ISL6444CA [INTERSIL]
Dual PWM Controller with DDR Memory Option for Gateway Applications; 双PWM控制器, DDR内存选项为网关应用型号: | ISL6444CA |
厂家: | Intersil |
描述: | Dual PWM Controller with DDR Memory Option for Gateway Applications |
文件: | 总18页 (文件大小:438K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
ISL6444
®
Data Sheet
May 2002
FN9069.1
Dual PWM Controller with DDR Memory
Option for Gateway Applications
Features
• Provides regulated output voltage in the range 0.9V–5.5V
- High efficiency over wide load range
The ISL6444 PWM controller provides high efficiency and
regulation for two output voltages adjustable in the range from
0.9V to 5.5V that are required to power I/O, chip-sets, and
memory banks in high-performance notebook computers,
PDAs, and Internet appliances.
- Synchronous buck converter with hysteretic operation at
light load
• Complete DDR memory power solution
- VTT tracks VDDQ/2
- VDDQ/2 buffered reference output
• No current-sense resistor required
Synchronous rectification and hysteretic operation at light
loads contribute to a high efficiency over a wide range of
loads. The hysteretic mode of operation can be disabled
separately on each PWM converter if continuous conduction
operation is desired for all load levels. Efficiency is even
- Uses MOSFET’s R
DS(ON)
- Optional current-sense resistor for precision overcurrent
• Undervoltage lock-out on VCC pin
• Dual mode operation
further enhanced by using MOSFET’s R
sense component.
as a current
DS(ON)
- Operates directly from battery 5.0-24V input
- Operates from 3.3V or 5V system rail
• Excellent dynamic response
Feed-forward ramp modulation, current mode control
scheme, and internal feed-back compensation provide fast
response to load transients. Out-of-phase operation with a
180o phase shift reduces the input current ripple.
- Combined voltage feed-forward and current mode
control
• Power-good signal for each channel
• 300kHz switching frequency
The controller can be transformed in a complete DDR
memory power supply solution by activating a DDR pin. In
DDR mode of operation one of the channels tracks the
output voltage of another channel and provides output
current sink and source capability–features essential for
proper powering of DDR chips. The buffered reference
voltage required by this type of memory is also provided.
- Out-of-phase operation for reduced input ripple
- In-phase operation in DDR mode for reduced channel
interference
- Out-of-phase operation with 90o phase shift for two-
stage conversion in DDR mode
Applications
The ISL6444 monitors the output voltages. Each PWM
controller generates a PGOOD (power good) signal when
the soft-start is completed and the output is within ±10% of
the set point.
•
Residential and Enterprise Gateways
• DSL Modems
• Routers and Switchers
A built-in overvoltage protection prevents output voltage
from going above 115% of the set point. Normal operation
automatically restores when the overvoltage conditions go
away. Undervoltage protection latches the chip off when
either output drops below 75% of its set value after the soft-
start sequence for this output is completed. An adjustable
overcurrent function monitors the output current by sensing
the voltage drop across the lower MOSFET. If precision
current-sensing is required, an external current-sense
resistor may optionally be used.
Pinout
ISL6444 (SSOP-28)
VCC
1
2
3
4
5
6
7
8
GND
LGATE1
PGND1
28
27
26
25
24
23
22
LGATE2
PGND2
PHASE2
UGATE2
PHASE1
UGATE1
BOOT1
BOOT2
ISEN2
EN2
ISEN1
EN1
The IC comes in a 28 lead SSOP package.
21
VOUT2
VSEN2
20
19
18
17
16
9
VOUT1
VSEN1
Ordering Information
10
o
PART NUMBER
TEMP. ( C)
PACKAGE
PKG. NO.
M28.15
OCSET2
SOFT2
OCSET1 11
12
ISL6444CA
-10 to 85
28 Ld SSOP
SOFT1
PG2/REF
13
14
DDR
VIN
ISL6444CA-T
-10 to 85
28 Ld SSOP
Taped and
Reeled
M28.15
15 PG1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1
1-888-INTERSIL or 321-724-7143 | Intersil (and design) is a registered trademark of Intersil Americas Inc.
Copyright © Intersil Americas Inc. 2002. All Rights Reserved
ISL6444
Generic Application Circuits
+V
IN
=+5V... +24V
Q1
V
OUT1
L1
(+1.8V)
PWM1
OCSET1
Q2
C1
Q3
Q4
V
OUT2
L2
OCSET2
DDR
PWM2
(+1.2V)
C2
ISL6444 APPLICATION CIRCUIT FOR TWO CHANNEL POWER SUPPLY
+5V
+V
IN
+5V...24V
Q1
V
OUT1
DDR
VDDQ
(+2.5V)
L1
OCSET1
PWM1
Q2
C1
R
R
OCSET2
Q3
Q4
V
VTT
(+1.25V)
V
OUT2
OUT3
L2
DDR REF
(+1.25V)
PWM2
C2
PGOOD2/REF
ISL6444 APPLICATION CIRCUIT FOR COMPLETE DDR MEMORY POWER SUPPLY
2
ISL6444
Absolute Maximum Ratings
Thermal Information
o
Bias Voltage, V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .+ 6.5V
cc
Thermal Resistance (Typical, Note 1)
θJA ( C/W)
Input Voltage, V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +27.0V
PHASE, BOOT, ISEN, UGATE . . . . . . . . . . . . . GND-0.3V to +33.0V
BOOT with respect to PHASE . . . . . . . . . . . . . . . . . . . . . . . . . .+ 6.5V
in
SSOP Package . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Maximum Junction Temperature (Plastic Package) . . . . . . . .150 C
Maximum Storage Temperature Range . . . . . . . . . -65 C to 150 C
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . .300 C
78
o
o
o
o
All Other Pins. . . . . . . . . . . . . . . . . . . . . . . GND -0.3V to V + 0.3V
cc
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 2
(SSOP - Lead Tips Only)
Recommended Operating Conditions
Bias Voltage, V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +5.0V ±5%
cc
Input Voltage, V . . . . . . . . . . . . . . . . . . . . . . . . . . . +5.0V to +24.0V
in
o
o
Ambient Temperature Range. . . . . . . . . . . . . . . . . . . -10 C to 85 C
Junction Temperature Range . . . . . . . . . . . . . . . . . -10 C to 125 C
o
o
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. θ is measured with the component mounted on a high effective thermal conductivity test board in free air. See Tech Brief TB379 for details.
JA
Electrical Specifications Recommended Operating Conditions, Unless Otherwise Noted.
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNITS
VCC SUPPLY
Bias Current
I
LGATEx, UGATEx Open, VSENx forced above
regulation point, DDR=0, VIN>5V
-
-
2.2
-
3.2
30
mA
CC
Shut-down Current
VCC UVLO
I
µA
CCSN
Rising Vcc Threshold
Falling Vcc Threshold
VIN
V
4.3
4.1
4.65
4.35
4.75
4.45
V
V
CCU
CCD
V
Input Voltage Pin Current (Sink)
Input Voltage Pin Current (Source)
Shut-down Current
OSCILLATOR
I
10
-
-
-15
-
30
-30
1
µA
µA
µA
VIN
I
VINO
I
-
VINS
PWM1 Oscillator Frequency
Ramp Amplitude, pk-pk
Ramp Amplitude, pk-pk
Ramp Offset
F
255
300
2
345
kHz
V
c
V
V
Vin= 16V, by design
Vin= 5V, by design
By design
-
-
-
-
-
-
-
-
-
-
R1
R2
1.25
0.5
125
250
V
V
V
ROFF
Ramp/V Gain
IN
G
Vin≥ 3V, by design
1 ≤ Vin ≤ 3V, by design
mV/V
mV/V
RB1
RB2
Ramp/V Gain
IN
G
REFERENCE AND SOFT START
Internal Reference Voltage
Reference Voltage Accuracy
Soft-Start Current During Start-up
Soft-Start Complete Threshold
PWM CONVERTERS
V
-
-1.0
-
0.9
-
-
+1.0
-
V
%
µA
V
REF
I
-5
SOFT
V
By design
1.5
ST
Load Regulation
0.0mA < I
By design
< 5.0A; 5.0V < V
BATT
< 24.0V -2.0
-
+2.0
120
65
%
nA
VOUT1
VSEN pin bias current
I
50
40
80
55
VSEN
VOUT pin input impedance
I
VOUT = 5V
kOhm
VOUT
3
ISL6444
Electrical Specifications Recommended Operating Conditions, Unless Otherwise Noted. (Continued)
PARAMETER
Undervoltage Shut-Down Level
Overvoltage Shut-Down
SYMBOL
TEST CONDITIONS
MIN
70
TYP
MAX
85
UNITS
%
V
Fraction of the set point; ~2µs noise filter
Fraction of the set point; ~2µs noise filter
UVL
V
110
-
130
%
OVP1
GATE DRIVERS
Upper Drive Pull-Up Resistance
Upper Drive Pull-Down Resistance
Lower Drive Pull-Up Resistance
Lower Drive Pull-Down Resistance
POWER GOOD AND CONTROL FUNCTIONS
Power Good Lower Threshold
Power Good Higher Threshold
R
R
V
V
V
V
=4.5V
=4.5V
=4.5V
=4.5V
-
-
-
-
8
15
5
Ω
Ω
Ω
Ω
2UGPUP
CC
CC
CC
CC
3.2
8
2UGPDN
R
R
15
3
2LGPUP
1.8
2LGPDN
V
Fraction of the set point; ~3µs noise filter
-13
12
-
-
-7
%
%
PG-
V
Fraction of the set point; ~3µs noise filter.
16
PG+
Guaranteed by design.
PGOODx Leakage Current
PGOODx Voltage Low
EN - Low (Off)
I
V
= 5.5V
-
-
1
0.85
0.8
-
µA
V
PGLKG
PULLUP
= -4mA
PGOOD
V
I
-
-
0.5
PGOOD
-
-
-
V
EN - High (On)
2.5
-
V
CCM Enforced (Hysteretic Operation
Inhibited)
VOUTX pulled low
0.1
V
Automatic CCM/Hysteretic Operation Enabled
DDR - Low (Off)
VOUTX connected to the output
0.9
-
-
-
-
-
0.8
-
V
V
V
V
DDR - High (On)
2.5
DDR REF Output Voltage
V
DDR=1, I
=0...10mA
0.99*
V
1.01*
DDREF
REF
OC2
10
V
V
OC2
-
OC2
16
DDR REF Output Current
I
DDR=1. Guaranteed by design.
mΑ
DDREF
4
Block Diagram
BOOT1
BOOT2
UGATE2
PHASE2
SOFT1 EN1 EN2 SOFT2
UGATE1
PHASE1
UG1
OVP1
UG2
OVP2
HI
HI
REFERENCE
AND
SOFT START
GATE
CONTROL
GATE
CONTROL
GATE LOGIC
GATE LOGIC
VCC
VCC
LG1
LG2
LGATE1
LGATE2
PGND2
SDWN2
SDWN1
REF=0.9V
LO
LO
OVP1
OVP2
PGND1
MODE CHANGE COMP 1
HYST COMP 1
MODE CHANGE COMP 2
HYST COMP 2
-
-
-
-
EA1
EA2
VSEN1
VREF
VSEN2
ISEN2
-
-
-
-
Σ
Σ
S2e
LGATE1
LGATE2
LGATE1
CSA1
LGATE2
CSA2
OC COMP1
-
OC COMP2
-
ISEN1
-
-
OC LOGIC1
OC LOGIC2
VSEN1
OVP2VSEN2
OVP1
1.24V
S1
1.24V
OUTPUT
VOLTAGE
MONITOR
OUTPUT
VOLTAGE
MONITOR
S2a
o
ϕ=90
-
VCC
GND
RAMP 1
RAMP 2
CLK
o
o
ϕ=180
ϕ=0
S2c
S2d
S2b
VCC
OCSET1
DDR
OCSET2
PG1
PG2/REF
VIN
ISL6444
SOFT1, SOFT2 (Pin 12, 17)
Functional Pin Description
These pins provide soft-start function for their respective
controllers. When the chip is enabled, the regulated 5µA
pull-up current source charges the capacitor connected from
the pin to ground. The output voltage of the converter follows
the ramping voltage on the SOFT pin.
GND (Pin 1)
Signal ground for the IC.
LGATE1, LGATE2 (Pin 2, 27)
These are outputs of the lower MOSFET drivers.
DDR (Pin 13)
PGND1, PGND2 (Pin 3, 26)
This pin, when high, transforms dual channel chip into
complete DDR memory solution. The OCSET2 pin becomes
an input to provide the required tracking function. The
channel synchronization is changed from out-of-phase to in-
phase. The PG2/REF pin becomes the output of the
VDDQ/2 buffered voltage that is used as a reference voltage
by the second channel.
These pins provide the return connection for lower gate
drivers. These pins are connected to sources of the lower
MOSFETs of their respective converters.
PHASE1, PHASE2 (Pin 4, 25)
The PHASE1 and PHASE2 points are the junction points of
the upper MOSFET sources, output filter inductors, and
lower MOSFET drains. Connect these pins to the respective
converter’s upper MOSFET source.
VIN (Pin 14)
Provides battery voltage to the oscillator for feed-forward
rejection of the input voltage variation.
UGATE1, UGATE2 (Pin 5, 24)
These pins provide the gate drive for the upper MOSFETs.
When connected to ground via 100kΩ resistor while the
DDR pin is high, this pin commands the out-of-phase 90o
channels synchronization for reduces inter-channel
interference.
BOOT1, BOOT2 (Pin 6, 23)
These pins power the upper MOSFET drivers of the PWM
converter. Connect this pin to the junction of the bootstrap
capacitor with the cathode of the bootstrap diode. Anode of
the bootstrap diode is connected to the VCC pin.
PG1 (Pin 15)
PGOOD1 is an open drain output used to indicate the status
of the output voltage. This pin is pulled low when the first
channel output is not within ±10% of the set value.
ISEN1, ISEN2 (Pin 7, 22)
These pins are used to monitor the voltage drop across the
lower MOSFET for current feedback and overcurrent
protection. For precise current detection these inputs can be
connected to the optional current sense resistors placed in
series with the source of the lower MOSFETs.
PG2/REF (Pin 16)
This pin has a double function depending on the mode the
chip is operating. When the chip is used as a dual channel
PWM controller (DDR=0), the pin provides a PGOOD2
function for the second channel. The pin is pulled low when
the second channel output is not within ±10% of the set value.
EN1, EN2 (Pin 8, 21)
These pins enable operation of the respective converter
when high. When both pins are low, the chip is disabled and
only low leakage current <1uA is taken from Vcc and Vin.
In DDR mode (DDR=1), this pin serves as an output of the
buffer amplifier that provides VDDQ/2 reference voltage
applied to the OCSET2 pin.
VOUT1, VOUT2 (Pin 9, 20)
OCSET2 (Pin 18)
These pins when connected to the converters’ respective
outputs provide the output voltage inside the chip to reduce
output voltage excursion during HYS/PWM transition. When
connected to ground, the se pins command forced
converters operate in continuous conduction mode at all
load levels.
In a dual channel application (DDR=0), a resistor from this
pin to ground sets the over current threshold for the second
controller.
In the DDR application (DDR=1), this pin sets the output
voltage of the buffer amplifier and the second controller and
should be connected to the center point of a divider from the
VDDQ output.
VSEN1, VSEN2 (Pin 10, 19)
These pins are connected to the resistive dividers that set
the desired output voltage. The PGOOD, UVP, and OVP
circuits use this signal to report output voltage status.
VCC (Pin 28)
This pin powers the controller.
OCSET1 (Pin 11)
A resistor from this pin to ground sets the over current
threshold for the first controller.
6
ISL6444
1.5V, the power good (PGOOD), the mode control, and the
fault functions are enabled, as depicted in Figure 1.
Description
Operation
The ISL6444 is a dual channel PWM controller intended for
use in power supplies for graphic chipset, SDRAM, DDR
DRAM or other low voltage power applications in modern
notebook and sub-notebook PCs. The IC integrates two
control circuits for two synchronous buck converters. The
output voltage of each controller can be set in the range of
0.9V to 5.5V by an external resistive divider. Out-of-phase
operation with 180 degree phase shift reduces input current
ripple.
EN
1
1.5V
0.9V
SOFT
2
VOUT
3
PGOOD
4
The synchronous buck converters can operate from either
an unregulated DC source such as a notebook battery with a
voltage ranging from 5.0V to 24V, or from a regulated
system rail of 3.3V or 5V. In either mode of operation the
controller is biased from the +5V source.
Ch1 5.0V
Ch3 1.0V
Ch2 2.0V
Ch4 5.0V
M1.00ms
FIGURE 1. START UP
The controllers operate in the current mode with input
voltage feed-forward for simplified feedback loop
compensation and reduced effect of the input voltage
variation. An integrated feedback loop compensation
dramatically reduces the number of external components.
This completes the soft start sequence. Further rise of pin
voltage does not affect the output voltage. During the soft-
start, the converter always operates in continuous
conduction mode independently of the load level or FCCM
pin potential.
Depending on the load level, converters can operate either
in a fixed-frequency mode or in a hysteretic mode. Switch-
over to the hysteretic mode operation at light loads improves
the converters' efficiency and prolongs battery run time. The
hysteretic mode of operation can be inhibited independently
for each channel if a variable frequency operation is not
desired.
The soft-start time (the time from the moment when EN
becomes high to the moment when PGOOD is reported) is
determined by the following equation.
1.5V × Csoft
T
= ----------------------------------
SOFT
5µA
The time it takes the output voltage to come into regulation
can be obtained from the following equation.
The ISL6444 has a special means to rearrange its internal
architecture into a complete DDR solution. When DDR input
is set high, the second channel can provide the capability to
track the output voltage of the first channel. The buffered
reference voltage required by DDR memory chips is also
provided.
T
= 0.6 × T
SOFT
RISE
Having such a spread between the time when the output
voltage reaches the regulation point and the moment when
PGOOD is reported allows for a fault-safe test mode by
means of an external circuit that clamps the SOFT pin
voltage on the level 0.9V<V
<1.5V.
SOFT
Initialization
Output Voltage Program
The ISL6444 initializes if at least one of the enable pins is
set high. The Power-On Reset (POR) function continually
monitors the bias supply voltage on the VCC pin and initiates
soft-start operation after the input supply voltage exceeds
4.5V. Should this voltage drop lower than 4.0V, the POR
disables the chip.
The output voltage of either channel is set by a resistive divider
from the output to ground. The center point of the divider is
connected to VSEN pin as shown in Figure 2. The output
voltage value is determined by the following equation.
0.9V • (R1 + R2)
V
= ---------------------------------------------
O
R2
Soft-Start
Where 0.9V is the value of the internal reference. The VSEN
pin voltage is also used by the controller for the power good
function and to detect undervoltage and overvoltage
conditions.
When soft start is initiated, the voltage on the SOFT pin of
the enabled channel starts to ramp gradually due to the 5µA
current sourced into the external soft-start capacitor. The
output voltage starts to follow the soft-start voltage.
Automatic Operation Mode Control
When the SOFT pin voltage reaches a level of 0.9V, the
output voltage comes into regulation while the soft-start pin
voltage continues to rise. When the SOFT voltage reaches
In nominal currents the synchronous buck converter
operates in continuous-conduction constant-frequency
mode. This mode of operation achieves higher efficiency
due to the substantially lower voltage drop across the
7
ISL6444
synchronous MOSFET compared to a Shottky diode. In
contrast, continuous-conduction operation in load currents
lower than the inductor critical value results in lower
efficiency. In this case, during a fraction of a switching cycle,
the direction of the inductor current changes to the opposite
actively discharging the output filter capacitor.
Hysteretic Operation
When the critical inductor current is detected, the converter
enters hysteretic mode. The PWM comparator and the error
amplifier that provided control in the CCM mode are inhibited
and the hysteretic comparator is now activated. A change is
also made to the gate logic. In hysteretic mode the
synchronous rectifier MOSFET is controlled in diode
emulation mode, hence conduction in the second quadrant
is prohibited.
Vin
Q1
L1
UGATE
ISEN
R
CS
VOUT
t
C1
Cz
Q2
R1
R2
LGATE
VOUT
VSEN
IIND
t
PHASE
OCSET
R
COMP
ISL6444
OC
t
1
2 3 4 5 6 7 8
Hysteretic
MODE
PWM
FIGURE 2. OUTPUT VOLTAGE PROGRAM
OF
t
OPERATION
To maintain the output voltage in regulation, the discharged
energy should be restored during the consequent cycle of
operation by the cost of increased circulating current and
losses associated with it.
FIGURE 3. CCM -- HYSTERETIC TRANSITION
VOUT
IIND
t
The critical value of the inductor current can be estimated by
the following expression.
(V – V ) • V
IN
O
O
I
= --------------------------------------------------
HYS
2 • F
• L • V
O IN
SW
t
1
2
3
4
5
6 7 8
PHASE
COMP
To improve converter efficiency in loads lower than critical,
the switch-over to variable frequency hysteretic operation
with diode emulation is implemented into the PWM scheme.
The switch-over is provided automatically by the mode
control circuit that constantly monitors the inductor current
and alters the way the PWM signal is generated.
t
t
MODE
Hysteretic
PWM
OF
OPERATION
FIGURE 4. HYSTERETIC -- CCM TRANSITION
The voltage across the synchronous MOSFET at the
moment of time just before the upper-MOSFET turns on is
monitored for purposes of mode change. When the
converter operates in currents higher than critical, this
voltage is always positive as shown in Figure 3 and 4. In
currents lower than critical, the voltage is always negative.
The mode control circuit uses a sign of voltage across the
synchronous devices to determine if the load current is
higher or lower than the critical value.
The hysteretic comparator initiates the PWM signal when the
output voltage gets below the lower threshold and
terminates the PWM signal when the output voltage rises
over the upper threshold. A spread or hysteresis between
these two thresholds determines the switching frequency
and the peak value of the inductor current. A transition to a
constant frequency CCM mode will happen when the load
current gets to a level higher than the critical:
∆V
hys
To prevent chatter between operating modes, the circuit
looks for eight sequential matching sign signals before it
makes its decision to perform a mode change. The same
algorithm is true for both CCM-hysteretic and hysteretic-
CCM transitions.
---------------------
≈
I
CCM
2 • ESR
Where, ∆V = 15mV, is a hysteretic comparator window,
hys
ESR is the equivalent series resistance of the output
capacitor.
8
ISL6444
Because of different control mechanisms, the value of the
load current where transition into CCM operation takes place
is usually higher compared to the load level at which
transition into hysteretic mode had occurred.
where: Ro -- is load resistance and Co -- is load
capacitance. For this type of modulator, a Type 2
compensation circuit is usually sufficient.
Figure 5 shows a Type 2 amplifier and its response along
with the responses of the current mode modulator and the
converter. The Type 2 amplifier, in addition to the pole at
origin, has a zero-pole pair that causes a flat gain region at
frequencies in between the zero and the pole.
VOUT pin and Forced Continuous Conduction Mode
(FCCM)
The error amplifier that provides control over the converter
during CCM mode is excluded from the regulation loop in the
hysteretic mode. Due to that, its output voltage eventually
runs away from the operation point that is normally related to
the desired output voltage. When the converter transitions
from hysteretic mode of operation into CCM, the output
voltage transient can occur as it takes some time for the
error amplifier to catch-up with regulation.
1
F
= ------------------------------ = 6kHz ;
Z
2π ⋅ R ⋅ C
2
1
1
F
= ------------------------------ = 600kHz ;
2π ⋅ R ⋅ C
P
1
2
This region is also associated with phase ‘bump’ or
reduced phase shift. The amount of phase shift reduction
depends on how wide the region of flat gain is and has a
maximum value of 90o. To further simplify the converter
compensation, the modulator gain is kept independent of
the input voltage variation by providing feed-forward of VIN
to the oscillator ramp.
To reduce undesirable effects of the error amplifier run away
during mode change, the exact value of the output voltage is
provided to the internal circuit via the VOUT pin, Figure 2.
In case the hysteretic mode of operation is not required, the
controller can be put in a forced continuous conduction
mode (FCCM) of operation. That can be accomplished by
connecting the VOUT pin to ground, which disables the
mode control circuit.
C2
C1
R2
Converter
R1
Such dual function of the VOUT pin enhances applicability of
the controller and allows for lower pin count.
EA
Type 2 EA
Feedback Loop Compensation
G
=18dB
M
To reduce the number of external components and remove
the burden of determining compensation components from a
system designer, both PWM controllers have internally
compensated error amplifiers. To make internal
compensation possible several design measures where
taken.
G
=14dB
EA
Modulator
F
F
Z
P
F
PO
F
C
First, the ramp signal applied to the PWM comparator is
proportional to the input voltage provided via the VIN pin.
This keeps the modulator gain constant when the input
voltage varies. The second, the load current proportional
signal is derived from the voltage drop across the lower
MOSFET during the PWM time interval and is added to the
amplified error signal on the comparator input. This
effectively creates an internal current control loop. The
resistor connected to the ISEN pin sets the gain in the
current feedback loop. The following expression estimates
the required value of the current sense resistor depending
on the maximum load current and the value of the
FIGURE 5. FEEDBACK LOOP COMPENSATION
The zero frequency, the amplifier high-frequency gain, and
the modulator gain are chosen to satisfy most typical
applications. The crossover frequency will appear at the
point where the modulator attenuation equals the amplifier
high frequency gain. The only task that the system designer
has to complete is to specify the output filter capacitors to
position the load main pole somewhere within one decade
lower than the amplifier zero frequency. With this type of
compensation plenty of phase margin is easily achieved due
to zero-pole pair phase ‘boost’.
MOSFET’s R
.
DS(ON)
Conditional stability may occur only when the main load pole
is positioned too much to the left side on the frequency axis
due to excessive output filter capacitance. In this case, the
ESR zero placed within 10kHz...50kHz range gives some
additional phase ‘boost’. Some phase boost can also be
I
⋅ R
MAX
DS(ON)
R
= ------------------------------------------- – 100Ω
CS
75µA
Due to implemented current feedback, the modulator has a
single pole response with -1 slope at a frequency
determined by the load
achieved by connecting capacitor C in parallel with the
upper resistor R1 of the divider that sets the output voltage
value, as shown in Figure 2.
1
z
F
= -------------------------------- ,
PO
2π ⋅ R ⋅ C
O
O
9
ISL6444
If the lower MOSFET current exceeds the overcurrent
Gate Control Logic
threshold, a pulse skipping circuit is activated. The upper
MOSFET will not be turned on as long as the sensed
current is higher then the threshold value. This limits the
current supplied by the DC voltage source. This condition
keeps on for eight clock cycles after the overcurrent
comparator was tripped for the first time. If after these first
eight clock cycles the current exceeds the overcurrent
threshold again in a time interval of another eight clock
cycles, the overcurrent protection latches and disables the
chip. If the overcurrent condition goes away during the first
eight clock cycles, normal operation is restored and the
overcurrent circuit resets itself sixteen clock cycles after the
overcurrent threshold was exceeded the first time, Figure 6.
The gate control logic translates generated PWM signals
into gate drive signals providing necessary amplification,
level shift, and shoot-trough protection. Also, it bears some
functions that help to optimize the IC performance over a
wide range of the operational conditions. As MOSFET
switching time can very dramatically from type to type and
with the input voltage, the gate control logic provides
adaptive dead time by monitoring real gate waveforms of
both the upper and the lower MOSFETs.
Dual-Step Conversion
The ISL6444 dual channel controller can be used either in
power systems with a single-stage power conversion when
the battery power is converted into the desired output
voltage in one step, or in the systems where some
intermediate voltages are initially established. The choice of
the approach may be dictated by the overall system design
criteria or simply to be a matter of voltages available to the
system designer, like in the case of PCI card applications.
PGOOD
1
8 CLK
IL
Shutdown
2
VOUT
When the power input voltage is a regulated 5V or 3.3V
system bus, the feed-forward ramp may become too
shallow, which creates the possibility of duty-factor jitter
especially in a noisy environment. The noise susceptibility
when operating from low level regulated power sources can
be improved by connecting the VIN pin to ground via a
resistor. The internal pull-up current source of ~15µA will
create a voltage drop across the resistor. If this voltage is
lower than 2.5V, the feed-forward ramp generator will be
internally reconnected from the VIN pin to the VCC pin and
the ramp slew rate will be doubled. Application circuits for
dual-step power conversion are presented in Figure 10.
3
Ch1 5.0V
Ch2 100mV
M 10.0µs
Ch3 1.0AΩ
FIGURE 6. OVERCURRENT PROTECTION WAVEFORMS
If load step is strong enough to pull output voltage lower
than the undervoltage threshold, the chip shuts down
immediately.
Because of the nature of the used current sensing
technique, and to accommodate wide range of the R
DS(ON)
variation, the value of the overcurrent threshold should
represent overload current about 150%...180% of the
nominal value. If accurate current protection is desired, a
current sense resistor placed in series with the lower
MOSFET source may be used.
Protections
The converter output is monitored and protected against
extreme overload, short circuit, overvoltage, and
undervoltage conditions.
A sustained overload on the output sets the PGOOD low and
latches-off the whole chip. The controller operation can be
restored by cycling the VCC voltage or an enable (EN) pin.
Overvoltage Protection
Should the output voltage increase over 115% of the normal
value due to the upper MOSFET failure, or other reasons,
the overvoltage protection comparator will force the
synchronous rectifier gate driver high. This action actively
pulls down the output voltage and eventually attempts to
blow the battery fuse. As soon as the output voltage drops
below the threshold, the OVP comparator is disengaged.
Overcurrent Protection
Both PWM controllers use the lower MOSFET’s
on-resistance -- R
to monitor the current for
DS(ON)
protection against shorted outputs. The sensed current
from the ISEN pin is compared with a current set by a
resistor connected from the OCSET pin to ground,.
This OVP scheme provides a ‘soft’ crowbar function which
helps to tackle severe load transients and does not invert the
output voltage when activated -- a common problem for OVP
schemes with a latch.
11.2V • (R
+ 100Ω)
CS
R
= -----------------------------------------------------------
OCSET
I
• R
OC
DS(ON)
Where, I
is a desired overcurrent protection threshold and
is the value of the current sense resistor connected to
OC
R
CS
the I
pin.
SEN
10
ISL6444
The PG2 pin function is also different in DDR mode. This pin
becomes the output of the buffer, which input is connected
via the OCSET2 pin to the center point of the R/R divider
from the VDDQ output. The buffer output voltage serves as
1.25V reference for the DDR memory chips. Current
capability of this pin is about 10mA.
Overtemperature Protection
The chip incorporates an over temperature protection circuit
that shuts the chip down when the die temperature of 150 C
o
is reached. Normal operation restores at die temperatures
o
below 125 C through the full soft-start cycle.
DDR Application
For the VTT channel some control and protective functions
can be significantly simplified as this output is derived from
the VDDQ output. For example, the overcurrent and
overvoltage protections for the second controller are
disabled when the DDR pin is set high. The hysteretic mode
of operation is also disabled on the VTT channel to allow
sinking capability to be independent from the load level. As
the VTT channel tracks the VDDQ/2 voltage, the soft-start
function is not required and the SOFT2 pin may be left open
or may be connected to VCC.
Double Data Rate (DDR) memory chips are expected to take
a place of memory of choice in many newly designed
computers including high-end notebooks due to increased
throughput. A novelty feature associated with this type of
memory is new referencing and data bus termination
techniques. These techniques employ a reference voltage,
VREF, that tracks the center point of VDDQ and VSS
voltages and an additional VTT power source to which all
terminating resistors are connected. Despite the additional
power source, the overall memory power consumption is
reduced compared to traditional termination.
Channel Synchronization in DDR
Applications
The added power source has a cluster of requirements that
should be observed and considered. Due to reduced
differential thresholds of DDR memory, the termination
power supply voltage, VTT, shall closely track VDDQ/2
voltage. Another very important feature for the termination
power supply is a capability to equally operate in sourcing
and sinking modes. The VTT supply shall regulate the output
voltage with the same degree of precision when current is
floating from the supply to the load and when the current is
diverted back from the load into the power supply. The last
mode of operation usually conflicts with the way most PWM
controllers operate.
Presence of two PWM controllers on the same die require
channel synchronization to reduce inter channel interference
that may cause the duty factor jitter and increased output
ripple. The PWM controller is mostly susceptible to noise
when an error signal on the input of the PWM comparator
approaches the decision making point. False triggering can
occur causing jitter and affecting the output regulation.
Out-of-phase operation is a common approach to
synchronize dual channel converters as it reduces an input
current ripple and provides a minimum interference for
channels that control different voltage levels. When used in
DDR application with cascaded converters (VTT generated
from VDDQ), the turn-on of the upper MOSFET in the VDDQ
channel happens to be just before the decision making point
in the VTT channel that is running with a duty-factor close to
50%, Figure 7 and Figure 8. This makes out-of-phase
channel synchronization undesirable when one of the
channels is running on a duty-factor of 50%. Inversely, the
in-phase channel arrangement does not have this drawback.
Points of decision are far from noisy moments of time in both
sourcing and sinking modes of operation for Vin=7.5V to 24V
as it is shown in Figure 7.
The ISL6444 dual channel PWM controller possesses
several important means that allow re configuration for this
particular application and provide all three voltages required
in DDR memory compliant computer.
To reconfigure the ISL6444 for a complete DDR solution, the
DDR pin shall be permanently set high. The simplest way to
do that is to connect it to the VCC rail. This activates some
functions inside the chip that are specific to the DDR
memory power needs.
In DDR application presented in Figure 12, the first controller
regulates VDDQ rail to 2.5V. The output voltage is set by an
external divider R3 and R4. The second controller regulates
the VTT rail to VDDQ/2. The OCSET2 pin function is now
different. The pin serves now as an input that brings VDDQ/2
voltage created by R5 and R6 divider inside the chip. That
effectively provides a tracking function for the VTT voltage.
11
ISL6444
In the case when power for VDDQ is taken from the +5V
system rail, as Figure 8 shows, both in-phase and out-of-
phase approaches are susceptible to noise in the sourcing
mode.
Noise immunity can be improved by operating the VTT
converter with a 90o phase shift. As the time diagrams in
Figure 8 show, the points of concern are always about a
quarter of the period away from the noise emitting
transitions.
300kHz CLOCK
300kHz CLOCK
VDDQ
VDDQ
SOURCING
SOURCING
VTT
OUT-OF-PHASE
VTT
OUT-OF-PHASE
SINKING
SINKING
SOURCING
VTT
SOURCING
IN-PHASE
VTT
IN-PHASE
SINKING
SINKING
SOURCING
VTT
FIGURE 7. CHANNEL INTRFEARENCE Vin=7.5V...24V
o
90 PHASE SHIFT
SINKING
FIGURE 8. CHANNEL INTERFERENCE Vin=5V
Several ways of synchronization are implemented into the
chip. When the DDR pin is connected to GND, the channels
operate 180o out-of-phase. In the DDR mode when the DDR
pin is connected to VCC, the channels operate either in-
phase when the VIN pin is connected to the input voltage
source, or with 90o phase shift if the VIN pin is connected to
GND via the 100kOhm resistor.
12
ISL6444
ISL6444 DC-DC Converter Application Circuits
Figures 9 and 10 show application circuits of a dual channel
DC/DC converter for a notebook PC.
The power supply shown in Figure 12 generates +2.5V
VDDQ voltage from a battery. The +1.25V VTT termination
voltage tracks VDDQ/2 and is derived from +2.5V VDDQ. To
complete the DDR memory power requirements, the +1.25V
reference voltage is also provided. The PG2 pin serves as
an output for the reference voltage in this mode.
The power supply in Figure 9 provides +V2.5S and +V1.8S
voltages for memory and graphic interface chipset from
+5.0-24VDC battery voltage.
Figure 10 shows the power supply that provides +V2.5S and
+V1.8S voltages for memory and graphic interface chipset
from +5.0V system rail.
Figure 13 depicts the DDR solution in the case where the 5V
system rail is used as a primary voltage source.
For detailed information on the circuit, including a Bill-of-
Materials and circuit board description, see Application Note
AN9995. Also see Intersil’s web site (http://www.intersil.com)
for the latest information.
Figure 11 shows an application circuit for a single-output
split input power supply with current sharing for advanced
graphic card applications.
Figure 12 and 13 show application circuits of a complete
power solution for DDR memory that becomes a preferred
choice in modern computers.
+5.0-24V
GND
IN
C2
56µF
C1
1µF
+
+5.0V
cc
C3
+
C4
0.01µF
CR1
VIN
12
VCC
28
C5
10µF
CR2
0.01µF
SOFT1
SOFT2
14
17
23
BOOT1
BOOT2
6
Q1
Q3
1/2 IRF7313
1/2 IRF7313
C7
0.1µF
C6
0.1µF
UGATE1
PHASE1
UGATE2
PHASE2
5
4
24
25
+V1_8
(2A)
L1
10µH
+V2_5S
(3A)
L2
10µH
R1
2k
ISEN1
R2
2k
ISEN2
7
22
27
C8
+
C9
+
ISL6444
330µF
LGATE1
330µF
LGATE2
Q2
2/2 IRF7313
2
Q4
2/2 IRF7313
R3
R5
R4
PGND1
VSEN1
PGND2
VSEN2
3
26
19
10
VOUT1
EN1
R6
VOUT2
EN2
9
8
20
21
16
PG1
PG2/REF
15
11
OCSET2 R8
OCSET1
R7
18
13
1
DDR
GND
FIGURE 9. DUAL OUTPUT APPLICATION CIRCUIT FOR ONE-STEP CONVERSION
13
ISL6444
R9
100k
+5.0V
GND
cc
C1
C3
0.01µF
+
C4
0.01µF
C2
56µF
CR1
VIN
12
1µF
VCC
CR2
SOFT1
SOFT2
14
28
17
23
BOOT1
BOOT2
6
Q1
Q3
1/2 IRF7313
1/2 IRF7313
C7
0.1µF
C6
0.1µF
UGATE1
PHASE1
UGATE2
PHASE2
5
4
24
25
L1
+V1_8
(2A)
L2
4.7µH
+V2_5S
(3A)
4.7µH
R1
2k
ISEN1
R2
2k
ISEN2
7
22
27
C8
330µF
+
C9
330µF
+
ISL6444
LGATE1
LGATE2
Q2
2/2 IRF7313
2
Q4
2/2 IRF7313
R3
R5
R4
PGND1
VSEN1
PGND2
VSEN2
3
26
19
10
VOUT1
EN1
R6
VOUT2
EN2
9
8
20
21
16
PG1
PG2/REF
15
11
OCSET2 R8
OCSET1
R7
18
13
1
DDR
GND
FIGURE 10. DUAL OUTPUT APPLICATION CIRCUIT FOR TWO-STEP CONVERSION
14
ISL6444
+12.0V
C1
10µF
GND
+5.0V
C3
0.01µF
SOFT1
+
C4
0.01µF
CR1
VIN
12
VCC
C5
10µF
CR2
SOFT2
14
28
17
BOOT1
BOOT2
6
23
Q1
Q3
1/2 IRF7313
1/2 IRF7313
C7
0.1µF
C6
0.1µF
UGATE1
PHASE1
UGATE2
PHASE2
5
4
24
25
L1
10.0µH
L2
4.7µH
R1
2k
ISEN1
R2
2k
ISEN2
7
22
C8
+
C9
+
ISL6444
330µF
LGATE1
330µF
LGATE2
Q2
2
27
Q4
2/2 IRF7313
R3
2/2 IRF7313
R4
6.89k
6.89k
PGND1
VSEN1
PGND2
VSEN2
3
26
19
10
VOUT1
EN1
VOUT2
EN2
R6
10K
R5
10K
9
8
20
21
16
PG1
PG2/REF
15
11
OCSET2 R8
OCSET1
R7
18
13
1
DDR
GND
R9 0.01
R10 0.01
C10
330µF
C11
330µF
+
+
VOUT
+1.5V
(8A)
FIGURE 11. SINGLE-OUTPUT SPLIT INPUT POWER SUPPLY
15
ISL6444
+5.6-24V
GND
IN
C1, C2
10µF
+5.0V
cc
C3
0.01µF
+
CR1
VIN
12
VCC
28
C5
10µF
CR2
SOFT1
SOFT2
BOOT2
14
17
23
BOOT1
6
Q1
Q3
1/2 IRF7313
1/2 IRF7313
C7
0.1µF
C6
UGATE1
PHASE1
UGATE2
PHASE2
5
4
24
25
0.1µF
VTT
+1.25V
VDDQ
+2.5V
(6A)
L1
4.7µH
L2
1.5µH
R1
680
LGATE1
ISEN1
R2
499
LGATE2
ISEN2
(3A)
7
22
27
C8
+
C9
+
ISL6444
330µF
330µF
Q2
2/2 IRF7313
2
Q4
2/2 IRF7313
R3
PGND1
VSEN1
32k4
PGND2
VSEN2
3
26
19
10
VOUT1
EN1
VOUT2
EN2
R4
9
20
VREF
18k2
1.25V
8
EN1
21
16
(10mA)
PG1
PG2/REF
15
11
OCSET1
R7
OCSET2
R5
18
13
1
18k2
DDR
VCC
GND
R6
C10
0.01µF
18k2
FIGURE 12. APPLICATION CIRCUIT FOR COMPLETE DDR MEMORY POWER SOLUTION WITH ONE-STEP CONVERSION
16
ISL6444
R9
100k
+5.0V
GND
cc
C1, C2
C3
0.01µF
10µF
CR1
VIN
12 14
VCC
28
CR2
SOFT1
SOFT2
BOOT2
17
23
BOOT1
6
Q1
Q3
1/2 IRF7313
1/2 IRF7313
C7
0.1µF
C6
0.1µF
UGATE1
PHASE1
UGATE2
PHASE2
5
4
24
25
VDDQ
+2.5V
(6A)
VTT
+1.25V
L1
L2
1.5µH
4.7µH
R1
1k
ISEN1
R2
5.9k
LGATE2
ISEN2
(3A)
7
22
27
C8
330µF
+
C9
330µF
+
ISL6444
LGATE1
Q2
2/2 IRF7313
2
Q4
2/2 IRF7313
R3
PGND1
VSEN1
32k4
PGND2
VSEN2
3
26
19
10
VOUT1
EN1
VOUT2
EN2
R4
9
8
20
VREF
1.25V
18k2
EN1
21
16
(10mA)
PG1
PG2/REF
15
OCSET1
R7
OCSET2
R5
18
11
1
13
18k2
DDR
GND
R6
C10
0.01µF
VCC
18k2
FIGURE 13. APPLICATION CIRCUIT FOR COMPLETE DDR MEMORY POWER SOLUTION WITH TWO-STEP CONVERSION
17
ISL6444
Shrink Small Outline Plastic Packages (SSOP)
M28.15
N
28 LEAD SHRINK NARROW BODY SMALL OUTLINE
PLASTIC PACKAGE
INDEX
AREA
0.25(0.010)
M
B M
H
E
INCHES
MIN
MILLIMETERS
GAUGE
PLANE
-B-
SYMBOL
MAX
0.069
0.010
0.061
0.012
0.010
0.394
0.157
MIN
1.35
0.10
-
MAX
1.75
0.25
1.54
0.30
0.25
10.00
3.98
NOTES
A
A1
A2
B
0.053
0.004
-
-
1
2
3
-
L
-
0.25
0.010
SEATING PLANE
A
0.008
0.007
0.386
0.150
0.20
0.18
9.81
3.81
9
-A-
o
D
h x 45
C
D
E
-
3
-C-
α
4
A2
e
A1
e
0.025 BSC
0.635 BSC
-
C
B
0.10(0.004)
H
h
0.228
0.0099
0.016
0.244
0.0196
0.050
5.80
0.26
0.41
6.19
0.49
1.27
-
0.17(0.007) M
C
A M B S
5
L
6
NOTES:
N
α
28
28
7
1. Symbols are defined in the “MO Series Symbol List” in Section 2.2
of Publication Number 95.
o
o
o
o
0
8
0
8
-
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
Rev. 0 2/95
3. Dimension “D” does not include mold flash, protrusions or gate
burrs. Mold flash, protrusion and gate burrs shall not exceed
0.15mm (0.006 inch) per side.
4. Dimension “E” does not include interlead flash or protrusions. Inter-
lead flash and protrusions shall not exceed 0.25mm (0.010 inch)
per side.
5. The chamfer on the body is optional. If it is not present, a visual in-
dex feature must be located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. Dimension “B” does not include dambar protrusion. Allowable dam-
bar protrusion shall be 0.10mm (0.004 inch) total in excess of “B”
dimension at maximum material condition.
10. Controlling dimension: INCHES. Converted millimeter dimensions
are not necessarily exact.
All Intersil U.S. products are manufactured, assembled and tested utilizing ISO9000 quality systems.
Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see www.intersil.com
18
相关型号:
ISL6446AIAZ
Dual (180° Out-of-Phase) PWM and Linear Controller; QSOP24; Temp Range: -40° to 85°C
RENESAS
ISL6446AIAZ-TK
Dual (180° Out-of-Phase) PWM and Linear Controller; QSOP24; Temp Range: -40° to 85°C
RENESAS
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