5P49V5943_17 [IDT]

Programmable Clock Generator;
5P49V5943_17
型号: 5P49V5943_17
厂家: INTEGRATED DEVICE TECHNOLOGY    INTEGRATED DEVICE TECHNOLOGY
描述:

Programmable Clock Generator

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中文:  中文翻译
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Programmable Clock Generator  
5P49V5943  
DATASHEET  
Description  
Features  
The 5P49V5943 is a programmable clock generator intended  
for high performance consumer, networking, industrial,  
computing, and data-communications applications.  
Configurations may be stored in on-chip One-Time  
Generates up to two independent output frequencies  
High performance, low phase noise PLL, <0.7 ps RMS  
typical phase jitter on outputs:  
2
– PCIe Gen1, 2, 3 compliant clock capability  
– USB 3.0 compliant clock capability  
– 1 GbE and 10 GbE  
Programmable (OTP) memory or changed using I C  
interface. This is IDTs fifth generation of programmable clock  
®
technology (VersaClock 5).  
The frequencies are generated from a single input reference  
clock.  
Two fractional output dividers (FODs)  
Independent Spread Spectrum capability on each output  
pair  
Two select pins allow up to 4 different configurations to be  
programmed and accessible using processor GPIOs or  
bootstrapping. The different selections may be used for  
different operating modes (full function, partial function, partial  
power-down), regional standards (US, Japan, Europe) or  
system production margin testing.  
Four banks of internal non-volatile in-system  
programmable or factory programmable OTP memory  
2
I C serial programming interface  
One reference LVCMOS output clock  
Two universal output pairs:  
2
The device may be configured to use one of two I C  
addresses to allow multiple devices to be used in a system.  
– Each configurable as one differential output pair or two  
LVCMOS outputs  
I/O Standards:  
Pin Assignment  
– Single-ended I/Os: 1.8V to 3.3V LVCMOS  
– Differential I/Os - LVPECL, LVDS and HCSL  
Input frequency ranges:  
– LVDS, LVPECL, HCSL Differential Clock Input (CLKIN,  
CLKINB) – 1MHz to 350MHz  
Output frequency ranges:  
– LVCMOS Clock Outputs – 1MHz to 200MHz  
– LVDS, LVPECL, HCSL Differential Clock Outputs –  
1MHz to 350MHz  
20 19 18 17 16  
1
2
V
DDO1  
15  
14  
13  
CLKIN  
CLKINB  
VDDA  
Individually selectable output voltage (1.8V, 2.5V, 3.3V) for  
each output pair  
OUT1  
OUT1B  
GND  
EPAD  
8
3
4
Programmable loop bandwidth  
Programmable output to output skew  
Programmable slew rate control  
Individual output enable/disable  
Power-down mode  
12  
11  
VDD  
5
GND  
SD/OE  
7
9
10  
6
1.8V, 2.5V or 3.3V core V  
, V  
DDA  
DDD  
Available in 20-pin VFQFPN 3mm x 3mm package  
-40° to +85°C industrial temperature operation  
20-pin VFQFPN  
5P49V5943 MARCH 3, 2017  
1
©2017 Integrated Device Technology, Inc.  
5P49V5943 DATASHEET  
Functional Block Diagram  
VDDO  
0
CLKIN  
OUT0_SEL_I2CB  
CLKINB  
VDDO  
1
SD/OE  
OUT1  
PLL  
SEL1/SDA  
FOD1  
FOD2  
OUT1B  
OTP  
and  
Control Logic  
SEL0/SCL  
V
DDO2  
VDDA  
OUT2  
VDDD  
OUT2B  
Applications  
Ethernet switch/router  
PCI Express 1.0/2.0/3.0  
Broadcast video/audio timing  
Multi-function printer  
Processor and FPGA clocking  
Any-frequency clock conversion  
MSAN/DSLAM/PON  
Fiber Channel, SAN  
Telecom line cards  
1 GbE and 10 GbE  
PROGRAMMABLE CLOCK GENERATOR  
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5P49V5943 DATASHEET  
Table 1: Pin Descriptions  
Number  
Name  
Type  
Description  
1
2
CLKIN  
CLKINB  
Input  
Input  
Pull-down Differential clock input. Weak 100kohms internal pull-down.  
Pull-down Complementary differential clock input. Weak 100kohms internal pull-down.  
Analog functions power supply pin. Connect to 1.8V to 3.3V. VDDA and VDDD  
should have the same voltage applied.  
3
4
VDDA  
VDD  
Power  
Power  
Power supply pin. Connect to 1.8 to 3.3V.  
Enables/disables the outputs (OE) or powers down the chip (SD). The SH bit  
controls the configuration of the SD/OE pin. The SH bit needs to be high for  
SD/OE pin to be configured as SD. The SP bit (0x02) controls the polarity of the  
signal to be either active HIGH or LOW only when pin is configured as OE  
(Default is active LOW.) Weak internal pull down resistor. When configured as  
SD, device is shut down, differential outputs are driven high/low, and the single-  
5
SD/OE  
Input  
Pull-down  
ended LVCMOS outputs are driven low. When configured as OE, and outputs are  
disabled, the outputs can be selected to be tri-stated or driven high/low,  
depending on the programming bits as shown in the SD/OE Pin Function Truth  
table.  
Configuration select pin, or I2C SDA input as selected by OUT0_SEL_I2CB.  
Weak internal pull down resistor.  
Configuration select pin, or I2C SCL input as selected by OUT0_SEL_I2CB.  
Weak internal pull down resistor.  
6
7
SEL1/SDA  
SEL0/SCL  
Input  
Input  
Pull-down  
Pull-down  
Output power supply. Connect to 1.8 to 3.3V. Sets output voltage levels for  
OUT2/OUT2B.  
Output Clock 2. Please refer to the Output Drivers section for more details.  
Complementary Output Clock 2. Please refer to the Output Drivers section for  
more details.  
8
9
VDDO2  
OUT2  
Power  
Output  
Output  
10  
OUT2B  
11  
12  
GND  
GND  
Power  
Power  
Connect to ground.  
Connect to ground.  
Complementary Output Clock 1. Please refer to the Output Drivers section for  
more details.  
Output Clock 1. Please refer to the Output Drivers section for more details.  
Output power supply. Connect to 1.8 to 3.3V. Sets output voltage levels for  
OUT1/OUT1B.  
13  
14  
15  
16  
17  
18  
19  
OUT1B  
OUT1  
Output  
Output  
Power  
Power  
Power  
Power  
Power  
VDDO1  
GND  
Connect to ground.  
Digital functions power supply pin. Connect to 1.8 to 3.3V. VDDA and VDDB  
should have the same voltage applied.  
Connect to ground.  
Power supply pin for OUT0_SEL_I2CB. Connect to 1.8 to 3.3V. Sets output  
voltage levels for OUT0.  
VDDD  
GND  
VDDO0  
Latched input/LVCMOS Output. At power up, the voltage at the pin  
OUT0_SEL_I2CB is latched by the part and used to select the state of pins 8  
and 9. If a weak pull up (10Kohms) is placed on OUT0_SEL_I2CB, pins 8 and 9  
20  
OUT0_SELB_I2C Input/Output Pull-down will be configured as hardware select pins, SEL1 and SEL0. If a weak pull down  
(10Kohms) is placed on OUT0_SEL_I2CB or it is left floating, pins 8 and 9 will  
act as the SDA and SCL pins of an I2C interface. After power up, the pin acts as  
a LVCMOS reference output.  
ePAD  
Power  
Connect to ground pad.  
MARCH 3, 2017  
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PROGRAMMABLE CLOCK GENERATOR  
5P49V5943 DATASHEET  
PLL Features and Descriptions  
After a pin level change, the device must not be interrupted for  
at least 1ms so that the new values have time to load and take  
effect.  
Spread Spectrum  
To help reduce electromagnetic interference (EMI), the  
5P49V5943 supports spread spectrum modulation. The  
output clock frequencies can be modulated to spread energy  
across a broader range of frequencies, lowering system EMI.  
The 5P49V5943 implements spread spectrum using the  
Fractional-N output divide, to achieve controllable modulation  
rate and spreading magnitude. The Spread spectrum can be  
applied to any output clock, any clock frequency, and any  
spread amount from ±0.25% to ±2.5% center spread and  
-0.5% to -5% down spread.  
If OUT0_SEL_I2CB was 0 at POR, alternate configurations  
can only be loaded via the I2C interface.  
Table 2: Loop Filter  
PLL loop bandwidth range depends on the input reference  
frequency (Fref) and can be set between the loop bandwidth  
range as shown in the table below.  
Input Reference  
Loop  
Loop  
Frequency–Fref BandwidthMin Bandwidth Max  
(MHz)  
1
(kHz)  
40  
(kHz)  
126  
350  
300  
1000  
Table 3: Configuration Table  
This table shows the SEL1, SEL0 settings to select the  
configuration stored in OTP. Four configurations can be stored  
in OTP. These can be factory programmed or user  
programmed.  
2
OUT0_SEL_I2CB SEL1 SEL0  
@ POR  
I C  
REG0:7 Config  
Access  
1
1
1
1
0
0
0
1
1
X
0
1
0
1
X
No  
No  
No  
No  
Yes  
0
0
0
0
1
0
1
2
3
I2C  
defaults  
0
X
X
Yes  
0
0
At power up time, the SEL0 and SEL1 pins must be tied to  
either the VDDD/VDDA power supply so that they ramp with  
that supply or are tied low (this is the same as floating the  
pins). This will cause the register configuration to be loaded  
that is selected according to Table 3 above. Providing that  
OUT0_SEL_I2CB was 1 at POR and OTP register 0:7=0, after  
the first 10mS of operation the levels of the SELx pins can be  
changed, either to low or to the same level as VDDD/VDDA.  
The SELx pins must be driven with a digital signal of < 300ns  
Rise/Fall time and only a single pin can be changed at a time.  
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5P49V5943 DATASHEET  
outputs are driven High/low, and the single-ended LVCMOS  
outputs are driven low. When configured as OE, and outputs  
are disabled, the outputs are driven high/low.  
Reference Clock Input Pins  
The 5P49V5943 supports one reference clock input. The  
clock input (CLKIN, CLKINB) is a fully differential input that  
only accepts a reference clock. The differential input accepts  
differential clocks from all the differential logic types and can  
also be driven from a single ended clock on one of the input  
pins.  
Table 4: SD/OE Pin Function Truth Table  
SH bit SP bit OSn bit OEn bit SD/OE  
OUTn  
0
0
0
0
0
0
0
0
0
1
1
1
x
0
1
1
x
x
0
1
Tri-state2  
Output active  
Output active  
Output driven High Low  
OTP Interface  
0
0
0
0
1
1
1
1
0
1
1
1
x
0
1
1
x
x
0
1
Tri-state2  
Output active  
Output driven High Low  
Output active  
Tri-state2  
Output active  
Output active  
The 5P49V5943 can also store its configuration in an internal  
OTP. The contents of the device's internal programming  
registers can be saved to the OTP by setting burn_start  
(W114[3]) to high and can be loaded back to the internal  
programming registers by setting usr_rd_start(W114[0]) to  
high.  
1
1
1
0
0
0
0
1
1
x
0
1
0
0
0
2
Tri-state2  
Output active  
Output driven High Low  
Output driven High Low 1  
To initiate a save or restore using I C, only two bytes are  
1
1
1
1
1
1
0
1
1
x
0
1
0
0
0
transferred. The Device Address is issued with the read/write  
bit set to “0”, followed by the appropriate command code. The  
save or restore instruction executes after the STOP condition  
is issued by the Master, during which time the 5P49V5943 will  
not generate Acknowledge bits. The 5P49V5943 will  
1
x
x
x
1
Note 1 : Global Shutdown  
acknowledge the instructions after it has completed execution  
of them. During that time, the I C bus should be interpreted as  
Note 2 : Tri-state regardless of OEn bits  
2
busy by all other users of the bus.  
Output Alignment  
On power-up of the 5P49V5943, an automatic restore is  
performed to load the OTP contents into the internal  
programming registers. The 5P49V5943 will be ready to  
accept a programming instruction once it acknowledges its  
Each output divider block has a synchronizing POR pulse to  
provide startup alignment between outputs. This allows  
alignment of outputs for low skew performance. The phase  
alignment works both for integer output divider values and for  
fractional output divider values.  
2
7-bit I C address.  
2
Availability of Primary and Secondary I C addresses to allow  
Besides the POR at power up, the same synchronization reset  
is also triggered when switching between configurations with  
the SEL0/1 pins. This ensures that the outputs remain aligned  
in every configuration. This reset causes the outputs to  
suspend for a few hundred microseconds so the switchover is  
not glitch-less. The reset can be disabled for applications  
where glitch-less switch over is required and alignment is not  
critical.  
2
programming for multiple devices in a system. The I C slave  
address can be changed from the default 0xD4 to 0xD0 by  
programming the I2C_ADDR bit D0. VersaClock 5  
2
Programming Guide provides detailed I C programming  
guidelines and register map.  
SD/OE Pin Function  
The polarity of the SD/OE signal pin can be programmed to be  
either active HIGH or LOW with the SP bit (W16[1]). When SP  
is “0” (default), the pin becomes active LOW and when SP is  
“1”, the pin becomes active HIGH. The SD/OE pin can be  
configured as either to shutdown the PLL or to enable/disable  
the outputs. The SH bit controls the configuration of the  
SD/OE pin The SH bit needs to be high for SD/OE pin to be  
configured as SD.  
2
When using I C to reprogram an output divider during  
operation, alignment can be lost. Alignment can be restored  
by manually triggering the reset through I C.  
2
When alignment is required for outputs with different  
frequencies, the outputs are actually aligned on the falling  
edges of each output by default. Rising edge alignment can  
also be achieved by utilizing the programmable skew feature  
to delay the faster clock by 180 degrees. The programmable  
skew feature also allows for fine tuning of the alignment.  
SP  
OUTn  
For details of register programming, please see VersaClock 5  
Family Register Descriptions and Programming Guide for  
details.  
SD/OE Input  
OEn  
Global Shutdown  
OSn  
SH  
When configured as SD, device is shut down, differential  
MARCH 3, 2017  
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PROGRAMMABLE CLOCK GENERATOR  
5P49V5943 DATASHEET  
Output Divides  
Device Hardware Configuration  
Each of the four output divides are comprised of a 12-bit  
integer counter, and a 24-bit fractional counter. The output  
divide can operate in integer divide only mode for improved  
performance, or utilize the fractional counters to generate any  
frequency with a synthesis accuracy better than 50ppb.  
The 5P49V5943 supports an internal One-Time  
Programmable (OTP) memory that can be pre-programmed  
at the factory with up to 4 complete device configuration.  
These configurations can be over-written using the serial  
interface once reset is complete. Any configuration written via  
the programming interface needs to be re-written after any  
power cycle or reset. Please contact IDT if a specific  
factory-programmed configuration is desired.  
The Output Divide also has the capability to apply a spread  
modulation to the output frequency. Independent of output  
frequency, a triangle wave modulation between 30 and 63kHz  
may be generated.  
Device Start-up & Reset Behavior  
Output Skew  
The 5P49V5943 has an internal power-up reset (POR) circuit.  
The POR circuit will remain active for a maximum of 10ms  
after device power-up.  
For outputs that share a common output divide value, there  
will be the ability to skew outputs by quadrature values to  
minimize interaction on the PCB. The skew on each output  
can be adjusted from 0 to 360 degrees. Skew is adjusted in  
units equal to 1/32 of the VCO period. So, for 100 MHz output  
and a 2800 MHz VCO, you can select how many 11.161pS  
units you want added to your skew (resulting in units of 0.402  
degrees). For example, 0, 0.402, 0.804, 1.206, 1.408, and so  
on. The granularity of the skew adjustment is always  
Upon internal POR circuit expiring, the device will exit reset  
and begin self-configuration.  
The device will load internal registers according to Table 3.  
Once the full configuration has been loaded, the device will  
respond to accesses on the serial port and will attempt to lock  
the PLL to the selected source and begin operation.  
dependent on the VCO period and the output period.  
Power Up Ramp Sequence  
Output Drivers  
VDDA and VDDD must ramp up together. VDDO0~2 must  
ramp up before, or concurrently with, VDDA and VDDD. All  
power supply pins must be connected to a power rail even if  
the output is unused. All power supplies must ramp in a linear  
fashion and ramp monotonically.  
The OUT1 to OUT2 clock outputs are provided with  
register-controlled output drivers. By selecting the output drive  
type in the appropriate register, any of these outputs can  
support LVCMOS, LVPECL, HCSL or LVDS logic levels  
The operating voltage ranges of each output is determined by  
its independent output power pin (V  
) and thus each can  
DDO  
VDDO0~2  
have different output voltage levels. Output voltage levels of  
2.5V or 3.3V are supported for differential HCSL, LVPECL  
operation, and 1. 8V, 2.5V, or 3.3V are supported for LVCMOS  
and differential LVDS operation.  
Each output may be enabled or disabled by register bits.  
When disabled an output will be in a logic 0 state as  
determined by the programming bit table shown on page 6.  
VDDA  
VDDD  
LVCMOS Operation  
When a given output is configured to provide LVCMOS levels,  
then both the OUTx and OUTxB outputs will toggle at the  
selected output frequency. All the previously described  
configuration and control apply equally to both outputs.  
Frequency, phase alignment, voltage levels and enable /  
disable status apply to both the OUTx and OUTxB pins. The  
OUTx and OUTxB outputs can be selected to be  
phase-aligned with each other or inverted relative to one  
another by register programming bits. Selection of  
phase-alignment may have negative effects on the phase  
noise performance of any part of the device due to increased  
simultaneous switching noise within the device.  
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MARCH 3, 2017  
5P49V5943 DATASHEET  
2
I C Mode Operation  
2
The device acts as a slave device on the I C bus using one of  
2
the two I C addresses (0xD0 or 0xD4) to allow multiple  
devices to be used in the system. The interface accepts  
byte-oriented block write and block read operations. Two  
address bytes specify the register address of the byte position  
of the first register to write or read. Data bytes (registers) are  
accessed in sequential order from the lowest to the highest  
byte (most significant bit first). Read and write block transfers  
can be stopped after any complete byte transfer. During a  
write operation, data will not be moved into the registers until  
the STOP bit is received, at which point, all data received in  
the block write will be written simultaneously.  
2
For full electrical I C compliance, it is recommended to use  
external pull-up resistors for SDATA and SCLK. The internal  
pull-down resistors have a size of 100ktypical.  
Current Read  
S
Dev Addr + R  
A
A
A
Data 0  
A
Data 1  
A
A
Data n  
Data 0  
A
Abar  
A
P
Sequential Read  
S
Dev Addr + W  
Reg start Addr  
Reg start Addr  
A
A
Sr  
Dev Addr + R  
A
Data 1  
A
A
Data n  
Abar  
P
Sequential Write  
S
Dev Addr + W  
Data 0  
A
Data 1  
A
Data n  
A
P
S = start  
from master to slave  
from slave to master  
Sr = repeated start  
A = acknowledge  
Abar= none acknowledge  
P = stop  
I2C Slave Read and Write Cycle Sequencing  
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5P49V5943 DATASHEET  
Table 5: I2C Bus DC Characteristics  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
For SEL1/SDA pin  
and SEL0/SCL pin.  
For SEL1/SDA pin  
and SEL0/SCL pin.  
5.5 2  
VIH  
Input HIGH Level  
Input LOW Level  
0.7xVDDD  
V
VIL  
GND-0.3  
0.3xVDDD  
V
VHYS  
IIN  
VOL  
Hysteresis of Inputs  
Input Leakage Current  
Output LOW Voltage  
0.05xVDDD  
-1  
V
µA  
V
30  
0.4  
IOL = 3 mA  
Table 6: I2C Bus AC Characteristics  
Symbol  
FSCLK  
tBUF  
Parameter  
Serial Clock Frequency (SCL)  
Bus free time between STOP and START  
Min  
10  
Typ  
Max  
400  
Unit  
kHz  
µs  
µs  
µs  
µs  
µs  
µs  
pF  
ns  
ns  
µs  
µs  
µs  
1.3  
0.6  
0.6  
0.1  
0
tSU:START Setup Time, START  
tHD:START Hold Time, START  
tSU:DATA Setup Time, data input (SDA)  
tHD:DATA Hold Time, data input (SDA) 1  
tOVD  
CB  
tR  
tF  
tHIGH  
tLOW  
Output data valid from clock  
0.9  
400  
300  
300  
Capacitive Load for Each Bus Line  
Rise Time, data and clock (SDA, SCL)  
Fall Time, data and clock (SDA, SCL)  
HIGH Time, clock (SCL)  
20 + 0.1xCB  
20 + 0.1xCB  
0.6  
1.3  
0.6  
LOW Time, clock (SCL)  
tSU:STOP Setup Time, STOP  
Note 1: A device must internally provide a hold time of at least 300 ns for the SDA signal (referred to the VIH(MIN) of the SCL signal) to bridge  
the undefined region of the falling edge of SCL.  
Note 2: I2C inputs are 5V tolerant.  
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Table 7: Absolute Maximum Ratings  
Stresses above the ratings listed below can cause permanent damage to the 5P49V5943. These ratings, which are standard values for IDT  
commercially rated parts, are stress ratings only. Functional operation of the device at these or any other conditions above those indicated in  
the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods can affect  
product reliability. Electrical parameters are guaranteed only over the recommended operating temperature range.  
Item  
Rating  
Supply Voltage, VDDA, VDDD, VDDO  
3.465V  
Inputs  
CLKIN, CLKINB  
Other inputs  
0V to 1.2V voltage swing single-ended  
-0.5V to VDDD  
Outputs, VDDO (LVCMOS)  
Outputs, IO (SDA)  
-0.5V to VDDO+ 0.5V  
10mA  
Package Thermal Impedance, JA  
Package Thermal Impedance, JC  
Storage Temperature, TSTG  
ESD Human Body Model  
Junction Temperature  
42C/W (0 mps)  
41.8C/W (0 mps)  
-65C to 150C  
2000V  
125°C  
Table 8: Recommended Operation Conditions  
Symbol  
Parameter  
Min  
1.71  
Typ  
1.8  
2.5  
3.3  
Max  
1.89  
Unit  
V
Power supply voltage for supporting 1.8V outputs  
Power supply voltage for supporting 2.5V outputs  
Power supply voltage for supporting 3.3V outputs  
Power supply voltage for core logic functions  
V
V
V
DDOX  
DDOX  
DDOX  
2.375  
3.135  
1.71  
2.625  
3.465  
3.465  
3.465  
V
V
V
V
DDD  
DDA  
Analog power supply voltage. Use filtered analog power  
supply.  
V
1.71  
V
Operating temperature, ambient  
T
-40  
+85  
15  
°C  
pF  
A
Maximum load capacitance (3.3V LVCMOS only)  
External reference clock CLKIN, CLKINB  
C
LOAD_OUT  
F
5
350  
5
MHz  
ms  
IN  
Power up time for all VDDs to reach minimum specified  
voltage (power ramps must be monotonic)  
t
0.05  
PU  
Note: VDDO1, VDDO2, VDDO3, and VDDO4 must be powered on either before or simultaneously with VDDD, VDDA and VDDO0.  
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5P49V5943 DATASHEET  
Table 9: Input Capacitance, LVCMOS Output Impedance, and Internal Pull-down  
Resistance (T = +25 °C)  
A
Symbol  
Parameter  
Min  
Typ  
Max  
7
Unit  
Input Capacitance (CLKIN, CLKINB, SD/OE, SEL1/SDA,  
SEL0/SCL)  
CIN  
3
pF  
SD/OE, SEL1/SDA, SEL0/SCL, CLKIN, CLKINB,  
OUT0_SEL_I2CB  
Pull-down Resistor  
ROUT  
100  
300  
k  
LVCMOS Output Driver Impedance (VDDO = 1.8V, 2.5V, 3.3V)  
17  
Table 10: DC Electrical Characteristics  
Symbol  
Parameter  
Test Conditions  
Min  
Typ  
Max  
Unit  
100 MHz on all outputs, 25 MHz  
REFCLK  
Iddcore3  
Core Supply Current  
30  
42  
37  
18  
17  
16  
29  
28  
16  
14  
12  
36  
27  
16  
10  
34  
47  
42  
21  
20  
19  
33  
33  
18  
16  
14  
42  
32  
19  
14  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
LVPECL, 350 MHz, 3.3V VDDOx  
LVPECL, 350 MHz, 2.5V VDDOx  
LVDS, 350 MHz, 3.3V VDDOx  
LVDS, 350 MHz, 2.5V VDDOx  
LVDS, 350 MHz, 1.8V VDDOx  
HCSL, 250 MHz, 3.3V VDDOx, 2 pF load  
HCSL, 250 MHz, 2.5V VDDOx, 2 pF load  
Iddox  
Output Buffer Supply Current  
1,2  
LVCMOS, 50 MHz, 3.3V, VDDOx  
1,2  
LVCMOS, 50 MHz, 2.5V, VDDOx  
1,2  
LVCMOS, 50 MHz, 1.8V, VDDOx  
LVCMOS, 200 MHz, 3.3V VDDOx1  
LVCMOS, 200 MHz, 2.5V VDDOx1,2  
LVCMOS, 200 MHz, 1.8V VDDOx1,2  
SD asserted, I2C Programming  
Iddpd  
Power Down Current  
1. Single CMOS driver active.  
2. Measured into a 5” 50 Ohm trace with 2 pF load.  
3. Iddcore = IddA+ IddD, no loads.  
Table 11: Electrical Characteristics – Differential Clock Input Parameters 1,2 (Supply  
Voltage V  
, V  
, V 0 = 3.3V ±5%, 2.5V ±5%, 1.8V ±5%, TA = -40°C to +85°C)  
DDO  
DDA  
DDD  
Symbol  
VIH  
Parameter  
Test Conditions  
Min  
0.55  
Typ  
Max  
Unit  
Input High Voltage - CLKIN, CLKINBSingle-ended input  
Input Low Voltage - CLKIN, CLKINB Single-ended input  
Input Amplitude - CLKIN, CLKINB Peak to Peak value, single-ended  
Input Slew Rate - CLKIN, CLKINB Measured differentially  
1.7  
V
VIL  
GND - 0.3  
200  
0.4  
1200  
8
V
mV  
V/ns  
µA  
VSWING  
dv/dt  
IIL  
0.4  
Input Leakage Low Current  
Input Leakage High Current  
Input Duty Cycle  
VIN = GND  
-5  
5
IIH  
VIN = 1.7V  
20  
µA  
dTIN  
Measurement from differential waveform  
45  
55  
%
1. Guaranteed by design and characterization, not 100% tested in production.  
2. Slew rate measured through ±75mV window centered around differential zero.  
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1
Table 12: DC Electrical Characteristics for 3.3V LVCMOS (V  
= 3.3V±5%, TA = -40°C to +85°C)  
DDO  
Symbol  
VOH  
VOL  
Parameter  
Test Conditions  
Min  
Typ  
Max  
VDDO  
0.4  
Unit  
V
IOH = -15mA  
Output HIGH Voltage  
Output LOW Voltage  
Output Leakage Current (OUT1~4)  
Output Leakage Current (OUT0)  
Input HIGH Voltage  
2.4  
IOL = 15mA  
V
Tri-state outputs, VDDO = 3.465V  
Tri-state outputs, VDDO = 3.465V  
Single-ended inputs - SD/OE  
Single-ended inputs - SD/OE  
Single-ended input OUT0_SEL_I2CB  
Single-ended input OUT0_SEL_I2CB  
SD/OE, SEL1/SDA, SEL0/SCL  
IOZDD  
IOZDD  
VIH  
5
µA  
µA  
V
30  
0.7xVDDD  
GND - 0.3  
2
VDDD + 0.3  
0.3xVDDD  
VDDO0 + 0.3  
0.4  
VIL  
Input LOW Voltage  
V
VIH  
Input HIGH Voltage  
V
VIL  
Input LOW Voltage  
GND - 0.3  
V
TR/TF  
Input Rise/Fall Time  
300  
ns  
1. See “Recommended Operating Conditions” table.  
Table 13: DC Electrical Characteristics for 2.5V LVCMOS (V  
= 2.5V±5%, TA = -40°C to +85°C)  
DDO  
Symbol  
VOH  
VOL  
Parameter  
Test Conditions  
Min  
Typ  
Max  
Unit  
V
IOH = -12mA  
Output HIGH Voltage  
Output LOW Voltage  
Output Leakage Current (OUT1~4)  
Output Leakage Current (OUT0)  
Input HIGH Voltage  
0.7xVDDO  
IOL = 12mA  
0.4  
5
V
Tri-state outputs, VDDO = 2.625V  
Tri-state outputs, VDDO = 2.625V  
Single-ended inputs - SD/OE  
Single-ended inputs - SD/OE  
Single-ended input OUT0_SEL_I2CB  
Single-ended input OUT0_SEL_I2CB  
IOZDD  
IOZDD  
VIH  
µA  
µA  
V
30  
0.7xVDDD  
GND - 0.3  
1.7  
VDDD + 0.3  
0.3xVDDD  
VDDO0 + 0.3  
0.4  
VIL  
Input LOW Voltage  
V
VIH  
Input HIGH Voltage  
V
VIL  
Input LOW Voltage  
GND - 0.3  
V
TR/TF  
SD/OE, SEL1/SDA, SEL0/SCL  
Input Rise/Fall Time  
300  
ns  
Table 14: DC Electrical Characteristics for 1.8V LVCMOS (V  
= 1.8V±5%, TA = -40°C to +85°C)  
DDO  
Symbol  
VOH  
VOL  
Parameter  
Test Conditions  
Min  
Typ  
Max  
VDDO  
Unit  
V
IOH = -8mA  
Output HIGH Voltage  
Output LOW Voltage  
Output Leakage Current (OUT1~4)  
Output Leakage Current (OUT0)  
Input HIGH Voltage  
0.7 xVDDO  
IOL = 8mA  
0.25 x VDDO  
5
V
Tri-state outputs, VDDO = 3.465V  
Tri-state outputs, VDDO = 3.465V  
Single-ended inputs - SD/OE  
Single-ended inputs - SD/OE  
Single-ended input OUT0_SEL_I2CB  
Single-ended input OUT0_SEL_I2CB  
SD/OE, SEL1/SDA, SEL0/SCL  
IOZDD  
IOZDD  
VIH  
µA  
µA  
V
30  
0.7 * VDDD  
GND - 0.3  
VDDD + 0.3  
0.3 * VDDD  
VDDO0 + 0.3  
0.4  
VIL  
Input LOW Voltage  
V
VIH  
Input HIGH Voltage  
0.65 * VDDO0  
GND - 0.3  
V
VIL  
Input LOW Voltage  
V
TR/TF  
Input Rise/Fall Time  
300  
ns  
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Table 15: DC Electrical Characteristics for LVDS(V  
= 3.3V+5% or 2.5V+5%, TA = -40°C to +85°C)  
DDO  
Symbol  
Parameter  
Min  
247  
Typ  
Max  
454  
-454  
50  
Unit  
mV  
mV  
mV  
V
Differential Output Voltage for the TRUE binary state  
Differential Output Voltage for the FALSE binary state  
Change in VOT between Complimentary Output States  
Output Common Mode Voltage (Offset Voltage)  
V
(+)  
(-)  
OT  
V
-247  
OT  
V
OT  
V
1.125  
1.25  
1.375  
50  
OS  
Change in VOS between Complimentary Output States  
Outputs Short Circuit Current, VOUT+ or VOUT - = 0V or VDDO  
V
mV  
mA  
mA  
OS  
I
9
6
24  
OS  
Differential Outputs Short Circuit Current, VOUT+ = VOUT  
-
I
12  
OSD  
Table 16: DC Electrical Characteristics for LVDS (V  
= 1.8V+5%, TA = -40°C to +85°C)  
DDO  
Symbol  
Parameter  
Min  
247  
Typ  
Max  
454  
-454  
50  
Unit  
mV  
mV  
mV  
V
Differential Output Voltage for the TRUE binary state  
Differential Output Voltage for the FALSE binary state  
Change in VOT between Complimentary Output States  
Output Common Mode Voltage (Offset Voltage)  
V
(+)  
(-)  
OT  
V
-247  
OT  
V
OT  
V
0.8  
0.875  
0.95  
50  
OS  
Change in VOS between Complimentary Output States  
Outputs Short Circuit Current, VOUT+ or VOUT - = 0V or VDDO  
V
mV  
mA  
mA  
OS  
I
9
6
24  
OS  
Differential Outputs Short Circuit Current, VOUT+ = VOUT  
-
I
12  
OSD  
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Table 17: DC Electrical Characteristics for LVPECL (V  
+85°C)  
= 3.3V+5% or 2.5V+5%, TA = -40°C to  
DDO  
Symbol  
Parameter  
Min  
Typ  
Max  
Unit  
V
Output Voltage HIGH, terminated through 50tied to VDD - 2 V  
Output Voltage LOW, terminated through 50tied to VDD - 2 V  
Peak-to-Peak Output Voltage Swing  
V
V
- 1.19  
- 1.94  
V
- 0.69  
DDO  
OH  
DDO  
DDO  
V
V
V
- 1.4  
DDO  
V
OL  
V
0.55  
0.993  
V
SWING  
Table 18: Electrical Characteristics – DIF 0.7V Low Power HCSL Differential Outputs  
(V  
= 3.3V±5%, 2.5V±5%, TA = -40°C to +85°C)  
DDO  
Symbol Parameter  
Conditions  
Min  
Typ  
Max  
4
Units  
V/ns  
%
Notes  
1,2,3  
1,2,3  
dV/dt  
dV/dt  
Slew Rate  
Slew Rate  
Scope averaging on  
1
Scope averaging on  
20  
Δ
Statistical measurement on single-ended  
signal using oscilloscope math function  
(Scope averaging ON)  
VHIGH  
VLOW  
VMAX  
VMIN  
Voltage High  
660  
850  
150  
mV  
mV  
mV  
mV  
mV  
mV  
mV  
1,6,7  
1,6  
1
Voltage Low  
-150  
Maximum Voltage  
Minimum Voltage  
1150  
Measurement on single-ended signal using  
absolute value (Scope averaging off)  
Scope averaging off  
-300  
300  
250  
1
VSWING Voltage Swing  
1,2,6  
1,4,6  
1,5  
Scope averaging off  
Scope averaging off  
VCROSS Crossing Voltage Value  
550  
140  
VCROSS  
Crossing Voltage variation  
Δ
1. Guaranteed by design and characterization. Not 100% tested in production  
2. Measured from differential waveform.  
3. Slew rate is measured through the VSWING voltage range centered around differential 0V. This results in a +/-150mV window around  
differential 0V.  
4. VCROSS is defined as voltage where Clock = Clock# measured on a component test board and only applies to the differential rising edge  
(i.e. Clock rising and Clock# falling).  
5. The total variation of all VCROSS measurements in any particular system. Note that this is a subset of VCROSS min/max (VCROSS absolute)  
allowed. The intent is to limit VCROSS induced modulation by setting VCROSS to be smaller than VCROSS absolute.  
6. Measured from single-ended waveform.  
7. Measured with scope averaging off, using statistics function. Variation is difference between min. and max.  
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Table 19: AC Timing Electrical Characteristics  
(VDDO = 3.3V+5% or 2.5V+5% or 1.8V ±5%, TA = -40°C to +85°C)  
(Spread Spectrum Generation = OFF)  
Symbol  
fIN 1  
Min.  
Typ.  
Max.  
350  
Units  
Parameter  
Test Conditions  
Input Frequency  
1
1
MHz  
Input frequency limit (CLKIN, CLKINB)  
200  
Single ended clock output limit (LVCMOS)  
Differential cock output limit (LVPECL/  
LVDS/HCSL)  
fOUT  
Output Frequency  
MHz  
1
350  
fVCO  
fPFD  
fBW  
t2  
VCO Frequency  
PFD Frequency  
Loop Bandwidth  
Input Duty Cycle  
2600  
1 1  
2900  
150  
0.9  
MHz  
MHz  
MHz  
%
VCO operating frequency range  
PFD operating frequency range  
Input frequency = 25MHz  
0.06  
45  
50  
50  
55  
Duty Cycle  
Measured at VDD/2, all outputs except  
Reference output OUT0, VDDOX= 2.5V or  
3.3V  
Measured at VDD/2, all outputs except  
Reference output OUT0, VDDOX=1.8V  
Measured at VDD/2, Reference output  
OUT0 (5MHz - 120MHz) with 50% duty  
cycle input  
45  
40  
40  
55  
60  
60  
%
%
%
50  
50  
t3 5  
Output Duty Cycle  
Measured at VDD/2, Reference output  
OUT0 (150.1MHz - 200MHz) with 50% duty  
cycle input  
30  
50  
70  
%
Slew Rate, SLEW[1:0] = 00  
Slew Rate, SLEW[1:0] = 01  
Slew Rate, SLEW[1:0] = 10  
Slew Rate, SLEW[1:0] = 11  
Slew Rate, SLEW[1:0] = 00  
Slew Rate, SLEW[1:0] = 01  
Slew Rate, SLEW[1:0] = 10  
Slew Rate, SLEW[1:0] = 11  
Slew Rate, SLEW[1:0] = 00  
Slew Rate, SLEW[1:0] = 01  
Slew Rate, SLEW[1:0] = 10  
Slew Rate, SLEW[1:0] = 11  
Rise Times  
2.2  
2.3  
2.4  
2.7  
1.3  
1.4  
1.4  
1.7  
0.7  
0.8  
0.9  
1.2  
300  
300  
400  
400  
1.0  
1.2  
1.3  
1.7  
0.6  
0.7  
0.6  
1.0  
0.3  
0.4  
0.4  
0.7  
Single-ended 3.3V LVCMOS output clock  
rise and fall time, 20% to 80% of VDDO  
(Output Load = 5 pF) VDDOX=3.3V  
Single-ended 2.5V LVCMOS output clock  
rise and fall time, 20% to 80% of VDDO  
(Output Load = 5 pF) VDDOX=2.5V  
t4 2  
V/ns  
Single-ended 1.8V LVCMOS output clock  
rise and fall time, 20% to 80% of VDDO  
(Output Load = 5 pF) VDDOX=1.8V  
LVDS, 20% to 80%  
LVDS, 80% to 20%  
LVPECL, 20% to 80%  
LVPECL, 80% to 20%  
Fall Times  
t5  
ps  
Rise Times  
Fall Times  
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Cycle-to-Cycle jitter (Peak-to-Peak),  
multiple output frequencies switching,  
differential outputs (1.8V to 3.3V nominal  
output voltage)  
46  
ps  
OUT0=25MHz  
OUT1=100MHz  
OUT2=125MHz  
OUT3=156.25MHz  
Cycle-to-Cycle jitter (Peak-to-Peak),  
multiple output frequencies switching,  
LVCMOS outputs (1.8 to 3.3V nominal  
output voltage)  
74  
ps  
OUT0=25MHz  
OUT1=100MHz  
OUT2=125MHz  
OUT3=156.25MHz  
t6  
Clock Jitter  
RMS Phase Jitter (12kHz to 5MHz  
integration range) reference clock (OUT0),  
25 MHz LVCMOS outputs (1.8 to 3.3V  
nominal output voltage).  
OUT0=25MHz  
0.5  
ps  
OUT1=100MHz  
OUT2=125MHz  
OUT3=156.25MHz  
RMS Phase Jitter (12kHz to 20MHz  
integration range) differential output, VDDO  
= 3.465V, 25MHz input, 156.25MHz output  
frequency  
OUT0=25MHz  
OUT1=100MHz  
0.75  
1.5  
ps  
ps  
OUT2=125MHz  
OUT3=156.25MHz  
Skew between the same frequencies, with  
outputs using the same driver format and  
phase delay set to 0 ns.  
PLL lock time from power-up, measured  
after all VDD's have raised above 90% of  
their target value.  
t7  
Output Skew  
75  
3
t8 3  
t9 4  
10  
4
ms  
ms  
Startup Time  
Startup Time  
PLL lock time from shutdown mode  
1. Practical lower frequency is determined by loop filter settings.  
2. A slew rate of 2.75V/ns or greater should be selected for output frequencies of 100MHz or higher.  
3. Includes loading the configuration bits from EPROMto PLL registers. It does not include EPROMprogramming/write time.  
4. Actual PLL lock time depends on the loop configuration.  
5. Duty Cycle is only guaranteed at max slew rate settings.  
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Table 20: PCI Express Jitter Specifications (V  
= 3.3V+5% or 2.5V+5%, T = -40°C to +85°C)  
A
DDO  
Symbol  
Parameter  
Conditions  
Min Typ Max PCIe Industry Units Notes  
Specification  
tJ  
ƒ = 100MHz, 25MHz Input  
Evaluation Band: 0Hz - Nyquist  
(clock frequency/2)  
30  
86  
ps  
1,4  
Phase Jitter  
Peak-to-Peak  
(PCIe Gen1)  
tREFCLK_HF_RMS  
(PCIe Gen2)  
ƒ = 100MHz, 25MHz Input High  
Band: 1.5MHz - Nyquist (clock  
frequency/2)  
2.56  
3.10  
ps  
2,4  
Phase Jitter RMS  
Phase Jitter RMS  
Phase Jitter RMS  
tREFCLK_LF_RMS  
(PCIe Gen2)  
ƒ = 100MHz, 25MHz Input Low  
Band: 10kHz - 1.5MHz  
0.27  
0.8  
3.0  
1.0  
ps  
ps  
2,4  
3,4  
tREFCLK_RMS  
(PCIe Gen3)  
ƒ = 100MHz, 25MHz Input  
Evaluation Band: 0Hz - Nyquist  
(clock frequency/2)  
Note: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is mounted in a test  
socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium has been reached under these  
conditions.  
1. Peak-to-Peak jitter after applying system transfer function for the Common Clock Architecture. Maximum limit for PCI Express Gen 1.  
2. RMS jitter after applying the two evaluation bands to the two transfer functions defined in the Common Clock Architecture and reporting the worst case results  
for each evaluation band. Maximum limit for PCI Express Generation 2 is 3.1ps RMS for tREFCLK_HF_RMS (High Band) and 3.0ps RMS for tREFCLK_LF_RMS (Low  
Band).  
3. RMS jitter after applying system transfer function for the common clock architecture. This specification is based on the PCI_Express_Base_r3.0 10 Nov, 2010  
specification, and is subject to change pending the final release version of the specification.  
4. This parameter is guaranteed by characterization. Not tested in production.  
Table 21: Jitter Specifications 1,2,3  
(VDDx = 3.3V+5% or 2.5V+5%, TA = -40°C to +85°C)  
Parameter  
Symbol  
Test Condition  
CLKIN = 19.44 MHz, All CLKn at 155.52 MHz5  
Total Jitter6  
RMS Jitter6, 10 kHz to 1.5MHz  
RMS Jitter6, 1.5MHz to 50MHz  
RMS Jitter6  
Min  
Typ  
0.69  
9.1  
Max  
0.95  
12  
Unit  
ps  
OC-12 Random Jitter (12 kHz–5 MHz)  
PCI Express 1.1 Common Clocked  
JOC12  
-
-
-
-
-
ps  
0.1  
0.3  
ps  
PCI Express 2.1 Common Clocked  
PCI Express 3.0 Common Clocked  
0.9  
1.1  
ps  
0.2  
0.4  
ps  
Notes:  
1 All measurements w ith Spread Spectrum Off.  
2 For best jitter performance, keep the single ended clock input slew rates at more than 1.0 V/ns and the differential clock input slew rates more than 0.3 V/ns.  
3 All jitter data in this table is based upon all output formats being differential. When single-ended outputs are used, there is the potential that the output jitter may increase  
due to the nature of single-ended outputs. If your configuration implements any single-ended output and any output is required to have jitter less than 3 ps rms, contact  
IDT for support to validate your configuration and ensure the best jitter performance. In many configurations, CMOS outputs have little to no effect upon jitter.  
4 DJ for PCI and GbEis < 5 ps pp.  
5 Output FOD in Integer mode.  
6 All output clocks 100 MHz HCSL format. Jitter is from the PCIEjitter filter combination that produces the highest jitter. Jitter is measured w ith the Intel Clock Jitter Tool,  
Ver. 1.6.6.  
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Table 22: Spread Spectrum Generation Specifications  
Symbol  
Parameter  
Output Frequency  
Mod Frequency  
Spread Value  
Description  
Min Typ Max  
Unit  
MHz  
kHz  
Output Frequency Range  
Modulation Frequency  
f
5
300  
OUT  
f
30 to 63  
MOD  
Amount of Spread Value (programmable) - Center Spread  
Amount of Spread Value (programmable) - Down Spread  
f
±0.25% to ±2.5%  
-0.5% to -5%  
%f  
OUT  
SPREAD  
Test Circuits and Loads  
VDDOx  
VDDD  
VDDA  
OUTx  
CLKOUT  
0.1µF  
0.1µF  
0.1µF  
CL  
GND  
HCSL Differential Output Test Load  
Zo=100ohm differential  
33  
2pF  
2pF  
33  
50  
50  
HCSL Output  
Test Circuits and Loads for Outputs  
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Typical Phase Noise at 100MHz (3.3V, 25°C)  
NOTE: All outputs operational at 100MHz, Phase Noise Plot with Spurs On.  
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5P49V5943 Application Schematic  
The following figure shows an example of 5P49V5943 application schematic. Input and output terminations shown are intended as examples  
only and may not represent the exact user configuration. In this example, the device is operated at VDDD, VDDA = 3.3V. The decoupling  
capacitors should be located as close as possible to the power pin.  
As with any high speed analog circuitry, the power supply pins are vulnerable to random noise. To achieve optimum jitter performance, power  
supply isolation is required. 5P49V5943 provides separate power supplies to isolate any high switching noise from coupling into the internal  
PLL.  
In order to achieve the best possible filtering, it is recommended that the placement of the filter components be on the device side of the PCB  
as close to the power pins as possible. If space is limited, the 0.1uf capacitor in each power pin filter should be placed on the device side. The  
other components can be on the opposite side of the PCB.  
Power supply filter recommendations are a general guideline to be used for reducing external noise from coupling into the devices. The filter  
performance is designed for a wide range of noise frequencies. This low-pass filter starts to attenuate noise at approximately 10 kHz. If a  
specific frequency noise component is known, such as switching power supply frequencies, it is recommended that component values be  
adjusted and if required, additional filtering be added. Additionally, good general design practices for power plane voltage stability suggests  
adding bulk capacitance in the local area of all devices.  
The schematic example focuses on functional connections and is not configuration specific. Refer to the pin description and functional tables  
in the datasheet to ensure the logic control inputs are properly set.  
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5P49V5943 Reference Schematic  
2
2
1
1
2
1
1
1
2
2
1
1
1
1
1
2
2
2
2
2
E P A D  
2 5  
E P A D  
2 4  
2 3  
E P A D  
E P A D  
2 2  
E P A D  
2 1  
2
2
1
1
PROGRAMMABLE CLOCK GENERATOR  
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CLKIN Equivalent Schematic  
Figure CLKIN Equivalent Schematic below shows the basis of  
the requirements on VIH max, VIL min and the 1200 mV p-p  
single ended Vswing maximum.  
clamped by these diodes. CLKIN and CLKINB input  
voltages less than -0.3V will be clamped by diodes D1 and  
D3.  
The 1.2V p-p maximum Vswing input requirement is  
determined by the internally regulated 1.2V supply for the  
actual clock receiver. This is the basis of the Vswing spec in  
Table 13.  
The CLKIN and CLKINB Vih max spec comes from the  
cathode voltage on the input ESD diodes D2 and D4, which  
are referenced to the internal 1.2V supply. CLKIN or  
CLKINB voltages greater than 1.2V + 0.5V =1.7V will be  
CLKIN Equivalent Schematic  
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5P49V5943 DATASHEET  
Wiring the Differential Input to Accept Single-Ended Levels  
Figure Recommended Schematic for Wiring a Differential  
Input to Accept Single-ended Levels shows how a differential  
input can be wired to accept single ended levels. This  
configuration has three properties; the total output impedance  
of Ro and Rs matches the 50 ohm transmission line  
impedance, the Vrx voltage is generated at the CLKIN inputs  
which maintains the LVCMOS driver voltage level across the  
transmission line for best S/N and the R1-R2 voltage divider  
values ensure that Vrx p-p at CLKIN is less than the maximum  
value of 1.2V.  
VDD  
Ro  
Rs  
Zo = 50 Ohm  
R1  
Vrx  
CLKIN  
Ro + Rs = 50  
LVCMOS  
CLKINB  
R2  
VersaClock 5 Receiver  
Recommended Schematic for Wiring a Differential Input to Accept Single-ended Levels  
Table 23 Nominal Voltage Divider Values vs Driver VDD  
shows resistor values that ensure the maximum drive level for  
the CLKIN port is not exceeded for all combinations of 5%  
tolerance on the driver VDD, the VersaClock Vddo_0 and 5%  
resistor tolerances. The values of the resistors can be  
adjusted to reduce the loading for slower and weaker  
LVCMOS driver by increasing the impedance of the R1-R2  
divider. To assist this assessment, the total load on the driver  
is included in the table.  
Table 23: Nominal Voltage Divider Values vs Driver VDD  
LVCMOS Driver VDD  
Ro+Rs  
50.0  
R1  
130  
100  
62  
R2  
75  
Vrx (peak) Ro+Rs+R1+R2  
3.3  
2.5  
1.8  
0.97  
1.00  
0.97  
255  
250  
242  
50.0  
100  
130  
50.0  
PROGRAMMABLE CLOCK GENERATOR  
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MARCH 3, 2017  
5P49V5943 DATASHEET  
HCSL Differential Clock Input Interface  
CLKIN/CLKINB will accept DC coupled HCSL signals.  
Zo=50ohm  
Q
CLKIN  
Zo=50ohm  
nQ  
CLKINB  
VersaClock 5 Receiver  
CLKIN, CLKINB Input Driven by an HCSL Driver  
3.3V Differential LVPECL Clock Input Interface  
The logic levels of 3.3V LVPECL and LVDS can exceed VIH  
max for the CLKIN/B pins. Therefore the LVPECL levels must  
be AC coupled to the VersaClock differential input and the DC  
bias restored with external voltage dividers. A single table of  
bias resistor values is provided below for both for 3.3V  
LVPECL and LVDS. Vbias can be VDDD, V or any other  
available voltage at the VersaClock receiver that is most  
conveniently accessible in layout.  
DDOX  
Vbias  
Rpu1  
Rpu2  
C5  
0.01µF  
Zo=50ohm  
Zo=50ohm  
CLKIN  
C6  
0.01µF  
CLKINB  
R9  
50ohm  
R10  
50ohm  
+3.3V LVPECL  
Driver  
VersaClock 5 Receiver  
R13  
4.7kohm  
R15  
4.7kohm  
RTT  
50ohm  
CLKIN, CLKINB Input Driven by a 3.3V LVPECL Driver  
MARCH 3, 2017  
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5P49V5943 DATASHEET  
Vbias  
Rpu1  
Rpu2  
C1  
0.1µF  
Zo=50ohm  
CLKIN  
C2  
0.1µF  
Rterm  
100ohm  
Zo=50ohm  
CLKINB  
VersaClock 5 Receiver  
LVDS Driver  
R2  
4.7kohm  
R1  
4.7kohm  
CLKIN, CLKINB Input Driven by an LVDS Driver  
Table 24: Bias Resistors for 3.3V LVPECL and LVDS Drive to CLKIN/B  
Vbias  
(V)  
Rpu1/2  
(kohm)  
CLKIN/B Bias Voltage  
(V)  
3.3  
2.5  
1.8  
22  
15  
10  
0.58  
0.60  
0.58  
2.5V Differential LVPECL Clock Input Interface  
The maximum DC 2.5V LVPECL voltage meets the VIH max  
CLKIN requirement. Therefore 2.5V LVPECL can be  
connected directly to the CLKIN terminals without AC coupling  
Zo=50ohm  
CLKIN  
Zo=50ohm  
CLKINB  
+2.5V LVPECL  
Driver  
Versaclock 5 Receiver  
R1  
50ohm  
R2  
50ohm  
RTT  
18ohm  
CLKIN, CLKINB Input Driven by a 2.5V LVPECL Driver  
PROGRAMMABLE CLOCK GENERATOR  
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5P49V5943 DATASHEET  
LVDS Driver Termination  
For a general LVDS interface, the recommended value for the  
termination impedance (ZT) is between 90. and 132. The  
actual value should be selected to match the differential  
impedance (Zo) of your transmission line. A typical  
point-to-point LVDS design uses a 100parallel resistor at the  
receiver and a 100. differential transmission-line  
environment. In order to avoid any transmission-line reflection  
issues, the components should be surface mounted and must  
be placed as close to the receiver as possible. The standard  
termination schematic as shown in figure Standard  
Termination or the termination of figure Optional Termination  
can be used, which uses a center tap capacitance to help filter  
common mode noise. The capacitor value should be  
approximately 50pF. In addition, since these outputs are LVDS  
compatible, the input receiver's amplitude and common-mode  
input range should be verified for compatibility with the IDT  
LVDS output. If using a non-standard termination, it is  
recommended to contact IDT and confirm that the termination  
will function as intended. For example, the LVDS outputs  
cannot be AC coupled by placing capacitors between the  
LVDS outputs and the 100 ohm shunt load. If AC coupling is  
required, the coupling caps must be placed between the 100  
ohm shunt termination and the receiver. In this manner the  
termination of the LVDS output remains DC coupled.  
ZO ZT  
LVDS  
ZT  
LVDS  
Driver  
Receiver  
Standard Termination  
ZT  
2
ZO ZT  
LVDS  
Driver  
LVDS  
Receiver  
ZT  
2
C
Optional Termination  
MARCH 3, 2017  
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PROGRAMMABLE CLOCK GENERATOR  
5P49V5943 DATASHEET  
Termination for 3.3V LVPECL Outputs  
The clock layout topology shown below is a typical termination  
for LVPECL outputs. The two different layouts mentioned are  
recommended only as guidelines.  
The differential outputs generate ECL/LVPECL compatible  
outputs. Therefore, terminating resistors (DC current path to  
ground) or current sources must be used for functionality.  
These outputs are designed to drive 50transmission lines.  
Matched impedance techniques should be used to maximize  
operating frequency and minimize signal distortion. The figure  
below show two different layouts which are recommended  
only as guidelines. Other suitable clock layouts may exist and  
it would be recommended that the board designers simulate  
to guarantee compatibility across all printed circuit and clock  
component process variations.  
3.3V  
3.3V  
Zo=50ohm  
Zo=50ohm  
+
-
LVPECL  
Input  
R1  
50ohm  
R2  
50ohm  
RTT  
50ohm  
3.3V LVPECL Output Termination (1)  
3.3V  
3.3V  
3.3V  
R3  
R4  
125ohm  
125ohm  
Zo=50ohm  
+
-
Zo=50ohm  
Input  
LVPECL  
R1  
84ohm  
R2  
84ohm  
3.3V LVPECL Output Termination (2)  
PROGRAMMABLE CLOCK GENERATOR  
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MARCH 3, 2017  
5P49V5943 DATASHEET  
Termination for 2.5V LVPECL Outputs  
Figures 2.5V LVPECL Driver Termination Example (1) and (2)  
show examples of termination for 2.5V LVPECL driver. These  
terminations are equivalent to terminating 50to VDDO – 2V.  
For VDDO = 2.5V, the VDDO – 2V is very close to ground level.  
The R3 in Figure 2.5V LVPECL Driver Termination Example  
(3) can be eliminated and the termination is shown in example  
(2).  
VDDO = 2.5V  
2.5V  
2.5V  
VDDO = 2.5V  
Zo=50ohm  
Zo=50ohm  
2.5V  
R1  
250ohm  
R3  
250ohm  
+
-
Zo=50ohm  
+
-
2.5V LVPECL  
Driver  
Zo=50ohm  
R1  
50ohm  
R2  
50ohm  
2.5V LVPECL  
Driver  
R2  
62.5ohm  
R4  
62.5ohm  
R3  
18ohm  
2.5V LVPECL Driver Termination Example (3)  
2.5V LVPECL Driver Termination Example (1)  
VDDO = 2.5V  
2.5V  
Zo=50ohm  
+
Zo=50ohm  
-
2.5V LVPECL  
R1  
50ohm  
R2  
50ohm  
Driver  
2.5V LVPECL Driver Termination Example (2)  
MARCH 3, 2017  
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5P49V5943 DATASHEET  
PCI Express Application Note  
For PCI Express Gen2, two transfer functions are defined with 2  
evaluation ranges and the final jitter number is reported in RMS. The  
two evaluation ranges for PCI Express Gen 2 are 10kHz – 1.5MHz  
(Low Band) and 1.5MHz – Nyquist (High Band). The plots show the  
individual transfer functions as well as the overall transfer function Ht.  
PCI Express jitter analysis methodology models the system  
response to reference clock jitter. The block diagram below  
shows the most frequently used Common Clock Architecture  
in which a copy of the reference clock is provided to both ends  
of the PCI Express Link.  
In the jitter analysis, the transmit (Tx) and receive (Rx) serdes  
PLLs are modeled as well as the phase interpolator in the  
receiver. These transfer functions are called H1, H2, and H3  
respectively. The overall system transfer function at the  
receiver is:  
Hts= H3s  H1s– H2s  
The jitter spectrum seen by the receiver is the result of  
applying this system transfer function to the clock spectrum  
X(s) and is:  
Ys= Xs  H3s  H1s– H2s  
In order to generate time domain jitter numbers, an inverse  
Fourier Transform is performed on X(s)*H3(s) * [H1(s) -  
H2(s)].  
PCIe Gen2A Magnitude of Transfer Function  
PCI Express Common Clock Architecture  
For PCI Express Gen 1, one transfer function is defined and the  
evaluation is performed over the entire spectrum: DC to Nyquist (e.g  
for a 100MHz reference clock: 0Hz – 50MHz) and the jitter result is  
reported in peak-peak.  
PCIe Gen2B Magnitude of Transfer Function  
For PCI Express Gen 3, one transfer function is defined and the  
evaluation is performed over the entire spectrum. The transfer  
function parameters are different from Gen 1 and the jitter result is  
reported in RMS.  
PCIe Gen1 Magnitude of Transfer Function  
PROGRAMMABLE CLOCK GENERATOR  
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MARCH 3, 2017  
5P49V5943 DATASHEET  
PCIe Gen3 Magnitude of Transfer Function  
For a more thorough overview of PCI Express jitter analysis  
methodology, please refer to IDT Application Note PCI Express  
Reference Clock Requirements.  
Marking Diagram  
ddd  
5943B  
YW**$  
1. “ddd” denotes dash code.  
2. Line 2: truncated part number  
3. “YW” is the last digit of the year and week that the part was assembled.  
4. “**” denotes sequential lot number.  
5. “$” denotes mark code.  
MARCH 3, 2017  
29  
PROGRAMMABLE CLOCK GENERATOR  
5P49V5943 DATASHEET  
Package Outline and Dimensions (20-pin 3 x 3 mm VFQFPN)  
PROGRAMMABLE CLOCK GENERATOR  
30  
MARCH 3, 2017  
5P49V5943 DATASHEET  
Package Outline and Dimensions (20-pin 3 x 3 mm VFQFPN), cont.  
MARCH 3, 2017  
31  
PROGRAMMABLE CLOCK GENERATOR  
5P49V5943 DATASHEET  
Ordering Information  
Part / Order Number  
5P49V5943BdddNDGI  
5P49V5943BdddNDGI8  
Marking  
see page 29  
Shipping Packaging  
Trays  
Package  
20-pin VFQFPN  
20-pin VFQFPN  
Temperature  
-40° to +85C  
-40° to +85C  
Tape and Reel  
Note: “ddd” denotes the dash code.  
“G” after the two-letter package code denotes Pb-Free configuration, RoHS compliant.  
Revision History  
Date  
Description of Change  
March 3, 2017  
Updated PODs and legal disclaimer  
February 24, 2017 1. Added “Output Alignment” section.  
2. Update “Output Divides” section.  
PROGRAMMABLE CLOCK GENERATOR  
32  
MARCH 3, 2017  
Corporate Headquarters  
6024 Silver Creek Valley Road  
San Jose, CA 95138 USA  
www.IDT.com  
Sales  
Tech Support  
www.idt.com/go/support  
1-800-345-7015 or 408-284-8200  
Fax: 408-284-2775  
www.IDT.com/go/sales  
DISCLAIMER Integrated Device Technology, Inc. (IDT) and its affiliated companies (herein referred to as “IDT”) reserve the right to modify the products and/or specifications described herein at any time, without  
notice, at IDT’s sole discretion. Performance specifications and operating parameters of the described products are determined in an independent state and are not guaranteed to perform the same way when installed  
in customer products. The information contained herein is provided without representation or warranty of any kind, whether express or implied, including, but not limited to, the suitability of IDT's products for any  
particular purpose, an implied warranty of merchantability, or non-infringement of the intellectual property rights of others. This document is presented only as a guide and does not convey any license under intel-  
lectual property rights of IDT or any third parties.  
IDT's products are not intended for use in applications involving extreme environmental conditions or in life support systems or similar devices where the failure or malfunction of an IDT product can be reasonably  
expected to significantly affect the health or safety of users. Anyone using an IDT product in such a manner does so at their own risk, absent an express, written agreement by IDT.  
Integrated Device Technology, IDT and the IDT logo are trademarks or registered trademarks of IDT and its subsidiaries in the United States and other countries. Other trademarks used herein are the property of  
IDT or their respective third party owners. For datasheet type definitions and a glossary of common terms, visit www.idt.com/go/glossary. Integrated Device Technology, Inc.. All rights reserved.  

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