IRG4BC30FD [INFINEON]

INSULATED GATE BIPOLAR TRANSISTOR WITH ULTRAFAST SOFT RECOVERY DIODE(Vces=600V, Vce(on)typ.=1.59V, @Vge=15V, Ic=17A); 超快软恢复二极管绝缘栅双极晶体管( VCES = 600V ,的VCE(on )典型值= 1.59V , @ VGE = 15V , IC = 17A)
IRG4BC30FD
型号: IRG4BC30FD
厂家: Infineon    Infineon
描述:

INSULATED GATE BIPOLAR TRANSISTOR WITH ULTRAFAST SOFT RECOVERY DIODE(Vces=600V, Vce(on)typ.=1.59V, @Vge=15V, Ic=17A)
超快软恢复二极管绝缘栅双极晶体管( VCES = 600V ,的VCE(on )典型值= 1.59V , @ VGE = 15V , IC = 17A)

晶体 二极管 晶体管 功率控制 双极性晶体管 栅 局域网 超快软恢复二极管 快速软恢复二极管
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中文:  中文翻译
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PD -91451B  
IRG4BC30FD  
Fast CoPack IGBT  
INSULATED GATE BIPOLAR TRANSISTOR WITH  
ULTRAFAST SOFT RECOVERY DIODE  
Features  
C
• Fast: Optimized for medium operating  
frequencies ( 1-5 kHz in hard switching, >20  
kHz in resonant mode).  
VCES = 600V  
VCE(on) typ. =1.59V  
• Generation 4 IGBT design provides tighter  
G
parameter distribution and higher efficiency than  
Generation 3  
• IGBT co-packaged with HEXFREDTM ultrafast,  
ultra-soft-recovery anti-parallel diodes for use in  
bridge configurations  
@VGE = 15V, IC = 17A  
E
n-channel  
• Industry standard TO-220AB package  
Benefits  
• Generation -4 IGBT's offer highest efficiencies  
available  
• IGBT's optimized for specific application conditions  
• HEXFRED diodes optimized for performance with  
IGBT's . Minimized recovery characteristics require  
less/no snubbing  
• Designed to be a "drop-in" replacement for equivalent  
industry-standard Generation 3 IR IGBT's  
Absolute Maximum Ratings  
TO-220AB  
Parameter  
Max.  
600  
Units  
V
VCES  
C @ TC = 25°C  
Collector-to-Emitter Voltage  
Continuous Collector Current  
Continuous Collector Current  
Pulsed Collector Current   
I
31  
IC @ TC = 100°C  
17  
ICM  
120  
A
ILM  
Clamped Inductive Load Current ‚  
Diode Continuous Forward Current  
Diode Maximum Forward Current  
Gate-to-Emitter Voltage  
120  
IF @ TC = 100°C  
12  
IFM  
120  
VGE  
± 20  
100  
V
P
D @ TC = 25°C  
Maximum Power Dissipation  
Maximum Power Dissipation  
Operating Junction and  
W
PD @ TC = 100°C  
42  
TJ  
-55 to +150  
TSTG  
Storage Temperature Range  
Soldering Temperature, for 10 sec.  
Mounting Torque, 6-32 or M3 Screw.  
°C  
300 (0.063 in. (1.6mm) from case)  
10 lbf•in (1.1 N•m)  
Thermal Resistance  
Parameter  
Junction-to-Case - IGBT  
Min.  
------  
------  
------  
-----  
Typ.  
------  
------  
0.50  
Max.  
1.2  
Units  
RqJC  
RqJC  
RqCS  
RqJA  
Wt  
Junction-to-Case - Diode  
Case-to-Sink, flat, greased surface  
Junction-to-Ambient, typical socket mount  
Weight  
2.5  
°C/W  
------  
80  
-----  
------  
2 (0.07)  
------  
g (oz)  
www.irf.com  
1
12/8/98  
IRG4BC30FD  
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)  
Parameter  
Min. Typ. Max. Units  
----  
Conditions  
V(BR)CES  
Collector-to-Emitter Breakdown Voltageƒ 600 ----  
V
VGE = 0V, IC = 250µA  
DV(BR)CES/DTJ Temperature Coeff. of Breakdown Voltage ---- 0.69 ---- V/°C VGE = 0V, IC = 1.0mA  
VCE(on)  
Collector-to-Emitter Saturation Voltage  
---- 1.59 1.8  
---- 1.99 ----  
---- 1.70 ----  
3.0 ---- 6.0  
IC = 17A  
C = 31A  
VGE = 15V  
V
I
See Fig. 2, 5  
IC = 17A, TJ = 150°C  
VGE(th)  
Gate Threshold Voltage  
VCE = VGE, IC = 250µA  
DVGE(th)/DTJ Temperature Coeff. of Threshold Voltage ---- -11 ---- mV/°C VCE = VGE, IC = 250µA  
gfe  
Forward Transconductance „  
6.1  
----  
10  
----  
S
VCE = 100V, IC = 17A  
VGE = 0V, VCE = 600V  
ICES  
Zero Gate Voltage Collector Current  
---- 250  
µA  
---- ---- 2500  
---- 1.4 1.7  
---- 1.3 1.6  
VGE = 0V, VCE = 600V, TJ = 150°C  
VFM  
IGES  
Diode Forward Voltage Drop  
V
IC = 12A  
See Fig. 13  
IC = 12A, TJ = 150°C  
VGE = ±20V  
Gate-to-Emitter Leakage Current  
---- ---- ±100 nA  
Switching Characteristics @ TJ = 25°C (unless otherwise specified)  
Parameter  
Min. Typ. Max. Units  
Conditions  
Qg  
Total Gate Charge (turn-on)  
Gate - Emitter Charge (turn-on)  
Gate - Collector Charge (turn-on)  
Turn-On Delay Time  
RiseTime  
----  
51  
77  
12  
IC = 17A  
Qge  
Qgc  
td(on)  
tr  
---- 7.9  
nC  
ns  
VCC = 400V  
VGE = 15V  
TJ = 25°C  
See Fig. 8  
----  
----  
----  
19  
42  
26  
28  
----  
----  
IC = 17A, VCC = 480V  
td(off)  
tf  
Turn-Off Delay Time  
FallTime  
---- 230 350  
---- 160 230  
---- 0.63 ----  
---- 1.39 ----  
---- 2.02 3.9  
VGE = 15V, RG = 23W  
Energy losses include "tail" and  
diode reverse recovery.  
See Fig. 9, 10, 11, 18  
Eon  
Eoff  
Turn-On Switching Loss  
Turn-Off Switching Loss  
Total Switching Loss  
Turn-On Delay Time  
RiseTime  
mJ  
ns  
E
ts  
td(on)  
tr  
td(off)  
tf  
----  
----  
42  
27  
----  
----  
TJ = 150°C, See Fig. 9, 10, 11, 18  
IC = 17A, VCC = 480V  
Turn-Off Delay Time  
FallTime  
---- 310 ----  
---- 310 ----  
---- 3.2 ----  
---- 7.5 ----  
---- 1100 ----  
VGE = 15V, RG = 23W  
Energy losses include "tail" and  
diode reverse recovery.  
Measured 5mm from package  
VGE = 0V  
E
ts  
Total Switching Loss  
Internal Emitter Inductance  
Input Capacitance  
mJ  
nH  
LE  
Cies  
Coes  
Cres  
trr  
Output Capacitance  
Reverse Transfer Capacitance  
Diode Reverse Recovery Time  
----  
----  
----  
----  
74  
14  
42  
----  
----  
60  
pF  
ns  
A
VCC = 30V  
See Fig. 7  
ƒ = 1.0MHz  
TJ = 25°C See Fig.  
80 120  
TJ = 125°C  
TJ = 25°C See Fig.  
TJ = 125°C 15  
TJ = 25°C See Fig.  
TJ = 125°C 16  
---- 180 ---- A/µs TJ = 25°C See Fig.  
---- 120 ---- TJ = 125°C 17  
14  
IF = 12A  
Irr  
Diode Peak Reverse Recovery Current ---- 3.5 6.0  
---- 5.6 10  
---- 80 180  
---- 220 600  
VR = 200V  
Qrr  
Diode Reverse Recovery Charge  
nC  
di/dt 200A/µs  
di(rec)M/dt  
Diode Peak Rate of Fall of Recovery  
During tb  
2
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IRG4BC30FD  
20  
16  
12  
8
Duty cycle: 50%  
T
T
=
125°C  
90°C  
J
=
sink  
Gate drive as specified  
Turn-on losses include  
effects of reverse recovery  
Power Dissipation = 21W  
6 0% of rated  
vo ltage  
I
4
A
100  
0
0.1  
1
10  
f, Frequency (kHz)  
Fig. 1 - Typical Load Current vs. Frequency  
(Load Current = IRMS of fundamental)  
1000  
100  
10  
1000  
TJ = 25°C  
100  
10  
1
T
J
= 150°C  
J
T = 150°C  
TJ = 25°C  
V CC = 50V  
5µs PULSE WIDTH  
V GE = 15V  
20µs PULSE WIDTH  
A
13  
A
1
5
6
7
8
9
10  
11  
12  
1
10  
V
, Gate-to-Emitter Voltage (V)  
V
, Collector-to-Emitter Voltage (V)  
GE  
CE  
Fig. 2 - Typical Output Characteristics  
Fig. 3 - Typical Transfer Characteristics  
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3
IRG4BC30FD  
40  
2.5  
2.0  
1.5  
1.0  
V
= 15V  
G E  
VGE = 15V  
80µs PULSE WIDTH  
IC = 34A  
30  
20  
10  
0
IC = 17A  
IC = 8.5A  
A
25  
50  
75  
100  
125  
150  
-60 -40 -20  
0
20  
40  
60  
80  
100 120 140 160  
T
, Case Tem perature (°C)  
C
T
, Junction Temperature (°C)  
J
Fig. 4 - Maximum Collector Current vs. Case  
Fig. 5 - Typical Collector-to-Emitter Voltage  
Temperature  
vs.JunctionTemperature  
10  
1
D = 0.50  
0.20  
0.10  
P
D M  
0.1  
0.05  
t
1
0.02  
t
2
SINGLE PULSE  
0.01  
(THERMAL RES PONSE)  
Notes:  
1. D uty factor D  
=
t
/ t  
1
2
2. Peak T = P  
x Z  
+ T  
C
DM  
J
thJC  
1
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
10  
t1 , Rectangular Pulse Duration (sec)  
Fig.6-MaximumEffectiveTransientThermalImpedance,Junction-to-Case  
4
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IRG4BC30FD  
2000  
1600  
1200  
800  
400  
0
20  
16  
12  
8
VCE = 400V  
VGE = 0V  
f = 1 MHz  
Cies = Cge + Cgc + Cce  
Cres = Cce  
SHORTED  
IC  
= 17A  
Coes = Cce + Cgc  
C
ies  
C
C
oes  
res  
4
A
A
0
1
10  
100  
0
10  
20  
30  
40  
50  
60  
V
, Collector-to-Emitter Voltage (V)  
Q
, Total Gate Charge (nC)  
CE  
g
Fig. 7 - Typical Capacitance vs.  
Fig. 8 - Typical Gate Charge vs.  
Collector-to-Emitter Voltage  
Gate-to-Emitter Voltage  
10  
2.20  
2.10  
2.00  
1.90  
1.80  
VCC = 480V  
VGE = 15V  
IC = 34A  
TJ  
IC  
= 25°C  
= 17A  
I C = 17A  
IC = 8.5A  
1
R G = 23  
V GE = 15V  
V CC = 480V  
A
A
0.1  
-60  
-40 -20  
0
20  
40  
60  
80  
100 120 140 160  
0
20  
40  
60  
80  
T
, Junction Temperature (°C)  
R
G
, Gate Resistance (  
)
J
Fig. 9 - Typical Switching Losses vs. Gate  
Fig. 10 - Typical Switching Losses vs.  
Resistance  
Junction Temperature  
www.irf.com  
5
IRG4BC30FD  
8.0  
1000  
100  
10  
V
T
= 20V  
G E  
RG  
T J  
= 23  
= 150°C  
= 125°C  
J
VCC = 480V  
VGE = 15V  
6.0  
4.0  
2.0  
0.0  
SAFE OPERATING AREA  
A
1
1
10  
100  
1000  
0
10  
20  
30  
40  
V
, Collector-to-E m itter V oltage (V )  
I
, Collector-to-Emitter Current (A)  
C E  
C
Fig. 12 - Turn-Off SOA  
Fig. 11 - Typical Switching Losses vs.  
Collector-to-Emitter Current  
100  
T
= 150°C  
J
T
= 125°C  
J
10  
T
=
25°C  
J
1
0.4  
0.8  
1.2  
1.6  
2.0  
2.4  
Forward Voltage Drop - V  
(V)  
FM  
Fig. 13 - Maximum Forward Voltage Drop vs. Instantaneous Forward Current  
6
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IRG4BC30FD  
100  
10  
1
160  
120  
80  
VR = 200V  
TJ = 125°C  
TJ = 25°C  
VR = 200V  
TJ = 125°C  
TJ = 25°C  
I
= 24A  
F
I
= 24A  
F
I
= 12A  
F
I
= 12A  
F
I
= 6.0A  
F
I
= 6.0A  
F
40  
0
100  
1000  
100  
1000  
di /dt - (A/µs)  
f
di /dt - (A/µs)  
f
Fig. 15 - Typical Recovery Current vs. dif/dt  
Fig. 14 - Typical Reverse Recovery vs. dif/dt  
600  
10000  
VR = 200V  
TJ = 125°C  
TJ = 25°C  
VR = 200V  
TJ = 125°C  
TJ = 25°C  
400  
1000  
I
= 6.0A  
F
I
= 24A  
F
I
= 12A  
F
I
= 12A  
F
200  
100  
I
= 24A  
F
I
= 6.0A  
F
0
100  
10  
100  
1000  
1000  
di /dt - (A/µs)  
f
di /dt - (A/µs)  
f
Fig. 16 - Typical Stored Charge vs. dif/dt  
Fig. 17 - Typical di(rec)M/dt vs. dif/dt  
www.irf.com  
7
IRG4BC30FD  
Same type  
device as  
D.U.T.  
90%  
10%  
V
ge  
430µF  
80%  
V
C
of Vce  
D.U.T.  
90%  
t
d(off)  
10%  
5%  
I
C
t
f
t
r
t
d(on)  
t=5µs  
E
E
off  
on  
Fig. 18a - Test Circuit for Measurement of  
LM, Eon, Eoff(diode), trr, Qrr, Irr, td(on), tr, td(off), tf  
E
= (E +E  
)
ts  
on  
off  
I
Fig. 18b - Test Waveforms for Circuit of Fig. 18a, Defining  
Eoff, td(off), tf  
trr  
id dt  
tx  
trr  
GATE VO LTAG E D.U.T.  
Q rr =  
Ic  
10% +Vg  
+Vg  
tx  
10% Irr  
10% Vcc  
Vcc  
DUT VO LTAGE  
AND CURRENT  
Vce  
Vpk  
Irr  
10% Ic  
Vcc  
Ipk  
90% Ic  
Ic  
DIODE RECOVERY  
W AVEFORMS  
5% Vce  
tr  
td(on)  
t2  
Eon = Vce ie dt  
t1  
t4  
Erec = Vd id dt  
t3  
DIO DE REVERSE  
t1  
t2  
RECOVERY ENERG Y  
t3  
t4  
Fig. 18d - Test Waveforms for Circuit of Fig. 18a,  
Fig. 18c - Test Waveforms for Circuit of Fig. 18a,  
Defining Erec, trr, Qrr, Irr  
Defining Eon, td(on), tr  
8
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IRG4BC30FD  
Vg  
GATE SIG NAL  
DEVICE UNDER TEST  
CURRENT D.U.T.  
VOLTAGE IN D.U.T.  
CURRENT IN D1  
t0  
t1  
t2  
Figure 18e. Macro Waveforms for Figure 18a's Test Circuit  
480V  
4 X IC @25°C  
D.U.T.  
L
RL=  
1000V  
V *  
c
0 - 480V  
50V  
6000µF  
100V  
Figure 20. Pulsed Collector Current  
Figure 19. Clamped Inductive Load Test  
Test Circuit  
Circuit  
www.irf.com  
9
IRG4BC30FD  
Notes:  
Repetitive rating: VGE=20V; pulse width limited by maximum junction temperature (figure 20)  
‚VCC=80%(VCES), VGE=20V, L=10µH, RG = 23W (figure 19)  
ƒPulse width £80µs; duty factor £0.1%.  
„Pulse width 5.0µs, single shot.  
Case Outline — TO-220AB  
10.54 (.415)  
10.29 (.405)  
N O TES:  
- B -  
3.78 (.149)  
3.54 (.139)  
2.87 (.113)  
2.62 (.103)  
1
DIM ENSION S & TO LER ANCING  
4.69 (.185)  
4.20 (.165)  
PER ANSI Y14.5M , 1982.  
CO NT R OLLIN G DIM ENSIO N : IN CH .  
DIM ENSION S ARE SH O W N  
M ILLIM ET ER S (IN CHES).  
CO NF O RM S T O JEDEC O UT LINE  
TO -220AB.  
1.32 (.052)  
1.22 (.048)  
- A -  
2
3
6.47 (.255)  
6.10 (.240)  
4
4
15.24 (.600)  
14.84 (.584)  
1.15 (.045)  
MIN  
LEAD ASSIG NME NTS  
1 - G ATE  
1
2
3
2 - CO LLECT O R  
3 - EM ITT ER  
4 - CO LLECT O R  
3.96 (.160)  
3.55 (.140)  
3 X  
14.09 (.555)  
13.47 (.530)  
4.06 (.160)  
3.55 (.140)  
0.93 (.037)  
0.69 (.027)  
0.55 (.022)  
0.46 (.018)  
3 X  
3 X  
1.40 (.055)  
1.15 (.045)  
3 X  
0.36 (.014)  
M B A M  
2.92 (.115)  
2.64 (.104)  
2.54 (.100)  
2X  
CONFORMS TO JEDEC OUTLINE TO-220AB  
Dim ensions in Millim eters and (Inches)  
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331  
IR GREAT BRITAIN: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020  
IR CANADA: 15 Lincoln Court, Brampton, Ontario L6T3Z2, Tel: (905) 453 2200  
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590  
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111  
IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086  
IR SOUTHEAST ASIA: 1 Kim Seng Promenade, Great World City West Tower, 13-11, Singapore 237994 Tel: ++ 65 838 4630  
IR TAIWAN:16 Fl. Suite D. 207, Sec. 2, Tun Haw South Road, Taipei, 10673, Taiwan Tel: 886-2-2377-9936  
http://www.irf.com/  
Data and specifications subject to change without notice.  
12/98  
10  
www.irf.com  

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