BUK7Y13-40B_08 [NXP]

N-channel TrenchMOS standard level FET; N沟道的TrenchMOS标准水平FET
BUK7Y13-40B_08
型号: BUK7Y13-40B_08
厂家: NXP    NXP
描述:

N-channel TrenchMOS standard level FET
N沟道的TrenchMOS标准水平FET

文件: 总12页 (文件大小:191K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
BUK7Y13-40B  
N-channel TrenchMOS standard level FET  
Rev. 03 — 26 May 2008  
Product data sheet  
1. Product profile  
1.1 General description  
Standard level N-channel enhancement mode Field-Effect Transistor (FET) in a plastic  
package using NXP High-Performance Automotive (HPA) TrenchMOS technology. This  
product has been designed and qualified to the appropriate AEC standard for use in  
automotive critical applications.  
1.2 Features and benefits  
„ 175 °C rated  
„ Q101 compliant  
„ Suitable for standard level gate drive  
sources  
„ Suitable for thermally demanding  
environments due to 175 °C rating  
1.3 Applications  
„ 12 V loads  
„ Air bag  
„ Automotive ABS systems  
„ Fuel pump and injection  
„ Automotive transmission control  
„ Motors, lamps and solenoids  
1.4 Quick reference data  
Table 1.  
Quick reference  
Symbol Parameter  
Conditions  
Min Typ Max Unit  
VDS  
ID  
drain-source voltage  
drain current  
Tj 25 °C; Tj 175 °C  
-
-
-
-
40  
58  
V
A
VGS = 10 V; Tmb = 25 °C;  
see Figure 1 and 4  
Ptot  
total power dissipation Tmb = 25 °C; see Figure 2  
-
-
-
85  
-
W
Dynamic characteristics  
QGD gate-drain charge  
ID = 10 A; VDS = 32 V;  
5
nC  
VGS = 10 V; see Figure 14  
Static characteristics  
RDSon drain-source on-state  
resistance  
VGS = 10 V; ID = 25 A;  
Tj = 25 °C; see Figure 13 and  
12  
-
-
11  
-
13  
85  
mΩ  
Avalanche ruggedness  
EDS(AL)S non-repetitive  
drain-source  
ID = 58 A; Vsup 40 V;  
RGS = 50 Ω; VGS = 10 V;  
Tj(init) = 25 °C; unclamped  
mJ  
avalanche energy  
BUK7Y13-40B  
NXP Semiconductors  
N-channel TrenchMOS standard level FET  
2. Pinning information  
Table 2.  
Pin  
Pinning  
Symbol Description  
Simplified outline  
Graphic symbol  
1, 2, 3  
4
S
G
D
source  
gate  
D
mb  
mb  
mounting base;  
connected to drain  
G
mbb076  
S
1
2 3 4  
SOT669 (LFPAK)  
3. Ordering information  
Table 3.  
Ordering information  
Type number  
Package  
Name  
Description  
plastic single-ended surface-mounted package (LFPAK); 4 leads  
Version  
BUK7Y13-40B  
LFPAK  
SOT669  
4. Limiting values  
Table 4.  
Limiting values  
In accordance with the Absolute Maximum Rating System (IEC 60134).  
Symbol Parameter  
Conditions  
Min  
Max  
40  
Unit  
V
VDS  
VDGR  
VGS  
ID  
drain-source voltage  
Tj 25 °C; Tj 175 °C  
RGS = 20 kΩ  
-
drain-gate voltage  
gate-source voltage  
drain current  
-
40  
V
20  
20  
V
Tmb = 25 °C; VGS = 10 V; see Figure 1 and 4  
Tmb = 175 °C; VGS = 10 V; see Figure 1  
Tmb = 25 °C; tp 10 μs; pulsed; see Figure 4  
Tmb = 25 °C; see Figure 2  
-
58  
A
-
41  
A
IDM  
Ptot  
Tstg  
Tj  
peak drain current  
-
234  
85  
A
total power dissipation  
storage temperature  
junction temperature  
-
W
°C  
°C  
-55  
-55  
175  
175  
Avalanche ruggedness  
EDS(AL)S non-repetitive  
ID = 58 A; Vsup 40 V; RGS = 50 Ω;  
VGS = 10 V; Tj(init) = 25 °C; unclamped  
-
-
85  
-
mJ  
J
drain-source avalanche  
energy  
[1][2]  
[3]  
EDS(AL)R repetitive drain-source  
avalanche energy  
see Figure 3  
Source-drain diode  
IS  
source current  
Tmb = 25 °C  
-
-
58  
A
A
ISM  
peak source current  
tp 10 μs; pulsed; Tmb = 25 °C  
234  
[1] Single-pulse avalanche rating limited by maximum junction temperature of 175 °C.  
[2] Repetitive avalanche rating limited by an average junction temperature of 170 °C.  
[3] Refer to application note AN10273 for further information.  
BUK7Y13-40B_3  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 03 — 26 May 2008  
2 of 12  
BUK7Y13-40B  
NXP Semiconductors  
N-channel TrenchMOS standard level FET  
03na19  
003aab217  
120  
60  
ID  
P
der  
(A)  
(%)  
80  
40  
20  
0
40  
0
0
50  
100  
150  
200  
0
50  
100  
150  
200  
T
mb (°C)  
T
mb  
(°C)  
P
tot  
V
• 10V  
GS  
P
=
× 100 %  
der  
P
(
)
tot 25°C  
Fig 1. Continuous drain current as a function of  
mounting base temperature  
Fig 2. Normalized total power dissipation as a  
function of mounting base temperature  
003aab220  
102  
(1)  
IAL  
(A)  
10  
(2)  
(3)  
1
10-1  
10-3  
10-2  
10-1  
1
10  
tAL (ms)  
(1) Singleípulse;T = 25 °C.  
j
(2) Singleípulse;T = 150 °C.  
j
(3) Repetitive.  
Fig 3. Single-shot and repetitive avalanche rating; avalanche current as a function of avalanche period  
BUK7Y13-40B_3  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 03 — 26 May 2008  
3 of 12  
BUK7Y13-40B  
NXP Semiconductors  
N-channel TrenchMOS standard level FET  
003aab218  
3
10  
Limit R  
= V / I  
DS D  
I
D
DSon  
(A)  
2
10  
t
p
= 10 μs  
100 μs  
10  
1 ms  
DC  
10 ms  
1
100 ms  
1  
10  
2
1
10  
10  
V
DS  
(V)  
T
= 25 °C; I  
is single pulse  
mb  
DM  
Fig 4. Safe operating area; continuous and peak drain currents as a function of drain-source voltage  
5. Thermal characteristics  
Table 5.  
Symbol  
Rth(j-mb)  
Thermal characteristics  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
thermal resistance  
from junction to  
mounting base  
see Figure 5  
-
-
1.8  
K/W  
03nm01  
10  
Zth (j-mb)  
(K/W)  
1
10-1  
10-2  
δ = 0.5  
0.2  
0.1  
tp  
T
P
δ =  
0.05  
0.02  
t
tp  
T
single shot  
10-6  
10-5  
10-4  
10-3  
10-2  
10-1  
1
tp (s)  
Fig 5. Transient thermal impedance from junction to mounting base as a function of pulse duration  
BUK7Y13-40B_3  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 03 — 26 May 2008  
4 of 12  
BUK7Y13-40B  
NXP Semiconductors  
N-channel TrenchMOS standard level FET  
6. Characteristics  
Table 6.  
Symbol  
Characteristics  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
Static characteristics  
V(BR)DSS drain-source  
breakdown voltage  
ID = 250 μA; VGS = 0 V;  
Tj = 25 °C  
40  
36  
2
-
-
V
ID = 250 μA; VGS = 0 V;  
Tj = -55 °C  
-
-
V
VGS(th)  
gate-source threshold ID = 1 mA; VDS = VGS; Tj = 25 °C;  
3
-
4
V
voltage  
see Figure 10 and 11  
ID = 1 mA; VDS = VGS  
;
-
4.4  
-
V
Tj = -55 °C; see Figure 10  
ID = 1 mA; VDS = VGS  
Tj = 175 °C; see Figure 10  
;
1
-
V
IDSS  
drain leakage current VDS = 40 V; VGS = 0 V;  
-
-
500  
μA  
Tj = 175 °C  
VDS = 40 V; VGS = 0 V; Tj = 25 °C  
-
-
-
0.02  
2
1
μA  
nA  
nA  
IGSS  
gate leakage current VDS = 0 V; VGS = 20 V; Tj = 25 °C  
100  
100  
VDS = 0 V; VGS = -20 V;  
2
Tj = 25 °C  
RDSon  
drain-source on-state VGS = 10 V; ID = 25 A;  
-
-
-
25  
13  
mΩ  
mΩ  
resistance  
Tj = 175 °C; see Figure 12  
VGS = 10 V; ID = 25 A; Tj = 25 °C;  
11  
see Figure 13 and 12  
Source-drain diode  
VSD  
source-drain voltage  
IS = 25 A; VGS = 25 V; Tj = 25 °C;  
-
0.85  
1.2  
V
see Figure 16  
trr  
reverse recovery time IS = 20 A; dIS/dt = 100 A/μs;  
-
-
41  
22  
-
-
ns  
VGS = 0 V; VDS = 30 V  
Qr  
recovered charge  
nC  
Dynamic characteristics  
QG(tot)  
QGS  
QGD  
Ciss  
total gate charge  
ID = 10 A; VDS = 32 V;  
VGS = 10 V; see Figure 14  
-
-
-
-
-
-
19  
6
-
nC  
nC  
nC  
pF  
pF  
pF  
gate-source charge  
gate-drain charge  
input capacitance  
output capacitance  
-
5
-
VGS = 0 V; VDS = 25 V;  
f = 1 MHz; Tj = 25 °C;  
see Figure 15  
983  
280  
138  
1311  
336  
189  
Coss  
Crss  
reverse transfer  
capacitance  
td(on)  
tr  
td(off)  
tf  
turn-on delay time  
rise time  
VDS = 30 V; RL = 2.5 Ω;  
VGS = 10 V; RG(ext) = 10 Ω  
-
-
-
-
9
-
-
-
-
ns  
ns  
ns  
ns  
25  
35  
27  
turn-off delay time  
fall time  
BUK7Y13-40B_3  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 03 — 26 May 2008  
5 of 12  
BUK7Y13-40B  
NXP Semiconductors  
N-channel TrenchMOS standard level FET  
003aab395  
003aab394  
20  
160  
I
D
20 10 9.5  
R
DSon  
(mΩ)  
(A)  
9
8.5  
120  
8
15  
7.5  
7
80  
40  
0
6.5  
10  
6
5.5  
5
V
GS  
(V) = 4.5  
5
4
8
12  
16  
20  
0
2
2
6
8
10  
(V)  
V
GS  
(V)  
V
DS  
T = 25 °C  
T = 25 °C; I = 25 A  
j D  
j
Fig 6. Output characteristics: drain current as a  
function of drain-source voltage; typical values  
Fig 7. Drain-source on-state resistance as a function  
of gate-source voltage; typical values  
003aab401  
003aab400  
70  
50  
I
D
g
(S)  
fs  
(A)  
40  
60  
30  
20  
10  
0
50  
40  
30  
T = 175 °C  
j
T = 25 °C  
j
5
10  
15  
20  
25  
30  
0
2
4
6
I
D
(A)  
V
GS  
(V)  
V
= 25V  
T = 25 °C;V = 25V  
j DS  
DS  
Fig 8. Transfer characteristics: drain current as a  
function of gate-source voltage; typical values  
Fig 9. Forward transconductance as a function of  
drain current; typical values  
BUK7Y13-40B_3  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 03 — 26 May 2008  
6 of 12  
BUK7Y13-40B  
NXP Semiconductors  
N-channel TrenchMOS standard level FET  
03aa32  
03aa35  
1  
2  
3  
4  
5  
6  
5
10  
V
I
D
GS(th)  
(V)  
(A)  
min  
typ  
max  
4
3
2
1
0
10  
10  
10  
10  
10  
max  
typ  
min  
60  
0
60  
120  
180  
0
2
4
6
T (°C)  
V
GS  
(V)  
j
I
= 1 mA;V = V  
T = 25 °C;V = V  
j DS GS  
D
DS  
GS  
Fig 10. Gate-source threshold voltage as a function of  
junction temperature  
Fig 11. Sub-threshold drain current as a function of  
gate-source voltage  
003aab851  
003aab396  
2
30  
7
8
V
GS  
(V) = 6  
a
R
DSon  
(mΩ)  
1.5  
20  
10  
1
0.5  
0
20  
10  
0
60  
0
60  
120  
180  
0
40  
80  
120  
160  
T (°C)  
j
I
D
(A)  
R
DSon  
T = 25 °C  
j
a =  
R
(
)
DSon 25°C  
Fig 12. Normalized drain-source on-state resistance  
factor as a function of junction temperature  
Fig 13. Drain-source on-state resistance as a function  
of drain current; typical values  
BUK7Y13-40B_3  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 03 — 26 May 2008  
7 of 12  
BUK7Y13-40B  
NXP Semiconductors  
N-channel TrenchMOS standard level FET  
003aab399  
003aab397  
10  
1600  
V
(V)  
GS  
C
(pF)  
C
8
6
4
2
0
iss  
V
DS  
= 14 V  
1200  
800  
400  
0
V
= 32 V  
DS  
C
oss  
C
rss  
1  
2
0
8
16  
24  
10  
1
10  
10  
Q
(nC)  
V
DS  
(V)  
G
T = 25 °C; I = 10 A  
V = 0V; f = 1 MHz  
GS  
j
D
Fig 14. Gate-source voltage as a function of gate  
charge; typical values  
Fig 15. Input, output and reverse transfer capacitances  
as a function of drain-source voltage; typical  
values  
003aab398  
60  
I
s
(A)  
40  
T = 175 °C  
j
20  
T = 25 °C  
j
0
0
0.2  
0.4  
0.6  
0.8  
V
1.0  
(V)  
SD  
V
= 0V  
GS  
Fig 16. Source current as a function of source-drain voltage; typical values  
BUK7Y13-40B_3  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 03 — 26 May 2008  
8 of 12  
BUK7Y13-40B  
NXP Semiconductors  
N-channel TrenchMOS standard level FET  
7. Package outline  
Plastic single-ended surface-mounted package (LFPAK); 4 leads  
SOT669  
A
2
E
A
C
c
E
1
b
2
2
b
3
L
1
mounting  
base  
b
4
D
1
D
H
L
2
1
2
3
4
X
e
w
M
c
A
b
1/2 e  
A
(A )  
3
C
A
1
θ
L
detail X  
y
C
0
2.5  
5 mm  
scale  
DIMENSIONS (mm are the original dimensions)  
(1)  
D
(1)  
D
(1)  
(1)  
1
A
A
A
H
L
L
L
2
w
y
θ
UNIT  
A
b
b
b
b
c
c
E
E
1
e
1
2
3
1
2
3
4
2
max  
1.20 0.15 1.10  
1.01 0.00 0.95  
0.50 4.41 2.2 0.9 0.25 0.30 4.10  
0.35 3.62 2.0 0.7 0.19 0.24 3.80  
5.0 3.3  
4.8 3.1  
6.2 0.85 1.3 1.3  
5.8 0.40 0.8 0.8  
8°  
0°  
mm  
0.25  
4.20  
1.27  
0.25 0.1  
Note  
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.  
REFERENCES  
OUTLINE  
EUROPEAN  
PROJECTION  
ISSUE DATE  
VERSION  
IEC  
JEDEC  
JEITA  
04-10-13  
06-03-16  
SOT669  
MO-235  
Fig 17. Package outline SOT669 (LFPAK)  
BUK7Y13-40B_3  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 03 — 26 May 2008  
9 of 12  
BUK7Y13-40B  
NXP Semiconductors  
N-channel TrenchMOS standard level FET  
8. Revision history  
Table 7.  
Revision history  
Document ID  
Release date  
Data sheet status  
Change notice  
Supersedes  
BUK7Y13-40B_3  
Modifications:  
20080526  
Product data sheet  
-
BUK7Y13-40B_2  
Table 5, maximum thermal resistance value updated  
BUK7Y13-40B_2  
BUK7Y13-40B_1  
20071002  
Product data sheet  
-
BUK7Y13-40B_1  
-
20070924  
Product data sheet  
-
BUK7Y13-40B_3  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 03 — 26 May 2008  
10 of 12  
BUK7Y13-40B  
NXP Semiconductors  
N-channel TrenchMOS standard level FET  
9. Legal information  
9.1  
Data sheet status  
Document status[1][2]  
Product status[3]  
Definition  
Objective [short] data sheet  
Development  
This document contains data from the objective specification for product development.  
This document contains data from the preliminary specification.  
This document contains the product specification.  
Preliminary [short] data sheet Qualification  
Product [short] data sheet Production  
[1]  
[2]  
[3]  
Please consult the most recently issued document before initiating or completing a design.  
The term ‘short data sheet’ is explained in section “Definitions”.  
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status  
information is available on the Internet at URL http://www.nxp.com.  
damage. NXP Semiconductors accepts no liability for inclusion and/or use of  
NXP Semiconductors products in such equipment or applications and  
therefore such inclusion and/or use is at the customer’s own risk.  
9.2  
Definitions  
Draft — The document is a draft version only. The content is still under  
internal review and subject to formal approval, which may result in  
modifications or additions. NXP Semiconductors does not give any  
representations or warranties as to the accuracy or completeness of  
information included herein and shall have no liability for the consequences of  
use of such information.  
Applications — Applications that are described herein for any of these  
products are for illustrative purposes only. NXP Semiconductors makes no  
representation or warranty that such applications will be suitable for the  
specified use without further testing or modification.  
Quick reference data — The Quick reference data is an extract of the  
product data given in the Limiting values and Characteristics sections of this  
document, and as such is not complete, exhaustive or legally binding.  
Short data sheet — A short data sheet is an extract from a full data sheet  
with the same product type number(s) and title. A short data sheet is intended  
for quick reference only and should not be relied upon to contain detailed and  
full information. For detailed and full information see the relevant full data  
sheet, which is available on request via the local NXP Semiconductors sales  
office. In case of any inconsistency or conflict with the short data sheet, the  
full data sheet shall prevail.  
Limiting values — Stress above one or more limiting values (as defined in  
the Absolute Maximum Ratings System of IEC 60134) may cause permanent  
damage to the device. Limiting values are stress ratings only and operation of  
the device at these or any other conditions above those given in the  
Characteristics sections of this document is not implied. Exposure to limiting  
values for extended periods may affect device reliability.  
Terms and conditions of sale — NXP Semiconductors products are sold  
subject to the general terms and conditions of commercial sale, as published  
at http://www.nxp.com/profile/terms, including those pertaining to warranty,  
intellectual property rights infringement and limitation of liability, unless  
explicitly otherwise agreed to in writing by NXP Semiconductors. In case of  
any inconsistency or conflict between information in this document and such  
terms and conditions, the latter will prevail.  
9.3  
Disclaimers  
General — Information in this document is believed to be accurate and  
reliable. However, NXP Semiconductors does not give any representations or  
warranties, expressed or implied, as to the accuracy or completeness of such  
information and shall have no liability for the consequences of use of such  
information.  
No offer to sell or license — Nothing in this document may be interpreted or  
construed as an offer to sell products that is open for acceptance or the grant,  
conveyance or implication of any license under any copyrights, patents or  
other industrial or intellectual property rights.  
Right to make changes — NXP Semiconductors reserves the right to make  
changes to information published in this document, including without  
limitation specifications and product descriptions, at any time and without  
notice. This document supersedes and replaces all information supplied prior  
to the publication hereof.  
Suitability for use — NXP Semiconductors products are not designed,  
authorized or warranted to be suitable for use in medical, military, aircraft,  
space or life support equipment, nor in applications where failure or  
malfunction of an NXP Semiconductors product can reasonably be expected  
to result in personal injury, death or severe property or environmental  
9.4  
Trademarks  
Notice: All referenced brands, product names, service names and trademarks  
are the property of their respective owners.  
TrenchMOS — is a trademark of NXP B.V.  
10. Contact information  
For additional information, please visit: http://www.nxp.com  
For sales office addresses, send an email to: salesaddresses@nxp.com  
BUK7Y13-40B_3  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 03 — 26 May 2008  
11 of 12  
BUK7Y13-40B  
NXP Semiconductors  
N-channel TrenchMOS standard level FET  
11. Contents  
1
Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
1.1  
1.2  
1.3  
1.4  
General description . . . . . . . . . . . . . . . . . . . . . 1  
Features and benefits. . . . . . . . . . . . . . . . . . . . 1  
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
Quick reference data . . . . . . . . . . . . . . . . . . . . 1  
2
3
4
5
6
7
8
Pinning information. . . . . . . . . . . . . . . . . . . . . . 2  
Ordering information. . . . . . . . . . . . . . . . . . . . . 2  
Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 2  
Thermal characteristics . . . . . . . . . . . . . . . . . . 4  
Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . 5  
Package outline . . . . . . . . . . . . . . . . . . . . . . . . . 9  
Revision history. . . . . . . . . . . . . . . . . . . . . . . . 10  
9
Legal information. . . . . . . . . . . . . . . . . . . . . . . 11  
Data sheet status . . . . . . . . . . . . . . . . . . . . . . 11  
Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . 11  
Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 11  
Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 11  
9.1  
9.2  
9.3  
9.4  
10  
11  
Contact information. . . . . . . . . . . . . . . . . . . . . 11  
Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12  
Please be aware that important notices concerning this document and the product(s)  
described herein, have been included in section ‘Legal information’.  
© NXP B.V. 2008.  
All rights reserved.  
For more information, please visit: http://www.nxp.com  
For sales office addresses, please send an email to: salesaddresses@nxp.com  
Date of release: 26 May 2008  
Document identifier: BUK7Y13-40B_3  

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