ACS253D [INTERSIL]

Radiation Hardened Dual 4-Input Multiplexer with Three-State Outputs; 抗辐射双4输入多路复用器具有三态输出
ACS253D
型号: ACS253D
厂家: Intersil    Intersil
描述:

Radiation Hardened Dual 4-Input Multiplexer with Three-State Outputs
抗辐射双4输入多路复用器具有三态输出

复用器
文件: 总2页 (文件大小:51K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
ACS253MS  
Radiation Hardened  
Dual 4-Input Multiplexer with Three-State Outputs  
November 1997  
Features  
Description  
• QML Qualified Per MIL-PRF-38535 Requirements  
• 1.25Micron Radiation Hardened SOS CMOS  
The Radiation Hardened ACS253MS is a Dual 4-Channel Mul-  
tiplexer having two common binary control inputs for selecting 1  
of 4 data channels. All inputs and outputs are buffered and are  
designed for balanced propagation delay and transition times.  
• Radiation Environment  
- Latch-up Free Under any Conditions  
Separate Output Enable inputs are provided to ease system  
design. When OE1 or OE2 are set HIGH, the corresponding  
output is configured into a high impedance state.  
5
- Total Dose . . . . . . . . . . . . . . . . . . . . . . 3 x 10 RAD(Si)  
-10  
- SEU Immunity. . . . . . . . . . . <1 x 10  
Errors/Bit/Day  
2
- SEU LET Threshold . . . . . . . . . . . >100MeV/(mg/cm )  
The ACS253MS is fabricated on a CMOS Silicon on Sapphire  
(SOS) process, which provides an immunity to Single Event  
Latch-up and the capability of highly reliable performance in  
any radiation environment. These devices offer significant  
power reduction and faster performance when compared to  
ALSTTL types.  
• Input Logic Levels . . .V = (0.3)(V ), V = (0.7)(V  
IL CC IH  
)
CC  
• Output Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±8mA  
• Quiescent Supply Current. . . . . . . . . . . . . . . . . . . 400µs  
• Propagation Delay  
Specifications for Rad Hard QML devices are controlled  
by the Defense Supply Center in Columbus (DSCC). The  
SMD numbers listed below must be used when ordering.  
- Enable to Output . . . . . . . . . . . . . . . . . . . . . . . . . 12ns  
- Input or Address to Output . . . . . . . . . . . . . . . . . 15ns  
Detailed Electrical Specifications for the ACS253 are  
contained in SMD 5962-98007. A “hot-link” is provided  
on our homepage with instructions for downloading.  
http://www.intersil.com/data/sm/index.htm  
Applications  
• Digital Channel Selection  
• Data Routing  
• High Frequency Switching  
Ordering Information  
o
SMD PART NUMBER  
INTERSIL PART NUMBER  
ACS253DMSR-02  
TEMP. RANGE ( C)  
PACKAGE  
16 Ld SBDIP  
CASE OUTLINE  
CDIP2-T16  
CDIP2-T16  
CDFP4-F16  
CDFP4-F16  
N/A  
5962F9800701VEC  
-55 to 125  
N/A  
ACS253D/Sample-02  
ACS253KMSR-02  
25  
-55 to 125  
25  
16 Ld SBDIP  
16 Ld Flatpack  
16 Ld Flatpack  
Die  
5962F9800701VXC  
N/A  
N/A  
ACS253K/Sample-02  
ACS253HMSR-02  
25  
Pinouts  
ACS253 (SBDIP)  
TOP VIEW  
ACS253 (FLATPACK)  
TOP VIEW  
1OE  
1
2
3
4
5
6
7
8
16 V  
CC  
15 2OE  
14 S  
1OE  
1
2
3
4
5
6
7
8
16  
15  
14  
13  
12  
11  
10  
9
V
CC  
S
1I  
1I  
1I  
1I  
1
3
2
1
0
S
1I  
1I  
1I  
1I  
2OE  
1
3
2
1
0
0
S
0
13 2I  
12 2I  
11 2I  
10 2I  
2I  
2I  
2I  
2I  
3
2
1
0
3
2
1
0
1Y  
1Y  
GND  
2Y  
9
2Y  
GND  
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.  
File Number 4428  
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999  
1
ACS253MS  
Die Characteristics  
DIE DIMENSIONS:  
BACKSIDE FINISH:  
Size: 2390µm x 2390µm (94 mils x 94 mils)  
Thickness: 525µm ±25µm (20.6 mils ±1 mil)  
Bond Pad: 110µm x 110µm (4.3 mils x 4.3 mils)  
Sapphire  
PASSIVATION:  
Type: Phosphorous Silicon Glass (PSG)  
Thickness: 1.30µm ±0.15µm  
METALLIZATION:  
Type: Al  
Metal 1 Thickness: 0.7µm ±0.1µm  
Metal 2 Thickness: 1.0µm ±0.1µm  
SPECIAL INSTRUCTIONS:  
Bond V  
CC  
First  
SUBSTRATE  
ADDITIONAL INFORMATION:  
5
2
Silicon on Sapphire (SOS)  
Worst Case Density: <2.0 x 10 A/cm  
Transistor Count: 140  
SUBSTRATE POTENTIAL:  
Unbiased Insulator  
Metallization Mask Layout  
ACS253MS  
S1  
10E  
V
20E  
CC  
1I  
S
3
0
3
2
1
2I  
2I  
2I  
1I  
1I  
2
1
0
1T  
1Y  
GND  
2Y  
2I  
0
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.  
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without  
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate  
and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which  
may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.  
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com  
2

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