CA3304 [INTERSIL]

4-Bit, 25 MSPS, Flash A/D Converters; 4位, 25 MSPS时,Flash A / D转换器
CA3304
型号: CA3304
厂家: Intersil    Intersil
描述:

4-Bit, 25 MSPS, Flash A/D Converters
4位, 25 MSPS时,Flash A / D转换器

转换器
文件: 总11页 (文件大小:119K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
CA3304, CA3304A  
4-Bit, 25 MSPS,  
August 1997  
Flash A/D Converters  
Features  
Description  
• CMOS/SOS Low Power with Video Speed (Typ) . . 25mW  
The Intersil CA3304 is a CMOS parallel (FLASH) analog-to-  
digital converter designed for applications demanding both  
low-power consumption and high speed digitization. Digitiz-  
ing at 25MHz, for example, requires only about 35mW.  
• Parallel Conversion Technique  
• Single Power Supply Voltage . . . . . . . . . . . . 3V to 7.5V  
• 25MHz Sampling Rate (40ns Conversion Time) at 5V  
Supply  
The CA3304 operates over a wide, full-scale signal input  
voltage range of 0.5V up to the supply voltage. Power  
consumption is as low as 10mW, depending upon the clock  
frequency selected.  
• 4-Bit Latched Three-State Output with Overflow and  
Data Change Outputs  
1
/ LSB Maximum Nonlinearity (A Version)  
8
• Inherent Resistance to Latch-Up Due to SOS Process  
• Bipolar Input Range with Optional Second Supply  
• Wide Input Bandwidth (Typ) . . . . . . . . . . . . . . . . 25MHz  
The intrinsic high conversion rate makes the CA3304 types  
ideally suited for digitizing high speed signals. The overflow  
bit makes possible the connection of two or more CA3304s  
in series to increase the resolution of the conversion system.  
A series connection of two CA3304s may be used to pro-  
duce a 5-bit, 25MHz converter. Operation of two CA3304s in  
parallel doubles the conversion speed (i.e., increases the  
sampling rate from 25MHz to 50MHz). A data change pin  
indicates when the present output differs from the previous,  
thus allowing compaction of data storage.  
Applications  
• High Speed A/D Conversion  
• Ultrasound Signature Analysis  
• Transient Signal Analysis  
• High Energy Physics Research  
• General-Purpose Hybrid ADCs  
• Optical Character Recognition  
• Radar Pulse Analysis  
Sixteen paralleled auto-balanced voltage comparators mea-  
sure the input voltage with respect to a known reference to  
produce the parallel-bit outputs in the CA3304. Fifteen com-  
parators are required to quantize all input voltage levels in this  
4-bit converter, and the additional comparator is required for  
the overflow bit.  
• Motion Signature Analysis  
• Robot Vision  
• RSSI Circuits  
Ordering Information  
o
PART NUMBER LINEARITY (INL, DNL)  
SAMPLING RATE  
25MHz (40ns)  
25MHz (40ns)  
25MHz (40ns)  
25MHZ (40ns)  
25MHz (40ns)  
25MHz (40ns)  
TEMP. RANGE ( C)  
-40 to 85  
PACKAGE  
16 Ld PDIP  
PKG. NO.  
E16.3  
CA3304E  
CA3304AE  
CA3304M  
CA3304AM  
CA3304D  
CA3304AD  
±0.25 LSB  
±0.125 LSB  
±0.25 LSB  
±0.125 LSB  
±0.25 LSB  
±0.125 LSB  
-40 to 85  
16 Ld PDIP  
E16.3  
M16.3  
M16.3  
D16.3  
D16.3  
-40 to 85  
16 Ld SOIC (W)  
16 Ld SOIC (W)  
16 Ld SBDIP  
16 Ld SBDIP  
-40 to 85  
-55 to 125  
-55 to 125  
Pinout  
CA3304 (SBDIP, PDIP, SOIC)  
TOP VIEW  
BIT 1 (LSB)  
BIT 2  
1
2
3
4
5
6
7
8
16 V  
DD  
15 CLK  
BIT 3  
14 V  
AA  
-
BIT 4  
13 V  
12 V  
11 V  
10 V  
-
REF  
REF  
IN  
DATA CHANGE (DC)  
OVERFLOW (OF)  
CE2  
+
+
AA  
9
CE1  
V
SS  
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.  
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999  
File Number 1790.2  
4-7  
CA3304, CA3304A  
Absolute Maximum Ratings  
Thermal Information  
o
o
DC Supply Voltage Range (V  
or V +)  
AA  
Thermal Resistance (Typical, Note 1)  
θ
( C/W)  
θ
( C/W)  
DD  
JA  
JC  
(Voltage Referenced to V or V - Terminal,  
Whichever is More Negative) . . . . . . . . . . . . . . . . . . -0.5V to +8V  
Input Voltage Range  
SBDIP Package. . . . . . . . . . . . . . . . . . . .  
PDIP Package . . . . . . . . . . . . . . . . . . . . .  
SOIC Package. . . . . . . . . . . . . . . . . . . . .  
80  
90  
100  
22  
N/A  
N/A  
SS AA  
CE1, CE2 Inputs . . . . . . . . . . . . . . . . . . . V -0.5V to V  
+0.5V Maximum Junction Temperature  
SS  
DD  
o
Clock, V  
REF  
+, V  
-, V Inputs . . . . . V - -0.5V to V - +0.5V  
Ceramic Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 175 C  
Plastic Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 150 C  
Maximum Storage Temperature Range (T  
Maximum Lead Temperature (Soldering 10s). . . . . . . . . . . . . 300 C  
(SOIC - Lead Tips Only)  
REF  
IN AA AA  
o
DC Input Current, Any Input . . . . . . . . . . . . . . . . . . . . . . . . . ±20mA  
o
o
) . . . -65 C to 150 C  
STG  
o
Operating Conditions  
Recommended Supply Voltage Range (V  
DD  
or V +) . . . . .3V to 7.5V  
AA  
Recommended V + Voltage Range. . . . . . V  
-1V to V  
+2.5V  
AA  
DD  
DD  
Recommended V - Voltage Range . . . . . . .V -2.5V to V +1V  
AA  
SS  
SS  
Operating Temperature  
CA3304D . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -55 C to 125 C  
CA3304E, CA3304M. . . . . . . . . . . . . . . . . . . . . . . . -40 C to 85 C  
o
o
o
o
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation  
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.  
NOTE:  
1. θ is measured with the component mounted on an evaluation PC board in free air.  
JA  
o
Electrical Specifications T = 25 C, V  
+ = 2V, V  
DD  
= V + = 5V, V - = V  
AA AA REF  
- = V = GND, f = 25MHz  
SS CLK  
A
REF  
Unless Otherwise Specified  
PARAMETER  
SYSTEM PERFORMANCE  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNITS  
Resolution  
4
-
-
-
-
-
-
-
-
-
-
Bits  
LSB  
LSB  
LSB  
LSB  
LSB  
LSB  
LSB  
LSB  
Input Errors  
Integral Linearity  
Error  
CA3304A  
CA3304  
CA3304A  
CA3304  
CA3304A  
CA3304  
CA3304A  
CA3304  
±0.1  
±0.125  
±0.25  
±0.125  
±0.25  
±0.75  
±1.0  
±0.125  
Differential Linearity  
Error  
±0.1  
±0.125  
Offset Error  
(Unadjusted)  
-
-
-
-
Gain Error  
(Unadjusted)  
±0.75  
±1.0  
DYNAMIC CHARACTERISTICS (Input Signal Level 0.5dB Below Full Scale)  
Conversion Timing Aperture Delay  
-
-
-
3
-
-
-
ns  
dB  
dB  
Signal to Noise Ratio, SNR  
f
f
= 25MHz, f = 100kHz  
IN  
23.7  
23.6  
S
RMS Signal  
= 25MHz, f = 5MHz  
IN  
S
=
RMS Noise  
Signal to Noise Ratio, SINAD  
f
f
= 25MHz, f = 100kHz  
IN  
-
-
23.4  
22.8  
-
-
dB  
dB  
S
RMS Signal  
= 25MHz, f = 5MHz  
IN  
S
=
RMS Noise + Distortion  
Total Harmonic Distortion, THD  
f
f
f
f
= 25MHz, f = 100kHz  
IN  
-
-
-
-
-34.5  
-31.0  
3.67  
3.57  
-
-
-
-
dBc  
dBc  
Bits  
Bits  
S
S
S
S
= 25MHz, f = 5MHz  
IN  
Effective Number of Bits, ENOB  
= 25MHz, f = 100kHz  
IN  
= 25MHz, f = 5MHz  
IN  
ANALOG INPUTS  
Input Range  
Full Scale Input Range  
(Notes 1, 4)  
0.5  
-
V
V
AA  
Input Loading  
Input Capacitance  
Input Current  
-
-
10  
-
pF  
µA  
V
= 2V (Note 2)  
150  
200  
IN  
4-8  
CA3304, CA3304A  
o
Electrical Specifications T = 25 C, V  
+ = 2V, V  
DD  
= V + = 5V, V - = V  
AA AA REF  
- = V = GND, f = 25MHz  
SS CLK  
A
REF  
Unless Otherwise Specified (Continued)  
PARAMETER  
Allowable Input Bandwidth  
TEST CONDITIONS  
(Note 4)  
MIN  
TYP  
25  
MAX  
UNITS  
MHz  
-
-
f
/2  
CLK  
-
-3dB Input Bandwidth  
REFERENCE INPUTS  
Input Range  
40  
MHz  
V
V
+ Range  
- Range  
(Note 4)  
(Note 4)  
V
-+0.5  
-
-
-
V
+
V
V
REF  
REF  
AA  
AA  
V
-
V
+-0.5  
AA  
AA  
Input Loading  
DIGITAL INPUTS  
Digital Input  
Resistor Ladder Impedance  
V
= 5V, CLK = Low  
640  
960  
IN  
Maximum V , Low  
IN  
CLOCK  
(Notes 3, 4)  
(Note 4)  
-
-
-
0.3 x V  
AA  
V
V
CE1, CE2  
CLOCK  
-
0.3 x V  
DD  
Minimum V , High  
IN  
(Notes 3, 4)  
(Note 4)  
0.7 x V  
AA  
-
-
-
V
CE1, CE2  
0.7 x V  
-
-
V
DD  
Input Leakage, Except CLK  
Input Leakage, CLK  
V = 0V, 5V  
(Note 3)  
-
-
±1  
µA  
µA  
±100  
±150  
DIGITAL OUTPUTS  
Digital Outputs  
Output Low (Sink) Current  
Output High (Source) Current  
Three-State Leakage Current  
V
= 0.4V  
6
-3  
-
-
-
-
-
mA  
mA  
µA  
O
V
= 4.6V  
O
V
= 0V, 5V  
±0.2  
±5  
O
TIMING CHARACTERISTICS  
Conversion Timing  
Maximum Conversion Speed  
CLK = Square Wave  
25  
20  
35  
-
-
MSPS  
ns  
Auto-Balance Time (φ1)  
-
Sample Time (φ2)  
Data Valid Delay  
Data Hold Time  
20  
-
-
5000  
ns  
ns  
ns  
ns  
ns  
Output Timing  
(Note 4)  
(Note 4)  
30  
25  
15  
10  
40  
-
15  
-
Output Enable Time  
Output Disable Time  
-
-
-
POWER SUPPLY CHARACTERISTICS  
Device Current, I  
Continuous Clock  
Continuous φ2  
Continuous φ1  
Continuous Clock  
Continuous φ2  
-
-
-
-
-
5.5  
0.4  
2
-
-
mA  
mA  
mA  
mA  
mA  
AA  
-
Device Current, I  
1.5  
5
-
DD  
V
V
+ = 5V,  
10  
AA  
= CE1 = V - = CLK = GND  
AA  
SS  
V
+ = 7V  
Continuous φ1  
-
5
20  
mA  
AA  
NOTES:  
1. Full scale input range, V  
however.  
+ - V  
REF  
-, may be in the range of 0.5V to V + -V - volts. Linearity errors increase at lower full scale ranges,  
AA AA  
REF  
2. Input current is due to energy transferred to the input at the start of the sample period. The average value is dependent on input and V  
voltage.  
DD  
3. The CLK input is a CMOS inverter with a 50kfeedback resistor. It operates from the V + and V - supplies. It may be AC-coupled  
AA AA  
with a 1V  
minimum source.  
P-P  
4. Parameter not tested, but guaranteed by design or characterization.  
4-9  
CA3304, CA3304A  
Pin Descriptions  
PIN NUMBER  
NAME  
Bit 1  
Bit 2  
Bit 3  
Bit 4  
DC  
DESCRIPTION  
1
2
Bit 1 (LSB).  
Bit 2.  
3
Bit 3.  
Output Data Bits  
(High = True)  
4
Bit 4 (MSB).  
Data Change.  
Overflow.  
5
6
OF  
7
CE2  
Three-State Output Enable Input, active low. See the Chip Enable Truth Table.  
8
V
Digital Ground.  
SS  
CE1  
9
Three-State Output Enable Input, active high. See the Chip Enable Truth Table.  
Analog Power Supply, +5V.  
10  
11  
12  
13  
14  
15  
16  
V
+
AA  
V
Analog Signal Input.  
IN  
V
+
Reference Voltage Positive Input.  
Reference Voltage Negative Input.  
Analog Ground.  
REF  
V
-
REF  
V
-
AA  
CLK  
Clock Input.  
V
Digital Power Supply, +5V.  
DD  
CHIP ENABLE TRUTH TABLE  
CE1  
0
CE2  
BIT 1 - BIT 4  
Valid  
DC, OF  
Valid  
1
1
0
1
Three-State  
Three-State  
Valid  
X
Three-State  
X = Don't Care  
TABLE 1. OUTPUT CODE TABLE  
INPUT VOLTAGE (V)  
OUTPUT CODE  
CODE  
DESCRIPTION  
V
V
+ = 1V  
- = -1V  
1.6V  
0V  
2V  
0V  
3.2V  
0V  
4.8V  
0V  
DECIMAL  
COUNT  
REF  
REF  
OF  
0
0
0
B4  
0
0
0
B3  
0
0
0
B2  
0
0
1
B1  
0
1
0
Zero  
-1.000  
0
0.1  
0.2  
0
0
0.2  
0.4  
0
0.3  
0.6  
0
1
2
1 LSB  
-0.875  
0.125  
2 LSB  
-0.750  
0.250  
1
1
/ Full Scale -1 LSB  
2
-0.125  
0.7  
0.8  
0.9  
0.875  
1.000  
1.125  
1.4  
1.6  
1.8  
2.1  
2.4  
2.7  
0
0
0
0
1
1
1
0
0
1
0
0
1
0
1
7
8
9
1
/ Full Scale  
2
0
/
Full Scale +1 LSB  
0.125  
2
Full Scale -1 LSB  
Full Scale  
0.750  
0.875  
1.000  
0.125  
1.4  
1.5  
1.6  
0.1  
1.750  
1.875  
2.000  
0.125  
2.8  
3.0  
3.2  
0.2  
4.2  
4.5  
4.8  
0.3  
0
0
1
1
1
1
1
1
1
1
1
1
0
1
1
14  
15  
31  
Overflow  
Step Size  
NOTE:  
1. The voltages listed are the ideal centers of each output code shown as a function of its associated reference voltage See Ideal Transfer  
1
Curve Figure 6. The output code should exist for an input equal to the ideal center voltage ± / of the step size.  
2
4-10  
CA3304, CA3304A  
Functional Diagram  
THREE-STATE  
DRIVERS  
φ2  
OUTPUT  
REGISTER  
V
+
V
DD  
AA  
DATA  
CHANGE  
10  
16  
5
D Q  
CLK  
φ1  
φ1  
φ1  
φ2 φ1  
V
IN  
COUNT  
16  
11  
D
Q
1
/ R  
2
6
4
3
OVERFLOW  
LATCH  
16  
D Q  
CLK  
12  
CAB #16  
V
+
R
REF  
BIT 4  
D Q  
CLK  
COUNT  
ENCODER  
LOGIC  
ARRAY  
R
R
8
D
Q
BIT 3  
D Q  
CLK  
LATCH  
8
CAB #8  
2
1
BIT 2  
D Q  
CLK  
COUNT  
1
R
BIT 1 (LSB)  
D Q  
CLK  
V
-
D
Q
REF 1  
/ R  
2
LATCH  
0
13  
CAB COMPARATOR #1  
50k  
CLOCK  
15  
9
7
CE1  
CE2  
φ1 (AUTO BALANCE)  
14  
8
φ2 (SAMPLE UNKNOWN)  
V
-
V
SS  
AA  
Cascaded Auto Balance (CAB)  
NOTE: CE1 and CE2 inputs and data outputs have standard CMOS protection networks to V  
and V . Analog inputs and clock have  
SS  
DD  
standard CMOS protection networks to V + and V -.  
AA AA  
Timing Diagrams  
DATA SHIFTED INTO  
OUTPUT REGISTERS  
COMPARATOR DATA  
LATCHED  
φ 1  
AUTO  
φ 2  
AUTO  
BALANCE  
AUTO  
BALANCE  
1
BALANCE  
CLOCK  
SAMPLE 1  
SAMPLE 2  
SAMPLE 3  
0
1
0
DATA VALID 0  
DATA VALID 1  
DATA VALID 2  
B1 - B4, DC & OF  
t
HO  
t
D
FIGURE 1. TIMING DIAGRAM  
CE1  
CE2  
BITS 1-4  
DC, OF  
t
t
t
EN  
DIS  
EN  
t
DIS  
HIGH  
HIGH  
IMPEDANCE  
IMPEDANCE  
HIGH  
IMPEDANCE  
FIGURE 2. OUTPUT ENABLE/DISABLE TIMING  
4-11  
CA3304, CA3304A  
Timing Diagrams (Continued)  
SAMPLE ENDS  
SAMPLE ENDS  
φ 1  
φ 1  
φ 1  
φ 1  
φ 2  
φ 2  
φ 2  
φ 2  
CLOCK  
CLOCK  
t
t
D
D
OUTPUT  
OLD DATA  
NEW DATA  
OUTPUT  
OLD DATA  
OLD DATA + 1  
NEW DATA  
FIGURE 3A.  
FIGURE 3B.  
With 1 as standby state (indefinite standby, double pulse needed)  
φ
φ
With 2 as standby state (fastest method, but standby limited to 5µs  
maximum)  
SAMPLE ENDS  
CLOCK  
φ 1  
φ 1  
φ 2  
φ 2  
φ 2  
t
D
OUTPUT  
OLD DATA  
INVALID DATA  
NEW DATA  
FIGURE 3C.  
φ
With 2 as standby state (indefinite standby, lower power than 3B)  
FIGURE 3. PULSE-MODE TIMING DIAGRAMS  
Typical Performance Curves  
8
7
40  
38  
36  
34  
32  
6
5
4
30  
28  
3
2
-50  
-25  
0
25  
50  
75  
100  
5
10  
15  
20  
25  
30  
o
TEMPERATURE ( C)  
f
(MHz)  
S
FIGURE 4. DATA DELAY vs TEMPERATURE  
FIGURE 5. DEVICE CURRENT vs SAMPLE FREQUENCY  
4-12  
CA3304, CA3304A  
Typical Performance Curves (Continued)  
0.10  
0.25  
0.22  
0.20  
0.17  
0.15  
0.12  
0.10  
0.07  
0.05  
0.02  
0.00  
0.09  
0.08  
0.07  
INL  
0.06  
0.05  
0.04  
0.03  
0.02  
0.01  
0.00  
INL  
DNL  
DNL  
-40 -30 -20 -10  
0
10 20 30 40 50 60 70 80 90  
1
2
3
4
5
o
TEMPERATURE ( C)  
REFERENCE VOLTAGE (V)  
FIGURE 6. NON-LINEARITY vs TEMPERATURE  
FIGURE 7. NON-LINEARITY vs REFERENCE VOLTAGE  
0.50  
4.00  
0.45  
0.40  
0.35  
0.30  
0.25  
0.20  
0.15  
0.10  
0.05  
0.00  
3.80  
3.60  
3.40  
3.20  
3.00  
2.80  
2.60  
2.40  
INL  
2.20  
2.00  
DNL  
15  
20  
25  
30  
35  
-40 -30 -20 -10  
0
10 20 30 40 50 60 70 80 90  
o
f
(MHz)  
TEMPERATURE ( C)  
S
FIGURE 8. NON-LINEARITY vs SAMPLE FREQUENCY  
FIGURE 9. EFFECTIVE BITS vs TEMPERATURE  
7.00  
6.80  
6.60  
6.40  
6.20  
4.00  
3.80  
3.60  
3.40  
3.20  
3.00  
2.80  
2.60  
2.40  
6.00  
5.80  
5.60  
5.40  
5.20  
5.00  
2.20  
2.00  
0
1
2
3
4
5
6
7
8
9
10  
-40 -30 -20 -10  
0
10 20 30 40 50 60 70 80 90  
o
f (MHz)  
I
TEMPERATURE ( C)  
FIGURE 10. EFFECTIVE BITS vs INPUT FREQUENCY  
FIGURE 11. DEVICE CURRENT vs TEMPERATURE  
4-13  
CA3304, CA3304A  
Typical Performance Curves (Continued)  
27Ω  
+5V SUPPLY  
CA3304  
V
+
V
AA  
DD  
CE2  
+
+
0.1µF  
CER  
4.7µF TAN  
4.7µF TAN  
+
0.1µF  
CER  
4.7µF TAN  
V
+
2V REFERENCE  
REF  
0.1µF  
CER  
DC, OF,  
B1-B4  
OUTPUT DATA  
REMOTE  
2V INTO 50Ω  
CMOS CLOCK  
SOURCE  
V
CLK  
IN  
SOURCE  
V
V
-
CE1  
REF  
-
V
50Ω  
AA  
SS  
ANALOG  
GROUND  
DIGITAL  
GROUND  
FIGURE 12A. TYPICAL CA3304 UNIPOLAR CIRCUIT CONFIGURATION  
27Ω  
+5V SUPPLY  
CA3304  
V
+
V
AA  
DD  
CE2  
+
0.1µF  
CER  
4.7µF TAN  
+
0.1µF  
CER  
4.7µF TAN  
V
+
+1V REFERENCE  
REF  
0.1µF  
CER  
DC, OF,  
B1 - B4  
REMOTE  
±1V INTO 50Ω  
SOURCE  
OUTPUT DATA  
IN914  
V
V
IN  
CMOS CLOCK  
SOURCE  
-1V  
REFERENCE  
CLK  
-
REF  
0.1µF  
CER  
10K  
CE1  
50Ω  
0.001µF  
-1.5V SUPPLY  
V
SS  
V
-
AA  
0.1µF  
CER  
4.7µF TAN  
ANALOG  
GROUND  
DIGITAL  
GROUND  
FIGURE 12B. TYPICAL CA3304 BIPOLAR CIRCUIT CONFIGURATION  
FIGURE 12.  
4-14  
CA3304, CA3304A  
Continuous Clock Operation  
Description  
One complete conversion cycle can be traced through the  
CA3304 via the following steps. (Refer to timing diagram  
Figure 3). The rising edge of the clock input will start a  
“sample” phase. During this entire “High” state of the clock,  
the 16 comparators will track the input voltage and the 16  
latches will track the comparator outputs. At the falling edge  
of the clock, all 16 comparator outputs are captured by the  
16 latches. This ends the “sample” phase and starts the  
“auto balance” phase for the comparators. During this “Low”  
state of the clock the output of the latches propagates  
through the decode array and a 6-bit code appears at the D  
inputs of the output registers. On the next rising edge of the  
clock, this 6-bit code is shifted into the output registers and  
Device Operation  
A sequential parallel technique is used by the CA3304  
converter to obtain its high speed operation. The sequence  
consists of the “Auto Balance” phase and the “Sample  
Unknown” phase (Refer to the circuit diagram). Each  
conversion takes one clock cycle (see Note). The “Auto  
Balance” (φ1) occurs during the Low period of the clock  
cycle, and the “Sample Unknown” (φ2) occurs during the  
High period of the clock cycle.  
NOTE: This device requires only a single-phase clock. The terminology  
of φ1 and φ2 refers to the High and Low periods of the same clock.  
During the “Auto Balance” phase, a transmission-gate switch  
is used to connect each of 16 commutating capacitors to  
their associated ladder reference tap. Those tap voltages will  
be as follows:  
appears with time delay t as valid data at the output of the  
D
three-state drivers. This also marks the start of a new  
“sample” phase, thereby repeating the conversion process  
for this next cycle.  
V
(N) = [(V  
REF  
/16) x N] - [V  
/(2 x 16)]  
REF  
TAP  
Pulse Mode Operation  
= V  
REF  
[(2N - 1)/32],  
For sampling high speed nonrecurrent or transient data, the  
converter may be operated in a pulse mode in one of three  
ways. The fastest method is to keep the converter in the  
Sample Unknown phase, φ2, during the standby state. The  
device can now be pulsed through the Auto Balance phase  
with as little as 20ns. The analog value is captured on the  
leading edge of φ1 and is transferred into the output registers  
on the trailing edge of φ1. We are now back in the standby  
state, φ2, and another conversion can be started within  
20ns, but not later than 5µs due to the eventual droop of the  
commutating capacitors. Another advantage of this method  
is that it has the potential of having the lowest power drain.  
The larger the time ratio between φ2 and φ1, the lower the  
power consumption. (See Timing Diagram Figure 3A).  
Where:  
V
V
(N) = Reference ladder tap voltage at point N,  
= Voltage across V  
TAP  
REF  
- to V  
+, and  
REF  
REF  
N = Tap number (1 through 16).  
The other side of the capacitor is connected to a single-  
stage inverting amplifier whose output is shorted to its input  
by a switch. This biases the amplifier at its intrinsic trip point,  
which is approximately (V  
charge to their associated tap voltages, priming the circuit for  
the next phase.  
- V )/2. The capacitors now  
DD  
SS  
In the “Sample Unknown” phase, all ladder tap switches are  
opened, the comparator amplifiers are no longer shorted,  
and V is switched to all 16 capacitors. Since the other end  
IN  
The second method uses the Auto Balance phase, φ1, as  
the standby state. In this state the converter can stay  
indefinitely waiting to start a conversion. A conversion is  
performed by strobing the clock input with two φ2 pulses.  
The first pulse starts a Sample Unknown phase and  
captures the analog value in the comparator latches on the  
trailing edge. A second φ2 pulse is needed to transfer the  
date into the output registers. This occurs on the leading  
edge of the second pulse. The conversion now takes place  
in 40ns, but the repetition rate may be as slow as desired.  
The disadvantage to this method is the slightly higher device  
dissipation due to the low ratio of φ2 to φ1. (See Timing  
Diagram Figure 3B).  
of the capacitor is now looking into an effectively open cir-  
cuit, any voltage that differs from the previous tap voltage will  
appear as a voltage shift at the comparator amplifiers. All  
comparators whose tap voltages were lower than V will  
IN  
drive the comparator outputs to a “low” state. All compara-  
tors whose tap voltages were higher than V will drive the  
IN  
comparator outputs to a “high” state. A second, capacitor-  
coupled, auto-zeroed amplifier further amplifies the outputs.  
The status of all these comparator amplifiers are stored at the  
end of this phase (φ2), by a secondary latching amplifier stage.  
Once latched, the status of the 16 comparators is decoded by  
a 16 to 5 bit decode array and the results are clocked into a  
storage register at the rising edge of the next φ2.  
For applications requiring both indefinite standby and lowest  
power, standby can be in the φ2 (Sample Unknown) state  
with two φ1 pulses to generate valid data (see Figure 3C).  
The conversion process now takes 60ns. [Note that the  
If the input is greater than 31/32 x V  
, the overflow output  
REF  
will go “high”. (The bit outputs will remain high). If the output  
differs from that of the previous conversion, the data change  
output will go “high”.  
above numbers do not include the t (Output Delay) time.]  
D
Increased Accuracy  
A three-state buffer is used at the output of the 7 storage  
registers which are controlled by two chip-enable signals.  
CE1 will independently disable B1 through B4 when it is in a  
high state. CE2 will independently disable B1 through B4  
and the OF and DC buffers when it is in the low state.  
In most case the accuracy of the CA3304 should be  
sufficient without any adjustments. In applications where  
accuracy is of utmost importance, two adjustments can be  
made to obtain better accuracy; i.e., offset trim and gain trim.  
4-15  
CA3304, CA3304A  
Offset Trim  
Digital Input And Output Levels  
In general offset correction can be done in the preamp The clock input is a CMOS inverter operating from and with  
circuitry by introducing a DC shift to V or by the offset trim logic input levels determined by the V supplies. If V + or  
IN  
AA  
AA  
of the op amp. When this is not possible the V  
- input can  
V
- are outside the range of the digital supplies, it may be  
REF  
AA  
necessary to level shift the clock input to meet the required  
30% to 70% of V input swing. Figure 12B shows an exam-  
be adjusted to produce an offset trim.  
AA  
The theoretical input voltage to produce the first transition is  
ple for a negative V -.  
AA  
1
/ LSB. The equation is as follows:  
2
An alternate way of driving the clock is to capacitively couple  
1
1
V
(0 to 1 transition) = / LSB = / (V  
/16)  
REF  
IN  
2
2
the pin from a source of at least 1V  
. An internal 50kΩ  
P-P  
= V  
/32.  
feedback resistor will keep the DC level at the intrinsic trip  
point. Extremely non-symmetrical clock waveforms should  
be avoided, however.  
REF  
Adjust offset by applying this input voltage and adjusting the  
- voltage or input amplifier offset until an output code  
V
REF  
alternating between 0 and 1 occurs.  
The remaining digital inputs and outputs are referenced to  
V
and V . If TTL or other lower voltage sources are to  
DD  
SS  
Gain Trim  
drive the CA3304, either pull-up resistors or CD74HCT  
In general the gain trim can also be done in the preamp circuitry  
by introducing a gain adjustment for the op amp. When this is  
not possible, then a gain adjustment circuit should be made to  
series “QMOS” buffers are recommended.  
5-Bit Resolution  
adjust the reference voltage. To perform this trim, V should be  
set to the 15 to overflow transition. That voltage is / LSB less  
2
To obtain 5-bit resolution, two CA3304s can be wired together.  
Necessary ingredients include an open-ended ladder net-  
work, an overflow indicator, three-state outputs, and chip-  
enable controls - all of which are available on the CA3304.  
IN  
1
than V  
+ and is calculated as follows:  
REF  
V
(15 to 16 transition) = V  
- V  
/32  
lN  
REF  
REF  
(31/32).  
The first step for connecting a 5-bit circuit is to totem-pole  
the ladder networks, as illustrated in Figure 13. Since the  
absolute-resistance value of each ladder may vary, external  
trim of the mid-reference voltage may be required.  
= V  
REF  
To perform the gain trim, first do the offset trim and then  
apply the required V for the 15 to overflow transition. Now  
IN  
+ until that transition occurs on the outputs.  
adjust V  
REF  
The overflow output of the lower device now becomes the  
fifth bit. When it goes high, all counts must come from the  
upper device. When it goes low, all counts must come from  
the lower device. This is done simply by connecting the  
lower overflow signal to the CE1 control of the lower A/D  
converter and the CE2 control of the upper A/D converter.  
The three-state outputs of the two devices (bits 1 through 4)  
are now connected in parallel to complete the circuitry.  
Layout, Input And Supply Considerations  
The CA3304 should be mounted on a ground-planed,  
printed-circuit board, with good high-frequency decoupling  
capacitors mounted as close as possible. If the supply is  
noisy, decouple V + with a resistor as shown in Figure 12A.  
AA  
The CA3304 outputs current spikes to its input at the start of  
the auto-balance and sample clock phases.  
A low  
impedance source, such as a locally-terminated 50coax  
cable, should be used to drive the input terminal. A fast-  
settling buffer such as the HA-5033, HA-5242, or CA3450  
Definitions  
Dynamic Performance Definitions  
should be used if the source is high impedance. The V  
REF  
terminals also have current spikes, and should be well  
bypassed.  
Fast Fourier Transform (FFT) techniques are used to evaluate  
the dynamic performance of the CA3304. A low distortion sine  
wave is applied to the input, it is sampled, and the output is  
stored in RAM. The data is then transformed into the fre-  
quency domain with a 4096 point FFT and analyzed to evalu-  
ate the dynamic performance of the A/D. The sine wave input  
to the part is -0.5dB down from full scale for all these tests.  
Care should be taken to keep digital signals away from the  
analog input, and to keep digital ground currents away from  
the analog ground. If possible, the analog ground should be  
connected to digital ground only at the CA3304.  
Bipolar Operation  
Signal-to-Noise (SNR)  
The CA3304, with separate analog (V +, V -) and digital  
AA AA  
SNR is the measured RMS signal to RMS noise at a speci-  
fied input and sampling frequency. The noise is the RMS  
sum of all of the spectral components except the fundamen-  
tal and the first five harmonics.  
(V , V ) supply pins, allows true bipolar or negative input  
DD SS  
operation. The V - pin may be returned to a negative  
AA  
supply (observing maximum voltage ratings to V + or V  
AA DD  
and recommended rating to V ), thus allowing the V  
SS REF  
-
potential also to be negative. Figure 12B shows operation  
Signal-to-Noise + Distortion Ratio (SINAD)  
with an input range of -1V to +1V. Similarly, V + and  
AA  
+ could be maintained at a higher voltage than V  
SINAD is the measured RMS signal to RMS sum of all other  
spectral components below the Nyquist frequency excluding DC.  
V
,
REF  
for an input range above the digital supply.  
DD  
4-16  
CA3304, CA3304A  
Effective Number of Bits (ENOB)  
+5V  
V
+
DC  
OF  
NC  
NC  
AA  
The effective number of bits (ENOB) is derived from the  
SINAD data. ENOB is calculated from:  
V
DD  
+FULL  
SCALE  
REF.  
B4  
V
V
+
-
REF  
IN  
ENOB = (SINAD - 1.76 + V  
CORR  
)/6.02,  
B3  
V
V
B2  
REF  
where:  
V
= 0.5dB.  
CORR  
-
B1  
AA  
V
CE1  
CE2  
Total Harmonic Distortion (THD)  
SS  
CLK  
CLOCK  
INPUT  
THD is the ratio of the RMS sum of the first 5 harmonic  
components to the RMS value of the measured input signal.  
BUFFER  
INPUT  
1K  
CA3304  
ADJUST  
CENTER  
NC  
+5V  
CLK  
DC  
OF  
Operating and Handling Considerations  
B5 MSB  
V
+
AA  
V
V
V
HANDLING  
DD  
B4  
B4  
B3  
B2  
B1  
+
-
B3  
REF  
IN  
All inputs and outputs of CMOS devices have a network for  
electrostatic protection during handling. Recommended han-  
dling practices for CMOS devices are described in  
lCAN-6525. “Guide to Better Handling and Operation of  
CMOS Integrated Circuits.”  
B2  
V
V
B1  
REF  
-
CE1  
CE2  
AA  
+5V  
V
SS  
CA3304  
OPERATING  
FIGURE 13. TYPICAL CA3304 5-BIT CONFIGURATION  
Operating Voltage  
During operation near the maximum supply voltage limit, care  
should be taken to avoid or suppress power supply turn-on  
and turn-off transients, power supply ripple, or ground noise;  
any of these conditions must not cause the power supply  
voltages to exceed the absolute maximum rating.  
OVERFLOW  
15  
14  
13  
12  
11  
10  
9
Input Signals  
To prevent damage to the input protection circuit, input signals  
should never be greater than V  
or V + nor less than V  
DD  
AA SS  
or V - (depending upon which supply the protection network  
AA  
is referenced. See Maximum Ratings.). Input currents must  
not exceed 20mA even when the power supply is off.  
8
7
6
5
4
3
Unused Inputs  
2
1
0
A connection must be provided at every input terminal. All  
unused input terminals must be connected to either V  
or  
DD  
V
, whichever is appropriate.  
SS  
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15 16  
Output Short Circuits  
INPUT VOLTAGE  
Shorting of outputs to any supply potential may damage  
CMOS devices by exceeding the maximum device dissipation.  
FIGURE 14. IDEAL TRANSFER CURVE  
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.  
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without  
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate  
and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which  
may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.  
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com  
4-17  

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