MSM548512L [OKI]

524,288-Word X 8-Bit High-Speed PSRAM; 524,288字×8位高速PSRAM
MSM548512L
型号: MSM548512L
厂家: OKI ELECTRONIC COMPONETS    OKI ELECTRONIC COMPONETS
描述:

524,288-Word X 8-Bit High-Speed PSRAM
524,288字×8位高速PSRAM

静态存储器
文件: 总12页 (文件大小:162K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
E2L0044-17-Y1  
This version: Jan. 1998  
Previous version: Dec. 1996  
¡ Semiconductor  
MSM548512L  
524,288-Word ¥ 8-Bit High-Speed PSRAM  
DESCRIPTION  
TheMSM548512LisfabricatedusingOKI’sCMOSsilicongateprocesstechnology. Thisprocess,  
coupledwithsingle-transistermemorystoragecells,permitsmaximumcircuitdensity,minimum  
chip size and high speed.  
MSM548512L has Self-refresh mode in addition to Address-refresh mode and Auto-refresh  
mode. In the Self-refresh mode the internal refresh timer and address counter refresh the  
dynamic memory cells automatically. This series allows low power consumption when using  
standby mode with Self-refresh.  
The MSM548512L also features a static RAM-like write function that writes the data into the  
memory cell at the rising edge of WE.  
FEATURES  
• Large capacity  
• Fast access time  
• Low power  
:
:
:
:
:
:
:
:
4-Mbit (524,288-word ¥ 8 bits)  
80 ns max.  
200 µA max. (standby with Self-refresh)  
Self refresh  
SRAM WE pin, no address multiplex  
5 V ±10%  
2048 cycle/32 ms auto-address refresh  
SRAM standard package  
• Refresh free  
• Logic compatible  
• Single power supply  
• Refresh  
• Package compatible  
• Package options:  
32-pin 600 mil plastic DIP  
32-pin 525 mil plastic SOP  
(DIP32-P-600-2.54)  
(SOP32-P-525-1.27-K) (Product : MSM548512L-xxGS-K)  
xx indicates speed rank.  
(Product : MSM548512L-xxRS)  
PRODUCT FAMILY  
Access Time (Max.)  
Family  
MSM548512L-80RS  
MSM548512L-10RS  
MSM548512L-12RS  
MSM548512L-80GS-K  
MSM548512L-10GS-K  
MSM548512L-12GS-K  
Package  
80 ns  
100 ns  
120 ns  
80 ns  
600 mil 32-pin  
Plastic DIP  
525 mil 32-pin  
Plastic SOP  
100 ns  
120 ns  
1/12  
¡ Semiconductor  
MSM548512L  
PIN CONFIGURATION (TOP VIEW)  
A18  
A16  
A14  
A12  
A7  
1
2
3
4
5
6
7
8
9
32 VCC  
31 A15  
30 A17  
29 WE  
28 A13  
27 A8  
1
2
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
A18  
A16  
A14  
A12  
A7  
VCC  
A15  
3
A17  
A6  
4
WE  
A13  
A5  
26 A9  
5
6
A6  
A8  
A4  
25 A11  
24 OE/RFSH  
23 A10  
22 CE  
7
A5  
A9  
A3  
8
A4  
A11  
9
A2 10  
A1 11  
A3  
OE/RFSH  
A10  
10  
11  
12  
13  
14  
15  
16  
A2  
A1  
CE  
A0 12  
21 I/O7  
20 I/O6  
19 I/O5  
18 I/O4  
17 I/O3  
A0  
I/O7  
I/O6  
I/O5  
I/O4  
I/O3  
I/O0  
I/O1  
I/O2  
VSS  
I/O0 13  
I/O1 14  
I/O2 15  
VSS 16  
32-Pin Plastic DIP  
32-Pin Plastic SOP  
Pin Name  
A0 - A18  
I/O0 - I/O7  
CE  
Function  
Address Input  
Data Input/Output  
Chip Enable Input  
OE/RFSH  
WE  
Output Enable / Refresh Input  
Write Enable Input  
VCC  
Power Voltage (5 V)  
Ground (0 V)  
VSS  
2/12  
¡ Semiconductor  
MSM548512L  
BLOCK DIAGRAM  
A0  
Address  
Latch  
Control  
Row  
Decoder  
Memory Matrix  
(2048 ¥ 256) ¥ 8  
A10  
I/O0  
I/O7  
Column I/O  
Input  
Data  
Control  
Column Decoder  
Address Latch Control  
A11  
A18  
Refresh  
Control  
CE  
Timing Pulse Generator  
Read/Write Control  
OE/RFSH  
WE  
3/12  
¡ Semiconductor  
MSM548512L  
FUNCTION TABLE  
CE  
L
OE/RFSH  
WE  
H
I/O Pin  
Low-Z  
High-Z  
High-Z  
High-Z  
High-Z  
Mode  
Read  
L
X
H
L
L
L
Write  
L
H
H
X
Refresh  
Standby  
H
H
X
L : Low Level Input  
H : High Level Input  
X : Don’t Care  
ELECTRICAL CHARACTERISTICS  
Absolute Maximum Ratings  
Parameter  
Symbol  
Rating  
Unit  
V
Voltage on Any Pin from VSS *1  
Power Dissipation  
VT  
PD  
–1.0 to 7.0  
1.0  
W
Topr  
Tstg  
Operating Temperature  
Storage Temperature  
0 to 70  
–55 to 125  
–10 to 85  
50  
°C  
°C  
Tbias  
IOS  
Storage Temperature (biased)  
Short Circuit Output Current  
°C  
mA  
*1  
To V  
SS  
Note:  
1. Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are  
exceeded. Functional operation should be restricted to the conditions as detailed  
in the operational sections of this data sheet. Exposure to absolute maximum  
rating conditions for extended periods may affect device reliability.  
Recommended Operating Conditions  
(Ta = 0°C to 70°C)  
Parameter  
Power Supply Voltage  
Symbol  
Min.  
4.5  
0
Typ.  
5.0  
0
Max.  
5.5  
0
Unit  
VCC  
VSS  
VIH  
VIL  
V
V
V
V
2.4  
–0.5  
6.0  
0.8  
Input Voltage  
4/12  
¡ Semiconductor  
MSM548512L  
DC Characteristics  
(VCC = 5 V 10ꢀ, VSS = 0 V, Ta = 0°C to 70°C)  
Parameter  
Symbol Min. Typ. Max. Unit  
Condition  
I
I/O = Open, tcyc = min.  
Operating Current  
ICC1  
50  
75  
mA  
CE = VIH, OE/RFSH = VIH,  
VIN 0 V  
ISB1  
1
2
mA  
Standby Current  
CE VCC – 0.2 V, VIN 0 V,  
OE/RFSH VCC – 0.2 V  
CE = VIH, OE/RFSH = VIL,  
VIN 0 V  
ISB2  
ICC2  
ICC3  
100  
1
200  
2
mA  
mA  
mA  
Self Refresh Current  
CE VCC – 0.2 V, VIN 0 V,  
OE/RFSH £ 0.2 V  
100  
200  
Input Leakage Current  
Output Leakage Current  
Output Low Level  
ILI  
–10  
–10  
10  
10  
0.4  
mA  
mA  
V
VCC = 5.5 V, VIN = VSS to VCC  
OE/RFSH = VIH, VI/O = VSS to VCC  
IOL = 2.1 mA  
ILO  
VOL  
VOH  
Output High Level  
2.4  
V
IOH = –1 mA  
Capacitance  
Parameter  
Input Capacitance  
I/O Pin Capacitance  
Symbol  
CIN  
Min.  
Typ.  
Max.  
8
Unit  
pF  
Condition  
VIN = 0 V  
CI/O  
10  
pF  
VI/O = 0 V  
Note:  
This parameter is periodically sampled and is not 100% tested.  
5/12  
¡ Semiconductor  
MSM548512L  
AC Characteristics  
Measurement condition:  
Input pulse level ........................... V = 2.4 V, V = 0.4 V  
IH IL  
Output reference level.................. V  
= 2.0 V, V = 0.8 V  
OH  
OL  
Rising and falling time................. 5 ns  
Output load .................................... 1 TTL + 100 pF  
Input timing reference level........ High = 2.2 V, Low = 0.8 V  
(VCC = 5 V 10ꢀ, Ta = 0°C to 70°C)  
MSM548512L MSM548512L MSM548512L  
-80  
-10  
-12  
Parameter  
Symbol  
Unit Note  
Min.  
160  
220  
20  
0
Max.  
80  
30  
25  
25  
10m  
20  
50  
8m  
Min. Max.  
Min. Max.  
tRC  
tRWC  
tCEA  
tOEA  
tCHZ  
tCLZ  
tOHZ  
tOLZ  
tCE  
Random Read Write Cycle Time  
Random Read Modify Write Cycle Time  
CE Access Time  
180  
240  
20  
0
100  
30  
30  
25  
10m  
25  
50  
8m  
210  
280  
20  
0
120  
50  
30  
30  
10m  
30  
50  
8m  
ns  
ns  
ns  
ns  
OE Access Time  
Chip Disable to Output in High-Z  
CE to Output in Low-Z  
OE Disable to Output in High-Z  
OE Output in Low-Z  
ns  
ns  
ns  
ns  
s
6
6
CE Pulse Width  
80n  
70  
0
100n  
70  
0
120n  
80  
0
tP  
CE Precharge Time  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tAS  
Address Set-up Time  
tAH  
Address Hold Time  
20  
0
25  
0
30  
0
tRCS  
tRCH  
tOHC  
tOCD  
tWP  
tCW  
tDW  
tDH  
Read Command Set-up Time  
Read Command Hold Time  
OE Command Hold Time  
OE Delay Time  
0
0
0
15  
0
15  
0
15  
0
Write Command Pulse Width  
Chip Enable Time  
25  
80  
20  
0
35  
120  
30  
0
30  
100  
25  
0
Input Data Set Time  
Input Data Hold Time  
tOW  
tWHZ  
tT  
Output Active from End of Write  
Write Enable to Output in High-Z  
Transition Time  
5
5
5
3
3
3
6
ns 11  
tRFD  
tFP  
tFAP  
tFC  
RFSH Delay Time from CE  
RFSH Precharge Time  
70  
40  
80n  
160  
8
70  
40  
80n  
180  
8
80  
40  
80n  
210  
8
ns  
ns  
s
RFSH Pulse Width (Auto-refresh)  
Auto-refresh Cycle Time  
RFSH Pulse Width (Self-refresh)  
ns  
ms  
tFAS  
CE Delay Time from RFSH  
tRFS  
tREF  
600  
32  
600  
32  
600  
32  
ns  
in Self-refresh Mode  
Refresh Period (2048 cycle/32 ms)  
ms  
6/12  
¡ Semiconductor  
MSM548512L  
Notes: 1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause  
permanent damage to the device.  
2. All voltages are referenced to ground.  
3. I  
depends on output loading. Specified values are obtained with the output  
CC1  
open.  
4. An initial pause of 100 µs is required after power-up followed by more than 8  
initial cycles before proper device operation is achieved.  
5. AC measurements assume t = 5 ns.  
T
6. t  
, t  
and t  
define the time at which the output achieves the open circuit  
CHZ WHZ  
OHZ  
condition and is not referenced to output voltage levels.  
7. In write cycles, the input data is latched at the earlier rising point of either CE  
or WE. Write operation is achieved when both CE and WE are low.  
8. The I/O state remains at high impedance after CE goes low if the transition occurs  
at the same time as or after the falling edge of WE.  
9. Use WE or OE or both signals to disable the output before input data is applied  
during a write cycle when the input is not the same.  
10. Data input must be set to floating state before I/O becomes low impedance by  
WE or OE or both.  
11. V (Min.) and V (Max.) are input timing reference levels for measurement. The  
IH  
IL  
transition time is measured between V and V  
.
IL  
IH  
12. 2048-cycle refresh must be applied within 15 µs after the end of self refreshing  
to satisfy 2048 cycles/32 ms.  
7/12  
¡ Semiconductor  
MSM548512L  
TIMING WAVEFORM  
Read Cycle  
tRC  
tCE  
tP  
CE  
tAS  
tAH  
Address  
A0 - A18  
tRCS  
tRCH  
WE  
tCEA  
tOHC  
OE/RSFH  
tOEA  
tCHZ  
tOLZ  
tOHZ  
DOUT  
Valid Data-out  
"H" or "L"  
Write Cycle 1 (OE High)  
tRC  
tCE  
tP  
CE  
tAS  
tAH  
Address  
A0 - A18  
tCW  
tWP  
WE  
OE/RFSH  
tOCD  
tDW  
tDH  
DIN  
Valid Data-in  
tWHZ  
tOLZ  
tCHZ  
tOHZ  
tCLZ  
tOW  
DOUT  
"H" or "L"  
8/12  
¡ Semiconductor  
Write Cycle 2 (OE Low)  
CE  
MSM548512L  
tRC  
tCE  
tP  
tAS  
tAH  
Address  
A0 - A18  
tCW  
tWP  
WE  
tOHC  
OE/RFSH  
tDW  
tDH  
DIN  
Valid Data-in  
tWHZ  
tCLZ  
DOUT  
"H" or "L"  
Read Modify Write  
tRWC  
tP  
CE  
tAS  
tAH  
Address  
A0 - A18  
tCW  
tRCH  
tRCS  
tWP  
WE  
tOCD  
tOHC  
OE/RFSH  
tOHZ  
tOEA  
tOLZ  
tDW  
Valid Data-in  
tDH  
DIN  
tCHZ  
tWHZ  
tOW  
tCLZ  
Valid  
DOUT  
Data-out  
"H" or "L"  
9/12  
¡ Semiconductor  
MSM548512L  
Auto Refresh Cycle  
tRFD  
tFC  
tFC  
tFAP  
CE  
tFP  
tFAP  
tFP  
OE/RFSH  
"H" or "L"  
Self Refresh Cycle  
tRFD  
CE  
tRFS  
tFP  
tFAS  
OE/RFSH  
"H" or "L"  
10/12  
¡ Semiconductor  
PACKAGE DIMENSIONS  
DIP32-P-600-2.54  
MSM548512L  
(Unit : mm)  
Package material  
Lead frame material  
Pin treatment  
Solder plate thickness  
Package weight (g)  
Epoxy resin  
42 alloy  
Solder plating  
5 mm or more  
4.70 TYP.  
11/12  
¡ Semiconductor  
MSM548512L  
(Unit : mm)  
SOP32-P-525-1.27-K  
Mirror finish  
Package material  
Lead frame material  
Pin treatment  
Solder plate thickness  
Package weight (g)  
Epoxy resin  
42 alloy  
Solder plating  
5 mm or more  
1.32 TYP.  
Notes for Mounting the Surface Mount Type Package  
The SOP, QFP, TSOP, SOJ, QFJ (PLCC), SHP and BGA are surface mount type packages, which  
are very susceptible to heat in reflow mounting and humidity absorbed in storage.  
Therefore, before you perform reflow mounting, contact Oki’s responsible sales person for the  
product name, package name, pin number, package code and desired mounting conditions  
(reflow method, temperature and times).  
12/12  

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