5962-89657013C [MAXIM]
D/A Converter, 1 Func, Parallel, Word Input Loading, CQCC28, CERAMIC, LCC-28;
| 型号： | 5962-89657013C |
| 厂家： | 
MAXIM INTEGRATED PRODUCTS |
| 描述： | D/A Converter, 1 Func, Parallel, Word Input Loading, CQCC28, CERAMIC, LCC-28 |
| 文件： | 总5页 (文件大小：31K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
SCOPE: CMOS, PARALLEL-LOADING, DUAL, MULTIPLYING 12-BIT D/A CONVERTER
Device Type
Generic Number
MX7537U(x)/883B
MX7537T(x)/883B
MX7537S(x)/883B
MX7547U(x)/883B
MX7547T(x)/883B
MX7547S(x)/883B
01
02
03
04
05
06
Case Outline(s). The case outlines shall be designated in Mil-Std-1835 and as follows:
Outline Letter
Mil-Std-1835
Case Outline
Package Code
MAXIM SMD
Q
E
L
3
GDIP1-T24 or CDIP2-T24
CQCC1-N28
24 LEAD CERDIP
28 LEADLESS CHIP L28
J24
Absolute Maximum Ratings:
VDD to DGND ........................................................................................………. -0.3V, + 17V
VRFBA, VRFBB to AGND .......................................................................................………. ±25V
VREFA, VREFB to AGND .......................................................................................………. ±25V
Digital Input Voltage to DGND .....................................................……… -0.3V, (VDD+0.3V)
IOUTA, IOUTB Voltage to DGND ...............................................…….... -0.3V, (VDD+0.3V)
AGND to DGND ............................................................................…….... -0.3V, (VDD+0.3V)
Lead Temperature (soldering, 10 seconds) ........................................................................ +300°C
Storage Temperature ........................................................................................... -65°C to +150°C
Continuous Power Dissipation ..........................................................................……... TA=+70°C
24 pin CERDIP(derate 12.5mW/°C above +70°C) ...............................................…….. 1000mW
28 pin LCC(derate 10.2mW/°C above +70°C) .......................................................…….. 816mW
Junction Temperature TJ .....................................................................................…….... +150°C
Thermal Resistance, Junction to Case, ΘJC
24 pin CERDIP................................................................................................…….... 40°C/W
28 pin LCC .....................................................................................................……..... 15°C/W
Thermal Resistance, Junction to Ambient, ΘJA:
24 pin CERDIP................................................................................................…….... 80°C/W
28 pin LCC .....................................................................................................………. 98°C/W
Recommended Operating Conditions
Ambient Operating Range (TA) ............................................................……... -55°C to +125°C
Logic Supply Voltage (VLOGIC) ................................................................……... +4.5V to +5.5V
Positive Supply Voltage (VDD)..............................................................……... +11.4V to +16.5V
Negative Supply Voltage (VEE)...............................................................……... -11.4V to -16.5V
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
----------------------- Electrical Characteristics of MX7537/47/883B for /883B
and SMD 5962-87763 and SMD 5962-89657
19-0057
Page 2 of
Rev. C
7
TABLE 1. ELECTRICAL TESTS:
CONDITIONS
-55 °C <=TA<= +125°C 1/
Unless otherwise specified
Group A
Subgroup type
Device
Limits Limits Units
Min Max
TEST
ACCURACY
Symbol
All
Resolution
RES
RA
1,2,3
1,2,3
12.0
Bits
1,2,4,5
3,6
Relative Accuracy
VDD=+10.8V and VDD=+16.5V
LSB
±0.5
V
DD=10.8V (MX7547 only)
±1.0
±1.0
±2.0
±3.0
±6.0
All
Differential Nonlinearity
Gain Error
DNL
AE
Guaranteed monotonic
Measured using RFBA, RFBB; DAC
registers loaded with all 1’s,
1,2,3
1,2,3
LSB
LSB
1,4
2,5
3,6
V
DD=10.8V
All
Gain Tempco
∆Gain/∆Temperature
NOTE 2
Output Leakage Current
IOUTA, IOUTB
TCFS
ILKG
4
±5.0 ppm/°C
All
All
VDD=+16.5V, DAC registers
loaded with all 0s
1,3
2
nA
±10
±250
20
VREFA, VREFB Input
Leakage
VREFA, VREFB Input
Resistance Match
RREF
∆RREF
VIH
VDD=+10.8V
1,2,3
1,2,3
1,2,3
1,2,3
9
kΩ
%
V
V
DD=+10.8V
1,4
2,3,5,6
All
±1.0
±3.0
Digital Input High
Voltage
Digital Input Low
Voltage
Digital Input Leakage
Current
VDD=+10.8V and VDD=+16.5V
VDD=+10.8V and VDD=+16.5V
VIN=+0V or 16.5V
2.4
All
All
VIL
0.8
V
IIN
1,3
2
±1.0 µA
±10
All
All
Digital Input Capacitance CIN
4
1,2,3
1,2,3
10 pF
Supply Voltage
Supply Current
Current Settling Time
VDD
IDD
tSL
Operating range, VDD=16.5V
10.8
16.5
V
All
2.0 mA
4,5,6
9,10,11
4
1.5
1.5
To 0.5 LSB, IOUT load =100Ω,
CEXT=13pF, DAC output
measured from falling edge of WR
To 0.5 LSB, IOUT load =100Ω,
CEXT=13pF, DAC output
measured from rising edge of WR
µs
µs
___
1,2,3
4,5,6
Current Settling Time
tSL
___
VREFA
to IOUTA
Feedthrough
Error
DAC
registers
loaded
VREFA=20Vp-p
10kHz sine wave,
VREFB=0V
FTE
with all 0s
4,5,6
(SMD)
-70
-70
-65 dB
(SMD)
VREFB
to IOUTB
NOTE 2
VREFB=20Vp-p
10kHz sine wave,
VREFA=0V
VREFA
DAC
registers
loaded
VREFA=20Vp-p
10kHz sine wave,
VREFB=0V
to IOUTA
Feedthrough
Error
FTE
1,2,3
with all 0s
4
-65 dB
(SMD)
VREFB
to IOUTB
NOTE 2
VREFB=20Vp-p
10kHz sine wave,
VREFA=0V
(SMD)
----------------------- Electrical Characteristics of MX7537/47/883B for /883B
and SMD 5962-87763 and SMD 5962-89657
19-0057
Page 3 of
Rev. C
7
CONDITIONS
-55 °C <=TA<= +125°C 1/
Unless otherwise specified
Group A
Subgroup
Device
type
Limits
Min
Limits Units
Max
TEST
Symbol
01,02,03
Power-Supply
Rejection Ratio
PSRR
1
2,3
V
DD=10.8V, ∆VDD=12V±5%
±0.01
±0.02
%/%
1
2,3
V
V
DD=10.8V, ∆VDD=VDD MAX -
DD MIN
±0.01
±0.02
-70 dB
All
All
Output Capacitance
(IOUTA, IOUTB)
COUT
DAC A, DAC B loaded with 0s
4
4
DAC A, DAC B loaded with 1s
VREFA=20Vp-p, 10kHz sine
to IOUTA wave, VREFB=0V
140
dB
VREFA
All
Channel-to-Channel
Isolation
-84
VREFB to VREFB=20Vp-p, 10kHz sine
IOUTB
wave, VREFA=0V
TIMING
01,02,03
01,02,03
All
Address Valid to
Write-setup Time
Address Valid to
Write-hold Time
Data-setup Time
t1
t2
t3
t4
t5
9
20
30
15
25
60
80
25
0
ns
ns
ns
ns
ns
10,11
9
10,11
9
10,11
9,10,11
9,10,11
All
Data-hold Time
Chip Select or Update
to Write-setup Time
01,02,03
9
80
100
0
04,05,06
All
10,11
9,10,11
Chip Select orUpdate
to Write Hold Time
Write Pulse Width
t6
t7
t8
ns
ns
ns
All
All
9
80
100
80
10,11
9
Clear Pulse Width
10,11
100
NOTE 1: Conditions unless otherwise specified, 4.5V≤VDD≤5.5V. VDD=10.8V to 16.5V, AGND=DGND=0V,
use maximum possible reference voltage.
NOTE 2: Typical number, for design aid only.
MODE SELECTION TABLE:
MX7537
___
CLR
___
UPD
___
CS
1
X
X
0
0
0
0
1
___
WR
X
1
X
0
0
0
0
0
A1
X
X
X
0
A0
X
X
X
0
Function
1
1
0
1
1
1
1
1
1
1
X
1
1
1
1
0
No data transfer
No data transfer
All registers cleared
DAC A LS input register loaded with D7-D0
DAC A MS input register loaded with D3-D0
DAC B LS input register loaded with D7-D0
0
1
1
0
1
X
1
X
DAC B MS input register loaded with D3-D0
DAC A, DAC B registers updated simultaneously from input
registers. Input registers not changed.
1
0
0
0
X
X
DAC A, DAC B registers are transparent. Input registers loaded.
X = Don’t care
----------------------- Electrical Characteristics of MX7537/47/883B for /883B
and SMD 5962-87763 and SMD 5962-89657
19-0057
Page 4 of
Rev. C
7
MODE SELECTION TABLE:
MX7547
___
CSA
X
___
CSB
X
___
WR
1
Function
No data transfer
No data transfer
1
1
X
___
___
0
↑
↑
↑
A rising edge on CSA or CSB transfer data to the respective DAC.
DAC A register loaded from data bus.
DAC B register loaded from data bus.
DAC A and DAC B registers loaded from data bus.
↑
0
1
0
↑
1
0
0
X= don’t care
WR input is edge-triggered.
ORDERING INFORMATION:
Package
Pkg. Code
J24
J24
Device ID
SMD Number
01
02
03
01
02
03
04
05
06
04
05
06
24 pin CERDIP
24 pin CERDIP
24 pin CERDIP
28 pin LCC
28 pin LCC
28 pin LCC
24 pin CERDIP
24 pin CERDIP
24 pin CERDIP
28 pin LCC
28 pin LCC
28 pin LCC
MX7537UQ/883B
MX7537TQ/883B
MX7537SQ/883B
MX7537UE/883B
MX7537TE/883B
MX7537SE/883B
MX7547UQ/883B
MX7547TQ/883B
MX7547SQ/883B
MX7547UE/883B
MX7547TE/883B
MX7547SE/883B
5962-8776303LA
5962-8776302LA
5962-8776301LA
5962-87763033C
5962-87763023C
5962-87763013C
5962-8965703LA
5962-8965702LA
5962-8965701LA
5962-89657033C
5962-89657023C
5962-89657013C
J24
L28
L28
L28
J24
J24
J24
L28
L28
L28
TERMINAL CONNECTIONS:
MX7537
J24
AGNDA
IOUTA
MX7537
L28
NC
AGNDA
IOUTA
MX7547
J24
AGNDA
IOUTA
RFBA
MX7547
L28
NC
AGNDA
IOUTA
MX7537 MX7537 MX7547 MX7547
J24
A0
A1
L28
NC
D6
J24
D8
D9
L28
NC
D6
1
2
3
15
16
17
RFBA
____
CLR
___
WR
___
UPD
VDD
D7
D10
D7
4
5
6
7
VREFA
RFBA
VREFA
RFBA
18
19
20
21
A0
A1
D11
(MSB)
___
D8
__
CS
D0
VREFA
___
CSA
(LSB)D0
VREFA
D9
WR
__
CS
D0
___
CSA
(LSB)D0
____
CLR
___
____
CSB
VDD
D10
D11
D1
D1
VREFB
WR
8
9
D2
D3
NC
D1
D2
D3
NC
D1
22
23
RFBB
IOUTB
NC
___
VREFB
RFBB
NC
___
UPD
WR
10
D4
D2
D4
D2
24
AGNDB VDD
IOUTB
____
CSB
VDD
VREFB
RFBB
IOUTB
11
12
13
14
D5
DGND
D6
D3
D4
D5
DGND
D5
DGND
D6
D3
D4
D5
DGND
25
26
27
28
VREFB
RFBB
IOUTB
D7
D7
AGNDB
----------------------- Electrical Characteristics of MX7537/47/883B for /883B
and SMD 5962-87763 and SMD 5962-89657
19-0057
Page 5 of
Rev. C
7
QUALITY ASSURANCE
Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil-Std-883.
Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015:
1. Test Condition, A, B, C, or D.
2. TA = +125°C minimum.
3. Interim and final electrical test requirements shall be specified in Table 2.
Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B, C, and D inspection.
Group A inspection:
1. Tests as specified in Table 2.
2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.
Group C and D inspections:
a. End-point electrical parameters shall be specified in Table 1.
b. Steady-state life test, Method 1005 of Mil-Std-883:
1. Test condition A, B, C, D.
2. TA = +125°C, minimum.
3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.
TABLE 2.
ELECTRICAL TEST REQUIREMENTS
Mil-Std-883 Test Requirements
Subgroups
per Method 5005, Table 1
Interim Electric Parameters
Method 5004
1
Final Electrical Parameters
Method 5005
1*, 2, 3, 9, 10, 11
Group A Test Requirements
Method 5005
Group C and D End-Point Electrical Parameters
Method 5005
1, 2, 3, 4**, 5**, 6**, 9, 10**, 11**
1
*
PDA applies to Subgroup 1 only.
** If not tested shall be guaranteed to the limits specified in Table 1.
----------------------- Electrical Characteristics of MX7537/47/883B for /883B
and SMD 5962-87763 and SMD 5962-89657
19-0057
Page 6 of
Rev. C
7
相关型号：
5962-8965701LC
DUAL, PARALLEL, WORD INPUT LOADING, 0.8us SETTLING TIME, 12-BIT DAC, CDIP24, 1.280 X 0.300 INCH, CERDIP-24
ADI
5962-89657023B
IC DUAL, PARALLEL, WORD INPUT LOADING, 0.8 us SETTLING TIME, 12-BIT DAC, CQCC28, CERAMIC, LCC-28, Digital to Analog Converter
ADI
5962-89657023C
IC DUAL, PARALLEL, WORD INPUT LOADING, 0.8 us SETTLING TIME, 12-BIT DAC, CQCC28, CERAMIC, LCC-28, Digital to Analog Converter
ADI
5962-8965702LA
DUAL, PARALLEL, WORD INPUT LOADING, 0.8us SETTLING TIME, 12-BIT DAC, CDIP24, CERAMIC, DIP-24
ADI
5962-8965702LB
DUAL, PARALLEL, WORD INPUT LOADING, 0.8us SETTLING TIME, 12-BIT DAC, CDIP24, 1.280 X 0.300 INCH, CERDIP-24
ADI
5962-8965702LC
DUAL, PARALLEL, WORD INPUT LOADING, 0.8us SETTLING TIME, 12-BIT DAC, CDIP24, 1.280 X 0.300 INCH, CERDIP-24
ADI
5962-8965702LX
DUAL, PARALLEL, WORD INPUT LOADING, 0.8 us SETTLING TIME, 12-BIT DAC, CDIP24, 1.280 X 0.310 INCH, CERDIP-24
ROCHESTER
©2020 ICPDF网 联系我们和版权申明