FCA20N60-F109 [ONSEMI]

分立 MOSFET;
FCA20N60-F109
型号: FCA20N60-F109
厂家: ONSEMI    ONSEMI
描述:

分立 MOSFET

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Is Now  
To learn more about onsemi™, please visit our website at  
www.onsemi.com  
onsemi andꢀꢀꢀꢀꢀꢀꢀand other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates and/or  
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FCA20N60  
N-Channel SuperFET MOSFET  
®
600 V, 20 A, 190 mΩ  
Description  
SuperFET® MOSFET is ON Semiconductor’s first genera-tion  
of high voltage super-junction (SJ) MOSFET family that is  
utilizing charge balance technology for outstanding low on-  
resistance and lower gate charge performance. This technology  
is tailored to minimize conduction loss, provide superior switch-  
ing performance, dv/dt rate and higher avalanche energy. Con-  
sequently, SuperFET MOSFET is very suitable for the switching  
power applications such as PFC, server/telecom power, FPD  
TV power, ATX power and industrial power applications.  
Features  
650V @ TJ = 150°C  
Typ. RDS(on) = 150 mΩ  
Ultra Low Gate Charge (Typ. Qg = 75 nC )  
Low Effective Output Capacitance (Typ. Coss(eff.) = 165 pF )  
100% Avalanche Tested  
Applications  
Solar Inverter  
AC-DC Power Supply  
D
G
G
D
TO-3PN  
S
S
MOSFET Maximum Ratings TC = 25oC unless otherwise noted.  
FCA20N60 /  
FCA20N60-F109  
Symbol  
VDSS  
VGSS  
Parameter  
Unit  
Drain to Source Voltage  
Gate-Soure voltage  
600  
±30  
V
V
- Continuous (TC = 25oC)  
- Continuous (TC = 100oC)  
- Pu ls ed  
20  
ID  
D r a in C u r r e n t  
A
12.5  
60  
IDM  
Dr ain Cur rent  
(Note 1)  
(Note 2)  
(Note 1)  
(Note 1)  
(Note 3)  
A
mJ  
A
EAS  
IAR  
Single Pulsed Avalanche Energy  
Avalanche Current  
690  
20  
EAR  
dv/dt  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt  
20.8  
4.5  
mJ  
V/ns  
W
W/oC  
oC  
(TC = 25oC)  
- Derate Above 25oC  
208  
PD  
Power Dissipation  
1.67  
-55 to +150  
300  
TJ, TSTG  
TL  
Operating and Storage Temperature Range  
Maximum Lead Temperature for Soldering, 1/8” from Case for 5 Seconds  
oC  
Thermal Characteristics  
FCA20N60 /  
FCA20N60_F109  
Symbol  
Parameter  
Unit  
RθJC  
RθJA  
Thermal Resistance, Junction to Case, Max.  
Thermal Resistance, Junction to Ambient, Max.  
0.6  
oC/W  
41.7  
Publication Order Number:  
©2008 Semiconductor Components Industries, LLC.  
October-2017,Rev. 3  
FCA20N60/D  
Package Marking and Ordering Information  
Part Number  
FCA20N60  
Top Mark  
FCA20N60  
FCA20N60  
Package  
TO-3PN  
TO-3PN  
Packing Method  
Tube  
Reel Size  
N/A  
Tape Width  
N/A  
Quantity  
30 units  
30 units  
FCA20N60-F109  
Tube  
N/A  
N/A  
Electrical Characteristics TC = 25oC unless otherwise noted.  
Symbol  
Parameter  
Test Conditions  
Min.  
Typ.  
Max.  
Unit  
Off Characteristics  
I
D = 250 μA, VGS = 0 V, TJ = 25oC  
ID = 250 μA, VGS = 0 V, TJ = 150oC  
600  
-
-
-
-
V
V
BVDSS  
Drain to Source Breakdown Voltage  
650  
ΔBVDSS  
/ ΔTJ  
Breakdown Voltage Temperature  
Coefficient  
I
D = 250 μA, Referenced to 25oC  
-
-
0.6  
-
-
V/oC  
Drain-Source Avalanche Breakdown  
Voltage  
BVDS  
VGS = 0 V, ID = 20 A  
DS = 600 V, VGS = 0 V  
700  
V
V
-
-
-
-
-
-
1
IDSS  
IGSS  
Zero Gate Voltage Drain Current  
Gate to Body Leakage Current  
μA  
VDS = 480 V, TC = 125oC  
10  
VGS = ±30 V, VDS = 0 V  
±100  
nA  
On Characteristics  
VGS(th)  
RDS(on)  
gFS  
Gate Threshold Voltage  
VGS = VDS, ID = 250 μA  
VGS = 10 V, ID = 10 A  
VDS = 40 V, ID = 10 A  
3.0  
-
5.0  
0.19  
-
V
Ω
S
Static Drain to Source On Resistance  
Forward Transconductance  
-
-
0.15  
17  
Dynamic Characteristics  
Ciss  
Input Capacitance  
-
-
-
-
-
-
-
-
2370  
1280  
95  
3080  
pF  
pF  
pF  
pF  
pF  
nC  
nC  
nC  
V
DS = 25 V, VGS = 0 V,  
Coss  
Crss  
Coss  
Coss(eff.)  
Qg  
Output Capacitance  
1665  
f = 1 MHz  
Reverse Transfer Capacitance  
Output Capacitance  
-
85  
-
VDS = 480 V, VGS = 0 V, f = 1 MHz  
VDS = 0 V to 400 V, VGS = 0 V  
65  
Effective Output Capacitance  
Total Gate Charge at 10V  
Gate to Source Gate Charge  
Gate to Drain “Miller” Charge  
165  
75  
98  
18  
-
VDS = 480 V, ID = 20 A,  
V
Qgs  
13.5  
36  
GS = 10 V  
(Note 4)  
Qgd  
Switching Characteristics  
td(on)  
tr  
td(off)  
tf  
Turn-On Delay Time  
Turn-On Rise Time  
Turn-Off Delay Time  
Turn-Off Fall Time  
-
-
-
-
62  
140  
230  
65  
135  
290  
470  
140  
ns  
ns  
ns  
ns  
VDD = 300 V, ID = 20 A,  
VGS = 10 V, RG = 25 Ω  
(Note 4)  
Drain-Source Diode Characteristics  
IS  
Maximum Continuous Drain to Source Diode Forward Current  
Maximum Pulsed Drain to Source Diode Forward Current  
-
-
-
-
-
-
-
20  
60  
1.4  
-
A
A
ISM  
VSD  
trr  
Drain to Source Diode Forward Voltage  
Reverse Recovery Time  
VGS = 0 V, ISD = 20 A  
-
V
530  
10.5  
ns  
μC  
VGS = 0 V, ISD = 20 A,  
dIF/dt = 100 A/μs  
Qrr  
Reverse Recovery Charge  
-
Notes:  
1: Repetitive rating: pulse-width limited by maximum junction temperature.  
2:  
3:  
I
I
= 10 A, V = 50 V, R = 25 Ω, starting T = 25°C.  
DD G J  
AS  
SD  
20 A, di/dt 200 A/μs, V BV  
, starting T = 25°C.  
J
DD  
DSS  
4: Essentially independent of operating temperature typical characteristics.  
www.onsemi.com  
2
Typical Performance Characteristics  
Figure 1. On-Region Characteristics  
Figure 2. Transfer Characteristics  
102  
VGS  
102  
Top :  
15.0 V  
10.0 V  
8.0 V  
7.0 V  
6.5 V  
6.0 V  
101  
150oC  
Bottom : 5.5 V  
101  
25oC  
-55oC  
100  
100  
* Note  
* Notes :  
1. VDS = 40V  
1. 250μs Pulse Test  
o
2. 250μs Pulse Test  
2. T = 25 C  
C
2
4
6
8
10  
10-1  
100  
101  
VGS , Gate-Source Voltage [V]  
VDS, Drain-Source Voltage [V]  
Figure 3. On-Resistance Variation vs.  
Drain Current and Gate Voltage  
Figure 4. Body Diode Forward Voltage  
Variation vs. Source Current  
and Temperatue  
102  
101  
100  
0.4  
0.3  
VGS = 10V  
0.2  
VGS = 20V  
150oC  
25oC  
0.1  
* Notes :  
1. VGS = 0V  
2. 250μs Pulse Test  
o
* Note : T = 25 C  
J
0.0  
0
5
10 15 20 25 30 35 40 45 50 55 60 65 70  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
1.4  
1.6  
VSD , Source-Drain Voltage [V]  
ID, Drain Current [A]  
Figure 5. Capacitance Characteristics  
Figure 6. Gate Charge Characteristics  
10000  
12  
10  
8
Ciss = Cgs + Cgd (Cds = shorted)  
VDS = 100V  
VDS = 250V  
9000  
8000  
7000  
6000  
5000  
4000  
3000  
2000  
1000  
0
Coss = Cds + Cgd  
Crss = Cgd  
VDS = 400V  
Coss  
6
* Notes :  
1. VGS = 0 V  
C
iss  
2. f = 1 MHz  
4
Crss  
2
* Note : I = 20A  
D
0
10-1  
100  
101  
0
10  
20  
30  
40  
50  
60  
70  
80  
QG, Total Gate Charge [nC]  
VDS, Drain-Source Voltage [V]  
www.onsemi.com  
3
Typical Performance Characteristics (Continued)  
Figure 7. Breakdown Voltage Variation  
vs. Temperature  
Figure 8. On-Resistance Variation  
vs. Temperature  
3.0  
2.5  
2.0  
1.5  
1.0  
1.2  
1.1  
1.0  
* Notes :  
0.9  
0.8  
1. VGS = 0 V  
* Notes :  
2. I = 250 μA  
D
1. V = 10 V  
0.5  
GS  
2. I = 20 A  
D
0.0  
-100  
-100  
-50  
0
50  
100  
150  
200  
-50  
0
50  
100  
150  
200  
TJ, Junction Temperature [oC]  
TJ, Junction Temperature [oC]  
Figure 9. Maximum Safe Operating Area  
Figure 10. Maximum Drain Current  
vs. Case Temperature  
25  
Operation in This Area  
102  
is Limited by R DS(on)  
20  
15  
10  
5
100 us  
101  
1 ms  
10 ms  
DC  
100  
* Notes :  
1. T = 25 o  
C
10-1  
10-2  
C
2. T = 150 o  
C
J
3. Single Pulse  
0
100  
101  
102  
103  
25  
50  
75  
100  
125  
150  
TC, Case Temperature [oC]  
VDS, Drain-Source Voltage [V]  
Figure 11. Transient Thermal Response Curve  
100  
D=0.5  
* N otes  
:
0.2  
o
10-1  
1. Zθ JC(t) = 0.6 C /W M ax.  
2. D uty Factor, D =t1/t2  
0.1  
3. TJM - TC  
= PD M * Zθ JC(t)  
0.05  
PDM  
0.02  
0.01  
t1  
t2  
10-2  
single pulse  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
101  
t1, Rectangular Pulse Duration [sec]  
www.onsemi.com  
4
IG = const.  
Figure 12. Gate Charge Test Circuit & Waveform  
RL  
VDS  
90%  
VDS  
VDD  
VGS  
RG  
10%  
VGS  
DUT  
V
GS  
td(on)  
tr  
td(off)  
tf  
t on  
t off  
Figure 13. Resistive Switching Test Circuit & Waveforms  
BVDSS  
--------------------  
BVDSS - VDD  
L
1
2
2
----  
EAS  
=
L IAS  
VDS  
I D  
BVDSS  
IAS  
RG  
VDD  
ID (t)  
V
VDS (t)  
VDD  
DUT  
GS  
t p  
t p  
Time  
Figure 14. Unclamped Inductive Switching Test Circuit & Waveforms  
www.onsemi.com  
5
+
DUT  
VDS  
_
I SD  
L
Driver  
RG  
Same Type  
as DUT  
VDD  
VGS  
• dv/dt controlled by RG  
• ISD controlled by pulse period  
Gate Pulse Width  
--------------------------  
VGS  
D =  
Gate Pulse Period  
10V  
( Driver )  
IFM , Body Diode Forward Current  
I SD  
di/dt  
( DUT )  
IRM  
Body Diode Reverse Current  
Body Diode Recovery dv/dt  
VSD  
VDS  
( DUT )  
VDD  
Body Diode  
Forward Voltage Drop  
Figure 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms  
www.onsemi.com  
6
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are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent  
coverage may be accessed at www.onsemi.com/site/pdf/PatentMarking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.  
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability  
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.  
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,  
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or  
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer  
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not  
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification  
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized  
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and  
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such  
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This  
literature is subject to all applicable copyright laws and is not for resale in any manner.  
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