BF904WR_15 [JMNIC]

N-channel dual-gate MOS-FET;
BF904WR_15
型号: BF904WR_15
厂家: QUANZHOU JINMEI ELECTRONIC CO.,LTD.    QUANZHOU JINMEI ELECTRONIC CO.,LTD.
描述:

N-channel dual-gate MOS-FET

文件: 总12页 (文件大小:91K)
中文:  中文翻译
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DISCRETE SEMICONDUCTORS  
DATA SHEET  
BF904WR  
N-channel dual-gate MOS-FET  
1995 Apr 25  
Product specification  
File under Discrete Semiconductors, SC07  
Philips Semiconductors  
Philips Semiconductors  
Product specification  
N-channel dual-gate MOS-FET  
BF904WR  
FEATURES  
PINNING  
PIN  
Specially designed for use at 5 V supply voltage  
SYMBOL  
DESCRIPTION  
Short channel transistor with high forward transfer  
admittance to input capacitance ratio  
1
2
3
4
s, b  
d
source  
drain  
Low noise gain controlled amplifier up to 1 GHz  
g2  
g1  
gate 2  
gate 1  
Superior cross-modulation performance during AGC.  
APPLICATIONS  
VHF and UHF applications with 3 to 7 V supply voltage  
such as television tuners and professional  
communications equipment.  
d
handbook, halfpage  
3
4
DESCRIPTION  
g
2
g
Enhancement type field-effect transistor in a plastic  
microminiature SOT343R package. The transistor  
consists of an amplifier MOS-FET with source and  
substrate interconnected and an internal bias circuit to  
ensure good cross-modulation performance during AGC.  
1
2
1
s,b  
Top view  
MAM192  
CAUTION  
Marking code: MC.  
The device is supplied in an antistatic package. The  
gate-source input must be protected against static  
discharge during transport or handling.  
Fig.1 Simplified outline (SOT343R) and symbol.  
QUICK REFERENCE DATA  
SYMBOL  
VDS  
PARAMETER  
drain-source voltage  
CONDITIONS  
MIN.  
TYP.  
MAX.  
UNIT  
7
V
ID  
drain current  
30  
mA  
mW  
°C  
Ptot  
Tj  
total power dissipation  
operating junction temperature  
forward transfer admittance  
input capacitance at gate 1  
reverse transfer capacitance  
noise figure  
280  
150  
30  
yfs  
22  
25  
2.2  
25  
2
mS  
pF  
Cig1-s  
Crs  
F
2.6  
35  
f = 1 MHz  
fF  
f = 800 MHz  
dB  
1995 Apr 25  
2
Philips Semiconductors  
Product specification  
N-channel dual-gate MOS-FET  
BF904WR  
LIMITING VALUES  
In accordance with the Absolute Maximum Rating System (IEC 134).  
SYMBOL  
VDS  
PARAMETER  
drain-source voltage  
drain current  
CONDITIONS  
MIN.  
MAX.  
UNIT  
7
V
ID  
30  
mA  
mA  
mA  
mW  
IG1  
IG2  
Ptot  
gate 1 current  
±10  
±10  
280  
gate 2 current  
total power dissipation  
up to Tamb = 50 °C; see Fig.2;  
note 1  
Tstg  
Tj  
storage temperature  
65  
+150  
+150  
°C  
°C  
operating junction temperature  
Note  
1. Device mounted on a printed-circuit board.  
MLD150  
300  
handbook, halfpage  
P
tot  
(mW)  
200  
100  
0
0
50  
100  
150  
200  
o
T
( C)  
amb  
Fig.2 Power derating curve.  
1995 Apr 25  
3
Philips Semiconductors  
Product specification  
N-channel dual-gate MOS-FET  
BF904WR  
THERMAL CHARACTERISTICS  
SYMBOL  
PARAMETER  
CONDITIONS  
note 1  
Ts = 91 °C; note 2  
VALUE  
UNIT  
K/W  
K/W  
Rth j-a  
Rth j-s  
thermal resistance from junction to ambient  
thermal resistance from junction to soldering point  
350  
210  
Notes  
1. Device mounted on a printed-circuit board.  
2. Ts is the temperature at the soldering point of the source lead.  
STATIC CHARACTERISTICS  
Tj = 25 °C; unless otherwise specified.  
SYMBOL  
V(BR)G1-SS  
V(BR)G2-SS  
V(F)S-G1  
V(F)S-G2  
VG1-S(th)  
VG2-S(th)  
IDSX  
PARAMETER  
CONDITIONS  
MIN.  
MAX.  
15  
UNIT  
gate 1-source breakdown voltage VG2-S = VDS = 0; IG1-S = 10 mA  
gate 2-source breakdown voltage VG1-S = VDS = 0; IG2-S = 10 mA  
6
6
V
15  
1.5  
1.5  
1
V
forward source-gate 1 voltage  
forward source-gate 2 voltage  
gate 1-source threshold voltage  
gate 2-source threshold voltage  
drain-source current  
VG2-S = VDS = 0; IS-G1 = 10 mA  
VG1-S = VDS = 0; IS-G2 = 10 mA  
VG2-S = 4V; VDS = 5 V; ID = 20 µA  
VG1-S = VDS = 5 V; ID = 20 µA  
0.5  
0.5  
0.3  
0.3  
8
V
V
V
1.2  
13  
V
VG2-S = 4 V; VDS = 5 V; RG1 = 120 k;  
mA  
note 1  
IG1-SS  
IG2-SS  
gate 1 cut-off current  
gate 2 cut-off current  
VG2-S = VDS = 0; VG1-S = 5 V  
VG1-S = VDS = 0; VG2-S = 5 V  
50  
50  
nA  
nA  
Note  
1. RG connects gate 1 to VGG = 5 V.  
DYNAMIC CHARACTERISTICS  
Common source; Tamb = 25 °C; VDS = 5 V; VG2-S = 4 V; ID = 10 mA; unless otherwise specified.  
SYMBOL  
PARAMETER  
CONDITIONS  
MIN.  
22  
TYP.  
25  
MAX.  
UNIT  
yfs  
Cig1-s  
Cig2-s  
Cos  
Crs  
forward transfer admittance pulsed; Tj = 25 °C  
input capacitance at gate 1 f = 1 MHz  
input capacitance at gate 2 f = 1 MHz  
30  
2.6  
2
mS  
pF  
pF  
pF  
fF  
1
1
2.2  
1.5  
1.3  
25  
1
drain-source capacitance  
reverse transfer capacitance f = 1 MHz  
noise figure f = 200 MHz; GS = 2 mS; BS = BSopt  
f = 800 MHz; GS = GSopt; BS = BSopt  
f = 1 MHz  
1.6  
35  
1.5  
2.8  
F
dB  
dB  
2
1995 Apr 25  
4
Philips Semiconductors  
Product specification  
N-channel dual-gate MOS-FET  
BF904WR  
MRA769  
MLD268  
40  
0
handbook, halfpage  
gain  
reduction  
Y
fs  
(dB)  
10  
(mS)  
30  
20  
30  
40  
20  
10  
0
50  
0
1
2
3
4
50  
0
50  
100  
150  
( C)  
o
V
(V)  
T
AGC  
j
f = 50 MHz.  
Tj = 25 °C.  
Fig.3 Forward transfer admittance as a function  
of junction temperature; typical values.  
Fig.4 Typical gain reduction as a function of  
AGC voltage.  
MLD270  
MRA771  
120  
20  
handbook, halfpage  
V
= 4 V  
G2 S  
3 V 2.5 V  
2 V  
V
unw  
(dB µV)  
110  
I
D
(mA)  
15  
100  
90  
10  
5
1.5 V  
1 V  
0
80  
0
10  
20  
30  
40  
50  
0
0.4  
0.8  
1.2  
1.6  
V
2.0  
(V)  
gain reduction (dB)  
G1  
S
VGG = 5 V; fw = 50 MHz.  
funw = 60 MHz; Tamb = 25 °C; RG1 = 120 kΩ.  
VDS = 5 V.  
Tj = 25 °C.  
Fig.5 Unwanted voltage for 1% cross-modulation  
as a function of gain reduction; typical  
values; see Fig.19.  
Fig.6 Transfer characteristics; typical values.  
1995 Apr 25  
5
Philips Semiconductors  
Product specification  
N-channel dual-gate MOS-FET  
BF904WR  
MLD269  
MLD271  
20  
150  
handbook, halfpage  
handbook, halfpage  
V
= 1.4 V  
S
V
= 4 V  
G2 S  
I
G1  
D
I
3.5 V  
(mA)  
G1  
16  
(µA)  
1.3 V  
3 V  
100  
1.2 V  
1.1 V  
12  
8
2.5 V  
2 V  
1.0 V  
0.9 V  
50  
4
0
0
0
0
2
4
6
8
10  
(V)  
0.5  
1.0  
1.5  
2.0  
2.5  
(V)  
V
V
G1  
DS  
S
VDS = 5 V.  
VG2-S = 4 V.  
Tj = 25 °C.  
Tj = 25 °C.  
Fig.8 Gate 1 current as a function of gate 1  
voltage; typical values.  
Fig.7 Output characteristics; typical values.  
MLD272  
MLD273  
16  
40  
handbook, halfpage  
handbook, halfpage  
I
y
D
fs  
(mS)  
(mA)  
V
= 4 V  
S
G2  
12  
30  
3.5 V  
3 V  
8
4
0
20  
2.5 V  
10  
0
2 V  
0
10  
20  
30  
40  
50  
(µA)  
0
4
8
12  
16  
20  
(mA)  
I
I
G1  
D
VDS = 5 V.  
VDS = 5 V; VG2-S = 4 V.  
Tj = 25 °C.  
Tj = 25 °C.  
Fig.9 Forward transfer admittance as a  
function of drain current; typical values.  
Fig.10 Drain current as a function of gate 1 current;  
typical values.  
1995 Apr 25  
6
Philips Semiconductors  
Product specification  
N-channel dual-gate MOS-FET  
BF904WR  
MLD275  
MLD274  
12  
20  
handbook, halfpage  
handbook, halfpage  
R
= 47 k68 kΩ  
G1  
I
D
I
D
82 kΩ  
(mA)  
(mA)  
15  
100 kΩ  
120 kΩ  
150 kΩ  
8
10  
5
180 kΩ  
220 kΩ  
4
0
0
0
0
1
2
3
4
5
2
4
6
8
V
(V)  
V
= V  
(V)  
DS  
GG  
GG  
VDS = 5 V; VG2-S = 4 V.  
G1 = 120 k(connected to VGG); Tj = 25 °C.  
VG2-S = 4 V.  
R
RG1 connected to VGG; Tj = 25 °C.  
Fig.11 Drain current as a function of gate 1  
supply voltage (= VGG); typical values;  
see Fig.19.  
Fig.12 Drain current as a function of gate 1  
(= VGG) and drain supply voltage;  
typical values; see Fig.19.  
MLD276  
MLB945  
12  
40  
handbook, halfpage  
handbook, halfpage  
V
= 5 V  
4.5 V  
GG  
I
G1  
(µA)  
I
D
V
= 5 V  
GG  
4 V  
(mA)  
30  
3.5 V  
3 V  
4.5 V  
8
4 V  
3.5 V  
3 V  
20  
10  
4
0
0
0
0
2
4
6
2
4
6
V
(V)  
S
V
(V)  
S
G2  
G2  
VDS = 5 V; Tj = 25 °C.  
VDS = 5 V; Tj = 25 °C.  
RG = 120 k(connected to VGG).  
RG = 120 k(connected to VGG).  
Fig.13 Drain current as a function of gate 2 voltage;  
typical values; see Fig.19.  
Fig.14 Gate 1 current as a function of gate 2  
voltage; typical values; see Fig.19.  
1995 Apr 25  
7
Philips Semiconductors  
Product specification  
N-channel dual-gate MOS-FET  
BF904WR  
MLD277  
MLD278  
2
10  
3
2
3
10  
rs  
10  
handbook, halfpage  
y
y
ϕ
is  
(mS)  
rs  
(deg)  
(µS)  
ϕ
rs  
2
10  
10  
10  
y
rs  
b
is  
1
10  
10  
g
is  
1
1
3
10  
1
2
3
2
10  
10  
10  
10  
10  
10  
f (MHz)  
f (MHz)  
VDS = 5 V; VG2 = 4 V.  
VDS = 5 V; VG2 = 4 V.  
ID =10 mA; Tamb = 25 °C.  
ID = 10 mA; Tamb = 25 °C.  
Fig.15 Input admittance as a function of frequency;  
typical values.  
Fig.16 Reverse transfer admittance and phase as  
a function of frequency; typical values.  
MLD280  
MLD279  
2
2
10  
fs  
10  
10  
handbook, halfpage  
y
os  
(mS)  
ϕ
y
fs  
y
fs  
fs  
(deg)  
b
g
(mS)  
os  
os  
1
ϕ
10  
10  
1
2
10  
10  
1
1
2
3
2
3
10  
10  
10  
10  
10  
10  
f (MHz)  
f (MHz)  
VDS = 5 V; VG2 = 4 V.  
VDS = 5 V; VG2 = 4 V.  
ID = 10 mA; Tamb = 25 °C.  
ID = 10 mA; Tamb = 25 °C.  
Fig.17 Forward transfer admittance and phase as  
a function of frequency; typical values.  
Fig.18 Output admittance as a function of  
frequency; typical values.  
1995 Apr 25  
8
Philips Semiconductors  
Product specification  
N-channel dual-gate MOS-FET  
BF904WR  
V
AGC  
R1  
10 kΩ  
C1  
4.7 nF  
C3 12 pF  
R
L
L1  
C2  
DUT  
50 Ω  
450 nH  
C4  
4.7 nF  
R
R2  
GEN  
R
G1  
50 Ω  
50Ω  
4.7 nF  
V
I
V
MLD171  
GG  
V
DS  
Fig.19 Cross-modulation test set-up.  
1995 Apr 25  
9
Philips Semiconductors  
Product specification  
N-channel dual-gate MOS-FET  
BF904WR  
Table 1 Scattering parameters: VDS =5 V; VG2-S = 4 V; ID = 10 mA  
s11  
s21  
s12  
s22  
f
MAGNITUDE ANGLE MAGNITUDE ANGLE MAGNITUDE ANGLE MAGNITUDE ANGLE  
(MHz)  
(ratio)  
(deg)  
(ratio)  
(deg)  
(ratio)  
(deg)  
(ratio)  
(deg)  
40  
100  
0.989  
0.985  
0.976  
0.958  
0.942  
0.918  
0.899  
0.876  
0.852  
0.823  
0.800  
0.750  
0.719  
0.682  
0.642  
0.602  
0.547  
0.596  
0.682  
0.771  
0.793  
3.4  
8.3  
2.420  
2.414  
2.368  
2.301  
2.251  
2.170  
2.080  
2.001  
1.924  
1.829  
1.747  
1.621  
1.535  
1.424  
1.349  
1.283  
1.130  
1.018  
0.979  
0.804  
0.541  
175.7  
169.1  
158.8  
148.5  
138.8  
129.5  
120.7  
112.1  
103.2  
94.7  
0.000  
0.001  
0.003  
0.004  
0.005  
0.005  
0.005  
0.005  
0.005  
0.005  
0.005  
0.005  
0.008  
0.010  
0.013  
0.018  
0.014  
0.040  
0.077  
0.120  
0.149  
79.9  
78.3  
0.993  
0.992  
0.987  
0.980  
0.974  
0.966  
0.958  
0.951  
0.944  
0.937  
0.933  
0.928  
0.930  
0.924  
0.928  
0.928  
0.887  
0.837  
0.778  
0.629  
0.479  
1.6  
3.9  
200  
16.4  
24.1  
32.0  
39.3  
46.0  
52.6  
58.8  
64.9  
70.9  
82.4  
92.7  
102.5  
109.8  
116.5  
124.9  
128.7  
132.6  
142.5  
157.5  
80.3  
7.8  
300  
73.7  
11.4  
15.2  
18.7  
22.2  
25.5  
28.9  
32.1  
35.2  
41.7  
48.4  
54.9  
62.9  
73.1  
81.0  
95.8  
109.6  
119.5  
119.9  
400  
70.7  
500  
67.2  
600  
67.8  
700  
68.6  
800  
72.9  
900  
78.7  
1000  
1200  
1400  
1600  
1800  
2000  
2200  
2400  
2600  
2800  
3000  
86.5  
88.3  
70.7  
120.5  
139.8  
137.8  
156.8  
175.1  
172.6  
163.9  
164.0  
178.8  
158.3  
54.6  
39.4  
22.5  
1.1  
15.1  
49.1  
79.4  
116.2  
153.5  
Table 2 Noise data: VDS = 5 V; VG2-S = 4 V; ID = 10 mA  
Γopt  
f
Fmin  
(dB)  
rn  
50.40  
(MHz)  
(ratio)  
(deg)  
49.6  
800  
2.00  
.686  
1995 Apr 25  
10  
Philips Semiconductors  
Product specification  
N-channel dual-gate MOS-FET  
BF904WR  
PACKAGE OUTLINE  
1.00  
max  
0.1  
max  
0.4  
0.2  
0.2  
A
0.2  
B
M
M
0.2  
3
4
A
1.35  
1.15  
2.2  
2.0  
0.3  
0.1  
2
1
0.25  
0.10  
0.7  
0.5  
1.4  
1.2  
2.2  
1.8  
B
MSB367  
Dimensions in mm.  
Fig.20 SOT343R.  
1995 Apr 25  
11  
Philips Semiconductors  
Product specification  
N-channel dual-gate MOS-FET  
BF904WR  
DEFINITIONS  
Data Sheet Status  
Objective specification  
Preliminary specification  
Product specification  
This data sheet contains target or goal specifications for product development.  
This data sheet contains preliminary data; supplementary data may be published later.  
This data sheet contains final product specifications.  
Limiting values  
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or  
more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation  
of the device at these or at any other conditions above those given in the Characteristics sections of the specification  
is not implied. Exposure to limiting values for extended periods may affect device reliability.  
Application information  
Where application information is given, it is advisory and does not form part of the specification.  
LIFE SUPPORT APPLICATIONS  
These products are not designed for use in life support appliances, devices, or systems where malfunction of these  
products can reasonably be expected to result in personal injury. Philips customers using or selling these products for  
use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such  
improper use or sale.  
1995 Apr 25  
12  

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