54ACTQ543DMQBD [NSC]

Quiet Series Octal Registered Transceiver with TRI-STATE Outputs; 宁静系列八路寄存收发器具有​​三态输出
54ACTQ543DMQBD
型号: 54ACTQ543DMQBD
厂家: National Semiconductor    National Semiconductor
描述:

Quiet Series Octal Registered Transceiver with TRI-STATE Outputs
宁静系列八路寄存收发器具有​​三态输出

文件: 总10页 (文件大小:159K)
中文:  中文翻译
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August 1998  
54ACTQ543  
Quiet Series Octal Registered Transceiver with  
TRI-STATE® Outputs  
General Description  
Features  
n Guaranteed simultaneous switching noise level and  
dynamic threshold performance  
The ACTQ543 is a non-inverting octal transceiver containing  
two sets of D-type registers for temporary storage of data  
flowing in either direction. Separate Latch Enable and Out-  
put Enable inputs are provided for each register to permit in-  
dependent input and output control in either direction of data  
flow.  
n 8-bit octal latched transceiver  
n Separate controls for data flow in each direction  
n Back-to-back registers for storage  
n Outputs source/sink 24 mA  
The ACTQ utilizes NSC Quiet Series technology to guaran-  
tee quiet output switching and improved dynamic threshold  
n 4 kV minimum ESD immunity  
performance. FACT Quiet Series features GTO output  
control and undershoot corrector in addition to a split ground  
bus for superior performance.  
Ordering Code  
Military  
Package  
Number  
J24A  
Package Description  
54ACTQ543DMQB  
54ACTQ543FMQB  
54ACTQ543LMQB  
24-Lead Ceramic Dual-In-Line  
24-Lead Cerpack  
W24C  
E28A  
24-Lead Ceramic Leadless  
Chip Carrier, Type C  
Logic Symbols  
IEEE/IEC  
DS100233-1  
DS100233-4  
GTO is a trademark of National Semiconductor Corporation.  
TRI-STATE® is a registered trademark of National Semiconductor Corporation.  
FACT® is a registered trademark of Fairchild Semiconductor Corporation.  
FACT Quiet Series is a trademark of Fairchild Semiconductor Corporation.  
© 1998 National Semiconductor Corporation  
DS100233  
www.national.com  
Connection Diagrams  
Pin Names  
OEAB  
OEBA  
CEAB  
Description  
A-to-B Output Enable Input (Active LOW)  
B-to-A Output Enable Input (Active LOW)  
A-to-B Enable Input (Active LOW)  
B-to-A Enable Input (Active LOW)  
A-to-B Latch Enable Input (Active LOW)  
B-to-A Latch Enable Input (Active LOW)  
A-to-B Data Inputs or  
Pin Assignment for  
DIP and Flatpak  
CEBA  
LEAB  
LEBA  
A0–A7  
B-to-A TRI-STATE Outputs  
B0–B7  
B-to-A Data Inputs or  
A-to-B TRI-STATE Outputs  
Functional Description  
The ACTQ543 contains two sets of eight D-type latches, with  
separate input and output controls for each set. For data flow  
from A to B, for example, the A-to-B Enable (CEAB) input  
must be LOW in order to enter data from A0–A7 or take data  
from B0–B7, as indicated in the Data I/O Control Table. With  
CEAB LOW, a LOW signal on the A-to-B Latch Enable  
(LEAB) input makes the A-to-B latches transparent; a subse-  
quent LOW-to-HIGH transition of the LEAB signal puts the A  
latches in the storage mode and their outputs no longer  
change with the A inputs. With CEAB and OEAB both LOW,  
the TRI-STATE B output buffers are active and reflect the  
data present at the output of the A latches. Control of data  
flow from B to A is similar, but using the CEBA, LEBA and  
OEBA inputs.  
DS100233-2  
Pin Assignment  
for LCC  
Data I/O Control Table  
Inputs  
Latch Status Output Buffers  
DS100233-3  
CEAB LEAB OEAB  
H
X
L
X
H
L
X
X
X
H
L
Latched  
Latched  
Transparent  
High Z  
X
L
X
X
High Z  
Driving  
=
=
=
H
L
X
HIGH Voltage Level  
LOW Voltage Level  
Immaterial  
A-to-B data flow shown; B-to-A flow control is the same, except using CEBA,  
LEBA and OEBA  
www.national.com  
2
Logic Diagram  
DS100233-8  
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.  
3
www.national.com  
Absolute Maximum Ratings (Note 1)  
If Military/Aerospace specified devices are required,  
please contact the National Semiconductor Sales Office/  
Distributors for availability and specifications.  
DC Latch-up Source or  
Sink Current  
±
300 mA  
175˚C  
Junction Temperature (TJ)  
CDIP  
Supply Voltage (VCC  
)
−0.5V to +7.0V  
Recommended Operating  
Conditions  
Supply Voltage VCC  
’ACTQ  
DC Input Diode Current (IIK  
)
=
VI −0.5V  
−20 mA  
+20 mA  
=
VI VCC + 0.5V  
DC Input Voltage (VI)  
−0.5V to VCC + 0.5V  
4.5V to 5.5V  
0V to VCC  
0V to VCC  
DC Output Diode Current (IOK  
)
Input Voltage (VI)  
=
VO −0.5V  
−20 mA  
+20 mA  
Output Voltage (VO  
)
=
VO VCC + 0.5V  
Operating Temperature (TA) (Note 2)  
54ACTQ  
DC Output Voltage (VO  
DC Output Source  
)
−0.5V to VCC + 0.5V  
−55˚C to +125˚C  
Minimum Input Edge Rate V/t  
’ACTQ Devices  
±
±
or Sink Current (IO  
)
50 mA  
DC VCC or Ground Current  
per Output Pin (ICC or IGND  
VIN from 0.8V to 2.0V  
)
50 mA  
@
VCC 4.5V, 5.5V  
125 mV/ns  
Storage Temperature (TSTG  
)
−65˚C to +150˚C  
Note 1: Absolute maximum ratings are those values beyond which damage  
to the device may occur. The databook specifications should be met, without  
exception, to ensure that the system design is reliable over its power supply,  
temperature, and output/input loading variables. National does not recom-  
mend operation of FACT® circuits outside databook specifications.  
Note 2: All commercial packaging is not recommended for applications re-  
quiring greater than 2000 temperature cycles from −40˚C to +125˚C.  
DC Characteristics for ’ACTQ Family Devices  
54ACTQ  
=
Symbol  
Parameter  
VCC  
(V)  
TA  
Units  
Conditions  
−55˚C to +125˚C  
Guaranteed Limits  
=
VIH  
VIL  
Minimum High Level  
Input Voltage  
4.5  
5.5  
4.5  
5.5  
4.5  
5.5  
2.0  
2.0  
0.8  
0.8  
4.4  
5.4  
V
V
V
VOUT 0.1V  
or VCC − 0.1V  
=
Maximum Low Level  
Input Voltage  
VOUT 0.1V  
or VCC − 0.1V  
=
VOH  
Minimum High Level  
Output Voltage  
IOUT −50 µA  
(Note 3)  
=
VIN VIL or VIH  
4.5  
5.5  
4.5  
5.5  
3.70  
4.70  
0.1  
V
V
IOH = −24 mA  
IOH = −24 mA  
=
VOL  
Maximum Low Level  
Output Voltage  
IOUT 50 µA  
0.1  
(Note 3)  
=
VIN VIL or VIH  
4.5  
5.5  
5.5  
0.50  
0.50  
V
IOL = 24 mA  
IOL = 24 mA  
=
±
IIN  
Maximum Input  
Leakage Current  
Maximum I/O  
1.0  
µA  
µA  
VI VCC, GND  
±
IOZT  
5.5  
10  
V(OE)  
V
IL, VIH  
=
=
Leakage Current  
Maximum ICC/Input  
VO VCC, GND  
=
VI VCC − 2.1V  
ICCT  
IOLD  
5.5  
5.5  
1.6  
mA  
mA  
=
VOLD 1.65V Max  
Minimum Dynamic  
Output Current  
(Note 4)  
=
VOHD 3.85V Min  
IOHD  
ICC  
5.5  
5.5  
−50  
mA  
µA  
=
Maximum Quiescent  
Supply Current  
160.0  
VIN VCC  
or GND (Note 5)  
www.national.com  
4
DC Characteristics for ’ACTQ Family Devices (Continued)  
54ACTQ  
=
Symbol  
Parameter  
VCC  
(V)  
TA  
Units  
Conditions  
−55˚C to +125˚C  
Guaranteed Limits  
1.5  
VOLP  
Quiet Output  
5.0  
5.0  
V
V
(Notes 6, 7)  
Maximum Dynamic VOL  
Quiet Output  
VOLV  
−1.2  
(Notes 6, 7)  
Minimum Dynamic VOL  
Note 3: Maximum of 8 outputs loaded; thresholds on input associated with output under test.  
Note 4: Maximum test duration 2.0 ms, one output loaded at a time.  
@ @  
for 54ACTQ 25˚C is identical to 74ACTQ 25˚C.  
Note 5:  
I
CC  
Note 6: Plastic DIP package.  
Note 7: Max number of outputs defined as (n). (n−1) Data Inputs are driven 0V to 3V, one output GND.  
Note 8: Max number of Data Inputs (n) switching. (n–1) Inputs switching 0V to 3V (’ACTQ). Input-under-test switching: 3V to threshold (V ), 0V to threshold (V ),  
@
ILD IHD  
=
f
1 MHz.  
AC Electrical Characteristics  
54ACTQ  
=
TA −55˚C  
Fig.  
No.  
VCC  
(V)  
Symbol  
Parameter  
to +125˚C  
Units  
=
CL 50 pF  
(Note 9)  
Min  
Max  
tPLH  
tPHL  
Propagation Delay  
Transparent Mode  
5.0  
5.0  
5.0  
5.0  
2.0  
9.5  
ns  
ns  
ns  
ns  
Figure 4  
Figure 4  
An to Bn or Bn to An  
Propagation Delay  
tPLH  
tPHL  
LEBA, LEAB  
2.0  
1.5  
1.5  
11.0  
13.0  
9.0  
to An, Bn  
tPZH  
tPZL  
Output Enable Time  
OEBA or OEAB to An or Bn  
CEBA or CEAB to An or Bn  
Output Disable Time  
OEBA or OEAB to An or Bn  
CEBA or CEAB to An or Bn  
Figure 6  
Figure 6  
tPHZ  
tPLZ  
±
Note 9: Voltage Range 5.0 is 5.0V 0.5V  
AC Operating Requirements  
54ACTQ  
=
TA −55˚C  
Symbol  
Parameter  
to +125˚C  
Units  
Fig.  
No.  
VCC  
(V)  
=
CL 50 pF  
(Note 10)  
Guaranteed  
Minimum  
3.0  
ts  
Setup Time, HIGH or LOW  
An or Bn to LEBA or LEAB  
Hold Time, HIGH or LOW  
An or Bn to LEBA or LEAB  
Latch Enable  
5.0  
5.0  
5.0  
ns  
ns  
ns  
Figure 7  
Figure 7  
Figure 5  
th  
1.5  
4.0  
tw  
Pulse Width, LOW  
±
Note 10: Voltage Range 5.0 is 5.0V 0.5V  
5
www.national.com  
Capacitance  
Symbol  
Parameter  
Typ  
4.5  
Units  
pF  
Conditions  
=
VCC OPEN  
CIN  
Input Capacitance  
Power Dissipation  
Capacitance  
=
VCC 5.0V  
CPD  
70.0  
pF  
AC Loading  
AC Waveforms  
DS100233-12  
FIGURE 4. Propagation Delay Waveforms for Inverting  
and Non-Inverting Functions  
DS100233-10  
*Includes jig and probe capacitance  
FIGURE 1. Standard AC Test Load  
DS100233-13  
DS100233-11  
FIGURE 5. Propagation Delay, Pulse Width Waveforms  
FIGURE 2. Test Input Signal Levels  
Amplitude  
Rep. Rate  
tw  
tr  
tf  
3.0V  
1 MHz  
500 ns  
2.5 ns  
2.5 ns  
FIGURE 3. Test Input Signal Requirements  
DS100233-14  
FIGURE 6. TRI-STATE Output High and Low Enable  
and Disable Time  
www.national.com  
6
AC Waveforms (Continued)  
DS100233-15  
FIGURE 7. Setup Time, Hold Time and Recovery Time Waveforms  
7
www.national.com  
8
Physical Dimensions inches (millimeters) unless otherwise noted  
28-Terminal Ceramic Leadless Chip Carrier (L)  
NS Package Number E28A  
24-Lead Ceramic Dual-In-Line Package (D)  
NS Package Number J24F  
9
www.national.com  
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)  
24-Lead Ceramic Flatpak (F)  
NS Package Number W24C  
LIFE SUPPORT POLICY  
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DE-  
VICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMI-  
CONDUCTOR CORPORATION. As used herein:  
1. Life support devices or systems are devices or sys-  
tems which, (a) are intended for surgical implant into  
the body, or (b) support or sustain life, and whose fail-  
ure to perform when properly used in accordance  
with instructions for use provided in the labeling, can  
be reasonably expected to result in a significant injury  
to the user.  
2. A critical component in any component of a life support  
device or system whose failure to perform can be rea-  
sonably expected to cause the failure of the life support  
device or system, or to affect its safety or effectiveness.  
National Semiconductor  
Corporation  
Americas  
Tel: 1-800-272-9959  
Fax: 1-800-737-7018  
Email: support@nsc.com  
National Semiconductor  
Europe  
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Response Group  
Tel: 65-2544466  
Fax: 65-2504466  
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Japan Ltd.  
Tel: 81-3-5620-6175  
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Email: europe.support@nsc.com  
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www.national.com  
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.  

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