MAX176BMLP/883B [MAXIM]
ADC, Successive Approximation, 12-Bit, 1 Func, 1 Channel, Serial Access, CMOS, CQCC20, CERAMIC, LCC-20;
| 型号： | MAX176BMLP/883B |
| 厂家： | 
MAXIM INTEGRATED PRODUCTS |
| 描述： | ADC, Successive Approximation, 12-Bit, 1 Func, 1 Channel, Serial Access, CMOS, CQCC20, CERAMIC, LCC-20 转换器 |
| 文件： | 总4页 (文件大小：28K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
SCOPE: Serial-Output, 250 ksps 12-Bit ADC with Track/Hold and Reference
Device Type
Generic Number
01
02
MAX176AM(x)/883B
MAX176BM(x)/883B
Case Outline(s). The case outlines shall be designated in Mil-Std-1835 and as follows:
Outline Letter
Mil-Std-1835
GDIP1-T8 or CDIP2-T8
CQCC1-N20
Case Outline
8 LEAD CERDIP
20-Pin LCC
Package Code
JA
LP
J08
L20
Absolute Maximum Ratings
VDD to GND ................................................................................................... -0.3V to +7V
SS to GND .................................................................................................. +0.3V to -17V
V
AIN to GND ............................................................................................................... ±15V
Digital Input Voltage to GND .......................................................... -0.3V to (VDD +0.3V)
Digital Output Voltage to GND ....................................................... -0.3V to (VDD +0.3V)
Lead Temperature (soldering, 10 seconds) ................................................................. +300°C
Storage Temperature .................................................................................... -65°C to +160°C
Continuous Power Dissipation .............................................................................. TA=+70°C
8 pin CERDIP(derate 8.0mW/°C above +70°C) ......................................................... 640mW
20 pin LCC(derate 9.1mW/°C above +70°C) ............................................................. 727mW
Junction Temperature TJ ......................................................................................…. +150°C
Thermal Resistance, Junction to Case, ΘJC
8 pin CERDIP..................................................................................................….. 55°C/W
20 pin LCC ......................................................................................................…. 20°C/W
Thermal Resistance, Junction to Ambient, ΘJA:
8 pin CERDIP.................................................................................................…. 125°C/W
20 pin LCC .....................................................................................................…. 110°C/W
Recommended Operating Conditions
Ambient Operating Range (TA) .........................................................……. -55°C to +125°C
Supply Voltage (VCC)........................................................................…….. +4.75V to +5.25V
Supply Voltage (VEE).........................................................................……. -11.4V to -15.75V
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
----------------------------
Electrical Characteristics of MAX176/883B
19-0293
Page 2 of
Rev. B
6
TABLE 1. ELECTRICAL TESTS:
CONDITIONS
-55 °C <=TA<= +125°C
DD=+5V±5%, VSS=-11.4V to -
Group A
Subgroup
Device
type
Limits
Min
Limits Units
Max
TEST
Symbol
V
15.75V, fCLK=3MHz
Unless otherwise specified
ACCURACY
Resolution
Differential Nonlinearity
1,2,3
1,2,3
All
RES
DNL
Guaranteed Monotonic over temp
NOTE 1
12
Bits
01
02
LSB
±0.75
±1.0
±0.5
±0.75
±1.0
±3.0
±5.0
±8.0
01
Integral Nonlinearity
INL
NOTE 1
1
LSB
2,3
1,2,3
02
Integral Nonlinearity
Offset Error
INL
VOS
NOTE 1
NOTE 1, NOTE 2 For JA pkg.
NOTE 1, NOTE 2 For LP pkg.
LSB
LSB
All
1,2,3
All
Full-Scale Error
AE
NOTE 3
1
LSB
ANALOG INPUTS
All
All
All
Input Voltage Range
Input Current
Input Capacitance
1,2,3
1,2,3
4
-5
+5
2.5 mA
10 pF
V
Note 4
INTERNAL
REFERENCE
All
All
All
VREF Output Voltage
VREF Output Tempco
Load Regulation
POWER SUPPLY
REJECTION
1,2,3
1,2,3
1,2,3
-4.98
-5.02
±40 ppm/°C
V
NOTE 5
NOTE 6 0mA<IL<5mA
5
mW
All
All
Positive Supply Rejection VDD
FS change, VSS=-15V or -12V,
1,2,3
1,2,3
LSB
LSB
±0.5
V
DD=5V±5%
FS change, VSS=-15V or -12V
DD=5V VSS=-15V or -12V
Negative Supply
Rejection
VSS
±0.5
±0.5
V
LOGIC INPUTS
Logic High Voltage
Logic Low Voltage
Input Current
(CLK, CONVST)
All
All
All
All
VIH
VIL
IIN
1,2,3
1,2,3
1,2,3
4
+2.4
4.0
V
V
+0.8
VIN=0V or VDD
NOTE 4
±5 µA
10 pF
Input Capacitance
CIN
LOGIC OUTPUTS
Output High Voltage
Output Low Voltage
POWER
REQUIREMENTS
Positive Supply Current
Negative Supply Current
All
All
VOH
VOL
1,2,3
1,2,3
V
V
Data ISOURCE=200µA
Data ISINK=1.6mA
0.4
8
All
All
IDD
ISS
CONVST=VDD, AIN=0V
CONVST=VDD, AIN=0V
1,2,3
1,2,3
mA
-11 mA
TIMING
NOTE 7
All
All
Clock Pulse Width
tCH
tCL
tSH
tSL
Clock High
Clock Low
Clock High
Clock Low
Leading clock
9,10,11
9,10,11
50
100
50
ns
ns
CONVST Pulse Width
150
tSC0
30
ns
All
CONVST to Clock Skew
9,10,11
tSC1
tPD
tAQ
Leading clock +1
NOTE 8
FS change at AIN NOTE 4
NOTE 4
160
20
All
All
All
All
Clock to Data Delay
Acquisition Time
CONVST Rise Time
Output Float Delay
9,10,11
9,10,11
9,10,11
9,10,11
170 ns
400 ns
100 ns
120 ns
NOTE 9
----------------------------
Electrical Characteristics of MAX176 /883B
19-0293
Page 3 of
Rev. B
6
CONDITIONS
-55 °C <=TA<= +125°C
DD=+5V±5%, VSS=-11.4V to -
Group A
Subgroup
Device
type
Limits
Min
Limits Units
Max
TEST
Symbol
V
15.75V, fCLK=3MHz
Unless otherwise specified
(AIN=10Vp-p, fAIN=50.17kHz,
DYNAMIC TESTS
f
SAMPLING=200ksps
9,10,11
9,10,11
9,10,11
All
All
All
Signal -to-Noise Plus
Distortion
Total Harmonic
Distortion
Peak Harmonic or
Spurious Noise
Input Slew Rate
Conversion Time
Acquisition Time
Clock Frequency
S/(N+D)
THD
70
dB
-80 dB
-80 dB
V/µs
SFDR
9,10,11
9,10,11
9,10,11
9,10,11
All
All
All
All
1.5
0.1
tCONV
tAQ
fCLK
14 clock cycles
NOTE 4
4.7
µs
400 ns
3.0 MHz
NOTE 1: These tests are performed at VDD=+5V, VSS=-15V. Operation over supply is guaranteed by supply
rejection tests.
NOTE 2: Offset measured at 0...00 to 0...01 digital output code.
NOTE 3: FS=+5.000V. Ideal last code transition = FS-3/2 LSB. Adjusted for offset error.
NOTE 4: Guaranteed by design. Not subject to test.
NOTE 5: VREF Tempco=∆VREF/∆T, where ∆VREF is reference voltage change from
25°C to +125°C or -55°C.
NOTE 6: Output current should not change during conversion.
NOTE 7: Timing Specifications are 100% tested. All input control signals are specified with tR=tF=5ns
(10% to 90% of +5V) and timed from a voltage level of +1.6V. Output delays are measured to
0.8V if going low and 2.4V if going high.
NOTE 8: DATA pin is loaded with 50pF to GND.
NOTE 9: DATA pin is loaded with 10pF 3kΩ. Defined as the time required for data lines to change 0.5V.
TERMINAL CONNECTIONS:
20 PIN LCC
1
2
3
VDD
VDD
NC
Positive Supply, +5V
Positive Supply, +5V
No Connect
4
NC
No Connect
5
6
7
AIN
VREF
NC
Analog Input, 0V to +5V Unipolar
Reference Voltage Output, -5.0V
No Connect
8
NC
No Connect
9
GND
GND
GND
DATA
NC
NC
NC
CLOCK
CONVST
Ground
Ground
Ground
Serial Data Output
No Connect
No Connect
No Connect
Clock Input, TTL/+5V CMOS compatible.
Conversion start input for three wire mode.
End-of-conversion output for two wire mode.
No Connect
10
11
12
13
14
15
16
17
18
19
20
NC
NC
VSS
No Connect
Negative Supply, -12V or -15V.
----------------------------
Electrical Characteristics of MAX176/883B
19-0293
Page 4 of
Rev. B
6
TERMINAL CONNECTIONS:
8 PIN CERDIP
1
2
3
4
5
6
7
VDD
AIN
VREF
GND
DATA
CLOCK
CONVST
Positive Supply, +5V
Analog Input, 0V to +5V Unipolar
Reference Voltage Output, -5.0V
Ground
Serial Data Output
Clock Input, TTL/+5V CMOS compatible.
Conversion start input for three wire mode.
End-of-conversion output for two wire mode.
Negative Supply, -12V or -15V.
8
VSS
Package
ORDERING INFORMATION:
8 pin CERDIP
20 pin LCC
MAX176AMJA/883B
MAX176AMLP/883B
MAX176BMJA/883B
MAX176BMLP/883B
QUALITY ASSURANCE
Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil-
Std-883.
Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015:
1. Test Condition, A, B, C, or D.
2. TA = +125°C minimum.
3. Interim and final electrical test requirements shall be specified in Table 2.
Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B,
C, and D inspection.
Group A inspection:
1. Tests as specified in Table 2.
2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.
Group C and D inspections:
a. End-point electrical parameters shall be specified in Table 1.
b. Steady-state life test, Method 1005 of Mil-Std-883:
1. Test condition A, B, C, D.
2. TA = +125°C, minimum.
3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.
TABLE 2.
ELECTRICAL TEST REQUIREMENTS
Mil-Std-883 Test Requirements
Subgroups
per Method 5005, Table 1
Interim Electric Parameters
Method 5004
1
Final Electrical Parameters
Method 5005
Group A Test Requirements
Method 5005
1*, 2, 3, 4*, 9, 10, 11
1, 2, 3, 4*, 9, 10, 11
1
Group C and D End-Point Electrical Parameters
Method 5005
*
PDA applies to Subgroup 1 only.
** Guaranteed by design.
----------------------------
Electrical Characteristics of MAX176/883B
19-0293
Page 5 of
Rev. B
6
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