FCDN614 [ONSEMI]

1-Channel ESD Protector;
FCDN614
型号: FCDN614
厂家: ONSEMI    ONSEMI
描述:

1-Channel ESD Protector

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中文:  中文翻译
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FCDN614-UBM  
1-Channel ESD Protector  
Functional Description  
The FCDN614-UBM provides robust ESD protection for sensitive  
parts that may be subjected to electrostatic discharge (ESD). The tiny  
form factor and single wirebond requirement enables it to be used in  
very confined spaces. The electrical ‘back-to-back Zener’  
configuration also provides ESD protection in cases where nodes with  
AC signals are present. This device is designed and characterized to  
safely dissipate ESD strikes of at least 8 kV, according to the  
MIL-STD-883 (Method 3015) specification for Human Body Model  
(HBM) ESD.  
http://onsemi.com  
ELECTRICAL SCHEMATIC  
Al (Aluminum on Underside)  
Features  
Compact Die Protects from ESD Discharges  
Almost No Conduction at Signal Amplitudes Less than 4 V  
ESD Protection to over 8 kV Contact Discharge per MIL_STD_883  
Bare Silicon on Underside  
International ESD Standard  
Applications  
ORDERING INFORMATION  
LED Lighting  
Modules  
Interface Circuits  
For information on tape and reel specifications,  
including part orientation and tape sizes, please  
refer to our Tape and Reel Packaging Specification  
Brochure, BRD8011/D.  
NOTE: The diagram shows a typical application with an AuSn or Au back metal on the ESD die. The diagram also shows the  
polarity convention for the ESD die.  
Figure 1. Applications Drawing  
© Semiconductor Components Industries, LLC, 2012  
1
Publication Order Number:  
June, 2012 Rev. 4  
FCDN614UBM/D  
FCDN614UBM  
I
Table 1. CURRENT/VOLTAGE GRAPH  
Symbol  
Description  
I
CL+  
I
Positive Clamping Current  
Positive Clamping Voltage  
CL+  
V
CL+  
I
Leakage Current at V  
L2+  
L2+  
V
I
Voltage Condition: +10 V  
I
L2+  
L2+  
V
CL  
V
L1−  
I
L1+  
Leakage Current at V  
V
L1+  
L1+  
I
I
V
L1+  
V V  
L2+ CL+  
L1−  
V
L1+  
Voltage Condition: +4 V  
I
Negative Clamping Current  
Negative Clamping Voltage  
CL  
V
CL−  
L1−  
I
Leakage Current at V  
L1−  
CL−  
V
L1−  
Voltage Condition: 4 V  
Figure 2. Current/Voltage Graph  
Table 2. ORDERING INFORMATION  
Ordering Part Number  
Topside Metal  
Al (Aluminum)  
Backside Metal  
Thickness  
Shipping Method  
FCDN614UBM  
Bare Silicon  
4 mils  
Wafer Form  
SPECIFICATIONS  
Table 3. ABSOLUTE MAXIMUM RATINGS  
Parameter  
Rating  
Units  
Operating Temperature Range  
Storage Temperature Range  
40 to +150  
65 to +150  
°C  
°C  
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the  
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect  
device reliability.  
Table 4. STANDARD OPERATING CONDITIONS  
Parameter  
Rating  
Units  
Operating Temperature Range  
40 to +150  
°C  
http://onsemi.com  
2
FCDN614UBM  
SPECIFICATIONS (Cont’d)  
Table 5. ELECTRICAL CHARACTERISTICS (Note 1)  
Symbol Parameter  
Test Conditions  
Min  
Typ  
Max  
Units  
I
Leakage Current  
V = 4 V, 150°C (Note 2)  
4.0  
mA  
mA  
mA  
LEAK  
V = 4 V, 25°C (V  
)
0.3 (I  
)
)
L1  
L1  
V = +10 V, 25°C (V  
)
0.5 (I  
L2+  
L2+  
V
Signal Clamp Voltage  
T = 25°C  
V
kV  
V
CL  
A
Positive Polarity on Signal Node (V  
)
at 10 mA (I  
)
+10.5  
+12.0  
+15.0  
5.0  
CL+  
CL+  
Negative Polarity on Signal Node (V  
)
at 10 mA (I  
)
9.0  
7.0  
CL−  
CL−  
V
ESD  
ESD Protection Withstand Voltage:  
Human Body Model  
(MILSTD883, Method 3015)  
T = 25°C  
A
(Note 2)  
8
V
Clamping Voltage during Transient Events on  
Signal Node  
I
= 1 A, t = 8/20 ms  
CL_ESD  
PP P  
Positive Transients  
Negative Transients  
(Note 2)  
+22  
15  
C
Input Capacitance  
At 1 MHz, 30 mV osc.  
Level, 0 VDC Bias  
At 1 MHz, 30 mV osc.  
Level, 3 VDC Bias  
(Note 2)  
4.7  
3.0  
pF  
IN  
1. Operating characteristics are over standard operating conditions unless otherwise specified.  
2. This parameter is guaranteed by design and/or characterization.  
MECHANICAL DETAILS  
Table 6. MECHANICAL SPECIFICATIONS  
Stepping Size:  
240 mm x 240 mm  
Parameter  
Composition  
Condition  
Units  
Silicon Wafer,  
p+ Doped  
Die Shape  
Square  
240  
240  
4
Length (Stepping Size)  
Width (Stepping Size)  
Thickness  
mm  
mm  
mils  
mm  
Saw Street Widths (Space  
between Devices on Wafer)  
(Note 1)  
70 (XDirection)  
70 (YDirection)  
Top Pad Length  
125  
mm  
mm  
Top Pad Width  
125  
Top Pad Opening:  
125 mm x 125 mm  
Top Pad Composition  
Back Metal (Underside)  
Die (Stepping Size)  
Passivation Opening  
Active Size  
Al (Aluminum)  
Bare Silicon  
240  
70  
mm  
mm  
mm  
mm  
Figure 3. Package Dimensions  
160  
5
Active to PA Opening  
1. The saw street is defined as the passivationfree area between  
devices.  
http://onsemi.com  
3
 
FCDN614UBM  
MECHANICAL DETAILS (Cont’d)  
PassivationFree  
Saw Street: 70 mm  
Stepping Size:  
240 mm x 240 mm  
Figure 4. Wafer Array  
ON Semiconductor and  
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC owns the rights to a number of patents, trademarks,  
copyrights, trade secrets, and other intellectual property. A listing of SCILLC’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/PatentMarking.pdf. SCILLC  
reserves the right to make changes without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any  
particular purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without  
limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications  
and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC  
does not convey any license under its patent rights nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for  
surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where  
personal injury or death may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and  
its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly,  
any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture  
of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.  
PUBLICATION ORDERING INFORMATION  
LITERATURE FULFILLMENT:  
N. American Technical Support: 8002829855 Toll Free  
USA/Canada  
Europe, Middle East and Africa Technical Support:  
Phone: 421 33 790 2910  
Japan Customer Focus Center  
Phone: 81358171050  
ON Semiconductor Website: www.onsemi.com  
Order Literature: http://www.onsemi.com/orderlit  
Literature Distribution Center for ON Semiconductor  
P.O. Box 5163, Denver, Colorado 80217 USA  
Phone: 3036752175 or 8003443860 Toll Free USA/Canada  
Fax: 3036752176 or 8003443867 Toll Free USA/Canada  
Email: orderlit@onsemi.com  
For additional information, please contact your local  
Sales Representative  
FCDN614UBM/D  

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