FDPF12N50NZ [ONSEMI]
功率 MOSFET,N 沟道,UniFETTM II,500 V,11.5 A,520 mΩ,TO-220F;型号: | FDPF12N50NZ |
厂家: | ONSEMI |
描述: | 功率 MOSFET,N 沟道,UniFETTM II,500 V,11.5 A,520 mΩ,TO-220F 局域网 开关 脉冲 晶体管 |
文件: | 总12页 (文件大小:1025K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
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August 2016
FDP12N50NZ / FDPF12N50NZ
TM
N-Channel UniFET II MOSFET
500 V, 11.5 A, 520 m
Features
Description
•
•
•
•
•
•
RDS(on) = 460 m (Typ.) @ VGS = 10 V, ID = 5.75 A
Low Gate Charge (Typ. 23 nC )
Low Crss (Typ. 14 pF )
UniFETTM II MOSFET is Fairchild Semiconductor’s high voltage
MOSFET family based on advanced planar stripe and DMOS
technology. This advanced MOSFET family has the smallest
on-state resistance among the planar MOSFET, and also pro-
vides superior switching performance and higher avalanche
energy strength. In addition, internal gate-source ESD diode
allows UniFET II MOSFET to withstand over 2kV HBM surge
stress. This device family is suitable for switching power con-
verter applications such as power factor correction (PFC), flat
panel display (FPD) TV power, ATX and electronic lamp bal-
lasts.
100% Avalanche Tested
ESD Improved Capability
RoHS Compliant
Applications
•
•
•
LCD/LED/PDP TV
Lighting
Uninterruptible Power Supply
D
G
G
D
S
G
D
TO-220F
TO-220
S
S
MOSFET Maximum Ratings TC = 25oC unless otherwise noted.
Symbol
VDSS
VGSS
Parameter
FDP12N50NZ FDPF12N50NZ
Unit
V
Drain to Source Voltage
Gate to Source Voltage
500
±25
V
- Continuous (TC = 25oC)
- Continuous (TC = 100oC)
- Pulsed
11.5
6.9
46
11.5*
6.9*
46*
ID
Drain Current
Drain Current
A
IDM
EAS
IAR
(Note 1)
(Note 2)
(Note 1)
(Note 1)
A
mJ
Single Pulsed Avalanche Energy
Avalanche Current
560
11.5
17
A
EAR
Repetitive Avalanche Energy
MOSFET dv/dt Ruggedness
Peak Diode Recovery dv/dt
mJ
20
V/ns
V/ns
W
W/oC
oC
dv/dt
PD
(Note 3)
10
(TC = 25oC)
- Derate above 25oC
170
42
Power Dissipation
1.37
0.33
TJ, TSTG
TL
Operating and Storage Temperature Range
-55 to +150
300
Maximum Lead Temperature for Soldering,
1/8” from Case for 5 Seconds
oC
*Drain current limited by maximum junction temperature
Thermal Characteristics
Symbol
RJC
RJA
Parameter
Unit
FDP12N50NZ FDPF12N50NZ
Thermal Resistance, Junction to Case, Max.
Thermal Resistance, Junction to Ambient, Max.
0.73
62.5
3.0
oC/W
62.5
www.fairchildsemi.com
©2010 Fairchild Semiconductor Corporation
FDP12N50NZ / FDPF12N50NZ Rev. 1.5
1
Package Marking and Ordering Information
Device Marking
FDP12N50NZ
FDPF12N50NZ
Device
Package
TO-220
Reel Size
Tube
Tape Width
N/A
Quantity
50 units
50 units
FDP12N50NZ
FDPF12N50NZ
TO-220F
Tube
N/A
Electrical Characteristics TC = 25oC unless otherwise noted.
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
Off Characteristics
ID = 250A, VGS = 0V, TJ = 25oC
-
-
-
V
500
-
BVDSS
Drain to Source Breakdown Voltage
BVDSS
/ TJ
Breakdown Voltage Temperature
Coefficient
I
D = 250A, Referenced to 25oC
0.5
V/oC
V
DS = 500V, VGS = 0V
-
-
-
-
-
-
1
IDSS
IGSS
Zero Gate Voltage Drain Current
Gate to Body Leakage Current
A
A
VDS = 400V, TC = 125oC
10
VGS = ±25V, VDS = 0V
±10
On Characteristics
VGS(th)
RDS(on)
gFS
Gate Threshold Voltage
VGS = VDS, ID = 250A
VGS = 10V, ID = 5.75A
VDS = 20V, ID = 5.75A
3.0
-
5.0
0.52
-
V
S
Static Drain to Source On Resistance
Forward Transconductance
-
-
0.46
12
Dynamic Characteristics
Ciss
Coss
Crss
Qg
Input Capacitance
-
-
-
-
-
945
155
14
1235
205
20
30
-
pF
pF
pF
nC
nC
nC
VDS = 25V, VGS = 0V
f = 1MHz
Output Capacitance
Reverse Transfer Capacitance
Total Gate Charge at 10V
Gate to Source Gate Charge
Gate to Drain “Miller” Charge
23
V
V
DS = 400V, ID = 11.5A
GS = 10V
Qgs
Qgd
5.5
9.6
(Note 4)
-
-
Switching Characteristics
td(on)
tr
td(off)
tf
Turn-On Delay Time
Turn-On Rise Time
Turn-Off Delay Time
Turn-Off Fall Time
-
-
-
-
20
50
60
45
50
ns
ns
ns
ns
V
R
DD = 250V, ID = 11.5A
G = 25
110
130
100
(Note 4)
Drain-Source Diode Characteristics
IS
Maximum Continuous Drain to Source Diode Forward Current
Maximum Pulsed Drain to Source Diode Forward Current
-
-
-
-
-
-
-
11.5
46
1.4
-
A
A
ISM
VSD
trr
Drain to Source Diode Forward Voltage
Reverse Recovery Time
VGS = 0V, ISD = 11.5A
-
V
315
2.0
ns
C
V
GS = 0V, ISD = 11.5A
dIF/dt = 100A/s
Qrr
Reverse Recovery Charge
-
Notes:
1. Repetitive Rating: Pulse width limited by maximum junction temperature
2. L = 8.5mH, I = 11.5A, V = 50V, R = 25, Starting T = 25C
AS
DD
G
J
3. I 11.5A, di/dt 200A/s, V BV
, Starting T = 25C
SD
DD
DSS
J
4. Essentially Independent of Operating Temperature Typical Characteristics
www.fairchildsemi.com
©2010 Fairchild Semiconductor Corporation
FDP12N50NZ / FDPF12N50NZ Rev. 1.5
2
Typical Characteristics
Figure 1. On-Region Characteristics
Figure 2. Transfer Characteristics
30
50
VGS = 15.0 V
10.0 V
8.0 V
7.0 V
10
10
6.5V
6.0 V
5.5 V
150oC
25oC
1
1
-55oC
*Notes:
1. 250s Pulse Test
2. TC = 25oC
*Notes:
1. VDS = 20V
2. 250s Pulse Test
0.1
0.1
0.1
1
10
20
3
4
5
6
7
8
9
10
VDS, Drain-Source Voltage[V]
VGS, Gate-Source Voltage[V]
Figure 3. On-Resistance Variation vs.
Figure 4. Body Diode Forward Voltage
Variation vs. Source Current
and Temperature
Drain Current and Gate Voltage
1.0
0.9
0.8
0.7
0.6
0.5
0.4
100
150oC
10
25oC
VGS = 10V
*Notes:
1. VGS = 0V
VGS = 20V
*Note: TC = 25oC
2. 250s Pulse Test
1
0.4
0
6
12
18
24
30
0.6
0.8
1.0
1.2
1.4
ID, Drain Current [A]
VSD, Body Diode Forward Voltage [V]
Figure 5. Capacitance Characteristics
Figure 6. Gate Charge Characteristics
10
2500
C
C
C
= C + C (C = shorted)
gs gd ds
iss
= C + C
ds gd
= C
gd
oss
rss
VDS = 100V
8
2000
1500
1000
500
0
VDS = 250V
*Note:
1. VGS = 0V
VDS = 400V
2. f = 1MHz
6
4
2
0
Ciss
Coss
Crss
*Note: ID = 11.5A
15 20
0.1
1
10
30
0
5
10
Qg, Total Gate Charge [nC]
25
VDS, Drain-Source Voltage [V]
www.fairchildsemi.com
©2010 Fairchild Semiconductor Corporation
FDP12N50NZ / FDPF12N50NZ Rev. 1.5
3
Typical Characteristics (Continued)
Figure 7. Breakdown Voltage Variation
vs. Temperature
Figure 8. On-Resistance Variation
vs. Temperature
2.8
2.4
2.0
1.6
1.2
1.20
1.15
1.10
1.05
1.00
0.95
*Notes:
1. VGS = 0V
*Notes:
1. VGS = 10V
2. ID = 5.75A
0.8
0.90
0.85
2. ID = 250uA
0.4
-75 -50
0
50
100
150
-100
-50
0
50
100
150
o
o
TJ, Junction Temperature [C]
TJ, Junction Temperature [C]
Figure 9. Maximum Safe Operating Area
- FDPF12N50NZ
Figure 10.Maximum Safe Operating Area
- FDP12N50NZ
100
100
30s
100s
10s
100s
10
10
1ms
1ms
10ms
10ms
100 ms
DC
DC
1
1
Operation in This Area
Operation in This Area
is Limited by R DS(on)
is Limited by RDS(on)
*Notes:
1. TC = 25oC
0.1
* Notes :
0.1
1. TC = 25oC
2. TJ = 150oC
2. TJ = 150oC
3. Single Pulse
3. Single Pulse
0.01
0.01
1
10
100
1000
1
10
100
1000
VDS, Drain-Source Voltage [V]
VDS, Drain-Source Voltage [V]
Figure 11. Maximum Drain Current vs. Case Temperature
12
10
8
6
4
2
0
25
50
75
100
125
150
o
TC,Case Temperature [C]
www.fairchildsemi.com
©2010 Fairchild Semiconductor Corporation
FDP12N50NZ / FDPF12N50NZ Rev. 1.5
4
Typical Characteristics (Continued)
Figure 12. Transient Thermal Response Curve - FDP12N50NZ
5
1
0.5
0.2
0.1 0.1
PDM
0.05
0.02
0.01
t1
t2
* Notes :
1. ZJC(t) = 0.73oC/W Max.
Single pulse
0.01
2. Duty Factor, D=t1/t2
3. TJM - TC = PDM * ZJC(t)
0.001
10-5
10-4
10-3
10-2
10-1
1
10
t1, Square Wave Pulse Duration [sec]
Figure 13. Transient Thermal Response Curve - FDPF12N50NZ
5
D=0.5
1
0.2
PDM
0.1
t1
0.05
10-1
10-2
t2
0.02
0.01
*Notes:
1. ZJC(t) = 3.0oC/W Max.
2. Duty Factor, D = t1/t2
3. TJM - TC = PDM * ZJC(t)
single pulse
10-5
10-4
10-3
10-2
10-1
1
10
t
t1, Square Wave Pulse Duration [sec]
www.fairchildsemi.com
©2010 Fairchild Semiconductor Corporation
FDP12N50NZ / FDPF12N50NZ Rev. 1.5
5
Figure 14. Gate Charge Test Circuit & Waveform
I
= const.
G
Figure 15. Resistive Switching Test Circuit & Waveforms
RL
VDS
90%
VDS
VDD
VGS
RG
10%
VGS
DUT
V
GS
td(on)
tr
td(off)
tf
t on
t off
Figure 16. Unclamped Inductive Switching Test Circuit & Waveforms
VGS
www.fairchildsemi.com
©2010 Fairchild Semiconductor Corporation
FDP12N50NZ / FDPF12N50NZ Rev. 1.5
6
Figure 17. Peak Diode Recovery dv/dt Test Circuit & Waveforms
+
DUT
VDS
_
I SD
L
Driver
RG
Same Type
as DUT
VDD
VGS
• dv/dt controlled by RG
• ISD controlled by pulse period
Gate Pulse Width
--------------------------
VGS
D =
Gate Pulse Period
10V
( Driver )
IFM , Body Diode Forward Current
I SD
di/dt
( DUT )
IRM
Body Diode Reverse Current
Body Diode Recovery dv/dt
VSD
VDS
( DUT )
VDD
Body Diode
Forward Voltage Drop
www.fairchildsemi.com
©2010 Fairchild Semiconductor Corporation
FDP12N50NZ / FDPF12N50NZ Rev. 1.5
7
Mechanical Dimensions
TO-220 3L
www.fairchildsemi.com
©2010 Fairchild Semiconductor Corporation
FDP12N50NZ / FDPF12N50NZ Rev. 1.5
8
Mechanical Dimensions
TO-220F 3L
www.fairchildsemi.com
©2010 Fairchild Semiconductor Corporation
FDP12N50NZ / FDPF12N50NZ Rev. 1.5
9
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Datasheet contains the design specifications for product development. Specifications
may change in any manner without notice.
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Datasheet contains preliminary data; supplementary data will be published at a later
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Not In Production
Rev. I77
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©2010 Fairchild Semiconductor Corporation
FDP12N50NZ / FDPF12N50NZ Rev. 1.5
10
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regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or
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