HA-5147/883 [INTERSIL]

100MHz, Ultra Low Noise, Precision, High Slew Rate Operational Amplifier; 为100MHz ,超低噪声,高精度,高转换率运算放大器
HA-5147/883
型号: HA-5147/883
厂家: Intersil    Intersil
描述:

100MHz, Ultra Low Noise, Precision, High Slew Rate Operational Amplifier
为100MHz ,超低噪声,高精度,高转换率运算放大器

运算放大器
文件: 总9页 (文件大小:390K)
中文:  中文翻译
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HA-5147/883  
100MHz, Ultra Low Noise, Precision,  
High Slew Rate Operational Amplifier  
June 1998  
Features  
Description  
• This Circuit is Processed in Accordance to MIL-STD-  
883 and is Fully Conformant Under the Provisions of  
Paragraph 1.2.1.  
The HA-5147/883 monolithic operational amplifier features  
an unparalleled combination of precision DC and wideband  
high speed characteristics. Utilizing the Intersil DI technol-  
ogy and advanced processing techniques, this unique  
design unites low noise precision instrumentation perfor-  
mance with high speed wideband capability.  
• High Slew Rate. . . . . . . . . . . . . . . . . . . . . . 28V/µs (Min)  
• Wide Gain Bandwidth (A 10) . . . . . . . 100MHz (Min)  
V
This amplifier’s impressive list of features include low V  
,
• Low Noise (at 1kHz). . . . . . . . . . . . . . . 4.5nV/Hz (Max)  
• Low Offset Voltage. . . . . . . . . . . . . . . . . . . .100µV (Max)  
OS  
wide gain-bandwidth, high open loop gain, and high CMRR.  
Additionally, this flexible device operates over a wide supply  
range while consuming only 120mW of power.  
o
• Low Offset Drift With Temperature. . . . 1.8µV/ C (Max)  
Using the HA-5147/883 allows designers to minimize errors  
while maximizing speed and bandwidth in applications  
requiring gains greater than ten.  
• High CMRR . . . . . . . . . . . . . . . . . . . . . . . . . .100dB (Min)  
• High Voltage Gain . . . . . . . . . . . . . . . . . . 700kV/V (Min)  
This device is ideally suited for low level transducer signal  
amplifier circuits. Other applications which can utilize the  
HA-5147/883’s qualities include instrumentation amplifiers,  
pulse or RF amplifiers, audio preamplifiers, and signal condi-  
tioning circuits.  
Applications  
• High Speed Signal Conditioners  
• Wide Bandwidth Instrumentation Amplifiers  
• Low Level Transducer Amplifiers  
• Fast, Low Level Voltage Comparators  
• Highest Quality Audio Preamplifiers  
• Pulse/RF Amplifiers  
Ordering Information  
TEMP.  
PKG.  
NO.  
o
PART NUMBER RANGE ( C)  
PACKAGE  
HA4-5147/883  
HA7-5147/883  
-55 to 125 20 Ld CLCC  
-55 to 125 8 Ld CERDIP  
J20.A  
F8.3A  
Pinouts  
HA-5147/883  
(CERDIP)  
HA-5147/883  
(CLCC)  
TOP VIEW  
TOP VIEW  
BAL  
-IN  
1
2
3
4
8
7
6
5
BAL  
V+  
3
2
1
20 19  
-
+
18  
17  
16  
15  
14  
NC  
V+  
4
5
6
7
8
NC  
-IN  
+IN  
OUT  
NC  
-
NC  
OUT  
NC  
NC  
+IN  
NC  
V-  
+
9
10 11 12 13  
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.  
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999  
Spec Number 511009-883  
File Number 3715.2  
1
HA-5147/883  
Absolute Maximum Ratings  
Thermal Information  
o
o
Voltage Between V+ and V- Terminals . . . . . . . . . . . . . . . . . . . . 44V Thermal Resistance (Typical, Note 2)  
θ
( C/W)  
θ
( C/W)  
JA  
JC  
Differential Input Voltage (Note 1). . . . . . . . . . . . . . . . . . . . . . . .0.7V  
Voltage at Either Input Terminal . . . . . . . . . . . . . . . . . . . . . . V+ to V-  
Input Current. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .25mA  
Output Current . . . . . . . . . . . . . . . . . . . Full Short Circuit Protection  
ESD Rating. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . <2000V  
CERDIP Package . . . . . . . . . . . . . . . .  
115  
65  
28  
15  
CLCC Package . . . . . . . . . . . . . . . . . .  
o
o
Package Power Dissipation Limit at 75 C for T 175 C  
J
CERDIP Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 870mW  
CLCC Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.54W  
Package Power Dissipation Derating Factor Above 75 C  
CERDIP Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8.7mW/ C  
o
o
Operating Conditions  
o
CLCC Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15.4mW/ C  
o
o
Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . . -55 C to 125 C  
o
Maximum Junction Temperature (T ) . . . . . . . . . . . . . . . . . . . 175 C  
J
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±15V  
o
o
Maximum Storage Temperature Range . . . . . . . . . .-65 C to 150 C  
Maximum Lead Temperature (Soldering 10s). . . . . . . . . . . . . 300 C  
V
R
1/2 (V+ - V-)  
INCM  
600Ω  
o
L
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation  
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.  
NOTES:  
1. For differential input voltages greater than 0.7V, the input current must be limited to 25mA to protect the back-to-back input diodes.  
2. θ is measured with the component mounted on an evaluation PC board in free air.  
JA  
TABLE 1. DC ELECTRICAL PERFORMANCE SPECIFICATIONS  
Device Tested at: V  
= ±15V, R  
= 50Ω, R = 100k, V  
LOAD OUT  
= 0V, Unless Otherwise Specified.  
SUPPLY  
SOURCE  
GROUP A  
SUBGROUPS  
o
PARAMETER  
SYMBOL  
CONDITIONS  
TEMP. ( C)  
MIN  
-100  
-300  
-
MAX  
100  
300  
80  
UNITS  
µV  
Input Offset Voltage  
V
V
V
= 0V  
1
25  
IO  
CM  
2, 3  
1
125, -55  
25  
µV  
Input Bias Current  
I
= 0V,  
nA  
B
CM  
R
= 10k, 50Ω  
S
2, 3  
125, -55  
-
150  
nA  
+I + –I  
B
B
------------------------------  
2
Input Offset Current  
I
V
= 0V,  
1
25  
-75  
75  
nA  
nA  
IO  
CM  
+R = 10k,  
-R = 10kΩ  
S
2, 3  
125, -55  
-135  
135  
S
Common Mode  
Range  
+CMR  
-CMR  
V+ = +4.7V,  
V- = -25.3V  
1
2, 3  
1
25  
125, -55  
25  
10.3  
10.3  
-
-
V
V
-
V+ = +25.3V,  
V- = -4.7V  
-10.3  
V
2, 3  
4
125, -55  
25  
-
-10.3  
V
Large Signal Voltage  
Gain  
+A  
VOL  
V
R
= 0V and +10V,  
700  
300  
700  
300  
100  
100  
100  
100  
-
-
-
-
-
-
-
-
kV/V  
kV/V  
kV/V  
kV/V  
dB  
OUT  
= 2kΩ  
L
5, 6  
4
125, -55  
25  
-A  
VOL  
V
= 0V and -10V,  
OUT  
R
= 2kΩ  
L
5, 6  
1
125, -55  
25  
Common Mode  
Rejection Ratio  
+CMRR  
-CMRR  
V  
V  
V  
V  
= +11V  
= +10V  
= -11V  
= -10V  
CM  
CM  
CM  
CM  
2, 3  
1
125, -55  
25  
dB  
dB  
2, 3  
125, -55  
dB  
Spec Number 511009-883  
2
HA-5147/883  
TABLE 1. DC ELECTRICAL PERFORMANCE SPECIFICATIONS (Continued)  
Device Tested at: V  
= ±15V, R  
= 50Ω, R = 100k, V  
LOAD OUT  
= 0V, Unless Otherwise Specified.  
SUPPLY  
SOURCE  
GROUP A  
SUBGROUPS  
o
PARAMETER  
SYMBOL  
CONDITIONS  
TEMP. ( C)  
MIN  
11.5  
11.5  
-
MAX  
UNITS  
V
Output Voltage Swing  
+V  
R
R
= 2kΩ  
4
5, 6  
4
25  
-
OUT1  
L
L
125, -55  
25  
-
V
-V  
= 2kΩ  
-11.5  
V
OUT1  
5, 6  
4
125, -55  
25  
-
-11.5  
V
+V  
R
R
= 600Ω  
= 600Ω  
10  
-
-
V
OUT2  
L
L
-V  
+I  
4
25  
-10  
V
OUT2  
Output Current  
V
= -10V  
= +10V  
4
25  
16.5  
-
-
mA  
mA  
mA  
mA  
mA  
mA  
dB  
dB  
dB  
dB  
mV  
mV  
mV  
mV  
OUT  
OUT  
OUT  
-I  
V
4
25  
-16.5  
OUT  
Quiescent Power  
Supply Current  
+I  
V
= 0V, I  
= 0mA  
= 0mA  
1
25  
-
4
4
-
CC  
OUT  
OUT  
2, 3  
1
125, -55  
25  
-
-I  
V
= 0V, I  
-4  
CC  
OUT  
OUT  
2, 3  
1
125, -55  
25  
-4  
-
Power Supply  
Rejection Ratio  
+PSRR  
-PSRR  
V  
= +14V  
86  
86  
86  
86  
-
SUP  
SUP  
SUP  
SUP  
V  
V  
V  
= +13.5V  
= +14V  
2, 3  
1
125, -55  
25  
-
-
= +13.5V  
2, 3  
1
125, -55  
25  
-
Offset Voltage  
Adjustment  
+V Adj  
IO  
Note 3  
V
-1  
-
IO  
2, 3  
1
125, -55  
25  
V
-1  
-
IO  
-V Adj  
IO  
Note 3  
V
V
+1  
+1  
-
IO  
2, 3  
125, -55  
-
IO  
NOTE:  
3. Offset adjustment range is [V (Measured) ±1mV] minimum referred to output. This test is for functionality only to assure adjustment  
IO  
through 0V.  
TABLE 2. AC ELECTRICAL PERFORMANCE SPECIFICATIONS  
Device Tested at: V  
= ±15V, R  
SOURCE  
= 50, R  
LOAD  
= 2k, C  
LOAD  
= 50pF, A  
VCL  
= +10V/V, Unless Otherwise Specified.  
SUPPLY  
GROUP A  
SUBGROUPS  
o
PARAMETER  
SYMBOL  
+SR  
CONDITIONS  
TEMP. ( C)  
MIN  
28  
28  
-
MAX  
UNITS  
V/µs  
V/µs  
ns  
Slew Rate  
V
= -3V to +3V  
= +3V to -3V  
= 0 to +200mV  
OUT  
7
7
7
25  
25  
25  
-
-
OUT  
-SR  
V
OUT  
Rise and Fall Time  
Overshoot  
t
V
50  
r
10% t 90%  
r
t
V
= 0 to -200mV  
7
25  
-
50  
ns  
f
OUT  
10% t 90%  
f
+OS  
-OS  
V
= 0 to +200mV  
= 0 to -200mV  
7
7
25  
25  
-
-
40  
40  
%
%
OUT  
V
OUT  
Spec Number 511009-883  
3
HA-5147/883  
TABLE 3. ELECTRICAL PERFORMANCE SPECIFICATIONS  
Device Characterized at: V  
= ±15V, R  
= 2k, C  
LOAD  
= 50pF, A = +10V/V, Unless Otherwise Specified.  
V
SUPPLY  
LOAD  
o
PARAMETER  
SYMBOL  
CONDITIONS  
NOTES  
TEMP. ( C)  
MIN  
MAX  
UNITS  
o
Average Offset Voltage  
Drift  
V
TC  
V
V
= 0V  
= 0V  
4
-55 to 125  
-
1.8  
µV/ C  
IO  
CM  
CM  
Differential Input  
Resistance  
R
4
4
25  
25  
0.8  
-
-
MΩ  
IN  
Low Frequency  
E
0.1Hz to 10Hz  
0.25  
µV  
P-P  
NP-P  
Peak-to-Peak Noise  
Input Noise Voltage  
Density  
E
R
R
R
R
R
R
= 20, f = 10Hz  
4
4
25  
-
10  
5.6  
4.5  
4.0  
2.3  
0.6  
-
nV/√Hz  
nV/√Hz  
nV/√Hz  
pA/√Hz  
pA/√Hz  
pA/√Hz  
MHz  
N
S
S
S
S
S
S
O
= 20, f = 100Hz  
25  
-
-
O
= 20, f = 1kHz  
4
25  
O
Input Noise Current  
Density  
I
= 2M, f = 10Hz  
4
25  
-
N
O
= 2M, f = 100Hz  
4
25  
-
O
= 2M, f = 1kHz  
4
25  
25  
-
O
Gain Bandwidth Product  
Full Power Bandwidth  
GBWP  
V
= 100mV, f = 10kHz  
4
120  
100  
445  
±10  
O
O
V
= 100mV, f = 1MHz  
4
25  
-
MHz  
O
O
FPBW  
CLSG  
V
= 10V  
4, 5  
4
25  
-
kHz  
PEAK  
Minimum Closed Loop  
Stable Gain  
R
= 2k, C = 50pF  
-55 to 125  
-
V/V  
L
L
Settling Time  
t
To 0.1% for a 10V Step  
Open Loop  
4
4
25  
25  
-
-
-
600  
100  
120  
µs  
S
Output Resistance  
R
OUT  
Quiescent Power  
Consumption  
PC  
V
= 0V, I  
OUT  
= 0mA  
4, 6  
-55 to 125  
mW  
OUT  
NOTES:  
4. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These pa-  
rameters are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characteriza-  
tion based upon data from multiple production runs which reflect lot to lot and within lot variation.  
5. Full Power Bandwidth guarantee based on Slew Rate measurement using FPBW = Slew Rate/(2πV  
).  
PEAK  
6. Quiescent Power Consumption based upon Quiescent Supply Current test maximum. (No load on output.)  
TABLE 4. ELECTRICAL TEST REQUIREMENTS  
MIL-STD-883 TEST REQUIREMENTS  
Interim Electrical Parameters (Pre Burn-In)  
Final Electrical Test Parameters  
Group A Test Requirements  
SUBGROUPS (SEE TABLES 1 AND 2)  
1
1 (Note 7), 2, 3, 4, 5, 6, 7  
1, 2, 3, 4, 5, 6, 7  
1
Groups C and D Endpoints  
NOTE:  
7. PDA applies to Subgroup 1 only.  
Spec Number 511009-883  
4
HA-5147/883  
Die Characteristics  
DIE DIMENSIONS:  
WORST CASE CURRENT DENSITY:  
5
2
104.3 x 65 x 19 mils  
3.6 x 10 A/cm at 15mA  
2650 x 1650 x 483µm  
This device meets Glassivation Integrity Test Requirement  
per MIL-STD-883 Method 2021 and MIL-I-38535 Paragraph  
30.5.5.4.  
METALLIZATION:  
Type: Al, 1% Cu  
Thickness: 16kÅ ± 2kÅ  
SUBSTRATE POTENTIAL (Powered Up):  
V-  
GLASSIVATION:  
TRANSISTOR COUNT:  
Type: Nitride (Si N ) over Silox (SiO , 5% Phos.)  
3
4
2
Silox Thickness: 12kÅ ± 2kÅ  
63  
Nitride Thickness: 3.5kÅ ± 1.5kÅ  
PROCESS:  
Bipolar Dielectric Isolation  
Metallization Mask Layout  
HA-5147/883  
BAL  
BAL  
-IN  
V+  
+IN  
OUT  
V-  
NC  
Spec Number 511009-883  
5
HA-5147/883  
Burn-In Circuits  
HA-5147/883 CERDIP  
R
2
1
2
3
4
8
7
6
5
R
1
V+  
-
+
C
D
1
1
V-  
D
C
R
3
2
2
HA-5147/883 CLCC  
R
2
3
2
1
20 19  
18  
4
5
6
7
8
R
1
V+  
17  
16  
-
+
C
D
1
1
15  
14  
R
3
9
10 11 12 13  
C
D
2
2
V-  
NOTE:  
1
R
R
C
D
= R = 1k, ±5%, / W (Min.)  
1
2
1
1
3
4
1
= 10k, ±5%, / W (Min.)  
= C = 0.01µF/Socket or 0.1µF/Row (Min.)  
= D = 1N4002 or Equivalent/Board  
4
2
2
|(V+) - (V-)| = 30V  
Spec Number 511009-883  
6
HA-5147/883  
o
Typical Performance Information T = 25 C, V  
= ±15V, Unless Otherwise Specified  
SUPPLY  
A
V+  
R
T
10kΩ  
1
2
3
4
8
7
6
5
-
+
NOTE: Tested offset adjustment range is |V  
OS  
±1mV| minimum referred to output. Typical range is ±4mV with R = 10k.  
T
SUGGESTED OFFSET VOLTAGE ADJUSTMENT  
A
= +10V/V  
V
+
V
AC  
V
OUT  
AC  
-
1.8kΩ  
200Ω  
50Ω  
50pF  
LARGE AND SMALL SIGNAL RESPONSE TEST CIRCUIT  
IN  
IN  
OUT  
OUT  
Vertical Scale: Input = 0.5V/Div.  
Vertical Scale: Input = 10mV/Div.  
Output = 100mV/Div.  
Output = 5V/Div.  
Horizontal Scale: 500ns/Div.  
Horizontal Scale: 100ns/Div.  
LARGE SIGNAL RESPONSE  
SMALL SIGNAL RESPONSE  
Spec Number 511009-883  
7
HA-5147/883  
Ceramic Leadless Chip Carrier Packages (CLCC)  
J20.A MIL-STD-1835 CQCC1-N20 (C-2)  
20 PAD CERAMIC LEADLESS CHIP CARRIER PACKAGE  
0.010 S E H S  
D
INCHES MILLIMETERS  
MIN  
D3  
SYMBOL  
A
MAX  
0.100  
0.088  
-
MIN  
1.52  
1.27  
-
MAX  
2.54  
2.23  
-
NOTES  
o
j x 45  
0.060  
0.050  
-
6, 7  
A1  
B
-
-
B1  
B2  
B3  
D
0.022  
0.028  
0.56  
0.71  
2, 4  
-
0.072 REF  
1.83 REF  
E3  
E
B
0.006  
0.342  
0.022  
0.358  
0.15  
8.69  
0.56  
9.09  
-
-
D1  
D2  
D3  
E
0.200 BSC  
0.100 BSC  
5.08 BSC  
2.54 BSC  
-
-
o
h x 45  
-
0.358  
0.358  
-
9.09  
9.09  
2
-
0.010 S E F S  
A1  
0.342  
8.69  
E1  
E2  
E3  
e
0.200 BSC  
0.100 BSC  
0.358  
0.050 BSC  
0.015  
5.08 BSC  
2.54 BSC  
9.09  
1.27 BSC  
0.38  
1.02 REF  
0.51 REF  
-
A
-
PLANE 2  
PLANE 1  
-
-
2
-
-E-  
e1  
h
-
-
2
5
5
-
0.040 REF  
0.020 REF  
j
0.007 M E F S H S  
L
0.045  
0.055  
0.055  
0.095  
0.015  
1.14  
1.14  
1.91  
0.08  
1.40  
1.40  
2.41  
0.38  
L1  
L2  
L3  
ND  
NE  
N
0.045  
0.075  
0.003  
-
B1  
e
-
L3  
L
-H-  
-
5
5
5
5
3
3
3
20  
20  
Rev. 0 5/18/94  
-F-  
NOTES:  
B3  
E1  
1. Metallized castellations shall be connected to plane 1 terminals  
and extend toward plane 2 across at least two layers of ceramic  
or completely across all of the ceramic layers to make electrical  
connection with the optional plane 2 terminals.  
L2  
E2  
B2  
2. Unless otherwise specified, a minimum clearance of 0.015 inch  
(0.38mm) shall be maintained between all metallized features  
(e.g., lid, castellations, terminals, thermal pads, etc.)  
L1  
3. Symbol “N” is the maximum number of terminals. Symbols “ND”  
and “NE” are the number of terminals along the sides of length  
“D” and “E”, respectively.  
D2  
e1  
D1  
4. The required plane 1 terminals and optional plane 2 terminals (if  
used) shall be electrically connected.  
5. The corner shape (square, notch, radius, etc.) may vary at the  
manufacturer’s option, from that shown on the drawing.  
6. Chip carriers shall be constructed of a minimum of two ceramic  
layers.  
7. Dimension “A” controls the overall package thickness. The maxi-  
mum “A” dimension is package height before being solder dipped.  
8. Dimensioning and tolerancing per ANSI Y14.5M-1982.  
9. Controlling dimension: INCH.  
Spec Number 511009-883  
8
HA-5147/883  
Ceramic Dual-In-Line Frit Seal Packages (CERDIP)  
c1 LEAD FINISH  
F8.3A MIL-STD-1835 GDIP1-T8 (D-4, CONFIGURATION A)  
8 LEAD CERAMIC DUAL-IN-LINE FRIT SEAL PACKAGE  
-D-  
E
-A-  
INCHES MILLIMETERS  
MIN  
BASE  
(c)  
METAL  
SYMBOL  
MAX  
0.200  
0.026  
0.023  
0.065  
0.045  
0.018  
0.015  
0.405  
0.310  
MIN  
-
MAX  
5.08  
0.66  
0.58  
1.65  
1.14  
0.46  
0.38  
10.29  
7.87  
NOTES  
b1  
A
b
-
-
M
M
(b)  
0.014  
0.014  
0.045  
0.023  
0.008  
0.008  
-
0.36  
0.36  
1.14  
0.58  
0.20  
0.20  
-
2
-B-  
b1  
b2  
b3  
c
3
SECTION A-A  
bbb  
C A - B  
D
D
S
S
S
-
4
BASE  
PLANE  
Q
A
2
-C-  
SEATING  
PLANE  
c1  
D
3
L
α
5
S1  
b2  
eA  
A A  
e
E
0.220  
5.59  
5
b
C A - B  
eA/2  
aaa M C A - B S  
c
e
0.100 BSC  
2.54 BSC  
-
eA  
eA/2  
L
0.300 BSC  
0.150 BSC  
7.62 BSC  
3.81 BSC  
-
ccc  
D
D
S
M
S
S
-
NOTES:  
0.125  
0.200  
0.060  
-
3.18  
5.08  
1.52  
-
-
1. Index area: A notch or a pin one identification mark shall be locat-  
ed adjacent to pin one and shall be located within the shaded  
area shown. The manufacturer’s identification shall not be used  
as a pin one identification mark.  
Q
0.015  
0.005  
0.38  
0.13  
6
S1  
7
o
o
o
o
90  
105  
90  
105  
-
α
2. The maximum limits of lead dimensions b and c or M shall be  
measured at the centroid of the finished lead surfaces, when  
solder dip or tin plate lead finish is applied.  
aaa  
bbb  
ccc  
M
-
-
-
-
0.015  
0.030  
0.010  
0.0015  
-
-
-
-
0.38  
0.76  
0.25  
0.038  
-
-
3. Dimensions b1 and c1 apply to lead base metal only. Dimension  
M applies to lead plating and finish thickness.  
-
2, 3  
8
4. Corner leads (1, N, N/2, and N/2+1) may be configured with a  
partial lead paddle. For this configuration dimension b3 replaces  
dimension b2.  
N
8
8
Rev. 0 4/94  
5. This dimension allows for off-center lid, meniscus, and glass  
overrun.  
6. Dimension Q shall be measured from the seating plane to the  
base plane.  
7. Measure dimension S1 at all four corners.  
8. N is the maximum number of terminal positions.  
9. Dimensioning and tolerancing per ANSI Y14.5M - 1982.  
10. Controlling dimension: INCH  
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.  
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice.  
Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reli-  
able. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may  
result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.  
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com  
Sales Office Headquarters  
NORTH AMERICA  
EUROPE  
ASIA  
Intersil Corporation  
Intersil SA  
Mercure Center  
100, Rue de la Fusee  
1130 Brussels, Belgium  
TEL: (32) 2.724.2111  
FAX: (32) 2.724.22.05  
Intersil (Taiwan) Ltd.  
Taiwan Limited  
7F-6, No. 101 Fu Hsing North Road  
Taipei, Taiwan  
Republic of China  
TEL: (886) 2 2716 9310  
FAX: (886) 2 2715 3029  
P. O. Box 883, Mail Stop 53-204  
Melbourne, FL 32902  
TEL: (321) 724-7000  
FAX: (321) 724-7240  
Spec Number 511009-883  
9

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