27C128-12E/L [MICROCHIP]

x8 EPROM ; X8 EPROM\n
27C128-12E/L
型号: 27C128-12E/L
厂家: MICROCHIP    MICROCHIP
描述:

x8 EPROM
X8 EPROM\n

存储 内存集成电路 可编程只读存储器 OTP只读存储器 电动程控只读存储器
文件: 总12页 (文件大小:65K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
27C128  
128K (16K x 8) CMOS EPROM  
FEATURES  
PACKAGE TYPES  
DIP/SOIC  
• High speed performance  
- 120 ns access time available  
VPP  
A12  
A7  
A6  
A5  
A4  
A3  
A2  
A1  
A0  
O0  
O1  
O2  
VSS  
• 1  
2
28 VCC  
27 PGM  
26 A13  
25 A8  
24 A9  
23 A11  
22 OE  
21 A10  
20 CE  
19 O7  
18 O6  
17 O5  
16 O4  
15 O3  
• CMOS Technology for low power consumption  
- 20 mA Active current  
3
4
5
- 100 µA Standby current  
6
• Factory programming available  
• Auto-insertion-compatible plastic packages  
• Auto ID aids automated programming  
• Separate chip enable and output enable controls  
• High speed “express” programming algorithm  
• Organized 16K x 8: JEDEC standard pinouts  
- 28-pin Dual-in-line package  
7
8
9
10  
11  
12  
13  
14  
- 32-pin PLCC Package  
- 28-pin SOIC package  
PLCC  
- Tape and reel  
• Available for the following temperature ranges:  
- Commercial:  
- Industrial:  
0˚C to +70˚C  
5
29  
A6  
A5  
A4  
A3  
A2  
A1  
A0  
NC  
O0  
A8  
A9  
A11  
NC  
OE  
A10  
CE  
O7  
6
28  
27  
26  
25  
24  
23  
22  
21  
-40˚C to +85˚C  
-40˚C to +125˚C  
7
- Automotive:  
8
9
10  
11  
12  
13  
DESCRIPTION  
The Microchip Technology Inc. 27C128 is a CMOS  
128K bit (electrically) Programmable Read Only Mem-  
ory. The device is organized as 16K words by 8 bits  
(16K bytes). Accessing individual bytes from an  
address transition or from power-up (chip enable pin  
going low) is accomplished in less than 120 ns. CMOS  
design and processing enables this part to be used in  
systems where reduced power consumption and high  
reliability are requirements.A complete family of pack-  
ages is offered to provide the most flexibility in applica-  
tions. For surface mount applications, PLCC, SOIC, or  
TSOP packaging is available. Tape and reel packaging  
is also available for PLCC or SOIC packages. UV eras-  
able versions are also available.  
O6  
A complete family of packages is offered to provide the  
most flexibility in applications. For surface mount appli-  
cations, PLCC or SOIC packaging is available. Tape  
and reel packaging is also available for PLCC or SOIC  
packages.  
1996 Microchip Technology Inc.  
DS11003K-page 1  
This document was created with FrameMaker 4 0 4  
27C128  
TABLE 1-1:  
Name  
PIN FUNCTION TABLE  
Function  
1.0  
ELECTRICAL CHARACTERISTICS  
1.1  
Maximum Ratings*  
VCC and input voltages w.r.t. VSS........-0.6V to +7.25V  
A0-A13  
CE  
Address Inputs  
Chip Enable  
VPP voltage w.r.t. VSS during  
programming ..........................................-0.6V to +14V  
OE  
Output Enable  
Program Enable  
Programming Voltage  
Data Output  
Voltage on A9 w.r.t. VSS ......................-0.6V to +13.5V  
Output voltage w.r.t. VSS ............... -0.6V to VCC +1.0V  
Storage temperature .......................... -65˚C to +150˚C  
Ambient temp. with power applied ..... -65˚C to +125˚C  
PGM  
VPP  
O0 - O7  
VCC  
*Notice: Stresses above those listed under “Maximum Ratings”  
may cause permanent damage to the device. This is a stress rat-  
ing only and functional operation of the device at those or any  
other conditions above those indicated in the operation listings of  
this specification is not implied. Exposure to maximum rating con-  
ditions for extended periods may affect device reliability.  
+5V Power Supply  
Ground  
VSS  
NC  
No Connection; No Internal Connec-  
tions  
NU  
Not Used; No External Connection Is  
Allowed  
TABLE 1-2:  
READ OPERATION DC CHARACTERISTICS  
VCC = +5V (±10%)  
Commercial:  
Industrial:  
Tamb = 0˚C to +70˚C  
Tamb = -40˚C to +85˚C  
Tamb = -40°C to +125°C  
Extended (Automotive):  
Parameter  
Part*  
Status  
Symbol  
Min.  
Max. Units  
Conditions  
Input Voltages  
all  
Logic "1"  
Logic "0"  
VIH  
VIL  
2.0  
-0.5  
VCC+1  
0.8  
V
V
Input Leakage  
all  
all  
ILI  
-10  
2.4  
10  
µA VIN = 0 to VCC  
Output Voltages  
Logic "1"  
Logic "0"  
VOH  
VOL  
V
V
IOH = -400 µA  
IOL = 2.1 mA  
0.45  
10  
6
Output Leakage  
all  
all  
ILO  
-10  
µA VOUT = 0V to VCC  
Input Capacitance  
CIN  
pF VIN = 0V; Tamb = 25°C;  
f = 1 MHz  
Output Capacitance  
all  
COUT  
12  
pF VOUT = 0V; Tamb = 25°C;  
f = 1 MHz  
Power Supply Current,  
Active  
C
I,E  
TTL input  
TTL input  
ICC1  
ICC2  
20  
25  
mA VCC = 5.5V; VPP = VCC  
mA f = 1 MHz;  
OE = CE = VIL;  
IOUT = 0 mA;  
VIL = -0.1 to 0.8V;  
VIH = 2.0 to VCC;  
Note 1  
Power Supply Current,  
Standby  
C
I, E  
all  
TTL input  
TTL input  
CMOS input  
ICC(S)  
2
3
100  
mA  
mA  
µA CE = VCC ± 0.2V  
IPP Read Current  
VPP Read Voltage  
all  
all  
Read Mode  
Read Mode  
IPP  
VPP  
100  
µA VPP = 5.5V  
V
VCC-0.7 VCC  
* Parts: C=Commercial Temperature Range; I, E=Industrial and Extended Temperature Ranges  
Note 1: Typical active current increases .75 mA per MHz up to operating frequency for all temperature ranges.  
DS11003K-page 2  
1996 Microchip Technology Inc.  
27C128  
TABLE 1-3:  
READ OPERATION AC CHARACTERISTICS  
AC Testing Waveform:  
Output Load:  
VIH = 2.4V and VIL = 0.45V; VOH = 2.0V VOL = 0.8V  
1 TTL Load + 100 pF  
Input Rise and Fall Times: 10 ns  
Ambient Temperature: Commercial:  
Industrial:  
Extended (Automotive): Tamb = -40°C to +125°C  
Tamb = 0˚C to +70˚C  
Tamb = -40˚C to +85˚C  
27C128-12 27C128-15 27C128-17 27C128-20 27C128-25  
Min Max Min Max Min Max Min Max Min Max  
Parameter  
Sym  
Units Conditions  
Address to Output Delay tACC  
0
120  
120  
65  
0
150  
150  
70  
0
170  
170  
70  
0
200  
200  
75  
0
250  
250  
100  
60  
ns CE=OE=VIL  
ns OE=VIL  
ns CE=VIL  
ns  
CE to Output Delay  
OE to Output Delay  
tCE  
tOE  
CE or OE to O/P High  
Impedance  
tOFF  
50  
50  
50  
55  
Output Hold from  
tOH  
0
0
0
0
0
ns  
Address CE or OE,  
whichever occurs first  
FIGURE 1-1: READ WAVEFORMS  
VIH  
Address Valid  
Address  
VIL  
VIH  
CE  
VIL  
tCE(2)  
VIH  
OE  
VIL  
tOFF(1,3)  
tOH  
tOE(2)  
VOH  
Outputs  
O0 - O7  
High Z  
High Z  
Valid Output  
VOL  
tACC  
Notes: (1) tOFF is specified for OE or CE, whichever occurs first  
(2) OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE  
(3) This parameter is sampled and is not 100% tested.  
1996 Microchip Technology Inc.  
DS11003K-page 3  
27C128  
TABLE 1-4:  
PROGRAMMING DC CHARACTERISTICS  
Ambient Temperature: Tamb = 25°C ± 5°C  
VCC = 6.5V ± 0.25V, VPP = 13.0V ± 0.25V  
Parameter  
Status  
Symbol  
Min  
Max.  
Units  
Conditions  
Input Voltages  
Logic”1”  
Logic”0”  
VIH  
VIL  
2.0  
-0.1  
VCC+1  
0.8  
V
V
Input Leakage  
ILI  
-10  
2.4  
10  
µA  
VIN = 0V to VCC  
Output Voltages  
Logic”1”  
Logic”0”  
VOH  
VOL  
V
V
IOH = -400 µA  
IOL = 2.1 mA  
0.45  
20  
VCC Current, program & verify  
VPP Current, program  
ICC2  
IPP2  
VH  
mA  
mA  
V
Note 1  
Note 1  
25  
A9 Product Identification  
11.5  
12.5  
Note 1: VCC must be applied simultaneously or before VPP and removed simultaneously or after VPP  
TABLE 1-5:  
PROGRAMMING AC CHARACTERISTICS  
for Program, Program Verify  
and Program Inhibit Modes  
AC Testing Waveform: VIH=2.4V and VIL=0.45V; VOH=2.0V; VOL=0.8V  
Ambient Temperature: Tamb=25°C± 5°C  
VCC= 6.5V ± 0.25V, VPP = VH = 13.0V ± 0.25V  
Parameter  
Symbol  
Min  
Max Units  
Remarks  
Address Set-Up Time  
Data Set-Up Time  
Data Hold Time  
tAS  
tDS  
2
2
µs  
µs  
µs  
µs  
ns  
µs  
µs  
µs  
µs  
µs  
ns  
tDH  
2
Address Hold Time  
Float Delay (2)  
tAH  
0
tDF  
0
130  
VCC Set-Up Time  
Program Pulse Width (1)  
CE Set-Up Time  
tVCS  
tPW  
tCES  
tOES  
tVPS  
tOE  
2
95  
2
105  
100 µs typical  
OE Set-Up Time  
2
VPP Set-Up Time  
Data Valid from OE  
2
100  
Note 1: For express algorithm, initial programming width tolerance is 100 µs ±5%.  
2: This parameter is only sampled and not 100% tested. Output float is defined as the point where data is no  
longer driven (see timing diagram).  
DS11003K-page 4  
1996 Microchip Technology Inc.  
27C128  
FIGURE 1-2: PROGRAMMING WAVEFORMS (1)  
Program  
Verify  
VIH  
Address  
Data  
Address Stable  
VIL  
V IH  
VIL  
tAS  
t DS  
tAH  
High Z  
Data In Stable  
Data Out Valid  
tDF  
(2)  
t DH  
13.0 V (3)  
5.0 V  
6.5 V (3)  
5.0 V  
VIH  
VPP  
VCC  
CE  
tVPS  
tVCS  
VIL  
tCES  
V IH  
PGM  
OE  
VIL  
tOES  
tPW  
tOE  
(2)  
V IH  
tOPW  
VIL  
Notes: (1)  
The input timing reference is 0.8V for VIL and 2.0V for VIH.  
(2)  
(3)  
tDF and tOE are characteristics of the device but must be accommodated by the programmer.  
Vcc = 6.5V ±0.25V, VPP = VH = 13.0V ±0.25V for Express algorithm.  
TABLE 1-6:  
MODES  
Operation Mode  
Read  
CE  
OE  
PGM  
VPP  
A9  
O0 - O7  
VIL  
VIL  
VIL  
VIH  
VIH  
VIL  
VIL  
VIL  
VIH  
VIL  
X
VIH  
VIL  
VIH  
X
VCC  
VH  
X
X
DOUT  
DIN  
Program  
Program Verify  
Program Inhibit  
Standby  
VH  
X
DOUT  
VH  
X
High Z  
X
X
VCC  
VCC  
VCC  
X
High Z  
Output Disable  
Identity  
VIH  
VIL  
VIH  
VIH  
X
High Z  
VH  
Identity Code  
X = Don’t Care  
For Read operations, if the addresses are stable, the  
address access time (tACC) is equal to the delay from  
CE to output (tCE). Data is transferred to the output  
after a delay from the falling edge of OE (tOE).  
1.2  
Read Mode  
(See Timing Diagrams and AC Characteristics)  
Read Mode is accessed when  
a) the CE pin is low to power up (enable) the chip  
b) the OE pin is low to gate the data to the output  
pins  
1996 Microchip Technology Inc.  
DS11003K-page 5  
27C128  
1.3  
Standby Mode  
1.7  
Verify  
The standby mode is defined when the CE pin is high  
(VIH) and a program mode is not defined.  
After the array has been programmed it must be veri-  
fied to ensure all the bits have been correctly pro-  
grammed. This mode is entered when all the following  
conditions are met:  
When these conditions are met, the supply current will  
drop from 20 mA to 100 µA.  
a) VCC is at the proper level,  
b) VPP is at the proper VH level,  
c) the CE line is low,  
1.4  
Output Enable  
This feature eliminates bus contention in microproces-  
sor-based systems in which multiple devices may drive  
the bus. The outputs go into a high impedance state  
when the following condition is true:  
d) the PGM line is high, and  
e) the OE line is low.  
1.8  
Inhibit  
• The OE and PGM pins are both high.  
When programming multiple devices in parallel with dif-  
ferent data, only CE or PGM need be under separate  
control to each device. By pulsing the CE or PGM line  
low on a particular device in conjunction with the PGM  
or CE line low, that device will be programmed; all other  
devices with CE or PGM held high will not be pro-  
grammed with the data, although address and data will  
be available on their input pins (i.e., when a high level  
is present on CE or PGM); and the device is inhibited  
from programming.  
1.5  
Erase Mode (U.V. Windowed Versions)  
Windowed products offer the capability to erase the  
memory array. The memory matrix is erased to the all  
1’s state when exposed to ultraviolet light. To ensure  
2
complete erasure, a dose of 15 watt-second/cm is  
required. This means that the device window must be  
placed within one inch and directly underneath an ultra-  
violet lamp with a wavelength of 2537 Angstroms,  
2
intensity of 12,000µW/cm for approximately 20 min-  
utes.  
1.9  
Identity Mode  
1.6  
Programming Mode  
In this mode specific data is output which identifies the  
manufacturer as Microchip Technology Inc. and device  
type. This mode is entered when Pin A9 is taken to VH  
(11.5V to 12.5V). The CE and OE lines must be at VIL.  
A0 is used to access any of the two non-erasable bytes  
whose data appears on O0 through O7.  
The Express Algorithm has been developed to improve  
the programming throughput times in a production  
environment. Up to ten 100-microsecond pulses are  
applied until the byte is verified. No overprogramming  
is required. A flowchart of the express algorithm is  
shown in Figure 1-3.  
Programming takes place when:  
Pin  
Identity  
Input  
A0  
Output  
a) VCC is brought to the proper voltage,  
b) VPP is brought to the proper VH level,  
c) the CE pin is low,  
H
e
x
0 O O O O O O O  
7
6
5
4
3
2
1
0
d) the OE pin is high, and  
Manufacturer  
Device Type*  
VIL  
VIH  
0
1
0
0
1
0
0
0
1
0
0
0
0
1
1
1
29  
83  
e) the PGM pin is low.  
Since the erased state is “1” in the array, programming  
of “0” is required. The address to be programmed is set  
via pins A0-A13 and the data to be programmed is pre-  
sented to pins O0-O7. When data and address are sta-  
ble, OE is high, CE is low and a low-going pulse on the  
PGM line programs that location.  
* Code subject to change  
DS11003K-page 6  
1996 Microchip Technology Inc.  
27C128  
FIGURE 1-3: PROGRAMMING EXPRESS ALGORITHM  
Conditions:  
Tamb = 25˚C ±5˚C  
VCC = 6.5 ±0.25V  
VPP = 13.0 ±0.25V  
Start  
ADDR = First Location  
VCC = 6.5V  
VPP = 13.0V  
X = 0  
Program one 100 µs pulse  
Increment X  
Verify  
Byte  
Pass  
Fail  
No  
Yes  
Device  
Failed  
X = 10 ?  
Last  
Address?  
Yes  
No  
Increment Address  
VCC = VPP = 4.5V, 5.5V  
All  
Yes  
No  
bytes  
= original  
data?  
Device  
Passed  
Device  
Failed  
1996 Microchip Technology Inc.  
DS11003K-page 7  
27C128  
NOTES:  
DS11003K-page 8  
1996 Microchip Technology Inc.  
27C128  
NOTES:  
1996 Microchip Technology Inc.  
DS11003K-page 9  
27C128  
NOTES:  
DS11003K-page 10  
1996 Microchip Technology Inc.  
27C128  
27C128 Product Identification System  
To order or to obtain information, e.g., on pricing or delivery, please use the listed part numbers, and refer to the factory or the listed  
sales offices.  
27C128 –25  
I
/P  
Package:  
L = Plastic Leaded Chip Carrier (PLCC)  
P = Plastic DIP (600 Mil)  
SO = Plastic SOIC (300 Mil)  
Temperature  
Range:  
Blank = 0˚C to +70˚C  
I = -40˚C to +85˚C  
E = -40˚C to +125˚C  
Access  
Time:  
12 = 120 ns  
15 = 150 ns  
17 = 170 ns  
20 = 200 ns  
25 = 250 ns  
Device:  
27C128  
128K (16K x 8) CMOS EPROM  
1996 Microchip Technology Inc.  
DS11003K-page 11  
WORLDWIDE SALES & SERVICE  
AMERICAS  
Corporate Office  
ASIA/PACIFIC  
China  
EUROPE  
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Tel: 770 640-0034 Fax: 770 640-0307  
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JAPAN  
Microchip Technology Intl. Inc.  
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9/3/96  
Los Angeles  
Microchip Technology Inc.  
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NewYork  
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Microchip Technology Inc.  
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Tel: 905 405-6279 Fax: 905 405-6253  
All rights reserved. 1996, Microchip Technology Incorporated, USA. 9/96  
Printed on recycled paper.  
Information contained in this publication regarding device applications and the like is intended through suggestion only and may be superseded by updates. No repre-  
sentation or warranty is given and no liability is assumed by Microchip Technology Incorporated with respect to the accuracy or use of such information, or infringement  
of patents or other intellectual property rights arising from such use or otherwise. Use of Microchip’s products as critical components in life support systems is not autho-  
rized except with express written approval by Microchip. No licenses are conveyed, implicitly or otherwise, under any intellectual property rights. The Microchip logo and  
name are registered trademarks of Microchip Technology Inc. All rights reserved. All other trademarks mentioned herein are the property of their respective companies.  
DS11003K-page 12  
1996 Microchip Technology Inc.  

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27C128-12I/J

16K X 8 UVPROM, 120 ns, CDIP28, 0.600 INCH, CERDIP-28
MICROCHIP
ETC
MICROCHIP
MICROCHIP
MICROCHIP

27C128-12I/TS

16K X 8 OTPROM, 120 ns, PDSO28, 8 X 13.40 MM, TSOP-28
MICROCHIP

27C128-15/J

16K X 8 UVPROM, 150 ns, CDIP28, 0.600 INCH, CERDIP-28
MICROCHIP

27C128-15/K

16K X 8 UVPROM, 150 ns, CQCC32, CERAMIC, LCC-32
MICROCHIP

27C128-15/KA

EPROM, 16KX8, 150ns, CMOS, CQCC32
VISHAY