
R
Figure 7. Typical Capacitance  
Figure 8. Typical Unclamped Inductive Surge  
1.0E+00  
1.0E−01  
1.0E−02  
R
= R  
tjc*r(t)  
tjc(t)  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1.0  
10  
t, TIME (seconds)  
Figure 9. Typical Thermal Response  
http://onsemi.com  
3
MBRB3030CTL  
Modeling Reverse Energy Characteristics  
of Power Rectifiers  
Prepared by: David Shumate & Larry Walker  
ON Semiconductor Products Sector  
ABSTRACT  
applied to devices used in this switching power circuitry.  
This technology lends itself to lower reverse breakdown  
voltages. This combination of high voltage spikes and low  
reverse breakdown voltage devices can lead to reverse  
energy destruction of power rectifiers in their applications.  
This phenomena, however, is not limited to just Schottky  
technology.  
In order to meet the challenges of these situations, power  
semiconductor manufacturers attempt to characterize their  
devices with respect to reverse energy robustness. The  
typical reverse energy specification, if provided at all, is  
usually given as energy−to−failure (mJ) with a particular  
inductor specified for the UIS test circuit. Sometimes the  
peak reverse test current is also specified. Practically all  
reverse energy characterizations are performed using the  
UIS test circuit shown in Figure 10. Typical UIS voltage and  
current waveforms are shown in Figure 11.  
Power semiconductor rectifiers are used in a variety of  
applications where the reverse energy requirements often  
vary dramatically based on the operating conditions of the  
application circuit. A characterization method was devised  
using the Unclamped Inductive Surge (UIS) test technique.  
By testing at only a few different operating conditions  
(i.e. different inductor sizes) a safe operating range can be  
established for a device. A relationship between peak  
avalanche current and inductor discharge time was  
established. Using this relationship and circuit parameters,  
the part applicability can be determined. This technique  
offers a power supply designer the total operating conditions  
for a device as opposed to the present single−data−point  
approach.  
INTRODUCTION  
In order to provide the designer with a more extensive  
characterization than the above mentioned one−point  
approach, a more comprehensive method for characterizing  
these devices was developed. A designer can use the given  
information to determine the appropriateness and safe  
operating area (SOA) of the selected device.  
In today’s modern power supplies, converters and other  
switching circuitry, large voltage spikes due to parasitic  
inductance can propagate throughout the circuit, resulting in  
catastrophic device failures. Concurrent with this, in an  
effort to provide low−loss power rectifiers, i.e., devices with  
lower forward voltage drops, Schottky technology is being  
HIGH SPEED SWITCH  
CHARGE INDUCTOR  
DRAIN CURRENT  
FREE−WHEELING  
DIODE  
+
V
INDUCTOR  
CHARGE  
SWITCH  
DRAIN VOLTAGE  
DUT  
GATE  
VOLTAGE  
Figure 10. Simplified UIS Test Circuit  
http://onsemi.com  
4
 
MBRB3030CTL  
Suggested Method of Characterization  
Example Application  
The device used for this example was an MBR3035CT,  
which is a 30 A (15 A per side) forward current, 35 V reverse  
breakdown voltage rectifier. All parts were tested to  
destruction at 25°C. The inductors used for the  
characterization were 10, 3.0, 1.0 and 0.3 mH. The data  
recorded from the testing were peak reverse current (Ip),  
peak reverse breakdown voltage (BVR), maximum  
withstand energy, inductance and inductor discharge time  
(see Table 1). A plot of the Peak Reverse Current versus  
Time at device destruction, as shown in Figure 12, was  
generated. The area under the curve is the region of lower  
reverse energy or lower stress on the device. This area is  
known as the safe operating area or SOA.  
INDUCTOR  
CURRENT  
DUT  
REVERSE  
VOLTAGE  
TIME (s)  
120  
100  
80  
Figure 11. Typical Voltage and Current UIS  
Waveforms  
Utilizing the UIS test circuit in Figure 10, devices are  
tested to failure using inductors ranging in value from 0.01  
to 159 mH. The reverse voltage and current waveforms are  
acquired to determine the exact energy seen by the device  
and the inductive current decay time. At least 4 distinct  
inductors and 5 to 10 devices per inductor are used to  
generate the characteristic current versus time relationship.  
This relationship when coupled with the application circuit  
conditions, defines the SOA of the device uniquely for this  
application.  
UIS CHARACTERIZATION CURVE  
60  
40  
20  
0
SAFE OPERATING AREA  
0
0.0005 0.001 0.0015 0.002 0.0025 0.003 0.0035 0.004  
TIME (s)  
Figure 12. Peak Reverse Current versus  
Time for DUT  
http://onsemi.com  
5
MBRB3030CTL  
As an example, the values were chosen as L = 200 mH,  
OV = 12 V and BVR = 35 V.  
Figure 13 illustrates the example. Note the UIS  
characterization curve, the parasitic inductor current curve  
and the safe operating region as indicated.  
Table 1. UIS Test Data  
PART  
ENERGY  
(mJ)  
TIME  
NO.  
I
(A)  
B
(V)  
L (mH)  
1
(ms)  
P
VR  
1
2
3
4
5
6
7
8
9
46.6  
41.7  
46.0  
42.7  
44.9  
44.1  
26.5  
26.4  
24.4  
27.6  
27.7  
17.9  
18.9  
18.8  
19.0  
74.2  
77.3  
75.2  
77.3  
73.8  
75.6  
74.7  
78.4  
70.5  
78.3  
65.2  
63.4  
66.0  
64.8  
64.8  
64.1  
63.1  
62.8  
62.2  
62.9  
63.2  
62.6  
62.1  
60.7  
62.6  
69.1  
69.6  
68.9  
69.6  
69.1  
69.2  
68.6  
70.3  
66.6  
69.4  
998.3  
870.2  
1038.9  
904.2  
997.3  
865.0  
1022.6  
1024.9  
872.0  
1091.0  
1102.4  
1428.6  
1547.4  
1521.1  
1566.2  
768.4  
815.4  
791.7  
842.6  
752.4  
823.2  
747.5  
834.0  
678.4  
817.3  
715  
657  
1
120  
1
697  
1
659  
I
ꢀ TIME RELATIONSHIP  
DUE TO CIRCUIT PARASITICS  
peak  
100  
80  
1
693  
1
687  
3
1261  
1262  
1178  
1316  
1314  
2851  
3038  
3092  
3037  
322  
60  
3
3
UIS CHARACTERIZATION CURVE  
40  
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
3
20  
0
3
SAFE OPERATING AREA  
10  
10  
10  
10  
0.3  
0.3  
0.3  
0.3  
0.3  
0.3  
0.3  
0.3  
0.3  
0.3  
0
0.0005 0.001 0.0015 0.002 0.0025 0.003 0.0035 0.004  
TIME (s)  
Figure 13. DUT Peak Reverse and Circuit  
Parasitic Inductance Current versus Time  
333  
328  
SUMMARY  
333  
Traditionally, power rectifier users have been supplied  
with single−data−point reverse−energy characteristics by  
the supplier’s device data sheet; however, as has been shown  
here and in previous work, the reverse withstand energy can  
vary significantly depending on the application. What was  
done in this work was to create a characterization scheme by  
which the designer can overlay or map their particular  
requirements onto the part capability and determine quite  
accurately if the chosen device is applicable. This  
characterization technique is very robust due to its statistical  
approach, and with proper guardbanding (6s) can be used to  
give worst−case device performance for the entire product  
line. A “typical” characteristic curve is probably the most  
applicable for designers allowing them to design in their  
own margins.  
321  
328  
327  
335  
317  
339  
The procedure to determine if a rectifier is appropriate,  
from a reverse energy standpoint, to be used in the  
application circuit is as follows:  
a. Obtain “Peak Reverse Current versus Time” curve  
from data book.  
b. Determine steady state operating voltage (OV) of  
circuit.  
c. Determine parasitic inductance (L) of circuit section of  
interest.  
d. Obtain rated breakdown voltage (BVR) of rectifier  
from data book.  
References  
1. Borras, R., Aliosi, P., Shumate, D., 1993, “Avalanche  
Capability of Today’s Power Semiconductors,  
“Proceedings, European Power Electronic  
Conference,” 1993, Brighton, England  
e. From the following relationships,  
(BVR * OV) @ t  
d
V + L @ i(t)  
dt  
2. Pshaenich, A., 1985, “Characterizing Overvoltage  
Transient Suppressors,” Powerconversion  
International, June/July  
I +  
L
a “designer” l versus t curve is plotted alongside the  
device characteristic plot.  
f. The point where the two curves intersect is the current  
level where the devices will start to fail. A peak  
inductor current below this intersection should be  
chosen for safe operating.  
http://onsemi.com  
6
 
MBRB3030CTL  
PACKAGE DIMENSIONS  
D2PAK  
CASE 418B−04  
ISSUE J  
NOTES:  
C
1. DIMENSIONING AND TOLERANCING  
PER ANSI Y14.5M, 1982.  
2. CONTROLLING DIMENSION: INCH.  
3. 418B−01 THRU 418B−03 OBSOLETE,  
NEW STANDARD 418B−04.  
E
V
W
−B−  
4
INCHES  
DIM MIN MAX  
MILLIMETERS  
MIN  
MAX  
A
B
C
D
E
F
G
H
J
0.340 0.380  
0.380 0.405  
0.160 0.190  
0.020 0.035  
0.045 0.055  
0.310 0.350  
0.100 BSC  
8.64  
9.65 10.29  
4.06  
0.51  
1.14  
7.87  
9.65  
A
4.83  
0.89  
1.40  
8.89  
S
1
2
3
2.54 BSC  
−T−  
SEATING  
PLANE  
0.080  
0.018 0.025  
0.090 0.110  
0.110  
2.03  
0.46  
2.29  
1.32  
7.11  
5.00 REF  
2.00 REF  
0.99 REF  
2.79  
0.64  
2.79  
1.83  
8.13  
K
W
J
K
L
G
0.052 0.072  
0.280 0.320  
0.197 REF  
0.079 REF  
0.039 REF  
M
N
P
R
S
V
H
D 3 PL  
M
M
0.13 (0.005)  
T
B
0.575 0.625 14.60 15.88  
0.045 0.055 1.14 1.40  
VARIABLE  
CONFIGURATION  
ZONE  
N
P
R
U
L
L
L
M
M
M
F
F
F
VIEW W−W  
1
VIEW W−W  
2
VIEW W−W  
3
SOLDERING FOOTPRINT*  
8.38  
0.33  
1.016  
0.04  
10.66  
0.42  
5.08  
0.20  
3.05  
0.12  
17.02  
0.67  
mm  
inches  
ǒ
Ǔ
SCALE 3:1  
*For additional information on our Pb−Free strategy and soldering  
details, please download the ON Semiconductor Soldering and  
Mounting Techniques Reference Manual, SOLDERRM/D.  
http://onsemi.com  
7
MBRB3030CTL  
SWITCHMODE is a trademark of Semiconductor Components Industries, LLC.  
ON Semiconductor and  
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice  
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability  
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.  
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All  
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights  
nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications  
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should  
Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates,  
and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death  
associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal  
Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.  
PUBLICATION ORDERING INFORMATION  
LITERATURE FULFILLMENT:  
N. American Technical Support: 800−282−9855 Toll Free  
USA/Canada  
ON Semiconductor Website: http://onsemi.com  
Order Literature: http://www.onsemi.com/litorder  
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Phone: 480−829−7710 or 800−344−3860 Toll Free USA/Canada  
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Phone: 81−3−5773−3850  
For additional information, please contact your  
local Sales Representative.  
MBRB3030CTL/D  

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