BF909,215 [NXP]

N-channel dual-gate MOSFET SOT-143 4-Pin;
BF909,215
型号: BF909,215
厂家: NXP    NXP
描述:

N-channel dual-gate MOSFET SOT-143 4-Pin

放大器 光电二极管 晶体管
文件: 总12页 (文件大小:323K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
BF909; BF909R  
N-channel dual gate MOS-FETs  
Rev. 02 — 19 November 2007  
Product data sheet  
IMPORTANT NOTICE  
Dear customer,  
As from October 1st, 2006 Philips Semiconductors has a new trade name  
- NXP Semiconductors, which will be used in future data sheets together with new contact  
details.  
In data sheets where the previous Philips references remain, please use the new links as  
shown below.  
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(email)  
The copyright notice at the bottom of each page (or elsewhere in the document,  
depending on the version)  
- © Koninklijke Philips Electronics N.V. (year). All rights reserved -  
is replaced with:  
- © NXP B.V. (year). All rights reserved. -  
If you have any questions related to the data sheet, please contact our nearest sales  
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NXP Semiconductors  
NXP Semiconductors  
Product specification  
N-channel dual gate MOS-FETs  
BF909; BF909R  
transistor consists of an amplifier MOS-FET with source  
and substrate interconnected and an internal bias circuit to  
ensure good cross-modulation performance during AGC.  
FEATURES  
Specially designed for use at 5 V supply voltage  
High forward transfer admittance  
Short channel transistor with high forward transfer  
admittance to input capacitance ratio  
CAUTION  
The device is supplied in an antistatic package. The  
gate-source input must be protected against static  
discharge during transport or handling.  
Low noise gain controlled amplifier up to 1 GHz  
Superior cross-modulation performance during AGC.  
APPLICATIONS  
PINNING  
VHF and UHF applications with 3 to 7 V supply voltage  
such as television tuners and professional  
communications equipment.  
PIN  
1
SYMBOL  
DESCRIPTION  
s, b  
d
source  
drain  
2
3
g2  
g1  
gate 2  
gate 1  
DESCRIPTION  
4
Enhancement type field-effect transistor in a plastic  
microminiature SOT143 or SOT143R package. The  
d
d
handbook, halfpage  
handbook, halfpage  
3
4
4
3
2
g
2
g
2
g
g
1
1
2
1
1
s,b  
s,b  
Top view  
MAM125 - 1  
Top view  
MAM124  
BF909 marking code: %M3.  
BF909R marking code: %M4.  
Fig.1 Simplified outline (SOT143) and symbol.  
Fig.2 Simplified outline (SOT143R) and symbol.  
QUICK REFERENCE DATA  
SYMBOL  
VDS  
PARAMETER  
drain-source voltage  
CONDITIONS  
MIN.  
TYP.  
MAX.  
UNIT  
7
V
ID  
drain current  
40  
mA  
mW  
°C  
Ptot  
Tj  
total power dissipation  
operating junction temperature  
forward transfer admittance  
input capacitance at gate 1  
reverse transfer capacitance  
noise figure  
200  
150  
50  
yfs  
36  
43  
3.6  
35  
2
mS  
pF  
Cig1-s  
Crs  
F
4.3  
50  
f = 1 MHz  
f = 800 MHz  
fF  
2.8  
dB  
Rev. 02 - 19 November 2007  
2 of 12  
NXP Semiconductors  
Product specification  
N-channel dual gate MOS-FETs  
BF909; BF909R  
LIMITING VALUES  
In accordance with the Absolute Maximum Rating System (IEC 134).  
SYMBOL  
PARAMETER  
CONDITIONS  
MIN.  
MAX.  
UNIT  
VDS  
ID  
drain-source voltage  
drain current  
7
V
40  
mA  
mA  
mA  
IG1  
IG2  
Ptot  
gate 1 current  
±10  
±10  
gate 2 current  
total power dissipation  
BF909  
see Fig.3  
up to Tamb = 50 °C; note 1  
up to Tamb = 40 °C; note 1  
200  
200  
+150  
150  
mW  
mW  
°C  
BF909R  
Tstg  
Tj  
storage temperature  
operating junction temperature  
65  
°C  
Note  
1. Device mounted on a printed-circuit board.  
MLB935  
250  
handbook, halfpage  
P
tot  
(mW)  
200  
150  
100  
BF909R  
BF909  
50  
0
0
50  
100  
150  
200  
o
T
( C)  
amb  
Fig.3 Power derating curves.  
Rev. 02 - 19 November 2007  
3 of 12  
NXP Semiconductors  
Product specification  
N-channel dual gate MOS-FETs  
BF909; BF909R  
THERMAL CHARACTERISTICS  
SYMBOL  
PARAMETER  
CONDITIONS  
VALUE  
UNIT  
Rth j-a  
thermal resistance from junction to ambient  
note 1  
BF909  
500  
550  
K/W  
K/W  
BF909R  
Rth j-s  
thermal resistance from junction to soldering point  
note 2  
BF909  
Ts = 92 °C  
Ts = 78 °C  
290  
360  
K/W  
K/W  
BF909R  
Notes  
1. Device mounted on a printed-circuit board.  
2. Ts is the temperature at the soldering point of the source lead.  
STATIC CHARACTERISTICS  
Tj = 25 °C; unless otherwise specified.  
SYMBOL  
PARAMETER  
CONDITIONS  
MIN.  
MAX.  
15  
UNIT  
V(BR)G1-SS  
V(BR)G2-SS  
V(F)S-G1  
gate 1-source breakdown voltage  
gate 2-source breakdown voltage  
forward source-gate 1 voltage  
forward source-gate 2 voltage  
gate 1-source threshold voltage  
VG2-S = VDS = 0; IG1-S = 10 mA  
VG1-S = VDS = 0; IG2-S = 10 mA  
VG2-S = VDS = 0; IS-G1 = 10 mA  
VG1-S = VDS = 0; IS-G2 = 10 mA  
6
6
V
V
V
V
V
15  
1.5  
1.5  
1
0.5  
0.5  
0.3  
V(F)S-G2  
VG1-S(th)  
VG2-S = 4 V; VDS = 5 V;  
ID = 20 µA  
VG2-S(th)  
IDSX  
gate 2-source threshold voltage  
drain-source current  
VG1-S = VDS = 5 V; ID = 20 µA  
0.3  
12  
1.2  
20  
V
VG2-S = 4 V; VDS = 5 V;  
mA  
RG1 = 120 k; note 1  
IG1-SS  
IG2-SS  
gate 1 cut-off current  
gate 2 cut-off current  
VG1-S = 5 V; VG2-S = VDS = 0  
VG2-S = 5 V; VG1-S = VDS = 0  
50  
50  
nA  
nA  
Note  
1. RG1 connects gate 1 to VGG = 5 V; see Fig.18.  
DYNAMIC CHARACTERISTICS  
Common source; Tamb = 25 °C; VDS = 5 V; VG2-S = 4 V; ID = 15 mA; unless otherwise specified.  
SYMBOL  
PARAMETER  
CONDITIONS  
MIN.  
36  
TYP.  
43  
MAX.  
50  
UNIT  
mS  
yfs  
Cig1-s  
Cig2-s  
Cos  
Crs  
forward transfer admittance pulsed; Tj = 25 °C  
input capacitance at gate 1  
input capacitance at gate 2  
drain-source capacitance  
f = 1 MHz  
f = 1 MHz  
f = 1 MHz  
3.6  
2.3  
2.3  
35  
2
4.3  
3
pF  
pF  
pF  
fF  
3
reverse transfer capacitance f = 1 MHz  
noise figure f = 800 MHz; GS = GSopt; BS = BSopt  
50  
2.8  
F
dB  
Rev. 02 - 19 November 2007  
4 of 12  
NXP Semiconductors  
Product specification  
N-channel dual gate MOS-FETs  
BF909; BF909R  
MLB937  
MLB936  
30  
110  
handbook, halfpage  
handbook, halfpage  
V
= 4 V  
3 V 2.5 V  
2 V  
G2  
S
I
V
D
unw  
(mA)  
(dBµV)  
20  
100  
1.5 V  
1 V  
90  
80  
10  
0
0
0
10  
20  
30  
40  
50  
0.4  
0.8  
1.2  
1.6  
V
2.0  
(V)  
gain reduction (dB)  
G1  
S
VDS = 5 V; VGG = 5 V; fw = 50 MHz.  
unw = 60 MHz; Tamb = 25 °C; RG1 = 120 k.  
f
VDS = 5 V.  
Fig.4 Unwanted voltage for 1% cross-modulation  
as a function of gain reduction; typical  
values; see Fig.18.  
Tj = 25 °C.  
Fig.5 Transfer characteristics; typical values.  
MLB938  
MLB939  
200  
30  
handbook, halfpage  
handbook, halfpage  
V
= 1.4 V  
S
G1  
I
V
= 4 V  
S
G1  
(µA)  
G2  
I
D
(mA)  
1.3 V  
1.2 V  
1.1 V  
150  
3.5 V  
20  
3 V  
100  
50  
0
2.5 V  
2 V  
1.0 V  
0.9 V  
10  
0
0
0
1
2
3
2
4
6
8
10  
(V)  
V
(V)  
S
G1  
V
DS  
VDS = 5 V.  
VG2-S = 4 V.  
Tj = 25 °C.  
VDS = 5 V.  
Tj = 25 °C.  
Fig.7 Gate 1 current as a function of gate 1  
voltage; typical values.  
Fig.6 Output characteristics; typical values.  
Rev. 02 - 19 November 2007  
5 of 12  
NXP Semiconductors  
Product specification  
N-channel dual gate MOS-FETs  
BF909; BF909R  
MLB941  
MLB940  
60  
25  
handbook, halfpage  
handbook, halfpage  
I
D
V
= 4 V  
S
G2  
y
(mA)  
20  
fs  
(mS)  
3.5 V  
3 V  
40  
15  
10  
5
2.5 V  
20  
2 V  
0
0
0
0
10  
20  
30  
20  
40  
60  
I
(µA)  
I
(mA)  
G1  
D
VDS = 5 V.  
VDS = 5 V; VG2-S = 4 V.  
Tj = 25 °C.  
Tj = 25 °C.  
Fig.8 Forward transfer admittance as a  
Fig.9 Drain current as a function of gate 1 current;  
typical values.  
function of drain current; typical values.  
MLB942  
MLB943  
16  
30  
handbook, halfpage  
handbook, halfpage  
I
D
R
= 47 k68 kΩ  
I
G1  
D
(mA)  
82 kΩ  
(mA)  
12  
100 kΩ  
20  
120 kΩ  
150 kΩ  
180 kΩ  
220 kΩ  
8
4
10  
0
0
0
2
4
6
0
2
4
6
8
V
(V)  
GG  
V
= V  
(V)  
DS  
GG  
VDS = 5 V; VG2-S = 4 V.  
VG2-S = 4 V.  
RG1 connected to VGG; Tj = 25 °C.  
RG1 = 120 k(connected to VGG); Tj = 25 °C.  
Fig.10 Drain current as a function of gate 1  
supply voltage (= VGG); typical values;  
see Fig.18.  
Fig.11 Drain current as a function of gate 1  
(= VGG) and drain supply voltage;  
typical values; see Fig.18.  
Rev. 02 - 19 November 2007  
6 of 12  
NXP Semiconductors  
Product specification  
N-channel dual gate MOS-FETs  
BF909; BF909R  
MLB944  
MLB945  
20  
40  
handbook, halfpage  
handbook, halfpage  
I
V
= 5 V  
D
GG  
I
G1  
(µA)  
(mA)  
16  
V
= 5 V  
GG  
4.5 V  
30  
4 V  
4.5 V  
3.5 V  
3 V  
4 V  
12  
8
3.5 V  
3 V  
20  
10  
4
0
0
0
0
2
4
6
2
4
6
V
(V)  
S
V
(V)  
S
G2  
G2  
VDS = 5 V; Tj = 25 °C.  
G1 = 120 k(connected to VGG).  
VDS = 5 V; Tj = 25 °C.  
R
RG1 = 120 k(connected to VGG).  
Fig.12 Drain current as a function of gate 2 voltage;  
typical values; see Fig.18.  
Fig.13 Gate 1 current as a function of gate 2  
voltage; typical values; see Fig.18.  
MLB947  
MLB946  
3
3
2
10  
10  
rs  
10  
handbook, halfpage  
y
y
ϕ
is  
(mS)  
rs  
(deg)  
(µS)  
ϕ
rs  
rs  
2
2
10  
10  
10  
b
is  
y
10  
10  
1
1
g
is  
1
1
10  
2
3
2
3
10  
10  
10  
10  
10  
10  
f (MHz)  
f (MHz)  
VDS = 5 V; VG2 = 4 V.  
VDS = 5 V; VG2 = 4 V.  
ID = 15 mA; Tamb = 25 °C.  
ID = 15 mA; Tamb = 25 °C.  
Fig.14 Input admittance as a function of frequency;  
typical values.  
Fig.15 Reverse transfer admittance and phase as  
a function of frequency; typical values.  
Rev. 02 - 19 November 2007  
7 of 12  
NXP Semiconductors  
Product specification  
N-channel dual gate MOS-FETs  
BF909; BF909R  
MLB949  
MLB948  
2
2
10  
10  
fs  
10  
handbook, halfpage  
y
os  
y
fs  
fs  
ϕ
y
(mS)  
b
fs  
os  
(deg)  
(mS)  
1
ϕ
g
10  
10  
os  
1
10  
2
1
10  
1
2
3
2
3
10  
10  
10  
10  
10  
10  
f (MHz)  
f (MHz)  
VDS = 5 V; VG2 = 4 V.  
D = 15 mA; Tamb = 25 °C.  
VDS = 5 V; VG2 = 4 V.  
I
ID = 15 mA; Tamb = 25 °C.  
Fig.16 Forward transfer admittance and phase as  
a function of frequency; typical values.  
Fig.17 Output admittance as a function of  
frequency; typical values.  
V
AGC  
R1  
10 kΩ  
C1  
4.7 nF  
C3 12 pF  
R3  
10 Ω  
R
L
L1  
C2  
DUT  
50 Ω  
350 nH  
C4  
C5  
2.2  
pF  
4.7 nF  
R
R2  
GEN  
R
G1  
50 Ω  
50 Ω  
4.7 nF  
V
I
V
MLD151  
GG  
V
DS  
Fig.18 Cross-modulation test set-up.  
Rev. 02 - 19 November 2007  
8 of 12  
NXP Semiconductors  
Product specification  
N-channel dual gate MOS-FETs  
BF909; BF909R  
Table 1 Scattering parameters: Tamb = 25 °C; VDS = 5 V; VG2-S = 4 V; ID = 15 mA  
s11  
s21  
s12  
s22  
f
MAGNITUDE ANGLE MAGNITUDE ANGLE MAGNITUDE ANGLE MAGNITUDE ANGLE  
(MHz)  
(ratio)  
(deg)  
(ratio)  
(deg)  
(ratio)  
(deg)  
(ratio)  
(deg)  
50  
0.985  
0.978  
0.957  
0.931  
0.899  
0.868  
0.848  
0.816  
0.792  
0.772  
0.754  
6.4  
12.6  
25.0  
36.5  
47.6  
57.4  
66.6  
74.6  
82.2  
89.3  
95.6  
4.064  
3.997  
3.886  
3.682  
3.484  
3.260  
3.053  
2.829  
2.652  
2.470  
2.328  
172.3  
164.9  
150.8  
137.3  
123.8  
111.7  
101.0  
90.3  
0.001  
0.002  
0.005  
0.006  
0.007  
0.007  
0.006  
0.005  
0.005  
0.005  
0.006  
86.9  
82.7  
74.3  
68.9  
59.6  
57.9  
58.5  
65.5  
83.3  
114.9  
138.7  
0.985  
0.982  
0.973  
0.960  
0.947  
0.936  
0.927  
0.919  
0.913  
0.910  
0.909  
3.2  
6.4  
100  
200  
300  
400  
500  
600  
700  
800  
900  
1000  
12.6  
18.6  
24.2  
29.6  
34.8  
39.8  
44.6  
49.5  
54.6  
79.9  
69.5  
59.5  
Table 2 Noise data: Tamb = 25 °C; VDS = 5 V; VG2-S = 4 V; ID = 15 mA  
Γopt  
f
Fmin  
(dB)  
rn  
0.581  
(MHz)  
(ratio)  
(deg)  
67.71  
800  
2.00  
0.603  
Rev. 02 - 19 November 2007  
9 of 12  
NXP Semiconductors  
Product specification  
N-channel dual gate MOS-FETs  
BF909; BF909R  
PACKAGE OUTLINES  
3.0  
2.8  
0.150  
B
1.9  
0.090  
A
B
M
0.75  
0.2  
A
0.60  
4
3
0.1  
max  
o
10  
max  
2.5  
max  
1.4  
1.2  
o
10  
max  
1
2
1.1  
max  
o
0.1 M  
A
B
MBC845  
30  
max  
0
0.1  
0
0.1  
0.88  
0.48  
1.7  
TOP VIEW  
Dimensions in mm.  
Fig.19 SOT143.  
3.0  
2.8  
B
0.150  
0.090  
1.9  
A
M
0.2  
0.40  
0.25  
A
3
4
0.1  
max  
o
10  
2.5  
max  
1.4  
1.2  
max  
o
10  
max  
2
1
1.1  
max  
0.48  
0.38  
0.88  
0.78  
o
MBC844  
30  
max  
1.7  
B
0.1 M  
TOP VIEW  
Dimensions in mm.  
Fig.20 SOT143R.  
Rev. 02 - 19 November 2007  
10 of 12  
BF909; BF909R  
NXP Semiconductors  
N-channel dual gate MOS-FETs  
Legal information  
Data sheet status  
Document status[1][2]  
Product status[3]  
Development  
Definition  
Objective [short] data sheet  
This document contains data from the objective specification for product development.  
This document contains data from the preliminary specification.  
This document contains the product specification.  
Preliminary [short] data sheet Qualification  
Product [short] data sheet Production  
[1]  
[2]  
[3]  
Please consult the most recently issued document before initiating or completing a design.  
The term ‘short data sheet’ is explained in section “Definitions”.  
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status  
information is available on the Internet at URL http://www.nxp.com.  
malfunction of an NXP Semiconductors product can reasonably be expected  
Definitions  
to result in personal injury, death or severe property or environmental  
damage. NXP Semiconductors accepts no liability for inclusion and/or use of  
NXP Semiconductors products in such equipment or applications and  
therefore such inclusion and/or use is at the customer’s own risk.  
Draft — The document is a draft version only. The content is still under  
internal review and subject to formal approval, which may result in  
modifications or additions. NXP Semiconductors does not give any  
representations or warranties as to the accuracy or completeness of  
information included herein and shall have no liability for the consequences of  
use of such information.  
Applications — Applications that are described herein for any of these  
products are for illustrative purposes only. NXP Semiconductors makes no  
representation or warranty that such applications will be suitable for the  
specified use without further testing or modification.  
Short data sheet — A short data sheet is an extract from a full data sheet  
with the same product type number(s) and title. A short data sheet is intended  
for quick reference only and should not be relied upon to contain detailed and  
full information. For detailed and full information see the relevant full data  
sheet, which is available on request via the local NXP Semiconductors sales  
office. In case of any inconsistency or conflict with the short data sheet, the  
full data sheet shall prevail.  
Limiting values — Stress above one or more limiting values (as defined in  
the Absolute Maximum Ratings System of IEC 60134) may cause permanent  
damage to the device. Limiting values are stress ratings only and operation of  
the device at these or any other conditions above those given in the  
Characteristics sections of this document is not implied. Exposure to limiting  
values for extended periods may affect device reliability.  
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subject to the general terms and conditions of commercial sale, as published  
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For additional information, please visit: http://www.nxp.com  
For sales office addresses, send an email to: salesaddresses@nxp.com  
Rev. 02 - 19 November 2007  
11 of 12  
BF909; BF909R  
NXP Semiconductors  
N-channel dual gate MOS-FETs  
Revision history  
Revision history  
Document ID  
BF909_N_2  
Modifications:  
BF909_1  
Release date  
20071119  
Data sheet status  
Change notice  
Supersedes  
Product data sheet  
-
BF909_1  
Fig.1 and 2 on page 2; Figure note changed  
19950425 Product specification  
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Please be aware that important notices concerning this document and the product(s)  
described herein, have been included in section ‘Legal information’.  
© NXP B.V. 2007.  
All rights reserved.  
For more information, please visit: http://www.nxp.com  
For sales office addresses, please send an email to: salesaddresses@nxp.com  
Date of release: 19 November 2007  
Document identifier: BF909_N_2  

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