BF909,215 [NXP]
N-channel dual-gate MOSFET SOT-143 4-Pin;型号: | BF909,215 |
厂家: | NXP |
描述: | N-channel dual-gate MOSFET SOT-143 4-Pin 放大器 光电二极管 晶体管 |
文件: | 总12页 (文件大小:323K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
BF909; BF909R
N-channel dual gate MOS-FETs
Rev. 02 — 19 November 2007
Product data sheet
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- NXP Semiconductors, which will be used in future data sheets together with new contact
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NXP Semiconductors
NXP Semiconductors
Product specification
N-channel dual gate MOS-FETs
BF909; BF909R
transistor consists of an amplifier MOS-FET with source
and substrate interconnected and an internal bias circuit to
ensure good cross-modulation performance during AGC.
FEATURES
• Specially designed for use at 5 V supply voltage
• High forward transfer admittance
• Short channel transistor with high forward transfer
admittance to input capacitance ratio
CAUTION
The device is supplied in an antistatic package. The
gate-source input must be protected against static
discharge during transport or handling.
• Low noise gain controlled amplifier up to 1 GHz
• Superior cross-modulation performance during AGC.
APPLICATIONS
PINNING
• VHF and UHF applications with 3 to 7 V supply voltage
such as television tuners and professional
communications equipment.
PIN
1
SYMBOL
DESCRIPTION
s, b
d
source
drain
2
3
g2
g1
gate 2
gate 1
DESCRIPTION
4
Enhancement type field-effect transistor in a plastic
microminiature SOT143 or SOT143R package. The
d
d
handbook, halfpage
handbook, halfpage
3
4
4
3
2
g
2
g
2
g
g
1
1
2
1
1
s,b
s,b
Top view
MAM125 - 1
Top view
MAM124
BF909 marking code: %M3.
BF909R marking code: %M4.
Fig.1 Simplified outline (SOT143) and symbol.
Fig.2 Simplified outline (SOT143R) and symbol.
QUICK REFERENCE DATA
SYMBOL
VDS
PARAMETER
drain-source voltage
CONDITIONS
MIN.
TYP.
MAX.
UNIT
−
−
−
−
−
−
−
−
7
V
ID
drain current
40
mA
mW
°C
Ptot
Tj
total power dissipation
operating junction temperature
forward transfer admittance
input capacitance at gate 1
reverse transfer capacitance
noise figure
200
150
50
yfs
36
−
43
3.6
35
2
mS
pF
Cig1-s
Crs
F
4.3
50
f = 1 MHz
f = 800 MHz
−
fF
−
2.8
dB
Rev. 02 - 19 November 2007
2 of 12
NXP Semiconductors
Product specification
N-channel dual gate MOS-FETs
BF909; BF909R
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 134).
SYMBOL
PARAMETER
CONDITIONS
MIN.
MAX.
UNIT
VDS
ID
drain-source voltage
drain current
−
−
−
−
7
V
40
mA
mA
mA
IG1
IG2
Ptot
gate 1 current
±10
±10
gate 2 current
total power dissipation
BF909
see Fig.3
up to Tamb = 50 °C; note 1
up to Tamb = 40 °C; note 1
−
−
200
200
+150
150
mW
mW
°C
BF909R
Tstg
Tj
storage temperature
operating junction temperature
−65
−
°C
Note
1. Device mounted on a printed-circuit board.
MLB935
250
handbook, halfpage
P
tot
(mW)
200
150
100
BF909R
BF909
50
0
0
50
100
150
200
o
T
( C)
amb
Fig.3 Power derating curves.
Rev. 02 - 19 November 2007
3 of 12
NXP Semiconductors
Product specification
N-channel dual gate MOS-FETs
BF909; BF909R
THERMAL CHARACTERISTICS
SYMBOL
PARAMETER
CONDITIONS
VALUE
UNIT
Rth j-a
thermal resistance from junction to ambient
note 1
BF909
500
550
K/W
K/W
BF909R
Rth j-s
thermal resistance from junction to soldering point
note 2
BF909
Ts = 92 °C
Ts = 78 °C
290
360
K/W
K/W
BF909R
Notes
1. Device mounted on a printed-circuit board.
2. Ts is the temperature at the soldering point of the source lead.
STATIC CHARACTERISTICS
Tj = 25 °C; unless otherwise specified.
SYMBOL
PARAMETER
CONDITIONS
MIN.
MAX.
15
UNIT
V(BR)G1-SS
V(BR)G2-SS
V(F)S-G1
gate 1-source breakdown voltage
gate 2-source breakdown voltage
forward source-gate 1 voltage
forward source-gate 2 voltage
gate 1-source threshold voltage
VG2-S = VDS = 0; IG1-S = 10 mA
VG1-S = VDS = 0; IG2-S = 10 mA
VG2-S = VDS = 0; IS-G1 = 10 mA
VG1-S = VDS = 0; IS-G2 = 10 mA
6
6
V
V
V
V
V
15
1.5
1.5
1
0.5
0.5
0.3
V(F)S-G2
VG1-S(th)
VG2-S = 4 V; VDS = 5 V;
ID = 20 µA
VG2-S(th)
IDSX
gate 2-source threshold voltage
drain-source current
VG1-S = VDS = 5 V; ID = 20 µA
0.3
12
1.2
20
V
VG2-S = 4 V; VDS = 5 V;
mA
RG1 = 120 kΩ; note 1
IG1-SS
IG2-SS
gate 1 cut-off current
gate 2 cut-off current
VG1-S = 5 V; VG2-S = VDS = 0
VG2-S = 5 V; VG1-S = VDS = 0
−
−
50
50
nA
nA
Note
1. RG1 connects gate 1 to VGG = 5 V; see Fig.18.
DYNAMIC CHARACTERISTICS
Common source; Tamb = 25 °C; VDS = 5 V; VG2-S = 4 V; ID = 15 mA; unless otherwise specified.
SYMBOL
PARAMETER
CONDITIONS
MIN.
36
TYP.
43
MAX.
50
UNIT
mS
yfs
Cig1-s
Cig2-s
Cos
Crs
forward transfer admittance pulsed; Tj = 25 °C
input capacitance at gate 1
input capacitance at gate 2
drain-source capacitance
f = 1 MHz
f = 1 MHz
f = 1 MHz
−
−
−
−
−
3.6
2.3
2.3
35
2
4.3
3
pF
pF
pF
fF
3
reverse transfer capacitance f = 1 MHz
noise figure f = 800 MHz; GS = GSopt; BS = BSopt
50
2.8
F
dB
Rev. 02 - 19 November 2007
4 of 12
NXP Semiconductors
Product specification
N-channel dual gate MOS-FETs
BF909; BF909R
MLB937
MLB936
30
110
handbook, halfpage
handbook, halfpage
V
= 4 V
3 V 2.5 V
2 V
G2
S
I
V
D
unw
(mA)
(dBµV)
20
100
1.5 V
1 V
90
80
10
0
0
0
10
20
30
40
50
0.4
0.8
1.2
1.6
V
2.0
(V)
gain reduction (dB)
G1
S
VDS = 5 V; VGG = 5 V; fw = 50 MHz.
unw = 60 MHz; Tamb = 25 °C; RG1 = 120 kΩ.
f
VDS = 5 V.
Fig.4 Unwanted voltage for 1% cross-modulation
as a function of gain reduction; typical
values; see Fig.18.
Tj = 25 °C.
Fig.5 Transfer characteristics; typical values.
MLB938
MLB939
200
30
handbook, halfpage
handbook, halfpage
V
= 1.4 V
S
G1
I
V
= 4 V
S
G1
(µA)
G2
I
D
(mA)
1.3 V
1.2 V
1.1 V
150
3.5 V
20
3 V
100
50
0
2.5 V
2 V
1.0 V
0.9 V
10
0
0
0
1
2
3
2
4
6
8
10
(V)
V
(V)
S
G1
V
DS
VDS = 5 V.
VG2-S = 4 V.
Tj = 25 °C.
VDS = 5 V.
Tj = 25 °C.
Fig.7 Gate 1 current as a function of gate 1
voltage; typical values.
Fig.6 Output characteristics; typical values.
Rev. 02 - 19 November 2007
5 of 12
NXP Semiconductors
Product specification
N-channel dual gate MOS-FETs
BF909; BF909R
MLB941
MLB940
60
25
handbook, halfpage
handbook, halfpage
I
D
V
= 4 V
S
G2
y
(mA)
20
fs
(mS)
3.5 V
3 V
40
15
10
5
2.5 V
20
2 V
0
0
0
0
10
20
30
20
40
60
I
(µA)
I
(mA)
G1
D
VDS = 5 V.
VDS = 5 V; VG2-S = 4 V.
Tj = 25 °C.
Tj = 25 °C.
Fig.8 Forward transfer admittance as a
Fig.9 Drain current as a function of gate 1 current;
typical values.
function of drain current; typical values.
MLB942
MLB943
16
30
handbook, halfpage
handbook, halfpage
I
D
R
= 47 kΩ 68 kΩ
I
G1
D
(mA)
82 kΩ
(mA)
12
100 kΩ
20
120 kΩ
150 kΩ
180 kΩ
220 kΩ
8
4
10
0
0
0
2
4
6
0
2
4
6
8
V
(V)
GG
V
= V
(V)
DS
GG
VDS = 5 V; VG2-S = 4 V.
VG2-S = 4 V.
RG1 connected to VGG; Tj = 25 °C.
RG1 = 120 kΩ (connected to VGG); Tj = 25 °C.
Fig.10 Drain current as a function of gate 1
supply voltage (= VGG); typical values;
see Fig.18.
Fig.11 Drain current as a function of gate 1
(= VGG) and drain supply voltage;
typical values; see Fig.18.
Rev. 02 - 19 November 2007
6 of 12
NXP Semiconductors
Product specification
N-channel dual gate MOS-FETs
BF909; BF909R
MLB944
MLB945
20
40
handbook, halfpage
handbook, halfpage
I
V
= 5 V
D
GG
I
G1
(µA)
(mA)
16
V
= 5 V
GG
4.5 V
30
4 V
4.5 V
3.5 V
3 V
4 V
12
8
3.5 V
3 V
20
10
4
0
0
0
0
2
4
6
2
4
6
V
(V)
S
V
(V)
S
G2
G2
VDS = 5 V; Tj = 25 °C.
G1 = 120 kΩ (connected to VGG).
VDS = 5 V; Tj = 25 °C.
R
RG1 = 120 kΩ (connected to VGG).
Fig.12 Drain current as a function of gate 2 voltage;
typical values; see Fig.18.
Fig.13 Gate 1 current as a function of gate 2
voltage; typical values; see Fig.18.
MLB947
MLB946
3
3
2
10
10
rs
10
handbook, halfpage
y
y
ϕ
is
(mS)
rs
(deg)
(µS)
ϕ
rs
rs
2
2
10
10
10
b
is
y
10
10
1
1
g
is
1
1
10
2
3
2
3
10
10
10
10
10
10
f (MHz)
f (MHz)
VDS = 5 V; VG2 = 4 V.
VDS = 5 V; VG2 = 4 V.
ID = 15 mA; Tamb = 25 °C.
ID = 15 mA; Tamb = 25 °C.
Fig.14 Input admittance as a function of frequency;
typical values.
Fig.15 Reverse transfer admittance and phase as
a function of frequency; typical values.
Rev. 02 - 19 November 2007
7 of 12
NXP Semiconductors
Product specification
N-channel dual gate MOS-FETs
BF909; BF909R
MLB949
MLB948
2
2
10
10
fs
10
handbook, halfpage
y
os
y
fs
fs
ϕ
y
(mS)
b
fs
os
(deg)
(mS)
1
ϕ
g
10
10
os
1
10
2
1
10
1
2
3
2
3
10
10
10
10
10
10
f (MHz)
f (MHz)
VDS = 5 V; VG2 = 4 V.
D = 15 mA; Tamb = 25 °C.
VDS = 5 V; VG2 = 4 V.
I
ID = 15 mA; Tamb = 25 °C.
Fig.16 Forward transfer admittance and phase as
a function of frequency; typical values.
Fig.17 Output admittance as a function of
frequency; typical values.
V
AGC
R1
10 kΩ
C1
4.7 nF
C3 12 pF
R3
10 Ω
R
L
L1
C2
DUT
50 Ω
≈350 nH
C4
C5
2.2
pF
4.7 nF
R
R2
GEN
R
G1
50 Ω
50 Ω
4.7 nF
V
I
V
MLD151
GG
V
DS
Fig.18 Cross-modulation test set-up.
Rev. 02 - 19 November 2007
8 of 12
NXP Semiconductors
Product specification
N-channel dual gate MOS-FETs
BF909; BF909R
Table 1 Scattering parameters: Tamb = 25 °C; VDS = 5 V; VG2-S = 4 V; ID = 15 mA
s11
s21
s12
s22
f
MAGNITUDE ANGLE MAGNITUDE ANGLE MAGNITUDE ANGLE MAGNITUDE ANGLE
(MHz)
(ratio)
(deg)
(ratio)
(deg)
(ratio)
(deg)
(ratio)
(deg)
50
0.985
0.978
0.957
0.931
0.899
0.868
0.848
0.816
0.792
0.772
0.754
−6.4
−12.6
−25.0
−36.5
−47.6
−57.4
−66.6
−74.6
−82.2
−89.3
−95.6
4.064
3.997
3.886
3.682
3.484
3.260
3.053
2.829
2.652
2.470
2.328
172.3
164.9
150.8
137.3
123.8
111.7
101.0
90.3
0.001
0.002
0.005
0.006
0.007
0.007
0.006
0.005
0.005
0.005
0.006
86.9
82.7
74.3
68.9
59.6
57.9
58.5
65.5
83.3
114.9
138.7
0.985
0.982
0.973
0.960
0.947
0.936
0.927
0.919
0.913
0.910
0.909
−3.2
−6.4
100
200
300
400
500
600
700
800
900
1000
−12.6
−18.6
−24.2
−29.6
−34.8
−39.8
−44.6
−49.5
−54.6
79.9
69.5
59.5
Table 2 Noise data: Tamb = 25 °C; VDS = 5 V; VG2-S = 4 V; ID = 15 mA
Γopt
f
Fmin
(dB)
rn
0.581
(MHz)
(ratio)
(deg)
67.71
800
2.00
0.603
Rev. 02 - 19 November 2007
9 of 12
NXP Semiconductors
Product specification
N-channel dual gate MOS-FETs
BF909; BF909R
PACKAGE OUTLINES
3.0
2.8
0.150
B
1.9
0.090
A
B
M
0.75
0.2
A
0.60
4
3
0.1
max
o
10
max
2.5
max
1.4
1.2
o
10
max
1
2
1.1
max
o
0.1 M
A
B
MBC845
30
max
0
0.1
0
0.1
0.88
0.48
1.7
TOP VIEW
Dimensions in mm.
Fig.19 SOT143.
3.0
2.8
B
0.150
0.090
1.9
A
M
0.2
0.40
0.25
A
3
4
0.1
max
o
10
2.5
max
1.4
1.2
max
o
10
max
2
1
1.1
max
0.48
0.38
0.88
0.78
o
MBC844
30
max
1.7
B
0.1 M
TOP VIEW
Dimensions in mm.
Fig.20 SOT143R.
Rev. 02 - 19 November 2007
10 of 12
BF909; BF909R
NXP Semiconductors
N-channel dual gate MOS-FETs
Legal information
Data sheet status
Document status[1][2]
Product status[3]
Development
Definition
Objective [short] data sheet
This document contains data from the objective specification for product development.
This document contains data from the preliminary specification.
This document contains the product specification.
Preliminary [short] data sheet Qualification
Product [short] data sheet Production
[1]
[2]
[3]
Please consult the most recently issued document before initiating or completing a design.
The term ‘short data sheet’ is explained in section “Definitions”.
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
malfunction of an NXP Semiconductors product can reasonably be expected
Definitions
to result in personal injury, death or severe property or environmental
damage. NXP Semiconductors accepts no liability for inclusion and/or use of
NXP Semiconductors products in such equipment or applications and
therefore such inclusion and/or use is at the customer’s own risk.
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liability for the consequences of
use of such information.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes no
representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and title. A short data sheet is intended
for quick reference only and should not be relied upon to contain detailed and
full information. For detailed and full information see the relevant full data
sheet, which is available on request via the local NXP Semiconductors sales
office. In case of any inconsistency or conflict with the short data sheet, the
full data sheet shall prevail.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) may cause permanent
damage to the device. Limiting values are stress ratings only and operation of
the device at these or any other conditions above those given in the
Characteristics sections of this document is not implied. Exposure to limiting
values for extended periods may affect device reliability.
Terms and conditions of sale — NXP Semiconductors products are sold
subject to the general terms and conditions of commercial sale, as published
at http://www.nxp.com/profile/terms, including those pertaining to warranty,
intellectual property rights infringement and limitation of liability, unless
explicitly otherwise agreed to in writing by NXP Semiconductors. In case of
any inconsistency or conflict between information in this document and such
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Disclaimers
General — Information in this document is believed to be accurate and
reliable. However, NXP Semiconductors does not give any representations or
warranties, expressed or implied, as to the accuracy or completeness of such
information and shall have no liability for the consequences of use of such
information.
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Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all information supplied prior
to the publication hereof.
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Notice: All referenced brands, product names, service names and trademarks
are the property of their respective owners.
Suitability for use — NXP Semiconductors products are not designed,
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space or life support equipment, nor in applications where failure or
Contact information
For additional information, please visit: http://www.nxp.com
For sales office addresses, send an email to: salesaddresses@nxp.com
Rev. 02 - 19 November 2007
11 of 12
BF909; BF909R
NXP Semiconductors
N-channel dual gate MOS-FETs
Revision history
Revision history
Document ID
BF909_N_2
Modifications:
BF909_1
Release date
20071119
Data sheet status
Change notice
Supersedes
Product data sheet
-
BF909_1
• Fig.1 and 2 on page 2; Figure note changed
19950425 Product specification
-
-
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.
© NXP B.V. 2007.
All rights reserved.
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: salesaddresses@nxp.com
Date of release: 19 November 2007
Document identifier: BF909_N_2
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