74F8960 [NXP]

Octal latched bidirectional Futurebus transceivers 3-State open-collector; 八进制锁存双向FUTUREBUS收发器,三态集电极开路
74F8960
型号: 74F8960
厂家: NXP    NXP
描述:

Octal latched bidirectional Futurebus transceivers 3-State open-collector
八进制锁存双向FUTUREBUS收发器,三态集电极开路

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中文:  中文翻译
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Philips Semiconductors FAST Products  
Product specification  
Octal latched bidirectional Futurebus transceivers  
(3-State + open-collector)  
74F8960/74F8961  
voltage swing is much less for BTL, so is its  
receiver threshold region, therefore noise  
margins are excellent.  
FEATURES  
Octal latched transceiver  
DESCRIPTION  
The 74F8960 and 74F8961 are octal  
bidirectional latched transceivers and are  
intended to provide the electrical interface to  
a high performance wired–OR bus. The B  
port inverting drivers are low–capacitance  
open collector with controlled ramp and are  
designed to sink 100mA from 2 volts. The B  
port inverting receivers have a 100 mV  
threshold region and a 4ns glitch filter.  
Drives heavily loaded backplanes with  
equivalent load impedances down to 10  
BTL offers low power consumption, low  
ground bounce, EMI and crosstalk, low  
capacitive loading, superior noise margin and  
low propagation delays. This results in a high  
bandwidth, reliable backplane.  
High drive (100mA) open collector drivers  
on B port  
Reduced voltage swing (1 volt) produces  
The 74F8960 and 74F8961 A ports have TTL  
3–state drivers and TTL receivers with a latch  
function. A separate High–level control input  
(VX) is provided to limit the A side output  
level to a given voltage level (such as 3.3V).  
For 5.0V systems, VX is simply tied to VCC.  
less noise and reduces power consumption  
High speed operation enhances  
performance of backplane buses and  
facilitates incident wave switching  
The B port interfaces to ‘Backplane  
Transceiver Logic’ (BTL). BTL features a  
reduced (1V to 2V) voltage swing for lower  
power consumption and a series diode on  
the drivers to reduce capacitive loading.  
Compatible with IEEE futurebus standards  
The 74F8961 is the non–inverting version of  
74F8960.  
Built-in precision band-gap reference  
provides accurate receiver thresholds and  
improved noise immunity  
Incident switching is employed, therefore BTL  
propagation delays are short. Although the  
Controlled output ramp and multiple GND  
pins minimize ground bounce  
Glitch-free power up/down operation  
TYPE  
TYPICAL PROPAGATION DELAY  
TYPICAL SUPPLY CURRENT( TOTAL)  
74F8960  
74F8961  
6.5ns  
6.5ns  
80mA  
80mA  
ORDERING INFORMATION  
ORDER CODE  
DESCRIPTION  
COMMERCIAL RANGE  
V
CC  
= 5V ±10%, T  
= 0°C to +70°C  
amb  
1
28–pin plastic DIP (300 mil)  
N74F8960N, N748961N  
N74F8960A, N74F8961A  
1
28–pin PLCC  
NOTE: Thermal mounting techiques are recommended.  
INPUT AND OUTPUT LOADING AND FAN OUT TABLE  
74F (U.L.)  
HIGH/LOW  
LOAD VALUE  
HIGH/LOW  
PINS  
DESCRIPTION  
A0 – A8  
B0 – B8  
OEA  
PNP latched inputs  
3.5/0.117  
5.0/0.167  
1.0/0.033  
1.0/0.033  
1.0/0.033  
150/40  
70µA/70µA  
100µA/100µA  
20µA/20µA  
20µA/20µA  
20µA/20µA  
3mA/24mA  
OC/100mA  
Data inputs with threshold circuitry  
A output enable input (active high)  
B output enable inputs (active low)  
Latch enable input (active low)  
3–state outputs  
OEB0, OEB1  
LE  
A0 – A7  
B0 – B7  
Open collector outputs  
OC/166.7  
NOTES:  
1. One (1.0) FAST unit load is defined as: 20µA in the high state and 0.6mA in the low state.  
2. OC = Open collector.  
1
December 19, 1990  
853-1120 01322  
Philips Semiconductors FAST Products  
Product specification  
Octal latched bidirectional Futurebus transceivers  
(3-State + open-collector)  
74F8960/74F8961  
PIN CONFIGURATION  
PIN CONFIGURATION PLCC  
LOGIC SYMBOL  
74F8960  
74F8960  
74F8960  
1
2
3
4
5
6
7
8
9
28 LE  
27 B0  
V
CC  
3
5
6
7
9
10  
12 13  
OEA  
A0  
V
GND A0 OEA  
LE B0 B1  
CC  
1
26  
4
3
2
28 27  
26  
25  
B1  
A1  
A2  
5
6
7
A0 A1 A2 A3 A4 A5  
OEB0  
A6 A7  
25  
24  
23  
22  
21  
20  
19  
GND  
GND  
A1  
GND  
24 B2  
23  
B2  
15  
2
A2  
A3  
OEA  
LE  
B3  
B3  
A3  
28  
16  
22 GND  
GND  
8
9
PLCC  
GND  
B4  
OEB1  
21  
GND  
A4  
A4  
B4  
20 B5  
B0 B1 B2 B3 B4 B5  
B6 B7  
19 17  
A5 10  
B5  
B6  
A5 10  
19  
18  
17  
16  
15  
B6  
GND 11  
11  
12  
13  
14  
GND  
A6  
GND  
B7  
12 13 14 15 16 17  
A6 A7 OEB2OEB1 B7 GND  
18  
27 26 24 23 21 20  
V
X
OEB1  
A7  
OEB0  
V
X
V
= Pin 1, V = Pin 14  
X
GND = Pin 4, 8, 11, 18, 22, 25  
CC  
PIN CONFIGURATION  
PIN CONFIGURATION PLCC  
LOGIC SYMBOL  
74F8961  
74F8961  
74F8961  
1
2
3
4
5
6
7
8
9
28 LE  
27 B0  
V
CC  
3
5
6
7
9
10  
12 13  
OEA  
A0  
V
GND A0 OEA  
LE B0 B1  
CC  
1
26  
4
3
2
28 27  
26  
25  
B1  
A1  
A2  
5
6
7
A0 A1 A2 A3 A4 A5  
OEB0  
A6 A7  
25  
24  
23  
22  
GND  
GND  
A1  
GND  
24 B2  
23  
B2  
15  
2
A2  
A3  
OEA  
LE  
B3  
22 GND  
B3  
A3  
28  
16  
GND  
8
9
PLCC  
GND  
OEB1  
A4  
GND  
A4  
21  
B4  
21 B4  
20 B5  
B0 B1 B2 B3 B4 B5 B6 B7  
A5 10  
20  
19  
B5  
B6  
A5 10  
19  
18  
17  
16  
15  
B6  
GND 11  
11  
12  
13  
14  
GND  
A6  
GND  
B7  
12 13 14 15 16 17  
18  
27 26 24 23 21 20 19 17  
A6 A7  
OEB2OEB1 B7 GND  
V
X
OEB1  
A7  
OEB0  
V
X
V
= Pin 1, V = Pin 14  
X
GND = Pin 4, 8, 11, 18, 22, 25  
CC  
2
December 19, 1990  
Philips Semiconductors FAST Products  
Product specification  
Octal latched bidirectional Futurebus transceivers  
(3-State + open-collector)  
74F8960/74F8961  
IEC/IEEE SYMBOL FOR 74F8960  
IEC/IEEE SYMBOL FOR 74F8961  
74F8960  
74F8961  
&
&
15  
16  
28  
2
15  
EN2  
EN2  
16  
28  
C1  
C1  
2
EN3  
EN3  
27  
27  
3
3
2
2
1D  
3
1D  
3
5
5
26  
24  
23  
21  
20  
19  
17  
26  
24  
23  
21  
20  
19  
17  
6
6
7
7
9
9
10  
11  
13  
10  
11  
13  
PIN DESCRIPTION  
SYMBOL  
PINS  
TYPE  
NAME AND FUNCTION  
A0 – A7  
B0 – B7  
3, 5, 6, 7, 9, 10, 12, 13  
I/O  
PNP latched input/3–state output (with V control option)  
X
Data input with special threshold circuitry to reject noise/ open collector output, high  
current drive  
27, 26, 24, 23, 21, 20, 19, 17  
I/O  
OEB0  
OEB1  
LE  
15  
16  
28  
14  
Input  
Input  
Input  
Input  
Enables the B outputs when both pins are low  
Enables the A outputs when high  
Latched when high (a special feature is buillt in for proper enabling times)  
V
X
Clamping voltage keeping V from rising above V (V = V for normal use)  
OH X X cc  
3
December 19, 1990  
Philips Semiconductors FAST Products  
Product specification  
Octal latched bidirectional Futurebus transceivers  
(3-State + open-collector)  
74F8960/74F8961  
LOGIC DIAGRAM  
74F9861  
74F9860  
15  
16  
15  
16  
OEB0  
OEB0  
OEB1  
OEA  
OEB1  
OEA  
2
2
28  
3
28  
3
LE  
A0  
LE  
A0  
Q
Q
Data  
LE  
Q
Q
Data  
LE  
27  
27  
26  
B0  
B0  
B1  
5
5
A1  
Data  
LE  
A1  
Data  
LE  
26  
B1  
6
6
Q
Q
A2  
A3  
Data  
LE  
A2  
A3  
Data  
LE  
24  
24  
23  
B2  
B2  
B3  
7
7
Q
Q
Data  
LE  
Data  
LE  
23  
B3  
9
9
Q
Q
Q
Q
A4  
A5  
Data  
LE  
A4  
A5  
Data  
LE  
21  
21  
20  
B4  
B4  
B5  
10  
10  
Data  
LE  
Data  
LE  
20  
B5  
12  
13  
12  
13  
Q
Q
A6  
A7  
Data  
LE  
A6  
A7  
Data  
LE  
19  
19  
17  
B6  
B6  
B7  
Q
Q
Data  
LE  
Data  
LE  
17  
B7  
V
= Pin 1, V = Pin 14,  
X
CC  
GND = Pin 4, 8, 11, 18, 22, 25  
4
December 19, 1990  
Philips Semiconductors FAST Products  
Product specification  
Octal latched bidirectional Futurebus transceivers  
(3-State + open-collector)  
74F8960/74F8961  
FUNCTION TABLE FOR 74F8960  
INPUTS  
LATCH  
STATE  
H
OUTPUTS  
OPERATING MODE  
An Bn* LE  
OEA  
L
OEB  
OEB  
An  
Z
Bn  
L
0
1
H
X
X
X
L
L
L
L
A 3–state, data from A to B  
L
L
L
L
L
L
L
Z
H**  
X
H
L
L
Qn  
(1)  
H (2)  
H (2)  
Qn  
H
Z
Qn A 3–state, latched data to B  
(1) Feedback: A to B, B to A  
H
H
H
H
L
L
L
(1)  
H
L
H
L
H
H
H
L
L
L
Z(2) Preconditioned latch enabling data transfer from B to A  
L
L
Z(2)  
L
L
Qn  
Z
Qn Latch state to A and B  
Z
H
X
X
X
H
L
H
H
H
H
H
H
H
X
X
X
X
X
X
X
X
X
X
X
H
H
H
H
H
H
H
H
H
H
l
L
L
l
Z
Z
Z
Z
Z
Z
Z
Z
Z
Z
Z
Z
Z
Z
B and A 3–state  
X
H
L
L
Qn  
H
Z
H
H
H
H
L
H
L
L
L
B 3–state, data from B to A  
H
L
H
H
L
Qn  
Qn  
H
H
L
H
X
X
X
H
L
Z
l
L
L
l
Z
B and A 3–state  
X
H
L
L
Qn  
H
Z
H
H
H
H
H
L
L
L
B 3–state, data from B to A  
H
L
H
H
Qn  
Qn  
H
L
NOTES:  
1. H = High–voltage level  
2. L  
3. X  
4. –  
5. Z  
=
=
=
=
Low–voltage level  
Don’t care  
Input not externally driven  
High impedance (off) state  
6. Q = High or low voltage level one setup time prior to the low–to–high LE transition.  
n
7. (1) = Condition will cause a feedback loop path: A to B and B to A.  
8. (2) = The latch must be preconmditioned such that B inputs may assume a high or low level while OEB0 and OEB1 are low and LE is high.  
9. H**= Goes to level of pullup voltage.  
10.B* = Precaution should be taken to insure the B inputs do not float. If they do they are equal to low state.  
5
December 19, 1990  
Philips Semiconductors FAST Products  
Product specification  
Octal latched bidirectional Futurebus transceivers  
(3-State + open-collector)  
74F8960/74F8961  
FUNCTION TABLE FOR 74F8961  
INPUTS  
LATCH  
STATE  
H
OUTPUTS  
OPERATING MODE  
An Bn* LE  
OEA  
L
OEB  
OEB  
An  
Z
Bn  
0
1
H
X
X
X
L
L
L
L
H** A 3–state, data from A to B  
L
L
L
L
L
L
L
L
Z
X
H
L
L
Qn  
(1)  
H (2)  
H (2)  
Qn  
H
Z
Qn A 3–state, latched data to B  
(1) Feedback: A to B, B to A  
H
H
H
H
L
L
L
(1)  
H
L
H
L
H
H
H
L
L
L
Z(2) Preconditioned latch enabling data transfer from B to A  
L
L
Z(2)  
L
L
Qn  
Z
Qn Latch state to A and B  
Z
H
X
X
X
H
L
H
H
H
H
H
H
H
X
X
X
X
X
X
X
X
X
X
X
H
H
H
H
H
H
H
H
H
H
l
L
L
l
Z
Z
Z
Z
Z
Z
Z
Z
Z
Z
Z
Z
Z
Z
B and A 3–state  
X
H
L
L
Qn  
H
Z
H
H
H
H
L
H
L
L
L
B 3–state, data from B to A  
H
L
H
H
L
Qn  
Qn  
H
H
L
H
X
X
X
H
L
Z
l
L
L
l
Z
B and A 3–state  
X
H
L
L
Qn  
H
Z
H
H
H
H
H
L
L
L
B 3–state, data from B to A  
H
L
H
H
Qn  
Qn  
H
L
NOTES:  
1. H = High–voltage level  
2. L  
3. X  
4. –  
5. Z  
=
=
=
=
Low–voltage level  
Don’t care  
Input not externally driven  
High impedance (off) state  
6. Q = High or low–voltage level one setup time prior to the low–to–high LE transition.  
n
7. (1) = Condition will cause a feedback loop path: A to B and B to A.  
8. (2) = The latch must be preconmditioned such that B inputs may assume a high or low level while OEB0 and OEB1 are low and LE is high.  
9. H**= Goes to level of pullup voltage.  
10.B* = Precaution should be taken to insure the B inputs do not float. If they do they are equal to low state.  
6
December 19, 1990  
Philips Semiconductors FAST Products  
Product specification  
Octal latched bidirectional Futurebus transceivers  
(3-State + open-collector)  
74F8960/74F8961  
ABSOLUTE MAXIMUM RATINGS  
(Operation beyond the limit set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the  
operating free air temperature range.)  
SYMBOL  
PARAMETER  
RATING  
UNIT  
V
V
V
V
Supply voltage  
Threshold control  
Input voltage  
–0.5 to +7.0  
–0.5 to +7.0  
–0.5 to +7.0  
–0.5 to +5.5  
–40 to +5  
CC  
X
V
OEB, OEA, LE  
V
IN  
A0 – A7, B0 – B7  
V
I
IN  
Input current  
mA  
V
I
Voltage applied to output in high output state  
Current applied to output in low output state  
–0.5 to V  
V
OUT  
CC  
A0 – A7  
B0 – B7  
48  
mA  
mA  
°C  
°C  
OUT  
200  
T
amb  
Operating free air temperature range  
Storage temperature range  
0 to +70  
Tstg  
–65 to +150  
RECOMMENDED OPERATING CONDITIONS  
LIMITS  
SYMBOL  
PARAMETER  
MIN  
NOM  
MAX  
UNIT  
V
V
Supply voltage  
4.5  
5.0  
5.5  
CC  
IH  
V
High–level input voltage  
Low–level input voltage  
Input clamp current  
Except B0 – B7  
2.0  
1.6  
V
B0 – B7  
Except B0 – B7  
B0 – B7  
V
V
IL  
0.8  
1.475  
–18  
–40  
–3  
V
V
I
Ik  
Except A0 – A7  
A0 – A7  
mA  
mA  
mA  
mA  
mA  
I
I
High–level output current  
Low–level output current  
A0 – A7  
OH  
A0 – A7  
24  
OL  
B0 – B7  
100  
+70  
T
amb  
Operating free air temperature  
range  
0
°C  
7
December 19, 1990  
Philips Semiconductors FAST Products  
Product specification  
Octal latched bidirectional Futurebus transceivers  
(3-State + open-collector)  
74F8960/74F8961  
DC ELECTRICAL CHARACTERISTICS  
(Over recommended operating free-air temperature range unless otherwise noted.)  
SYMBOL  
PARAMETER  
TEST  
LIMITS  
UNIT  
TYP.  
1
2
CONDITIONS  
MIN.  
MAX.  
100  
I
I
High–level output current  
B0 – B7  
B0 – B7  
V
V
V
= MAX, V = MAX, V = MIN, V = 2.1V  
µA  
µA  
V
OH  
CC  
CC  
CC  
IL  
IH  
OH  
Power–off output current  
= 0.0V, V = MAX, V = MIN, V = 2.1V  
100  
OFF  
IL  
IH  
OH  
= MIN,  
= MAX, V = MIN  
I
= –3mA, V =V  
2.5  
2.5  
V
CC  
OH  
X
CC  
4
V
High-level output voltage  
A0 – A7  
I
= –4mA,  
=3.13V and 3.47V  
OH  
OH  
V
IL  
V
IH  
V
X
4
A0 – A7  
V
V
V
V
V
= MIN,  
I
OL  
= 20mA, V = V  
CC  
0.50  
1.15  
V
V
V
V
CC  
X
V
V
Low-level output voltage  
Input clamp voltage  
B0 – B78  
= MAX  
= MIN  
I
OL  
= 100mA  
OL  
IL  
I
OL  
= 4mA  
0.40  
IH  
A0 – A7  
= MIN, I = I  
-0.5  
-1.2  
IK  
CC  
CC  
I
IK  
Except A0 – A7  
= MIN, I = I  
V
I
IK  
I
µA  
mA  
µA  
Input current at  
OEBn, OEA, LE  
A0–A7, B0 – B7  
V
V
= MAX, V = 7.0V  
100  
1
I
CC  
I
maximum input voltage  
= MAX, V = 5.5V  
I
CC  
I
IH  
High–level input current  
Low–level input current  
OEBn, OEA, LE  
B0–B7  
V
CC  
V
CC  
V
CC  
V
CC  
= MAX, V = 2.7V  
20  
100  
–20  
–100  
I
µA  
µA  
µA  
= MAX, V = 2.1V, Bn – An = 0V  
I
I
IL  
OEBn, OEA, LE  
B0 – B7  
= MAX, V = 0.5V  
I
= MAX, V = 0.3V  
I
Off–state output current,  
high–level current applied  
I
I
+ I  
+ I  
A0 – A7  
A0 – A7  
V
= MAX, V = 2.7V  
70  
–70  
100  
10  
µA  
µA  
µA  
µA  
OZH  
IH  
CC  
O
Off–state output current,  
low–level voltage applied  
V
V
= MAX, V = 0.5V  
OZL  
IL  
CC  
I
= MAX, V = V , LE = OEA = OEBn =  
CC  
X
CC  
–100  
–10  
2.7V, A0 – A7 = 2.7V, B0 – B7 = 2.0V,  
I
X
High–level control current  
V
CC  
= MAX, V = 3.13 & 3.47V, LE = OEA =  
X
OEBn = A0 – A7 = 2.7V, B0 – B7 = 2.0V,  
V
2.7V  
= MAX, Bn = 1.3V, OEA = 2.0V, OEBn =  
= MAX, Bn = 1.8V, OEA = 2.0V, OEBn =  
= MAX  
CC  
74F8960  
A0–A7  
I
Short circuit output  
-60  
-150  
mA  
OS  
3
current  
V
CC  
2.7V  
only 74F8961  
I
I
V
V
65  
100  
75  
100  
145  
100  
mA  
mA  
mA  
CCH  
CC  
I
Supply current (total)  
I
= MAX, V = 0.5V  
IL  
CC  
CCL  
CC  
CCZ  
NOTES:  
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type  
and function table for operating mode.  
2. All typical values are at V = 5V, T  
3. Not more than one output should be shorted at a time. For testing I , the use of high-speed test apparatus and/or sample-and-hold  
= 25°C.  
CC  
amb  
OS  
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting  
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any  
sequence of parameter tests, I tests should be performed last.  
OS  
4. Due to test equipment limitations, actual test conditions are for V =1.8v and V = 1.3V.  
IH  
IL  
8
December 19, 1990  
Philips Semiconductors FAST Products  
Product specification  
Octal latched bidirectional Futurebus transceivers  
(3-State + open-collector)  
74F8960/74F8961  
AC ELECTRICAL CHARACTERISTICS FOR 74F8960  
A PORT LIMITS  
T
= +25°C  
= +5.0V  
T
= 0°C to +70°C  
= +5.0V ± 10%  
amb  
amb  
V
SYMBOL  
PARAMETER  
TEST  
V
UNIT  
CC  
CC  
CONDITION  
C = 50pF, R = 500Ω  
C = 50p, R = 500Ω  
L
L
L
L
MIN  
TYP  
MAX  
MIN  
MAX  
t
t
Propagation delay  
Bn to An  
4.5  
6.0  
6.0  
10.0  
8.5  
13.5  
3.5  
7.5  
9.5  
14.5  
PLH  
PHL  
Waveform 1, 2  
ns  
ns  
ns  
t
t
Output enable time to high or low, OEA  
to An  
Waveform 4  
Waveform 5  
8.0  
8.5  
10.5  
11.0  
13.5  
13.5  
7.5  
8.5  
15.0  
16.0  
PZH  
PZL  
t
t
Output enable time from high or low,  
OEA to An  
Waveform 4  
Waveform 5  
2.0  
2.0  
3.5  
4.5  
6.5  
7.0  
2.0  
2.0  
7.0  
7.5  
PHZ  
PLZ  
B PORT LIMITS  
T
= +25°C  
= +5.0V  
T
= 0°C to +70°C  
= +5.0V ± 10%  
amb  
amb  
V
SYMBOL  
PARAMETER  
TEST  
V
UNIT  
CC  
CC  
CONDITION  
C
= 50pF, R = 9Ω  
C
= 50pF, R = 9Ω  
D
U
D
L
MIN  
TYP  
MAX  
MIN  
MAX  
t
t
Propagation delay  
An to Bn  
3.5  
3.5  
5.5  
5.0  
8.0  
8.0  
2.0  
3.0  
9.5  
9.0  
PLH  
PHL  
Waveform 1, 2  
Waveform 1, 2  
Waveform 1, 2  
ns  
ns  
ns  
ns  
t
t
Propagation delay  
LE to Bn  
3.5  
4.0  
5.5  
6.5  
8.5  
9.0  
2.5  
3.0  
9.5  
10.5  
PLH  
PHL  
t
t
Output enable/disable time  
OEBn to Bn  
2.5  
3.5  
4.5  
5.5  
7.5  
8.5  
1.5  
3.5  
8.0  
9.0  
PLH  
PHL  
t
t
Transition time, Bn port  
1.3V to 1.7V, 1.7V to 1.3V  
Test circuit and  
waveforms  
0.5  
0.5  
2.0  
2.0  
4.5  
4.5  
0.5  
0.5  
5.0  
6.0  
TLH  
THL  
AC SETUP REQUIREMENTS FOR 74F8960  
LIMITS  
T
= +25°C  
= +5.0V  
T
= 0°C to +70°C  
= +5.0V ± 10%  
amb  
amb  
V
SYMBOL  
PARAMETER  
TEST  
V
UNIT  
CC  
CC  
CONDITION  
C = 50pF, R = 500Ω  
C = 50pF, R = 500Ω  
L L  
L
L
MIN  
TYP  
MAX  
MIN  
MAX  
t
su  
t
su  
(H)  
(L)  
Setup time, high or low  
An to LE  
5.0  
3.0  
5.0  
5.0  
Waveform 3  
ns  
th(H)  
th(L)  
Hold time, high or low  
An to LE  
0.0  
0.0  
0.0  
0.0  
Waveform 3  
Waveform 3  
ns  
ns  
t (L)  
w
LE pulse width, low  
4.5  
5.0  
9
December 19, 1990  
Philips Semiconductors FAST Products  
Product specification  
Octal latched bidirectional Futurebus transceivers  
(3-State + open-collector)  
74F8960/74F8961  
AC ELECTRICAL CHARACTERISTICS FOR 74F8961  
A PORT LIMITS  
T
= +25°C  
= +5.0V  
T
= 0°C to +70°C  
= +5.0V ± 10%  
amb  
amb  
V
SYMBOL  
PARAMETER  
TEST  
V
UNIT  
CC  
CC  
CONDITION  
C = 50pF, R = 500Ω  
C = 50p, R = 500Ω  
L
L
L
L
MIN  
TYP  
MAX  
MIN  
MAX  
t
t
Propagation delay  
Bn to An  
5.5  
4.5  
8.0  
6.0  
12.0  
9.0  
5.5  
4.5  
12.0  
9.0  
PLH  
PHL  
Waveform 1, 2  
ns  
ns  
ns  
t
t
Output enable time to high or low, OEA  
to An  
Waveform 4  
Waveform 5  
8.0  
8.5  
10.5  
11.0  
13.5  
13.5  
7.5  
8.0  
15.0  
15.5  
PZH  
PZL  
t
t
Output enable time from high or low,  
OEA to An  
Waveform 4  
Waveform 5  
2.0  
2.0  
3.5  
4.5  
6.0  
7.0  
1.5  
2.0  
6.5  
7.5  
PHZ  
PLZ  
B PORT LIMITS  
T
= +25°C  
= +5.0V  
T
= 0°C to +70°C  
= +5.0V ± 10%  
amb  
amb  
V
SYMBOL  
PARAMETER  
TEST  
V
UNIT  
CC  
CC  
CONDITION  
C
= 50pF, R = 9Ω  
C
= 50pF, R = 9Ω  
D
U
D
U
MIN  
TYP  
MAX  
MIN  
MAX  
t
t
Propagation delay  
An to Bn  
3.0  
3.0  
5.0  
4.5  
7.0  
7.5  
2.5  
2.5  
8.0  
8.5  
PLH  
PHL  
Waveform 1, 2  
Waveform 1, 2  
Waveform 1, 2  
ns  
ns  
ns  
ns  
t
t
Propagation delay  
LE to Bn  
3.5  
3.5  
5.0  
5.0  
8.0  
8.0  
3.0  
2.5  
9.0  
9.0  
PLH  
PHL  
t
t
Output enable/disable time  
OEBn to Bn  
3.0  
3.5  
4.5  
5.5  
7.0  
9.0  
2.5  
3.5  
8.0  
10.0  
PLH  
PHL  
t
t
Transition time, Bn port  
1.3V to 1.7V, 1.7V to 1.3V  
Test circuit and  
waveforms  
0.5  
0.5  
2.0  
2.0  
4.5  
4.5  
0.5  
0.5  
5.0  
4.5  
TLH  
THL  
AC SETUP REQUIREMENTS FOR 74F8961  
LIMITS  
T
= +25°C  
= +5.0V  
T
= 0°C to +70°C  
= +5.0V ± 10%  
amb  
amb  
V
SYMBOL  
PARAMETER  
TEST  
V
UNIT  
CC  
CC  
CONDITION  
C = 50pF, R = 500Ω  
C = 50pF, R = 500Ω  
L L  
L
L
MIN  
TYP  
MAX  
MIN  
MAX  
t
su  
t
su  
(H)  
(L)  
Setup time, high or low  
An to LE  
3.5  
4.5  
4.5  
5.0  
Waveform 3  
ns  
th(H)  
th(L)  
Hold time, high or low  
An to LE  
0.0  
0.0  
0.0  
0.0  
Waveform 3  
Waveform 3  
ns  
ns  
t (L)  
w
LE pulse width, low  
4.0  
5.0  
10  
December 19, 1990  
Philips Semiconductors FAST Products  
Product specification  
Octal latched bidirectional Futurebus transceivers  
(3-State + open-collector)  
74F8960/74F8961  
AC WAVEFORMS  
An, Bn, OEBn  
An, Bn, OEBn  
V
V
M
V
V
M
M
M
t
t
t
t
PHL  
PLH  
PLH  
PHL  
An, Bn  
V
V
V
V
M
M
M
M
An, Bn  
Waveform 1. Propagation delay for data to output  
Waveform 2. Propagation delay for data to output  
An  
V
V
V
V
M
M
M
M
t
(L)  
t (H)  
h
h
t
(L)  
t (H)  
s
s
t
(L)  
w
V
V
V
M
LE  
M
M
Waveform 3. Data setup and hold times and LE pulse width  
OEA  
OEA  
An  
V
V
V
V
M
M
M
M
V
-0.3V  
0V  
OH  
t
t
t
t
PLZ  
PZH  
PHZ  
PZL  
V
V
M
An  
M
V
+0.3V  
OL  
Waveform 4. 3–state output enable time to high level  
and output disable time from high level  
Waveform 5. 3-state output enable time to low level  
and output disable time from low level  
NOTES:  
1. For all waveforms, V = 1.5V.  
M
2. The shaded areas indicate when the input is permitted to change for predictable output performance.  
TEST CIRCUITS AND WAVEFORMS  
SWITCH POSITION  
t
AMP (V)  
Low V  
w
90%  
90%  
TEST  
SWITCH  
closed  
open  
NEGATIVE  
PULSE  
V
CC  
V
V
M
M
t
, t  
PLZ PZL  
10%  
10%  
7.0V  
All other  
R
t
t
)
)
t
t )  
L
THL ( f  
TLH ( r  
V
V
OUT  
IN  
PULSE  
GENERATOR  
D.U.T.  
t
t
t
t )  
TLH ( r  
THL ( f  
AMP (V)  
Low V  
R
C
R
L
90%  
M
90%  
T
L
POSITIVE  
PULSE  
V
V
M
10%  
10%  
Test circuit for 3–state outputs on A port  
t
w
V
7.0V  
CC  
Input pulse definition  
INPUT PULSE REQUIREMENTS  
R
U
V
V
OUT  
IN  
family  
PULSE  
GENERATOR  
D.U.T.  
V
Low V  
74F amplitude  
rep. rate  
1MHz  
t
t
t
M
w
TLH  
THL  
A port  
B port  
3.0V  
3.0V  
0.0V 1.5V  
1.0V 1.5V  
500ns 2.5ns 2.5ns  
500ns 4.0ns 4.0ns  
R
C
D
T
1MHz  
Test circuit for outputs on B port  
DEFINITIONS:  
R
C
R
C
R
=
=
=
=
=
Load resistor; see AC electrical characteristics for value.  
Load capacitance includes jig and probe capacitance; see AC electrical characteristics for value.  
Pull up resistor; see AC electrical characteristics for value.  
L
L
U
D
T
Load capacitance includes jig and probe capacitance; see AC electrical characteristics for value.  
Termination resistance should be equal to Z  
of pulse generators.  
OUT  
11  
December 19, 1990  

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