UPD4482363GF-A50 [NEC]

8M-BIT CMOS SYNCHRONOUS FAST SRAM PIPELINED OPERATION DOUBLE CYCLE DESELECT; 8M - BIT的CMOS同步快速SRAM流水线操作双循环DESELECT
UPD4482363GF-A50
型号: UPD4482363GF-A50
厂家: NEC    NEC
描述:

8M-BIT CMOS SYNCHRONOUS FAST SRAM PIPELINED OPERATION DOUBLE CYCLE DESELECT
8M - BIT的CMOS同步快速SRAM流水线操作双循环DESELECT

存储 内存集成电路 静态存储器
文件: 总28页 (文件大小:298K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
DATA SHEET  
MOS INTEGRATED CIRCUIT  
µ
PD4482163, 4482183, 4482323, 4482363  
8M-BIT CMOS SYNCHRONOUS FAST SRAM  
PIPELINED OPERATION  
DOUBLE CYCLE DESELECT  
Description  
The µPD4482163 is a 524,288-word by 16-bit, the µPD4482183 is a 524,288-word by 18-bit, µPD4482323 is a 262,144-  
word by 32-bit and the µPD4482363 is a 262,144-word by 36-bit synchronous static RAM fabricated with advanced CMOS  
technology using Full-CMOS six-transistor memory cell.  
The µPD4482163, µPD4482183, µPD4482323 and µPD4482363 integrates unique synchronous peripheral circuitry, 2-  
bit burst counter and output buffer as well as SRAM core. All input registers are controlled by a positive edge of the single  
clock input (CLK).  
The µPD4482163, µPD4482183, µPD4482323 and µPD4482363 are suitable for applications which require synchronous  
operation, high speed, low voltage, high density and wide bit configuration, such as cache and buffer memory.  
ZZ has to be set LOW at the normal operation. When ZZ is set HIGH, the SRAM enters Power Down State (“Sleep”). In  
the “Sleep” state, the SRAM internal state is preserved. When ZZ is set LOW again, the SRAM resumes normal operation.  
The µPD4482163, µPD4482183, µPD4482323 and µPD4482363 are packaged in 100-pin PLASTIC LQFP with a 1.4  
mm package thickness for high density and low capacitive loading.  
Features  
Single 3.3 V power supply  
Synchronous operation  
Operating temperature : TA = 0 to 70 °C (-A44, -A50, -A60)  
TA = 40 to +85 °C (-A44Y, -A50Y, -A60Y)  
Internally self-timed write control  
Burst read / write : Interleaved burst and linear burst sequence  
Fully registered inputs and outputs for pipelined operation  
Double-Cycle deselect timing  
All registers triggered off positive clock edge  
3.3 V LVTTL Compatible : All inputs and outputs  
Fast clock access time : 2.8 ns (225 MHz), 3.1 ns (200 MHz), 3.5 ns (167 MHz)  
Asynchronous output enable : /G  
Burst sequence selectable : MODE  
Sleep mode : ZZ (ZZ = Open or Low : Normal operation)  
Separate byte write enable : /BW1 to /BW4, /BWE (µPD4482323, µPD4482363)  
/BW1, /BW2, /BWE (µPD4482163, µPD4482183)  
Global write enable : /GW  
Three chip enables for easy depth expansion  
Common I/O using three state outputs  
The information in this document is subject to change without notice. Before using this document, please  
confirm that this is the latest version.  
Not all products and/or types are available in every country. Please check with an NEC Electronics  
sales representative for availability and additional information.  
Document No. M14904EJ3V0DS00 (3rd edition)  
Date Published December 2002 NS CP(K)  
Printed in Japan  
The mark  shows major revised points.  
The mark # shows major revised points.  
2000  
µPD4482163, 4482183, 4482323, 4482363  
Ordering Information  
Part number  
Access  
Time  
ns  
Clock  
Frequency  
MHz  
Core Supply  
Voltage  
V
I/O Interface  
3.3 V LVTTL  
Operating  
Temperature  
°C  
Package  
µPD4482163GF-A44  
µPD4482163GF-A50  
µPD4482163GF-A60  
µPD4482183GF-A44  
µPD4482183GF-A50  
µPD4482183GF-A60  
µPD4482323GF-A44  
µPD4482323GF-A50  
µPD4482323GF-A60  
µPD4482363GF-A44  
µPD4482363GF-A50  
µPD4482363GF-A60  
µPD4482163GF-A44Y  
µPD4482163GF-A50Y  
µPD4482163GF-A60Y  
µPD4482183GF-A44Y  
µPD4482183GF-A50Y  
µPD4482183GF-A60Y  
µPD4482323GF-A44Y  
µPD4482323GF-A50Y  
µPD4482323GF-A60Y  
µPD4482363GF-A44Y  
µPD4482363GF-A50Y  
µPD4482363GF-A60Y  
2.8  
3.1  
3.5  
2.8  
3.1  
3.5  
2.8  
3.1  
3.5  
2.8  
3.1  
3.5  
2.8  
3.1  
3.5  
2.8  
3.1  
3.5  
2.8  
3.1  
3.5  
2.8  
3.1  
3.5  
225  
200  
167  
225  
200  
167  
225  
200  
167  
225  
200  
167  
225  
200  
167  
225  
200  
167  
225  
200  
167  
225  
200  
167  
3.3 ± 0.165  
0 to 70  
100-pin PLASTIC  
LQFP (14 × 20)  
40 to +85  
Data Sheet M14904EJ3V0DS  
2
µPD4482163, 4482183, 4482323, 4482363  
Pin Configurations  
/××× indicates active low signal.  
100-pin PLASTIC LQFP (14 x 20)  
[µPD4482163GF, µPD4482183GF]  
Marking Side  
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81  
NC  
NC  
NC  
1
80  
79  
78  
77  
76  
75  
74  
73  
72  
71  
70  
69  
68  
67  
66  
65  
64  
63  
62  
61  
60  
59  
58  
57  
56  
55  
54  
53  
52  
51  
A18  
NC  
NC  
2
3
V
DDQ  
4
V
V
DD  
Q
V
SS  
Q
5
SS  
Q
NC  
NC  
6
NC  
7
I/OP1, NC  
I/O8  
I/O9  
8
I/O10  
9
I/O7  
V
SS  
Q
Q
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
29  
30  
V
V
SS  
Q
V
DD  
DD  
Q
I/O11  
I/O12  
NC  
I/O6  
I/O5  
V
SS  
V
DD  
NC  
NC  
V
DD  
V
SS  
I/O13  
I/O14  
ZZ  
I/O4  
I/O3  
V
DD  
Q
Q
V
V
DD  
Q
V
SS  
SS  
Q
I/O15  
I/O16  
I/O2  
I/O1  
NC  
I/OP2, NC  
NC  
NC  
V
SS  
Q
Q
V
V
SS  
Q
V
DD  
DD  
Q
NC  
NC  
NC  
NC  
NC  
NC  
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50  
Remark Refer to Package Drawing for the 1-pin index mark.  
Data Sheet M14904EJ3V0DS  
3
µPD4482163, 4482183, 4482323, 4482363  
Pin Identification (µPD4482163GF, µPD4482183GF)  
Symbol Pin No.  
A0 to A18  
Description  
37, 36, 35, 34, 33, 32, 100, 99, 82, 81, 44, 45, 46, 47, 48, Synchronous Address Input  
49, 50, 43, 80  
I/O1 to I/O16  
58, 59, 62, 63, 68, 69, 72, 73, 8, 9, 12, 13, 18, 19, 22, 23  
Synchronous Data In,  
Synchronous / Asynchronous Data Out  
Synchronous Data In (Parity),  
I/OP1, NCNote  
I/OP2, NCNote  
/ADV  
74  
24  
Synchronous / Asynchronous Data Out (Parity)  
Synchronous Burst Address Advance Input  
Synchronous Address Status Processor Input  
Synchronous Address Status Controller Input  
Synchronous Chip Enable Input  
Synchronous Byte Write Enable Input  
Synchronous Global Write Input  
Asynchronous Output Enable Input  
Clock Input  
83  
/AP  
84  
/AC  
85  
/CE,CE2, /CE2  
98, 97, 92  
/BW1, /BW2, /BWE 93, 94, 87  
/GW  
/G  
88  
86  
89  
31  
CLK  
MODE  
Asynchronous Burst Sequence Select Input  
Do not change state during normal operation  
Asynchronous Power Down State Input  
Power Supply  
ZZ  
64  
VDD  
VSS  
15, 41, 65, 91  
17, 40, 67, 90  
Ground  
VDDQ  
VSSQ  
NC  
4, 11, 20, 27, 54, 61, 70, 77  
5, 10, 21, 26, 55, 60, 71, 76  
Output Buffer Power Supply  
Output Buffer Ground  
1, 2, 3, 6, 7, 14, 16, 25, 28, 29, 30, 38, 39, 42, 51, 52, 53, No Connection  
56, 57, 66, 75, 78, 79, 95, 96  
Note NC (No Connection) is used in the µPD4482163GF.  
I/OP1 and I/OP2 are used in the µPD4482183GF.  
Data Sheet M14904EJ3V0DS  
4
µPD4482163, 4482183, 4482323, 4482363  
100-pin PLASTIC LQFP (14 x 20)  
[µPD4482323GF, µPD4482363GF]  
Marking Side  
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81  
I/OP2, NC  
I/O16  
I/OP3, NC  
I/O17  
1
80  
79  
78  
77  
76  
75  
74  
73  
72  
71  
70  
69  
68  
67  
66  
65  
64  
63  
62  
61  
60  
59  
58  
57  
56  
55  
54  
53  
52  
51  
2
I/O15  
I/O18  
3
V
V
DD  
Q
V
DD  
Q
Q
4
SS  
Q
V
SS  
5
I/O14  
I/O13  
I/O12  
I/O11  
I/O19  
I/O20  
I/O21  
I/O22  
6
7
8
9
V
V
SS  
Q
V
SS  
Q
Q
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
29  
30  
DD  
Q
V
DD  
I/O10  
I/O9  
I/O23  
I/O24  
NC  
V
SS  
NC  
V
DD  
V
DD  
NC  
ZZ  
V
SS  
I/O25  
I/O26  
I/O8  
I/O7  
V
V
DD  
Q
V
DD  
Q
Q
SS  
Q
V
SS  
I/O6  
I/O5  
I/O4  
I/O3  
I/O27  
I/O28  
I/O29  
I/O30  
V
V
SS  
Q
V
SS  
Q
Q
DD  
Q
V
DD  
I/O2  
I/O31  
I/O32  
I/O1  
I/OP1, NC  
I/OP4, NC  
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50  
Remark Refer to Package Drawing for the 1-pin index mark.  
Data Sheet M14904EJ3V0DS  
5
µPD4482163, 4482183, 4482323, 4482363  
Pin Identification (µPD4482323GF, µPD4482363GF)  
Symbol  
A0 to A17  
Pin No.  
Description  
Synchronous Address Input  
37, 36, 35, 34, 33, 32, 100, 99, 82, 81, 44, 45,  
46, 47, 48, 49, 50, 43  
I/O1 to I/O32  
52, 53, 56, 57, 58, 59, 62, 63, 68, 69, 72, 73, 74, Synchronous Data In,  
75, 78, 79, 2, 3, 6, 7, 8, 9, 12, 13, 18, 19, 22, 23,  
24, 25, 28, 29  
Synchronous / Asynchronous Data Out  
I/OP1, NCNote  
I/OP2, NCNote  
I/OP3, NCNote  
I/OP4, NCNote  
/ADV  
51  
Synchronous Data In (Parity),  
80  
Synchronous / Asynchronous Data Out (Parity)  
1
30  
83  
Synchronous Burst Address Advance Input  
Synchronous Address Status Processor Input  
Synchronous Address Status Controller Input  
Synchronous Chip Enable Input  
Synchronous Byte Write Enable Input  
Synchronous Global Write Input  
Asynchronous Output Enable Input  
Clock Input  
/AP  
84  
/AC  
85  
/CE, CE2, /CE2  
98, 97, 92  
/BWE1 to /BWE4, /BWE 93, 94, 95, 96, 87  
/GW  
/G  
88  
86  
89  
31  
CLK  
MODE  
Asynchronous Burst Sequence Select Input  
Do not change state during normal operation  
Asynchronous Power Down State Input  
Power Supply  
ZZ  
64  
VDD  
VSS  
15, 41, 65, 91  
17, 40, 67, 90  
Ground  
VDDQ  
VSSQ  
NC  
4, 11, 20, 27, 54, 61, 70, 77  
5, 10, 21, 26, 55, 60, 71, 76  
14, 16, 38, 39, 42, 66  
Output Buffer Power Supply  
Output Buffer Ground  
No Connection  
Note NC (No Connection) is used in the µPD4482323GF.  
I/OP1 to I/OP4 are used in the µPD4482363GF.  
Data Sheet M14904EJ3V0DS  
6
µPD4482163, 4482183, 4482323, 4482363  
Block Diagrams  
[µPD4482163, µPD4482183]  
19  
17  
19  
Address  
A0 to A18  
Registers  
A0, A1  
A1’  
MODE  
/ADV  
CLK  
Q1  
Binary  
Counter  
and Logic  
A0’  
/AC  
/AP  
Row and Column  
Decoders  
CLR  
Q0  
8/9  
8/9  
Byte 1  
Byte 1  
Memory cell array  
1,024 rows  
/BW1  
/BW2  
Write Register  
Write Driver  
Byte 2  
Write Register  
Byte 2  
Write Driver  
512 × 16 columns  
(8,388,608 bits)  
512 × 18 columns  
(9,437,184 bits)  
/BWE  
16/18  
/GW  
/CE  
16/18  
Enable  
Register  
Output  
Registers Buffers  
Output  
CE2  
/CE2  
/G  
Input  
Registers  
2
16/18  
I/O1 to I/O16  
I/OP1 to I/OP2  
Power Down Control  
ZZ  
Burst Sequence  
[µPD4482163, µPD4482183]  
Interleaved Burst Sequence Table (MODE = VDD)  
External Address  
1st Burst Address  
2nd Burst Address  
3rd Burst Address  
A18 to A2, A1, A0  
A18 to A2, A1, /A0  
A18 to A2, /A1, A0  
A18 to A2, /A1, /A0  
Linear Burst Sequence Table (MODE = VSS)  
External Address  
1st Burst Address  
2nd Burst Address  
3rd Burst Address  
A18 to A2, 0, 0  
A18 to A2, 0, 1  
A18 to A2, 1, 0  
A18 to A2, 1, 1  
A18 to A2, 0, 1  
A18 to A2, 1, 0  
A18 to A2, 1, 1  
A18 to A2, 0, 0  
A18 to A2, 1, 0  
A18 to A2, 1, 1  
A18 to A2, 0, 0  
A18 to A2, 0, 1  
A18 to A2, 1, 1  
A18 to A2, 0, 0  
A18 to A2, 0, 1  
A18 to A2, 1, 0  
Data Sheet M14904EJ3V0DS  
7
µPD4482163, 4482183, 4482323, 4482363  
[µPD4482323, µPD4482363]  
18  
16  
18  
Address  
A0 to A17  
Registers  
A0, A1  
MODE  
/ADV  
CLK  
A1’  
Q1  
Binary  
Counter  
and Logic  
A0’  
/AC  
/AP  
Row and Column  
Decoders  
CLR  
Q0  
8/9  
8/9  
8/9  
8/9  
Byte 1  
Byte 1  
Memory cell array  
1,024 rows  
/BW1  
/BW2  
/BW3  
Write Register  
Write Driver  
Byte 2  
Write Register  
Byte 2  
Write Driver  
256 × 32 columns  
(8,388,608 bits)  
Byte 3  
Write Register  
Byte 3  
Write Driver  
256 × 36 columns  
(9,437,184 bits)  
Byte 4  
Write Register  
Byte 4  
Write Driver  
/BW4  
/BWE  
32/36  
32/36  
Output  
Registers Buffers  
Output  
/GW  
/CE  
Enable  
Register  
CE2  
/CE2  
Input  
Registers  
/G  
4
32/36  
I/O1 to I/O32  
I/OP1 to I/OP4  
Power Down Control  
ZZ  
[µPD4482323, µPD4482363]  
Interleaved Burst Sequence Table (MODE = VDD)  
External Address  
1st Burst Address  
2nd Burst Address  
3rd Burst Address  
A17 to A2, A1, A0  
A17 to A2, A1, /A0  
A17 to A2, /A1, A0  
A17 to A2, /A1, /A0  
Linear Burst Sequence Table (MODE = VSS)  
External Address  
1st Burst Address  
2nd Burst Address  
3rd Burst Address  
A17 to A2, 0, 0  
A17 to A2, 0, 1  
A17 to A2, 1, 0  
A17 to A2, 1, 1  
A17 to A2, 0, 1  
A17 to A2, 1, 0  
A17 to A2, 1, 1  
A17 to A2, 0, 0  
A17 to A2, 1, 0  
A17 to A2, 1, 1  
A17 to A2, 0, 0  
A17 to A2, 0, 1  
A17 to A2, 1, 1  
A17 to A2, 0, 0  
A17 to A2, 0, 1  
A17 to A2, 1, 0  
Data Sheet M14904EJ3V0DS  
8
µPD4482163, 4482183, 4482323, 4482363  
Asynchronous Truth Table  
Operation  
Read Cycle  
Read Cycle  
Write Cycle  
Deselected  
/G  
L
I/O  
Dout  
H
×
High-Z  
High-Z, Din  
High-Z  
×
Remark × : don’t care  
Synchronous Truth Table  
Operation  
/CE  
H
L
CE2  
/CE2  
×
/AP  
×
/AC  
L
/ADV  
×
/WRITE  
CLK  
Address  
None  
Deselected Note  
×
L
×
L
×
H
H
×
×
×
×
H
×
×
×
×
×
×
L H  
L H  
L H  
L H  
L H  
L H  
L H  
L H  
L H  
L H  
L H  
L H  
L H  
L H  
L H  
L H  
Deselected Note  
×
L
×
×
None  
Deselected Note  
L
H
×
L
×
×
×
None  
Deselected Note  
L
H
H
L
L
×
×
None  
Deselected Note  
L
H
L
L
×
×
None  
Read Cycle / Begin Burst  
Read Cycle / Begin Burst  
Read Cycle / Continue Burst  
Read Cycle / Continue Burst  
Read Cycle / Suspend Burst  
Read Cycle / Suspend Burst  
Write Cycle / Begin Burst  
Write Cycle / Continue Burst  
Write Cycle / Continue Burst  
Write Cycle / Suspend Burst  
Write Cycle / Suspend Burst  
L
×
×
×
External  
External  
Next  
L
L
H
H
×
L
×
H
H
H
H
H
L
L
L
L
L
×
×
H
H
H
H
L
L
H
×
×
L
Next  
×
H
×
H
H
×
Current  
Current  
External  
Next  
H
L
×
L
H
H
×
×
×
H
H
H
H
L
H
×
×
L
Next  
×
H
×
H
H
Current  
Current  
H
×
Note Deselect status is held until new “Begin Burst” entry.  
Remarks 1. × : don’t care  
2. /WRITE = L means any one or more byte write enables (/BW1, /BW2, /BW3 or /BW4) and /BWE are  
LOW or /GW is LOW.  
/WRITE = H means the following two cases.  
(1) /BWE and /GW are HIGH.  
(2) /BW1, /BW2 and /GW are HIGH, and /BWE is LOW. [µPD4482163, µPD4482183]  
/BW1 to /BW4 and /GW are HIGH, and /BWE is LOW. [µPD4482323, µPD4482363]  
Data Sheet M14904EJ3V0DS  
9
µPD4482163, 4482183, 4482323, 4482363  
Partial Truth Table for Write Enables  
[µPD4482163, µPD4482183]  
Operation  
/GW  
H
/BWE  
/BW1  
/BW2  
Read Cycle  
H
L
L
L
L
×
×
H
L
×
H
H
L
Read Cycle  
H
Write Cycle / Byte 1 (I/O [1:8], I/OP1)  
Write Cycle / Byte 2 (I/O [9:16], I/OP2)  
Write Cycle / All Bytes  
Write Cycle / All Bytes  
H
H
H
L
H
L
L
×
×
Remark × : don’t care  
[µPD4482323, µPD4482363]  
Operation  
/GW  
H
/BWE  
/BW1  
/BW2  
/BW3  
/BW4  
Read Cycle  
H
L
L
L
L
L
L
×
×
H
L
×
H
H
L
×
H
H
H
L
×
H
H
H
H
L
Read Cycle  
H
Write Cycle / Byte 1 (I/O [1:8], I/OP1)  
Write Cycle / Byte 2 (I/O [9:16], I/OP2)  
Write Cycle / Byte 3 (I/O [17:24], I/OP3)  
Write Cycle / Byte 4 (I/O [25:32], I/OP4)  
Write Cycle / All Bytes  
H
H
H
H
H
L
H
H
H
L
H
H
L
H
L
Write Cycle / All Bytes  
L
×
×
×
×
Remark × : don’t care  
Pass-Through Truth Table  
Previous Cycle  
Present Cycle  
Next Cycle  
Operation  
Operation  
Add /WRITE  
Ak  
I/O  
Operation  
Add /CEs /WRITE /G  
I/O  
Write Cycle  
L
Dn(Ak) Read Cycle  
(Begin Burst)  
Am  
L
H
L
Q1(Ak)  
Read Q1(Am)  
Deselected  
-
H
×
×
High-Z  
No Carry Over from  
Previous Cycle  
Remarks 1. × : don’t care  
2. /WRITE = L means any one or more byte write enables (/BW1, /BW2, /BW3 or /BW4) and /BWE are  
LOW or /GW is LOW.  
/WRITE = H means the following two cases.  
(1) /BWE and /GW are HIGH.  
(2) /BW1, /BW2 and /GW are HIGH, and /BWE is LOW. [µPD4482163, µPD4482183]  
/BW1 to /BW4 and /GW are HIGH, and /BWE is LOW. [µPD4482323, µPD4482363]  
/CEs = L means /CE is LOW, /CE2 is LOW and CE2 is HIGH.  
/CEs = H means /CE is HIGH or /CE2 is HIGH or CE2 is LOW.  
ZZ (Sleep) Truth Table  
ZZ  
Chip Status  
Active  
0.2 V  
Open  
Active  
VDD 0.2 V  
Sleep  
Data Sheet M14904EJ3V0DS  
10  
µPD4482163, 4482183, 4482323, 4482363  
Electrical Specifications  
Absolute Maximum Ratings  
Parameter  
Supply voltage  
Symbol  
VDD  
Conditions  
MIN.  
–0.5  
–0.5  
–0.5  
–0.5  
0
TYP.  
MAX.  
+4.0  
Unit Notes  
V
V
Output supply voltage  
Input voltage  
VDDQ  
VIN  
VDD  
VDD + 0.5  
VDDQ + 0.5  
70  
V
V
1, 2  
1, 2  
Input / Output voltage  
Operating ambient temperature  
VI/O  
TA  
-A44, -A50, -A60  
°C  
-A44Y, -A50Y, -A60Y  
–40  
–55  
+85  
Storage temperature  
Tstg  
+125  
°C  
Notes 1. –2.0 V (MIN.) (Pulse width : 2 ns)  
2. VDDQ + 2.3 V (MAX.) (Pulse width : 2 ns)  
Caution  
Exposing the device to stress above those listed in Absolute Maximum Ratings could cause  
permanent damage. The device is not meant to be operated under conditions outside the limits  
described in the operational section of this specification. Exposure to Absolute Maximum Rating  
conditions for extended periods may affect device reliability.  
Recommended DC Operating Conditions  
Parameter  
Supply voltage  
Symbol  
VDD  
Conditions  
MIN.  
3.135  
3.135  
2.0  
TYP.  
3.3  
MAX.  
3.465  
Unit  
V
Output supply voltage  
High level input voltage  
Low level input voltage  
VDDQ  
VIH  
3.3  
3.465  
V
VDDQ + 0.3  
+0.8  
V
VIL  
–0.3 Note  
V
Note –0.8 V (MIN.) (Pulse Width : 2 ns)  
Data Sheet M14904EJ3V0DS  
11  
µPD4482163, 4482183, 4482323, 4482363  
DC Characteristics (Recommended Operating Conditions Unless Otherwise Noted)  
Parameter  
Symbol  
ILI  
Test condition  
MIN.  
–2  
TYP.  
MAX.  
+2  
Unit  
µA  
Note  
Input leakage current  
I/O leakage current  
Operating supply current  
VIN (except ZZ, MODE) = 0 V to VDD  
VI/O = 0 V to VDDQ, Outputs are disabled  
ILO  
–2  
+2  
µA  
IDD  
Device selected, Cycle = MAX.  
-A44  
440  
mA  
VIN VIL or VIN VIH, II/O = 0 mA  
-A44Y  
-A50  
400  
320  
180  
-A50Y  
-A60  
-A60Y  
IDD1  
Suspend cycle, Cycle = MAX.  
/AC, /AP, /ADV, /GW, /BWEs VIH,  
VIN VIL or VIN VIH, II/O = 0 mA  
Device deselected, Cycle = 0 MHz  
Standby supply current  
ISB  
30  
15  
mA  
VIN VIL or VIN VIH, All inputs are static  
Device deselected, Cycle = 0 MHz  
VIN 0.2 V or VIN VDD 0.2 V,  
VI/O 0.2 V, All inputs are static  
Device deselected, Cycle = MAX.  
VIN VIL or VIN VIH  
ISB1  
ISB2  
130  
15  
Power down supply current ISBZZ ZZ VDD 0.2 V, VI/O VDDQ + 0.2 V  
mA  
V
High level output voltage  
Low level output voltage  
VOH  
VOL  
IOH = 4.0 mA  
IOL = +8.0 mA  
2.4  
0.4  
V
Capacitance (TA = 25 °C, f = 1MHz)  
Parameter  
Symbol  
CIN  
Test conditions  
MIN.  
TYP.  
MAX.  
Unit  
pF  
Input capacitance  
VIN = 0 V  
VI/O = 0 V  
Vclk = 0 V  
6.0  
8.0  
6.0  
Input / Output capacitance  
Clock Input capacitance  
CI/O  
pF  
Cclk  
pF  
Remark These parameters are periodically sampled and not 100% tested.  
Data Sheet M14904EJ3V0DS  
12  
µPD4482163, 4482183, 4482323, 4482363  
AC Characteristics (Recommended Operating Conditions Unless Otherwise Noted)  
AC Test Conditions  
Input waveform (Rise / Fall time = 1 ns (20 to 80%))  
3.0 V  
1.5 V  
Test ponts  
1.5 V  
V
SS  
Output waveform  
1.5 V  
Test points  
1.5 V  
Output load condition  
CL : 30 pF  
5 pF (TKHQX1, TKHQX2, TGLQX, TGHQZ, TKHQZ)  
External load at test  
VT = +1.5 V  
50 Ω  
ZO = 50 Ω  
I/O (Output)  
CL  
Remark CL includes capacitance's of the probe and jig, and stray capacitances.  
Data Sheet M14904EJ3V0DS  
13  
µPD4482163, 4482183, 4482323, 4482363  
Read and Write Cycle  
Parameter  
Symbol  
-A44  
-A44Y  
-A50  
-A50Y  
-A60  
-A60Y  
Unit  
Note  
(225 MHz)  
(200 MHz)  
(167 MHz)  
Standard  
Alias  
TCYC  
TCD  
TOE  
TDC1  
TDC2  
TOLZ  
TOHZ  
TCZ  
TCH  
TCL  
TAS  
TSS  
TDS  
TWS  
MIN.  
MAX.  
MIN.  
MAX.  
MIN.  
MAX.  
Cycle time  
TKHKH  
TKHQV  
TGLQV  
TKHQX1  
TKHQX2  
TGLQX  
TGHQZ  
TKHQZ  
TKHKL  
4.4  
5.0  
6.0  
3.5  
3.5  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Clock access time  
2.8  
2.8  
3.1  
3.1  
Output enable access time  
Clock high to output active  
Clock high to output change  
Output enable to output active  
Output disable to output High-Z  
Clock high to output High-Z  
Clock high pulse width  
Clock low pulse width  
Setup times Address  
Address status  
0
0
0
1.5  
0
1.5  
0
1.5  
0
0
2.8  
2.8  
0
3.1  
3.1  
0
3.5  
3.5  
1.5  
1.8  
1.8  
1.4  
1.5  
2.0  
2.0  
1.5  
1.5  
2.0  
2.0  
1.5  
TKLKH  
TAVKH  
TADSVKH  
TDVKH  
TWVKH  
Data in  
Write enable  
Address advance TADVVKH  
Chip enable  
Address  
TEVKH  
TKHAX  
Hold times  
TAH  
TSH  
TDH  
TWH  
0.4  
0.5  
0.5  
ns  
Address status  
Data in  
TKHADSX  
TKHDX  
Write enable  
TKHWX  
Address advance TKHADVX  
Chip enable  
TKHEX  
TZZE  
Power down entry time  
TZZE  
TZZR  
8.8  
8.8  
10.0  
10.0  
12.0  
12.0  
ns  
ns  
Power down recovery time  
TZZR  
Data Sheet M14904EJ3V0DS  
14  
READ CYCLE  
TKHKH  
CLK  
/AP  
/AC  
TKHKL  
TKLKH  
TADSVKH  
TKHADSX  
TADSVKH  
TKHADSX  
TAVKH  
TKHAX  
A1  
A2  
A3  
Address  
/ADV  
TADVVKH  
TKHADVX  
TWVKH  
TKHWX  
TKHWX  
µ
/BWE  
/BWs  
Note3  
Note3  
TWVKH  
/GW  
TEVKH  
TKHEX  
/CEs Note1  
/G  
TGLQV  
TGHQZ  
High-Z  
Data In  
TKHQV  
Q2(A2)  
TKHQZ  
TGLQX  
TKHQX2  
Note2  
High-Z  
High-Z  
Q1(A1)  
Q1(A2)  
Q3(A2)  
Q4(A2) Q1(A2) Q1(A3)  
Data Out  
Notes 1. /CEs refers to /CE, CE2 and /CE2. When /CEs is LOW, /CE and /CE2 are LOW and CE2 is HIGH.  
When /CEs is HIGH, /CE and /CE2 are HIGH and CE2 is LOW.  
Outputs are disabled within two clock cycles after deselect.  
2.  
3. If /GW is set to low level or /BWE is set to low level and one of /BW1 to /BW4 is set to low level,  
Q1(A3) is not output.  
Qn(A2) refers to output from address A2. Q1-Q4 refer to outputs according to burst sequence.  
Remark  
WRITE CYCLE  
TKHKH  
CLK  
/AP  
TADSVKH TKHADSX  
TKHKL  
TKLKH  
TADSVKH TKHADSX  
/AC  
Address  
/ADV  
TAVKH  
TKHAX  
A1  
A2  
A3  
TADVVKH  
TKHADVX  
µ
TWVKH  
TKHWX  
/BWENote1  
/BWs  
TWVKH  
TKHWX  
/GWNote1  
TEVKH  
TKHEX  
/CEs Note2  
/G  
TDVKH  
TKHDX  
High-Z  
D1(A1)  
D1(A2)  
D2(A2)  
D2(A2)  
D3(A2)  
D4(A2)  
D1(A3)  
D2(A3)  
D3(A3)  
Data In  
TGHQZ  
High-Z  
Data Out  
All bytes WRITE can be initiated by /GW LOW or /GW HIGH and /BWE, /BW1 to /BW4 LOW.  
/CEs refers to /CE, CE2 and /CE2. When /CEs is LOW, /CE and /CE2 are LOW and CE2 is HIGH.  
When /CEs is HIGH, /CE and /CE2 are HIGH and CE2 is LOW.  
1.  
2.  
Notes  
READ / WRITE CYCLE  
TKHKH  
CLK  
TKLKH  
TKHKL  
TKHADSX  
TADSVKH  
TADSVKH  
/AP  
/AC  
TKHADSX  
TAVKH  
TKHAX  
A1  
A2  
A3  
Address  
/ADV  
TADVVKH  
TKHADVX  
µ
TWVKH  
TKHWX  
/BWE Note1  
/BWs  
TKHWX  
TWVKH  
/GW Note1  
TEVKH  
TKHEX  
/CEs Note2  
/G  
TDVKH  
TKHDX  
High-Z  
High-Z  
Data In  
D1(A2)  
TGHQZ  
TKHQV  
TKHQX1  
TGLQX  
Q1(A2)  
High-Z  
High-Z  
High-Z  
Data Out  
Q1(A1)  
Q1(A3) Q2(A3)  
Q3(A3)  
Q4(A3)  
All bytes WRITE can be initiated by /GW LOW or /GW HIGH and /BWE, /BW1 to /BW4 LOW.  
1.  
2.  
Notes  
/CEs refers to /CE, CE2 and /CE2. When /CEs is LOW, /CE and /CE2 are LOW and CE2 is HIGH.  
When /CEs is HIGH, /CE and /CE2 are HIGH and CE2 is LOW.  
SINGLE READ / WRITE CYCLE  
TKHKH  
CLK  
TKLKH  
TKHKL  
TKHADSX  
TADSVKH  
/AC  
TAVKH TKHAX  
A2  
A5  
A8  
A3  
A4  
Address  
A7  
A9  
A1  
A6  
TKHWX  
TKHWX  
TWVKH  
/BWE Note1  
/BWs  
Note4  
Note4  
TWVKH  
/GW Note1  
µ
TEVKH  
TKHEX  
/CEs Note2  
/G  
TDVKH TKHDX  
High-Z  
TGLQV  
High-Z  
Data In  
D1(A5) D1(A6)  
D1(A7)  
TKHQZ  
Q1(A9)  
TKHQV  
Q1(A7)  
TGHQZ  
TGLQX  
Q1(A1)  
Note3  
High-Z  
High-Z  
Data Out  
Q1(A8)  
Q1(A2) Q1(A3)  
Q1(A4)  
All bytes WRITE can be initiated by /GW LOW or /GW HIGH and /BWE, /BW1 to /BW4 LOW.  
1.  
2.  
Notes  
/CEs refers to /CE, CE2 and /CE2. When /CEs is LOW, /CE and /CE2 are LOW and CE2 is HIGH.  
When /CEs is HIGH, /CE and /CE2 are HIGH and CE2 is LOW.  
Outputs are disabled within two clock cycles after deselect.  
3.  
4.  
If /GW is set to low level or /BWE is set to low level and one of /BW1 to /BW4 is set to low level,  
Q1(A9) is not output.  
/AP is HIGH and /ADV is don't care.  
Remark  
POWER DOWN (ZZ) CYCLE  
TKHKH  
CLK  
TKHKL  
TKLKH  
/AP  
/AC  
Address  
A1  
A2  
µ
/ADV  
/BWE  
/BWs  
/GW  
/CEs  
/G  
High-Z  
High-Z  
Q1(A1)  
Q1(A2)  
Data Out  
TZZR  
TZZE  
ZZ  
Power Down (ISBZZ) State  
STOP CLOCK CYCLE  
TKHKH  
CLK  
TKHKL  
TKLKH  
/AP  
/AC  
Address  
A1  
A2  
µ
/ADV  
/BWE  
/BWs  
/GW  
/CEs  
/G  
High-Z  
High-Z  
High-Z  
Data In  
High-Z  
Q1(A1)  
Q1(A2)  
Data Out  
Note  
Power Down State (ISB1  
)
Note VIN 0.2 V or VIN VDD 0.2 V, VI/O 0.2 V  
µPD4482163, 4482183, 4482323, 4482363  
Package Drawing  
100-PIN PLASTIC LQFP (14x20)  
A
B
80  
81  
51  
50  
detail of lead end  
S
C
D
R
Q
31  
30  
100  
1
F
M
G
J
H
I
K
P
S
N
S
L
M
NOTE  
ITEM MILLIMETERS  
Each lead centerline is located within 0.13 mm of  
its true position (T.P.) at maximum material condition.  
A
B
C
D
F
22.0 0.2  
20.0 0.2  
14.0 0.2  
16.0 0.2  
0.825  
G
0.575  
+0.08  
0.32  
H
0.07  
I
J
0.13  
0.65 (T.P.)  
1.0 0.2  
0.5 0.2  
K
L
+0.06  
0.17  
M
0.05  
N
P
Q
0.10  
1.4  
0.125 0.075  
+7°  
3°  
R
S
3°  
1.7 MAX.  
S100GF-65-8ET-1  
Data Sheet M14904EJ3V0DS  
21  
µPD4482163, 4482183, 4482323, 4482363  
Recommended Soldering Condition  
Please consult with our sales offices for soldering conditions of the µPD4482163, 4482183, 4482323 and 4482363.  
Types of Surface Mount Devices  
µPD4482163GF : 100-pin PLASTIC LQFP (14 x 20)  
µPD4482183GF : 100-pin PLASTIC LQFP (14 x 20)  
µPD4482323GF : 100-pin PLASTIC LQFP (14 x 20)  
µPD4482363GF : 100-pin PLASTIC LQFP (14 x 20)  
Data Sheet M14904EJ3V0DS  
22  
µPD4482163, 4482183, 4482323, 4482363  
Revision History  
Edition/  
Page  
Type of  
revision  
Location  
Description  
Date  
This  
edition  
Previous  
edition  
(Previous edition This edition)  
3rd edition/ Throughout Throughout Modification  
Dec. 2002 Addition  
Preliminary Data Sheet Data Sheet  
Extended operating temperature products  
(TA = 40 to +85 °C)  
Data Sheet M14904EJ3V0DS  
23  
µPD4482163, 4482183, 4482323, 4482363  
[MEMO]  
Data Sheet M14904EJ3V0DS  
24  
µPD4482163, 4482183, 4482323, 4482363  
[MEMO]  
Data Sheet M14904EJ3V0DS  
25  
µPD4482163, 4482183, 4482323, 4482363  
[MEMO]  
Data Sheet M14904EJ3V0DS  
26  
µPD4482163, 4482183, 4482323, 4482363  
NOTES FOR CMOS DEVICES  
1
PRECAUTION AGAINST ESD FOR SEMICONDUCTORS  
Note:  
Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and  
ultimately degrade the device operation. Steps must be taken to stop generation of static electricity  
as much as possible, and quickly dissipate it once, when it has occurred. Environmental control  
must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using  
insulators that easily build static electricity. Semiconductor devices must be stored and transported  
in an anti-static container, static shielding bag or conductive material. All test and measurement  
tools including work bench and floor should be grounded. The operator should be grounded using  
wrist strap. Semiconductor devices must not be touched with bare hands. Similar precautions need  
to be taken for PW boards with semiconductor devices on it.  
2
HANDLING OF UNUSED INPUT PINS FOR CMOS  
Note:  
No connection for CMOS device inputs can be cause of malfunction. If no connection is provided  
to the input pins, it is possible that an internal input level may be generated due to noise, etc., hence  
causing malfunction. CMOS devices behave differently than Bipolar or NMOS devices. Input levels  
of CMOS devices must be fixed high or low by using a pull-up or pull-down circuitry. Each unused  
pin should be connected to VDD or GND with a resistor, if it is considered to have a possibility of  
being an output pin. All handling related to the unused pins must be judged device by device and  
related specifications governing the devices.  
3
STATUS BEFORE INITIALIZATION OF MOS DEVICES  
Note:  
Power-on does not necessarily define initial status of MOS device. Production process of MOS  
does not define the initial operation status of the device. Immediately after the power source is  
turned ON, the devices with reset function have not yet been initialized. Hence, power-on does  
not guarantee out-pin levels, I/O settings or contents of registers. Device is not initialized until the  
reset signal is received. Reset operation must be executed immediately after power-on for devices  
having reset function.  
Data Sheet M14904EJ3V0DS  
27  
µPD4482163, 4482183, 4482323, 4482363  
The information in this document is current as of December, 2002. The information is subject to  
change without notice. For actual design-in, refer to the latest publications of NEC Electronics data  
sheets or data books, etc., for the most up-to-date specifications of NEC Electronics products. Not  
all products and/or types are available in every country. Please check with an NEC Electronics sales  
representative for availability and additional information.  
No part of this document may be copied or reproduced in any form or by any means without the prior  
written consent of NEC Electronics. NEC Electronics assumes no responsibility for any errors that may  
appear in this document.  
NEC Electronics does not assume any liability for infringement of patents, copyrights or other intellectual  
property rights of third parties by or arising from the use of NEC Electronics products listed in this document  
or any other liability arising from the use of such products. No license, express, implied or otherwise, is  
granted under any patents, copyrights or other intellectual property rights of NEC Electronics or others.  
Descriptions of circuits, software and other related information in this document are provided for illustrative  
purposes in semiconductor product operation and application examples. The incorporation of these  
circuits, software and information in the design of a customer's equipment shall be done under the full  
responsibility of the customer. NEC Electronics assumes no responsibility for any losses incurred by  
customers or third parties arising from the use of these circuits, software and information.  
While NEC Electronics endeavors to enhance the quality, reliability and safety of NEC Electronics products,  
customers agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To  
minimize risks of damage to property or injury (including death) to persons arising from defects in NEC  
Electronics products, customers must incorporate sufficient safety measures in their design, such as  
redundancy, fire-containment and anti-failure features.  
NEC Electronics products are classified into the following three quality grades: "Standard", "Special" and  
"Specific".  
The "Specific" quality grade applies only to NEC Electronics products developed based on a customer-  
designated "quality assurance program" for a specific application. The recommended applications of an NEC  
Electronics product depend on its quality grade, as indicated below. Customers must check the quality grade of  
each NEC Electronics product before using it in a particular application.  
"Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio  
and visual equipment, home electronic appliances, machine tools, personal electronic equipment  
and industrial robots.  
"Special": Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster  
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed  
for life support).  
"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life  
support systems and medical equipment for life support, etc.  
The quality grade of NEC Electronics products is "Standard" unless otherwise expressly specified in NEC  
Electronics data sheets or data books, etc. If customers wish to use NEC Electronics products in applications  
not intended by NEC Electronics, they must contact an NEC Electronics sales representative in advance to  
determine NEC Electronics' willingness to support a given application.  
(Note)  
(1) "NEC Electronics" as used in this statement means NEC Electronics Corporation and also includes its  
majority-owned subsidiaries.  
(2) "NEC Electronics products" means any product developed or manufactured by or for NEC Electronics (as  
defined above).  
M8E 02. 11-1  

相关型号:

UPD4482363GF-A50-A

Cache SRAM, 256KX36, 3.1ns, CMOS, PQFP100, 14 X 20 MM, PLASTIC, LQFP-100
NEC

UPD4482363GF-A50Y

8M-BIT CMOS SYNCHRONOUS FAST SRAM PIPELINED OPERATION DOUBLE CYCLE DESELECT
NEC

UPD4482363GF-A50Y

Cache SRAM, 256KX36, 3.1ns, CMOS, PQFP100, 14 X 20 MM, PLASTIC, LQFP-100
RENESAS

UPD4482363GF-A50Y-A

IC,SYNC SRAM,256KX36,CMOS,QFP,100PIN,PLASTIC
RENESAS

UPD4482363GF-A60

8M-BIT CMOS SYNCHRONOUS FAST SRAM PIPELINED OPERATION DOUBLE CYCLE DESELECT
NEC

UPD4482363GF-A60

Cache SRAM, 256KX36, 3.5ns, CMOS, PQFP100, 14 X 20 MM, PLASTIC, LQFP-100
RENESAS

UPD4482363GF-A60-A

Cache SRAM, 256KX36, 3.5ns, CMOS, PQFP100, 14 X 20 MM, PLASTIC, LQFP-100
NEC

UPD4482363GF-A60Y

8M-BIT CMOS SYNCHRONOUS FAST SRAM PIPELINED OPERATION DOUBLE CYCLE DESELECT
NEC

UPD4482363GF-A60Y

Cache SRAM, 256KX36, 3.5ns, CMOS, PQFP100, 14 X 20 MM, PLASTIC, LQFP-100
RENESAS
NEC

UPD4483362

8M-BIT CMOS SYNCHRONOUS FAST STATIC RAM 256K-WORD BY 36-BIT HSTL INTERFACE / REGISTER-REGISTER / LATE WRITE
NEC

UPD4483362GF-A75

8M-BIT CMOS SYNCHRONOUS FAST STATIC RAM 256K-WORD BY 36-BIT HSTL INTERFACE / REGISTER-REGISTER / LATE WRITE
NEC