BSC118N10NS G [INFINEON]

英飞凌的 100V OptiMOS™ 功率 MOSFET 可以为高效率、高功率密度的 SMPS 提供卓越的解决方案。与下一代出色技术相比,该系列在 R Ds(on)和 FOM(品质因数)方面均降低了30%。;
BSC118N10NS G
型号: BSC118N10NS G
厂家: Infineon    Infineon
描述:

英飞凌的 100V OptiMOS™ 功率 MOSFET 可以为高效率、高功率密度的 SMPS 提供卓越的解决方案。与下一代出色技术相比,该系列在 R Ds(on)和 FOM(品质因数)方面均降低了30%。

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BSC118N10NS G  
OptiMOS™2 Power-Transistor  
Product Summary  
Features  
V DS  
100  
11.8  
71  
V
• N-channel, normal level  
R DS(on),max  
I D  
m  
A
• Excellent gate charge x R DS(on) product (FOM)  
• Very low on-resistance R DS(on)  
• 150 °C operating temperature  
PG-TDSON-8  
• Pb-free lead plating; RoHS compliant  
• Qualified according to JEDEC1) for target application  
• Ideal for high-frequency switching and synchronous rectification  
• Halogen-free according to IEC61249-2-21  
Type  
Package  
Marking  
BSC118N10NS G  
PG-TDSON-8  
118N10NS  
Maximum ratings, at T j=25 °C, unless otherwise specified  
Value  
Parameter  
Symbol Conditions  
Unit  
I D  
T C=25 °C  
Continuous drain current  
71  
44  
A
T C=100 °C  
T A=25 °C,  
R
11  
thJA=45 K/W2)  
Pulsed drain current3)  
I D,pulse  
E AS  
T C=25 °C  
280  
155  
I D=50 A, R GS=25 Ω  
Avalanche energy, single pulse  
Gate source voltage  
mJ  
V
V GS  
±20  
P tot  
T C=25 °C  
Power dissipation  
114  
W
°C  
T j, T stg  
Operating and storage temperature  
IEC climatic category; DIN IEC 68-1  
-55 ... 150  
55/150/56  
1)J-STD20 and JESD22  
Rev. 1.08  
page 1  
2009-11-03  
BSC118N10NS G  
Values  
Parameter  
Symbol Conditions  
Unit  
min.  
typ.  
max.  
Thermal characteristics  
R thJC  
Thermal resistance, junction - case  
bottom  
-
-
-
-
-
-
-
-
1.1  
18  
62  
45  
K/W  
top  
R thJA  
minimal footprint  
6 cm2 cooling area2)  
Thermal resistance,  
junction - ambient  
Electrical characteristics, at T j=25 °C, unless otherwise specified  
Static characteristics  
V (BR)DSS  
V GS(th)  
V
V
GS=0 V, I D=1 mA  
DS=V GS, I D=70 µA  
Drain-source breakdown voltage  
Gate threshold voltage  
100  
2
-
-
V
3
4
V
DS=100 V, V GS=0 V,  
I DSS  
Zero gate voltage drain current  
-
-
0.01  
10  
1
µA  
T j=25 °C  
V
DS=100 V, V GS=0 V,  
100  
T j=125 °C  
I GSS  
V
V
GS=20 V, V DS=0 V  
GS=10 V, I D=50 A  
Gate-source leakage current  
Drain-source on-state resistance  
Gate resistance  
-
-
-
1
100 nA  
R DS(on)  
R G  
10  
0.8  
11.8  
-
mΩ  
|V DS|>2|I D|R DS(on)max  
I D=50 A  
,
g fs  
Transconductance  
33  
65  
-
S
2
2) Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm (one layer, 70 µm thick) copper area for drain  
connection. PCB is vertical in still air.  
3) see figure 3  
Rev. 1.08  
page 2  
2009-11-03  
BSC118N10NS G  
Values  
Parameter  
Symbol Conditions  
Unit  
min.  
typ.  
max.  
Dynamic characteristics  
Input capacitance  
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Rise time  
C iss  
-
-
-
-
-
-
-
2800  
420  
26  
3700 pF  
560  
V
GS=0 V, V DS=50 V,  
C oss  
C rss  
t d(on)  
t r  
f =1 MHz  
39  
21  
32  
32  
48  
12  
ns  
21  
V
DD=50 V, V GS=10 V,  
I D=25 A, R G=1.6 Ω  
t d(off)  
t f  
Turn-off delay time  
Fall time  
32  
8
Gate Charge Characteristics4)  
Gate to source charge  
Gate to drain charge  
Switching charge  
Q gs  
-
-
-
-
-
-
14  
10  
19  
42  
4.9  
45  
19  
15  
27  
56  
-
nC  
Q gd  
V
V
DD=50 V, I D=25 A,  
Q sw  
Q g  
GS=0 to 10 V  
Gate charge total  
V plateau  
Q oss  
Gate plateau voltage  
Output charge  
V
V
DD=50 V, V GS=0 V  
60  
nC  
Reverse Diode  
I S  
Diode continous forward current  
Diode pulse current  
-
-
-
-
70  
A
T C=25 °C  
I S,pulse  
280  
V
GS=0 V, I F=50 A,  
V SD  
Diode forward voltage  
-
0.94  
1.2  
V
T j=25 °C  
t rr  
Reverse recovery time  
-
-
81  
-
-
ns  
V R=50 V, I F=25 A,  
di F/dt =100 A/µs  
Q rr  
Reverse recovery charge  
188  
nC  
4) See figure 16 for gate charge parameter definition  
Rev. 1.08  
page 3  
2009-11-03  
BSC118N10NS G  
1 Power dissipation  
2 Drain current  
P
tot=f(T C)  
I D=f(T C); V GS10 V  
120  
80  
60  
40  
20  
0
80  
40  
0
0
40  
80  
120  
160  
0
40  
80  
120  
160  
T
C [°C]  
T
C [°C]  
3 Safe operating area  
I D=f(V DS); T C=25 °C; D =0  
parameter: t p  
4 Max. transient thermal impedance  
thJC=f(t p)  
Z
parameter: D =t p/T  
103  
101  
limited by on-state  
resistance  
100 ns  
1 µs  
10 µs  
102  
101  
100  
10-1  
100 µs  
100  
0.5  
1 ms  
0.2  
0.1  
DC  
0.05  
10-1  
0.02  
0.01  
single pulse  
10-2  
10-1  
100  
101  
102  
103  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
V
DS [V]  
t
p [s]  
Rev. 1.08  
page 4  
2009-11-03  
BSC118N10NS G  
5 Typ. output characteristics  
I D=f(V DS); T j=25 °C  
6 Typ. drain-source on resistance  
DS(on)=f(I D); T j=25 °C  
R
parameter: V GS  
parameter: V GS  
160  
25  
10 V  
20  
7 V  
5.5 V  
120  
5 V  
6 V  
15  
10  
5
6 V  
7 V  
80  
10 V  
5.5 V  
40  
5 V  
4.5 V  
0
0
0
1
2
3
4
5
0
50  
100  
150  
V
DS [V]  
ID [A]  
7 Typ. transfer characteristics  
I D=f(V GS); |V DS|>2|I D|R DS(on)max  
parameter: T j  
8 Typ. forward transconductance  
g fs=f(I D); T j=25 °C  
160  
120  
80  
120  
80  
40  
0
40  
25 °C  
150 °C  
0
0
2
4
6
8
0
20  
40  
60  
80  
100  
120  
V
GS [V]  
I
D [A]  
Rev. 1.08  
page 5  
2009-11-03  
BSC118N10NS G  
9 Drain-source on-state resistance  
10 Typ. gate threshold voltage  
GS(th)=f(T j); V GS=V DS  
R
DS(on)=f(T j); I D=50 A; V GS=10 V  
V
parameter: I D  
25  
4
3.5  
3
20  
700 µA  
70 µA  
2.5  
2
15  
98%  
typ  
10  
1.5  
1
5
0
0.5  
0
-60  
-20  
20  
60  
100  
140  
180  
-60  
-20  
20  
60  
T j [°C]  
100  
140  
180  
T j [°C]  
11 Typ. capacitances  
12 Forward characteristics of reverse diode  
I F=f(V SD  
C =f(V DS); V GS=0 V; f =1 MHz  
)
parameter: T j  
104  
1000  
Ciss  
103  
Coss  
25 °C  
100  
10  
102  
Crss  
150°C, 98%  
150 °C  
25°C, 98%  
101  
100  
1
0
0
20  
40  
60  
80  
0.5  
1
1.5  
2
V
DS [V]  
V SD [V]  
Rev. 1.08  
page 6  
2009-11-03  
BSC118N10NS G  
13 Avalanche characteristics  
AS=f(t AV); R GS=25 Ω  
14 Typ. gate charge  
GS=f(Q gate); I D=50 A pulsed  
V
I
parameter: T j(start)  
parameter: V DD  
100  
10  
8
6
4
2
80 V  
25 °C  
50 V  
20 V  
100 °C  
10  
125 °C  
1
1
0
0
10  
100  
1000  
10  
20  
Q
30  
gate [nC]  
40  
50  
t
AV [µs]  
15 Drain-source breakdown voltage  
16 Gate charge waveforms  
V
BR(DSS)=f(T j); I D=1 mA  
110  
V GS  
Q g  
105  
100  
95  
V gs(th)  
Q g(th)  
Q sw  
Q gd  
Q gate  
Q gs  
90  
-60  
-20  
20  
60  
100  
140  
180  
T j [°C]  
Rev. 1.08  
page 7  
2009-11-03  
BSC118N10NS G  
Package Outline: PG-TDSON-8  
Rev. 1.08  
page 8  
2009-11-03  
BSC118N10NS G  
Dimensions in mm  
Rev. 1.08  
page 9  
2009-11-03  
BSC118N10NS G  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
© 2009 Infineon Technologies AG  
All Rights Reserved.  
Legal Disclaimer  
The information given in this document shall in no event be regarded as a guarantee of  
conditions or characteristics. With respect to any examples or hints given herein, any typical  
values stated herein and/or any information regarding the application of the device,  
Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind,  
including without limitation, warranties of non-infringement of intellectual property rights  
of any third party.  
Information  
For further information on technology, delivery terms and conditions and prices, please  
contact the nearest Infineon Technologies Office (www.infineon.com).  
Warnings  
Due to technical requirements, components may contain dangerous substances. For information  
on the types in question, please contact the nearest Infineon Technologies Office.  
Infineon Technologies components may be used in life-support devices or systems only with  
the express written approval of Infineon Technologies, if a failure of such components can  
reasonably be expected to cause the failure of that life-support device or system or to affect  
the safety or effectiveness of that device or system. Life support devices or systems are  
intended to be implanted in the human body or to support and/or maintain and sustain  
and/or protect human life. If they fail, it is reasonable to assume that the health of the user  
or other persons may be endangered.  
Rev. 1.08  
page 10  
2009-11-03  

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