IKW40T12 [INFINEON]
IGBT TRENCHSTOP™;型号: | IKW40T12 |
厂家: | Infineon |
描述: | IGBT TRENCHSTOP™ 双极性晶体管 |
文件: | 总16页 (文件大小:510K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
IKW40T120
®
TrenchStop Series
®
Low Loss DuoPack : IGBT in TrenchStop and Fieldstop technology with soft,
fast recovery anti-parallel Emitter Controlled HE diode
C
E
Best in class TO247
Short circuit withstand time – 10s
Designed for :
G
- Frequency Converters
- Uninterrupted Power Supply
TrenchStop and Fieldstop technology for 1200 V applications
®
offers :
- very tight parameter distribution
PG-TO-247-3
- high ruggedness, temperature stable behavior
NPT technology offers easy parallel switching capability due to
positive temperature coefficient in VCE(sat)
Low EMI
Low Gate Charge
Very soft, fast recovery anti-parallel Emitter Controlled HE diode
Qualified according to JEDEC1 for target applications
Pb-free lead plating; RoHS compliant
Complete product spectrum and PSpice Models : http://www.infineon.com/igbt/
Type
VCE
IC
VCE(sat),Tj=25°C Tj,max Marking Code
1.7V K40T120
Package
IKW40T120
1200V 40A
PG-TO-247-3
150C
Maximum Ratings
Parameter
Symbol
Value
Unit
Collector-emitter voltage
DC collector current
TC = 25C
VC E
IC
1200
V
A
75
40
TC = 100C
Pulsed collector current, tp limited by Tjmax
Turn off safe operating area
VCE 1200V, Tj 150C
Diode forward current
ICp ul s
-
105
105
IF
80
40
TC = 25C
TC = 100C
Diode pulsed current, tp limited by Tjmax
IFp ul s
VG E
tSC
105
20
10
Gate-emitter voltage
V
Short circuit withstand time2)
VGE = 15V, VCC 1200V, Tj 150C
Power dissipation
s
Pt ot
270
W
TC = 25C
Operating junction temperature
Storage temperature
Tj
-40...+150
-55...+150
C
Tst g
1 J-STD-020 and JESD-022
2) Allowed number of short circuits: <1000; time between short circuits: >1s.
1
Rev. 2.3 12.03.2013
IFAG IPV TD VLS
IKW40T120
®
TrenchStop Series
Soldering temperature, 1.6mm (0.063 in.) from case for 10s
-
260
2
Rev. 2.3 12.03.2013
IFAG IPV TD VLS
IKW40T120
®
TrenchStop Series
Thermal Resistance
Parameter
Symbol
Conditions
Max. Value
Unit
Characteristic
IGBT thermal resistance,
junction – case
Rt hJC
Rt hJC D
Rt hJA
0.45
0.81
40
K/W
Diode thermal resistance,
junction – case
Thermal resistance,
junction – ambient
Electrical Characteristic, at Tj = 25 C, unless otherwise specified
Value
typ.
Parameter
Symbol
Conditions
Unit
min.
max.
Static Characteristic
Collector-emitter breakdown voltage V( BR )C ES VG E =0V, IC =1.5mA
1200
-
-
V
Collector-emitter saturation voltage
VC E( sat ) VG E = 15V, IC =40A
Tj =25C
-
-
-
1.7
2.1
2.3
2.3
-
-
Tj =125C
Tj =150C
Diode forward voltage
VF
VG E =0V, IF =40A
Tj =25C
-
-
-
1.75
1.75
1.75
2.3
-
-
Tj =125C
Tj =150C
Gate-emitter threshold voltage
VG E( t h)
ICE S
IC =1.5mA,VC E =VG E
5.0
5.8
6.5
Zero gate voltage collector current
VC E =1200V,
VG E =0V
mA
Tj =25C
-
-
-
-
-
-
0.4
4.0
600
-
Tj =150C
Gate-emitter leakage current
Transconductance
IGE S
gfs
VC E =0V,VG E =20V
VC E =20V, IC =40A
-
nA
S
21
6
Integrated gate resistor
RG int
Ω
3
Rev. 2.3 12.03.2013
IFAG IPV TD VLS
IKW40T120
®
TrenchStop Series
Dynamic Characteristic
Input capacitance
Ci ss
VC E =25V,
VG E =0V,
f=1MHz
-
-
-
-
2500
130
110
203
-
-
-
-
pF
Output capacitance
Reverse transfer capacitance
Gate charge
Cos s
Crs s
QGat e
VC C =960V, IC =40A
VG E =15V
nC
nH
A
Internal emitter inductance
LE
-
-
13
-
-
measured 5mm (0.197 in.) from case
Short circuit collector current1)
IC( SC )
210
VG E =15V,tSC10s
VC C = 600V,
Tj = 25C
Switching Characteristic, Inductive Load, at Tj=25 C
Value
typ.
Parameter
Symbol
Conditions
Unit
min.
max.
IGBT Characteristic
Turn-on delay time
Rise time
td( o n)
tr
td( of f)
tf
-
-
-
-
-
-
-
48
34
-
-
-
-
-
-
-
ns
Tj =25C,
VC C =600V,IC =40A,
VG E =0/15V,
Turn-off delay time
Fall time
480
70
RG =15,
L2 ) =180nH,
C2) =39pF
Turn-on energy
Eo n
Eo ff
Et s
3.3
3.2
6.5
mJ
Energy losses include
“tail” and diode
reverse recovery.
Turn-off energy
Total switching energy
Anti-Parallel Diode Characteristic
Diode reverse recovery time
Diode reverse recovery charge
trr
-
-
-
-
240
3.8
28
-
-
ns
Tj =25C,
Qrr
µC
A
VR =600V, IF =40A,
diF/dt=800A/s
Diode peak reverse recovery current Irr m
Diode peak rate of fall of reverse
recovery current during tb
dirr /dt
370
A/s
1) Allowed number of short circuits: <1000; time between short circuits: >1s.
2) Leakage inductance L and Stray capacity C due to dynamic test circuit in Figure E.
4
Rev. 2.3 12.03.2013
IFAG IPV TD VLS
IKW40T120
®
TrenchStop Series
Switching Characteristic, Inductive Load, at Tj=150 C
Value
Unit
Parameter
Symbol
Conditions
min.
typ.
max.
IGBT Characteristic
Turn-on delay time
Rise time
td( o n)
tr
td( of f)
tf
-
-
-
-
-
-
-
52
40
-
-
-
-
-
-
-
ns
Tj =150C
VC C =600V,IC =40A,
VG E =0/15V,
Turn-off delay time
Fall time
580
120
5.0
5.4
10.4
RG = 15,
L1 ) =180nH,
C1) =39pF
Turn-on energy
Eo n
Eo ff
Et s
mJ
Energy losses include
“tail” and diode
reverse recovery.
Turn-off energy
Total switching energy
Anti-Parallel Diode Characteristic
Diode reverse recovery time
Diode reverse recovery charge
trr
-
-
-
-
410
8.8
36
-
-
-
ns
Tj =150C
Qrr
µC
A
VR =600V, IF =40A,
diF/dt=800A/s
Diode peak reverse recovery current Irr m
Diode peak rate of fall of reverse
recovery current during tb
dirr /dt
330
A/s
1) Leakage inductance L and Stray capacity C due to dynamic test circuit in Figure E.
Rev. 2.3 12.03.2013
5
IFAG IPV TD VLS
IKW40T120
®
TrenchStop Series
100A
10A
1A
tp=3µs
100A
80A
60A
40A
20A
0A
TC=80°C
10µs
TC=110°C
50µs
150µs
500µs
Ic
20ms
DC
Ic
0,1A
10Hz
100Hz
1kHz
10kHz
100kHz
1V
10V
100V
1000V
f, SWITCHING FREQUENCY
VCE, COLLECTOR-EMITTER VOLTAGE
Figure 1. Collector current as a function of
switching frequency
Figure 2. Safe operating area
(D = 0, TC = 25C,
(Tj 150C, D = 0.5, VCE = 600V,
VGE = 0/+15V, RG = 15)
Tj 150C;VGE=15V)
70A
60A
50A
40A
30A
20A
10A
0A
250W
200W
150W
100W
50W
0W
25°C
75°C
125°C
25°C
50°C
75°C
100°C
125°C
TC, CASE TEMPERATURE
TC, CASE TEMPERATURE
Figure 3. Power dissipation as a function of
case temperature
Figure 4. Collector current as a function of
case temperature
(Tj 150C)
(VGE 15V, Tj 150C)
6
Rev. 2.3 12.03.2013
IFAG IPV TD VLS
IKW40T120
®
TrenchStop Series
100A
90A
80A
70A
60A
50A
40A
30A
20A
10A
0A
100A
90A
VGE=17V
VGE=17V
80A
70A
60A
50A
40A
30A
20A
10A
0A
15V
15V
13V
11V
9V
13V
11V
9V
7V
7V
0V
1V
2V
3V
4V
5V
6V
0V
1V
2V
3V
4V
5V
6V
VCE, COLLECTOR-EMITTER VOLTAGE
VCE, COLLECTOR-EMITTER VOLTAGE
Figure 5. Typical output characteristic
Figure 6. Typical output characteristic
(Tj = 25°C)
(Tj = 150°C)
100A
90A
80A
70A
60A
50A
40A
30A
3,5V
3,0V
2,5V
2,0V
1,5V
1,0V
0,5V
0,0V
IC=80A
IC=40A
IC=25A
IC=10A
20A
TJ=150°C
25°C
10A
0A
-50°C
0°C
50°C
100°C
0V
2V
4V
6V
8V
10V 12V
VGE, GATE-EMITTER VOLTAGE
TJ, JUNCTION TEMPERATURE
Figure 7. Typical transfer characteristic
Figure 8. Typical collector-emitter
(VCE=20V)
saturation voltage as a function of
junction temperature
(VGE = 15V)
7
Rev. 2.3 12.03.2013
IFAG IPV TD VLS
IKW40T120
®
TrenchStop Series
td(off)
1000 ns
td(off)
100ns
10ns
1ns
tf
tf
100 ns
td(on)
td(on)
tr
tr
10 ns
1 ns
0A
20A
40A
60A
IC, COLLECTOR CURRENT
RG, GATE RESISTOR
Figure 9. Typical switching times as a
function of collector current
(inductive load, TJ=150°C,
Figure 10. Typical switching times as a
function of gate resistor
(inductive load, TJ=150°C,
VCE=600V, VGE=0/15V, RG=15Ω,
Dynamic test circuit in Figure E)
VCE=600V, VGE=0/15V, IC=40A,
Dynamic test circuit in Figure E)
td(off)
7V
6V
5V
4V
3V
2V
1V
0V
max.
typ.
100ns
tf
min.
td(on)
tr
10ns
-50°C
0°C
50°C
100°C
150°C
0°C
50°C
100°C
150°C
TJ, JUNCTION TEMPERATURE
TJ, JUNCTION TEMPERATURE
Figure 11. Typical switching times as a
Figure 12. Gate-emitter threshold voltage as
a function of junction temperature
(IC = 1.5mA)
function of junction temperature
(inductive load, VCE=600V,
VGE=0/15V, IC=40A, RG=15Ω,
Dynamic test circuit in Figure E)
8
Rev. 2.3 12.03.2013
IFAG IPV TD VLS
IKW40T120
®
TrenchStop Series
*) Eon and Etsinclude losses
due to diode recovery
*) Eon and Ets include losses
due to diode recovery
Ets*
15 mJ
10 mJ
5 mJ
25,0mJ
20,0mJ
15,0mJ
10,0mJ
5,0mJ
Ets*
Eon*
Eon*
Eoff
Eoff
0,0mJ
0 mJ
10A 20A 30A 40A 50A 60A 70A
IC, COLLECTOR CURRENT
RG, GATE RESISTOR
Figure 13. Typical switching energy losses
as a function of collector current
(inductive load, TJ=150°C,
Figure 14. Typical switching energy losses
as a function of gate resistor
(inductive load, TJ=150°C,
VCE=600V, VGE=0/15V, RG=15Ω,
Dynamic test circuit in Figure E)
VCE=600V, VGE=0/15V, IC=40A,
Dynamic test circuit in Figure E)
*) Eon and Ets include losses
*) Eon and Ets include losses
due to diode recovery
15mJ
due to diode recovery
15mJ
Ets*
10mJ
5mJ
0mJ
10mJ
Ets*
Eoff
5mJ
Eoff
Eon*
Eon*
0mJ
50°C
100°C
150°C
400V
500V
600V
700V
800V
TJ, JUNCTION TEMPERATURE
VCE, COLLECTOR-EMITTER VOLTAGE
Figure 15. Typical switching energy losses
as a function of junction
Figure 16. Typical switching energy losses
as a function of collector emitter
voltage
temperature
(inductive load, VCE=600V,
VGE=0/15V, IC=40A, RG=15Ω,
Dynamic test circuit in Figure E)
(inductive load, TJ=150°C,
VGE=0/15V, IC=40A, RG=15Ω,
Dynamic test circuit in Figure E)
9
Rev. 2.3 12.03.2013
IFAG IPV TD VLS
IKW40T120
®
TrenchStop Series
Ciss
15V
10V
5V
1nF
100pF
10pF
240V
960V
Coss
Crss
0V
0V
10V
20V
0nC
50nC
100nC 150nC 200nC 250nC
QGE, GATE CHARGE
VCE, COLLECTOR-EMITTER VOLTAGE
Figure 17. Typical gate charge
Figure 18. Typical capacitance as a function
of collector-emitter voltage
(IC=40 A)
(VGE=0V, f = 1 MHz)
15µs
10µs
5µs
300A
200A
100A
0A
0µs
12V
14V
16V
12V
14V
16V
18V
VGE, GATE-EMITTETR VOLTAGE
VGE, GATE-EMITTETR VOLTAGE
Figure 19. Short circuit withstand time as a
function of gate-emitter voltage
(VCE=600V, start at TJ=25°C)
Figure 20. Typical short circuit collector
current as a function of gate-
emitter voltage
(VCE 600V, Tj 150C)
10
Rev. 2.3 12.03.2013
IFAG IPV TD VLS
IKW40T120
®
TrenchStop Series
VCE
600V
400V
200V
0V
600V
400V
200V
0V
60A
40A
20A
0A
60A
40A
20A
0A
IC
VCE
IC
0us
0us
0.5us
1us
1.5us
0.5us
1us
1.5us
t, TIME
t, TIME
Figure 21. Typical turn on behavior
(VGE=0/15V, RG=15Ω, Tj = 150C,
Dynamic test circuit in Figure E)
Figure 22. Typical turn off behavior
(VGE=15/0V, RG=15Ω, Tj = 150C,
Dynamic test circuit in Figure E)
D=0.5
D=0.5
0.2
0.1
0.2
10-1K/W
10-1K/W
10-2K/W
10-3K/W
R , ( K / W )
0.228
0.257
0.238
0.087
, ( s )
1.01*10-1
1.15*10-2
1.30*10-3
1.53*10-4
0.1
0.05
R , ( K / W )
0.159
0.133
0.120
0.038
, ( s )
1.10*10-1
1.56*10-2
1.35*10-3
1.51*10-4
0.02
0.05
0.01
single pulse
0.02
R1
R2
0.01
10-2K/W
single pulse
R1
R2
C1 =1 /R1 C2 =2 /R2
C1 =1 /R1 C2 =2 /R2
10-3K/W
10µs
100µs
1ms
10ms
100ms
10µs
100µs
1ms
10ms
100ms
tP, PULSE WIDTH
tP, PULSE WIDTH
Figure 23. IGBT transient thermal resistance
Figure 24. Diode transient thermal
(D = tp / T)
impedance as a function of pulse
width
(D=tP/T)
11
Rev. 2.3 12.03.2013
IFAG IPV TD VLS
IKW40T120
®
TrenchStop Series
8µC
6µC
4µC
TJ=150°C
600ns
500ns
400ns
300ns
200ns
100ns
0ns
TJ=150°C
TJ=25°C
2µC
0µC
TJ=25°C
400A/µs
600A/µs
800A/µs 1000A/µs
400A/µs
600A/µs
800A/µs
1000A/µs
diF/dt, DIODE CURRENT SLOPE
diF/dt, DIODE CURRENT SLOPE
Figure 23. Typical reverse recovery time as
a function of diode current slope
(VR=600V, IF=40A,
Figure 24. Typical reverse recovery charge
as a function of diode current
slope
Dynamic test circuit in Figure E)
(VR=600V, IF=40A,
Dynamic test circuit in Figure E)
TJ=25°C
40A
-400A/µs
-300A/µs
-200A/µs
-100A/µs
-0A/µs
TJ=150°C
35A
TJ=150°C
30A
TJ=25°C
25A
20A
15A
10A
5A
0A
400A/µs
600A/µs
800A/µs
1000A/µs
400A/µs
600A/µs
800A/µs
1000A/µs
diF/dt, DIODE CURRENT SLOPE
diF/dt, DIODE CURRENT SLOPE
Figure 25. Typical reverse recovery current
as a function of diode current
slope
Figure 26. Typical diode peak rate of fall of
reverse recovery current as a
function of diode current slope
(VR=600V, IF=40A,
(VR=600V, IF=40A,
Dynamic test circuit in Figure E)
Dynamic test circuit in Figure E)
12
Rev. 2.3 12.03.2013
IFAG IPV TD VLS
IKW40T120
®
TrenchStop Series
100A
80A
60A
40A
20A
0A
TJ=25°C
IF=80A
150°C
2,0V
40A
1,5V
25A
10A
1,0V
0,5V
0,0V
-50°C
0°C
50°C
100°C
0V
1V
2V
VF, FORWARD VOLTAGE
TJ, JUNCTION TEMPERATURE
Figure 27. Typical diode forward current as
a function of forward voltage
Figure 28. Typical diode forward voltage as a
function of junction temperature
13
Rev. 2.3 12.03.2013
IFAG IPV TD VLS
IKW40T120
®
TrenchStop Series
14
Rev. 2.3 12.03.2013
IFAG IPV TD VLS
IKW40T120
®
TrenchStop Series
i,v
t
=t +t
S F
di /dt
r r
F
Q
=Q +Q
r r
S
F
t
r r
I
t
t
F
S
F
t
Q
10% I
r r m
Q
S
F
I
r r m
di /dt
V
r r
r r m
R
90% I
Figure C. Definition of diodes
switching characteristics
1
2
n
r1
r 2
r n
T (t)
j
p(t)
r 2
r1
rn
Figure A. Definition of switching times
T
C
Figure D. Thermal equivalent
circuit
Figure E. Dynamic test circuit
Leakage inductance L =180nH
and Stray capacity C =39pF.
Figure B. Definition of switching losses
15
Rev. 2.3 12.03.2013
IFAG IPV TD VLS
IKW40T120
®
TrenchStop Series
Published by
Infineon Technologies AG
81726 Munich, Germany
© 2013 Infineon Technologies AG
All Rights Reserved.
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The information given in this document shall in no event be regarded as a guarantee of conditions or
characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or
any information regarding the application of the device, Infineon Technologies hereby disclaims any and all
warranties and liabilities of any kind, including without limitation, warranties of non-infringement of intellectual
property rights of any third party.
Information
For further information on technology, delivery terms and conditions and prices, please contact the nearest
Infineon Technologies Office (www.infineon.com).
Warnings
Due to technical requirements, components may contain dangerous substances. For information on the
types in question, please contact the nearest Infineon Technologies Office.
The Infineon Technologies component described in this Data Sheet may be used in life-support devices or
systems and/or automotive, aviation and aerospace applications or systems only with the express written
approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the
failure of that life-support, automotive, aviation and aerospace device or system or to affect the safety or
effectiveness of that device or system. Life support devices or systems are intended to be implanted in the
human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable
to assume that the health of the user or other persons may be endangered.
16
Rev. 2.3 12.03.2013
IFAG IPV TD VLS
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