LM208 [NSC]

Operational Amplifiers; 运算放大器
LM208
型号: LM208
厂家: National Semiconductor    National Semiconductor
描述:

Operational Amplifiers
运算放大器

运算放大器
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中文:  中文翻译
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May 1989  
LM108A/LM208A/LM308A Operational Amplifiers  
General Description  
The LM108/LM108A series are precision operational ampli-  
fiers having specifications about a factor of ten better than  
FET amplifiers over their operating temperature range. In  
addition to low input currents, these devices have extremely  
low offset voltage, making it possible to eliminate offset ad-  
justments, in most cases, and obtain performance ap-  
proaching chopper stabilized amplifiers.  
introducing less error than devices like the 709 with 10 kX  
sources. Integrators with drifts less than 500 mV/sec and  
analog time delays in excess of one hour can be made us-  
ing capacitors no larger than 1 mF.  
The LM208A is identical to the LM108A, except that the  
b
LM208A has its performance guaranteed over a 25 C to  
§
85 C temperature range, instead of 55 C to 125 C.  
a
b
a
The LM308A devices have slightly-relaxed specifications  
§
§
§
g
18V and have sufficient supply rejection to use unregulat-  
The devices operate with supply voltages from  
g
2V to  
a
and performances over a 0 C to 70 C temperature range.  
§
§
ed supplies. Although the circuit is interchangeable with and  
uses the same compensation as the LM101A, an alternate  
compensation scheme can be used to make it particularly  
insensitive to power supply noise and to make supply by-  
pass capacitors unnecessary.  
Features  
Y
Offset voltage guaranteed less than 0.5 mV  
Y
Y
Y
Y
Maximum input bias current of 3.0 nA over temperature  
Offset current less than 400 pA over temperature  
Supply current of only 300 mA, even in saturation  
The low current error of the LM108A series makes possible  
many designs that are not practical with conventional ampli-  
fiers. In fact, it operates from 10 MX source resistances,  
Guaranteed 5 mV/ C drift  
§
Compensation Circuits  
Standard Compensation Circuit  
Alternate* Frequency Compensation  
R1 C  
O
a
R1 R2  
*Improve
noise b
30 pF  
TL/H/7759–1  
.
TL/H/7759–2  
**Bandwidth and slew rate are proportional to 1/C  
f
**Bandwidth and slew rate are proportional to 1/C  
.
s
Feedforward Compensation  
TL/H/7759–3  
C
1995 National Semiconductor Corporation  
TL/H/7759  
RRD-B30M115/Printed in U. S. A.  
LM108A/LM208A Absolute Maximum Ratings  
b
a
65 C to 150 C  
If Military/Aerospace specified devices are required,  
please contact the National Semiconductor Sales  
Office/Distributors for availability and specifications.  
(Note 5)  
Storage Temperature Range  
§
§
Lead Temperature (Soldering, 10 sec.) (DIP)  
260 C  
§
Soldering Information  
Dual-In-Line Package  
Soldering (10 sec.)  
g
Supply Voltage  
20V  
260 C  
§
Power Dissipation (Note 1)  
Differential Input Current (Note 2)  
Input Voltage (Note 3)  
500 mW  
Small Outline Package  
Vapor Phase (60 sec.)  
Infrared (15 sec.)  
215 C  
§
g
10 mA  
220 C  
§
g
15V  
Continuous  
See An-450 ‘‘Surface Mounting Methods and Their Effect  
on Product Reliability’’ for other methods of soldering sur-  
face mount devices.  
Output Short-Circuit Duration  
Operating Free Air Temperature Range  
LM108A  
LM208A  
b
b
a
55 C to 125 C  
§
25 C to 85 C  
§
§
ESD Tolerance (Note 6)  
2000V  
a
§
Electrical Characteristics (Note 4)  
Parameter  
Conditions  
Min  
Typ  
0.3  
0.05  
0.8  
70  
Max  
0.5  
Units  
mV  
nA  
e
e
e
e
e
Input Offset Voltage  
Input Offset Current  
Input Bias Current  
Input Resistance  
T
T
T
T
T
T
25 C  
§
A
A
A
A
A
A
25 C  
§
0.2  
25 C  
§
2.0  
nA  
25 C  
§
30  
80  
MX  
mA  
Supply Current  
25 C  
§
0.3  
0.6  
e
e
g
Large Signal Voltage Gain  
25 C, V  
§
15V,  
S
300  
1.0  
V/mV  
mV  
t
10 kX  
e
g
V
10V, R  
OUT  
L
Input Offset Voltage  
1.0  
5.0  
0.4  
2.5  
Average Temperature Coefficient  
of Input Offset Voltage  
mV/ C  
§
Input Offset Current  
nA  
Average Temperature Coefficient  
of Input Offset Current  
0.5  
pA/ C  
§
Input Bias Current  
Supply Current  
3.0  
0.4  
nA  
e
T
A
125 C  
§
0.15  
mA  
e
t
e
g
g
Large Signal Voltage Gain  
V
15V, V  
10V,  
S
OUT  
40  
V/mV  
R
10 kX  
L
S
S
e
e
e
g
g
g
g
14  
Output Voltage Swing  
V
V
15V, R  
10 kX  
13  
V
V
L
g
Input Voltage Range  
15V  
13.5  
96  
Common Mode Rejection Ratio  
Supply Voltage Rejection Ratio  
110  
110  
dB  
dB  
96  
Note 1: The maximum junction temperature of the LM108A is 150 C, while that of the LM208A is 100 C. For operating at elevated temperatures, devices in the H08  
§
§
package must be derated based on a thermal resistance of 160 C/W, junction to ambient, or 20 C/W, junction to case. The thermal resistance of the dual-in-line  
§
§
package is 100 C/W, junction to ambient.  
§
Note 2: The inputs are shunted with back-to-back diodes for overvoltage protection. Therefore, excessive current will flow if a differential input voltage in excess of  
1V is applied between the inputs unless some limiting resistance is used.  
g
Note 3: For supply voltages less than 15V, the absolute maximum input voltage is equal to the supply voltage.  
s
s
s
s
125 C, unless otherwise specified. With the LM208A, however, all temperature  
A
b
g
g
20V and 55 C  
Note 4: These specifications apply for 5V  
s
V
T
§
§
S
s
85 C.  
b
specifications are limited to 25 C  
T
§
§
A
Note 5: Refer to RETS108AX for LM108AH and LM108AJ-8 military specifications.  
Note 6: Human body model, 1.5 kX in series with 100 pF.  
2
LM308A Absolute Maximum Ratings  
If Military/Aerospace specified devices are required,  
please contact the National Semiconductor Sales  
Office/Distributors for availability and specifications.  
Lead Temperature (Soldering, 10 sec.) (DIP)  
260 C  
§
Soldering Information  
Dual-In-Line Package  
Soldering (10 sec.)  
Small Outline Package  
Vapor phase (60 sec.)  
Infrared (15 sec.)  
g
Supply Voltage  
18V  
260 C  
§
Power Dissipation (Note 1)  
Differential Input Current (Note 2)  
Input Voltage (Note 3)  
500 mW  
215 C  
§
g
10 mA  
220 C  
§
g
15V  
Continuous  
See An-450 ‘‘Surface Mounting Methods and Their Effect  
on Product Reliability’’ for other methods of soldering sur-  
face mount devices.  
Output Short-Circuit Duration  
Operating Temperature Range  
Storage Temperature Range  
a
0 C to 70 C  
§
65 C to 150 C  
§
§
b
a
ESD rating to be determined.  
§
H-Package Lead Temperature  
(Soldering, 10 sec.)  
300 C  
§
Electrical Characteristics (Note 4)  
Parameter  
Conditions  
Min  
Typ  
0.3  
0.2  
1.5  
40  
Max  
0.5  
1
Units  
mV  
nA  
e
e
e
e
e
Input Offset Voltage  
Input Offset Current  
Input Bias Current  
Input Resistance  
T
T
T
T
T
T
25 C  
§
A
A
A
A
A
A
25 C  
§
25 C  
§
7
nA  
25 C  
§
10  
80  
MX  
mA  
e
e
g
g
Supply Current  
25 C, V  
§
15V  
0.3  
0.8  
S
e
Large Signal Voltage Gain  
25 C, V  
15V,  
§
S
300  
2.0  
2.0  
V/mV  
mV  
t
10 kX  
e
g
g
g
V
V
V
10V, R  
OUT  
L
e
e
e
Input Offset Voltage  
15V, R  
100X  
100X  
0.73  
5.0  
1.5  
10  
S
S
S
e
Average Temperature Coefficient  
of Input Offset Voltage  
15V, R  
S
mV/ C  
§
Input Offset Current  
nA  
Average Temperature Coefficient  
of Input Offset Current  
pA/ C  
§
Input Bias Current  
10  
nA  
e
e
g
g
Large Signal Voltage Gain  
V
15V, V  
10V,  
S
OUT  
60  
V/mV  
t
e
e
R
10 kX  
L
S
S
e
g
g
g
g
g
14  
Output Voltage Swing  
V
V
15V, R  
10 kX  
13  
14  
V
V
L
Input Voltage Range  
15V  
Common Mode Rejection Ratio  
Supply Voltage Rejection Ratio  
96  
96  
110  
110  
dB  
dB  
Note 1: The maximum junction temperature of the LM308A is 85 C. For operating at elevated temperatures, devices in the H08 package must be derated based on  
§
a thermal resistance of 160 C/W, junction to ambient, or 20 C/W, junction to case. The thermal resistance of the dual-in-line package is 100 C/W, junction to  
§
§
§
ambient.  
Note 2: The inputs are shunted with back-to-back diodes for overvoltage protection. Therefore, excessive current will flow if a differential input voltage in excess of  
1V is applied between the inputs unless some limiting resistance is used.  
g
Note 3: For supply voltages less than 15V, the absolute maximum input voltage is equal to the supply voltage.  
s
s
s
s
a
T
A
g
Note 4: These specifications apply for 5V  
g
15V and 0 C  
V
S
70 C, unless otherwise specified.  
§
§
3
Typical Applications  
Sample and Hold  
²
Teflon, polyethylene or polycarbo
Worst case drift less than 2.5 mV/sec.  
TL/H/7759–4  
High Speed Amplifier with Low Drift and Low Input Current  
TL/H/7759–5  
4
Application Hints  
A very low drift amplifier poses some uncommon application  
and testing problems. Many sources of error can cause the  
apparent circuit drift to be much higher than would be pre-  
dicted.  
Resistors can cause other errors besides gradient generat-  
ed voltages. If the gain setting resistors do not track with  
temperature a gain error will result. For example, a gain of  
1000 amplifier with a constant 10 mV input will have a 10V  
output. If the resistors mistrack by 0.5% over the operating  
temperature range, the error at the output is 50 mV. Re-  
ferred to input, this is a 50 mV error. All of the gain fixing  
resistor should be the same material.  
Thermocouple effects caused by temperature gradient  
across dissimilar metals are perhaps the worst offenders.  
Only a few degrees gradient can cause hundreds of micro-  
volts of error. The two places this shows up, generally, are  
the package-to-printed circuit board interface and tempera-  
ture gradients across resistors. Keeping package leads  
short and the two input leads close together helps greatly.  
Testing low drift amplifiers is also difficult. Standard drift  
testing technique such as heating the device in an oven and  
having the leads available through a connector, thermo-  
probe, or the soldering iron methodÐdo not work. Thermal  
gradients cause much greater errors than the amplifier drift.  
Coupling microvolt signal through connectors is especially  
bad since the temperature difference across the connector  
Resistor choice as well as physical placement is important  
for minimizing thermocouple effects. Carbon, oxide film and  
some metal film resistors can cause large thermocouple er-  
rors. Wirewound resistors of evanohm or manganin are best  
can be 50 C or more. The device under test along with the  
§
gain setting resistor should be isothermal.  
since they only generate about 2 mV/ C referenced to cop-  
§
per. Of course, keeping the resistor ends at the same tem-  
perature is important. Generally, shielding a low drift stage  
electrically and thermally will yield good results.  
Schematic Diagram  
TL/H/7759–6  
5
Connection Diagrams  
Metal Can Package  
Dual-In-Line Package  
TL/H/7759–7  
Pin 4 is connected to the case.  
TL/H/7759–8  
Top View  
**Unused pin (no internal connection) to allow for input anti-leakage guard  
ring on printed circuit board layout.  
Order Number LM108AJ-8, LM208AJ-8, LM308AJ-8,  
LM308AM or LM308AN  
See NS Package Number J08A, M08A or N08E  
Order Number LM108AH, LM208AH or LM208AH  
See NS Package Number H08C  
Physical Dimensions inches (millimeters)  
Metal Can Package (H)  
Order Number LM108AH, LM208AH or LM308AH  
NS Package Number H08C  
6
Physical Dimensions inches (millimeters) (Continued)  
Ceramic Dual-In-Line Package (J)  
Order Number LM108AJ-8, LM208AJ-8 or LM308AJ-8  
NS Package Number J08A  
S.O. Package (M)  
Order Number LM308AM  
NS Package Number M08A  
7
Physical Dimensions inches (millimeters) (Continued)  
Molded Dual-In-Line Package (N)  
Order Number LM308AN  
NS Package Number N08E  
LIFE SUPPORT POLICY  
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DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL  
SEMICONDUCTOR CORPORATION. As used herein:  
1. Life support devices or systems are devices or  
systems which, (a) are intended for surgical implant  
into the body, or (b) support or sustain life, and whose  
failure to perform, when properly used in accordance  
with instructions for use provided in the labeling, can  
be reasonably expected to result in a significant injury  
to the user.  
2. A critical component is any component of a life  
support device or system whose failure to perform can  
be reasonably expected to cause the failure of the life  
support device or system, or to affect its safety or  
effectiveness.  
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