LM5111-2M [NSC]

Dual 5A Compound Gate Driver; 双通道5A复合门驱动器
LM5111-2M
型号: LM5111-2M
厂家: National Semiconductor    National Semiconductor
描述:

Dual 5A Compound Gate Driver
双通道5A复合门驱动器

驱动器 MOSFET驱动器 驱动程序和接口 接口集成电路 光电二极管 栅
文件: 总10页 (文件大小:204K)
中文:  中文翻译
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July 2004  
LM5111  
Dual 5A Compound Gate Driver  
n Independent inputs (TTL compatible)  
n Fast propagation times (25 ns typical)  
n Fast rise and fall times (14 ns/12 ns rise/fall with 2 nF  
load)  
n Available in dual non-inverting, dual inverting and  
combination configurations  
n Supply rail under-voltage lockout protection  
n Pin compatible with industry standard gate drivers  
General Description  
The LM5111 Dual Gate Driver replaces industry standard  
gate drivers with improved peak output current and effi-  
ciency. Each “compound” output driver stage includes MOS  
and bipolar transistors operating in parallel that together sink  
more than 5A peak from capacitive loads. Combining the  
unique characteristics of MOS and bipolar devices reduces  
drive current variation with voltage and temperature. Under-  
voltage lockout protection is also provided. The drivers can  
be operated in parallel with inputs and outputs connected to  
double the drive current capability. This device is available in  
the SOIC-8 package.  
Typical Applications  
n Synchronous Rectifier Gate Drivers  
n Switch-mode Power Supply Gate Driver  
n Solenoid and Motor Drivers  
Features  
n Independently drives two N-Channel MOSFETs  
n Compound CMOS and bipolar outputs reduce output  
current variation  
Package  
n SOIC-8  
n 5A sink/3A source current capability  
n Two channels can be connected in parallel to double the  
drive current  
Pin Configurations  
20112301  
SOIC-8  
© 2004 National Semiconductor Corporation  
DS201123  
www.national.com  
Ordering Information  
Order Number  
Package Type  
NSC Package Drawing  
Supplied As  
Shipped in anti-static units, 95  
Units/Rail  
LM5111-1M  
SOIC-8  
M08A  
LM5111-1MX  
LM5111-2M  
SOIC-8  
SOIC-8  
M08A  
M08A  
2500 shipped in Tape & Reel  
Shipped in anti-static units, 95  
Units/Rail  
LM5111-2MX  
LM5111-3M  
SOIC-8  
SOIC-8  
M08A  
M08A  
2500 shipped in Tape & Reel  
Shipped in anti-static units, 95  
Units/Rail  
LM5111-3MX  
SOIC-8  
M08A  
2500 shipped in Tape & Reel  
Block Diagram  
20112303  
Block Diagram of LM5111  
www.national.com  
2
Pin Description  
Pin  
1
Name  
NC  
Description  
No Connect  
Application Information  
TTL compatible thresholds.  
2
IN_A  
VEE  
‘A’ side control input  
3
Ground reference for both inputs  
and outputs  
Connect to power ground.  
4
5
IN_B  
‘B’ side control input  
TTL compatible thresholds.  
OUT_B  
Output for the ‘B’ side driver.  
Voltage swing of this output is from VCC to VEE.  
The output stage is capable of sourcing 3A and  
sinking 5A.  
6
7
VCC  
Positive output supply  
Locally decouple to VEE.  
OUT_A.  
Output for the ‘A’ side driver.  
Voltage swing of this output is from VCC to VEE  
The output stage is capable of sourcing 3A and  
sinking 5A.  
.
8
NC  
No Connect  
Configuration Table  
Part Number  
“A” Output Configuration  
“B” Output Configuration  
Non-Inverting  
Package  
LM5111-1M  
LM5111-2M  
LM5111-3M  
Non-Inverting  
Inverting  
SOIC- 8  
SOIC- 8  
SOIC- 8  
Inverting  
Inverting  
Non-Inverting  
3
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Absolute Maximum Ratings (Note 1)  
Storage Temperature Range, (TSTG  
Maximum Junction Temperature,  
(TJ(max))  
)
−55˚C to +150˚C  
If Military/Aerospace specified devices are required,  
please contact the National Semiconductor Sales Office/  
Distributors for availability and specifications.  
+150˚C  
+125˚C  
2kV  
Operating Junction Temperature  
ESD Rating  
VCC to VEE  
IN to VEE  
−0.3V to 15V  
−0.3V to 15V  
Electrical Characteristics  
TJ = −40˚C to +125˚C, VCC = 12V, VEE = 0V, No Load on OUT_A or OUT_B, unless otherwise specified.  
Symbol  
VCCR  
VCCH  
ICC  
Parameter  
VCC Operating Range  
VCC Under Voltage Lockout  
(rising)  
Conditions  
VCC−VEE  
Min  
Typ  
Max  
Units  
3.5  
14  
V
VCC−VEE  
2.3  
2.9  
3.5  
V
VCC Under Voltage Lockout  
Hysteresis  
230  
1
mV  
VCC Supply Current (ICC  
)
IN_A = IN_B = 0V (5111-1)  
IN_A = IN_B = VCC  
(5111-2)  
2
2
1
mA  
IN_A = VCC, IN_B = 0V  
(5111-3)  
1
2
CONTROL INPUTS  
VIH  
VIL  
HYS  
IIL  
Logic High  
1.75  
1.35  
400  
2.2  
V
V
Logic Low  
0.8  
−1  
Input Hysteresis  
Input Current Low  
mV  
IN_A=IN_B=VCC  
0.1  
1
(5111-1-2-3)  
IIH  
Input Current High  
IN_B=VCC (5111-3)  
IN_A=IN_B=VCC (5111-2)  
IN_A=IN_B=VCC (5111-1)  
IN_A=VCC (5111-3)  
10  
−1  
10  
-1  
18  
0.1  
18  
25  
1
µA  
25  
1
0.1  
OUTPUT DRIVERS  
ROH  
Output Resistance High  
IOUT = −10 mA  
30  
50  
ROL  
Output Resistance Low  
Peak Source Current  
IOUT = + 10 mA  
1.4  
2.5  
ISource  
OUTA/OUTB = VCC/2,  
200 ns Pulsed Current  
OUTA/OUTB = VCC/2,  
200 ns Pulsed Current  
3
5
A
A
ISink  
Peak Sink Current  
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4
Electrical Characteristics (Continued)  
TJ = −40˚C to +125˚C, VCC = 12V, VEE = 0V, No Load on OUT_A or OUT_B, unless otherwise specified.  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Units  
SWITCHING CHARACTERISTICS  
td1  
td2  
tr  
Propagation Delay Time Low to CLOAD = 2 nF, see Figure  
High, IN rising (IN to OUT)  
Propagation Delay Time High to CLOAD = 2 nF, see Figure  
25  
25  
14  
12  
40  
40  
25  
25  
ns  
ns  
ns  
ns  
1
Low, IN falling (IN to OUT)  
Rise Time  
1
CLOAD = 2.0 nF, see Figure  
1
tf  
Fall Time  
CLOAD = 2 nF, see Figure  
1
LATCHUP PROTECTION  
AEC - Q100, Method 004  
TJ = 150˚C  
500  
mA  
Note 1: Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions under which operation of the device  
is intended to be functional. For guaranteed specifications and test conditions, see the Electrical Characteristics.  
Timing Waveforms  
20112306  
20112305  
(b)  
(a)  
FIGURE 1. (a) Inverting, (b) Non-Inverting  
5
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Typical Performance Characteristics  
Supply Current vs Frequency  
Supply Current vs Capacitive Load  
20112311  
20112310  
Rise and Fall Time vs Supply Voltage  
Rise and Fall Time vs Temperature  
20112312  
20112313  
Rise and Fall Time vs Capacitive Load  
Delay Time vs Supply Voltage  
20112314  
20112315  
www.national.com  
6
Typical Performance Characteristics (Continued)  
Delay Time vs Temperature  
RDSON vs Supply Voltage  
20112317  
20112316  
UVLO Thresholds and Hysteresis vs Temperature  
20112318  
operated as a single with inputs and output pins connected.  
The drive current capability in parallel operation is precisely  
2X the drive of an individual channel. Small differences in  
switching speed between the driver channels will produce a  
transient current (shoot-through) in the output stage when  
two output pins are connected to drive a single load. The  
efficiency loss for parallel operation has been characterized  
at various loads, supply voltages and operating frequencies.  
The power dissipation in the LM5111 increases be less than  
1% relative to the dual driver configuration when operated as  
a single driver with inputs/ outputs connected.  
Detailed Operating Description  
LM5111 dual gate driver consists of two independent and  
identical driver channels with TTL compatible logic inputs  
and high current totem-pole outputs that source or sink  
current to drive MOSFET gates. The driver output consist of  
a compound structure with MOS and bipolar transistor oper-  
ating in parallel to optimize current capability over a wide  
output voltage and operating temperature range. The bipolar  
device provides high peak current at the critical threshold  
region of the MOSFET VGS while the MOS devices provide  
rail-to-rail output swing. The totem pole output drives the  
MOSFET gate between the gate drive supply voltage VCC  
and the power ground potential at the VEE pin.  
An Under Voltage Lock Out (UVLO) circuit is included in the  
LM5111 , which senses the voltage difference between VCC  
and the chip ground pin, VEE. When the VCC to VEE voltage  
difference falls below 2.8V both driver channels are disabled.  
The UVLO hysteresis prevents chattering during brown-out  
conditions and the driver will resume normal operation when  
the VCC to VEE differential voltage exceeds approximately  
3.0V.  
The control inputs of the drivers are high impedance CMOS  
buffers with TTL compatible threshold voltages. The LM5111  
pinout was designed for compatibility with industry standard  
gate drivers in single supply gate driver applications.  
The two driver channels of the LM5111 are designed as  
identical cells. Transistor matching inherent to integrated  
circuit manufacturing ensures that the AC and DC pe-  
formance of the channels are nearly identical. Closely  
matched propagation delays allow the dual driver to be  
The LM5111 is available in dual non-inverting (-1), dual  
Inverting (-2) and the combination inverting plus non-  
inverting (-3) configurations. All three configurations are of-  
fered in the SOIC-8 plastic package.  
7
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Layout Considerations  
Attention must be given to board layout when using LM5111.  
Some important considerations include:  
1. A Low ESR/ESL capacitor must be connected close to  
the IC and between the VCC and VEE pins to support  
high peak currents being drawn from VCC during turn-on  
of the MOSFET.  
2. Proper grounding is crucial. The drivers need a very low  
impedance path for current return to ground avoiding  
inductive loops. The two paths for returning current to  
ground are a) between LM5111 VEE pin and the ground  
of the circuit that controls the driver inputs, b) between  
LM5111 VEE pin and the source of the power MOSFET  
being driven. All these paths should be as short as  
possible to reduce inductance and be as wide as pos-  
sible to reduce resistance. All these ground paths should  
be kept distinctly separate to avoid coupling between the  
high current output paths and the logic signals that drive  
the LM5111. A good method is to dedicate one copper  
plane in a multi-layered PCB to provide a common  
ground surface.  
20112307  
FIGURE 2.  
The schematic above shows a conceptual diagram of the  
LM5111 output and MOSFET load. Q1 and Q2 are the  
switches within the gate driver. RG is the gate resistance of  
the external MOSFET, and CIN is the equivalent gate capaci-  
tance of the MOSFET. The gate resistance Rg is usually very  
small and losses in it can be neglected. The equivalent gate  
capacitance is a difficult parameter to measure since it is the  
combination of CGS (gate to source capacitance) and CGD  
(gate to drain capacitance). Both of these MOSFET capaci-  
tances are not constants and vary with the gate and drain  
voltage. The better way of quantifying gate capacitance is  
the total gate charge QG in coloumbs. QG combines the  
charge required by CGS and CGD for a given gate drive  
3. With the rise and fall times in the range of 10 ns to 30 ns,  
care is required to minimize the lengths of current car-  
rying conductors to reduce their inductance and EMI  
from the high di/dt transients generated by the LM5111.  
4. The LM5111 SOIC footprint is compatible with other  
industry standard drivers including the TC4426/27/28  
and UCC27323/4/5.  
5. If either channel is not being used, the respective input  
pin (IN_A or IN_B) should be connected to either VEE or  
VCC to avoid spurious output signals.  
voltage VGATE  
.
Assuming negligible gate resistance, the total power dissi-  
pated in the MOSFET driver due to gate charge is approxi-  
mated by  
Thermal Performance  
PDRIVER = VGATE x QG x FSW  
INTRODUCTION  
Where  
The primary goal of thermal management is to maintain the  
integrated circuit (IC) junction temperature (TJ) below a  
specified maximum operating temperature to ensure reliabil-  
ity. It is essential to estimate the maximum TJ of IC compo-  
nents in worst case operating conditions. The junction tem-  
perature is estimated based on the power dissipated in the  
IC and the junction to ambient thermal resistance θJA for the  
IC package in the application board and environment. The  
θJA is not a given constant for the package and depends on  
the printed circuit board design and the operating environ-  
ment.  
FSW = switching frequency of the MOSFET.  
For example, consider the MOSFET MTD6N15 whose gate  
charge specified as 30 nC for VGATE = 12V.  
The power dissipation in the driver due to charging and  
discharging of MOSFET gate capacitances at switching fre-  
quency of 300 kHz and VGATE of 12V is equal to  
PDRIVER = 12V x 30 nC x 300 kHz = 0.108W.  
If both channels of the LM5111 are operating at equal fre-  
quency with equivalent loads, the total losses will be twice as  
this value which is 0.216W.  
DRIVE POWER REQUIREMENT CALCULATIONS IN  
LM5111  
In addition to the above gate charge power dissipation, -  
transient power is dissipated in the driver during output  
transitions. When either output of the LM5111 changes state,  
current will flow from VCC to VEE for a very brief interval of  
time through the output totem-pole N and P channel  
MOSFETs. The final component of power dissipation in the  
driver is the power associated with the quiescent bias cur-  
rent consumed by the driver input stage and Under-voltage  
lockout sections.  
The LM5111 dual low side MOSFET driver is capable of  
sourcing/sinking 3A/5A peak currents for short intervals to  
drive a MOSFET without exceeding package power dissipa-  
tion limits. High peak currents are required to switch the  
MOSFET gate very quickly for operation at high frequencies.  
Characterization of the LM5111 provides accurate estimates  
of the transient and quiescent power dissipation compo-  
nents. At 300 kHz switching frequency and 30 nC load used  
in the example, the transient power will be 8 mW. The 1 mA  
nominal quiescent current and 12V VGATE supply produce a  
12 mW typical quiescent power.  
Therefore the total power dissipation  
PD = 0.216 + 0.008 + 0.012 = 0.236W.  
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8
flow. If the ambient temperature (TA) is 60˚C, and the RD  
-
Thermal Performance (Continued)  
We know that the junction temperature is given by  
S(on) of the LM5111 output at TJ(max) is 2.5, this equation  
yields ISINK(max) of 391mA which is much smaller than 5A  
peak pulsed currents.  
TJ = PD x θJA + TA  
Similarly, the maximum continuous source current can be  
calculated as  
Or the rise in temperature is given by  
TRISE = TJ − TA = PD x θJA  
For SOIC-8 package θJA is estimated as 170˚C/W for the  
conditions of natural convection.  
Therefore TRISE is equal to  
TRISE = 0.236 x 170 = 40.1˚C  
where VDIODE is the voltage drop across hybrid output stage  
which varies over temperature and can be assumed to be  
about 1.1V at TJ(max) of 125˚C. Assuming the same param-  
eters as above, this equation yields ISOURCE(max) of 347mA.  
CONTINUOUS CURRENT RATING OF LM5111  
The LM5111 can deliver pulsed source/sink currents of 3A  
and 5A to capacitive loads. In applications requiring continu-  
ous load current (resistive or inductive loads), package  
power dissipation, limits the LM5111 current capability far  
below the 5A sink/3A source capability. Rated continuous  
current can be estimated both when sourcing current to or  
sinking current from the load. For example when sinking, the  
maximum sink current can be calculated as:  
where RDS(on) is the on resistance of lower MOSFET in the  
output stage of LM5111.  
Consider TJ(max) of 125˚C and θJA of 170˚C/W for an SO-8  
package under the condition of natural convection and no air  
9
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Physical Dimensions inches (millimeters)  
unless otherwise noted  
NOTES: UNLESS OTHERWISE SPECIFIED  
1. STANDARD LEAD FINISH TO BE 200 MICROINCHES/5.08 MICROMETERS MINIMUM LEAD/TIN(SOLDER) ON  
COPPER.  
2. DIMENSION DOES NOT INCLUDE MOLD FLASH.  
3. REFERENCE JEDEC REGISTRATION MS-012, VARIATION AA, DATED MAY 1990.  
8-Lead SOIC Package  
NS Package Number M08A  
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