ARRAYRDM-0116A10-DFN-TR [ONSEMI]

Silicon Photomultipliers (SiPM), RDM-Series 1 x 16 Monolithic Array;
ARRAYRDM-0116A10-DFN-TR
型号: ARRAYRDM-0116A10-DFN-TR
厂家: ONSEMI    ONSEMI
描述:

Silicon Photomultipliers (SiPM), RDM-Series 1 x 16 Monolithic Array

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Silicon Photomultipliers  
(SiPM), RDM-Series 1 x 16  
Monolithic Array  
Product Preview  
ArrayRDM-0116A10-DFN  
www.onsemi.com  
The ArrayRDM0116A10DFN is a monolithic 1 × 16 array of  
Silicon Photomultiplier (SiPM) pixels based on the marketleading  
RDM process. The RDM process has been specifically developed to  
create products that give high PDE at the NIR wavelengths used for  
LiDAR and 3D ranging applications. The ArrayRDM0116A10DFN  
also features an antireflection coating on the entrance window.  
In order to meet the requirements for automotive LiDAR  
applications, this product is qualified to the AECQ102 standard and  
developed in accordance with IATF 16949.  
An evaluation board (ArrayRDM0116A10GEVB) is also  
available for this product.  
KEY SENSOR AND PACKAGE SPECIFICATIONS  
Parameter  
Silicon Process  
Number of Pixels  
Array Configuration  
Pixel Size  
Value  
Comment  
The ARRAYRDM0116A10DFN Product  
RDM  
16  
ORDERING INFORMATION  
See detailed ordering and shipping information in the ordering  
information section on page 6 of this data sheet.  
1 × 16  
0.17 × 0.49 mm  
0.55 mm  
10 mm  
Pixel Pitch  
Microcell Size  
Number of  
Microcells per Pixel  
368  
Package Size  
Output Type  
3 × 12 × 1.85 mm  
DFN Package (W × L × H)  
Analog  
Standard and Fast Output  
per Pixel  
PERFORMANCE SPECIFICATIONS  
Typical values are measured at 21°C. Minimum and Maximum (when available) values take into account operation over the full  
temperature range of 40°C to 105°C. All measurements made at Vbr + 19 V. Note that Vov and values below may change in the final  
product.  
Parameter  
PDE @ 905 nm  
Min  
Typ  
14  
Max  
Unit  
%
Comment  
Dark Count Rate  
40  
kcps  
%
Per pixel  
Optical Crosstalk  
25  
6
Gain  
0.8 × 10  
TBD  
18  
Afterpulsing Probability  
Microcell Recovery Time  
Microcell Rise Time  
Fast Output Pulse Width  
Fast Output Rise Time  
Terminal Capacitance  
ns  
ns  
ns  
ns  
pF  
RC time constant  
Per pixel  
0.25  
1
0.25  
59  
This document contains information on a product under development. ON Semiconductor reserves the right to change or discontinue this product without notice.  
© Semiconductor Components Industries, LLC, 2019  
1
Publication Order Number:  
ARRAYRDM0116A10/D  
April, 2020 Rev. P1  
ArrayRDM0116A10DFN  
BIAS PARAMETERS  
Parameter  
Min  
Typ  
Max  
Unit  
Comment  
Breakdown Voltage (Vbr)  
21.7  
V
See Figure 1 for plot of typical Vbr as  
a function of temperature  
Over Voltage (Vov)  
19.0  
V
Typical value recommended for  
operation and used for  
characterization  
Operating Bias (Vop)  
Vop = Vbr + Vov  
See Figure 1  
Temperature Coefficient of Vbr  
mV/°C  
ABSOLUTE MAXIMUM RATINGS  
Parameter  
Value  
45 V  
Unit  
V
Comment  
Maximum Bias  
Maximum Current  
14 mA  
mA  
For the whole array at 40.7 V (Vop)  
and 21°C  
Maximum Storage Temperature  
Operating Temperature Range  
125  
°C  
°C  
40 to +105  
Ambient temperature  
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality  
should not be assumed, damage may occur and reliability may be affected.  
PACKAGE SPECIFICATIONS  
Parameter  
Value  
TBD  
TBD  
4
Unit  
Comment  
ESDHBM  
ESDCDM  
q
q
°C/W  
°C/W  
JC  
JA  
245  
3
MSL  
For all part numbers  
Figure 1. Breakdown Voltage vs. Temperature  
www.onsemi.com  
2
 
ArrayRDM0116A10DFN  
BIAS AND READOUT RECOMMENDATIONS  
The ArrayRDM0116A10DFN is formed of a linear  
Pairs of 1 nF 100 V ceramic capacitors are  
recommended for systems where dynamic switching  
of bias is required  
Higher capacitance can be used when static bias  
voltage is used eg 10 nF 100 V  
array of 16 SiPM pixels and housed in a 36pin DFN  
package. Figure 2 shows the sensor array schematic. The  
signals from each pixel can be accessed either via the pixel  
cathode or fast output. The common anode is also available  
and allows the provision of a single bias supply for all  
16 pixels.  
Use the EPAD contact to reduce the inductance of the bias  
supply connection to the SiPM array by using multiple  
plugged vias from the EPAD to the bias plane  
Cathode 1  
Cathode 2  
Cathode 16  
Decoupling capacitors should also be used on the back  
side of the PCB from the EPAD vias to GND when  
possible  
Fast Output 1  
Fast Output 2  
Fast Output 16  
SiPM 1  
SiPM 2  
SiPM 16  
Anode  
(Common)  
Figure 2. Array Schematic Showing  
Pixel Connections  
Figure 4.  
Recommendations for Series Termination (see Figure 4):  
Use series termination resistors close to the fast output  
pins (pins 2 to 17) of the Array  
Helps to match the source impedance of the SiPM  
pixels to the PCB and amplifier load  
Helps to reduce reflections of the high speed signals  
0201 package size resistors fit neatly beside each fast  
output pin  
Figure 3.  
GND cathodes near to each cathode pin (pins 20 to 35)  
using vias to GND plane when standard readout is not  
required  
Terminate any unused fast outputs using 50 W resistor to  
GND to avoid further reflections from unterminated  
tracks  
The following recommendations for the bias are advised  
(see Figure 3):  
Supply negative bias to the anode with cathode  
terminated to GND as illustrated in EVB schematic in  
Figure 6  
Use an internal power plane below the GND plane for the  
bias  
Place decoupling capacitors close to anode corner pins of  
the DFN (pins 1, 18, 19 & 36)  
Recommendations for Signal Track Impedance:  
Match impedance of signal tracks to 50 W  
E.g. Use microstrip impedance where signals on the top  
layer of the PCB are above a ground plane on an internal  
layer of the PCB  
www.onsemi.com  
3
 
ArrayRDM0116A10DFN  
PIN ASSIGNMENT  
Pixel 1  
Pixel 16  
Pin #  
Pin Assignment  
Pin #  
Pin Assignment  
1
2
Anode  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
29  
30  
31  
32  
33  
34  
35  
36  
Anode  
Fast output 1  
Fast output 2  
Fast output 3  
Fast output 4  
Fast output 5  
Fast output 6  
Fast output 7  
Fast output 8  
Fast output 9  
Fast output 10  
Fast output 11  
Fast output 12  
Fast output 13  
Fast output 14  
Fast output 15  
Fast output 16  
Anode  
Cathode 16  
Cathode 15  
Cathode 14  
Cathode 13  
Cathode 12  
Cathode 11  
Cathode 10  
Cathode 9  
Cathode 8  
Cathode 7  
Cathode 6  
Cathode 5  
Cathode 4  
Cathode 3  
Cathode 2  
Cathode 1  
Anode  
3
4
PIN 1  
5
TOP VIEW  
6
7
8
9
10  
11  
12  
13  
14  
15  
16  
17  
18  
EPAD  
EPAD  
BOTTOM VIEW  
Anode  
www.onsemi.com  
4
ArrayRDM0116A10DFN  
EVALUATION BOARD  
The ArrayRDM0116A10GEVB evaluation board is  
shown in Figure 5 and schematically (with pin outs) in  
Figure 6. It consists of:  
ArrayRDM0116A10DFN 16channel SiPM array  
32 U.FL connectors for access to each pixel cathode and  
fast output for signal readout  
An SMA connector for applying the bias to the common  
anode  
Bias filtering circuit  
Decoupling capacitors (14 x 10 nF and 4 x 100 nF  
decoupling capacitors from anode to ground not shown)  
This product allows a user to quickly and easily set up an  
evaluation of the array product.  
Note that a negative bias supply should be supplied via the  
SMA connector (J33), and the U.FL connectors (J1 to J32)  
should be 50 W terminated.  
Figure 5. ArrayRDM0116A10GEVB Top Side  
View Showing the 1x16 Sensor Placement  
50 W  
50 W  
50 W  
S1  
J17  
J18  
S2  
S16  
J32  
F1  
F2  
J1  
J2  
F16  
J16  
J33 (Body)  
SiPM 1  
SiPM 2  
SiPM 16  
0 V  
J33  
Vbias  
Connector  
J1J32  
J33  
Style  
U.FL Receptacle (Hirose U.FLRSMT)  
SMA Jack (F)  
Figure 6. ArrayRDM0116A10GEVB Board Schematic  
www.onsemi.com  
5
 
ArrayRDM0116A10DFN  
ORDERING INFORMATION  
Part Number  
Product Description  
Shipping Format  
ArrayRDM0116A10DFNTR  
Monolithic 1 × 16 array of NIR sensitive SiPM pixels formed  
using the RDM process.  
Tape and Reel  
Individual cathode and fast output connection per pixel and  
a common anode available via the 36pin DFN package.  
ArrayRDM0116A10DFNTR1  
ArrayRDM0116A10DFNTRE  
Cut Tape  
Unqualified prototype part of the ArrayRDM0116A10DFNTR  
Depends on  
Quantity Order  
ArrayRDM0116A10GEVB  
Evaluation board consisting of an ArrayRDM0116A10DFN  
mounted onto PCB.  
ESD Package  
A U.FL connector gives access to each pixel cathode and fast  
output. The bias is supplied via an SMA connector to the  
common anode.  
†For information on tape and reel specifications, including part orientation and tape sizes, please contact sensl_questions@onsemi.com.  
www.onsemi.com  
6
ArrayRDM0116A10DFN  
PACKAGE DIMENSIONS  
DFN36 12x3, 0.65P  
CASE 506EV  
ISSUE O  
A
B
www.onsemi.com  
7
ArrayRDM0116A10DFN  
EVALUATION BOARD DIMENSIONS  
www.onsemi.com  
8
ArrayRDM0116A10DFN  
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TECHNICAL SUPPORT  
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Phone: 011 421 33 790 2910  
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For additional information, please contact your local Sales Representative  
ON Semiconductor Website: www.onsemi.com  
www.onsemi.com  

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