BSC060P03NS3EG [INFINEON]

OptiMOS P3 Power-Transistor; P3的OptiMOS功率三极管
BSC060P03NS3EG
型号: BSC060P03NS3EG
厂家: Infineon    Infineon
描述:

OptiMOS P3 Power-Transistor
P3的OptiMOS功率三极管

晶体 晶体管 功率场效应晶体管 开关 脉冲 光电二极管 局域网
文件: 总9页 (文件大小:286K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
BSC060P03NS3E G  
OptiMOSTM P3 Power-Transistor  
Product Summary  
V DS  
-30  
6.0  
V
Features  
R DS(on),max  
I D  
m  
A
• single P-Channel in SuperSO8  
• Qualified according JEDEC1) for target applications  
-100  
• 150 °C operating temperature  
PG-TDSON-8  
• 100% Avalanche rated  
V GS=25 V, specially suited for notebook applications  
• ESD protected  
• Pb-free; RoHS compliant  
• applications: battery management, load switching  
• Halogen-free according to IEC61249-2-21  
Marking  
Lead free  
Halogen free  
Packing  
Type  
Package  
Yes  
060P3NSE Yes  
non dry  
BSC060P03NS3E G PG-TDSON-8  
Maximum ratings, at T j=25 °C, unless otherwise specified  
Value  
Parameter  
Symbol Conditions  
Unit  
I D  
T C=25 °C  
T C=70 °C  
T A=25 °C  
T C=25 °C2)  
-100  
-82.0  
Continuous drain current  
A
17.7  
I D,pulse  
E AS  
-200  
Pulsed drain current  
149  
I D=-50 A, R GS=25 Ω  
Avalanche energy, single pulse  
Gate source voltage  
mJ  
V
V GS  
P tot  
±25  
T C =25 °C  
T A=25 °C2)  
83  
Power dissipation  
W
2.5  
T j, T stg  
-55 ... 150  
class 3 (> 4 kV)  
260  
Operating and storage temperature  
ESD class  
°C  
°C  
JESD22-A114 HBM  
Soldering temperature  
55/150/56  
IEC climatic category; DIN IEC 68-1  
1) J-STD20 and JESD22  
Rev. 2.1  
page 1  
2009-11-16  
BSC060P03NS3E G  
Values  
Parameter  
Symbol Conditions  
Unit  
min.  
typ.  
max.  
Thermal characteristics  
Thermal resistance,  
junction - case  
R thJC  
-
-
-
-
1.5  
50  
K/W  
Thermal resistance,  
junction - ambient  
6 cm2 cooling area2)  
R thJA  
Electrical characteristics, at T j=25 °C, unless otherwise specified  
Static characteristics  
V (BR)DSS  
V
V
GS=0 V, I D=-250µA  
DS=V GS, I D=-150 µA  
Drain-source breakdown voltage  
Gate threshold voltage  
-30  
-
-
V
V GS(th)  
-3.1  
-2.5  
-1.9  
V
DS=-30 V, V GS=0 V,  
I DSS  
Zero gate voltage drain current  
-
-
-1  
µA  
T j=25 °C  
V
DS=-30 V, V GS=0 V,  
-
-
-
-
-
-100  
-10  
T j=125 °C  
I GSS  
V
V
GS=-25 V, V DS=0 V  
GS=-6 V, I D=-35 A  
Gate-source leakage current  
µA  
R DS(on)  
Drain-source on-state resistance  
5.7  
9.6  
mΩ  
V
GS=-10 V, I D=-50 A  
-
-
4.1  
5.9  
63  
6.0  
R G  
g fs  
Gate resistance  
-
-
|V DS|>2|I D|R DS(on)max  
I D=-30 A  
,
Transconductance  
32  
S
2
2) Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm (one layer, 70 µm thick) copper area for drain  
connection. PCB is vertical in still air.  
Rev. 2.1  
page 2  
2009-11-16  
BSC060P03NS3E G  
Values  
Parameter  
Symbol Conditions  
Unit  
min.  
typ.  
max.  
Dynamic characteristics  
Input capacitance  
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Rise time  
C iss  
-
-
-
-
-
-
-
4530  
2110  
150  
15  
6020 pF  
2810  
V
GS=0 V, V DS=-15 V,  
C oss  
C rss  
t d(on)  
t r  
f =1 MHz  
220  
22  
209  
99  
ns  
V
DD=-15 V, V GS=-  
139  
66  
10 V, I D=-50 A,  
R G=6 Ω  
t d(off)  
t f  
Turn-off delay time  
Fall time  
34  
51  
Gate Charge Characteristics3)  
Gate to source charge  
Gate charge at threshold  
Gate to drain charge  
Switching charge  
Q gs  
-
-
-
-
-
-
-
20  
7
27  
10  
13  
30  
81  
-
nC  
Q g(th)  
Q gd  
9
V
V
DD=-15 V, I D=-50 A,  
GS=0 to -10 V  
Q sw  
22  
61  
4.5  
49  
Q g  
Gate charge total  
V plateau  
Q oss  
Gate plateau voltage  
Output charge  
V
V
DD=-15 V, V GS=0 V  
65  
nC  
Reverse Diode  
I S  
Diode continous forward current  
Diode pulse current  
-
-
-
-
100  
200  
A
T C=25 °C  
I S,pulse  
V
GS=0 V, I F=-50 A,  
V SD  
Diode forward voltage  
Reverse recovery time  
Reverse recovery charge  
-
-
-
-
-1.1  
V
T j=25 °C  
V R=15 V, I F=|I S|,  
di F/dt =100 A/µs  
t rr  
51  
49  
-
-
ns  
nC  
Q rr  
Rev. 2.1  
page 3  
2009-11-16  
BSC060P03NS3E G  
1 Power dissipation  
2 Drain current  
P
tot=f(T C)  
I D=f(T C); |V GS|10 V  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
120  
110  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
0
40  
80  
120  
160  
0
40  
80  
120  
160  
T C [°C]  
T
C [°C]  
3 Safe operating area  
I D=f(V DS); T C=25 °C1); D =0  
4 Max. transient thermal impedance  
thJS=f(t p)  
Z
parameter: t p  
parameter: D =t p/T  
101  
1000  
10  
1 µs  
10 µs  
102  
100  
100 µs  
100  
1
0.5  
0.2  
1 ms  
101  
10  
limited by on-state  
resistance  
10 ms  
0.1  
100  
1
0.05  
DC  
10-1  
0.1  
0.02  
0.01  
single pulse  
10-1  
0.1  
10-2  
10-2  
0.01  
0.1  
0.01  
0.00001  
1
10  
100  
0.0001  
0.001  
0.01  
0.1  
1
10  
10-1  
100  
101  
102  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
101  
-V DS [V]  
t
p [s]  
Rev. 2.1  
page 4  
2009-11-16  
BSC060P03NS3E G  
5 Typ. output characteristics  
I D=f(V DS); T j=25 °C  
6 Typ. drain-source on resistance  
DS(on)=f(I D); T j=25 °C  
R
parameter: V GS  
parameter: V GS  
70  
30  
-10 V  
-5.0V  
60  
25  
20  
15  
10  
5
-4.5 V  
-4.0 V  
50  
40  
30  
20  
10  
0
-4.5 V  
-5.0V  
-4.0 V  
-6.0 V  
-10 V  
-3.7 V  
-3.5V  
0
0
0
1
2
3
10  
20  
30  
40  
-V DS [V]  
-ID [A]  
7 Typ. transfer characteristics  
I D=f(V GS); |V DS|>2|I D|R DS(on)max  
parameter: T j  
8 Typ. forward transconductance  
g fs=f(I D); T j=25 °C  
200  
180  
160  
140  
120  
100  
80  
200  
180  
160  
140  
120  
100  
80  
60  
60  
25 °C  
40  
40  
150 °C  
20  
20  
0
0
0
1
2
3
4
5
6
0
20 40 60 80 100 120 140 160 180 200  
-V GS [V]  
-ID [A]  
Rev. 2.1  
page 5  
2009-11-16  
BSC060P03NS3E G  
10 Typ. gate threshold voltage  
GS(th)=f(T j); V GS=V DS; I D=-150 µA  
9 Drain-source on-state resistance  
R
DS(on)=f(T j); I D=-50 A; V GS=-10 V  
V
10  
4
3.5  
3
8
max.  
2.5  
2
typ.  
98 %  
6
min.  
1.5  
1
typ.  
4
0.5  
0
2
-60  
-20  
20  
60  
100  
140  
180  
-60  
-20  
20  
60  
T j [°C]  
100  
140  
180  
T j [°C]  
11 Typ. capacitances  
12 Forward characteristics of reverse diode  
I F=f(V SD  
C =f(V DS); V GS=0 V; f =1 MHz  
)
parameter: T j  
104  
100  
Ciss  
Coss  
25 °C, typ  
150 °C, 98%  
103  
102  
101  
10  
150 °C, typ  
Crss  
1
25 °C, 98%  
0.1  
0
0
5
10  
15  
20  
25  
30  
0.5  
1
1.5  
-V SD [V]  
-V DS [V]  
Rev. 2.1  
page 6  
2009-11-16  
BSC060P03NS3E G  
13 Avalanche characteristics  
AS=f(t AV); R GS=25 Ω  
14 Typ. gate charge  
GS=f(Q gate); I D=-50 A pulsed  
V
I
parameter: T j(start)  
parameter: V DD  
102  
10  
9
8
7
6
5
4
3
2
1
25 °C  
-15 V  
-6 V  
100 °C  
-24 V  
125 °C  
101  
0
0
20  
40  
60  
100  
100  
101  
102  
103  
t
AV [µs]  
-Q gate [nC]  
15 Drain-source breakdown voltage  
16 Gate charge waveforms  
V
BR(DSS)=f(T j); I D=-250 µA  
36  
V GS  
Q g  
34  
32  
30  
28  
26  
V gs(th)  
Q g(th)  
Q sw  
Q gd  
Q gate  
Q gs  
-60  
-20  
20  
60  
100  
140  
180  
T j [°C]  
Rev. 2.1  
page 7  
2009-11-16  
BSC060P03NS3E G  
Package Outline  
PG-TDSON-8  
Dimensions in mm  
Rev. 2.1  
page 8  
2009-11-16  
BSC060P03NS3E G  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
© 2009 Infineon Technologies AG  
All Rights Reserved.  
Legal Disclaimer  
The information given in this document shall in no event be regarded as a guarantee of  
conditions or characteristics. With respect to any examples or hints given herein, any typical  
values stated herein and/or any information regarding the application of the device,  
Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind,  
including without limitation, warranties of non-infringement of intellectual property rights  
of any third party.  
Information  
For further information on technology, delivery terms and conditions and prices, please  
contact the nearest Infineon Technologies Office (www.infineon.com).  
Warnings  
Due to technical requirements, components may contain dangerous substances. For information  
on the types in question, please contact the nearest Infineon Technologies Office.  
Infineon Technologies components may be used in life-support devices or systems only with  
the express written approval of Infineon Technologies, if a failure of such components can  
reasonably be expected to cause the failure of that life-support device or system or to affect  
the safety or effectiveness of that device or system. Life support devices or systems are  
intended to be implanted in the human body or to support and/or maintain and sustain  
and/or protect human life. If they fail, it is reasonable to assume that the health of the user  
or other persons may be endangered.  
Rev. 2.1  
page 9  
2009-11-16  

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