5962-8876802KYC [HP]

Hermetically Sealed, Low IF, Wide VCC, Logic Gate Optocouplers; 密封式,低中频,宽VCC逻辑门光电耦合器
5962-8876802KYC
型号: 5962-8876802KYC
厂家: HEWLETT-PACKARD    HEWLETT-PACKARD
描述:

Hermetically Sealed, Low IF, Wide VCC, Logic Gate Optocouplers
密封式,低中频,宽VCC逻辑门光电耦合器

光电 输出元件 栅
文件: 总12页 (文件大小:296K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Hermetically Sealed,  
Low I , Wide V ,  
F
CC  
HCPL-520x*  
5962-88768  
HCPL-523x  
HCPL-623x  
HCPL-625x  
5962-88769  
Logic Gate Optocouplers  
Technical Data  
*See matrix for available extensions.  
Features  
• Isolated Bus Driver (Single  
Channel)  
• Pulse Transformer  
Replacement  
• Ground Loop Elimination  
• Harsh Industrial  
Environments  
• Computer-Peripheral  
Interfaces  
eliminates the potential for  
output signal chatter. The  
detector in the single channel  
units has a tri-state output stage  
• Dual Marked with Device  
Part Number and DSCC  
Standard Microcircuit  
Drawing  
• Manufactured and Tested on  
a MIL-PRF-38534 Certified  
Line  
• QML-38534, Class H and K  
• Four Hermetically Sealed  
Package Configurations  
• Performance Guaranteed  
over -55°C to +125°C  
• Wide VCC Range (4.5 to 20 V)  
• 350 ns Maximum Propaga-  
tion Delay  
• CMR: > 10,000 V/µs Typical  
• 1500 Vdc Withstand Test  
Voltage  
• Three State Output Available  
• High Radiation Immunity  
• HCPL-2200/31 Function  
Compatibility  
• Reliability Data Available  
• Compatible with LSTTL,  
TTL, and CMOS Logic  
Truth Tables  
(Positive Logic)  
Multichannel Devices  
Input  
On (H)  
Off (L)  
Output  
H
L
Description  
These units are single, dual and  
quad channel, hermetically sealed  
optocouplers. The products are  
capable of operation and storage  
over the full military temperature  
range and can be purchased as  
either standard product or with  
full MIL-PRF-38534 Class Level  
H or K testing or from the  
appropriate DSCC Drawing. All  
devices are manufactured and  
tested on a MIL-PRF-38534  
certified line and are included in  
the DSCC Qualified Manufac-  
turers List QML-38534 for Hybrid  
Microcircuits.  
Single Channel DIP  
Input  
On (H)  
Off (L)  
On (H)  
Off (L)  
Enable Output  
H
H
L
Z
Z
H
L
L
Functional Diagram  
Multiple Channel Devices  
Available  
V
CC  
Each channel contains an AlGaAs  
light emitting diode which is  
V
O
Applications  
• Military and Space  
• High Reliability Systems  
• Transportation and Life  
Critical Systems  
optically coupled to an integrated  
high gain photon detector. The  
detector has a threshold with  
hysteresis which provides differ-  
ential mode noise immunity and  
V
E
GND  
• High Speed Line Receiver  
A 0.1 µF bypass capacitor must be connected between VCC and GND pins.  
CAUTION: It is advised that normal static precautions be taken in handling and assembly of this component to  
prevent damage and/or degradation which may be induced by ESD.  
2
which allows for direct connection  
to data buses. The output is non-  
inverting. The detector IC has an  
internal shield that provides a  
guaranteed common mode  
transient immunity of up to  
10,000 V/µs. Improved power  
supply rejection eliminates the  
need for special power supply  
bypass precautions.  
ceramic chip carrier (case outline  
2). Devices may be purchased  
with a variety of lead bend and  
plating options, see Selection  
Guide Table for details. Standard  
Microcircuit Drawing (SMD)  
parts are available for each  
package and lead style.  
specifications, and performance  
characteristics shown in the  
figures are identical for all parts.  
Occasional exceptions exist due  
to package variations and limita-  
tions and are as noted. Addition-  
ally, the same package assembly  
processes and materials are used  
in all devices. These similarities  
give justification for the use of  
data obtained from one part to  
represent other part’s per-  
Because the same electrical die  
(emitters and detectors) are used  
for each channel of each device  
listed in this data sheet, absolute  
maximum ratings, recommended  
operating conditions, electrical  
Package styles for these parts are  
8 pin DIP through hole (case  
outline P), 16 pin DIP flat pack  
(case outline F), and leadless  
formance for die related  
reliability and certain limited  
radiation test results.  
Selection Guide–Package Styles and Lead Configuration Options  
Package  
Lead Style  
Channels  
8 Pin DIP  
Through Hole  
1
8 Pin DIP  
Through Hole  
2
16 Pin Flat Pack  
Unformed Leads  
4
20 Pad LCCC  
Surface Mount  
2
Common Channel  
Wiring  
None  
V , GND  
CC  
V , GND  
CC  
None  
Agilent Part # & Options  
Commercial  
MIL-PRF-38534, Class H  
MIL-PRF-38534, Class K  
Standard Lead Finish  
Solder Dipped  
Butt Cut/Gold Plate  
Gull Wing/Soldered  
Class H SMD Part #  
Prescript for all below  
Either Gold or Solder  
Gold Plate  
HCPL-5200  
HCPL-5201  
HCPL-520K  
Gold Plate  
Option #200  
Option #100  
Option #300  
HCPL-5230  
HCPL-5231  
HCPL-523K  
Gold Plate  
Option #200  
Option #100  
Option #300  
HCPL-6250  
HCPL-6251  
HCPL-625K  
Gold Plate  
HCPL-6230  
HCPL-6231  
HCPL-623K  
Soldered Pads  
5962-  
5962-  
5962-  
8876903FX  
8876903FC  
5962-  
88769022X  
8876801PX  
8876801PC  
8876801PA  
8876801YC  
8876801YA  
8876801XA  
8876901PX  
8876901PC  
8876901PA  
8876901YC  
8876901YA  
8876901XA  
Solder Dipped  
88769022A  
Butt Cut/Gold Plate  
Butt Cut/Soldered  
Gull Wing/Soldered  
Class K SMD Part #  
Prescript for all below  
Either Gold or Solder  
Gold Plate  
5962-  
5962-  
5962-  
8876906KFX  
8876906KFC  
5962-  
8876905K2X  
8876802KPX  
8876802KPC  
8876802KPA  
8876802KYC  
8876802KYA  
8876802KXA  
8876904KPX  
8876904KPC  
8876904KPA  
8876904KYC  
8876904KYA  
8876904KXA  
Solder Dipped  
8876905K2A  
Butt Cut/Gold Plate  
Butt Cut/Soldered  
Gull Wing/Soldered  
3
Functional Diagrams  
8 Pin DIP  
Through Hole  
1 Channel  
8 Pin DIP  
Through Hole  
2 Channels  
16 Pin Flat Pack  
Unformed Leads  
4 Channels  
20 Pad LCCC  
Surface Mount  
2 Channels  
15  
16  
15  
14  
13  
1
2
3
4
V
CC2  
V
8
7
6
5
V
8
7
6
5
1
2
3
4
1
2
3
4
CC  
CC  
V
CC  
19  
20  
13  
12  
V
V
O2  
GND  
V
O1  
V
V
V
V
V
O
O1  
O2  
O3  
O4  
2
V
O2  
V
CC1  
12  
11  
5
6
7
8
2
3
10  
V
E
O1  
GND  
GND  
GND  
1
GND 10  
9
7
8
Note: Multichannel DIP and flat pack devices have common VCC and ground. Single channel DIP has an enable pin 6. LCCC (leadless  
ceramic chip carrier) package has isolated channels with separate VCC and ground connections.  
7.24 (0.285)  
Outline Drawings  
6.99 (0.275)  
16 Pin Flat Pack, 4 Channels  
2.29 (0.090)  
MAX.  
1.27 (0.050)  
REF.  
11.13 (0.438)  
10.72 (0.422)  
0.46 (0.018)  
0.36 (0.014)  
8.13 (0.320)  
MAX.  
2.85 (0.112)  
MAX.  
0.88 (0.0345)  
MIN.  
0.31 (0.012)  
0.23 (0.009)  
0.89 (0.035)  
0.69 (0.027)  
5.23  
(0.206)  
MAX.  
9.02 (0.355)  
8.76 (0.345)  
NOTE: DIMENSIONS IN MILLIMETERS (INCHES).  
20 Terminal LCCC Surface Mount, 2 Channels  
8 Pin DIP Through Hole, 1 and 2 Channel  
8.70 (0.342)  
9.10 (0.358)  
9.40 (0.370)  
9.91 (0.390)  
0.76 (0.030)  
1.27 (0.050)  
8.13 (0.320)  
MAX.  
4.95 (0.195)  
5.21 (0.205)  
1.78 (0.070)  
2.03 (0.080)  
7.16 (0.282)  
7.57 (0.298)  
1.02 (0.040) (3 PLCS)  
1.14 (0.045)  
1.40 (0.055)  
4.32 (0.170)  
MAX.  
8.70 (0.342)  
9.10 (0.358)  
4.95 (0.195)  
5.21 (0.205)  
TERMINAL 1 IDENTIFIER  
2.16 (0.085)  
0.51 (0.020)  
MIN.  
3.81 (0.150)  
METALIZED  
CASTILLATIONS (20 PLCS)  
1.78 (0.070)  
2.03 (0.080)  
0.20 (0.008)  
0.33 (0.013)  
MIN.  
0.64  
(0.025)  
(20 PLCS)  
0.51 (0.020)  
1.52 (0.060)  
2.03 (0.080)  
7.36 (0.290)  
7.87 (0.310)  
2.29 (0.090)  
2.79 (0.110)  
0.51 (0.020)  
MAX.  
NOTE: DIMENSIONS IN MILLIMETERS (INCHES).  
SOLDER THICKNESS 0.127 (0.005) MAX.  
NOTE: DIMENSIONS IN MILLIMETERS (INCHES).  
4
Leaded Device Marking  
Leadless Device Marking  
Agilent LOGO  
A QYYWWZ  
XXXXXX  
XXXXXXX  
XXX XXX  
50434  
COMPLIANCE INDICATOR,*  
DATE CODE, SUFFIX (IF NEEDED)  
Agilent LOGO  
Agilent P/N  
PIN ONE/  
ESD IDENT  
A QYYWWZ  
XXXXXX  
XXXX  
XXXXXX  
XXX 50434  
COMPLIANCE INDICATOR,*  
DATE CODE, SUFFIX (IF NEEDED)  
DSCC SMD*  
DSCC SMD*  
Agilent FSCN*  
Agilent P/N  
DSCC SMD*  
DSCC SMD*  
PIN ONE/  
COUNTRY OF MFR.  
Agilent FSCN*  
COUNTRY OF MFR.  
ESD IDENT  
*QUALIFIED PARTS ONLY  
*QUALIFIED PARTS ONLY  
Hermetic Optocoupler Options  
Option  
Description  
100  
Surface mountable hermetic optocoupler with leads trimmed for butt joint assembly. This  
option is available on commercial and hi-rel product in 8 pin DIP (see drawings below for  
details).  
4.32 (0.170)  
MAX.  
0.51 (0.020)  
1.14 (0.045)  
MIN.  
0.20 (0.008)  
0.33 (0.013)  
1.40 (0.055)  
2.29 (0.090)  
2.79 (0.110)  
0.51 (0.020)  
MAX.  
7.36 (0.290)  
7.87 (0.310)  
NOTE: DIMENSIONS IN MILLIMETERS (INCHES).  
200  
300  
Lead finish is solder dipped rather than gold plated. This option is available on commercial  
and hi-rel product in 8 pin DIP. DSCC Drawing part numbers contain provisions for lead  
finish. All leadless chip carrier devices are delivered with solder dipped terminals as a  
standard feature.  
Surface mountable hermetic optocoupler with leads cut and bent for gull wing assembly. This  
option is available on commercial and hi-rel product in 8 pin DIP (see drawings below for  
details). This option has solder dipped leads.  
4.57 (0.180)  
MAX.  
4.57 (0.180)  
MAX.  
0.20 (0.008)  
0.33 (0.013)  
0.51 (0.020)  
MIN.  
5° MAX.  
1.40 (0.055)  
1.65 (0.065)  
9.65 (0.380)  
9.91 (0.390)  
2.29 (0.090)  
2.79 (0.110)  
0.51 (0.020)  
MAX.  
NOTE: DIMENSIONS IN MILLIMETERS (INCHES).  
5
Absolute Maximum Ratings  
Storage Temperature Range, TS .................................. -65°C to +150°C  
Operating Temperature, TA ......................................... -55°C to +125°C  
Case Temperature, TC ................................................................+170°C  
Junction Temperature, TJ ..........................................................+175°C  
Lead Solder Temperature .............................................. 260°C for 10 s  
Average Forward Curre, IF AVG (each channel) ............................. 8 mA  
Peak Input Current, IF PK (each channel) ............................... 20 mA[1]  
Reverse Input Voltage, VR (each channel) ....................................... 3 V  
Supply Voltage ,VCC .............................................. 0.0 V min., 20 V max.  
Average Output Current, IO (each channel) ................................. 15 mA  
Output Voltage, VO (each channel) .................... –0.3 V min., 20 V max.  
Package Power Dissipation, Pd (each channel) ......................... 200 mW  
Single Channel Product Only  
Tri-State Enable Voltage, VE ............................... –0.3 V min., 20 V max.  
8 Pin Ceramic DIP Single Channel Schematic  
ANODE  
CATHODE  
Note enable pin 6. An external 0.01 µF to 0.1 µF bypass capacitor is recommended  
between VCC and ground for each package type.  
ESD Classification  
(MIL-STD-883, Method 3015)  
HCPL-5200/01/0K, HCPL-6230/31/3K ................................(), Class 1  
HCPL-5230/31/3K, HCPL-6250/51/5K ............................ (Dot), Class 3  
Recommended Operating Conditions  
Parameter  
Symbol Min.  
Max.  
20  
8
Units  
V
mA  
Power Supply Voltage  
Input Current, High Level,  
Each Channel  
VCC  
IFH  
4.5  
2
Input Voltage, Low Level,  
Each Channel  
Fan Out (TTL Load)  
Each Channel  
VFL  
N
0
0.8  
4
V
Single Channel Product Only  
High Level Enable Voltage  
Low Level Enable Voltage  
VEH  
VEL  
2.0  
0
20  
0.8  
V
V
6
Electrical Characteristics  
T = -55°C to +125°C, 4.5 V VCC 20 V, 2 mA IF(ON) 8 mA, 0 V VF(OFF) 0.8 V, unless otherwise  
A
specified.  
Group A[11]  
Subgroups Min. Typ.* Max. Units Fig. Notes  
Limit  
Parameter  
Sym.  
Test Conditions  
Logic Low Output Voltage  
V
IOL = 6.4 mA (4 TTL Loads)  
1, 2, 3  
1, 2, 3  
0.5  
V
V
1,3  
2
OL  
IOH = -2.6 mA  
2.4  
**  
Logic High Output Voltage  
V
(**VOH =VCC - 2.1 V)  
2,3  
2
OH  
IOH = -0.32 mA  
NA  
3.1  
Output Leakage Current  
(VOUT > VCC)  
IOHH VO = 5.5 V IF = 8 mA  
VO = 20 V VCC = 4.5 V  
VCC = 5.5 V VF = 0 V  
VE = Don't Care  
1, 2, 3  
100  
500  
6
µA  
2
Single  
4.5  
5.3  
Channel  
Logic Low  
VCC = 20 V  
1, 2, 3  
7.5  
Supply  
ICCL  
Current  
Dual  
VCC = 5.5 V  
9.0  
12  
mA  
Channel  
VF1 = VF2 = 0 V  
V
CC = 20 V  
VCC = 5.5 V VF1 = VF2  
F3 = VF4 = 0 V  
10.6  
14  
15  
24  
Quad  
Channel  
=
V
V
CC = 20 V  
VCC = 5.5 V IF = 8 mA  
VE = Don't Care  
17  
30  
Single  
Channel  
2.9  
4.5  
1, 2, 3  
Logic High  
Supply  
Current  
VCC = 20 V  
3.3  
5.8  
6
9
ICCH  
Dual  
VCC = 5.5 V  
mA  
Channel  
IF1  
IF2 = 8 mA  
VCC = 5.5 V IF1 = IF2  
=
V
CC = 20 V  
6.6  
9
12  
18  
24  
Quad  
Channel  
=
F3  
V
CC = 20 V I=
11  
IF4 = 8 mA  
Logic Low Short Circuit  
Output Current  
VO = VCC = 5.5 V  
20  
35  
mA  
mA  
IOSL  
VF = 0 V  
1, 2, 3  
1, 2, 3  
2, 3  
2, 3  
VO = VCC = 20 V  
VCC = 5.5 V  
Logic High Short Circuit  
Output Current  
IF = 8 mA  
VO = GND  
-10  
-25  
1.8  
IOSH  
VCC = 20 V  
Input Forward Voltage  
VF IF = 8 mA  
1, 2, 3  
1, 2, 3  
1.0  
3
1.3  
V
V
4
2
2
Input Reverse  
BVR IR = 10 µA  
Breakdown Voltage  
Input-Output Insulation  
Leakage Current  
II-O VI-O = 1500 Vdc, t = 5s  
1
1.0  
µA  
V/µs  
V/µs  
ns  
4, 5  
RH = 45%, TA = 25°C  
Logic High Common Mode |CMH| IF = 2 mA, VCM = 50 VP-P  
Transient Immunity  
9, 10, 11  
9, 10, 11  
9, 10, 11  
9, 10, 11  
1000 10,000  
1000 10,000  
9
9
2, 6,  
12  
Logic Low Common Mode |CML| IF = 0 mA, VCM = 50 VP-P  
Transient Immunity  
2, 6,  
12  
Propagation Delay Time  
to Logic Low  
tPHL  
173 350  
118 350  
5,  
6
2, 7  
Propagation Delay Time  
to Logic High  
tPLH  
ns  
5,  
6
2, 7  
7
Electrical Characteristics Single Channel Product Only  
TA = -55°C to +125°C, 4.5 V VCC 20 V, 2 mA IF (ON) 8 mA, 0 V VF(OFF) 0.8 V, 2.0 V  
VEH 20 V, 0 V VEL 0.8 V, unless otherwise specified.  
Group A[11]  
Subgroups Min. Typ.* Max. Units Fig. Notes  
Limits  
Parameter  
Sym.  
Test Conditions  
High Impedance State IOZL VO = 0.4 V VEN = 2 V,  
1, 2, 3  
-20  
µA  
Output Current  
VF = 0 V  
VEN = 2 V,  
IF = 8 mA  
VO = 2.4 V  
IOZH VO = 5.5 V  
VO = 20 V  
20  
µA  
1, 2, 3  
100  
500  
Logic High Enable  
Voltage  
VEH  
1, 2, 3  
1, 2, 3  
2.0  
V
V
Logic Low Enable  
Voltage  
VEL  
0.8  
Logic High Enable  
Current  
VEN = 2.7 V  
20  
µA  
IEH  
VEN = 5.5 V  
1, 2, 3  
1, 2, 3  
100  
VEN = 20 V  
0.004  
250  
Logic Low Enable  
Current  
IEL  
VEN = 0.4 V  
-0.32 mA  
*All typical values are at VCC = 5 V, TA = 25°C, IF(ON) = 5 mA unless otherwise specified.  
Typical Characteristics  
All typical values are at TA = 25°C, VCC = 5 V, IF(ON) = 5 mA unless otherwise specified.  
Parameter  
Symbol Typ.  
Units  
Test Conditions  
Fig. Notes  
Input Current Hysteresis  
IHYS  
0.07  
mA  
VCC = 5 V  
3
2
VF  
Input Diode Temperature Coefficient  
––––  
-1.25 mV/°C IF = 8 mA  
2
TA  
RI-O  
CI-O  
CIN  
tr  
Resistance (Input-Output)  
Capacitance (Input-Output)  
Input Capacitance  
1013  
2.0  
20  
pF  
pF  
ns  
ns  
V
I-O = 500 Vdc  
2, 8  
2, 8  
2, 10  
2
f = 1 MHz  
VF = 0 V, f = 1 MHz  
Output Rise Time (10-90%)  
Output Fall Time (90-10%)  
45  
5, 7  
5, 7  
tf  
10  
2
8
Typical Characteristics (cont’d.)  
All typical values are at T = 25°C, VCC = 5 V, IF(ON) = 5 mA, unless otherwise specified.  
A
Single Channel Product Only  
Parameter  
Symbol Typ.  
Units  
Test Conditions  
Fig. Notes  
Output Enable Time to Logic High  
tPZH  
tPZL  
tPHZ  
tPLZ  
30  
30  
45  
55  
ns  
8
Output Enable Time to Logic Low  
Output Disable Time from Logic High  
Output Disable Time from Logic Low  
ns  
ns  
ns  
8
8
8
Dual and Quad Channel Products Only  
RH = 45%, TA = 25°C,  
Input-Input Insulation Leakage Current  
II-I  
0.5  
nA  
V
I-I = 500 V, t = 5 s  
9
9
9
Resistance (Input-Input)  
RI-I  
1013  
VI-I = 500 V  
f = 1 MH  
Capacitance (Input-Input)  
CI-I  
1.5  
pF  
Notes:  
1. Peak Forward Input Current pulse width < 50 µs at 1 KHz maximum repetition rate.  
2. Each channel of a multichannel device.  
3. Duration of output short circuit time not to exceed 10 ms.  
4. All devices are considered two-terminal devices: measured between all input leads or terminals shorted together and all output leads  
or terminals shorted together.  
5. This is a momentary withstand test, not an operating condition.  
6. CML is the maximum rate of rise of the common mode voltage that can be sustained with the output voltage in the logic low state (VO  
< 0.8 V). CM is the maximum rate of fall of the common mode voltage that can be sustained with the output voltage in the logic  
high state (V H> 2.0 V).  
7. tPHL propagatOion delay is measured from the 50% point on the leading edge of the input pulse to the 1.3 V point on the leading edge  
of the output pulse. The t propagation delay is measured from the 50% point on the trailing edge of the input pulse to the 1.3 V  
point on the trailing edgePoLHf the output pulse.  
8. Measured between each input pair shorted together and all output connections for that channel shorted together.  
9. Measured between adjacent input pairs shorted together for each multichannel device.  
10. Zero-bias capacitance measured between the LED anode and cathode.  
11. Standard parts receive 100% testing at 25°C (Subgroups 1 and 9). SMD, Class H and Class K parts receive 100% testing at 25, 125,  
and –55°C (Subgroups 1 and 9, 2 and 10, 3 and 11, respectively).  
12. Parameters are tested as part of device initial characterization and after design and process changes. Parameters guaranteed to limits  
specified for all lots not specifically tested.  
Figure 1. Typical Logic Low Output  
Voltage vs. Temperature.  
Figure 2. Typical Logic High Output  
Current vs. Temperature.  
9
Figure 3. Output Voltage vs. Forward  
Input Current.  
Figure 4. Typical Diode Input Forward  
Characteristic.  
V
CC  
PULSE GEN.  
= t 5 ns  
t = 100 kHz  
10 % DUTY  
CYCLE  
OUTPUT V  
MONITORING  
NODE  
O
t
=
r
f
5 V  
D.U.T.  
V
CC  
619  
D
1
I
F
V
O
INPUT  
MONITORING  
NODE  
D
D
D
2
3
4
C =  
L
15 pF  
V
E
GND  
5 K  
R
f
THE PROBE AND JIG CAPACITANCES  
ARE INCLUDED IN C  
.
L
Figure 5. Test Circuit for tPLH, tPHL, tr, and tf.  
Figure 6. Typical Propagation Delay  
vs. Temperature.  
Figure 7. Typical Rise, Fall Time vs.  
Temperature.  
10  
C
= 15 pF INCLUDING PROBE  
L
AND JIG CAPACITANCE.  
PULSE  
GENERATOR  
+5 V  
V
CC  
Z
= 50  
O
t
= t = 5 ns  
r
f
V
O
S1  
619 Ω  
D.U.T.  
D1-4 ARE 1N916 OR 1N3064  
V
CC  
D
1
V
O
I
F
D
D
D
2
3
4
C
L
V
E
GND  
5 KΩ  
INPUT V  
MONITORING  
NODE  
O
S2  
Figure 8. Test Circuit for tPHZ, tPZH, tPLZ, and tPZL  
.
A
V
CC  
D.U.T.  
B
OUTPUT V  
MONITORING  
NODE  
O
V
CC  
R
IN  
V
O
0.1 µF  
BYPASS  
V
E
V
FF  
GND  
*SEE NOTE 6.  
V
CM  
+
PULSE GEN.  
Figure 9. Test Circuit for Common Mode Transient Immunity and Typical Waveforms.  
V
CC1  
(+5 V)  
V
CC2  
(4.5 TO 20 V)  
665  
D.U.T.  
V
CC  
R
DATA  
OUTPUT  
V
L
CC1  
(+5 V)  
V
O
DATA  
INPUT  
CMOS  
750 Ω  
TTL OR  
LSTTL  
D.U.T.  
V
E
V
CC  
GND  
DATA  
INPUT  
TTL OR  
LSTTL  
TOTEM  
POLE  
V
R
L
CC2  
OUTPUT  
GATE  
5 V  
1.1 K  
1
2
TOTEM  
POLE  
OUTPUT  
GATE  
10 V  
15 V  
20 V  
2.37 K  
3.83 K  
5.11 K  
GND  
Figure 10. LSTTL to CMOS Interface Circuit.  
Figure 11. Recommended LED Drive Circuit.  
11  
V
CC1  
(+5 V)  
619 Ω  
D.U.T.  
V
CC  
4.02 KΩ  
DATA  
INPUT  
TTL OR  
LSTTL  
GND  
OPEN  
COLLECTOR  
GATE  
Figure 12. Series LED Drive with Open Collector Gate  
(4.02 kResistor Shunts IOH from the LED).  
V
CC2  
(+5 V)  
DATA  
OUTPUT  
V
CC1  
(+5 V)  
UP TO 16 LSTTL  
LOADS  
665  
665 Ω  
D.U.T.  
OR 4 TTL LOADS  
V
CC  
0.1  
µF  
DATA  
INPUT  
TTL OR  
LSTTL  
DATA  
OUTPUT  
DATA  
INPUT  
TTL OR  
LSTTL  
TOTEM  
POLE  
GND  
OUTPUT  
GATE  
1
TOTEM  
POLE  
OUTPUT  
GATE  
UP TO 16 LSTTL  
LOADS  
OR 4 TTL LOADS  
1
2
Figure 13. Recommended LSTTL to LSTTL Circuit.  
V
+ 20 V  
CC  
D.U.T.*  
V
CC  
I
F
I
O
0.01 µF  
+
1200  
V
E
V
IN  
1.90 V  
100 Ω  
GND  
CONDITIONS: I = 8 mA  
F
I
= -14 mA  
O
T
= +125 °C  
A
*ALL CHANNELS TESTED SIMULTANEOUSLY.  
Figure 14. Single Channel Operating Circuit for Burn-in and Steady State Life Tests.  
MIL-PRF-38534 Class H,  
Class K, and DSCC SMD  
Test Program  
Agilent’s Hi-Rel Optocouplers are  
in compliance with MIL-PRF-  
38534 Classes H and K. Class H  
and Class K devices are also in  
compliance with DSCC drawings  
5962-88768 and  
5962-88769.  
Testing consists of 100% screen-  
ing and quality conformance  
inspection to MIL-PRF-38534.  
www.semiconductor.agilent.com  
Data subject to change.  
Copyright © 1999 Agilent Technologies, Inc.  
Obsoletes 5967-6330E  
5980-0280E (10/00)  

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