IRF830AS [INFINEON]

Power MOSFET(Vdss=500V, Rds(on)max=1.40ohm, Id=5.0A); 功率MOSFET ( VDSS = 500V , RDS(ON)最大值= 1.40ohm ,ID = 5.0A )
IRF830AS
型号: IRF830AS
厂家: Infineon    Infineon
描述:

Power MOSFET(Vdss=500V, Rds(on)max=1.40ohm, Id=5.0A)
功率MOSFET ( VDSS = 500V , RDS(ON)最大值= 1.40ohm ,ID = 5.0A )

文件: 总10页 (文件大小:155K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
PD- 92006A  
SMPS MOSFET  
IRF830AS/L  
HEXFET® Power MOSFET  
Applications  
VDSS  
500V  
RDS(on) max  
ID  
5.0A  
l Switch Mode Power Supply (SMPS)  
l Uninterruptable Power Supply  
l High Speed Power Switching  
1.40Ω  
Benefits  
l Low Gate Charge Qg Results in Simple  
Drive Requirement  
l Improved Gate, Avalanche and Dynamic  
dv/dt Ruggedness  
l Fully Characterized Capacitance and  
Avalanche Voltage and Current  
l Effective Coss specified (See AN 1001)  
D2Pak  
TO-262  
Absolute Maximum Ratings  
Parameter  
Max.  
5.0  
Units  
A
ID @ TC = 25°C  
ID @ TC = 100°C  
IDM  
Continuous Drain Current, VGS @ 10V†  
Continuous Drain Current, VGS @ 10V†  
Pulsed Drain Current †  
Power Dissipation  
3.2  
20  
3.1  
PD @TA = 25°C  
PD @TC = 25°C  
W
Power Dissipation  
74  
Linear Derating Factor  
0.59  
W/°C  
V
VGS  
dv/dt  
TJ  
Gate-to-Source Voltage  
± 30  
Peak Diode Recovery dv/dt ƒ†  
Operating Junction and  
5.3  
V/ns  
-55 to + 150  
TSTG  
Storage Temperature Range  
Soldering Temperature, for 10 seconds  
°C  
300 (1.6mm from case )  
Typical SMPS Topologies:  
l Two Transistor Forward  
l Half Bridge and Full Bridge  
Notes  through are on page 10  
www.irf.com  
1
5/4/00  
IRF830AS/L  
Static @ TJ = 25°C (unless otherwise specified)  
Parameter  
Min. Typ. Max. Units  
Conditions  
VGS = 0V, ID = 250µA  
V(BR)DSS  
Drain-to-Source Breakdown Voltage  
500 ––– –––  
V
V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient ––– 0.60 –––  
V/°C Reference to 25°C, ID = 1mA†  
VGS = 10V, ID = 3.0A „  
VDS = VGS, ID = 250µA  
VDS = 500V, VGS = 0V  
VDS = 400V, VGS = 0V, TJ = 125°C  
VGS = 30V  
RDS(on)  
VGS(th)  
Static Drain-to-Source On-Resistance  
Gate Threshold Voltage  
––– ––– 1.4  
2.0 ––– 4.5  
V
––– ––– 25  
––– ––– 250  
––– ––– 100  
––– ––– -100  
IDSS  
Drain-to-Source Leakage Current  
µA  
nA  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
IGSS  
VGS = -30V  
Dynamic @ TJ = 25°C (unless otherwise specified)  
Parameter  
Forward Transconductance  
Total Gate Charge  
Min. Typ. Max. Units  
Conditions  
VDS = 50V, ID = 3.0A†  
ID = 5.0A  
gfs  
2.8 ––– –––  
S
Qg  
––– ––– 24  
––– ––– 6.3  
––– ––– 11  
Qgs  
Qgd  
td(on)  
tr  
Gate-to-Source Charge  
Gate-to-Drain ("Miller") Charge  
Turn-On Delay Time  
Rise Time  
nC VDS = 400V  
VGS = 10V, See Fig. 6 and 13 „†  
–––  
–––  
–––  
–––  
10 –––  
21 –––  
21 –––  
15 –––  
VDD = 250V  
ID = 5.0A  
ns  
td(off)  
tf  
Turn-Off Delay Time  
Fall Time  
RG = 14Ω  
RD = 49,See Fig. 10 „†  
VGS = 0V  
Ciss  
Coss  
Crss  
Coss  
Coss  
Coss eff.  
Input Capacitance  
––– 620 –––  
Output Capacitance  
Reverse Transfer Capacitance  
Output Capacitance  
Output Capacitance  
Effective Output Capacitance  
–––  
–––  
93 –––  
4.3 –––  
VDS = 25V  
pF  
ƒ = 1.0MHz, See Fig. 5  
VGS = 0V, VDS = 1.0V, ƒ = 1.0MHz  
VGS = 0V, VDS = 400V, ƒ = 1.0MHz  
VGS = 0V, VDS = 0V to 400V ꢀ†  
––– 886 –––  
–––  
–––  
27 –––  
39 –––  
Avalanche Characteristics  
Parameter  
Single Pulse Avalanche Energy‚†  
Typ.  
Max.  
230  
5.0  
Units  
mJ  
EAS  
IAR  
–––  
–––  
–––  
Avalanche Current†  
A
EAR  
Repetitive Avalanche Energy  
7.4  
mJ  
Thermal Resistance  
Parameter  
Junction-to-Case  
Typ.  
–––  
Max.  
1.7  
Units  
°C/W  
RθJC  
RθJA  
Junction-to-Ambient ( PCB Mounted, steady-state)*  
–––  
40  
Diode Characteristics  
Parameter  
Min. Typ. Max. Units  
Conditions  
D
IS  
Continuous Source Current  
(Body Diode)  
MOSFET symbol  
5.0  
20  
––– –––  
––– –––  
showing the  
A
G
ISM  
Pulsed Source Current  
(Body Diode)   
integral reverse  
p-n junction diode.  
S
VSD  
trr  
Diode Forward Voltage  
Reverse Recovery Time  
Reverse RecoveryCharge  
Forward Turn-On Time  
––– ––– 1.5  
––– 430 650  
––– 2.0 3.0  
V
TJ = 25°C, IS = 5.0A, VGS = 0V „  
ns  
TJ = 25°C, IF = 5.0A  
Qrr  
ton  
µC di/dt = 100A/µs „†  
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)  
2
www.irf.com  
IRF830AS/L  
100  
10  
1
100  
10  
VGS  
15V  
VGS  
15V  
10V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
TOP  
TOP  
10V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
BOTTOM 4.5V  
BOTTOM 4.5V  
1
4.5V  
4.5V  
0.1  
0.01  
20µs PULSE WIDTH  
20µs PULSE WIDTH  
°
°
T = 150 C  
J
T = 25 C  
J
0.1  
1
10  
100  
0.1  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
DS  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
100  
10  
2.5  
5.0A  
=
I
D
2.0  
1.5  
1.0  
0.5  
0.0  
°
T = 150 C  
J
°
T = 25 C  
J
1
V
= 50V  
DS  
V
= 10V  
GS  
20µs PULSE WIDTH  
0.1  
4.0  
-60 -40 -20  
0
20 40 60 80 100 120 140 160  
°
5.0  
6.0  
7.0 8.0  
T , Junction Temperature ( C)  
J
V
, Gate-to-Source Voltage (V)  
GS  
Fig 3. Typical Transfer Characteristics  
Fig 4. Normalized On-Resistance  
Vs. Temperature  
www.irf.com  
3
IRF830AS/L  
20  
16  
12  
8
10000  
I = 5.0A  
D
V G S = 0V,  
f = 1MHz  
Ciss = Cgs + Cgd  
,
Cds SHORTED  
V
V
V
= 400V  
= 250V  
= 100V  
DS  
DS  
DS  
Crss = C gd  
Coss = Cds + C gd  
1000  
100  
10  
C
C
iss  
oss  
4
C
rss  
FOR TEST CIRCUIT  
SEE FIGURE 13  
1
0
A
0
4
8
12  
16  
20  
24  
1
10  
100  
1000  
Q
, Total Gate Charge (nC)  
V
, Drain-to-Source Voltage (V)  
G
DS  
Fig 6. Typical Gate Charge Vs.  
Fig 5. Typical Capacitance Vs.  
Gate-to-Source Voltage  
Drain-to-Source Voltage  
100  
10  
1
100  
OPERATION IN THIS AREA LIMITED  
BY R  
DS(on)  
10us  
10  
100us  
°
T = 150 C  
J
1ms  
1
°
T = 25 C  
J
10ms  
°
T = 25 C  
C
°
T = 150 C  
Single Pulse  
J
V
= 0 V  
GS  
0.1  
0.2  
0.1  
0.4  
SD  
0.6  
0.8  
1.0  
1.2  
10  
100  
1000  
10000  
V
,Source-to-Drain Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
Fig 8. Maximum Safe Operating Area  
Fig 7. Typical Source-Drain Diode  
Forward Voltage  
4
www.irf.com  
IRF830AS/L  
RD  
5.0  
4.0  
3.0  
2.0  
1.0  
0.0  
VDS  
VGS  
10V  
D.U.T.  
RG  
+VDD  
-
Pulse Width ≤ 1 µs  
Duty Factor ≤ 0.1 %  
Fig 10a. Switching Time Test Circuit  
V
DS  
90%  
25  
50  
T
75  
100  
125  
150  
°
, Case Temperature ( C)  
C
10%  
V
GS  
t
t
r
t
t
f
Fig 9. Maximum Drain Current Vs.  
d(on)  
d(off)  
Case Temperature  
Fig 10b. Switching Time Waveforms  
10  
1
D = 0.50  
0.20  
0.10  
0.05  
P
DM  
0.1  
t
1
0.02  
0.01  
t
2
SINGLE PULSE  
(THERMAL RESPONSE)  
Notes:  
1. Duty factor D =  
t / t  
1 2  
2. Peak T = P  
x Z  
+ T  
C
J
DM  
thJC  
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
t , Rectangular Pulse Duration (sec)  
1
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case  
www.irf.com  
5
IRF830AS/L  
500  
400  
300  
200  
100  
0
1 5V  
I
D
TOP  
2.2A  
3.2A  
BOTTOM 5.0A  
DRIVER  
L
V
G
DS  
D.U.T  
R
+
V
D D  
-
I
A
AS  
20V  
0.01  
t
p
Fig 12a. Unclamped Inductive Test Circuit  
V
(BR)DSS  
t
p
25  
50  
75  
100  
125  
150  
°
Starting T , Junction Temperature ( C)  
J
I
AS  
Fig 12c. Maximum Avalanche Energy  
Fig 12b. Unclamped Inductive Waveforms  
Vs. Drain Current  
Q
G
10 V  
790  
7 8 5  
780  
7 7 5  
770  
Q
Q
GD  
GS  
V
G
Charge  
Fig 13a. Basic Gate Charge Waveform  
Current Regulator  
Same Type as D.U.T.  
50KΩ  
.2µF  
12V  
.3µF  
+
V
DS  
D.U.T.  
-
A
0.0  
1.0  
2.0  
3.0  
4.0  
5.0  
V
GS  
I
, Avalanc he Current (A)  
av  
3mA  
I
I
D
G
Current Sampling Resistors  
Fig 12d. Typical Drain-to-Source Voltage  
Vs. Avalanche Current  
Fig 13b. Gate Charge Test Circuit  
6
www.irf.com  
IRF830AS/L  
Peak Diode Recovery dv/dt Test Circuit  
+
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
D.U.T  
ƒ
-
+
‚
-
„
-
+

RG  
dv/dt controlled by RG  
+
-
Driver same type as D.U.T.  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
VDD  
Driver Gate Drive  
P.W.  
P.W.  
Period  
Period  
D =  
V
=10V  
*
GS  
D.U.T. I Waveform  
SD  
Reverse  
Recovery  
Current  
Body Diode Forward  
Current  
di/dt  
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  
V
DD  
Re-Applied  
Voltage  
Body Diode  
Forward Drop  
Inductor Curent  
I
SD  
Ripple 5%  
* VGS = 5V for Logic Level Devices  
Fig 14. For N-Channel HEXFET® Power MOSFET  
www.irf.com  
7
IRF830AS/L  
D2Pak Package Outline  
10.54 (.415)  
10.29 (.405)  
10.16 (.400)  
REF.  
- B -  
1.32 (.052)  
4.69 (.185)  
4.20 (.165)  
1.40 (.055)  
- A -  
M AX.  
1.22 (.048)  
2
6.47 (.255)  
6.18 (.243)  
1.78 (.070)  
1.27 (.050)  
15.49 (.610)  
14.73 (.580)  
2.79 (.110)  
2.29 (.090)  
1
3
2.61 (.103)  
2.32 (.091)  
5.28 (.208)  
4.78 (.188)  
8.89 (.350)  
REF.  
1.40 (.055)  
1.14 (.045)  
1.39 (.055)  
1.14 (.045)  
3X  
0.55 (.022)  
0.46 (.018)  
0.93 (.037)  
0.69 (.027)  
3X  
5.08 (.200)  
0.25 (.010)  
M
B A M  
MINIMUM RECOM MENDED FOOTPRINT  
11.43 (.450)  
8.89 (.350)  
LEAD ASSIGNMENTS  
1 - GATE  
NO TES:  
1
2
3
4
DIM ENSIONS AFTER SO LDER DIP.  
17.78 (.700)  
2 - DRAIN  
3 - SOURCE  
DIM ENSIONING & TOLERANCING PER ANSI Y14.5M , 1982.  
CONTROLLING DIM ENSION : INCH.  
HEATSINK & LEAD DIM ENSIONS DO NOT INCLUDE BURRS.  
3.81 (.150)  
2.54 (.100)  
2.08 (.082)  
2X  
2X  
Part Marking Information  
D2Pak  
A
INTERNATIONAL  
RECTIFIER  
LOGO  
PART NUM BER  
F530S  
9246  
1M  
DATE CODE  
(YYW W )  
9B  
ASSEM BLY  
YY  
=
YEAR  
= W EEK  
LOT CODE  
W W  
8
www.irf.com  
IRF830AS/L  
Package Outline  
TO-262 Outline  
Part Marking Information  
TO-262  
www.irf.com  
9
IRF830AS/L  
Tape & Reel Information  
D2Pak  
TR R  
1 .60 (.0 63)  
1 .50 (.0 59)  
1.60 (.063)  
1.50 (.059)  
4.10 (.161)  
3.90 (.153)  
0.368 (.0145)  
0.342 (.0135)  
FEE D D IREC TIO N  
TR L  
11.60 (.457)  
11.40 (.449)  
1 .85 (.0 73)  
1 .65 (.0 65)  
24.30 (.957)  
23.90 (.941)  
15.42 (.609)  
15.22 (.601)  
1.75 (.069)  
1.25 (.049)  
10.90 (.429)  
10.70 (.421)  
4.72 (.136)  
4.52 (.178)  
16.10 (.634)  
15.90 (.626)  
FEED D IRE CTION  
13.50 (.532)  
12.80 (.504)  
27.40 (1.079)  
23.90 (.941)  
4
330.00  
(14.173)  
M AX.  
60.00 (2.362)  
M IN.  
30.40 (1.197)  
M AX.  
NO TES  
1. CO M FORM S TO EIA-418.  
2. CO NTROLLING DIM ENSIO N: M ILLIM ETER.  
3. DIM ENSION M EASURED  
:
26.40 (1.039)  
24.40 (.961)  
4
@ HUB.  
3
4. INCLUDES FLANGE DISTORTION  
@
O UTER EDGE.  
Notes:  
Repetitive rating; pulse width limited by  
„Pulse width 300µs; duty cycle 2%.  
max. junction temperature. ( See fig. 11 )  
‚Starting TJ = 25°C, L = 18mH  
Coss eff. is a fixed capacitance that gives the same charging time  
RG = 25, IAS = 5.0A. (See Figure 12)  
as Coss while VDS is rising from 0 to 80% VDSS  
ƒISD 5.0A, di/dt 370A/µs, VDD V(BR)DSS  
TJ 150°C  
,
†Uses IRF830A data and test conditions  
* When mounted on 1" square PCB ( FR-4 or G-10 Material ).  
For recommended footprint and soldering techniques refer to application note #AN-994.  
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105  
IR EUROPEAN REGIONAL CENTRE: 439/445 Godstone Rd, Whyteleafe, Surrey CR3 OBL, UK Tel: ++ 44 (0)20 8645 8000  
IR CANADA: 15 Lincoln Court, Brampton, Ontario L6T3Z2, Tel: (905) 453 2200  
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 (0) 6172 96590  
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 011 451 0111  
IR JAPAN: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo 171 Tel: 81 (0)3 3983 0086  
IR SOUTHEAST ASIA: 1 Kim Seng Promenade, Great World City West Tower, 13-11, Singapore 237994 Tel: ++ 65 (0)838 4630  
IR TAIWAN:16 Fl. Suite D. 207, Sec. 2, Tun Haw South Road, Taipei, 10673 Tel: 886-(0)2 2377 9936  
Data and specifications subject to change without notice. 5/00  
10  
www.irf.com  

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