28C04A-15/L [MICROCHIP]

4K (512 x 8) CMOS EEPROM; 4K ( 512 ×8 )的CMOS EEPROM
28C04A-15/L
型号: 28C04A-15/L
厂家: MICROCHIP    MICROCHIP
描述:

4K (512 x 8) CMOS EEPROM
4K ( 512 ×8 )的CMOS EEPROM

存储 内存集成电路 可编程只读存储器 电动程控只读存储器 电可擦编程只读存储器
文件: 总10页 (文件大小:127K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Obsolete Device  
28C04A  
4K (512 x 8) CMOS EEPROM  
FEATURES  
PACKAGE TYPES  
• Fast Read Access Time—150 ns  
• CMOS Technology for Low Power Dissipation  
- 30 mA Active  
DIP  
A7  
A6  
• 1  
2
24 Vcc  
23 A8  
A5  
3
22 NC  
21 WE  
20 OE  
19 NC  
18 CE  
17 I/O7  
16 I/O6  
15 I/O5  
14 I/O4  
13 I/O3  
A4  
4
A3  
5
- 100 µA Standby  
A2  
6
• Fast Byte Write Time—200 µs or 1 ms  
• Data Retention >200 years  
• Endurance - Minimum 104 Erase/Write Cycles  
- Automatic Write Operation  
- Internal Control Timer  
A1  
7
A0  
8
I/O0  
I/O1  
I/O2  
9
10  
11  
VSS 12  
- Auto-Clear Before Write Operation  
- On-Chip Address and Data Latches  
• Data Polling  
PLCC  
• Chip Clear Operation  
A6  
5
6
7
8
9
29 A8  
A5  
A4  
A3  
A2  
A1 10  
A0 11  
28 NC  
27 NC  
26 NC  
25 OE  
24 NC  
23 CE  
22 I/O7  
21 I/O6  
• Enhanced Data Protection  
- VCC Detector  
- Pulse Filter  
- Write Inhibit  
NC 12  
I/O0 13  
• 5-Volt-Only Operation  
• Organized 512x8 JEDEC standard pinout  
- 24-pin Dual-In-Line Package  
- 32-pin PLCC Package  
Pin 1 indicator on PLCC on top of package  
• Available for Extended Temperature Ranges:  
- Commercial: 0°C to +70°C  
- Industrial: -40°C to +85°C  
BLOCK DIAGRAM  
I/O0  
I/O7  
DESCRIPTION  
VSS  
Data Protection  
The Microchip Technology Inc. 28C04A is a CMOS 4K  
non-volatile electrically Erasable and Programmable  
Read Only Memory (EEPROM). The 28C04A is  
accessed like a static RAM for the read or write cycles  
without the need of external components. During a  
“byte write”, the address and data are latched inter-  
nally, freeing the microprocessor address and data bus  
for other operations. Following the initiation of write  
cycle, the device will go to a busy state and automati-  
cally clear and write the latched data using an internal  
control timer. To determine when a write cycle is com-  
plete, the 28C04A uses Data polling. Data polling  
allows the user to read the location last written to when  
the write operation is complete. CMOS design and pro-  
cessing enables this part to be used in systems where  
reduced power consumption and reliability are  
required. A complete family of packages is offered to  
provide the utmost flexibility in applications.  
VCC  
Circuitry  
Chip Enable/  
Output Enable  
Control Logic  
CE  
OE  
Input/Output  
Buffers  
WE  
Auto Erase/Write  
Timing  
Data  
Poll  
Program Voltage  
Generation  
A0  
Y
Y Gating  
Decoder  
L
a
t
c
h
e
s
4K bit  
Cell Matrix  
X
Decoder  
A8  
2004 Microchip Technology Inc.  
DS11126H-page 1  
28C04A  
TABLE 1-1:  
Name  
PIN FUNCTION TABLE  
Function  
1.0  
ELECTRICAL CHARACTERISTICS  
1.1  
MAXIMUM RATINGS*  
VCC and input voltages w.r.t. VSS ....... -0.6V to + 6.25V  
Voltage on OE w.r.t. VSS......................-0.6V to +13.5V  
Output Voltage w.r.t. VSS .................-0.6V to VCC+0.6V  
Storage temperature ..........................-65°C to +125°C  
Ambient temp. with power applied .......-50°C to +95°C  
A0 - A8  
CE  
Address Inputs  
Chip Enable  
OE  
Output Enable  
Write Enable  
WE  
I/O0 - I/O7 Data Inputs/Outputs  
*Notice: Stresses above those listed under “Maximum Ratings”  
may cause permanent damage to the device. This is a stress rat-  
ing only and functional operation of the device at those or any  
other conditions above those indicated in the operation listings of  
this specification is not implied. Exposure to maximum rating con-  
ditions for extended periods may affect device reliability.  
VCC  
VSS  
NC  
+5V Power Supply  
Ground  
No Connect; No Internal Connection  
NU  
Not Used; No External Connection is  
Allowed  
TABLE 1-2:  
READ/WRITE OPERATION DC CHARACTERISTICS  
VCC = +5V ±10%  
Commercial (C): Tamb =  
0°C to +70°C  
Industrial  
(I): Tamb = -40°C to +85°C  
Parameter  
Status  
Symbol  
Min  
Max  
Units  
Conditions  
Input Voltages  
Logic ‘1’  
Logic ‘0’  
VIH  
VIL  
2.0  
-0.1  
VCC+1  
0.8  
V
V
Input Leakage  
ILI  
-10  
10  
10  
µA  
VIN = -0.1V to VCC+1  
Input Capacitance  
CIN  
pF  
VIN = 0V; Tamb = 25°C;  
f = 1 MHz  
Output Voltages  
Logic ‘1’  
Logic ‘0’  
VOH  
VOL  
2.4  
-10  
V
V
IOH = -400 µA  
IOL = 2.1 mA  
0.45  
10  
Output Leakage  
ILO  
µA  
VOUT = -0.1V TO VCC + 0.1V  
Output Capacitance  
COUT  
12  
pF  
VIN = 0V; TAMB = 25°C;  
f = 1 MHz  
Power Supply Current, Active  
Power Supply Current, Standby  
TTL input  
ICC  
30  
mA f = 5 MHz (Note 1)  
VCC = 5.5V  
TTL input  
TTL input  
CMOS input ICC(S)CMOS  
ICC(S)TTL  
ICC(S)TTL  
2
3
100  
mA  
mA  
µA  
CE = VIH (0°C to +70°C)  
CE = VIH (-40°C to +85°C)  
CE = VCC-0.3 to VCC+1  
OE = VCC  
All inputs equal VCC or VSS  
Note 1: AC power supply current above 5 MHz; 1 mA/MHz.  
DS11126H-page 2  
2004 Microchip Technology Inc.  
28C04A  
TABLE 1-3:  
READ OPERATION AC CHARACTERISTICS  
AC Testing Waveform:  
Output Load:  
VIH = 2.4V; VIL = 0.45V; VOH = 2.0V; VOL = 0.8V  
1 TTL Load + 100 pF  
Input Rise and Fall Times: 20 ns  
Ambient Temperature:  
Commercial (C): Tamb = 0°C to +70°C  
Industrial  
(I): Tamb = -40°C to +85°C  
28C04A-15  
Sym  
28C04A-20  
28C04A-25  
Parameter  
Units  
Conditions  
Min  
Max  
Min  
Max  
Min  
Max  
Address to Output Delay  
CE to Output Delay  
tACC  
tCE  
150  
150  
70  
200  
200  
80  
250  
250  
100  
70  
ns  
ns  
ns  
ns  
ns  
OE = CE = VIL  
OE = VIL  
OE to Output Delay  
tOE  
CE = VIL  
CE to OE High Output Float  
tOFF  
tOH  
0
0
50  
0
0
55  
0
0
Output Hold from Address, CE  
or OE, whichever occurs first  
Endurance  
1M  
1M  
1M  
cycles 25°C, Vcc =  
5.0V, Block  
Mode (Note)  
Note: This parameter is not tested but guaranteed by characterization. For endurance estimates in a specific appli-  
cation, please consult the Total Endurance Model which can be obtained on our BBS or website.  
FIGURE 1-1: READ WAVEFORMS  
2004 Microchip Technology Inc.  
DS11126H-page 3  
28C04A  
TABLE 1-4:  
BYTE WRITE AC CHARACTERISTICS  
AC Testing Waveform:  
Output Load:  
VIH = 2.4V; VIL = 0.45V; VOH = 2.0V; VOL = 0.8V  
1 TTL Load + 100 pF  
Input Rise/Fall Times:  
Ambient Temperature:  
20 nsec  
Commercial (C): Tamb= 0°C to 70°C  
Industrial  
(I): Tamb= -40°C to 85°C  
Parameter  
Symbol  
Min  
Max  
Units  
Remarks  
Address Set-Up Time  
Address Hold Time  
Data Set-Up Time  
Data Hold Time  
tAS  
tAH  
10  
50  
50  
10  
100  
50  
10  
10  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ms  
µs  
tDS  
tDH  
Write Pulse Width  
tWPL  
tWPH  
tOEH  
tOES  
tDV  
Note 1  
Note 2  
Write Pulse High Time  
OE Hold Time  
OE Set-Up Time  
Data Valid Time  
1000  
1
Write Cycle Time (28C04A)  
Write Cycle Time (28C04AF)  
tWC  
tWC  
0.5 ms typical  
200  
100 µs typical  
Note 1: A write cycle can be initiated be CE or WE going low, whichever occurs last. The data is latched on the pos-  
itive edge of CE or WE, whichever occurs first.  
2: Data must be valid within 1000ns max. after a write cycle is initiated and must be stable at least until tDH  
after the positive edge of WE or CE, whichever occurs first.  
FIGURE 1-2: PROGRAMMING WAVEFORMS  
VIH  
Address  
VIL  
tAS  
tAH  
VIH  
VIL  
tWPL  
tDS  
CE, WE  
Data In  
tDH  
tDV  
VIH  
VIL  
tOES  
VIH  
VIL  
OE  
tOEH  
DS11126H-page 4  
2004 Microchip Technology Inc.  
28C04A  
FIGURE 1-3: DATA POLLING WAVEFORMS  
VIH  
Last Written  
Address Valid  
Address Valid  
Address  
CE  
V
IL  
VIH  
IL  
t ACC  
tCE  
V
t
WPH  
VIH  
tWPL  
WE  
V
IL  
tOE  
VIH  
OE  
V
IL  
tDV  
VIH  
Data In  
Valid  
True Data Out  
Data  
I/O7 Out  
V
IL  
tWC  
FIGURE 1-4: CHIP CLEAR WAVEFORMS  
V
IH  
IL  
CE  
V
V
H
OE  
VIH  
t
S
tH  
t
W
V
IH  
IL  
WE  
t
W
= 10ms  
= = 1µs  
tH  
V
tS  
= 12.0V ±0.5V  
V
H
2004 Microchip Technology Inc.  
DS11126H-page 5  
28C04A  
2.4  
Write Mode  
2.0  
DEVICE OPERATION  
The Microchip Technology Inc. 28C04A has four basic  
modes of operation—read, standby, write inhibit, and  
byte write—as outlined in the following table.  
The 28C04A has a write cycle similar to that of a Static  
RAM. The write cycle is completely self-timed and initi-  
ated by a low going pulse on the WE pin. On the falling  
edge of WE, the address information is latched. On ris-  
ing edge, the data and the control pins (CE and OE) are  
latched.  
Operation  
CE  
IE  
WE  
I/O  
Mode  
Read  
L
H
H
X
X
L
L
X
X
L
H
X
X
X
H
L
DOUT  
High Z  
High Z  
High Z  
High Z  
DIN  
2.5  
Data Polling  
Standby  
The 28C04A features Data polling to signal the comple-  
tion of a byte write cycle. During a write cycle, an  
attempted read of the last byte written results in the  
data complement of I/O7 (I/O0 to I/O6 are indetermin-  
able). After completion of the write cycle, true data is  
available. Data polling allows a simple read/compare  
operation to determine the status of the chip eliminating  
the need for external hardware.  
Write Inhibit  
Write Inhibit  
Write Inhibit  
Byte Write  
X
H
Byte Clear  
Automatic Before Each “Write”  
X = Any TTL level.  
2.6  
Chip Clear  
All data may be cleared to 1's in a chip clear cycle by  
raising OE to 12 volts and bringing the WE and CE low.  
This procedure clears all data.  
2.1  
Read Mode  
The 28C04A has two control functions, both of which  
must be logically satisfied in order to obtain data at the  
outputs. Chip enable (CE) is the power control and  
should be used for device selection. Output Enable  
(OE) is the output control and is used to gate data to the  
output pins independent of device selection. Assuming  
that addresses are stable, address access time (tACC)  
is equal to the delay from CE to output (tCE). Data is  
available at the output tOE after the falling edge of OE,  
assuming that CE has been low and addresses have  
been stable for at least tACC-tOE.  
2.2  
Standby Mode  
The 28C04A is placed in the standby mode by applying  
a high signal to the CE input. When in the standby  
mode, the outputs are in a high impedance state, inde-  
pendent of the OE input.  
2.3  
Data Protection  
In order to ensure data integrity, especially during criti-  
cal power-up and power-down transitions, the following  
enhanced data protection circuits are incorporated:  
First, an internal VCC detect (3.3 volts typical) will inhibit  
the initiation of non-volatile programming operation  
when VCC is less than the VCC detect circuit trip.  
Second, there is a WE filtering circuit that prevents WE  
pulses of less than 10 ns duration from initiating a write  
cycle.  
Third, holding WE or CE high or OE low, inhibits a write  
cycle during power-on and power-off (VCC).  
DS11126H-page 6  
2004 Microchip Technology Inc.  
28C04A  
28C04A Product Identification System  
To order or to obtain information, e.g., on pricing or delivery, please use the listed part numbers, and refer to the factory or the listed  
sales offices.  
28C04A  
F
T
15  
I
/P  
Package:  
L = Plastic Leaded Chip Carrier (PLCC)  
P = Plastic DIP (600mill)  
Temperature  
Range:  
Blank = 0°C to +70°C  
I = -40°C to +85°C  
Access Time:  
15  
20  
25  
150 ns  
200 ns  
250 ns  
Shipping:  
Option:  
Device:  
Blank  
T
Tube  
Tape and Reel “L” only  
Blank = twc = 1ms  
F = twc = 200 µs  
28C04A  
512 x 8 CMOS EEPROM  
2004 Microchip Technology Inc.  
DS11126H-page 7  
28C04A  
NOTES:  
DS11126H-page 8  
2004 Microchip Technology Inc.  
Note the following details of the code protection feature on Microchip devices:  
Microchip products meet the specification contained in their particular Microchip Data Sheet.  
Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the  
intended manner and under normal conditions.  
There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our  
knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data  
Sheets. Most likely, the person doing so is engaged in theft of intellectual property.  
Microchip is willing to work with the customer who is concerned about the integrity of their code.  
Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not  
mean that we are guaranteeing the product as “unbreakable.”  
Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our  
products. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts  
allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act.  
Information contained in this publication regarding device  
applications and the like is intended through suggestion only  
and may be superseded by updates. It is your responsibility to  
ensure that your application meets with your specifications.  
No representation or warranty is given and no liability is  
assumed by Microchip Technology Incorporated with respect  
to the accuracy or use of such information, or infringement of  
patents or other intellectual property rights arising from such  
use or otherwise. Use of Microchip’s products as critical  
components in life support systems is not authorized except  
with express written approval by Microchip. No licenses are  
conveyed, implicitly or otherwise, under any intellectual  
property rights.  
Trademarks  
The Microchip name and logo, the Microchip logo, Accuron,  
dsPIC, KEELOQ, microID, MPLAB, PIC, PICmicro, PICSTART,  
PRO MATE, PowerSmart, rfPIC, and SmartShunt are  
registered trademarks of Microchip Technology Incorporated  
in the U.S.A. and other countries.  
AmpLab, FilterLab, MXDEV, MXLAB, PICMASTER, SEEVAL,  
SmartSensor and The Embedded Control Solutions Company  
are registered trademarks of Microchip Technology  
Incorporated in the U.S.A.  
Analog-for-the-Digital Age, Application Maestro, dsPICDEM,  
dsPICDEM.net, dsPICworks, ECAN, ECONOMONITOR,  
FanSense, FlexROM, fuzzyLAB, In-Circuit Serial  
Programming, ICSP, ICEPIC, Migratable Memory, MPASM,  
MPLIB, MPLINK, MPSIM, PICkit, PICDEM, PICDEM.net,  
PICLAB, PICtail, PowerCal, PowerInfo, PowerMate,  
PowerTool, rfLAB, rfPICDEM, Select Mode, Smart Serial,  
SmartTel and Total Endurance are trademarks of Microchip  
Technology Incorporated in the U.S.A. and other countries.  
SQTP is a service mark of Microchip Technology Incorporated  
in the U.S.A.  
All other trademarks mentioned herein are property of their  
respective companies.  
© 2004, Microchip Technology Incorporated, Printed in the  
U.S.A., All Rights Reserved.  
Printed on recycled paper.  
Microchip received ISO/TS-16949:2002 quality system certification for  
its worldwide headquarters, design and wafer fabrication facilities in  
Chandler and Tempe, Arizona and Mountain View, California in  
October 2003. The Company’s quality system processes and  
procedures are for its PICmicro® 8-bit MCUs, KEELOQ® code hopping  
devices, Serial EEPROMs, microperipherals, nonvolatile memory and  
analog products. In addition, Microchip’s quality system for the design  
and manufacture of development systems is ISO 9001:2000 certified.  
2004 Microchip Technology Inc.  
DS11126H-page 9  
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Fax: 905-673-6509  
Fax: 31-416-690340  
ASIA/PACIFIC  
Australia  
Microchip Technology Australia Pty Ltd  
Unit 32 41 Rawson Street  
Epping 2121, NSW  
Sydney, Australia  
Tel: 61-2-9868-6733  
Fax: 61-2-9868-6755  
United Kingdom  
505 Eskdale Road  
Winnersh Triangle  
Korea  
168-1, Youngbo Bldg. 3 Floor  
Samsung-Dong, Kangnam-Ku  
Seoul, Korea 135-882  
Wokingham  
Berkshire, England RG41 5TU  
Tel: 44-118-921-5869  
Fax: 44-118-921-5820  
Tel: 82-2-554-7200 Fax: 82-2-558-5932 or  
82-2-558-5934  
07/12/04  
2004 Microchip Technology Inc.  

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