IAUC100N08S5N034 [INFINEON]

The IAUC100N08S5N034 is a 3.4mR 80V MOSFET in a 5x6 mm² SSO8 package, using Infineon’s leading OptiMOS™ 5 technology. Next to others it is used in 48V auxiliaries, DCDC converter as well as power distribution.;
IAUC100N08S5N034
型号: IAUC100N08S5N034
厂家: Infineon    Infineon
描述:

The IAUC100N08S5N034 is a 3.4mR 80V MOSFET in a 5x6 mm² SSO8 package, using Infineon’s leading OptiMOS™ 5 technology. Next to others it is used in 48V auxiliaries, DCDC converter as well as power distribution.

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IAUC100N08S5N034  
OptiMOS-5 Power Transistor  
Product Summary  
VDS  
80  
3.4  
100  
V
Features  
RDS(on),max  
ID  
mW  
• OptiMOS™ power MOSFET for automotive applications  
A
• N-channel - Enhancement mode - Normal Level  
• MSL1 up to 260°C peak reflow  
• 175 °C operating temperature  
PG-TDSON-8-34  
• Green product (RoHS compliant)  
• 100% Avalanche tested  
Type  
Package  
Marking  
IAUC100N08S5N034  
PG-TDSON-8-34  
5N08034  
Maximum ratings, at T j=25 °C, unless otherwise specified  
Value  
Parameter  
Symbol  
Conditions  
Unit  
V GS=10 V, Chip  
limitation1,2)  
I D  
Drain current  
132  
A
V GS=10V, DC  
current3)  
T a=85 °C, V GS=10 V,  
RthJA on 2s2p 2,4)  
100  
22  
Pulsed drain current2)  
I D,pulse  
E AS  
T C=25 °C  
400  
240  
Avalanche energy, single pulse2)  
Avalanche current, single pulse  
Gate source voltage  
I D=50 A  
mJ  
A
I AS  
-
100  
V GS  
-
±20  
V
P tot  
T C=25 °C  
Power dissipation  
136  
W
°C  
T j, T stg  
Operating and storage temperature  
-
-55 ... +175  
Rev. 1.1  
page 1  
2021-06-18  
IAUC100N08S5N034  
Values  
typ.  
Parameter  
Symbol  
Conditions  
Unit  
min.  
max.  
Thermal characteristics2)  
R thJC  
Thermal resistance, junction - case  
-
-
-
-
-
1.1  
-
K/W  
Thermal resistance, junction -  
ambient4)  
R thJA  
23.5  
Electrical characteristics, at T j=25 °C, unless otherwise specified  
Static characteristics  
V (BR)DSS V GS=0V, I D=1mA  
V GS(th) V DS=V GS, I D=78 µA  
Drain-source breakdown voltage  
Gate threshold voltage  
80  
-
-
V
2.2  
3.0  
3.8  
V DS=80V, V GS=0V,  
T j=25°C  
I DSS  
Zero gate voltage drain current  
-
-
0.1  
1
1
µA  
V DS=80V, V GS=0V,  
T j=85°C2)  
20  
I GSS  
V GS=20V, V DS=0V  
Gate-source leakage current  
-
-
-
-
-
100 nA  
R DS(on) V GS=6V, I D=25A  
V GS=10V, I D=50A  
Drain-source on-state resistance  
3.9  
2.8  
1.5  
4.8  
3.4  
-
mW  
Gate resistance2)  
R G  
-
W
Rev. 1.1  
page 2  
2021-06-18  
IAUC100N08S5N034  
Values  
typ.  
Parameter  
Symbol  
Conditions  
Unit  
min.  
max.  
Dynamic characteristics2)  
Input capacitance  
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Turn-off delay time  
Rise time  
C iss  
C oss  
Crss  
t d(on)  
t d(off)  
t r  
-
-
-
-
-
-
-
3507  
620  
27  
4559 pF  
806  
V GS=0V, V DS=40V,  
f =1MHz  
41  
10  
-
-
-
-
ns  
18  
V DD=40V, V GS=10V,  
I D=50A, R G,ext=3.5W  
6
t f  
Fall time  
12  
Gate Charge Characteristics2)  
Gate to source charge  
Gate to drain charge  
Gate charge total  
Q gs  
-
-
-
-
17  
12  
51  
4.7  
22  
18  
66  
-
nC  
Q gd  
V DD=40V, I D=50A,  
V GS=0 to 10V  
Q g  
V plateau  
Gate plateau voltage  
V
A
Reverse Diode  
Diode continous forward current2)  
Diode pulse current2)  
I S  
T C=25°C  
T C=25 °C  
-
-
-
-
100  
400  
I S,pulse  
V GS=0V, I F=50 A,  
T j=25°C  
V SD  
Diode forward voltage  
-
0.9  
1.2  
V
Reverse recovery time2)  
t rr  
-
-
48  
55  
-
-
ns  
V R=40V, I F=50A,  
di F/dt =100A/µs  
Reverse recovery charge2)  
Q rr  
nC  
1) Practically the current is limited by the overall system design including the customer-specific PCB.  
2) The parameter is not subject to production test - verified by design/characterization.  
3) The product can operate at a specified current based on best practice to minimize electro-migration at the solder joint.  
For rare events and inrush currents, the value may be exceeded.  
4) Device on a four-layer 2s2p FR4 PCB defined in accordance with JEDEC standards (JESD51-5-7). PCB is vertical in  
still air.  
Rev. 1.1  
page 3  
2021-06-18  
IAUC100N08S5N034  
1 Power dissipation  
2 Drain current  
P tot = f(T C); V GS = 10 V  
I D = f(T C); V GS = 10 V  
150  
120  
90  
60  
30  
0
150  
Chip Limit  
120  
DC Current  
90  
60  
30  
0
0
50  
100  
150  
200  
0
50  
100  
150  
200  
TC [°C]  
TC [°C]  
3 Safe operating area  
4 Max. transient thermal impedance  
I D = f(V DS); T C = 25 °C; D = 0  
parameter: t p  
Z thJC = f(t p)  
parameter: D =t p/T  
101  
1000  
100  
10  
1 µs  
10 µs  
100  
0.5  
100 µs  
150 µs  
0.1  
10-1  
0.05  
0.01  
10-2  
single pulse  
10-3  
1
0.1  
1
10  
100  
10-6  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
VDS [V]  
tp [s]  
Rev. 1.1  
page 4  
2021-06-18  
IAUC100N08S5N034  
5 Typ. output characteristics  
6 Typ. drain-source on-state resistance  
I D = f(V DS); T j = 25 °C  
parameter: V GS  
R DS(on) = f(I D); T j = 25 °C  
parameter: V GS  
18  
400  
10 V  
7 V  
6.5 V  
5.5 V  
14  
300  
6 V  
10  
200  
5.5 V  
5V  
6 V  
6.5 V  
6
100  
5 V  
7 V  
10 V  
2
0
0
100  
200  
ID [A]  
300  
400  
0
1
2
3
4
5
6
7
VDS [V]  
7 Typ. transfer characteristics  
8 Typ. drain-source on-state resistance  
I D = f(V GS); V DS = 6V  
parameter: T j  
R DS(on) = f(T j);  
parameter: ID, VGS  
400  
300  
200  
100  
0
10  
9
-55 °C  
25 °C  
8
7
175 °C  
VGS=6V, ID=25A  
6
5
4
3
2
VGS=10V, ID=50A  
1
0
2
3
4
5
6
7
8
-60  
-20  
20  
60  
100  
140  
180  
VGS [V]  
Tj [°C]  
Rev. 1.1  
page 5  
2021-06-18  
IAUC100N08S5N034  
9 Typ. gate threshold voltage  
10 Typ. capacitances  
V GS(th) = f(T j); V GS = V DS  
parameter: I D  
C = f(V DS); V GS = 0 V; f = 1 MHz  
104  
4
Ciss  
3.5  
780 µA  
3
2.5  
2
103  
Coss  
78 µA  
102  
Crss  
1.5  
1
101  
0
20  
40  
60  
80  
-60  
-20  
20  
60  
Tj [°C]  
100  
140  
180  
VDS [V]  
11 Typical forward diode characteristics  
IF = f(VSD  
12 Avalanche characteristics  
I AS= f(t AV  
)
)
parameter: T j  
parameter: Tj(start)  
103  
1000  
102  
100  
25 °C  
150 °C  
100 °C  
25 °C  
175 °C  
101  
10  
100  
0
1
0.2  
0.4  
0.6  
0.8  
1
1.2  
0.1  
1
10  
100  
1000  
VSD [V]  
tAV [µs]  
Rev. 1.1  
page 6  
2021-06-18  
IAUC100N08S5N034  
13 Avalanche energy  
E AS = f(T j)  
14 Drain-source breakdown voltage  
V BR(DSS) = f(T j); I D = 1 mA  
parameter: I D  
88  
86  
84  
82  
80  
78  
76  
500  
25 A  
400  
300  
50 A  
200  
100 A  
100  
0
-60  
-20  
20  
60  
100  
140  
180  
25  
75  
125  
175  
Tj [°C]  
Tj [°C]  
15 Typ. gate charge  
16 Gate charge waveforms  
V GS = f(Q gate); I D = 50 A pulsed  
parameter: V DD  
10  
9
8
7
6
5
4
3
2
1
0
V GS  
16 V  
Q g  
64V  
40 V  
V gs(th)  
Q g(th)  
Q sw  
Q gate  
0
10  
20  
30  
40  
50  
60  
Q gd  
Q gs  
Qgate [nC]  
Rev. 1.1  
page 7  
2021-06-18  
IAUC100N08S5N034  
Package Outline  
Footprint  
Packaging  
Rev. 1.1  
page 8  
2021-06-18  
IAUC100N08S5N034  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
© Infineon Technologies AG 2021  
All Rights Reserved.  
Legal Disclaimer  
The information given in this document shall in no event be regarded as a guarantee of conditions  
or characteristics. With respect to any examples or hints given herein, any typical values stated  
herein and/or any information regarding the application of the device, Infineon Technologies hereby  
disclaims any and all warranties and liabilities of any kind, including without limitation, warranties  
of non-infringement of intellectual property rights of any third party.  
Information  
For further information on technology, delivery terms and conditions and prices, please contact  
the nearest Infineon Technologies Office (www.infineon.com).  
Warnings  
Due to technical requirements, components may contain dangerous substances.  
For information on the types in question, please contact the nearest Infineon Technologies Office.  
Infineon Technologies components may be used in life-support devices or systems only with the  
express written approval of Infineon Technologies, if a failure of such components can reasonably be  
expected to cause the failure of that life-support device or system or to affect the safety or  
effectiveness of that device or system. Life support devices or systems are intended to be implanted  
in the human body or to support and/or maintain and sustain and/or protect human life.  
If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.  
Rev. 1.1  
page 9  
2021-06-18  
IAUC100N08S5N034  
Revision History  
Version  
Date  
Changes  
Revision 1.0  
Revision 1.1  
2021-05-17  
2021-06-18  
Final Data Sheet  
- Company logo size adjusted  
- Datasheet file name updated  
Rev. 1.1  
page 10  
2021-06-18  

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