FGAF40S65AQ [ONSEMI]

IGBT,650V,40A,场截止沟槽;
FGAF40S65AQ
型号: FGAF40S65AQ
厂家: ONSEMI    ONSEMI
描述:

IGBT,650V,40A,场截止沟槽

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Field Stop Trench IGBT  
650 V, 40 A  
FGAF40S65AQ  
Description  
Using novel field stop IGBT technology, ON Semiconductor’s new  
series of field stop 4th generation of RC IGBTs offer the optimum  
performance for PFC applications and welder where low conduction  
and switching losses are essential.  
www.onsemi.com  
Features  
V
I
C
CES  
Maximum Junction Temperature: T = 175°C  
J
650 V  
40 A  
Positive Temperature Coefficient for Easy Parallel Operating  
High Current Capability  
Low Saturation Voltage: V  
= 1.6 V (Typ.) @ I = 40 A  
C
C
E
CE(sat)  
100% of the Parts Tested for I (Note 1)  
LM  
High Input Impedance  
G
Fast Switching  
Tighten Parameter Distribution  
IGBT with Monolithic Reverse Conducting Diode  
This Device is PbFree and is RoHS Compliant  
Applications  
PFC, Welder  
TO3PF  
CASE 340AH  
ORDERING INFORMATION  
See detailed ordering and shipping information on page 2 of  
this data sheet.  
© Semiconductor Components Industries, LLC, 2018  
1
Publication Order Number:  
May, 2021 Rev. 3  
FGAF40S65AQ/D  
FGAF40S65AQ  
PACKAGE MARKING AND ORDERING INFORMATION  
Part Number  
Device Marking  
Package  
Reel Size  
Tape Width  
Quantity per Tube  
FGAF40S65AQ  
FGAF40S65AQ  
TO3PF  
30  
Table 1. ABSOLUTE MAXIMUM RATINGS  
Symbol  
Description  
FGAF40S65AQ  
Unit  
V
V
CES  
V
GES  
Collector to Emitter Voltage  
Gate to Emitter Voltage  
Transient Gate to Emitter Voltage  
Collector Current  
650  
20  
V
30  
V
I
C
@ T = 25°C  
80  
A
C
@ T = 100°C  
40  
C
I
(Note 1)  
(Note 2)  
Pulsed Collector Current  
Pulsed Collector Current  
Diode Forward Current  
@ T = 25°C  
160  
A
A
LM  
C
I
160  
CM  
I
F
@ T = 25°C  
40  
A
C
@ T = 100°C  
20  
160  
A
C
I
(Note 2)  
Pulsed Diode Maximum Forward Current  
Maximum Power Dissipation  
A
FM  
P
D
@ T = 25°C  
94  
W
W
°C  
°C  
°C  
C
@ T = 100°C  
47  
C
T
J
Operating Junction Temperature Range  
Storage Temperature Range  
55 to +175  
55 to +175  
300  
T
STG  
T
L
Maximum Lead Temp. for Soldering Purposes, 1/8from case for 5 sec  
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality  
should not be assumed, damage may occur and reliability may be affected.  
1. V = 400 V, V = 15 V, I = 160 A, R = 7 W, Inductive Load.  
CC  
GE  
C
G
2. Repetitive rating: Pulse width limited by max. junction temperature.  
Table 2. THERMAL CHARACTERISTICS  
Symbol  
(IGBT)  
Parameter  
FGAF40S65AQ  
Unit  
R
Thermal Resistance, Junction to Case, Max.  
Thermal Resistance, Junction to Ambient, Max.  
1.6  
40  
_C/W  
_C/W  
q
JC  
R
q
JA  
www.onsemi.com  
2
 
FGAF40S65AQ  
Table 3. ELECTRICAL CHARACTERISTICS OF THE IGBT (T = 25°C unless otherwise noted)  
C
Symbol  
Parameter  
Test Conditions  
Min  
Typ  
Max  
Unit  
OFF CHARACTERISTICS  
BV  
Collector to Emitter Breakdown Voltage  
/ DT Temperature Coefficient of Breakdown Voltage  
V
GE  
V
GE  
V
CE  
V
GE  
= 0 V, I = 1 mA  
650  
0.5  
V
V/°C  
mA  
CES  
C
DBV  
= 0 V, I = 1 mA  
CES  
J
C
I
Collector CutOff Current  
GE Leakage Current  
= V  
, V = 0 V  
250  
400  
CES  
GES  
CES  
GES  
GE  
I
= V  
, V = 0 V  
CE  
nA  
ON CHARACTERISTICS  
V
GE Threshold Voltage  
I
I
I
= 40 mA, V = V  
GE  
2.6  
5.3  
1.6  
1.9  
6.6  
2.1  
V
V
V
GE(th)  
C
C
C
CE  
V
Collector to Emitter Saturation Voltage  
= 40 A, V = 15 V  
GE  
CE(sat)  
= 40 A, V = 15 V,  
GE  
T
= 175°C  
C
DYNAMIC CHARACTERISTICS  
C
Input Capacitance  
V
= 30 V V = 0 V,  
2590  
35  
pF  
pF  
pF  
ies  
CE  
,
GE  
f = 1 MHz  
C
Output Capacitance  
oes  
C
Reverse Transfer Capacitance  
10  
res  
SWITCHING CHARACTERISTICS  
T
TurnOn Delay Time  
Rise Time  
V
= 400 V, I = 10 A,  
17.8  
6.3  
ns  
ns  
ns  
ns  
mJ  
mJ  
mJ  
ns  
ns  
ns  
ns  
mJ  
mJ  
mJ  
ns  
ns  
ns  
ns  
mJ  
mJ  
mJ  
d(on)  
CC  
G
C
R
= 6 W, V = 15 V,  
GE  
T
r
Inductive Load, T = 25°C  
C
T
TurnOff Delay Time  
Fall Time  
81.6  
9.3  
d(off)  
T
f
E
TurnOn Switching Loss  
TurnOff Switching Loss  
Total Switching Loss  
TurnOn Delay Time  
Rise Time  
132  
62  
on  
off  
E
E
194  
19.5  
9.6  
ts  
T
d(on)  
V
= 400 V, I = 20 A,  
= 6 W, V = 15 V,  
GE  
CC C  
R
G
T
r
Inductive Load, T = 25°C  
C
T
TurnOff Delay Time  
Fall Time  
76.8  
7.4  
d(off)  
T
f
E
TurnOn Switching Loss  
TurnOff Switching Loss  
Total Switching Loss  
TurnOn Delay Time  
Rise Time  
296  
111  
407  
17.5  
6.8  
on  
off  
E
E
ts  
T
d(on)  
V
= 400 V, I = 10 A,  
= 6 W, V = 15 V,  
GE  
CC C  
R
G
T
r
Inductive Load, T = 175°C  
C
T
TurnOff Delay Time  
Fall Time  
88  
d(off)  
T
f
9.7  
E
TurnOn Switching Loss  
TurnOff Switching Loss  
Total Switching Loss  
285  
106  
391  
on  
off  
E
E
ts  
www.onsemi.com  
3
 
FGAF40S65AQ  
Table 3. ELECTRICAL CHARACTERISTICS OF THE IGBT (T = 25°C unless otherwise noted)  
C
Symbol  
Parameter  
Test Conditions  
Min  
Typ  
Max  
Unit  
SWITCHING CHARACTERISTICS  
T
TurnOn Delay Time  
V
= 400 V, I = 20 A,  
19.1  
11.2  
81.6  
9.2  
ns  
ns  
ns  
ns  
mJ  
mJ  
mJ  
nC  
nC  
nC  
d(on)  
CC  
G
C
R
= 6 W, V = 15 V,  
GE  
T
r
Rise Time  
Inductive Load, T = 175°C  
C
T
TurnOff Delay Time  
Fall Time  
d(off)  
T
f
E
TurnOn Switching Loss  
TurnOff Switching Loss  
Total Switching Loss  
Total Gate Charge  
Gate to Emitter Charge  
Gate to Collector Charge  
552  
186  
738  
75  
on  
off  
E
E
ts  
Q
V
CE  
V
GE  
= 400 V, I = 40 A,  
g
C
= 15 V  
Q
Q
15  
ge  
gc  
18  
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product  
performance may not be indicated by the Electrical Characteristics if operated under different conditions.  
Table 4. ELECTRICAL CHARACTERISTICS OF THE DIODE (T = 25°C unless otherwise noted)  
C
Symbol  
Parameter  
Test Conditions  
I = 20 A  
= 25°C  
Min  
Typ  
1.2  
Max  
1.6  
Unit  
V
FM  
Diode Forward Voltage  
T
C
V
F
T
= 175°C  
= 175°C  
1.16  
325  
C
C
E
rec  
Reverse Recovery Energy  
I = 20 A,  
T
mJ  
F
dI /dt = 200 A/ms  
F
T
rr  
Diode Reverse Recovery Time  
T
C
= 25°C  
274  
ns  
T
C
= 175°C  
362  
Q
Diode Reverse Recovery Charge  
T
= 25°C  
1596  
2651  
nC  
rr  
C
T
C
= 175°C  
www.onsemi.com  
4
FGAF40S65AQ  
TYPICAL CHARACTERISTICS  
Figure 1. Typical Output Characteristics  
Figure 2. Typical Output Characteristics  
Figure 3. Typical Saturation Voltage Characteristics  
Figure 4. Saturation Voltage vs. Case  
Temperature at Variant Current Level  
Figure 5. Saturation Voltage vs. VGE  
Figure 6. Saturation Voltage vs. VGE  
www.onsemi.com  
5
FGAF40S65AQ  
TYPICAL CHARACTERISTICS (Continued)  
Figure 7. Capacitance Characteristics  
Figure 8. Gate Charge Characteristics  
Figure 9. Turnon Characteristics vs.  
Figure 10. Turnoff Characteristics  
Gate Resistance  
vs. Gate Resistance  
Figure 11. Switching Loss vs.  
Gate Resistance  
Figure 12. Turnon Characteristics vs.  
Collector Current  
www.onsemi.com  
6
FGAF40S65AQ  
TYPICAL CHARACTERISTICS (Continued)  
Figure 13. Turnoff Characteristics vs.  
Figure 14. Switching Loss vs.  
Collector Current  
Collector Current  
Figure 15. Load Current vs. Frequency  
Figure 16. SOA Characteristics  
Figure 17. Forward Characteristics  
Figure 18. Reverse Recovery Current  
www.onsemi.com  
7
FGAF40S65AQ  
TYPICAL CHARACTERISTICS (Continued)  
Figure 19. Reverse Recovery Time  
Figure 20. Stored Charge  
Figure 21. Transient Thermal Impedance of IGBT  
www.onsemi.com  
8
MECHANICAL CASE OUTLINE  
PACKAGE DIMENSIONS  
TO3PF3L  
CASE 340AH  
ISSUE A  
DATE 09 JAN 2015  
NOTES:  
1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 2009.  
2. CONTROLLING DIMENSION: MILLIMETERS.  
3. CONTOUR UNCONTROLLED IN THIS AREA (6 PLACES).  
4. DIMENSIONS D AND E DO NOT INCLUDE MOLD FLASH OR GATE  
PROTRUSIONS. MOLD FLASH AND GATE PROTRUSIONS NOT TO  
EXCEED 0.13 PER SIDE. THESE DIMENSIONS ARE TO BE MEA­  
SURED AT THE OUTERMOST EXTREME OF THE PLASTIC BODY.  
5. DIMENSION b2 DOES NOT INCLUDE DAMBAR PROTRUSION.  
LEAD WIDTH INCLUDING PROTRUSION SHALL NOT EXCEED 2.20.  
SEATING  
PLANE  
P
A
E
A1  
Q
H1  
MILLIMETERS  
DIM MIN  
MAX  
5.70  
3.20  
3.50  
2.20  
0.95  
2.15  
4.20  
1.10  
24.70  
25.30  
3.70  
15.70  
5.55  
10.20  
19.50  
5.20  
2.20  
3.80  
4.70  
A
A1  
A2  
A3  
b
5.30  
2.80  
3.10  
1.80  
0.65  
1.90  
3.80  
0.80  
24.30  
D
b2  
b3  
c
D2  
D
L2  
D3  
D2 24.70  
L1  
D3  
E
3.30  
15.30  
5.35  
9.80  
19.10  
4.80  
1.90  
3.40  
4.30  
e
H1  
L
L1  
L2  
P
NOTE 3  
L
Q
1
2
3
c
3X b  
3X b2  
A3  
A2  
b3  
e
Electronic versions are uncontrolled except when accessed directly from the Document Repository.  
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.  
DOCUMENT NUMBER:  
DESCRIPTION:  
98AON79755E  
TO3PF3L  
PAGE 1 OF 1  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding  
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically  
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rights of others.  
© Semiconductor Components Industries, LLC, 2019  
www.onsemi.com  
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, and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates  
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