SSF3N80D_15 [GOOD-ARK]

800V N-Channel MOSFET;
SSF3N80D_15
型号: SSF3N80D_15
厂家: GOOD-ARK ELECTRONICS    GOOD-ARK ELECTRONICS
描述:

800V N-Channel MOSFET

文件: 总7页 (文件大小:995K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
SSF3N80D  
800V N-Channel MOSFET  
Main Product Characteristics  
VDSS  
RDS(on)  
ID  
800V  
3.8Ω (typ.)  
3A  
MarkingandPin  
Assignment  
TO-252  
SchematicDiagram  
Features and Benefits  
AdvancedMOSFETprocesstechnology  
Special designed for PWM, load switching and  
generalpurposeapplications  
Ultralowon-resistancewithlowgatecharge  
Fastswitching andreversebodyrecovery  
150operating temperature  
Leadfreeproduct  
Description  
It utilizes the latest processing techniques to achieve the high cell density and reduces the on-resistance with  
high repetitive avalanche rating. These features combine to make this design an extremely efficient and reliable  
devicefor useinpower switching applicationandawidevarietyof other applications.  
Absolute Max Rating  
Symbol  
Parameter  
Max.  
Units  
ID @ TC = 25°C  
ID @ TC = 100°C  
IDM  
3
1.9  
Continuous Drain Current, VGS @ 10V①  
Continuous Drain Current, VGS @ 10V①  
Pulsed Drain Current②  
A
12  
80  
W
W/°C  
V
Power Dissipation③  
PD @TC = 25°C  
Linear Derating Factor  
0.64  
800  
VDS  
Drain-Source Voltage  
VGS  
Gate-to-Source Voltage  
± 30  
216  
V
EAS  
Single Pulse Avalanche Energy @ L=30mH  
Avalanche Current @ L=30mH  
Operating Junction and Storage Temperature Range  
mJ  
A
IAS  
3.8  
TJ TSTG  
-55 to + 150  
°C  
www.goodark.com  
Page 1 of 7  
Rev.1.0  
SSF3N80D  
800V N-Channel MOSFET  
Thermal Resistance  
Symbol  
Characteristics  
Typ.  
Max.  
1.56  
110  
40  
Units  
/W  
/W  
/W  
RθJC  
Junction-to-case③  
Junction-to-ambient (t ≤ 10s) ④  
Junction-to-Ambient (PCB mounted, steady-state) ④  
RθJA  
Electrical Characteristics@TA=25unless otherwise specified  
Symbol Parameter  
Min.  
800  
2
Typ.  
Max.  
Units  
Conditions  
V(BR)DSS Drain-to-Source breakdown voltage  
V
VGS = 0V, ID = 250μA  
VGS=10V,ID = 1.5A  
TJ = 125℃  
3.8  
8.9  
4.8  
RDS(on)  
VGS(th)  
IDSS  
Static Drain-to-Source on-resistance  
Gate threshold voltage  
Ω
V
4
VDS = VGS, ID = 250μA  
TJ = 125℃  
2.0  
1
VDS = 800V,VGS = 0V  
TJ = 125℃  
Drain-to-Source leakage current  
Gate-to-Source forward leakage  
μA  
nA  
50  
100  
-100  
VGS =30V  
IGSS  
VGS = -30V  
Qg  
Total gate charge  
Gate-to-Source charge  
Gate-to-Drain("Miller") charge  
Turn-on delay time  
Rise time  
11.2  
3.3  
5.1  
11.3  
14.2  
24.3  
15.3  
386  
50.4  
3.73  
ID = 3A,  
nC  
ns  
VDS=400V,  
Qgs  
Qgd  
td(on)  
tr  
VGS = 10V  
VGS=10V, VDS=400V,  
RL=133Ω,  
RGEN=25Ω  
ID=3A  
td(off)  
tf  
Turn-Off delay time  
Fall time  
Ciss  
Coss  
Crss  
Input capacitance  
Output capacitance  
Reverse transfer capacitance  
VGS = 0V  
VDS = 25V  
ƒ = 1MHz  
pF  
Source-Drain Ratings and Characteristics  
Symbol  
Parameter  
Continuous Source Current  
(Body Diode)  
Min.  
Typ.  
Max.  
Units  
Conditions  
MOSFET symbol  
showing the  
IS  
3
A
integral reverse  
p-n junction diode.  
IS=3A, VGS=0V  
TJ = 25°C, IF =3A,  
di/dt = 100A/μs  
Pulsed Source Current  
(Body Diode)  
ISM  
12  
A
VSD  
trr  
Diode Forward Voltage  
Reverse Recovery Time  
Reverse Recovery Charge  
0.88  
989  
1.4  
V
ns  
nC  
Qrr  
2405  
www.goodark.com  
Page 2 of 7  
Rev.1.0  
SSF3N80D  
800V N-Channel MOSFET  
Test Circuits and Waveforms  
Waveforms:  
Notes:  
The maximum current rating is limited by bond-wires.  
Repetitive rating; pulse width limited by max. junction temperature.  
The power dissipation PD is based on max. junction temperature, using junction-to-case thermal  
resistance.  
The value of RθJA is measured with the device mounted on 1in 2 FR-4 board with 2oz. Copper, in a  
still air environment with TA =25°C  
www.goodark.com  
Page 3 of 7  
Rev.1.0  
SSF3N80D  
800V N-Channel MOSFET  
Typical Electrical and Thermal Characteristics  
Figure 2. Gate to source cut-off voltage  
Figure 1: Typical Output Characteristics  
Figure 3. Drain-to-Source Breakdown Voltage Vs.  
Case Temperature  
Figure 4: Normalized On-Resistance Vs. Case  
Temperature  
www.goodark.com  
Page 4 of 7  
Rev.1.0  
SSF3N80D  
800V N-Channel MOSFET  
Typical Electrical and Thermal Characteristics  
Figure 5. Maximum Drain Current Vs. Case  
Temperature  
Figure 6.Typical Capacitance Vs. Drain-to-Source  
Voltage  
www.goodark.com  
Page 5 of 7  
Rev.1.0  
SSF3N80D  
800V N-Channel MOSFET  
Mechanical Data  
TO-252 PACKAGE OUTLINE DIMENSION  
Dimension In Millimeters  
Dimension In Inches  
Min Nom Max  
Symbol  
Min  
2.200  
0.950  
0.500  
0.450  
0.450  
6.450  
5.200  
5.950  
2.240  
4.430  
9.450  
1.250  
0.600  
0.000  
Nom  
Max  
2.400  
1.250  
0.700  
0.550  
0.550  
6.750  
5.400  
6.250  
2.340  
4.730  
9.950  
1.750  
0.900  
0.100  
A
B
b
b1  
C
D
-
-
-
-
-
-
-
-
-
-
-
-
-
-
0.087  
0.037  
0.020  
0.018  
0.018  
0.254  
0.205  
0.234  
0.088  
0.174  
0.372  
0.049  
0.024  
0.000  
-
-
-
-
-
-
-
-
-
-
-
-
-
-
0.094  
0.049  
0.028  
0.022  
0.022  
0.266  
0.213  
0.246  
0.092  
0.186  
0.392  
0.069  
0.035  
0.004  
D1  
E
e1  
e2  
L1  
L2  
L3  
K
www.goodark.com  
Page 6 of 7  
Rev.1.0  
SSF3N80D  
800V N-Channel MOSFET  
Ordering and Marking Information  
Device Marking: SSF3N80D  
Package (Available)  
TO-252DPAK)  
Operating Temperature Range  
C : -55 to 150 ºC  
Devices per Unitoptions)  
Package  
Type  
Units/Tape Tapes/Inner  
Box  
Units/Inner  
Box  
Inner  
Boxes/Carton  
Units/Carton  
Box  
Box  
TO-252  
TO-252  
TO-252  
2500  
2500  
800  
2
1
5
5000  
2500  
4000  
7
10  
8
35000  
25000  
32000  
Reliability Test Program  
Test Item  
High  
Conditions  
Tj=125to 150@  
Duration Sample Size  
168 hours  
500 hours  
1000 hours  
3 lots x 77 devices  
Temperature  
Reverse  
80% of Max  
VDSS/VCES/VR  
Bias(HTRB)  
High  
Tj=150@ 100% of  
168 hours  
500 hours  
1000 hours  
3 lots x 77 devices  
Temperature  
Gate  
Max VGSS  
Bias(HTGB)  
www.goodark.com  
Page 7 of 7  
Rev.1.0  

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