79C0832RPQI20 [MAXWELL]

8 Megabit EEPROM MCM; 8兆位EEPROM MCM
79C0832RPQI20
型号: 79C0832RPQI20
厂家: MAXWELL TECHNOLOGIES    MAXWELL TECHNOLOGIES
描述:

8 Megabit EEPROM MCM
8兆位EEPROM MCM

可编程只读存储器 电动程控只读存储器 电可擦编程只读存储器
文件: 总19页 (文件大小:482K)
中文:  中文翻译
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79C0832  
8 Megabit (256K x 32-Bit)  
EEPROM MCM  
FEATURES:  
DESCRIPTION:  
• 256k x 32-bit EEPROM MCM  
• RAD-PAK® radiation-hardened against natural  
• space radiation  
Maxwell Technologies’ 79C0832 multi-chip module (MCM)  
memory features a greater than 100 krad (Si) total dose toler-  
ance, dependent upon orbit. Using Maxwell Technologies’ pat-  
ented radiation-hardened RAD-PAK® MCM packaging  
technology, the 79C0832 is the first radiation-hardened 8  
megabit MCM EEPROM for space application. The 79C0832  
uses eight 1 Megabit high speed CMOS die to yield an 8  
megabit product. The 79C0832 is capable of in-system electri-  
cal byte and page programmability. It has a 128 x 8 byte page  
programming function to make its erase and write operations  
faster. It also features Data Polling and a Ready/Busy signal to  
indicate the completion of erase and programming operations.  
In the 79C0832, hardware data protection is provided with the  
RES pin, in addition to noise protection on the WE signal and  
write inhibit on power on and off. Software data protection is  
implemented using the JEDEC optional standard algorithm.  
Total dose hardness:  
- >100 krad (Si)  
- Dependent upon orbit  
• Excellent Single event effects  
- SEL > 120 MeV/mg/cm2  
TH  
- SEU > 90 MeV/mg/cm2 read mode  
- SEU = 18 MeV/mg/cm2 write mode  
High endurance  
- 10,000 cycles/byte (Page Programming Mode)  
- 10 year data retention  
• Page Write Mode: 1 to 8 X 128 byte page  
High Speed:  
- 150 and 200 ns maximum access times  
Automatic programming  
- 10 ms automatic Page/Byte write  
Low power dissipation  
Maxwell Technologies' patented RAD-PAK® packaging technol-  
ogy incorporates radiation shielding in the microcircuit pack-  
age. It eliminates the need for box shielding while providing  
the required radiation shielding for a lifetime in orbit or space  
mission. In a GEO orbit, RAD-PAK provides greater than 100  
krad (Si) radiation dose tolerance. This product is available  
with screening up to Maxwell Technologies self-defined Class  
K.  
- 160 mW/MHz active current  
- 880 µW standby current  
02.14.06 REV 15  
1
All data sheets are subject to change without notice  
(858) 503-3300 - Fax: (858) 503-3301 - www.maxwell.com  
©2006 Maxwell Technologies  
All rights reserved.  
79C0832  
8 Megabit (256K x 32-Bit) EEPROM MCM  
TABLE 1. 79C0832 PINOUT DESCRIPTION  
PIN  
SYMBOL  
DESCRIPTION  
84-77, 29-37  
ADDR0 to ADDR16 Address Input  
48-55, 66-73, 96,  
1-7, 18-25  
I/O0 to I/O31  
Data Input/Output  
61  
41, 43  
45  
OE  
CE0-1  
WE  
Output Enable  
Chip Enable 0 through 1  
Write Enable  
10, 17, 28, 40, 44,  
58, 65, 76, 87, 93  
5V  
Power Supply  
8, 9, 11-16, 26, 27,  
38, 42, 46, 56, 57,  
59, 60, 62-64, 74,  
75, 85, 86, 88-92,  
94, 95  
GND  
Ground  
39  
47  
RDY/BUSY  
RES  
Ready/Busy  
Reset  
All data sheets are subject to change without notice  
02.14.06 REV 15  
2
©2006 Maxwell Technologies  
All rights reserved  
79C0832  
8 Megabit (256K x 32-Bit) EEPROM MCM  
TABLE 2. 79C0832 ABSOLUTE MAXIMUM RATINGS  
PARAMETER  
SYMBOL  
MIN  
TYP  
MAX  
UNIT  
Supply Voltage  
Input Voltage  
V
-0.6  
7.0  
7.0  
V
V
CC  
V
-0.51  
IN  
Package Weight  
RP  
RT  
45  
38  
Grams  
XP  
TBD  
3
Thermal Impedance  
FJC  
TOPR  
TSTG  
°C/W  
°C  
Operating Temperature Range  
Storage Temperature Range  
-55  
-65  
125  
150  
°C  
1. V min = -3.0V for pulse width <50ns.  
IN  
TABLE 3. 79C0832 RECOMMENDED DC OPERATING CONDITIONS  
PARAMETER  
SYMBOL  
MIN  
MAX  
UNIT  
Supply Voltage  
Input Voltage  
V
4.5  
-0.31  
2.2  
5.5  
0.8  
V
CC  
V
V
V
V
IL  
V
V
CC +0.3  
CC +1  
125  
IH  
RES_PIN  
V
V -0.5  
V
H
CC  
Operating Temperature Range  
TOPR  
-55  
°C  
1. V min = -1.0V for pulse width < 50 ns  
IL  
1
TABLE 4. DELTA LIMITS  
2
PARAMETER  
VARIATION  
ICC1A  
+/- 10 %  
+/- 10 %  
+/- 10 %  
+/- 10 %  
+/- 10 %  
ICC1D  
ICC2A  
ILI - ADDR, CE, OE, WE  
ILI - D0-D31  
1. Parameters are measured and recorded per MIL-STD-883 for Class K devices  
2. Specified value in Table 6  
All data sheets are subject to change without notice  
02.14.06 REV 15  
3
©2006 Maxwell Technologies  
All rights reserved  
79C0832  
8 Megabit (256K x 32-Bit) EEPROM MCM  
TABLE 5. 79C0832 CAPACITANCE  
(T = 25 °C, f = 1 MHz)  
A
PARAMETER  
Input Capacitance : V = 0V  
SYMBOL  
MIN  
MAX  
UNIT  
1
CIN OE  
6
6
pF  
IN  
C WE  
IN  
C CE0-1  
6
IN  
C A0-A16  
6
IN  
CIN RES  
48  
6
1
Output Capacitance: VOUT = 0V  
COut RDY/BSY  
pF  
CO ut D0-D31  
--  
12  
1. Guaranteed by design.  
TABLE 6. 79C0832 DC ELECTRICAL CHARACTERISTICS  
(V = 5V ±10%, TA = -55 TO +125°C)  
CC  
PARAMETER  
TEST CONDITION  
SYMBOL SUBGROUPS  
MIN  
MAX  
10 2  
1.12  
4
UNITS  
Input Leakage Current1 V = V  
A0-A16, CE,WE, OE  
ILI  
1, 2, 3  
--  
µA  
mA  
µA  
IN  
CC  
V = 0V  
IN  
Input Leakage Current V =V  
D0-D31  
ILI  
1, 2, 3  
IN CC  
Output Leakage Current (VCC = 5.5V, VOUT = 5.5V/0.4V)  
ILO  
1, 2, 3  
1, 2, 3  
--  
--  
4
µA  
µA  
mA  
mA  
mA  
mA  
Standby VCC Current1  
CE = ADDR=WE=OE =V  
ICC1A  
ICC1B  
ICC1C  
ICC1D  
ICC2A  
80  
4
CC  
CE = V ADDR=WE=OE =V  
IH;  
CC  
CE = ADDR=WE=OE =V  
--  
--  
45  
25  
60  
IH  
CE =V , ADDR=WE=OE =0V  
IH  
Operating  
CC Current1,3  
OE = 0V ADDR=WE=V  
IOUT = 0mA, CE Duty = 100%,  
Cycle = 1 us at VCC = 5.5V  
1, 2, 3  
1, 2, 3  
1, 2, 3  
1, 2, 3  
1, 2, 3  
CC  
V
OE =ADDR=WE=0V  
ICC2B  
ICC2C  
ICC2D  
--  
85  
200  
225  
0.8  
mA  
mA  
mA  
V
IOUT = 0mA, CE Duty = 100%,  
Cycle = 1 us at VCC = 5.5V  
OE = 0V ADDR=WE=V  
--  
CC  
IOUT = 0mA, CE Duty = 100%,  
Cycle = 150 ns at VCC = 5.5V  
OE =ADDR=WE=0V  
IOUT = 0mA, CE Duty = 100%,  
Cycle = 150 ns at VCC = 5.5V  
Input Voltage  
V
IL  
V
2.2  
IH  
RES_PIN  
V
VCC -0.5  
H
All data sheets are subject to change without notice  
02.14.06 REV 15  
4
©2006 Maxwell Technologies  
All rights reserved  
79C0832  
8 Megabit (256K x 32-Bit) EEPROM MCM  
TABLE 6. 79C0832 DC ELECTRICAL CHARACTERISTICS  
(V = 5V ±10%, TA = -55 TO +125°C)  
CC  
PARAMETER  
TEST CONDITION  
SYMBOL SUBGROUPS  
MIN  
MAX  
UNITS  
Output Voltage  
Data Lines: V Min, IOL= 2.1mA  
V
1, 2, 3  
--  
0.4  
0.4  
--  
--  
--  
V
V
V
V
V
CC  
OL  
RDY/BSY_Line: VCC Min, IOL = 12mA  
Data Lines: VCC Min, IOH = -400µA  
RDY/BSY_Line: VCC Min, IOH = -12mA  
V
OL  
V
2.4  
3.15  
CC - 0.3V  
OH  
V
OH  
All Outputs: V Min , IOH = -100uA  
V
CC  
1. All Inputs are tied to VCC with a 5.5KW resistor, except for RES which is 30KW.  
2. For RES ILI=800uA max.  
3. Only one CE Active (Low)  
1
TABLE 7. 79C0832 AC ELECTRICAL CHARACTERISTICS FOR READ OPERATION  
(V = 5V ±10%, TA = -55 TO +125°C)  
CC  
PARAMETER  
SYMBOL  
SUBGROUPS  
MIN  
MAX  
UNIT  
Address Access Time CE = OE = V , WE = V  
tACC  
9, 10, 11  
ns  
IL  
IH  
-150  
-200  
--  
--  
150  
200  
Chip Enable Access Time OE = V , WE = V  
-150  
-200  
tCE  
tOE  
tOH  
9, 10, 11  
9, 10, 11  
9, 10, 11  
9, 10, 11  
ns  
ns  
ns  
IL  
IH  
--  
--  
150  
200  
Output Enable Access TIme CE = V , WE = V  
IL  
IH  
-150  
-200  
0
0
75  
125  
Output Hold to Address Change CE = OE =V , WE = V  
-150  
-200  
IL  
IH  
0
0
--  
--  
Output Disable to High-Z 2  
CE = V , WE = V  
tDF  
ns  
ns  
IL  
IH  
-150  
-200  
0
0
50  
60  
CE = OE = V , WE = V  
tDFR  
IL  
IH  
-150  
-200  
0
0
350  
450  
3
RES to Output Delay CE = OE = V , WE = V  
TRR  
9, 10, 11  
ns  
IL  
IH  
-150  
-200  
0
0
450  
650  
1. Test conditions: input pulse levels = 0.4V to 2.4V; input rise and fall times < 20 ns; output load = 1 TTL gate + 100 pF (including  
scope and jig); reference levels for measuring timing = 0.8 V/1.8 V.  
2. tDF and tDFR are defined as the time at which the output becomes an open circuit and data is no longer driven.  
3. Guaranteed by design.  
All data sheets are subject to change without notice  
02.14.06 REV 15  
5
©2006 Maxwell Technologies  
All rights reserved  
79C0832  
8 Megabit (256K x 32-Bit) EEPROM MCM  
TABLE 8. 79C0832 AC ELECTRICAL CHARACTERISTICS FOR WRITE OPERATION  
(V = 5V ±10%, TA = -55 TO +125°C)  
CC  
1
PARAMETER  
SYMBOL  
SUBGROUPS  
MAX  
UNITS  
MIN  
Address Setup Time  
tAS  
9, 10, 11  
ns  
-150  
-200  
0
0
--  
--  
Chip Enable to Write Setup Time (WE controlled)  
-150  
-200  
tCS  
9, 10, 11  
9, 10, 11  
ns  
0
0
--  
--  
Write Pulse Width  
CE controlled  
-150  
-200  
WE controlled  
-150  
tCW  
ns  
ns  
250  
350  
--  
--  
tWP  
250  
350  
--  
--  
-200  
Address Hold Time  
-150  
-200  
tAH  
9, 10, 11  
9, 10, 11  
9, 10, 11  
9, 10, 11  
9, 10, 11  
9, 10, 11  
9, 10, 11  
9, 10, 11  
9, 10, 11  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ms  
150  
200  
--  
--  
Data Setup Time  
-150  
-200  
tDS  
100  
150  
--  
--  
Data Hold Time  
-150  
-200  
tDH  
10  
10  
--  
--  
Chip Enable Hold Time (WE controlled)  
-150  
-200  
tCH  
0
0
--  
--  
Write Enable to Write Setup Time (CE controlled)  
-150  
-200  
tWS  
tWH  
tOES  
tOEH  
tWC  
0
0
--  
--  
Write Enable Hold Time (CE controlled)  
-150  
-200  
0
0
--  
--  
Output Enable to Write Setup Time  
-150  
-200  
0
0
--  
--  
Output Enable Hold Time  
-150  
-200  
0
0
--  
--  
Write Cycle Time 2  
-150  
-200  
--  
--  
10  
10  
All data sheets are subject to change without notice  
02.14.06 REV 15  
6
©2006 Maxwell Technologies  
All rights reserved  
79C0832  
8 Megabit (256K x 32-Bit) EEPROM MCM  
TABLE 8. 79C0832 AC ELECTRICAL CHARACTERISTICS FOR WRITE OPERATION  
(V = 5V ±10%, TA = -55 TO +125°C)  
CC  
1
PARAMETER  
SYMBOL  
SUBGROUPS  
MAX  
UNITS  
MIN  
Data Latch Time  
tDL  
9, 10, 11  
ns  
-150  
-200  
300  
400  
--  
--  
Byte Load Window  
-150  
-200  
tBL  
tBLC  
tDB  
9, 10, 11  
9, 10, 11  
9, 10, 11  
9, 10, 11  
9, 10, 11  
9, 10, 11  
µs  
µs  
ns  
ns  
µs  
µs  
100  
200  
--  
--  
Byte Load Cycle  
-150  
-200  
.55  
.95  
30  
30  
Time to Device Busy  
-150  
-200  
120  
170  
--  
--  
Write Start Time 3  
-150  
-200  
tDW  
150  
250  
--  
--  
RES to Write Setup Time4  
-150  
-200  
tRP  
100  
200  
--  
--  
V
CC to RES Setup Time4  
tRES  
-150  
-200  
1
3
--  
--  
1. Use this device in a longer cycle than this value.  
2. tWC must be longer than this value unless polling techniques or RDY/BUSY are used. This device automatically completes the  
internal write operation within this value.  
3. Next read or write operation can be initiated after tDW if polling techniques or RDY/BUSY are used.  
4. Guaranteed by design.  
1
TABLE 9. 79C0832 MODE SELECTION  
CE 2  
PARAMETER  
OE  
WE  
I/O  
RES  
RDY/BUSY  
Read  
V
V
V
DOUT  
V
V
IL  
IL  
IH  
H
OH  
Standby  
Write  
V
X
X
High-Z  
X
V
IH  
OH  
V
V
V
D
V
VOH --> V  
OL  
IL  
IH  
IL  
IN  
H
Deselect  
Write Inhibit  
V
V
V
High-Z  
V
V
OH  
IL  
IH  
IH  
H
X
X
X
V
--  
--  
X
X
--  
--  
IH  
V
X
IL  
Data Polling  
V
V
V
Data Out (I/O7)  
High-Z  
V
V
OL  
IL  
IL  
IH  
H
Program Reset  
X
X
X
V
V
OH  
L
1. Refer to the recommended DC operating conditions.  
2. For CE0-1 only one CE can be used (on) at a time.  
All data sheets are subject to change without notice  
02.14.06 REV 15  
7
©2006 Maxwell Technologies  
All rights reserved  
79C0832  
8 Megabit (256K x 32-Bit) EEPROM MCM  
FIGURE 1. READ TIMING WAVEFORM  
FIGURE 2. BYTE WRITE TIMING WAVEFORM (1) (WE CONTROLLED)  
All data sheets are subject to change without notice  
02.14.06 REV 15  
8
©2006 Maxwell Technologies  
All rights reserved  
79C0832  
8 Megabit (256K x 32-Bit) EEPROM MCM  
FIGURE 3. BYTE WRITE TIMING WAVEFORM (2) (CE CONTROLLED)  
FIGURE 4. PAGE WRITE TIMING WAVEFORM (1) (WE CONTROLLED)  
1) A7-A16 are Page Addresses and must be the same within a Page Write Operation.  
All data sheets are subject to change without notice  
02.14.06 REV 15  
9
©2006 Maxwell Technologies  
All rights reserved  
79C0832  
8 Megabit (256K x 32-Bit) EEPROM MCM  
FIGURE 5. PAGE WRITE TIMING WAVEFORM (2) (CE CONTROLLED)  
1
1) A7-A16 are Page Addresses and must be the same within a Page Write Operation.  
FIGURE 6. DATA POLLING TIMING WAVEFORM  
All data sheets are subject to change without notice  
02.14.06 REV 15  
10  
©2006 Maxwell Technologies  
All rights reserved  
79C0832  
8 Megabit (256K x 32-Bit) EEPROM MCM  
FIGURE 7. SOFTWARE DATA PROTECTION TIMING WAVEFORM (1) (IN PROTECTION MODE)  
FIGURE 8. SOFTWARE DATA PROTECTION WAVEFORM (2) (IN NON-PROTECTION MODE)  
EEPROM APPLICATION NOTES  
This application note describes the programming procedures for the EEPROM modules and with details of various  
techniques to preserve data integrity.  
Automatic Page Write  
Page-mode write feature allows 1 to 128 bytes of data to be written into the EEPROM in a single write cycle. Loading  
the first byte of data, the data load window opens 30µs for the second byte. In the same manner each additional byte  
of data can be loaded within 30µs of the preceding falling edge of either WE or CE. When CE and WE are kept high  
for 100µs after data input, the EEPROM enters the write mode automatically and the data input is written into the  
EEPROM.  
WE, CE Pin Operation  
During a write cycle, addresses are latched by the falling edge of WE or CE, and data is latched by the rising edge of  
WE or CE.  
All data sheets are subject to change without notice  
02.14.06 REV 15  
11  
©2006 Maxwell Technologies  
All rights reserved  
79C0832  
8 Megabit (256K x 32-Bit) EEPROM MCM  
Data Polling  
Data Polling function allows the status of the EEPROM to be determined. If EEPROM is set to read mode during a  
write cycle, an inversion of the last byte of data to be loaded outputs from I/O 7 to indicate that the EEPROM is per-  
forming a write operation.  
RDY/Busy Signal  
RDY/Busy signal also allows a comparison operation to determine the status of the EEPROM. The RDY/Busy signal  
goes low (VOL) after the first write signal. At the end of the write cycle, the RDY/Busy returns to a high state ( V ).  
OH  
RES Signal  
When RES is LOW (V ), the EEPROM cannot be read or programmed. The EEPROM data must be protected by  
L
keeping RES low when V is power on and off. RES should be high (V ) during read and programming operations.  
CC  
H
Data Protection  
To protect the data during operation and power on/off, the EEPROM has the internal functions described below.  
1. Data Protection against Noise of Control Pins (CE, OE, WE) during Operation.  
During readout or standby, noise on the control pins may act as a trigger and turn the EEPROM to programming  
mode by mistake. To prevent this phenomenon, the EEPROM has a noise cancellation function that cuts noise if its  
width is 20ns or less in programming mode. Be careful not to allow noise of a width more than 20ns on the control  
pins.  
All data sheets are subject to change without notice  
02.14.06 REV 15  
12  
©2006 Maxwell Technologies  
All rights reserved  
79C0832  
8 Megabit (256K x 32-Bit) EEPROM MCM  
2. Data Protection at V on/off  
CC  
When V is turned on or off, noise on the control pins generated by external circuits, such as CPUs, may turn the EEPROM to  
CC  
programming mode by mistake. To prevent this unintentional programming, the EEPROM must be kept in unprogrammable  
state during VCC on/off by using a CPU reset signal to RES pin.  
3. RES Signal  
RES should be kept at V level when VCC is turned on or off. The EEPROM breaks off programming operation when RES  
SS  
become low, programming operation doesnt finish correctly in case that RES falls low during programming operation. RES  
should be kept high for 10 ms after the last data is input  
.
10ms  
4. Software Data Protection Enable  
The 79C0832 contains a software controlled write protection feature that allows the user to inhibit all write operations to the  
device. This is useful in protecting the device from unwanted write cycles due to uncontrollable circuit noise or inadvertent  
writes caused by minor bus contentions. Software data protection is enabled by writing the following data sequence to the  
EEPROM and allowing the write cycle period (tWC) of 10ms to elapse:  
.
Software Data Protection Enable Sequence  
Address  
Data  
5555  
AA AA AA AA  
55 55 55 55  
AAAA or 2AAA  
5555  
A0 A0 A0 A0  
All data sheets are subject to change without notice  
02.14.06 REV 15  
13  
©2006 Maxwell Technologies  
All rights reserved  
79C0832  
8 Megabit (256K x 32-Bit) EEPROM MCM  
5. Writing to the Memory with Software Data Protection Enabled  
To write to the device once Software protection is enabled, the enable sequence must precede the data to be written. This  
sequence allows the write to occur while at the same time keeping the software protection enabled  
Sequence for Writing Data with Software Protection Enabled.  
Address  
Data  
5555  
AA AA AA AA  
55 55 55 55  
AAAA or 2AAA  
5555  
A0 A0 A0 A0  
Write Address(s)  
Normal Data Input  
6. Disabling Software Protection  
Software data protection mode can be disabled by inputting the following 6 bytes sequence. Once the software protection  
sequence has been written, no data can be written to the memory until the write cycle (TWC) has elapsed.  
Software Protection Disable Sequence  
Address  
Data  
5555  
AA AA AA AA  
55 55 55 55  
AAAA or 2AAA  
80 80 80 80  
AA AA AA AA  
5555  
5555  
AAAA or 2AAA  
5555  
55 55 55 55  
20 20 20 20  
Devices are shipped in the “unprotected” state, meaning that the contents of the memory can be changed as  
required by the user. After the software data protection is enabled, the device enters the Protect Mode  
where no further write commands have any effect on the memory contents.  
All data sheets are subject to change without notice  
02.14.06 REV 15  
14  
©2006 Maxwell Technologies  
All rights reserved  
79C0832  
8 Megabit (256K x 32-Bit) EEPROM MCM  
96-PIN RAD-PAK® QUAD FLAT PACKAGE  
DIMENSION  
SYMBOL  
MIN  
NOM  
MAX  
A
b
.184  
.010  
---  
.200  
.012  
.009  
1.420  
1.162  
.050  
.129  
2.528  
2.500  
1.700  
.165  
96  
.216  
.013  
c
.012  
D
D1  
e
1.408  
1.432  
S1  
L
---  
2.485  
---  
2.543  
2.505  
L1  
L2  
A1  
N
.152  
.178  
Note: All dimensions in inches  
All data sheets are subject to change without notice  
02.14.06 REV 15  
15  
©2006 Maxwell Technologies  
All rights reserved  
79C0832  
8 Megabit (256K x 32-Bit) EEPROM MCM  
A1  
Pin #1 ID  
c
S1  
MAXWELL  
e
b
TECHNOLOGIES  
L2  
D1  
D(sq)  
L1(sq)  
A
L(sq)  
96 PIN RAD-TOLERANT QUAD FLAT PACKAGE  
DIMENSION  
SYMBOL  
MIN  
NOM  
MAX  
A
b
.167  
.010  
--  
.183  
.012  
.009  
1.420  
1.162  
.050  
.129  
2.528  
2.500  
1.700  
.165  
96  
.199  
.013  
c
.012  
D
D1  
e
1.408  
1.432  
S1  
L
--  
2.543  
2.505  
L1  
L2  
A1  
N
2.485  
.152  
.178  
Note: All dimensions in inches  
All data sheets are subject to change without notice  
02.14.06 REV 15  
16  
©2006 Maxwell Technologies  
All rights reserved  
79C0832  
8 Megabit (256K x 32-Bit) EEPROM MCM  
96 PIN XRAYL QUAD FLAT PACKAGE  
DIMENSION  
SYMBOL  
MIN  
NOM  
MAX  
A
b
.200  
.007  
.222  
.010  
.245  
.013  
c
.009  
.009  
.013  
D
D1  
e
1.690  
1.707  
1.150  
0.050  
.278  
1.725  
S1  
L
3.000  
2.985  
2.090  
.115  
3.020  
3.000  
2.200  
.130  
3.040  
3.005  
2.210  
.145  
L1  
L2  
A1  
N
96  
Note: All dimensions in inches  
All data sheets are subject to change without notice  
02.14.06 REV 15  
17  
©2006 Maxwell Technologies  
All rights reserved  
79C0832  
8 Megabit (256K x 32-Bit) EEPROM MCM  
Important Notice:  
These data sheets are created using the chip manufacturers published specifications. Maxwell Technologies verifies  
functionality by testing key parameters either by 100% testing, sample testing or characterization.  
The specifications presented within these data sheets represent the latest and most accurate information available to  
date. However, these specifications are subject to change without notice and Maxwell Technologies assumes no  
responsibility for the use of this information.  
Maxwell Technologies’ products are not authorized for use as critical components in life support devices or systems  
without express written approval from Maxwell Technologies.  
Any claim against Maxwell Technologies must be made within 90 days from the date of shipment from Maxwell Tech-  
nologies. Maxwell Technologies’ liability shall be limited to replacement of defective parts.  
All data sheets are subject to change without notice  
02.14.06 REV 15  
18  
©2006 Maxwell Technologies  
All rights reserved  
79C0832  
8 Megabit (256K x 32-Bit) EEPROM MCM  
Product Ordering Options  
Model Number  
79C0832  
XX  
Q
X
-XX  
Option Details  
Feature  
Access Time  
15 = 150 ns  
20 = 200 ns  
Multi Chip Module (MCM)1  
Screening Flow  
K = Maxwell Self-Defined Class K  
H = Maxwell Self-Defined Class H  
I = Industrial (testing @ -55°C,  
+25°C, +125°C)  
E = Engineering (testing @ +25°C)  
Q = Quad Flat Pack  
Package  
RP = RAD-PAK® package  
XP = Xray-PakL Package  
RT1 = Guaranteed to 10 krad at  
die level  
Radiation Feature  
RT2 = Guaranteed to 25 krad at  
die level  
RT4 = Guaranteed to 40 krad at  
8 Megabit (256K x 32-Bit)  
EEPROM MCM  
Base Product  
Nomenclature  
1) Products are manufactureded and screened to Maxwell Technologies self-defined Class H and Class K flows.  
All data sheets are subject to change without notice  
02.14.06 REV 15  
19  
©2006 Maxwell Technologies  
All rights reserved  

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