LPC822M101JDH20 [NXP]
32-bit ARM® Cortex®-M0 microcontroller; up to 32 kB flash and 8 kB SRAM; 12-bit ADC; comparator;型号: | LPC822M101JDH20 |
厂家: | NXP |
描述: | 32-bit ARM® Cortex®-M0 microcontroller; up to 32 kB flash and 8 kB SRAM; 12-bit ADC; comparator 静态存储器 |
文件: | 总83页 (文件大小:2412K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
LPC82x
32-bit ARM® Cortex®-M0+ microcontroller; up to 32 kB flash
and 8 kB SRAM; 12-bit ADC; comparator
Rev. 1.4 — 19 March 2021
Product data sheet
1. General description
The LPC82x are an ARM Cortex-M0+ based, low-cost 32-bit MCU family operating at
CPU frequencies of up to 30 MHz. The LPC82x support up to 32 KB of flash memory and
8 KB of SRAM.
The peripheral complement of the LPC82x includes a CRC engine, four I2C-bus
interfaces, up to three USARTs, up to two SPI interfaces, one multi-rate timer,
self-wake-up timer, and state-configurable timer with PWM function (SCTimer/PWM), a
DMA, one 12-bit ADC and one analog comparator, function-configurable I/O ports through
a switch matrix, an input pattern match engine, and up to 29 general-purpose I/O pins.
For additional documentation related to the LPC82x parts, see Section 18.
2. Features and benefits
System:
ARM Cortex-M0+ processor (revision r0p1), running at frequencies of up to
30 MHz with single-cycle multiplier and fast single-cycle I/O port.
ARM Cortex-M0+ built-in Nested Vectored Interrupt Controller (NVIC).
System tick timer.
AHB multilayer matrix.
Serial Wire Debug (SWD) with four break points and two watch points. JTAG
boundary scan (BSDL) supported.
MTB
Memory:
Up to 32 KB on-chip flash programming memory with 64 Byte page write and
erase. Code Read Protection (CRP) supported.
8 KB SRAM.
ROM API support:
Boot loader.
On-chip ROM APIs for ADC, SPI, I2C, USART, power configuration (power
profiles) and integer divide.
Flash In-Application Programming (IAP) and In-System Programming (ISP).
Digital peripherals:
High-speed GPIO interface connected to the ARM Cortex-M0+ IO bus with up to 29
General-Purpose I/O (GPIO) pins with configurable pull-up/pull-down resistors,
programmable open-drain mode, input inverter, and digital filter. GPIO direction
control supports independent set/clear/toggle of individual bits.
High-current source output driver (20 mA) on four pins.
LPC82x
NXP Semiconductors
32-bit ARM Cortex-M0+ microcontroller
High-current sink driver (20 mA) on two true open-drain pins.
GPIO interrupt generation capability with boolean pattern-matching feature on
eight GPIO inputs.
Switch matrix for flexible configuration of each I/O pin function.
CRC engine.
DMA with 18 channels and 9 trigger inputs.
Timers:
State Configurable Timer (SCTimer/PWM) with input and output functions
(including capture and match) for timing and PWM applications. Each
SCTimer/PWM input is multiplexed to allow selecting from several input sources
such as pins, ADC interrupt, or comparator output.
Four channel Multi-Rate Timer (MRT) for repetitive interrupt generation at up to
four programmable, fixed rates.
Self-Wake-up Timer (WKT) clocked from either the IRC, a low-power,
low-frequency internal oscillator, or an external clock input in the always-on power
domain.
Windowed Watchdog timer (WWDT).
Analog peripherals:
One 12-bit ADC with up to 12 input channels with multiple internal and external
trigger inputs and with sample rates of up to 1.2 Msamples/s. The ADC supports
two independent conversion sequences.
Comparator with four input pins and external or internal reference voltage.
Serial peripherals:
Three USART interfaces with pin functions assigned through the switch matrix and
one common fractional baud rate generator.
Two SPI controllers with pin functions assigned through the switch matrix.
Four I2C-bus interfaces. One I2C supports Fast-mode Plus with 1 Mbit/s data rates
on two true open-drain pins and listen mode. Three I2Cs support data rates up to
400 kbit/s on standard digital pins.
Clock generation:
12 MHz internal RC oscillator trimmed to 1.5 % accuracy that can optionally be
used as a system clock.
Crystal oscillator with an operating range of 1 MHz to 25 MHz.
Programmable watchdog oscillator with a frequency range of 9.4 kHz to 2.3 MHz.
PLL allows CPU operation up to the maximum CPU rate without the need for a
high-frequency crystal. May be run from the system oscillator, the external clock
input, or the internal RC oscillator.
Clock output function with divider that can reflect all internal clock sources.
Power control:
Power consumption in active mode as low as 90 uA/MHz in low-current mode
using the IRC as the clock source.
Integrated PMU (Power Management Unit) to minimize power consumption.
Reduced power modes: Sleep mode, Deep-sleep mode, Power-down mode, and
Deep power-down mode.
Wake-up from Deep-sleep and Power-down modes on activity on USART, SPI, and
I2C peripherals.
Timer-controlled self wake-up from Deep power-down mode.
LPC82x
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Product data sheet
Rev. 1.4 — 19 March 2021
2 of 82
LPC82x
NXP Semiconductors
32-bit ARM Cortex-M0+ microcontroller
Power-On Reset (POR).
Brownout detect (BOD).
Unique device serial number for identification.
Single power supply (1.8 V to 3.6 V).
Operating temperature range -40 °C to +105 °C.
Available in a TSSOP20 and HVQFN33 (5x5) package.
3. Applications
Sensor gateways
Industrial
Simple motor control
Portables and wearables
Lighting
Gaming controllers
8/16-bit applications
Consumer
Motor control
Fire and security applications
Climate control
4. Ordering information
Table 1.
Ordering information
Type number
Package
Name
Description
Version
LPC824M201JHI33
LPC822M101JHI33
HVQFN33
HVQFN: plastic thermal enhanced very thin quad flat package; no leads; n/a
33 terminals; body 5 5 0.85 mm
HVQFN33
HVQFN: plastic thermal enhanced very thin quad flat package; no leads; n/a
33 terminals; body 5 5 0.85 mm
LPC824M201JDH20 TSSOP20
LPC822M101JDH20 TSSOP20
plastic thin shrink small outline package; 20 leads; body width 4.4 mm
plastic thin shrink small outline package; 20 leads; body width 4.4 mm
SOT360-1
SOT360-1
4.1 Ordering options
Table 2.
Ordering options
Type number
Flash/ SRAM/ USART I2C
KB KB
SPI ADC
channels
Comparator GPIO
Package
LPC824M201JHI33
LPC822M101JHI33
LPC824M201JDH20
LPC822M101JDH20
32
8
3
3
3
3
4
4
4
4
2
2
2
2
12
Y
Y
Y
y
29
29
16
16
HVQFN33
HVQFN33
TSSOP20
TSSOP20
16
32
16
4
8
4
12
5
5
LPC82x
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Product data sheet
Rev. 1.4 — 19 March 2021
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LPC82x
NXP Semiconductors
32-bit ARM Cortex-M0+ microcontroller
5. Marking
20
Terminal 1 index area
Terminal 1 index area
1
aaa-014766
aaa-014382
Fig 1. TSSOP20 package marking
Fig 2. HVQFN33 package marking
The HVQFN33 packages typically have the following top-side marking:
82xJ
xx xx
yywwxR
The TSSOP20 packages typically have the following top-side marking:
LPC82x
Mx01J
xxxxxxxx
zzywwxR
In the last line, field ‘y’ or ‘yy’ states the year the device was manufactured. Field ‘ww’
states the week the device was manufactured during that year. Field ‘R’ states the chip
revision.
LPC82x
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Product data sheet
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4 of 82
LPC82x
NXP Semiconductors
32-bit ARM Cortex-M0+ microcontroller
6. Block diagram
LPC82xM
SWCLK, SWD
TEST/DEBUG
INTERFACE
29 x
PIO0
HIGH-SPEED
GPIO
ARM
CORTEX-M0+
FLASH
16/32 KB
SRAM
4/8 KB
ROM
PIN INTERRUPTS/
PATTERN MATCH
slave
slave
slave
SCT_PIN[3:0]
SCT_OUT[6:0]
SCTIMER/
PWM
AHB-LITE BUS
slave master
slave
CRC
DMA
AHB TO APB
BRIDGE
TXD, RTS
RXD, CTS
SCLK
WWDT
IOCON
USART0/1/2
SPI0/1
SCK, SSEL
MISO, MOSI
29 x
SWITCH
MATRIX
MULTI-RATE TIMER
SCL
SDA
2
I C0/1/2/3
XTALOUT
XTALIN
PMU
XTAL
SYSCON
RESET, CLKIN
CLKOUT
SELF
WAKE-UP TIMER
ALWAYS-ON POWER DOMAIN
IRC
CLOCK
GENERATION,
POWER CONTROL,
SYSTEM
WDOsc
BOD
ADC_[11:0]
ADC
FUNCTIONS
POR
ACMP_I[4:1]
VDDCMP
ACMP_O
COMPARATOR
clocks and
controls
aaa-014399
Gray-shaded blocks show peripherals that can provide hardware triggers or fixed DMA requests for DMA transfers.
Fig 3. LPC82x block diagram
LPC82x
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Product data sheet
Rev. 1.4 — 19 March 2021
5 of 82
LPC82x
NXP Semiconductors
32-bit ARM Cortex-M0+ microcontroller
7. Pinning information
7.1 Pinning
1
2
20
19
18
17
16
15
14
13
12
11
PIO0_23/ADC_3/ACMP_I4
PIO0_14/ADC_2/ACMP_I3
PIO0_0/ACMP_I1/TDO
VREFP
PIO0_17/ADC_9
PIO0_13/ADC_10
3
4
PIO0_12
VREFN
5
RESET/PIO0_5
V
SS
V
DD
TSSOP20
6
PIO0_4/ADC_11/WAKEUP/TRST
SWCLK/PIO0_3/TCK
SWDIO/PIO0_2/TMS
PIO0_11/I2C0_SDA
PIO0_10/I2C0_SCL
7
PIO0_8/XTALIN
8
PIO0_9/XTALOUT
PIO0_1/ACMP_I2/CLKIN/TDI
PIO0_15
9
10
aaa-011391
Fig 4.
Pin configuration TSSOP20 package
terminal 1
index area
1
2
3
4
5
6
7
8
24
PIO0_13/ADC_10
PIO0_12
PIO0_0/ACMP_I1/TDO
PIO0_6/ADC_1/VDDCMP
PIO0_7/ADC_0
VREFP
23
22
21
20
19
18
17
PIO0_5/RESET
PIO0_4/ADC_11/TRST
PIO0_28/WKTCLKIN
SWCLK/PIO0_3/TCK
SWDIO/PIO0_2/TMS
PIO0_11/I2C0_SDA
VREFN
V
DD
PIO0_8/XTALIN
33 V
SS
PIO0_9/XTALOUT
aaa-011396
Transparent top view
Fig 5.
Pin configuration HVQFN33 package
LPC82x
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Product data sheet
Rev. 1.4 — 19 March 2021
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LPC82x
NXP Semiconductors
32-bit ARM Cortex-M0+ microcontroller
7.2 Pin description
The pin description table Table 3 shows the pin functions that are fixed to specific pins on
each package. These fixed-pin functions are selectable through the switch matrix
between GPIO and the comparator, ADC, SWD, RESET, and the XTAL pins. By default,
the GPIO function is selected except on pins PIO0_2, PIO0_3, and PIO0_5. JTAG
functions are available in boundary scan mode only.
Movable function for the I2C, USART, SPI, and SCT pin functions can be assigned
through the switch matrix to any pin that is not power or ground in place of the pin’s fixed
functions.
The following exceptions apply:
Do not assign more than one output to any pin. However, more than one input can be
assigned to a pin. Once any function is assigned to a pin, the pin’s GPIO functionality is
disabled.
Pin PIO0_4 triggers a wake-up from Deep power-down mode. If the part must wake up
from Deep power-down mode via an external pin, do not assign any movable function to
this pin.
The JTAG functions TDO, TDI, TCK, TMS, and TRST are selected on pins PIO0_0 to
PIO0_4 by hardware when the part is in boundary scan mode.
Table 3.
Symbol
Pin description
Reset
state[1]
Type
Description
[2]
[2]
PIO0_0/ACMP_I1/
TDO
19 24
I; PU
I; PU
IO
PIO0_0 — General-purpose port 0 input/output 0.
In ISP mode, this is the U0_RXD pin.
In boundary scan mode: TDO (Test Data Out).
ACMP_I1 — Analog comparator input 1.
PIO0_1 — General-purpose port 0 input/output 1.
In boundary scan mode: TDI (Test Data In).
ACMP_I2 — Analog comparator input 2.
CLKIN — External clock input.
A
PIO0_1/ACMP_I2/
CLKIN/TDI
12 16
IO
A
I
[4]
[4]
SWDIO/PIO0_2/
TMS
8
7
7
6
I; PU
I; PU
IO
SWDIO — Serial Wire Debug I/O. SWDIO is enabled by default
on this pin. In boundary scan mode: TMS (Test Mode Select).
I/O
I
PIO0_2 — General-purpose port 0 input/output 2.
SWCLK/PIO0_3/
TCK
SWCLK — Serial Wire Clock. SWCLK is enabled by default on
this pin.
In boundary scan mode: TCK (Test Clock).
IO
PIO0_3 — General-purpose port 0 input/output 3.
LPC82x
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Product data sheet
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LPC82x
NXP Semiconductors
32-bit ARM Cortex-M0+ microcontroller
Table 3.
Symbol
Pin description
Reset
state[1]
Type
Description
[3]
PIO0_4/ADC_11/
TRSTN/WAKEUP
6
4
I; PU
IO
PIO0_4 — General-purpose port 0 input/output 4.
In boundary scan mode: TRST (Test Reset).
In ISP mode, this pin is the U0_TXD pin.
This pin triggers a wake-up from Deep power-down mode. If the
part must wake up from Deep power-down mode via an external
pin, do not assign any movable function to this pin. This pin
should be pulled HIGH externally before entering Deep
power-down mode. A LOW-going pulse as short as 50 ns causes
the chip to exit Deep power-down mode and wakes up the part.
A
ADC_11 — ADC input 11.
[7]
RESET/PIO0_5
5
3
I; PU
IO
RESET — External reset input: A LOW-going pulse as short as
50 ns on this pin resets the device, causing I/O ports and
peripherals to take on their default states, and processor
execution to begin at address 0.
In deep power-down mode, this pin must be pulled HIGH
externally. The RESET pin can be left unconnected or be used as
a GPIO or for any movable function if an external RESET function
is not needed and the Deep power-down mode is not used.
I
PIO0_5 — General-purpose port 0 input/output 5.
PIO0_6 — General-purpose port 0 input/output 6.
ADC_1 — ADC input 1.
[10]
PIO0_6/ADC_1/
VDDCMP
-
-
23
22
I; PU
IO
A
A
VDDCMP — Alternate reference voltage for the analog
comparator.
[2]
[8]
PIO0_7/ADC_0
PIO0_8/XTALIN
I; PU
I; PU
IO
A
PIO0_7 — General-purpose port 0 input/output 7.
ADC_0 — ADC input 0.
14 18
13 17
IO
A
PIO0_8 — General-purpose port 0 input/output 8.
XTALIN — Input to the oscillator circuit and internal clock
generator circuits. Input voltage must not exceed 1.95 V.
[8]
[6]
PIO0_9/XTALOUT
I; PU
IO
A
PIO0_9 — General-purpose port 0 input/output 9.
XTALOUT — Output from the oscillator circuit.
PIO0_10/I2C0_SCL 10
9
Inactive I; F
PIO0_10 — General-purpose port 0 input/output 10 (open-drain).
I2C0_SCL — Open-drain I2C-bus clock input/output. High-current
sink if I2C Fast-mode Plus is selected in the I/O configuration
register.
[6]
PIO0_11/I2C0_SDA
9
8
Inactive I; F
PIO0_11 — General-purpose port 0 input/output 11 (open-drain).
I2C0_SDA — Open-drain I2C-bus data input/output. High-current
sink if I2C Fast-mode Plus is selected in the I/O configuration
register.
[4]
[2]
PIO0_12
4
3
2
1
I; PU
I; PU
IO
PIO0_12 — General-purpose port 0 input/output 12. ISP entry
pin. A LOW level on this pin during reset starts the ISP command
handler.
PIO0_13/ADC_10
IO
A
PIO0_13 — General-purpose port 0 input/output 13.
ADC_10 — ADC input 10.
LPC82x
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Product data sheet
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LPC82x
NXP Semiconductors
32-bit ARM Cortex-M0+ microcontroller
Table 3.
Symbol
Pin description
Reset
state[1]
Type
Description
[2]
PIO0_14/
ACMP_I3/ADC_2
20 25
11 15
I; PU
IO
A
PIO0_14 — General-purpose port 0 input/output 14.
ACMP_I3 — Analog comparator common input 3.
ADC_2 — ADC input 2.
A
[5]
[4]
[2]
PIO0_15
I; PU
I; PU
I; PU
IO
IO
IO
A
PIO0_15 — General-purpose port 0 input/output 15.
PIO0_16 — General-purpose port 0 input/output 16.
PIO0_17 — General-purpose port 0 input/output 17.
ADC_9 — ADC input 9.
PIO0_16
-
10
32
PIO0_17/ADC_9
2
[2]
[2]
[2]
[2]
[2]
[2]
PIO0_18/ADC_8
PIO0_19/ADC_7
PIO0_20/ADC_6
PIO0_21/ADC_5
PIO0_22/ADC_4
-
31
30
29
28
27
26
I; PU
I; PU
I; PU
I; PU
I; PU
I; PU
IO
A
PIO0_18 — General-purpose port 0 input/output 18.
ADC_8 — ADC input 8.
-
IO
A
PIO0_19 — General-purpose port 0 input/output 19.
ADC_7 — ADC input 7.
-
IO
A
PIO0_20 — General-purpose port 0 input/output 20.
ADC_6 — ADC input 6.
-
IO
A
PIO0_21 — General-purpose port 0 input/output 21.
ADC_5 — ADC input 5.
-
IO
A
PIO0_22 — General-purpose port 0 input/output 22.
ADC_4 — ADC input 4.
PIO0_23/ADC_3/
ACMP_I4
1
IO
A
PIO0_23 — General-purpose port 0 input/output 23.
ADC_3 — ADC input 3.
A
ACMP_I4 — Analog comparator common input 4.
PIO0_24 — General-purpose port 0 input/output 24.
PIO0_25 — General-purpose port 0 input/output 25.
PIO0_26 — General-purpose port 0 input/output 26.
PIO0_27 — General-purpose port 0 input/output 27.
[5]
[5]
[5]
[5]
[3]
PIO0_24
PIO0_25
PIO0_26
PIO0_27
-
-
-
-
-
14
13
12
11
5
I; PU
I; PU
I; PU
I; PU
I; PU
IO
IO
IO
IO
IO
PIO0_28/
PIO0_28 — General-purpose port 0 input/output 28. This pin can
host an external clock for the self-wake-up timer. To use the pin
as a self-wake-up timer clock input, select the external clock in the
wake-up timer CTRL register. The external clock input is active in
all power modes, including deep power-down.
WKTCLKIN
VDD
15 19
-
-
Supply voltage for the I/O pad ring, the core voltage regulator, and
the analog peripherals.
VSS
16 33[11]
17 20
-
-
-
-
-
-
Ground.
VREFN
VREFP
ADC negative reference voltage.
18 21
ADC positive reference voltage. Must be equal or lower than VDD.
[1] Pin state at reset for default function: I = Input; AI = Analog Input; O = Output; PU = internal pull-up enabled (pins pulled up to full VDD
level); IA = inactive, no pull-up/down enabled; F = floating. For pin states in the different power modes, see Section 14.5 “Pin states in
different power modes”. For termination on unused pins, see Section 14.4 “Termination of unused pins”.
[2] 5 V tolerant pin providing standard digital I/O functions with configurable modes, configurable hysteresis, and analog input. When
configured as an analog input, the digital section of the pin is disabled, and the pin is not 5 V tolerant.
LPC82x
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Product data sheet
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LPC82x
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32-bit ARM Cortex-M0+ microcontroller
[3] 5 V tolerant pad providing digital I/O functions with configurable pull-up/pull-down resistors and configurable hysteresis. This pin is
active in Deep power-down mode and includes a 20 ns glitch filter (active in all power modes). In Deep power-down mode, pulling the
WAKEUP pin LOW wakes up the chip. The wake-up pin function can be disabled and the pin can be used for other purposes, if the
WKT low-power oscillator is enabled for waking up the part from Deep power-down mode. See Table 17 “Dynamic characteristics:
WKTCLKIN pin” for the WKTCLKIN input.
[4] 5 V tolerant pad providing digital I/O functions with configurable pull-up/pull-down resistors and configurable hysteresis; includes
high-current output driver.
[5] 5 V tolerant pad providing digital I/O functions with configurable pull-up/pull-down resistors and configurable hysteresis.
[6] True open-drain pin. I2C-bus pins compliant with the I2C-bus specification for I2C standard mode, I2C Fast-mode, and I2C Fast-mode
Plus. Do not use this pad for high-speed applications such as SPI or USART. The pin requires an external pull-up to provide output
functionality. When power is switched off, this pin is floating and does not disturb the I2C lines. Open-drain configuration applies to all
functions on this pin.
[7] See Figure 10 for the reset pad configuration. This pin includes a 20 ns glitch filter (active in all power modes). RESET functionality is
not available in Deep power-down mode. Use the WAKEUP pin to reset the chip and wake up from Deep power-down mode. An
external pull-up resistor is required on this pin for the Deep power-down mode.
[8] 5 V tolerant pin providing standard digital I/O functions with configurable modes, configurable hysteresis, and analog I/O for the system
oscillator. When configured for XTALIN and XTALOUT, the digital section of the pin is disabled, and the pin is not 5 V tolerant.
[9] The WKTCLKIN function is enabled in the DPDCTRL register in the PMU. See the LPC82x user manual.
[10] The digital part of this pin is 3 V tolerant pin due to special analog functionality. Pin provides standard digital I/O functions with
configurable modes, configurable hysteresis, and an analog input. When configured as an analog input, the digital section of the pin is
disabled.
[11] Thermal pad for HVQFN33.
Table 4.
Movable functions (assign to pins PIO0_0 to PIO0_28 through switch matrix)
Function name
U0_TXD
Type
O
Description
Transmitter output for USART0.
Receiver input for USART0.
U0_RXD
I
U0_RTS
O
Request To Send output for USART0.
Clear To Send input for USART0.
Serial clock input/output for USART0 in synchronous mode.
Transmitter output for USART1.
Receiver input for USART1.
U0_CTS
I
U0_SCLK
U1_TXD
I/O
O
U1_RXD
I
U1_RTS
O
Request To Send output for USART1.
Clear To Send input for USART1.
Serial clock input/output for USART1 in synchronous mode.
Transmitter output for USART2.
Receiver input for USART2.
U1_CTS
I
U1_SCLK
U2_TXD
I/O
O
U2_RXD
I
U2_RTS
O
Request To Send output for USART1.
Clear To Send input for USART1.
Serial clock input/output for USART1 in synchronous mode.
Serial clock for SPI0.
U2_CTS
I
U2_SCLK
SPI0_SCK
SPI0_MOSI
SPI0_MISO
SPI0_SSEL0
SPI0_SSEL1
SPI0_SSEL2
SPI0_SSEL3
SPI1_SCK
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
Master Out Slave In for SPI0.
Master In Slave Out for SPI0.
Slave select 0 for SPI0.
Slave select 1 for SPI0.
Slave select 2 for SPI0.
Slave select 3 for SPI0.
Serial clock for SPI1.
LPC82x
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© NXP Semiconductors N.V. 2021. All rights reserved.
Product data sheet
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LPC82x
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Table 4.
Movable functions (assign to pins PIO0_0 to PIO0_28 through switch matrix)
Function name
SPI1_MOSI
SPI1_MISO
SPI1_SSEL0
SPI1_SSEL1
SCT_PIN0
Type
I/O
I/O
I/O
I/O
I
Description
Master Out Slave In for SPI1.
Master In Slave Out for SPI1.
Slave select 0 for SPI1.
Slave select 1 for SPI1.
Pin input 0 to the SCT input multiplexer.
Pin input 1 to the SCT input multiplexer.
Pin input 2 to the SCT input multiplexer.
Pin input 3 to the SCT input multiplexer.
SCT output 0.
SCT_PIN1
I
SCT_PIN2
I
SCT_PIN3
I
SCT_OUT0
SCT_OUT1
SCT_OUT2
SCT_OUT3
SCT_OUT4
SCT_OUT5
I2C1_SDA
O
O
SCT output 1.
O
SCT output 2.
O
SCT output 3.
O
SCT output 4.
O
SCT output 5.
I/O
I/O
I/O
I/O
I/O
I/O
I
I2C1-bus data input/output.
I2C1-bus clock input/output.
I2C2-bus data input/output.
I2C2-bus clock input/output.
I2C3-bus data input/output.
I2C3-bus clock input/output.
ADC external pin trigger input 0.
ADC external pin trigger input 1.
Analog comparator output.
Clock output.
I2C1_SCL
I2C2_SDA
I2C2_SCL
I2C3_SDA
I2C3_SCL
ADC_PINTRIG0
ADC_PINTRIG1
ACMP_O
I
O
CLKOUT
O
GPIO_INT_BMAT
O
Output of the pattern match engine.
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8. Functional description
8.1 ARM Cortex-M0+ core
The ARM Cortex-M0+ core runs at an operating frequency of up to 30 MHz using a
two-stage pipeline. The core revision is r0p1.
Integrated in the core are the NVIC and Serial Wire Debug with four breakpoints and two
watchpoints. The ARM Cortex-M0+ core supports a single-cycle I/O enabled port for fast
GPIO access.
The core includes a single-cycle multiplier and a system tick timer.
8.2 On-chip flash program memory
The LPC82x contain up to 32 KB of on-chip flash program memory. The flash memory
supports a 64 Byte page size with page write and erase.
8.3 On-chip SRAM
The LPC82x contain a total of 8 KB on-chip static RAM data memory in two separate
SRAM blocks with one combined clock for both SRAM blocks.
8.4 On-chip ROM
The on-chip ROM contains the bootloader and the following Application Programming
Interfaces (APIs):
• In-System Programming (ISP) and In-Application Programming (IAP) support for flash
including IAP erase page command.
• Power profiles for configuring power consumption and PLL settings
• 32-bit integer division routines
• APIs to use the following peripherals:
– SPI
– USART
– I2C
– ADC
8.5 Memory map
The LPC82x incorporates several distinct memory regions. Figure 6 shows the overall
map of the entire address space from the user program viewpoint following reset. The
interrupt vector area supports address remapping.
The ARM private peripheral bus includes the ARM core registers for controlling the NVIC,
the system tick timer (SysTick), and the reduced power modes.
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LPC82x
4 GB
0xFFFF FFFF
0xE010 0000
0xE000 0000
reserved
APB peripherals
0x4008 0000
private peripheral bus
reserved
30 - 31 reserved
0x4007 8000
0xA000 8000
I2C3
29
28
27
26
25
24
23
22
0x4007 4000
0x4007 0000
0x4006 C000
GPIO PINT
GPIO
0xA000 4000
0xA000 0000
I2C2
USART2
USART1
USART0
reserved
SPI1
0x4006 8000
0x4006 4000
reserved
0x4006 0000
0x4005 C000
0x5000 C000
0x5000 8000
0x5000 4000
0x5000 0000
DMA
SCTimer/PWM
CRC
SPI0
0x4005 8000
0x4005 4000
0x4005 0000
I2C1
I2C0
21
20
19
reserved
APB peripherals
reserved
reserved
0x4004 C000
0x4004 8000
0x4004 4000
0x4004 0000
system control (SYSCON)
IOCON
18
17
0x4008 0000
0x4000 0000
1 GB
flash controller
reserved
16
15
0x4003 C000
0x4003 8000
0x4003 4000
14
reserved
reserved
13
12
reserved
input mux
0x2000 0000
0x4003 0000
0x4002 C000
0x4002 8000
0.5 GB
11
10
9
reserved
DMA TRIGMUX
analog comparator
0x1FFF 3000
0x1FFF 0000
0x4002 4000
0x4002 0000
12 KB boot ROM
PMU
8
reserved
12-bit ADC
reserved
7
0x4001 C000
0x4001 8000
0x1400 1000
0x1400 0000
4 KB MTB registers
6
reserved
reserved
5
0x4001 4000
0x4001 0000
0x4000 C000
0x4000 8000
4
reserved
switch matrix
self wake-up timer
MRT
3
0x1001 2000
0x1000 1000
0x1000 0000
4 KB SRAM1
4 KB SRAM0
2
1
0
0x4000 4000
0x4000 0000
WWDT
reserved
0x0000 8000
0x0000 0000
0x0000 00C0
active interrupt vectors
32 KB on-chip flash
0x0000 0000
0 GB
aaa-015072
Fig 6. LPC82x Memory mapping
8.6 Nested Vectored Interrupt Controller (NVIC)
The Nested Vectored Interrupt Controller (NVIC) is part of the Cortex-M0+. The tight
coupling to the CPU allows for low interrupt latency and efficient processing of late arriving
interrupts.
8.6.1 Features
• Nested Vectored Interrupt Controller is a part of the ARM Cortex-M0+.
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• Tightly coupled interrupt controller provides low interrupt latency.
• Controls system exceptions and peripheral interrupts.
• Supports 32 vectored interrupts.
• In the LPC82x, the NVIC supports vectored interrupts for each of the peripherals and
the eight pin interrupts.
• Four programmable interrupt priority levels with hardware priority level masking.
• Software interrupt generation using the ARM exceptions SVCall and PendSV.
• Supports NMI.
8.6.2 Interrupt sources
Each peripheral device has at least one interrupt line connected to the NVIC but can have
several interrupt flags. Individual interrupt flags can also represent more than one interrupt
source.
8.7 System tick timer
The ARM Cortex-M0+ includes a 24-bit system tick timer (SysTick) that is intended to
generate a dedicated SysTick exception at a fixed time interval (typically 10 ms).
8.8 I/O configuration
The IOCON block controls the configuration of the I/O pins. Each digital or mixed
digital/analog pin with the PIO0_n designator (except the true open-drain pins PIO0_10
and PIO0_11) in Table 3 can be configured as follows:
• Enable or disable the weak internal pull-up and pull-down resistors.
• Select a pseudo open-drain mode. The input cannot be pulled up above VDD. The
pins are not 5 V tolerant when VDD is grounded.
• Program the input glitch filter with different filter constants using one of the IOCON
divided clock signals (IOCONCLKCDIV, see Figure 9 “LPC82x clock generation”).
You can also bypass the glitch filter.
• Invert the input signal.
• Hysteresis can be enabled or disabled.
• For pins PIO0_10 and PIO0_11, select the I2C-mode and output driver for standard
digital operation, for I2C standard and fast modes, or for I2C Fast mode+.
• The switch matrix setting enables the analog input mode on pins with analog and
digital functions. Enabling the analog mode disconnects the digital functionality.
Remark: The functionality of each I/O pin is flexible and is determined entirely through the
switch matrix. See Section 8.9 for details.
8.8.1 Standard I/O pad configuration
Figure 7 shows the possible pin modes for standard I/O pins with analog input function:
• Digital output driver with configurable open-drain output.
• Digital input: Weak pull-up resistor (PMOS device) enabled/disabled.
• Digital input: Weak pull-down resistor (NMOS device) enabled/disabled.
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• Digital input: Repeater mode enabled/disabled.
• Digital input: Programmable input digital filter selectable on all pins.
• Analog input: Selected through the switch matrix.
V
V
DD
DD
open-drain enable
output enable
strong
pull-up
ESD
data output
PIN
pin configured
as digital output
driver
strong
pull-down
ESD
V
SS
V
DD
weak
pull-up
pull-up enable
weak
pull-down
repeater mode
enable
pull-down enable
data input
PROGRAMMABLE
DIGITAL FILTER
pin configured
as digital input
select data
inverter
SWM PINENABLE for
analog input
analog input
pin configured
as analog input
aaa-014392
Fig 7. Standard I/O pad configuration
8.9 Switch Matrix (SWM)
The switch matrix controls the function of each digital or mixed analog/digital pin in a
highly flexible way by allowing to connect many functions like the USART, SPI, SCT, and
I2C functions to any pin that is not power or ground. These functions are called movable
functions and are listed in Table 4.
Functions that need specialized pads like the oscillator pins XTALIN and XTALOUT can
be enabled or disabled through the switch matrix. These functions are called fixed-pin
functions and cannot move to other pins. The fixed-pin functions are listed in Table 3. If a
fixed-pin function is disabled, any other movable function can be assigned to this pin.
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8.10 Fast General-Purpose parallel I/O (GPIO)
Device pins that are not connected to a specific peripheral function are controlled by the
GPIO registers. Pins may be dynamically configured as inputs or outputs. Multiple outputs
can be set or cleared in one write operation.
LPC82x use accelerated GPIO functions:
• GPIO registers are on the ARM Cortex-M0+ IO bus for fastest possible single-cycle
I/O timing, allowing GPIO toggling with rates of up to 15 MHz.
• An entire port value can be written in one instruction.
• Mask, set, and clear operations are supported for the entire port.
All GPIO port pins are fixed-pin functions that are enabled or disabled on the pins by the
switch matrix. Therefore each GPIO port pin is assigned to one specific pin and cannot be
moved to another pin. Except for pins SWDIO/PIO0_2, SWCLK/PIO0_3, and
RESET/PIO0_5, the switch matrix enables the GPIO port pin function by default.
8.10.1 Features
• Bit level port registers allow a single instruction to set and clear any number of bits in
one write operation.
• Direction control of individual bits.
• All I/O default to GPIO inputs with internal pull-up resistors enabled after reset -
except for the I2C-bus true open-drain pins PIO0_10 and PIO0_11.
• Pull-up/pull-down configuration, repeater, and open-drain modes can be programmed
through the IOCON block for each GPIO pin (see Figure 7).
• Direction (input/output) can be set and cleared individually.
• Pin direction bits can be toggled.
8.11 Pin interrupt/pattern match engine
The pin interrupt block configures up to eight pins from all digital pins for providing eight
external interrupts connected to the NVIC.
The pattern match engine can be used, with software, to create complex state machines
based on pin inputs.
Any digital pin, independently of the function selected through the switch matrix, can be
configured through the SYSCON block as input to the pin interrupt or pattern match
engine. The registers that control the pin interrupt or pattern match engine are on the IO+
bus for fast single-cycle access.
8.11.1 Features
• Pin interrupts
– Up to eight pins can be selected from all digital pins as edge- or level-sensitive
interrupt requests. Each request creates a separate interrupt in the NVIC.
– Edge-sensitive interrupt pins can interrupt on rising or falling edges or both.
– Level-sensitive interrupt pins can be HIGH- or LOW-active.
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– Pin interrupts can wake up the LPC82x from sleep mode, deep-sleep mode, and
power-down mode.
• Pin interrupt pattern match engine
– Up to eight pins can be selected from all digital pins to contribute to a boolean
expression. The boolean expression consists of specified levels and/or transitions
on various combinations of these pins.
– Each minterm (product term) comprising the specified boolean expression can
generate its own, dedicated interrupt request.
– Any occurrence of a pattern match can be also programmed to generate an RXEV
notification to the ARM CPU. The RXEV signal can be connected to a pin.
– The pattern match engine does not facilitate wake-up.
8.12 DMA controller
The DMA controller can access all memories and the USART, SPI, I2C, and ADC
peripherals using DMA requests or triggers. DMA transfers can also be triggered by
internal events like the ADC interrupts, the pin interrupts (PININT0 and PININT1), the
SCTimer DMA requests, and the DMA trigger outputs.
8.12.1 Features
• 18 channels with each channel connected to peripheral request inputs.
• DMA operations can be triggered by on-chip events or by two pin interrupts. Each
DMA channel can select one trigger input from 9 sources.
• Priority is user selectable for each channel.
• Continuous priority arbitration.
• Address cache with two entries.
• Efficient use of data bus.
• Supports single transfers up to 1,024 words.
• Address increment options allow packing and/or unpacking data.
8.12.2 DMA trigger input MUX (TRIGMUX)
Each DMA trigger is connected to a programmable multiplexer which connects the trigger
input to one of multiple trigger sources. Each multiplexer supports the same trigger
sources: the ADC sequence interrupts, the SCT DMA request lines, and pin interrupts
PININT0 and PININT1, and the outputs of the DMA triggers 0 and 1 for chaining DMA
triggers.
8.13 USART0/1/2
All USART functions are movable functions and are assigned to pins through the switch
matrix.
8.13.1 Features
• Maximum bit rates of 1.875 Mbit/s in asynchronous mode and 10 Mbit/s in
synchronous mode for USART functions connected to all digital pins except the
open-drain pins.
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• 7, 8, or 9 data bits and 1 or 2 stop bits
• Synchronous mode with master or slave operation. Includes data phase selection and
continuous clock option.
• Multiprocessor/multidrop (9-bit) mode with software address compare. (RS-485
possible with software address detection and transceiver direction control.)
• Parity generation and checking: odd, even, or none.
• One transmit and one receive data buffer.
• RTS/CTS for hardware signaling for automatic flow control. Software flow control can
be performed using Delta CTS detect, Transmit Disable control, and any GPIO as an
RTS output.
• Received data and status can optionally be read from a single register
• Break generation and detection.
• Receive data is 2 of 3 sample "voting". Status flag set when one sample differs.
• Built-in Baud Rate Generator.
• A fractional rate divider is shared among all UARTs.
• Interrupts available for Receiver Ready, Transmitter Ready, Receiver Idle, change in
receiver break detect, Framing error, Parity error, Overrun, Underrun, Delta CTS
detect, and receiver sample noise detected.
• Separate data and flow control loopback modes for testing.
• Baud rate clock can also be output in asynchronous mode.
• Supported by on-chip ROM API.
8.14 SPI0/1
All SPI functions are movable functions and are assigned to pins through the switch
matrix.
8.14.1 Features
• Maximum data rates of up to 30 Mbit/s in master mode and up to 18 Mbit/s in slave
mode for SPI functions connected to all digital pins except the open-drain pins.
• Data frames of 1 to 16 bits supported directly. Larger frames supported by software.
• Master and slave operation.
• Data can be transmitted to a slave without the need to read incoming data, which can
be useful while setting up an SPI memory.
• Control information can optionally be written along with data, which allows very
versatile operation, including “any length” frames.
• One Slave Select input/output with selectable polarity and flexible usage.
Remark: Texas Instruments SSI and National Microwire modes are not supported.
8.15 I2C-bus interface (I2C0/1/2/3)
The I2C-bus is bidirectional for inter-IC control using only two wires: a serial clock line
(SCL) and a serial data line (SDA). Each device is recognized by a unique address and
can operate as either a receiver-only device (e.g., an LCD driver) or a transmitter with the
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capability to both receive and send information (such as memory). Transmitters and/or
receivers can operate in either master or slave mode, depending on whether the chip has
to initiate a data transfer or is only addressed. The I2C is a multi-master bus and can be
controlled by more than one bus master.
The I2C0-bus functions are fixed-pin functions. All other I2C-bus functions for I2C1/2/3
are movable functions and can be assigned through the switch matrix to any pin.
However, only the true open-drain pins provide the electrical characteristics to support the
full I2C-bus specification (see Ref. 3).
8.15.1 Features
• I2C0 supports Fast-mode Plus with data rates of up to 1 Mbit/s in addition to standard
and fast modes on two true open-drain pins.
• True open-drain pins provide fail-safe operation: When the power to an I2C-bus
device is switched off, the SDA and SCL pins connected to the I2C0-bus are floating
and do not disturb the bus.
• I2C1/2/3 support standard and fast mode with data rates of up to 400 kbit/s.
• Independent Master, Slave, and Monitor functions.
• Supports both Multi-master and Multi-master with Slave functions.
• Multiple I2C slave addresses supported in hardware.
• One slave address can be selectively qualified with a bit mask or an address range in
order to respond to multiple I2C bus addresses.
• 10-bit addressing supported with software assist.
• Supports SMBus.
8.16 SCTimer/PWM
The state configurable timer can perform basic 16-bit and 32-bit timer/counter functions
with match outputs and external and internal capture inputs. In addition, the
SCTimer/PWM can employ up to eight different programmable states, which can change
under the control of events, to provide complex timing patterns.
The inputs to the SCT are multiplexed between movable functions from the switch matrix
and internal connections such as the ADC threshold compare interrupt, the comparator
output, and the ARM core signals ARM_TXEV and DEBUG_HALTED. The signal on each
SCT input is selected through the INPUT MUX.
All outputs of the SCT are movable functions and are assigned to pins through the switch
matrix. One SCT output can also be selected as one of the ADC conversion triggers.
8.16.1 Features
• Each SCTimer/PWM supports:
– Eight match/capture registers.
– Eight events.
– Eight states.
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– Four inputs. Each input is configurable through an input multiplexer to use one of
four external pins (connected through the switch matrix) or one of four internal
sources. The maximum input signal frequency is 25 MHz.
– Six outputs. Connected to pins through the switch matrix.
• Counter/timer features:
– Each SCTimer is configurable as two 16-bit counters or one 32-bit counter.
– Counters can be clocked by the system clock or selected input.
– Configurable as up counters or up-down counters.
– Configurable number of match and capture registers. Up to eight match and
capture registers total.
– Upon match create the following events: interrupt; stop, limit, halt the timer or
change counting direction; toggle outputs.
– Counter value can be loaded into capture register triggered by a match or
input/output toggle.
• PWM features:
– Counters can be used with match registers to toggle outputs and create
time-proportioned PWM signals.
– Up to six single-edge or dual-edge PWM outputs with independent duty cycle and
common PWM cycle length.
• Event creation features:
– The following conditions define an event: a counter match condition, an input (or
output) condition such as a rising or falling edge or level, a combination of match
and/or input/output condition.
– Selected events can limit, halt, start, or stop a counter or change its direction.
– Events trigger state changes, output toggles, interrupts, and DMA transactions.
– Match register 0 can be used as an automatic limit.
– In bidirectional mode, events can be enabled based on the count direction.
– Match events can be held until another qualifying event occurs.
• State control features:
– A state is defined by events that can happen in the state while the counter is
running.
– A state changes into another state as a result of an event.
– Each event can be assigned to one or more states.
– State variable allows sequencing across multiple counter cycles.
• One SCTimer match output can be selected as ADC hardware trigger input.
8.16.2 SCTimer/PWM input MUX (INPUT MUX)
Each input of the SCTimer/PWM is connected to a programmable multiplexer which
allows to connect one of multiple internal or external sources to the input. The available
sources are the same for each SCTimer/PWM input and can be selected from four pins
configured through the switch matrix, the ADC threshold compare interrupt, the
comparator output, and the ARM core signals ARM_TXEV and DEBUG_HALTED.
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8.17 Multi-Rate Timer (MRT)
The Multi-Rate Timer (MRT) provides a repetitive interrupt timer with four channels. Each
channel can be programmed with an independent time interval, and each channel
operates independently from the other channels.
8.17.1 Features
• 31-bit interrupt timer
• Four channels independently counting down from individually set values
• Bus stall, repeat and one-shot interrupt modes
8.18 Windowed WatchDog Timer (WWDT)
The watchdog timer resets the controller if software fails to service the watchdog timer
periodically within a programmable time window.
8.18.1 Features
• Internally resets chip if not periodically reloaded during the programmable time-out
period.
• Optional windowed operation requires reload to occur between a minimum and
maximum time period, both programmable.
• Optional warning interrupt can be generated at a programmable time prior to
watchdog time-out.
• Enabled by software but requires a hardware reset or a watchdog reset/interrupt to be
disabled.
• Incorrect feed sequence causes reset or interrupt if enabled.
• Flag to indicate watchdog reset.
• Programmable 24-bit timer with internal prescaler.
• Selectable time period from (Tcy(WDCLK) 256 4) to (Tcy(WDCLK) 224 4) in
multiples of Tcy(WDCLK) 4.
• The WatchDog Clock (WDCLK) is generated by the dedicated watchdog oscillator
(WDOSC).
8.19 Self-Wake-up Timer (WKT)
The self-wake-up timer is a 32-bit, loadable down counter. Writing any non-zero value to
this timer automatically enables the counter and launches a count-down sequence. When
the counter is used as a wake-up timer, this write can occur prior to entering a reduced
power mode.
8.19.1 Features
• 32-bit loadable down counter. Counter starts automatically when a count value is
loaded. Time-out generates an interrupt/wake up request.
• The WKT resides in a separate, always-on power domain.
• The WKT supports three clock sources: an external clock on the WKTCLKIN pin, the
low-power oscillator, and the IRC. The low-power oscillator is located in the always-on
power domain, so it can be used as the clock source in Deep power-down mode.
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• The WKT can be used for waking up the part from any reduced power mode,
including Deep power-down mode, or for general-purpose timing.
8.20 Analog comparator (ACMP)
The analog comparator with selectable hysteresis can compare voltage levels on external
pins and internal voltages.
After power-up and after switching the input channels of the comparator, the output of the
voltage ladder must be allowed to settle to its stable value before it can be used as a
comparator reference input. Settling times are given in Table 25.
The analog comparator output is a movable function and is assigned to a pin through the
switch matrix. The comparator inputs and the voltage reference are enabled through the
switch matrix.
COMPARATOR ANALOG BLOCK
COMPARATOR DIGITAL BLOCK
V
DD
VDDCMP
4
32
comparator
level ACMP_O,
ADC trigger
sync
edge detect
comparator
edge NVIC
ADC_0
internal
voltage
reference
4
ACMP_I[4:1]
aaa-012135
Fig 8. Comparator block diagram
8.20.1 Features
• Selectable 0 mV, 10 mV ( 5 mV), and 20 mV ( 10 mV), 40 mV ( 20 mV) input
hysteresis.
• Two selectable external voltages (VDD or VDDCMP on pin PIO0_6); fully configurable
on either positive or negative input channel.
• Internal voltage reference from band gap selectable on either positive or negative
input channel.
• 32-stage voltage ladder with the internal reference voltage selectable on either the
positive or the negative input channel.
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• Voltage ladder source voltage is selectable from an external pin or the main 3.3 V
supply voltage rail.
• Voltage ladder can be separately powered down for applications only requiring the
comparator function.
• Interrupt output is connected to NVIC.
• Comparator level output is connected to output pin ACMP_O.
• One comparator output is internally collected to the ADC trigger input multiplexer.
8.21 Analog-to-Digital Converter (ADC)
The ADC supports a resolution of 12 bit and fast conversion rates of up to
1.2 MSamples/s. Sequences of analog-to-digital conversions can be triggered by multiple
sources. Possible trigger sources are the pin triggers, the SCT output SCT_OUT3, the
analog comparator output, and the ARM TXEV.
The ADC includes a hardware threshold compare function with zero-crossing detection.
Remark: For best performance, select VREFP and VREFN at the same voltage levels as
V
DD and VSS. When selecting VREFP and VREFN different from VDD and VSS, ensure
that the voltage midpoints are the same:
(VREFP-VREFN)/2 + VREFN = VDD/2
8.21.1 Features
• 12-bit successive approximation analog to digital converter.
• 12-bit conversion rate of up to 1.2 MSamples/s.
• Two configurable conversion sequences with independent triggers.
• Optional automatic high/low threshold comparison and zero-crossing detection.
• Power-down mode and low-power operating mode.
• Measurement range VREFN to VREFP (not to exceed VDD voltage level).
• Burst conversion mode for single or multiple inputs.
• Hardware calibration mode.
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8.22 Clocking and power control
SYSCON
AHB clock 0
(core, system;
main clock
system clock
always-on)
CLOCK DIVIDER
SYSAHBCLKDIV
29
memories
and peripherals,
peripheral clocks
SYSAHBCLKCTRL[1:29]
(system clock enable)
USART0
USART1
USART2
FRACTIONAL RATE
GENERATOR
CLOCK DIVIDER
UARTCLKDIV
IRC oscillator
7
IOCON
glitch filter
CLOCK DIVIDER
IOCONCLKDIV
watchdog oscillator
MAINCLKSEL
(main clock select)
IRC oscillator
IRC oscillator
system oscillator
watchdog oscillator
CLOCK DIVIDER
CLKOUTDIV
CLKOUT pin
XTALIN
XTALOUT
SYSTEM
OSCILLATOR
SYSTEM PLL
CLKIN
CLKOUTSEL
(CLKOUT clock select)
SYSPLLCLKSEL
system PLL clock select
WWDT
WKT
watchdog oscillator
IRC oscillator
PMU
WKT
low-power oscillator
aaa-012136
Fig 9. LPC82x clock generation
8.22.1 Crystal and internal oscillators
The LPC82x include four independent oscillators:
1. The crystal oscillator (SysOsc) operating at frequencies between 1 MHz and 25 MHz.
2. The internal RC Oscillator (IRC) with a fixed frequency of 12 MHz.
3. The internal low-power, low-frequency Oscillator with a nominal frequency of 10 kHz
with 40% accuracy for use with the self-wake-up timer.
4. The dedicated Watchdog Oscillator (WDOsc) with a programmable nominal
frequency between 9.4 kHz and 2.3 MHz with 40% accuracy.
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32-bit ARM Cortex-M0+ microcontroller
Each oscillator, except the low-frequency oscillator, can be used for more than one
purpose as required in a particular application.
Following reset, the LPC82x operates from the IRC until switched by software allowing the
part to run without any external crystal and the bootloader code to operate at a known
frequency.
See Figure 9 for an overview of the LPC82x clock generation.
8.22.1.1 Internal RC Oscillator (IRC)
The IRC may be used as the clock source for the WWDT, and/or as the clock that drives
the PLL and then the CPU. The nominal IRC frequency is 12 MHz. The IRC is trimmed to
1.5 % accuracy over the entire voltage and temperature range.
The IRC can be used as a clock source for the CPU with or without using the PLL. The
IRC frequency can be boosted to a higher frequency, up to the maximum CPU operating
frequency, by the system PLL.
Upon power-up or any chip reset, the LPC82x use the IRC as the clock source. Software
may later switch to one of the other available clock sources.
8.22.1.2 Crystal Oscillator (SysOsc)
The crystal oscillator can be used as the clock source for the CPU, with or without using
the PLL.
The SysOsc operates at frequencies of 1 MHz to 25 MHz. This frequency can be boosted
to a higher frequency, up to the maximum CPU operating frequency, by the system PLL.
8.22.1.3 Internal Low-power Oscillator and Watchdog Oscillator (WDOsc)
The nominal frequency of the WDOsc is programmable between 9.4 kHz and 2.3 MHz.
The frequency spread over silicon process variations is 40%.
The WDOsc is a dedicated oscillator for the windowed WWDT.
The internal low-power 10 kHz ( 40% accuracy) oscillator serves as the clock input to the
WKT. This oscillator can be configured to run in all low-power modes.
8.22.2 Clock input
An external clock source can be supplied on the selected CLKIN pin directly to the PLL
input. When selecting a clock signal for the CLKIN pin, follow the specifications for digital
I/O pins in Table 8 “Static characteristics, supply pins” and Table 16 “Dynamic
characteristics: I/O pins[1]”.
An 1.8 V external clock source can be supplied on the XTALIN pins to the system
oscillator limiting the voltage of this signal (see Section 14.1).
The maximum frequency for both clock signals is 25 MHz.
8.22.3 System PLL
The PLL accepts an input clock frequency in the range of 10 MHz to 25 MHz. The input
frequency is multiplied up to a high frequency with a Current Controlled Oscillator (CCO).
The multiplier can be an integer value from 1 to 32. The CCO operates in the range of
156 MHz to 320 MHz, so there is an additional divider in the loop to keep the CCO within
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its frequency range while the PLL is providing the desired output frequency. The output
divider may be set to divide by 2, 4, 8, or 16 to produce the output clock. Since the
minimum output divider value is 2, it is insured that the PLL output has a 50 % duty cycle.
The PLL is turned off and bypassed following a chip reset and may be enabled by
software. The program must configure and activate the PLL, wait for the PLL to lock, and
then connect to the PLL as a clock source. The PLL settling time is nominally 100 s.
8.22.4 Clock output
The LPC82x features a clock output function that routes the IRC, the SysOsc, the
watchdog oscillator, or the main clock to the CLKOUT function. The CLKOUT function can
be connected to any digital pin through the switch matrix.
8.22.5 Wake-up process
The LPC82x begin operation at power-up by using the IRC as the clock source allowing
chip operation to resume quickly. If the SysOsc, the external clock source, or the PLL are
needed by the application, software must enable these features and wait for them to
stabilize before they are used as a clock source.
8.22.6 Power control
The LPC82x supports the ARM Cortex-M0 Sleep mode. The CPU clock rate may also be
controlled as needed by changing clock sources, reconfiguring PLL values, and/or altering
the CPU clock divider value. This allows a trade-off of power versus processing speed
based on application requirements. In addition, a register is provided for shutting down the
clocks to individual on-chip peripherals, allowing to fine-tune power consumption by
eliminating all dynamic power use in any peripherals that are not required for the
application. Selected peripherals have their own clock divider which provides even better
power control.
8.22.6.1 Power profiles
The power consumption in Active and Sleep modes can be optimized for the application
through simple calls to the power profile API. The API is accessible through the on-chip
ROM.
The power configuration routine configures the LPC82x for one of the following power
modes:
• Default mode corresponding to power configuration after reset.
• CPU performance mode corresponding to optimized processing capability.
• Efficiency mode corresponding to optimized balance of current consumption and CPU
performance.
• Low-current mode corresponding to lowest power consumption.
In addition, the power profile includes routines to select the optimal PLL settings for a
given system clock and PLL input clock.
8.22.6.2 Sleep mode
When Sleep mode is entered, the clock to the core is stopped. Resumption from the Sleep
mode does not need any special sequence but re-enabling the clock to the ARM core.
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32-bit ARM Cortex-M0+ microcontroller
In Sleep mode, execution of instructions is suspended until either a reset or interrupt
occurs. Peripheral functions continue operation during Sleep mode and may generate
interrupts to cause the processor to resume execution. Sleep mode eliminates dynamic
power used by the processor itself, memory systems and related controllers, and internal
buses.
8.22.6.3 Deep-sleep mode
In Deep-sleep mode, the LPC82x core is in Sleep mode and all peripheral clocks and all
clock sources are off except for the IRC and watchdog oscillator or low-power oscillator if
selected. The IRC output is disabled. In addition, all analog blocks are shut down and the
flash is in standby mode. In Deep-sleep mode, the application can keep the watchdog
oscillator and the BOD circuit running for self-timed wake-up and BOD protection.
The LPC82x can wake up from Deep-sleep mode via a reset, digital pins selected as
inputs to the pin interrupt block, a watchdog timer interrupt, or an interrupt from the
USART (if the USART is configured in synchronous slave mode), the SPI, or the I2C
blocks (in slave mode).
Any interrupt used for waking up from Deep-sleep mode must be enabled in one of the
SYSCON wake-up enable registers and the NVIC.
Deep-sleep mode saves power and allows for short wake-up times.
8.22.6.4 Power-down mode
In Power-down mode, the LPC82x is in Sleep mode and all peripheral clocks and all clock
sources are off except for watchdog oscillator or low-power oscillator if selected. In
addition, all analog blocks and the flash are shut down. In Power-down mode, the
application can keep the watchdog oscillator and the BOD circuit running for self-timed
wake-up and BOD protection.
The LPC82x can wake up from Power-down mode via a reset, digital pins selected as
inputs to the pin interrupt block, a watchdog timer interrupt, or an interrupt from the
USART (if the USART is configured in synchronous slave mode), the SPI, or the I2C
blocks (in slave mode).
Any interrupt used for waking up from Power-down mode must be enabled in one of the
SYSCON wake-up enable registers and the NVIC.
Power-down mode reduces power consumption compared to Deep-sleep mode at the
expense of longer wake-up times.
8.22.6.5 Deep power-down mode
In Deep power-down mode, power is shut off to the entire chip except for the WAKEUP
pin and the self-wake-up timer if enabled. Four general-purpose registers are available to
store information during Deep power-down mode. The LPC82x can wake up from Deep
power-down mode via the WAKEUP pin, or without an external signal by using the
time-out of the self-wake-up timer (see Section 8.19).
The LPC82x can be prevented from entering Deep power-down mode by setting a lock bit
in the PMU block. Locking out Deep power-down mode enables the application to keep
the watchdog timer or the BOD running at all times.
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When entering Deep power-down mode, an external pull-up resistor is required on the
WAKEUP pin to hold it HIGH. Pull the RESET pin HIGH to prevent it from floating while in
Deep power-down mode.
8.23 System control
8.23.1 Reset
Reset has four sources on the LPC82x: the RESET pin, the Watchdog reset, power-on
reset (POR), and the BrownOut Detection (BOD) circuit. The RESET pin is a Schmitt
trigger input pin. Assertion of chip reset by any source, once the operating voltage attains
a usable level, starts the IRC and initializes the flash controller.
A LOW-going pulse as short as 50 ns resets the part.
When the internal Reset is removed, the processor begins executing at address 0, which
is initially the Reset vector mapped from the boot block. At that point, all of the processor
and peripheral registers have been initialized to predetermined values.
In Deep power-down mode, an external pull-up resistor is required on the RESET pin.
V
DD
V
DD
V
DD
R
pu
ESD
20 ns RC
GLITCH FILTER
reset
PIN
ESD
V
SS
aaa-004613
Fig 10. Reset pad configuration
8.23.2 Brownout detection
The LPC82x includes up to four levels for monitoring the voltage on the VDD pin. If this
voltage falls below one of the selected levels, the BOD asserts an interrupt signal to the
NVIC. This signal can be enabled for interrupt in the Interrupt Enable Register in the NVIC
to cause a CPU interrupt. Alternatively, software can monitor the signal by reading a
dedicated status register. Four threshold levels can be selected to cause a forced reset of
the chip.
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8.23.3 Code security (Code Read Protection - CRP)
CRP provides different levels of security in the system so that access to the on-chip flash
and use of the Serial Wire Debugger (SWD) and In-System Programming (ISP) can be
restricted. Programming a specific pattern into a dedicated flash location invokes CRP.
IAP commands are not affected by the CRP.
In addition, ISP entry via the ISP entry pin can be disabled without enabling CRP. For
details, see the LPC82x user manual.
There are three levels of Code Read Protection:
1. CRP1 disables access to the chip via the SWD and allows partial flash update
(excluding flash sector 0) using a limited set of the ISP commands. This mode is
useful when CRP is required and flash field updates are needed but all sectors cannot
be erased.
2. CRP2 disables access to the chip via the SWD and only allows full flash erase and
update using a reduced set of the ISP commands.
3. Running an application with level CRP3 selected, fully disables any access to the chip
via the SWD pins and the ISP. This mode effectively disables ISP override using the
ISP entry pin as well. If necessary, the application must provide a flash update
mechanism using IAP calls or using a call to the reinvoke ISP command to enable
flash update via the USART.
CAUTION
If level three Code Read Protection (CRP3) is selected, no future factory testing can be
performed on the device.
In addition to the three CRP levels, sampling of the ISP entry pin for valid user code can
be disabled. For details, see the LPC82x user manual.
8.23.4 APB interface
The APB peripherals are located on one APB bus.
8.23.5 AHBLite
The AHBLite connects the CPU bus of the ARM Cortex-M0+ to the flash memory, the
main static RAM, the CRC, the DMA, the ROM, and the APB peripherals.
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8.24 Emulation and debugging
Debug functions are integrated into the ARM Cortex-M0+. Serial wire debug functions are
supported in addition to a standard JTAG boundary scan. The ARM Cortex-M0+ is
configured to support up to four breakpoints and two watch points.
The Micro Trace Buffer is implemented on the LPC82x.
The RESET pin selects between the JTAG boundary scan (RESET = LOW) and the ARM
SWD debug (RESET = HIGH). The ARM SWD debug port is disabled while the LPC82x is
in reset. The JTAG boundary scan pins are selected by hardware when the part is in
boundary scan mode on pins PIO0_0 to PIO0_3 (see Table 3).
To perform boundary scan testing, follow these steps:
1. Erase any user code residing in flash.
2. Power up the part with the RESET pin pulled HIGH externally.
3. Wait for at least 250 s.
4. Pull the RESET pin LOW externally.
5. Perform boundary scan operations.
6. Once the boundary scan operations are completed, assert the TRST pin to enable the
SWD debug mode, and release the RESET pin (pull HIGH).
Remark: The JTAG interface cannot be used for debug purposes.
V
DD
3.3 V
LPC82x
~10 kΩ -
100 kΩ
VTREF
SWDIO
SWCLK
nRESET
GND
SWDIO
SWCLK
from SWD
connector
RESET
~10 kΩ -
100 kΩ
DGND
PIO0_12
ISP entry
aaa-015075
Fig 11. Connecting the SWD pins to a standard SWD connector
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9. Limiting values
Table 5.
Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).[1]
Symbol Parameter
Conditions
Min
Max
Unit
[2]
VDD
supply voltage (core and external
0.5
+4.6
V
rail)
Vref
VI
reference voltage
input voltage
on pin VREFP
0.5
0.5
VDD
V
V
[3][4]
[5]
5 V tolerant I/O pins; VDD
1.8 V
+5.5
on I2C open-drain pins
PIO0_10, PIO0_11
0.5
+5.5
V
[6]
3 V tolerant I/O pin PIO0_6
0.5
0.5
+3.6
+4.6
V
V
[7][8]
[9]
VIA
analog input voltage
[2]
Vi(xtal)
IDD
crystal input voltage
supply current
0.5
+2.5
100
100
100
V
per supply pin
-
-
-
mA
mA
mA
ISS
ground current
per ground pin
Ilatch
I/O latch-up current
(0.5VDD) < VI < (1.5VDD);
Tj < 125 C
[10]
[11]
Tstg
storage temperature
65
+150
150
1.5
C
C
W
Tj(max)
maximum junction temperature
-
-
Ptot(pack) total power dissipation (per
package)
based on package heat
transfer, not device power
consumption
Vesd
electrostatic discharge voltage
human body model; all pins
-
-
3500
1200
V
V
charged device model;
HVQFN33 package
[1] The following applies to the limiting values:
a) This product includes circuitry specifically designed for the protection of its internal devices from the damaging effects of excessive
static charge. Nonetheless, it is suggested that conventional precautions be taken to avoid applying greater than the rated
maximum.
b) Parameters are valid over operating temperature range unless otherwise specified. All voltages are with respect to VSS unless
otherwise noted.
[2] Maximum/minimum voltage above the maximum operating voltage (see Table 7) and below ground that can be applied for a short time
(< 10 ms) to a device without leading to irrecoverable failure. Failure includes the loss of reliability and shorter lifetime of the device.
[3] Applies to all 5 V tolerant I/O pins except true open-drain pins PIO0_10 and PIO0_11 and except the 3 V tolerant pin PIO0_6.
[4] Including the voltage on outputs in 3-state mode.
[5] VDD present or not present. Compliant with the I2C-bus standard. 5.5 V can be applied to this pin when VDD is powered down.
[6] VDD present or not present.
[7] An ADC input voltage above 3.6 V can be applied for a short time without leading to immediate, unrecoverable failure. Accumulated
exposure to elevated voltages at 4.6 V must be less than 106 s total over the lifetime of the device. Applying an elevated voltage to the
ADC inputs for a long time affects the reliability of the device and reduces its lifetime.
[8] If the comparator is configured with the common mode input VIC = VDD, the other comparator input can be up to 0.2 V above or below
VDD without affecting the hysteresis range of the comparator function.
[9] It is recommended to connect an overvoltage protection diode between the analog input pin and the voltage supply pin.
[10] Dependent on package type.
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[11] Human body model: equivalent to discharging a 100 pF capacitor through a 1.5 k series resistor.
10. Thermal characteristics
The average chip junction temperature, Tj (C), can be calculated using the following
equation:
T j = Tamb + PD Rth j – a
(1)
• Tamb = ambient temperature (C),
• Rth(j-a) = the package junction-to-ambient thermal resistance (C/W)
• PD = sum of internal and I/O power dissipation
The internal power dissipation is the product of IDD and VDD. The I/O power dissipation of
the I/O pins is often small and many times can be negligible. However it can be significant
in some applications.
Table 6.
Symbol
Thermal resistance
Parameter
Conditions
Max/min
Unit
HVQFN33 package
Rth(j-a) thermal resistance from
JEDEC (4.5 in 4 in); still air 40 +/- 15 % C/W
junction-to-ambient
single-layer (4.5 in 3 in); still 114 +/- 15 % C/W
air
Rth(j-c)
thermal resistance from
junction-to-case
18 +/- 15 % C/W
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11. Static characteristics
11.1 General operating conditions
Table 7.
General operating conditions
Tamb = −40 °C to +105 °C, unless otherwise specified.
Symbol
fclk
Parameter
Conditions
Min
-
Typ[1]
-
Max
30
Unit
MHz
V
clock frequency
internal CPU/system clock
VDD
supply voltage (core
and external rail)
1.8
3.3
3.6
Vref
reference voltage
on pin VREFP
2.4
-
VDD
V
Oscillator pins
Vi(xtal)
crystal input voltage
crystal output voltage
on pin XTALIN
0.5
0.5
1.8
1.8
1.95
1.95
V
V
Vo(xtal)
on pin XTALOUT
Pin capacitance
Cio input/output
capacitance
[2]
[2]
[2]
pins with analog and digital
functions
I2C-bus pins (PIO0_10 and
PIO0_11)
-
-
-
-
-
-
7.1
2.5
2.8
pF
pF
pF
pins with digital functions only
[1] Typical ratings are not guaranteed. The values listed are for room temperature (25 C), nominal supply voltages.
[2] Including bonding pad capacitance. Based on simulation, not tested in production.
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11.2 Supply pins
Table 8.
Static characteristics, supply pins
Tamb = −40 °C to +105 °C, unless otherwise specified.
Symbol
Parameter
Conditions
Min
Typ[1]
Max
Unit
IDD
supply current
Active mode; code
while(1){}
executed from flash;
[2][3][4]
[6][7]
system clock = 12 MHz; default
mode; VDD = 3.3 V
-
-
-
-
1.85
1.04
3.95
3.2
-
-
-
-
mA
mA
mA
mA
[2][3][4]
[6][7]
system clock = 12 MHz;
low-current mode; VDD = 3.3 V
[2][3][6]
[7][9]
system clock = 30 MHz; default
mode; VDD = 3.3 V
[2][3][6]
[7][9]
system clock = 30 MHz;
low-current mode; VDD = 3.3 V
Sleep mode
[2][3][4]
[6][7]
system clock = 12 MHz; default
mode; VDD = 3.3 V
-
-
-
-
-
1.35
0.8
-
-
-
-
mA
mA
mA
mA
[2][3][4]
[6][7]
system clock = 12 MHz;
low-current mode; VDD = 3.3 V
[2][3][9]
[6][7]
system clock = 30 MHz; default
mode; VDD = 3.3 V
2.55
2.1
[2][3][9]
[6][7]
system clock = 30 MHz;
low-current mode; VDD = 3.3 V
[2][3][10]
[2][3][10]
[2][11]
IDD
IDD
IDD
supply current
supply current
supply current
Deep-sleep mode;
DD = 3.3 V;
V
Tamb = 25 C
Tamb = 105 C
158
-
300
400
A
A
-
-
Power-down mode;
DD = 3.3 V
V
Tamb = 25 C
Tamb = 105 C
1.6
-
10
50
A
A
-
Deep power-down mode; VDD
=
3.3 V; 10 kHz low-power oscillator
and self-wake-up timer (WKT)
disabled
T
amb = 25 C
-
-
0.2
-
1
4
A
A
Tamb = 105 C
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Table 8.
Static characteristics, supply pins …continued
Tamb = −40 °C to +105 °C, unless otherwise specified.
Symbol
Parameter
Conditions
Min
Typ[1]
Max
Unit
IDD
supply current
Deep power-down mode; VDD
=
-
1.1
-
A
3.3 V; 10 kHz low-power oscillator
and self-wake-up timer (WKT)
enabled
Deep power-down mode; VDD
3.3 V; external clock input
WKTCLKIN @ 10 kHz with
self-wake-up timer enabled
=
=
-
-
0.4
0.7
-
-
A
A
Deep power-down mode; VDD
3.3 V; external clock input
WKTCLKIN @ 32 kHz with
self-wake-up timer enabled
[1] Typical ratings are not guaranteed. The values listed are for room temperature (25 C), nominal supply voltages.
[2] Tamb = 25 C.
[3] IDD measurements were performed with all pins configured as GPIO outputs driven LOW and pull-up resistors disabled.
[4] IRC enabled; system oscillator disabled; system PLL disabled.
[5] System oscillator enabled; IRC disabled; system PLL disabled.
[6] BOD disabled.
[7] All peripherals disabled in the SYSAHBCLKCTRL register. Peripheral clocks to USART, CLKOUT, and IOCON disabled in system
configuration block.
[8] IRC enabled; system oscillator disabled; system PLL enabled.
[9] IRC disabled; system oscillator enabled; system PLL enabled.
[10] All oscillators and analog blocks turned off.
[11] WAKEUP pin pulled HIGH externally.
LPC82x
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32-bit ARM Cortex-M0+ microcontroller
11.3 Electrical pin characteristics
Table 9.
Static characteristics, electrical pin characteristics
Tamb = −40 °C to +105 °C, unless otherwise specified.
Symbol Parameter Conditions
Standard port pins configured as digital pins, RESET
Min
Typ[1]
Max
Unit
IIL
LOW-level input current VI = 0 V; on-chip pull-up resistor
disabled
-
0.5
0.5
0.5
-
10[2]
10[2]
10[2]
5
nA
nA
nA
V
IIH
IOZ
VI
HIGH-level input
current
VI = VDD; on-chip pull-down resistor
disabled
-
OFF-state output
current
VO = 0 V; VO = VDD; on-chip
pull-up/down resistors disabled
-
[4]
[6]
input voltage
VDD 1.8 V; 5 V tolerant pins
0
except PIO0_6
VDD = 0 V
0
-
-
-
3.6
VDD
-
V
V
V
VO
output voltage
output active
0
VIH
HIGH-level input
voltage
0.7VDD
VIL
LOW-level input voltage
hysteresis voltage
-
-
-
0.3VDD
V
Vhys
VOH
0.4
-
V
HIGH-level output
voltage
IOH = 4 mA; 2.5 V <= VDD <= 3.6 V
IOH = 3 mA; 1.8 V <= VDD < 2.5 V
IOL = 4 mA; 2.5 V <= VDD <= 3.6 V
IOL = 3 mA; 1.8 V <= VDD < 2.5 V
VOH = VDD 0.4 V;
VDD 0.4 -
VDD 0.4 -
-
V
-
V
VOL
LOW-level output
voltage
-
-
-
-
0.4
0.4
-
V
-
V
IOH
HIGH-level output
current
4
mA
2.5 V VDD 3.6 V
1.8 V VDD < 2.5 V
3
4
-
-
-
-
mA
mA
IOL
LOW-level output
current
VOL = 0.4 V
2.5 V VDD 3.6 V
1.8 V VDD < 2.5 V
3
-
-
-
-
mA
mA
[7]
[7]
IOHS
IOLS
HIGH-level short-circuit VOH = 0 V
output current
45
LOW-level short-circuit VOL = VDD
output current
-
-
50
mA
Ipd
Ipu
pull-down current
pull-up current
VI = 5 V
VI = 0 V;
10
50
150
A
2.0 V VDD 3.6 V
15
10
0
50
50
0
85
85
0
A
A
1.8 V VDD < 2.0 V
VDD < VI < 5 V
High-drive output pin configured as digital pin (PIO0_2, PIO0_3, PIO0_12, PIO0_16)
IIL
LOW-level input current VI = 0 V; on-chip pull-up resistor
disabled
-
-
-
0.5
0.5
0.5
10[2]
10[2]
10[2]
nA
nA
nA
IIH
IOZ
HIGH-level input
current
VI = VDD; on-chip pull-down resistor
disabled
OFF-state output
current
VO = 0 V; VO = VDD; on-chip
pull-up/down resistors disabled
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NXP Semiconductors
32-bit ARM Cortex-M0+ microcontroller
Table 9.
Static characteristics, electrical pin characteristics …continued
Tamb = −40 °C to +105 °C, unless otherwise specified.
Symbol
Parameter
Conditions
Min
Typ[1]
Max
Unit
[4]
[6]
VI
input voltage
VDD 1.8 V
0
-
5.0
V
VDD = 0 V
0
-
-
-
3.6
VDD
-
V
V
V
VO
output voltage
output active
0
VIH
HIGH-level input
voltage
0.7VDD
VIL
LOW-level input voltage
hysteresis voltage
-
-
-
0.3VDD
V
V
V
V
V
Vhys
VOH
0.4
-
HIGH-level output
voltage
IOH = 20 mA; 2.5 V <= VDD < 3.6 V
IOH = 12 mA; 1.8 V <= VDD < 2.5 V
IOL = 4 mA
VDD 0.4 -
VDD 0.4 -
-
-
VOL
IOH
LOW-level output
voltage
-
-
-
-
-
0.4
HIGH-level output
current
VOH = VDD 0.4 V;
2.5 V <= VDD < 3.6 V
20
12
4
-
-
-
mA
mA
mA
VOH = VDD 0.4 V;
1.8 V <= VDD < 2.5 V
IOL
LOW-level output
current
VOL = 0.4 V
2.5 V VDD 3.6 V
1.8 V VDD < 2.5 V
3
-
-
-
-
mA
mA
[7]
IOLS
LOW-level short-circuit VOL = VDD
output current
50
[8]
[8]
Ipd
Ipu
pull-down current
pull-up current
VI = 5 V
10
10
0
50
50
0
150
85
0
A
A
A
VI = 0 V
VDD < VI < 5 V
I2C-bus pins (PIO0_10 and PIO0_11)
VIH
HIGH-level input
voltage
0.7VDD
-
-
V
VIL
LOW-level input voltage
hysteresis voltage
-
-
-
0.3VDD
-
V
V
Vhys
IOL
0.05VDD
LOW-level output
current
VOL = 0.4 V; I2C-bus pins
configured as standard mode pins
2.5 V <= VDD < 3.6 V
3.5
3
-
-
-
-
mA
mA
1.8 V <= VDD < 2.5 V
IOL
LOW-level output
current
VOL = 0.4 V; I2C-bus pins
configured as Fast-mode Plus pins;
2.5 V <= VDD < 3.6 V
1.8 V <= VDD < 2.5 V
VI = VDD
20
16
-
-
-
mA
mA
A
-
-
[9]
ILI
input leakage current
2
10
4
22
VI = 5 V
-
A
[1] Typical ratings are not guaranteed. The values listed are for room temperature (25 C), nominal supply voltages.
[2] Based on characterization. Not tested in production.
[3] Low-current mode PWR_LOW_CURRENT selected when running the set_power routine in the power profiles.
[4] Including voltage on outputs in 3-state mode.
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32-bit ARM Cortex-M0+ microcontroller
[5] VDD supply voltage must be present.
[6] 3-state outputs go into 3-state mode in Deep power-down mode.
[7] Allowed as long as the current limit does not exceed the maximum current allowed by the device.
[8] Pull-up and pull-down currents are measured across the weak internal pull-up/pull-down resistors. See Figure 12.
[9] To VSS
.
V
DD
I
I
OL
pd
+
-
pin PIO0_n
pin PIO0_n
A
I
OH
Ipu
-
+
A
aaa-010819
Fig 12. Pin input/output current measurement
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NXP Semiconductors
32-bit ARM Cortex-M0+ microcontroller
11.4 Power consumption
Power measurements in Active, Sleep, Deep-sleep, and Power-down modes were
performed under the following conditions:
• Configure all pins as GPIO with pull-up resistor disabled in the IOCON block.
• Configure GPIO pins as outputs using the GPIO DIR register.
• Write 1 to the GPIO CLR register to drive the outputs LOW.
aaa-013992
4
30 MHz
I
DD
24 MHz
12 MHz
6 MHz
4 MHz
3 MHz
2 MHz
1 MHz
(mA)
3
2
1
0
1.8
2.4
3
3.6
V
(V)
DD
Conditions: Tamb = 25 C; active mode entered executing code while(1){} from flash; all
peripherals disabled in the SYSAHBCLKCTRL register (SYSAHBCLKCTRL =0x1F); all peripheral
clocks disabled; internal pull-up resistors disabled; BOD disabled; low-current mode.
1 MHz - 6 MHz: external clock; IRC, PLL disabled.
12 MHz: IRC enabled; PLL disabled.
24 MHz: IRC enabled; PLL enabled.
30 MHz: system oscillator enabled; PLL enabled.
Fig 13. Active mode: Typical supply current IDD versus supply voltage VDD
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NXP Semiconductors
32-bit ARM Cortex-M0+ microcontroller
aaa-013993
4
3
2
1
0
30 MHz
24 MHz
12 MHz
6 MHz
4 MHz
3 MHz
2 MHz
1 MHz
I
DD
(mA)
-40
-10
20
50
80
110
temperature (°C)
Conditions: VDD = 3.3 V; active mode entered executing code while(1){} from flash; all
peripherals disabled in the SYSAHBCLKCTRL register (SYSAHBCLKCTRL =0x1F); all peripheral
clocks disabled; internal pull-up resistors disabled; BOD disabled; low-current mode.
1 MHz - 6 MHz: external clock; IRC, PLL disabled.
12 MHz: IRC enabled; PLL disabled.
24 MHz: IRC enabled; PLL enabled.
30 MHz: system oscillator enabled; PLL enabled.
Fig 14. Active mode: Typical supply current IDD versus temperature
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NXP Semiconductors
32-bit ARM Cortex-M0+ microcontroller
aaa-013994
2.5
30 MHz
24 MHz
12 MHz
6 MHz
4 MHz
3 MHz
2 MHz
1 MHz
I
DD
(mA)
2
1.5
1
0.5
0
-40
10
60
110
temperature (°C)
Conditions: VDD = 3.3 V; sleep mode entered from flash; all peripherals disabled in the
SYSAHBCLKCTRL register (SYSAHBCLKCTRL =0x1F); all peripheral clocks disabled; internal
pull-up resistors disabled; BOD disabled; low-current mode.
1 MHz - 6 MHz: external clock; IRC, PLL disabled.
12 MHz: IRC enabled; PLL disabled.
24 MHz: IRC enabled; PLL enabled.
30 MHz: system oscillator enabled; PLL enabled.
Fig 15. Sleep mode: Typical supply current IDD versus temperature for different system
clock frequencies
aaa-013983
180
DD
(μuAA))
170
V3.6 V= 3.6 V
DD
I
3.3 VV
2.7 VV
2 V
1.8 VV
160
150
140
130
120
-40
-10
20
50
80
temperature (°C)
110
Conditions: BOD disabled; all oscillators and analog blocks disabled in the PDSLEEPCFG register
(PDSLEEPCFG = 0x0000 18FF).
Fig 16. Deep-sleep mode: Typical supply current IDD versus temperature for different
supply voltages VDD
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LPC82x
NXP Semiconductors
32-bit ARM Cortex-M0+ microcontroller
aaa-013984
25
20
15
10
5
I
DD
(μA)
VDD==33..66VV
DD
3.3 VV
1.8 VV
0
-40
-10
20
50
80
110
temperature (°C)
Conditions: BOD disabled; all oscillators and analog blocks disabled in the PDSLEEPCFG register
(PDSLEEPCFG = 0x0000 18FF).
Fig 17. Power-down mode: Typical supply current IDD versus temperature for different
supply voltages VDD
aaa-013985
2
I
DD
(μuAA))
1.5
1
V
= 3.63.V6
3.33.V3
2.72.V7
1.81.V8
DD
0.5
0
-40
-10
20
50
80
110
temperature (°C)
WKT not running.
Fig 18. Deep power-down mode: Typical supply current IDD versus temperature for
different supply voltages VDD
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32-bit ARM Cortex-M0+ microcontroller
aaa-013991
3
2.5
2
I
DD
(μA)
V
= 3.6 V
3.6
DD
3.3 V
2.4 V
1.8 V
1.5
1
0.5
0
-40
-10
20
50
80
temperature (°C)
110
WKT running with internal 10 kHz low-power oscillator.
Fig 19. Deep power-down mode: Typical supply current IDD versus temperature for
different supply voltages VDD (internal clock)
aaa-014386
2
I
DD
(μA)
VDD==33..66VV
DD
1.5
1
3.3 VV
2.7 VV
1.8 VV
0.5
0
-40
-10
20
50
80
110
temperature (°C)
WKT running with external 10 kHz clock. Clock input waveform: square wave with rise time and fall
time of 5 ns.
Fig 20. Deep power-down mode: Typical supply current IDD versus temperature for
different supply voltages VDD (external 10 kHz input clock)
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LPC82x
NXP Semiconductors
32-bit ARM Cortex-M0+ microcontroller
aaa-014388
3
2.5
2
I
DD
(μA)
VDD==33..66VV
DD
3.3 VV
2.7 VV
1.8 VV
1.5
1
0.5
0
-40
-10
20
50
80
110
temperature (°C)
WKT running with external 32 kHz clock. Clock input waveform: square wave with rise time and fall
time of 5 ns.
Fig 21. Deep power-down mode: Typical supply current IDD versus temperature for
different supply voltages VDD (external 32 kHz input clock)
aaa-014389
25
I
DD
(μA)
20
15
10
5
VDD = 33..66 VV
3.3 VV
2.7 VV
1.8 VV
20
0
-40
-10
50
80
110
temperature (°C)
WKT running with external 1 MHz clock. Clock input waveform: square wave with rise time and fall
time of 5 ns.
Fig 22. Deep power-down mode: Typical supply current IDD versus temperature for
different supply voltages VDD (external 1 MHz input clock)
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NXP Semiconductors
32-bit ARM Cortex-M0+ microcontroller
11.5 CoreMark data
aaa-014006
2.5
coremark score
((iterations/s)/MHz)
CPU/epfeffiirccfoiieernnmccayynce/efficiency
2
1.5
1
default
low-current
0.5
0
0
6
12
18
24
30
system clock frequency (MHz)
Conditions: VDD = 3.3 V; Tamb = 25 °C; active mode; all peripherals except one UART and the SCT
disabled in the SYSAHBCLKCTRL register; BOD disabled; internal pull-up resistors enabled.
Measured with Keil uVision 5.10.
1 MHz - 6 MHz: external clock; IRC, PLL disabled.12 MHz: IRC enabled; PLL disabled. 24 MHz:
IRC enabled; PLL enabled.30 MHz: system oscillator enabled; PLL enabled.
Fig 23. CoreMark score
aaa-014007
8
6
4
2
0
I
DD
(mA)
default
CPU//peefffiirccfoiieernnmccayynce/efficiency
low-current
0
6
12
18
24
30
system clock frequency (MHz)
Conditions: VDD = 3.3 V; Tamb = 25 °C; active mode; all peripherals except one UART and the SCT
disabled in the SYSAHBCLKCTRL register; BOD disabled; internal pull-up resistors enabled.
Measured with Keil uVision 5.10.
1 MHz - 6 MHz: external clock; IRC, PLL disabled.12 MHz: IRC enabled; PLL disabled.24 MHz:
IRC enabled; PLL enabled.30 MHz: system oscillator enabled; PLL enabled.
Fig 24. Active mode: CoreMark power consumption IDD
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NXP Semiconductors
32-bit ARM Cortex-M0+ microcontroller
11.6 Peripheral power consumption
The supply current per peripheral is measured as the difference in supply current between
the peripheral block enabled and the peripheral block disabled in the SYSAHBCLKCFG.
and PDRUNCFG (for analog blocks) registers. All other blocks are disabled in both
registers and no code accessing the peripheral is executed. Measured on a typical
sample at Tamb = 25 C. Unless noted otherwise, the system oscillator and PLL are
running in both measurements.
The supply currents are shown for system clock frequencies of 12 MHz and 30 MHz.
Table 10. Power consumption for individual analog and digital blocks
Peripheral
Typical supply current in μA
Notes
System clock frequency =
n/a
12 MHz
30 MHz
IRC
261
-
-
System oscillator running; PLL off;
independent of main clock frequency; IRC
output disabled.
System oscillator at 12 MHz
Watchdog oscillator
274
2
-
-
-
-
IRC running; PLL off; independent of main
clock frequency.
System oscillator running; PLL off;
independent of main clock frequency.
BOD
39
-
-
-
Independent of main clock frequency.
-
Main PLL
CLKOUT
301
67
-
-
150
Main clock divided by 4 in the CLKOUTDIV
register.
ROM
-
-
27
95
68
-
GPIO + pin interrupt/pattern
match
233
GPIO pins configured as outputs and set to
LOW. Direction and pin state are maintained if
the GPIO is disabled in the SYSAHBCLKCFG
register.
SWM
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
59
45
168
89
29
54
49
52
57
55
55
50
54
56
34
145
110
411
220
71
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
IOCON
SCTimer/PWM
MRT
WWDT
I2C0
132
122
127
142
136
136
124
134
138
82
I2C1
I2C2
I2C3
SPI0
SPI1
USART0
USART1
USART2
Comparator ACMP
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32-bit ARM Cortex-M0+ microcontroller
Table 10. Power consumption for individual analog and digital blocks …continued
Peripheral
Typical supply current in μA
Notes
System clock frequency =
n/a
12 MHz
30 MHz
ADC
-
57
141
Digital controller only. Analog portion of the
ADC disabled in the PDRUNCFG register.
-
-
57
141
Combined analog and digital logic. ADC
enabled in the PDRUNCFG register and
LPWRMODE bit set to 1 in the ADC CTRL
register (ADC in low-power mode).
1990
2070
Combined analog and digital logic. ADC
enabled in the PDRUNCFG register and
LPWRMODE bit set to 0 in the ADC CTRL
register (ADC powered).
DMA
CRC
-
-
324
34
793
85
-
11.7 Electrical pin characteristics
aaa-013973
aaa-013974
1.8
OLH
3.5
V
OHL
(V)
V
(V)
1.7
3.2
2.9
2.6
2.3
2
-40 CC°C
25 °CC
90 °CC
105 °CC
-40 °CC
25 °CC
90 °CC
105 °CC
1.6
1.5
1.4
1.3
1.2
0
4
8
12
16
20
24
0
20
40
60
OH
80
I
(mA)
I
(mA)
OH
Conditions: VDD = 1.8 V; on pin PIO0_12.
Conditions: VDD = 3.3 V; on pin PIO0_12.
Fig 25. High-drive output: Typical HIGH-level output voltage VOH versus HIGH-level output current IOH
LPC82x
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NXP Semiconductors
32-bit ARM Cortex-M0+ microcontroller
aaa-013964
aaa-013972
40
60
45
30
15
0
I
I
OLL
(mA)
OLL
(mA)
-40 CC°C
25 °CC
90 °CC
105 °CC
-40 °CC
25 °CC
90 °CC
105 °CC
30
20
10
0
0
0.1
0.2
0.3
0.4
0.5
(V)
0.6
0
0.1
0.2
0.3
0.4
0.5
(V)
0.6
V
V
OL
OL
Conditions: VDD = 1.8 V; on pins PIO0_10 and PIO0_11.
Conditions: VDD = 3.3 V; on pins PIO0_10 and PIO0_11.
Fig 26. I2C-bus pins (high current sink): Typical LOW-level output current IOL versus LOW-level output voltage
VOL
aaa-013975
aaa-013976
10
8
15
12
9
I
I
OLL
(mA)
OLL
(mA)
-40 CC°C
25 °CC
90 °CC
105 °CC
-40 °CC
25 °CC
90 °CC
105 °CC
6
4
6
2
3
0
0
0
0.1
0.2
0.3
0.4
0.5
(V)
0.6
0
0.1
0.2
0.3
0.4
0.5
(V)
0.6
V
V
OL
OL
Conditions: VDD = 1.8 V; standard port pins and
high-drive pin PIO0_12.
Conditions: VDD = 3.3 V; standard port pins and
high-drive pin PIO0_12.
Fig 27. Typical LOW-level output current IOL versus LOW-level output voltage VOL
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NXP Semiconductors
32-bit ARM Cortex-M0+ microcontroller
aaa-013977
aaa-013978
1.8
OHH
3.5
-40 CC°C
25 °CC
90 °CC
105 °CC
V
(V)
V
OHH
(V)
1.7
1.6
1.5
1.4
1.3
1.2
3.2
2.9
2.6
2.3
2
-40 °CC
25 °CC
90 °CC
105 °CC
0
1.5
3
4.5
OH
6
0
8
16
24
I
(mA)
I
(mA)
OH
Conditions: VDD = 1.8 V; standard port pins.
Conditions: VDD = 3.3 V; standard port pins.
Fig 28. Typical HIGH-level output voltage VOH versus HIGH-level output source current IOH
aaa-013979
aaa-013980
0
-4
-8
0
I
I
pu
(μuAA))
pu
(uμAA))
-14
-28
-42
-56
-70
-40 CC°C
105 °CC
90 °CC
25 °CC
105 °CC
-40 °CC
90 °CC
25 °CC
-12
-16
0
0.7
1.4
2.1
2.8
V (V)
3.5
0
1
2
3
4
5
V (V)
I
I
Conditions: VDD = 1.8 V; standard port pins.
Conditions: VDD = 3.3 V; standard port pins.
Fig 29. Typical pull-up current IPU versus input voltage VI
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aaa-013981
aaa-013982
35
80
60
40
20
0
I
I
pd
(μuAA))
puud
(uμAA))
28
21
14
7
-40 CC°C
-40 °CC
25 °CC
90 °CC
105 °CC
25 °CC
90 °CC
105 °CC
0
0
0.7
1.4
2.1
2.8
3.5
0
1
2
3
4
5
V (V)
V (V)
I
I
Conditions: VDD = 1.8 V; standard port pins.
Conditions: VDD = 3.3 V; standard port pins.
Fig 30. Typical pull-down current IPD versus input voltage VI
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12. Dynamic characteristics
12.1 Power-up ramp conditions
Table 11. Power-up characteristics
Tamb = −40 °C to +105 °C; 1.8 V ≤ VDD ≤ 3.6 V
Symbol Parameter
Conditions
Min
0
Typ
Max
500
-
Unit
ms
s
[1][3]
[1][2][3]
[3]
tr
rise time
VI 200 mV
-
-
-
twait
VI
wait time
12
0
input voltage
at t = t1 on pin VDD
200
mV
[1] See Figure 31.
[2] The wait time specifies the time the power supply must be at levels below 200 mV before ramping up. See
the LPC82x errata sheet.
[3] Based on characterization, not tested in production.
t
r
V
DD
200 mV
0
t
wait
t = t
1
aaa-017426
Condition: 0 < VI 200 mV at start of power-up (t = t1)
Fig 31. Power-up ramp
12.2 Flash/EEPROM memory
Table 12. Flash characteristics
Tamb = −40 °C to +105 °C. Based on JEDEC NVM qualification. Failure rate < 10 ppm for parts as
specified below.
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
[1]
Nendu
endurance
10000
100000
-
cycles
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Table 12. Flash characteristics
Tamb = −40 °C to +105 °C. Based on JEDEC NVM qualification. Failure rate < 10 ppm for parts as
specified below.
Symbol
Parameter
Conditions
powered
Min
10
Typ
20
Max
Unit
years
years
ms
tret
retention time
-
not powered
20
40
-
ter
erase time
page or multiple
consecutivepages,
sector or multiple
consecutive
95
100
105
sectors
[2]
tprog
programming
time
0.95
1
1.05
ms
[1] Number of program/erase cycles.
[2] Programming times are given for writing 64 bytes to the flash. Tamb <= +85 C. Flash programming with IAP
calls (see LPC82x user manual).
12.3 External clock for the oscillator in slave mode
Remark: The input voltage on the XTALIN and XTALOUT pins must be 1.95 V (see
Table 7). For connecting the oscillator to the XTAL pins, also see Section 12.3.
Table 13. Dynamic characteristic: external clock (XTALIN input)
Tamb = −40 °C to +105 °C; VDD over specified ranges.[1]
Symbol
fosc
Parameter
Min
Typ[2]
Max
Unit
MHz
ns
oscillator frequency
clock cycle time
clock HIGH time
clock LOW time
clock rise time
clock fall time
1
-
-
-
-
-
-
25
Tcy(clk)
tCHCX
tCLCX
tCLCH
tCHCL
40
1000
Tcy(clk) 0.4
-
ns
Tcy(clk) 0.4
-
ns
-
-
5
5
ns
ns
[1] Parameters are valid over operating temperature range unless otherwise specified.
[2] Typical ratings are not guaranteed. The values listed are for room temperature (25 C), nominal supply
voltages.
t
CHCX
t
t
t
CLCH
CHCL
CLCX
T
cy(clk)
aaa-004648
Fig 32. External clock timing (with an amplitude of at least Vi(RMS) = 200 mV)
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12.4 Internal oscillators
Table 14. Dynamic characteristics: IRC
Tamb = −40 °C to +105 °C; 2.7 V ≤ VDD ≤ 3.6 V[1].
Symbol Parameter
Conditions
Min
Typ[2] Max
12 12.18
Unit
fosc(RC)
internal RC
-
11.82
MHz
oscillator frequency
[1] Parameters are valid over operating temperature range unless otherwise specified.
[2] Typical ratings are not guaranteed. The values listed are for room temperature (25 C), nominal supply
voltages.
aaa-014008
12.2
V3.6 V= 3.6 V
DD
3.3 VV
3 V
f
(MHz)
2.7 VV
2.4 VV
2.1 VV
2 V
12.1
1.8 VV
12
11.9
11.8
-40
-10
20
50
80
110
temperature (°C)
Conditions: Frequency values are typical values. 12 MHz 1.5 % accuracy is guaranteed for
2.7 V VDD 3.6 V. Variations between parts may cause the IRC to fall outside the 12 MHz
1.5 % accuracy specification for voltages below 2.7 V.
Fig 33. Typical Internal RC oscillator frequency versus temperature
Table 15. Dynamic characteristics: Watchdog oscillator
Symbol
Parameter
Conditions
Min Typ[1 Max Unit
]
[2][3]
[2][3]
fosc(int)
internal oscillator DIVSEL = 0x1F, FREQSEL = 0x1
-
-
9.4
-
-
kHz
kHz
frequency
in the WDTOSCCTRL register;
DIVSEL = 0x00, FREQSEL = 0xF
in the WDTOSCCTRL register
2300
[1] Typical ratings are not guaranteed. The values listed are at nominal supply voltages.
[2] The typical frequency spread over processing and temperature (Tamb = 40 C to +105 C) is 40 %.
[3] See the LPC82x user manual.
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12.4.1 I/O pins
32-bit ARM Cortex-M0+ microcontroller
Table 16. Dynamic characteristics: I/O pins[1]
Tamb = −40 °C to +105 °C; 3.0 V ≤ VDD ≤ 3.6 V.
Symbol Parameter Conditions
Min
3.0
2.5
Typ
Max
5.0
Unit
ns
tr
tf
rise time
fall time
pin configured as output
pin configured as output
-
-
5.0
ns
[1] Applies to standard port pins and RESET pin.
12.4.2 WKTCLKIN pin (wake-up clock input)
Table 17. Dynamic characteristics: WKTCLKIN pin
Tamb = −40 °C to +105 °C; 1.8 V ≤ VDD ≤ 3.6 V.
Symbol Parameter
Conditions
Min Max
Unit
[1]
fclk
clock frequency
deep power-down mode and
power-down mode
-
1
MHz
[1]
deep-sleep, sleep, and active mode
-
10
-
MHz
ns
tCHCX
tCLCX
clock HIGH time
clock LOW time
-
-
50
50
-
ns
[1] Assuming a square-wave input clock.
12.4.3 SCTimer/PWM output timing
Table 18. SCTimer/PWM output dynamic characteristics
Tamb = −40 °C to 105 °C; 2.4 V <= VDD <= 3.6 V; CL = 10 pF. Simulated skew (over process, voltage,
and temperature) of any two SCT output signals routed to standard I/O pins; sampled at the 50 %
level of the falling or rising edge; values guaranteed by design.
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
tsk(o)
output skew time
-
-
-
4
ns
12.4.4 I2C-bus
Table 19. Dynamic characteristic: I2C-bus pins[1]
Tamb = −40 °C to +105 °C; values guaranteed by design.[2]
Symbol
Parameter
Conditions
Standard-mode
Fast-mode
Min
Max
Unit
fSCL
SCL clock
frequency
0
0
0
100
400
1
kHz
kHz
MHz
Fast-mode Plus; on
pins PIO0_10 and
PIO0_11
[4][5][6][7]
tf
fall time
of both SDA and
SCL signals
-
300
ns
Standard-mode
Fast-mode
20 + 0.1 Cb 300
120
ns
ns
Fast-mode Plus;
on pins PIO0_10
and PIO0_11
-
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32-bit ARM Cortex-M0+ microcontroller
Table 19. Dynamic characteristic: I2C-bus pins[1]
Tamb = −40 °C to +105 °C; values guaranteed by design.[2]
Symbol
Parameter
Conditions
Standard-mode
Fast-mode
Min
4.7
1.3
Max
Unit
s
tLOW
LOW period of
the SCL clock
-
-
-
s
Fast-mode Plus; on 0.5
pins PIO0_10 and
PIO0_11
s
tHIGH
HIGH period of
the SCL clock
Standard-mode
Fast-mode
4.0
0.6
-
-
-
s
s
s
Fast-mode Plus; on 0.26
pins PIO0_10 and
PIO0_11
[3][4][8]
tHD;DAT
data hold time
Standard-mode
Fast-mode
0
0
0
-
-
-
s
s
s
Fast-mode Plus; on
pins PIO0_10 and
PIO0_11
[9][10]
tSU;DAT
data set-up
time
Standard-mode
Fast-mode
250
100
-
-
-
ns
ns
ns
Fast-mode Plus; on 50
pins PIO0_10 and
PIO0_11
[1] See the I2C-bus specification UM10204 for details.
[2] Parameters are valid over operating temperature range unless otherwise specified.
[3] tHD;DAT is the data hold time that is measured from the falling edge of SCL; applies to data in transmission
and the acknowledge.
[4] A device must internally provide a hold time of at least 300 ns for the SDA signal (with respect to the
VIH(min) of the SCL signal) to bridge the undefined region of the falling edge of SCL.
[5] Cb = total capacitance of one bus line in pF.
[6] The maximum tf for the SDA and SCL bus lines is specified at 300 ns. The maximum fall time for the SDA
output stage tf is specified at 250 ns. This allows series protection resistors to be connected in between the
SDA and the SCL pins and the SDA/SCL bus lines without exceeding the maximum specified tf.
[7] In Fast-mode Plus, fall time is specified the same for both output stage and bus timing. If series resistors
are used, designers should allow for this when considering bus timing.
[8] The maximum tHD;DAT could be 3.45 s and 0.9 s for Standard-mode and Fast-mode but must be less than
the maximum of tVD;DAT or tVD;ACK by a transition time (see UM10204). This maximum must only be met if
the device does not stretch the LOW period (tLOW) of the SCL signal. If the clock stretches the SCL, the
data must be valid by the set-up time before it releases the clock.
[9] tSU;DAT is the data set-up time that is measured with respect to the rising edge of SCL; applies to data in
transmission and the acknowledge.
[10] A Fast-mode I2C-bus device can be used in a Standard-mode I2C-bus system but the requirement
tSU;DAT = 250 ns must then be met. This will automatically be the case if the device does not stretch the
LOW period of the SCL signal. If such a device does stretch the LOW period of the SCL signal, it must
output the next data bit to the SDA line tr(max) + tSU;DAT = 1000 + 250 = 1250 ns (according to the
Standard-mode I2C-bus specification) before the SCL line is released. Also the acknowledge timing must
meet this set-up time.
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t
f
t
SU;DAT
70 %
30 %
70 %
30 %
SDA
SCL
t
t
HD;DAT
VD;DAT
t
f
t
HIGH
70 %
30 %
70 %
30 %
70 %
30 %
70 %
30 %
t
LOW
1 / f
S
SCL
aaa-004643
Fig 34. I2C-bus pins clock timing
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12.4.5 SPI interfaces
In master mode, the maximum supported bit rate is limited by the maximum system clock
to 30 Mbit/s. In slave mode, assuming a set-up time of 3 ns for the external device and
neglecting any PCB trace delays, the maximum supported bit rate is 1/(2 x (26 ns + 3 ns))
= 17 Mbit/s at 3.0 V <= VDD <= 3.6 V and 13 Mbit/s at 1.8 V <= VDD < 3.0 V. The actual
bit rate depends on the delays introduced by the external trace and the external device.
Remark: SPI functions can be assigned to all digital pins. The characteristics are valid for
all digital pins except the open-drain pins PIO0_10 and PIO0_11.
Table 20. SPI dynamic characteristics
Tamb = −40 °C to 105 °C; CL = 20 pF; input slew = 1 ns. Simulated parameters sampled at the 30 %
and 70 % level of the rising or falling edge; values guaranteed by design. Delays introduced by the
external trace or external device are not considered.
Symbol
SPI master
tDS
Parameter
Conditions
Min
Max
Unit
data set-up time
data hold time
1.8 V <= VDD <= 3.6 V
1.8 V <= VDD <= 3.6 V
2
-
ns
ns
ns
tDH
6
-
tv(Q)
data output valid time 1.8 V <= VDD <= 3.6 V
-3
4
SPI slave
tDS
data set-up time
data hold time
1.8 V <= VDD <= 3.6 V
1.8 V <= VDD <= 3.6 V
2
4
0
0
-
ns
ns
ns
ns
tDH
-
tv(Q)
data output valid time 3.0 V <= VDD <= 3.6 V
1.8 V <= VDD < 3.0 V
26
35
LPC82x
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32-bit ARM Cortex-M0+ microcontroller
T
cy(clk)
SCK (CPOL = 0)
SCK (CPOL = 1)
SSEL
MOSI (CPHA = 0)
MISO (CPHA = 0)
t
t
v(Q)
v(Q)
IDLE
IDLE
DATA VALID (MSB)
DATA VALID
DATA VALID (MSB)
DATA VALID (MSB)
DATA VALID (LSB)
t
t
DH
DS
DATA VALID (MSB)
DATA VALID
DATA VALID (LSB)
MOSI (CPHA = 1)
MISO (CPHA = 1)
t
t
v(Q)
v(Q)
DATA VALID (MSB)
DATA VALID (MSB)
IDLE
IDLE
DATA VALID (LSB)
DATA VALID
t
t
DH
DS
DATA VALID (MSB)
DATA VALID (MSB)
DATA VALID (LSB)
DATA VALID
aaa-014969
Tcy(clk) = CCLK/DIVVAL with CCLK = system clock frequency. DIVVAL is the SPI clock divider. See the LPC82x User manual.
Fig 35. SPI master timing
LPC82x
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32-bit ARM Cortex-M0+ microcontroller
T
cy(clk)
SCK (CPOL = 0)
SCK (CPOL = 1)
SSEL
MISO (CPHA = 0)
MOSI (CPHA = 0)
t
t
v(Q)
v(Q)
IDLE
IDLE
DATA VALID (MSB)
DATA VALID
DATA VALID (MSB)
DATA VALID (MSB)
DATA VALID (LSB)
t
t
DH
DS
DATA VALID (MSB)
DATA VALID
DATA VALID (LSB)
MISO (CPHA = 1)
MOSI (CPHA = 1)
t
t
v(Q)
v(Q)
DATA VALID (MSB)
DATA VALID (MSB)
DATA VALID (LSB)
DATA VALID
IDLE
IDLE
t
t
DH
DS
DATA VALID (MSB)
DATA VALID (MSB)
DATA VALID (LSB)
DATA VALID
aaa-014970
Fig 36. SPI slave timing
LPC82x
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32-bit ARM Cortex-M0+ microcontroller
12.4.6 USART interface
The maximum USART bit rate is 10 Mbit/s in synchronous mode master mode and
10 Mbit/s in synchronous slave mode.
Remark: USART functions can be assigned to all digital pins. The characteristics are
valid for all digital pins except the open-drain pins PIO0_10 and PIO0_11.
Table 21. USART dynamic characteristics
Tamb = −40 °C to 105 °C; 1.8 V <= VDD <= 3.6 V unless noted otherwise; CL = 10 pF; input slew =
10 ns. Simulated parameters sampled at the 30 %/70 % level of the falling or rising edge; values
guaranteed by design.
Symbol
Parameter
Conditions
Min
Max Unit
USART master (in synchronous mode)
tsu(D)
data input set-up time
3.0 V <= VDD <= 3.6 V
1.8 V <= VDD < 3.0 V
31
37
0
-
ns
th(D)
tv(Q)
data input hold time
data output valid time
-
ns
ns
0
5
USART slave (in synchronous mode)
tsu(D)
th(D)
tv(Q)
data input set-up time
data input hold time
data output valid time
6
2
0
0
-
ns
ns
ns
ns
-
3.0 V <= VDD <= 3.6 V
1.8 V <= VDD < 3.0 V
28
37
T
cy(clk)
Un_SCLK (CLKPOL = 0)
Un_SCLK (CLKPOL = 1)
TXD
t
t
vQ)
v(Q)
START
BIT0
BIT1
t
t
su(D) h(D)
BIT1
START
BIT0
RXD
aaa-015074
In master mode, Tcy(clk) = U_PCLK/BRGVAL. See the LPC82x User manual.
Fig 37. USART timing
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13. Characteristics of analog peripherals
13.1 BOD
Table 22. BOD static characteristics[1]
Tamb = 25 °C.
Symbol Parameter
Conditions
Min
Typ
Max
Unit
Vth
threshold voltage interrupt level 1
assertion
-
-
2.25
2.40
-
-
V
V
de-assertion
interrupt level 2
assertion
-
-
2.54
2.68
-
-
V
V
de-assertion
interrupt level 3
assertion
-
-
2.85
2.95
-
-
V
V
de-assertion
reset level 1
assertion
-
-
2.05
2.20
-
-
V
V
de-assertion
reset level 2
assertion
-
-
2.34
2.49
-
-
V
V
de-assertion
reset level 3
assertion
-
-
2.63
2.78
-
-
V
V
de-assertion
[1] Interrupt levels are selected by writing the level value to the BOD control register BODCTRL, see the
LPC82x user manual. Interrupt level 0 is reserved.
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13.2 ADC
Table 23. 12-bit ADC static characteristics
Tamb = −40 °C to +105 °C unless noted otherwise; VDD = 2.4 V to 3.6 V; VREFP = VDD; VREFN = VSS
.
Symbol
VIA
Parameter
Conditions
Min
0
Typ
Max
VDD
VDD
0.32
Unit
V
analog input voltage
reference voltage
-
-
-
Vref
on pin VREFP
2.4
-
V
Cia
analog input
capacitance
pF
[2]
[3]
fclk(ADC)
ADC clock frequency
2.7 V <= VDD <= 3.6 V
2.4 V <= VDD < 2.7 V
2.7 V <= VDD <= 3.6 V
2.4 V <= VDD < 2.7 V
Tamb = 105 °C
-
-
-
-
-
-
30
25
1.2
1
MHz
-
MHz
[2]
fs
sampling frequency
-
Msamples/s
Msamples/s
LSB
[3]
-
[5][4]
ED
differential linearity
error
+/- 2.5
-
[6][4]
[7][4]
[8][4]
EL(adj)
EO
integral non-linearity
offset error
Tamb = 105 °C
Tamb = 105 °C
-
+/- 2.5
+/- 4.5
+/- 0.5
-
-
-
-
-
LSB
LSB
%
-
Verr(fs)
Zi
full-scale error voltage 1.2 Msamples/s; Tamb = 105 °C
input impedance fs = 1.2 Msamples/s
-
[1][9]
[10]
0.1
M
[1] The input resistance of ADC channel 0 is higher than for all other channels. See Figure 38.
[2] In the ADC TRM register, set VRANGE = 0 (default).
[3] In the ADC TRM register, set VRANGE = 1 (default).
[4] Based on characterization. Not tested in production.
[5] The differential linearity error (ED) is the difference between the actual step width and the ideal step width. See Figure 39.
[6] The integral non-linearity (EL(adj)) is the peak difference between the center of the steps of the actual and the ideal transfer curve after
appropriate adjustment of gain and offset errors. See Figure 39.
[7] The offset error (EO) is the absolute difference between the straight line which fits the actual curve and the straight line which fits the
ideal curve. See Figure 39.
[8] The full-scale error voltage or gain error (EG) is the difference between the straight line fitting the actual transfer curve after removing
offset error, and the straight line which fits the ideal transfer curve. See Figure 39.
[9] Tamb = 25 C; maximum sampling frequency fs = 1.2 Msamples/s and analog input capacitance Cia = 0.1 pF.
[10] Input impedance Zi is inversely proportional to the sampling frequency and the total input capacity including Cia and Cio: Zi 1 / (fs Ci).
See Table 7 for Cio.
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ADC
R
= 0.25 kΩ...2.5 kΩ
1
ADCn_0
C
io
R
= 5 Ω...25 Ω
sw
ADCn_[1:11]
DAC
C
DAC
C
io
C
ia
aaa-011748
Fig 38. ADC input impedance
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32-bit ARM Cortex-M0+ microcontroller
offset
error
O
gain
error
E
E
G
4095
4094
4093
4092
4091
4090
(2)
7
code
out
(1)
6
5
4
3
2
1
0
(5)
(4)
(3)
1 LSB
(ideal)
4090 4091 4092 4093 4094 4095 4096
1
2
3
4
5
6
7
V
IA
(LSB
)
ideal
offset error
E
O
VREFP - V
4096
SS
1 LSB =
002aaf436
(1) Example of an actual transfer curve.
(2) The ideal transfer curve.
(3) Differential linearity error (ED).
(4) Integral non-linearity (EL(adj)).
(5) Center of a step of the actual transfer curve.
Fig 39. 12-bit ADC characteristics
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13.3 Comparator and internal voltage reference
Table 24. Internal voltage reference static and dynamic characteristics
Tamb = −40 °C to +105 °C; VDD = 3.3 V; hysteresis disabled in the comparator CTRL register.
Symbol Parameter
Conditions
Min
Typ
-
Max
Unit
mV
mV
VO
output voltage Tamb = 25 C to 105C
Tamb = 25 C
860
940
904
aaa-014424
0.910
V
Oref
(m(VV))
0.905
0.900
0.895
0.890
-40
-10
20
50
80
110
temperature (°C)
VDD = 3.3 V; characterized through bench measurements on typical samples.
Fig 40. Typical internal voltage reference output voltage
Table 25. Comparator characteristics
Tamb = −40 °C to +105 °C unless noted otherwise; VDD = 1.8 V to 3.6 V.
Symbol Parameter
Static characteristics
Conditions
Min Typ
Max
Unit
Vref(cmp)
comparator reference
voltage
pin PIO0_6/VDDCMP configured for
function VDDCMP
1.5
-
3.6
V
[2]
[2]
IDD
supply current
VP > VM; Tamb = 25 °C; VDD = 3.3 V
VM > VP; Tamb = 25 °C; VDD = 3.3 V
-
90
-
A
A
V
-
60
-
VIC
common-mode input voltage
output voltage variation
offset voltage
0
0
-
-
VDD
DVO
Voffset
-
VDD
V
[2]
[2]
[2]
VIC = 0.1 V; VDD = 2.4 V; Tamb = 105 °C
VIC = 1.5 V; VDD = 2.4 V; Tamb = 105 °C
VIC = 2.9 V; VDD = 2.4 V; Tamb = 105 °C
+/- 4
+/- 2
+/- 4
-
-
-
mV
mV
mV
-
-
Dynamic characteristics
tstartup
start-up time
nominal process; VDD = 3.3 V; Tamb
=
-
13
-
s
25 °C
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Table 25. Comparator characteristics …continued
Tamb = −40 °C to +105 °C unless noted otherwise; VDD = 1.8 V to 3.6 V.
Symbol Parameter
tPD propagation delay
Conditions
Min Typ
Max
Unit
HIGH to LOW; VDD = 3.0 V; Tamb
=
105 °C
[1][2][4]
[1][2]
VIC = 0.1 V; 100 mV overdrive input
-
-
-
-
-
-
140
190
130
120
220
80
-
-
-
-
-
-
ns
ns
ns
ns
ns
ns
VIC = 0.1 V; rail-to-rail input
[1][2][4]
[1][2]
VIC = 1.5 V; 100 mV overdrive input
VIC = 1.5 V; rail-to-rail input
[1][2][4]
[1][2]
VIC = 2.9 V; 100 mV overdrive input
VIC = 2.9 V; rail-to-rail input
tPD
propagation delay
LOW to HIGH; VDD = 3.0 V; Tamb =
105 °C
[1][2][4]
[1][2]
VIC = 0.1 V; 100 mV overdrive input
-
-
-
-
-
-
-
240
60
-
-
-
-
-
-
-
ns
ns
ns
ns
ns
ns
VIC = 0.1 V; rail-to-rail input
[1][2][4]
[1][2]
VIC = 1.5 V; 100 mV overdrive input
VIC = 1.5 V; rail-to-rail input
160
150
150
260
[1][2][4]
[1][2]
VIC = 2.9 V; 100 mV overdrive input
VIC = 2.9 V; rail-to-rail input
[3]
Vhys
Vhys
Rlad
hysteresis voltage
hysteresis voltage
ladder resistance
positive hysteresis; VDD = 3.0 V;
V
IC = 1.5 V; Tamb = 105 °C; settings:
5 mV
6
mV
mV
mV
10 mV
20 mV
-
-
11
23
-
-
[1][3]
negative hysteresis; VDD = 3.0 V;
V
IC = 1.5 V; Tamb = 105 °C; settings:
5 mV
-
-
-
-
10
15
27
1
-
-
-
-
mV
mV
mV
M
10 mV
20 mV
-
[1] CL = 10 pF
[2] Characterized on typical samples, not tested in production.
[3] Input hysteresis is relative to the reference input channel and is software programmable.
[4] 100 mV overdrive corresponds to a square wave from 50 mV below the reference (VIC) to 50 mV above the reference.
Table 26. Comparator voltage ladder dynamic characteristics
Tamb = −40 °C to +105 °C; VDD = 1.8 V to 3.6 V.
Symbol Parameter
Conditions
Min
Typ
Max
Unit
[1]
[1]
ts(pu) power-up settling
to 99% of voltage
ladder output value
-
17
-
s
time
ts(sw)
switching settling
time
to 99% of voltage
ladder output value
-
18
-
s
[1] Characterized on typical samples, not tested in production.
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Table 27. Comparator voltage ladder reference static characteristics
VDD = 1.8 V to 3.6 V. Tamb = -40 °C to + 105°C; external or internal reference.
Symbol
Parameter
Conditions
Min
Typ[1] Max
Unit
mV
%
[2]
EV(O)
output voltage error
decimal code = 00
decimal code = 08
decimal code = 16
decimal code = 24
decimal code = 30
decimal code = 31
-
-
-
-
-
-
+/- 6
+/- 1
+/- 1
+/- 1
+/- 1
+/- 1
-
-
-
-
-
-
%
%
%
%
[1] Characterized though limited samples. Not tested in production.
[2] All peripherals except comparator, temperature sensor, and IRC turned off.
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14. Application information
14.1 XTAL input
The input voltage to the on-chip oscillators is limited to 1.8 V. If the oscillator is driven by a
clock in slave mode, it is recommended to couple the input through a capacitor with Ci =
100 pF. To limit the input voltage to the specified range, choose an additional capacitor to
ground Cg which attenuates the input voltage by a factor Ci/(Ci + Cg). In slave mode, a
minimum of 200 mV(RMS) is needed.
LPC800
XTALIN
C
i
C
g
100 pF
aaa-004646
Fig 41. Slave mode operation of the on-chip oscillator
In slave mode the input clock signal should be coupled with a capacitor of 100 pF
(Figure 41), with an amplitude between 200 mV (RMS) and 1000 mV (RMS). This
corresponds to a square wave signal with a signal swing of between 280 mV and 1.4 V.
The XTALOUT pin in this configuration can be left unconnected.
External components and models used in oscillation mode are shown in Figure 42 and in
Table 28 and Table 29. Since the feedback resistance is integrated on chip, only a crystal
and the capacitances CX1 and CX2 must be connected externally in case of fundamental
mode oscillation (the fundamental frequency is represented by L, CL and RS).
Capacitance CP in Figure 42 represents the parallel package capacitance and should not
be larger than 7 pF. Parameters FOSC, CL, RS and CP are supplied by the crystal
manufacturer (see Table 28).
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LPC800
L
XTALIN
XTALOUT
C
R
C
P
=
L
XTAL
S
C
C
X2
X1
aaa-004647
Fig 42. Oscillator modes and models: oscillation mode of operation and external crystal
model used for CX1/CX2 evaluation
Table 28. Recommended values for CX1/CX2 in oscillation mode (crystal and external
components parameters) low frequency mode
Fundamental oscillation Crystal load
Maximum crystal
External load
frequency FOSC
capacitance CL
series resistance RS
capacitors CX1, CX2
1 MHz to 5 MHz
10 pF
< 300
< 300
< 300
< 300
< 200
< 100
< 160
< 60
18 pF, 18 pF
39 pF, 39 pF
57 pF, 57 pF
18 pF, 18 pF
39 pF, 39 pF
57 pF, 57 pF
18 pF, 18 pF
39 pF, 39 pF
18 pF, 18 pF
20 pF
30 pF
5 MHz to 10 MHz
10 pF
20 pF
30 pF
10 MHz to 15 MHz
15 MHz to 20 MHz
10 pF
20 pF
10 pF
< 80
Table 29. Recommended values for CX1/CX2 in oscillation mode (crystal and external
components parameters) high frequency mode
Fundamental oscillation Crystal load
Maximum crystal
External load
frequency FOSC
capacitance CL
series resistance RS
capacitors CX1, CX2
15 MHz to 20 MHz
10 pF
< 180
< 100
< 160
< 80
18 pF, 18 pF
39 pF, 39 pF
18 pF, 18 pF
39 pF, 39 pF
20 pF
20 MHz to 25 MHz
10 pF
20 pF
14.2 XTAL Printed-Circuit Board (PCB) layout guidelines
The crystal should be connected on the PCB as close as possible to the oscillator input
and output pins of the chip. Take care that the load capacitors Cx1,Cx2, and Cx3 in case of
third overtone crystal usage have a common ground plane. The external components
must also be connected to the ground plain. Loops must be made as small as possible in
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order to keep the noise coupled in via the PCB as small as possible. Also parasitics
should stay as small as possible. Values of Cx1 and Cx2 should be chosen smaller
according to the increase in parasitics of the PCB layout.
14.3 Connecting power, clocks, and debug functions
Figure 43 shows the basic board connections used to power the LPC82x, connect the
external crystal, and provide debug capabilities via the serial wire port.
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3.3 V
SWD connector
Note 4
3.3 V
~10 kΩ - 100 kΩ
SWDIO/PIO0_2
SWCLK/PIO0_3
1
2
4
3
5
7
PIO0_8/XTALIN
~10 kΩ - 100 kΩ
n.c.
n.c.
6
8
C1
Note 1
n.c.
DGND
C2
PIO0_9/XTALOUT
RESET/PIO0_5
9
10
DGND
V
SS
DGND
DGND
Note 2
3.3 V
V
DD
LPC82x
0.1 μF
0.01 μF
PIO0_12
ADC_0
DGND
ISP select pin
Note 5 (ADC_1),
Note 3 (VDDCMP)
PIO0_6/ADC_1/VDDCMP
Note 5
Note 3
3.3 V
VREFP
0.1 μF
0.1 μF
10 μF
VREFN
AGND
AGND
AGND
DGND
aaa-015073
(1) See Section 14.1 “XTAL input” for the values of C1 and C2.
(2) Position the decoupling capacitors of 0.1 μF and 0.01 μF as close as possible to the VDD pin. Add one set of decoupling
capacitors to each VDD pin.
(3) Position the decoupling capacitors of 0.1 μF as close as possible to the VREFN and VDD pins. The 10 μF bypass capacitor
filters the power line. Tie VREFP to VDD if the ADC is not used. Tie VREFN to VSS if ADC is not used.
(4) Uses the ARM 10-pin interface for SWD.
(5) When measuring signals of low frequency, use a low-pass filter to remove noise and to improve ADC performance. Also see
Ref. 4.
Fig 43. Power, clock, and debug connections
14.4 Termination of unused pins
Table 30 shows how to terminate pins that are not used in the application. In many cases,
unused pins may should be connected externally or configured correctly by software to
minimize the overall power consumption of the part.
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Unused pins with GPIO function should be configured as outputs set to LOW with their
internal pull-up disabled. To configure a GPIO pin as output and drive it LOW, select the
GPIO function in the IOCON register, select output in the GPIO DIR register, and write a 0
to the GPIO PORT register for that pin. Disable the pull-up in the pin’s IOCON register.
In addition, it is recommended to configure all GPIO pins that are not bonded out on
smaller packages as outputs driven LOW with their internal pull-up disabled.
Table 30. Termination of unused pins
Pin
Default Recommended termination of unused pins
state[1]
RESET/PIO0_5
I; PU
In an application that does not use the RESET pin or its GPIO function, the
termination of this pin depends on whether Deep power-down mode is used:
• Deep power-down used: Connect an external pull-up resistor and keep pin in
default state (input, pull-up enabled) during all other power modes.
• Deep power-down not used and no external pull-up connected: can be left
unconnected if internal pull-up is disabled and pin is driven LOW and
configured as output by software.
all PIOn_m (not
open-drain)
I; PU
Can be left unconnected if driven LOW and configured as GPIO output with pull-up
disabled by software.
PIOn_m (I2C open-drain)
VREFP
IA
-
Can be left unconnected if driven LOW and configured as GPIO output by software.
Tie to VDD.
Tie to VSS.
VREFN
-
[1] I = Input, O = Output, IA = Inactive (no pull-up/pull-down enabled), F = floating, PU = Pull-Up.
14.5 Pin states in different power modes
Table 31. Pin states in different power modes
Pin
Active
Sleep
Deep-sleep/Power- Deep power-down
down
PIOn_m pins (not As configured in the IOCON[1]. Default: internal pull-up
I2C) enabled.
Floating.
PIO0_4, PIO0_5 As configured in the IOCON[1].
Floating.
(open-drain
I2C-bus pins)
RESET
Reset function enabled. Default: input, internal pull-up
enabled.
Reset function disabled; floating; if the part
is in deep power-down mode, the RESET
pin needs an external pull-up to reduce
power consumption.
PIO0_16/
WAKEUP
As configured in the IOCON[1]. WAKEUP function inactive. Wake-up function enabled; can be disabled
by software.
[1] Default and programmed pin states are retained in sleep, deep-sleep, and power-down modes.
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32-bit ARM Cortex-M0+ microcontroller
15. Package outline
TSSOP20: plastic thin shrink small outline package; 20 leads; body width 4.4 mm
SOT360-1
D
E
A
X
c
H
v
M
A
y
E
Z
11
20
Q
A
2
(A )
3
A
A
1
pin 1 index
L
p
L
1
10
detail X
w
M
b
p
e
0
2.5
5 mm
scale
DIMENSIONS (mm are the original dimensions)
A
(1)
(2)
(1)
UNIT
A
A
A
b
c
D
E
e
H
L
L
Q
v
w
y
Z
1
2
3
p
E
p
max.
8o
0o
0.15
0.05
0.95
0.80
0.30
0.19
0.2
0.1
6.6
6.4
4.5
4.3
6.6
6.2
0.75
0.50
0.4
0.3
0.5
0.2
mm
1.1
0.65
0.25
1
0.2
0.13
0.1
Notes
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.
2. Plastic interlead protrusions of 0.25 mm maximum per side are not included.
REFERENCES
OUTLINE
EUROPEAN
PROJECTION
ISSUE DATE
VERSION
IEC
JEDEC
JEITA
99-12-27
03-02-19
SOT360-1
MO-153
Fig 44. Package outline SOT360-1 (TSSOP20)
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32-bit ARM Cortex-M0+ microcontroller
HVQFN33: plastic thermal enhanced very thin quad flat package; no leads;
32 terminals; body 5 x 5 x 0.85 mm
D
B
A
terminal 1
index area
A
A
1
E
c
detail X
C
e
1
y
y
v
w
C
C
A
B
C
1
e
1/2 e
b
9
16
L
17
8
e
e
E
h
2
1/2 e
24
1
terminal 1
index area
32
25
X
D
h
0
2.5
scale
5 mm
Dimensions (mm are the original dimensions)
(1)
(1)
(1)
(1)
Unit
A
A
b
c
D
D
E
E
e
e
e
L
v
w
y
y
1
1
h
h
1
2
max
0.05 0.30
5.1 3.75 5.1 3.75
0.5
mm nom 0.85
min
0.2
0.5 3.5 3.5
0.1 0.05 0.05 0.1
0.00 0.18
4.9 3.45 4.9 3.45
0.3
Note
1. Plastic or metal protrusions of 0.075 mm maximum per side are not included.
hvqfn33f_po
References
Outline
version
European
projection
Issue date
IEC
JEDEC
JEITA
11-10-11
11-10-17
MO-220
Fig 45. Package outline (HVQFN33 5x5)
LPC82x
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16. Soldering
Footprint information for reflow soldering of TSSOP20 package
SOT360-1
Hx
Gx
P2
(0.125)
(0.125)
Hy Gy
By Ay
C
D2 (4x)
P1
D1
Generic footprint pattern
Refer to the package outline drawing for actual layout
solder land
occupied area
DIMENSIONS in mm
P1 P2 Ay
By
C
D1
D2
Gx
Gy
Hx
Hy
0.650 0.750 7.200 4.500 1.350 0.400 0.600 6.900 5.300 7.300 7.450
sot360-1_fr
Fig 46. Reflow soldering of the TSSOP20 package
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32-bit ARM Cortex-M0+ microcontroller
Footprint information for reflow soldering of HVQFN33 package
Hx
Gx
see detail X
P
nSPx
Ay
By
SLy
Hy Gy
nSPy
C
D
SLx
Bx
Ax
0.60
0.30
solder land
solder paste
occupied area
detail X
Dimensions in mm
P
Ax
Ay
Bx
By
C
D
Gx
Gy
Hx
Hy
6.2
SLx
SLy
nSPx nSPy
0.5
5.95
5.95
4.25
4.25
0.85
0.27
5.25
5.25
6.2
3.75
3.75
3
3
11-11-15
11-11-20
Issue date
002aag766
Fig 47. Reflow soldering of the HVQFN33 package (5x5)
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17. Abbreviations
Table 32. Abbreviations
Acronym
AHB
Description
Advanced High-performance Bus
Advanced Peripheral Bus
BrownOut Detection
APB
BOD
GPIO
PLL
General-Purpose Input/Output
Phase-Locked Loop
RC
Resistor-Capacitor
SPI
Serial Peripheral Interface
System Management Bus
Transverse ElectroMagnetic
SMBus
TEM
UART
Universal Asynchronous Receiver/Transmitter
18. References
[1] LPC82x User manual UM10800:
http://www.nxp.com/documents/user_manual/UM10800.pdf
[2] LPC82x Errata sheet:
http://www.nxp.com/documents/errata_sheet/ES_LPC82X.pdf
[3] I2C-bus specification UM10204.
[4] Technical note ADC design guidelines:
http://www.nxp.com/documents/technical_note/TN00009.pdf
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19. Revision history
Table 33. Revision history
Document ID
Release date
Data sheet status
Change notice Supersedes
LPC82X v.1.4
20210319
Product data sheet
-
LPC82X v.1.3
Modifications:
Updated footnotes for Table 23.
Updated Table 9 , For Vi input voltage tolerant pin is changed to PIO0_6 instead of
PIO0_12.
Updated Table 11, Condition changed for rise time spec.
LPC82X v.1.3
Modifications:
LPC82X v.1.2
Modifications:
20180404
• Updated table note 2 of Section 12.1 “Power-up ramp conditions”.
20161003 Product data sheet LPC82X v.1.1
Product data sheet
201804004I
LPC82X v.1.2
-
• Added text to Table 4 “Movable functions (assign to pins PIO0_0 to PIO0_28 through
switch matrix)”:
–
–
–
SPI0_SSEL1 - Slave select 1 for SPI0.
SPI0_SSEL2 - Slave select 2 for SPI0.
SPI0_SSEL3 - Slave select 3 for SPI0.
• Changed the cross reference in the remark of Section 12.3 “External clock for the
oscillator in slave mode” to Table 7 “General operating conditions”.
• Updated table note section 2 in Table 5 “Limiting values” to make the reference to
Table 7 “General operating conditions”.
LPC82X v.1.1
Modifications:
20160602
Product data sheet
-
LPC82X v.1
• Updated Power, clock, and debug connections diagram. See Figure 43.
• Changed PIO0_13 to PIO0_16 in High-drive output pin configured as digital pin
(PIO0_2, PIO0_3, PIO0_12, PIO0_16). See Table 9 “Static characteristics, electrical
pin characteristics”.
• Changed the table header of Table 10 “Power consumption for individual analog and
digital blocks” from main clock to system clock.
• Added Section 12.1 “Power-up ramp conditions”.
• Removed BOD reset level 0 specifications in Table 22 “BOD static characteristics[1]”.
LPC82X v.1
20141001
Product data sheet
-
-
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22. Contents
1
General description . . . . . . . . . . . . . . . . . . . . . . 1
8.20.1
8.21
8.21.1
8.22
Features. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
Analog-to-Digital Converter (ADC). . . . . . . . . 23
Features. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
Clocking and power control . . . . . . . . . . . . . . 24
Crystal and internal oscillators . . . . . . . . . . . . 24
2
Features and benefits . . . . . . . . . . . . . . . . . . . . 1
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
Ordering information. . . . . . . . . . . . . . . . . . . . . 3
Ordering options . . . . . . . . . . . . . . . . . . . . . . . . 3
Marking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . 5
3
4
4.1
5
8.22.1
8.22.1.1 Internal RC Oscillator (IRC) . . . . . . . . . . . . . . 25
8.22.1.2 Crystal Oscillator (SysOsc) . . . . . . . . . . . . . . 25
8.22.1.3 Internal Low-power Oscillator and Watchdog
Oscillator (WDOsc) . . . . . . . . . . . . . . . . . . . . 25
8.22.2
8.22.3
8.22.4
8.22.5
8.22.6
8.22.6.1 Power profiles . . . . . . . . . . . . . . . . . . . . . . . . 26
8.22.6.2 Sleep mode . . . . . . . . . . . . . . . . . . . . . . . . . . 26
8.22.6.3 Deep-sleep mode. . . . . . . . . . . . . . . . . . . . . . 27
8.22.6.4 Power-down mode . . . . . . . . . . . . . . . . . . . . . 27
8.22.6.5 Deep power-down mode . . . . . . . . . . . . . . . . 27
6
7
7.1
7.2
Pinning information. . . . . . . . . . . . . . . . . . . . . . 6
Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 7
Clock input . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
System PLL . . . . . . . . . . . . . . . . . . . . . . . . . . 25
Clock output . . . . . . . . . . . . . . . . . . . . . . . . . . 26
Wake-up process . . . . . . . . . . . . . . . . . . . . . . 26
Power control . . . . . . . . . . . . . . . . . . . . . . . . . 26
8
8.1
8.2
8.3
8.4
8.5
8.6
8.6.1
8.6.2
8.7
8.8
8.8.1
8.9
8.10
8.10.1
8.11
8.11.1
8.12
8.12.1
8.12.2
8.13
8.13.1
8.14
8.14.1
8.15
8.15.1
8.16
8.16.1
8.16.2
8.17
8.17.1
8.18
8.18.1
8.19
8.19.1
8.20
Functional description . . . . . . . . . . . . . . . . . . 12
ARM Cortex-M0+ core . . . . . . . . . . . . . . . . . . 12
On-chip flash program memory . . . . . . . . . . . 12
On-chip SRAM . . . . . . . . . . . . . . . . . . . . . . . . 12
On-chip ROM . . . . . . . . . . . . . . . . . . . . . . . . . 12
Memory map. . . . . . . . . . . . . . . . . . . . . . . . . . 12
Nested Vectored Interrupt Controller (NVIC) . 13
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Interrupt sources. . . . . . . . . . . . . . . . . . . . . . . 14
System tick timer . . . . . . . . . . . . . . . . . . . . . . 14
I/O configuration . . . . . . . . . . . . . . . . . . . . . . . 14
Standard I/O pad configuration. . . . . . . . . . . . 14
Switch Matrix (SWM) . . . . . . . . . . . . . . . . . . . 15
Fast General-Purpose parallel I/O (GPIO) . . . 16
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Pin interrupt/pattern match engine . . . . . . . . . 16
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
DMA controller . . . . . . . . . . . . . . . . . . . . . . . . 17
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
DMA trigger input MUX (TRIGMUX). . . . . . . . 17
USART0/1/2 . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
SPI0/1. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
I2C-bus interface (I2C0/1/2/3) . . . . . . . . . . . . 18
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
SCTimer/PWM . . . . . . . . . . . . . . . . . . . . . . . . 19
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
SCTimer/PWM input MUX (INPUT MUX). . . . 20
Multi-Rate Timer (MRT) . . . . . . . . . . . . . . . . . 21
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Windowed WatchDog Timer (WWDT) . . . . . . 21
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Self-Wake-up Timer (WKT). . . . . . . . . . . . . . . 21
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Analog comparator (ACMP) . . . . . . . . . . . . . . 22
8.23
System control . . . . . . . . . . . . . . . . . . . . . . . . 28
Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
Brownout detection . . . . . . . . . . . . . . . . . . . . 28
Code security (Code Read Protection - CRP) 29
APB interface . . . . . . . . . . . . . . . . . . . . . . . . . 29
AHBLite . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
Emulation and debugging . . . . . . . . . . . . . . . 30
8.23.1
8.23.2
8.23.3
8.23.4
8.23.5
8.24
9
Limiting values . . . . . . . . . . . . . . . . . . . . . . . . 31
Thermal characteristics . . . . . . . . . . . . . . . . . 32
10
11
Static characteristics . . . . . . . . . . . . . . . . . . . 33
General operating conditions . . . . . . . . . . . . . 33
Supply pins. . . . . . . . . . . . . . . . . . . . . . . . . . . 34
Electrical pin characteristics. . . . . . . . . . . . . . 36
Power consumption . . . . . . . . . . . . . . . . . . . . 39
CoreMark data . . . . . . . . . . . . . . . . . . . . . . . . 45
Peripheral power consumption. . . . . . . . . . . . 46
Electrical pin characteristics. . . . . . . . . . . . . . 47
11.1
11.2
11.3
11.4
11.5
11.6
11.7
12
12.1
12.2
12.3
Dynamic characteristics. . . . . . . . . . . . . . . . . 51
Power-up ramp conditions . . . . . . . . . . . . . . . 51
Flash/EEPROM memory . . . . . . . . . . . . . . . . 51
External clock for the oscillator in slave mode 52
Internal oscillators . . . . . . . . . . . . . . . . . . . . . 53
I/O pins. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
WKTCLKIN pin (wake-up clock input) . . . . . . 54
SCTimer/PWM output timing . . . . . . . . . . . . . 54
12.4
12.4.1
12.4.2
12.4.3
12.4.4
12.4.5
12.4.6
I2
C-bus . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
SPI interfaces. . . . . . . . . . . . . . . . . . . . . . . . . 57
USART interface . . . . . . . . . . . . . . . . . . . . . . 60
continued >>
LPC82x
All information provided in this document is subject to legal disclaimers.
© NXP Semiconductors N.V. 2021. All rights reserved.
Product data sheet
Rev. 1.4 — 19 March 2021
81 of 82
LPC82x
NXP Semiconductors
32-bit ARM Cortex-M0+ microcontroller
13
Characteristics of analog peripherals . . . . . . 61
13.1
13.2
13.3
BOD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
ADC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 62
Comparator and internal voltage reference . . 65
14
14.1
14.2
Application information. . . . . . . . . . . . . . . . . . 68
XTAL input . . . . . . . . . . . . . . . . . . . . . . . . . . . 68
XTAL Printed-Circuit Board (PCB) layout
guidelines . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69
Connecting power, clocks, and debug
14.3
functions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70
Termination of unused pins. . . . . . . . . . . . . . . 71
Pin states in different power modes . . . . . . . . 72
14.4
14.5
15
16
17
18
19
Package outline . . . . . . . . . . . . . . . . . . . . . . . . 73
Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
Abbreviations. . . . . . . . . . . . . . . . . . . . . . . . . . 77
References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77
Revision history. . . . . . . . . . . . . . . . . . . . . . . . 78
20
Legal information. . . . . . . . . . . . . . . . . . . . . . . 79
Data sheet status . . . . . . . . . . . . . . . . . . . . . . 79
Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . 79
Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 79
Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 80
20.1
20.2
20.3
20.4
21
22
Contact information. . . . . . . . . . . . . . . . . . . . . 80
Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81
How To Reach Us
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products, and NXP Semiconductors accepts no liability for any assistance with applications or customer product
Table continues on the next page...
design. It is customer’s sole responsibility to determine whether the NXP Semiconductors product is suitable and fit
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Limiting values — Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of
IEC 60134) will cause permanent damage to the device. Limiting values are stress ratings only and (proper) operation
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present) or the Characteristics sections of this document is not warranted. Constant or repeated exposure to limiting
values will permanently and irreversibly affect the quality and reliability of the device.
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Table continues on the next page...
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Date of release: 03/19/2021
Document identifier:
LPC82X
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