FDB28N30TM [ONSEMI]

功率 MOSFET,N 沟道,UniFETTM,300V,28A,129mΩ,D2PAK;
FDB28N30TM
型号: FDB28N30TM
厂家: ONSEMI    ONSEMI
描述:

功率 MOSFET,N 沟道,UniFETTM,300V,28A,129mΩ,D2PAK

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MOSFET - UniFETt,  
N-Channel  
300 V, 28 A, 129 mW  
FDB28N30TM  
Description  
UniFET t MOSFET is ON Semiconductor’s high voltage  
MOSFET family based on planar stripe and DMOS technology. This  
MOSFET is tailored to reduce on−state resistance, and to provide  
better switching performance and higher avalanche energy strength.  
This device family is suitable for switching power converter  
applications such as power factor correction (PFC), flat panel display  
(FPD) TV power, ATX and electronic lamp ballasts.  
www.onsemi.com  
N−Channel  
D
Features  
G
Typical R  
= 108 mW at V = 10 V, I = 14 A  
GS D  
DS(on)  
Low Gate Charge (Typical Q = 39 nC)  
g
Low Reverse Transfer Capacitance C (Typical C = 35 pF)  
rss  
rss  
S
100% Avalanche Tested  
This Device is Pb−Free and is RoHS Compliant  
D
Applications  
Uninterruptible Power Supply  
AC−DC Power Supply  
G
S
2
D PAK−3 (TO−263, 3−LEAD)  
CASE 418AJ  
MARKING DIAGRAM  
$Y&Z&3&K  
FDB28N30  
$Y  
= ON Semiconductor Logo  
&Z  
&3  
&K  
= Assembly Plant Code  
= Numeric Date Code  
= Lot Code  
FDB28N30  
= Specific Device Code  
ORDERING INFORMATION  
See detailed ordering and shipping information on page 2 of  
this data sheet.  
© Semiconductor Components Industries, LLC, 2020  
1
Publication Order Number:  
April, 2020 − Rev. 1  
FDB28N30TM/D  
FDB28N30TM  
MOSFET MAXIMUM RATINGS (T = 25°C unless otherwise noted)  
C
Symbol  
Parameter  
Ratings  
Units  
V
Drain to Source Voltage  
Gate to Source Voltage  
300  
30  
V
V
A
DSS  
V
GSS  
ID  
Drain Current  
−Continuous (T = 25°C)  
28  
C
−Continuous (T = 100°C)  
19  
C
IDM  
A
Drain Current  
−Pulsed  
(Note 1)  
(Note 2)  
(Note 1)  
(Note 1)  
(Note 3)  
112  
E
Single Pulsed Avalanche Energy  
Avalanche Current  
588  
28  
mJ  
A
AS  
AR  
I
E
AR  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt  
25  
mJ  
V/ns  
W
dv/dt  
4.5  
P
D
Power Dissipation (T = 25°C)  
250  
2.0  
C
−Derate above 25°C  
Operating and Storage Temperature Range  
Maximum Lead Temperature for Soldering, 1/8” from Case for 5 seconds  
W/°C  
°C  
TJ, T  
−55 to +150  
300  
STG  
T
L
°C  
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality  
should not be assumed, damage may occur and reliability may be affected.  
1. Repetitive rating: pulse−width limited by maximum junction temperature  
2. L = 1.5 mH, I = 28 A, V = 50 V, R = 25 W, starting T = 25°C  
AS  
DD  
G
J
3. I 28 A, di/dt 200 A/ms, V BV  
, starting T = 25°C  
SD  
DD  
DSS  
J
THERMAL CHARACTERISTICS  
Symbol  
Parameter  
Ratings  
0.5  
Units  
°C/W  
°C/W  
RθJC  
RθJA  
Maximum Thermal Resistance, Junction to Case  
Maximum Thermal Resistance, Junction to Ambient  
(1 in2 Pad of 2−oz Copper)  
40  
RθJA  
Maximum Thermal Resistance, Junction to Ambient  
(Minimum Pad of 2−oz Copper)  
62.5  
°C/W  
PACKAGE MARKING AND ORDERING INFORMATION  
Part Number  
Top Mark  
Package  
Shipping  
2
FDB28N30TM  
FDB28N30  
D PAK−3 (TO−263, 3−LEAD)  
(Pb−Free)  
800 units / Tape & Reel  
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging  
Specifications Brochure, BRD8011/D  
www.onsemi.com  
2
 
FDB28N30TM  
ELECTRICAL CHARACTERISTICS (T = 25°C unless otherwise noted)  
C
Symbol  
OFF CHARACTERISTICS  
BV Drain to Source Breakdown  
Parameter  
Test Conditions  
Min.  
Typ.  
Max.  
Units  
I
I
= 250 mA, V = 0 V, T = 25°C  
300  
V
DSS  
D
GS  
J
Voltage  
DBV  
Breakdown Voltage  
= 250 mA, referenced to 25°C  
0.4  
V/°C  
mA  
DSS  
D
Temperature Coefficient  
DT  
J
I
Drain−to−Source Leakage  
Current  
V
V
V
= 300 V, V = 0 V  
1
DSS  
DS  
DS  
GS  
GS  
= 240 V, T = 125°C  
10  
100  
C
I
Gate to Body Leakage Current  
=
30 V, V = 0 V  
nA  
GSS  
DS  
ON CHARACTERISTICS  
V
Gate Threshold Voltage  
V
V
= V , I = 250 mA  
3.0  
5.0  
V
GS(th)  
DS(on)  
GS  
DS  
D
R
Static Drain to Source  
On Resistance  
= 10 V, I = 14 A  
0.108  
24.8  
0.129  
W
GS  
D
g
FS  
Forward Transconductance  
V
= 40 V, I = 14 A  
s
DS  
DS  
D
DYNAMIC CHARACTERISTICS  
C
Input Capacitance  
V
= 25 V, V = 0 V, f = 1 MHz  
1690  
305  
35  
2250  
405  
50  
pF  
pF  
pF  
nC  
nC  
nC  
iss  
GS  
C
Output Capacitance  
oss  
C
Reverse Transfer Capacitance  
Total Gate Charge at 10 V  
Gate to Source Gate Charge  
Gate to Drain “Miller” Charge  
rss  
Q
V
DS  
= 240 V, I = 28 A, V = 10 V  
39  
50  
g
D
GS  
(Note 4)  
Q
gs  
Q
gd  
12  
17  
SWITCHING CHARACTERISTICS  
t
Turn−On Delay Time  
Turn−On Rise Time  
Turn−Off Delay Time  
Turn−Off Fall Time  
V
= 150 V, I = 28 A, V = 10V, R = 25 W  
35  
135  
79  
80  
ns  
ns  
ns  
ns  
d(on)  
DD  
D
GS  
G
(Note 4)  
t
r
280  
168  
148  
t
d(off)  
t
f
69  
DRAIN−SOURCE DIODE CHARACTERISTICS  
I
Maximum Continuous Drain to  
Source Diode Forward Current  
28  
112  
1.4  
A
A
V
S
I
Maximum Pulsed Drain to  
Source Diode Forward Current  
SM  
V
SD  
Drain to Source Diode Forward  
Voltage  
V
V
= 0 V, I = 28 A  
SD  
GS  
t
Reverse Recovery Time  
= 0 V, I = 28 A, dI /dt = 100 A/ms  
279  
2.7  
ns  
rr  
GS  
SD  
F
Q
Reverse Recovery Charge  
mC  
rr  
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product  
performance may not be indicated by the Electrical Characteristics if operated under different conditions.  
4. Essentially independent of operating temperature typical characteristics.  
www.onsemi.com  
3
 
FDB28N30TM  
TYPICAL PERFORMANCE CHARACTERISTICS  
100  
100  
V
= 10.0 V  
8.0 V  
GS  
7.0 V  
6.5 V  
6.0 V  
10  
150oC  
5.5 V  
−55oC  
25oC  
10  
1
Notes:  
Notes:  
1
1. 250 ms Pulse Test  
1. V = 20 V  
DS  
2. T = 255C  
2. 250 ms Pulse Test  
C
0.5  
0.4  
0.1  
1
10  
2
4
6
8
10  
VDS,Drain−Source Voltage[V]  
VGS,Gate−Source Voltage[V]  
Figure 1. On−Region Characteristics  
Figure 2. Transfer Characteristics  
0.30  
0.25  
0.20  
0.15  
0.10  
200  
100  
150oC  
25oC  
10  
V
GS = 10V  
VGS = 20V  
Notes:  
1. V = 0 V  
GS  
* Note : TJ = 25oC  
50 75  
2. 250 ms Pulse Test  
1.5 2.0  
VSD, Body Diode Forward Voltage [V]  
1
0.0  
0.5  
1.0  
0
25  
ID, Drain Current [A]  
Figure 3. On−Resistance Variation vs.  
Drain Current and Gate Voltage  
Figure 4. Body Diode Forward Voltage  
Variation vs. Source Current and Temperature  
4500  
3000  
1500  
0
10  
C
C
C
= C + C (C = shorted)  
gs gd ds  
iss  
V
DS = 60 V  
= C + C  
ds gd  
= C  
gd  
oss  
rss  
V
DS = 150 V  
8
6
4
2
0
VDS = 240 V  
Coss  
Notes:  
1. V = 0 V  
GS  
2. f = 1 MHz  
Ciss  
Crss  
Note: ID = 28 A  
32 40  
10−1  
100  
101  
VDS, Drain−Source Voltage [V]  
0
8
16  
24  
30  
Qg, Total Gate Charge [nC]  
Figure 5. Capacitance Characteristics  
Figure 6. Gate Charge Characteristics  
www.onsemi.com  
4
FDB28N30TM  
TYPICAL PERFORMANCE CHARACTERISTICS (continued)  
1.2  
1.1  
1.0  
0.9  
0.8  
3.0  
2.5  
2.0  
1.5  
1.0  
Notes:  
Notes:  
0.5  
1. V = 0 V  
GS  
1. V = 10 V  
GS  
2. I = 250 mA  
D
2. I = 14 A  
D
0.0  
−100  
−100  
−50  
0
50  
100  
150  
200  
−50  
0
50  
100  
150  
200  
o
o
TJ, Junction Temperature[ C]  
TJ, Junction Temperature[ C]  
Figure 7. Breakdown Voltage Variation  
vs. Temperature  
Figure 8. On−Resistance Variation vs.  
Temperature  
30  
25  
20  
15  
10  
5
200  
100  
10ms  
100ms  
1ms  
10  
1
10ms  
DC  
Operation in This Area  
is Limited by R DS(on)  
Notes:  
0.1  
0.01  
1. T = 255C  
C
2. T = 1505C  
J
3. Single Pulse  
0
25  
1
10  
100  
500  
50  
75  
100  
125  
150  
o
TC, Case Temperature[ C]  
VDS, Drain−Source Voltage [V]  
Figure 9. Maximum Safe Operating Area  
Figure 10. Maximum Drain Current vs.  
Case Temperature  
1
0.5  
0.2  
0.1  
0.1  
PDM  
0.05  
t1  
0.02  
t2  
0.01  
0.01  
Notes:  
Single pulse  
1. Z (t) = 0.55C/W Max.  
q
JC  
2. Duty Factor, D = t /t  
1
2
3. T − T = P  
* Z (t)  
q
JC  
JM  
C
DM  
1E−3  
10−5  
10−4  
10−3  
10−2  
10−1  
100  
t1, Rectangular Pulse Duration [sec]  
Figure 11. Transient Thermal Response Curve  
www.onsemi.com  
5
FDB28N30TM  
IG = const.  
Figure 12. Gate Charge Test Circuit & Waveform  
RL  
VDS  
90%  
VDS  
VDD  
VGS  
RG  
10%  
VGS  
DUT  
V
GS  
td(on)  
tr  
td(off)  
tf  
t on  
toff  
Figure 13. Resistive Switching Test Circuit & Waveform  
VGS  
Figure 14. Unclamped inductive Switching Test Circuit & Waveform  
www.onsemi.com  
6
FDB28N30TM  
+
DUT  
VDS  
_
I SD  
L
G
Same Type  
as DUT  
VDD  
VGS  
Sdv/dtcontrolled by R  
G
SI controlled by pulse period  
SD  
Gate Pulse Width  
VGS  
D =  
10V  
Gate Pulse Period  
( Driver )  
IFM , Body Diode Forward Current  
I SD  
di/dt  
( DUT )  
IRM  
Body Diode Reverse Current  
Body Diode Recoverydv/dt  
VSD  
VDS  
( DUT )  
VDD  
Body Diode  
Forward Voltage Drop  
Figure 15. Peak Diode Recovery dv/dt Test Circuit & Waveform  
UniFET is a trademark of Semiconductor Components Industries, LLC (SCILLC) or its subsidiaries in the United States and/or other countries.  
www.onsemi.com  
7
MECHANICAL CASE OUTLINE  
PACKAGE DIMENSIONS  
D2PAK3 (TO263, 3LEAD)  
CASE 418AJ  
ISSUE F  
DATE 11 MAR 2021  
SCALE 1:1  
XXXXXX = Specific Device Code  
A
= Assembly Location  
WL  
Y
= Wafer Lot  
= Year  
GENERIC MARKING DIAGRAMS*  
WW  
W
M
G
AKA  
= Work Week  
= Week Code (SSG)  
= Month Code (SSG)  
= PbFree Package  
= Polarity Indicator  
XX  
AYWW  
XXXXXXXXG  
AKA  
XXXXXXXXG  
AYWW  
XXXXXX  
XXYMW  
XXXXXXXXX  
AWLYWWG  
*This information is generic. Please refer to  
device data sheet for actual part marking.  
PbFree indicator, “G” or microdot “ G”,  
may or may not be present. Some products  
may not follow the Generic Marking.  
IC  
Standard  
Rectifier  
SSG  
Electronic versions are uncontrolled except when accessed directly from the Document Repository.  
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.  
DOCUMENT NUMBER:  
98AON56370E  
D2PAK3 (TO263, 3LEAD)  
PAGE 1 OF 1  
DESCRIPTION:  
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© Semiconductor Components Industries, LLC, 2018  
www.onsemi.com  
onsemi,  
, and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates  
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