PHD11N06LT [NXP]

TrenchMOS transistor Logic level FET; 的TrenchMOS晶体管逻辑电平场效应管
PHD11N06LT
型号: PHD11N06LT
厂家: NXP    NXP
描述:

TrenchMOS transistor Logic level FET
的TrenchMOS晶体管逻辑电平场效应管

晶体 晶体管
文件: 总9页 (文件大小:79K)
中文:  中文翻译
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Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Logic level FET  
PHB11N06LT, PHD11N06LT  
FEATURES  
SYMBOL  
QUICK REFERENCE DATA  
’Trench’ technology  
• Very low on-state resistance  
• Fast switching  
• Stable off-state characteristics  
• High thermal cycling performance  
• Low thermal resistance  
VDSS = 55 V  
d
s
ID = 11 A  
R
DS(ON) 150 m(VGS = 5 V)  
g
R
DS(ON) 130 m(VGS = 10 V)  
GENERAL DESCRIPTION  
N-channel enhancement mode, logic level, field-effect power transistor in a plastic envelope using ’trench’ technology.  
The device has very low on-state resistance. It is intended for use in dc to dc converters and general purpose switching  
applications.  
The PHB11N06LT is supplied in the SOT404 surface mounting package.  
The PHD11N06LT is supplied in the SOT428 surface mounting package.  
PINNING  
SOT428  
SOT404  
PIN  
DESCRIPTION  
tab  
tab  
1
2
gate  
drain 1  
3
source  
drain  
2
2
tab  
1
3
1
3
LIMITING VALUES  
Limiting values in accordance with the Absolute Maximum System (IEC 134)  
SYMBOL PARAMETER  
CONDITIONS  
MIN.  
MAX.  
UNIT  
VDSS  
VDGR  
VGS  
ID  
Drain-source voltage  
Drain-gate voltage  
Gate-source voltage  
Continuous drain current  
Tj = 25 ˚C to 175˚C  
Tj = 25 ˚C to 175˚C; RGS = 20 k  
-
-
-
-
-
-
-
55  
55  
± 13  
11  
7.6  
44  
V
V
V
A
A
A
W
˚C  
Tmb = 25 ˚C  
Tmb = 100 ˚C  
Tmb = 25 ˚C  
Tmb = 25 ˚C  
IDM  
PD  
Tj, Tstg  
Pulsed drain current  
Total power dissipation  
Operating junction and  
storage temperature  
36  
175  
- 55  
1 It is not possible to make contact to pin 2 of the SOT404 or SOT428 package  
September 1998  
1
Rev 1.000  
Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Logic level FET  
PHB11N06LT, PHD11N06LT  
ESD LIMITING VALUE  
SYMBOL PARAMETER  
CONDITIONS  
MIN.  
MAX.  
UNIT  
VC  
Electrostatic discharge  
capacitor voltage, all pins  
Human body model (100 pF, 1.5 k)  
-
2
kV  
THERMAL RESISTANCES  
SYMBOL PARAMETER  
CONDITIONS  
TYP.  
MAX.  
UNIT  
Rth j-mb  
Thermal resistance junction  
to mounting base  
-
4.17  
K/W  
Rth j-a  
Thermal resistance junction SOT78 package, in free air  
60  
50  
-
-
K/W  
K/W  
to ambient  
SOT428 and SOT404 package, pcb  
mounted, minimum footprint  
ELECTRICAL CHARACTERISTICS  
Tj= 25˚C unless otherwise specified  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
V(BR)DSS  
V(BR)GSS  
VGS(TO)  
Drain-source breakdown  
voltage  
Gate-source breakdown  
voltage  
VGS = 0 V; ID = 0.25 mA;  
55  
50  
10  
-
-
-
-
-
-
V
V
V
Tj = -55˚C  
IG = ±1 mA;  
Gate threshold voltage  
VDS = VGS; ID = 1 mA  
1.0  
0.5  
-
-
-
-
4
-
-
-
1.5  
-
-
100  
120  
250  
10  
0.02  
-
2.0  
-
2.3  
130  
150  
315  
-
V
V
V
Tj = 175˚C  
Tj = -55˚C  
RDS(ON)  
Drain-source on-state  
resistance  
VGS = 10 V; ID = 5.5 A  
VGS = 5 V; ID = 5.5 A  
mΩ  
mΩ  
mΩ  
S
µA  
µA  
µA  
µA  
Tj = 175˚C  
gfs  
IGSS  
Forward transconductance  
Gate source leakage current VGS = ±5 V; VDS = 0 V  
VDS = 25 V; ID = 5.5 A  
1
Tj = 175˚C  
Tj = 175˚C  
20  
10  
500  
IDSS  
Zero gate voltage drain  
current  
VDS = 55 V; VGS = 0 V;  
0.05  
-
-
Qg(tot)  
Qgs  
Qgd  
Total gate charge  
Gate-source charge  
Gate-drain (Miller) charge  
ID = 11 A; VDD = 44 V; VGS = 5 V  
-
-
-
6.1  
1.3  
3.2  
-
-
-
nC  
nC  
nC  
td on  
tr  
td off  
tf  
Turn-on delay time  
Turn-on rise time  
Turn-off delay time  
Turn-off fall time  
VDD = 30 V; ID = 5 A;  
VGS = 5 V; RG = 10 Ω  
Resistive load  
-
-
-
-
6
16  
35  
30  
30  
ns  
ns  
ns  
ns  
23  
18  
18  
Ld  
Ls  
Internal drain inductance  
Internal source inductance  
Measured from tab to centre of die  
Measured from source lead to source  
bond pad  
-
-
3.5  
7.5  
-
-
nH  
nH  
Ciss  
Coss  
Crss  
Input capacitance  
Output capacitance  
Feedback capacitance  
VGS = 0 V; VDS = 25 V; f = 1 MHz  
-
-
-
250  
34  
35  
330  
50  
50  
pF  
pF  
pF  
September 1998  
2
Rev 1.000  
Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Logic level FET  
PHB11N06LT, PHD11N06LT  
REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS  
Tj = 25˚C unless otherwise specified  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
IS  
Continuous source current  
(body diode)  
Pulsed source current (body  
diode)  
Diode forward voltage  
-
-
-
-
-
11  
44  
A
A
V
ISM  
VSD  
IF = 11 A; VGS = 0 V  
0.95  
1.2  
trr  
Qrr  
Reverse recovery time  
Reverse recovery charge  
IF = 11 A; -dIF/dt = 100 A/µs;  
VGS = 0 V; VR = 30 V  
-
-
34  
57  
-
-
ns  
nC  
AVALANCHE LIMITING VALUE  
SYMBOL PARAMETER  
CONDITIONS  
MIN.  
MAX.  
10  
UNIT  
WDSS  
Drain-source non-repetitive ID 10 A; VDD 25 V; VGS = 5 V;  
unclamped inductive turn-off RGS = 50 ; Tmb = 25 ˚C  
energy  
-
mJ  
September 1998  
3
Rev 1.000  
Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Logic level FET  
PHB11N06LT, PHD11N06LT  
Normalised Power Derating  
PD%  
Transient thermal impedance, Zth j-mb (K/W)  
120  
110  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
10  
1
0.1  
p
t
t
p
P
0.01  
D
D =  
T
t
T
0.001  
1us  
10us 100us 1ms  
10ms  
0.1s  
1s  
10s  
0
20  
40  
60  
80  
Tmb /  
100 120 140 160 180  
C
pulse width, tp (s)  
Fig.1. Normalised power dissipation.  
PD% = 100 PD/PD 25 ˚C = f(Tmb)  
Fig.4. Transient thermal impedance.  
Zth j-mb = f(t); parameter D = tp/T  
Normalised Current Derating  
ID%  
ID, Drain current (Amps)  
Tj = 25 C  
120  
110  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
10  
8
10 V  
5 V  
3.6 V  
3.4 V  
6
3.2 V  
4
3 V  
2.8 V  
2
VGS = 2.6 V  
0
0
20  
40  
60  
80  
100 120 140 160 180  
0
2
4
6
8
10  
Tmb /  
C
VDS, Drain-Source voltage (Volts)  
Fig.2. Normalised continuous drain current.  
ID% = 100 ID/ID 25 ˚C = f(Tmb); conditions: VGS 5 V  
Fig.5. Typical output characteristics, Tj = 25 ˚C.  
ID = f(VDS); parameter VGS  
RDS(on), Drain-Source on resistance (Ohms)  
tp =  
ID, Drain current (Amps)  
0.5  
100  
10  
1
2.6V  
Tj = 25 C  
0.4  
3.2V  
2.8V  
3V  
3.4V  
3.6V  
10 us  
0.3  
0.2  
0.1  
0
100 us  
DC  
1 ms  
VGS = 5 V  
10 V  
10 ms  
0.1  
0
2
4
6
8
10  
1
10  
VDS, Drain-source voltage (Volts)  
100  
ID, Drain current (Amps)  
Fig.3. Safe operating area. Tmb = 25 ˚C  
ID & IDM = f(VDS); IDM single pulse; parameter tp  
Fig.6. Typical on-state resistance, Tj = 25 ˚C.  
RDS(ON) = f(ID); parameter VGS  
September 1998  
4
Rev 1.000  
Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Logic level FET  
PHB11N06LT, PHD11N06LT  
VGS(TO) / V  
max.  
Drain current, ID (A)  
10  
2.5  
2
VDS > ID x RDS(on)  
8
typ.  
1.5  
1
6
4
min.  
175 C  
2
0.5  
Tj = 25 C  
0
0
0
1
2
3
4
5
-100  
-50  
0
50  
Tj / C  
100  
150  
200  
Gate-source voltage, VGS (V)  
Fig.7. Typical transfer characteristics.  
ID = f(VGS) ; conditions: VDS = 25 V; parameter Tj  
Fig.10. Gate threshold voltage.  
GS(TO) = f(Tj); conditions: ID = 1 mA; VDS = VGS  
V
Sub-Threshold Conduction  
Transconductance, gfs (S)  
VDS > ID x RDS(on)  
1E-01  
1E-02  
1E-03  
1E-04  
1E-05  
1E-05  
8
7
6
5
4
3
2
1
0
Tj = 25 C  
2%  
typ  
98%  
Tj = 175 C  
0
2
4
6
8
10  
Drain current, ID (A)  
0
0.5  
1
1.5  
2
2.5  
3
Fig.8. Typical transconductance, Tj = 25 ˚C.  
gfs = f(ID); conditions: VDS = 25 V  
Fig.11. Sub-threshold drain current.  
ID = f(VGS); conditions: Tj = 25 ˚C; VDS = VGS  
Capacitances, Ciss, Coss, Crss (pF)  
Rds(on) normlised to 25degC  
a
1000  
100  
10  
2.5  
2
Ciss  
Coss  
Crss  
1.5  
1
0.5  
0.1  
1
10  
100  
-100  
-50  
0
50  
100  
150  
200  
Drain-source voltage, VDS (V)  
Tmb / degC  
Fig.9. Normalised drain-source on-state resistance.  
a = RDS(ON)/RDS(ON)25 ˚C = f(Tj); ID = 5.5 A; VGS = 5 V  
Fig.12. Typical capacitances, Ciss, Coss, Crss.  
C = f(VDS); conditions: VGS = 0 V; f = 1 MHz  
September 1998  
5
Rev 1.000  
Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Logic level FET  
PHB11N06LT, PHD11N06LT  
WDSS%  
VGS, Gate-Source voltage (Volts)  
15  
120  
110  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
VDD = 44 V  
ID = 11 A  
Tj = 25 C  
10  
5
0
20  
40  
60  
80  
100  
120  
140  
160  
180  
0
2
4
6
8
10  
12  
Qg, Gate charge (nC)  
Tmb / C  
Fig.13. Typical turn-on gate-charge characteristics.  
VGS = f(QG); parameter VDS  
Fig.15. Normalised avalanche energy rating.  
WDSS% = f(Tmb)  
Source-drain diode current, IF (A)  
VGS = 0V  
20  
15  
10  
5
VDD  
+
L
VDS  
-
175 C  
VGS  
-ID/100  
Tj = 25 C  
T.U.T.  
0
R 01  
RGS  
shunt  
0
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
1.4  
Source-drain voltage, VSDS (V)  
Fig.16. Avalanche energy test circuit.  
WDSS = 0.5 LID2 BVDSS/(BVDSS VDD  
Fig.14. Typical reverse diode current.  
IF = f(VSDS); conditions: VGS = 0 V; parameter Tj  
)
September 1998  
6
Rev 1.000  
Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Logic level FET  
PHB11N06LT, PHD11N06LT  
MECHANICAL DATA  
Dimensions in mm  
Net Mass: 1.4 g  
4.5 max  
1.4 max  
10.3 max  
11 max  
15.4  
2.5  
0.85 max  
(x2)  
0.5  
2.54 (x2)  
Fig.17. SOT404 : centre pin connected to mounting base.  
MOUNTING INSTRUCTIONS  
Dimensions in mm  
11.5  
9.0  
17.5  
2.0  
3.8  
5.08  
Fig.18. SOT404 : soldering pattern for surface mounting.  
Notes  
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent  
damage to MOS gate oxide.  
2. Epoxy meets UL94 V0 at 1/8".  
September 1998  
7
Rev 1.000  
Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Logic level FET  
PHB11N06LT, PHD11N06LT  
MECHANICAL DATA  
Dimensions in mm : Net Mass: 1.4 g  
seating plane  
1.1  
2.38 max  
0.93 max  
5.4  
6.73 max  
tab  
4 min  
6.22 max  
0.5 min  
10.4 max  
4.6  
0.5  
2
0.3  
0.5  
3
1
0.8 max  
(x2)  
2.285 (x2)  
Fig.19. SOT428 : centre pin connected to mounting base.  
MOUNTING INSTRUCTIONS  
Dimensions in mm  
7.0  
7.0  
2.15  
2.5  
1.5  
4.57  
Fig.20. SOT428 : soldering pattern for surface mounting.  
Notes  
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent  
damage to MOS gate oxide.  
2. Epoxy meets UL94 V0 at 1/8".  
September 1998  
8
Rev 1.000  
Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Logic level FET  
PHB11N06LT, PHD11N06LT  
DEFINITIONS  
Data sheet status  
Objective specification  
This data sheet contains target or goal specifications for product development.  
Preliminary specification This data sheet contains preliminary data; supplementary data may be published later.  
Product specification  
This data sheet contains final product specifications.  
Limiting values  
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one  
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and  
operation of the device at these or at any other conditions above those given in the Characteristics sections of  
this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.  
Application information  
Where application information is given, it is advisory and does not form part of the specification.  
Philips Electronics N.V. 1998  
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the  
copyright owner.  
The information presented in this document does not form part of any quotation or contract, it is believed to be  
accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any  
consequence of its use. Publication thereof does not convey nor imply any license under patent or other  
industrial or intellectual property rights.  
LIFE SUPPORT APPLICATIONS  
These products are not designed for use in life support appliances, devices or systems where malfunction of these  
products can be reasonably expected to result in personal injury. Philips customers using or selling these products  
for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting  
from such improper use or sale.  
September 1998  
9
Rev 1.000  

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