SS7505 [GOOD-ARK]

75V N-Channel MOSFET;
SS7505
型号: SS7505
厂家: GOOD-ARK ELECTRONICS    GOOD-ARK ELECTRONICS
描述:

75V N-Channel MOSFET

文件: 总7页 (文件大小:1126K)
中文:  中文翻译
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SSF7505  
75V N-Channel MOSFET  
Main Product Characteristics  
VDSS 75V  
RDS(on) 3.3mohm(typ.)  
ID 170A  
MarkingandPin  
Assignment  
SchematicDiagram  
TO-220  
Features and Benefits  
AdvancedtrenchMOSFETprocess technology  
Special designed for PWM, load switching and  
generalpurposeapplications  
Ultralowon-resistancewithlowgatecharge  
Fastswitching andreversebodyrecovery  
175operating temperature  
Leadfreeproduct  
Description  
It utilizes the latest trench processing techniques to achieve the high cell density and reduces the  
on-resistance with high repetitive avalanche rating. These features combine to make this design an extremely  
efficient andreliable devicefor useinpower switching application and awidevarietyof other applications.  
Absolute Max Rating  
Symbol  
Parameter  
Max.  
170  
Units  
ID @ TC = 25°C  
ID @ TC = 100°C  
IDM  
Continuous Drain Current, VGS @ 10V①  
Continuous Drain Current, VGS @ 10V①  
Pulsed Drain Current②  
A
110  
670  
272  
W
W/°C  
V
Power Dissipation③  
PD @TC = 25°C  
Linear Derating Factor  
2.0  
VDS  
Drain-Source Voltage  
75  
VGS  
Gate-to-Source Voltage  
± 20  
960  
V
EAS  
mJ  
A
Single Pulse Avalanche Energy @ L=0.3mH②  
Avalanche Current @ L=0.3mH②  
Operating Junction and Storage Temperature Range  
IAR  
80  
TJ TSTG  
-55 to + 175  
°C  
www.goodark.com  
Page 1 of 7  
Rev.1.0  
SSF7505  
75V N-Channel MOSFET  
Thermal Resistance  
Symbol  
Characteristics  
Typ.  
Max.  
0.55  
62  
Units  
/W  
/W  
/W  
RθJC  
Junction-to-case③  
Junction-to-ambient (t ≤ 10s) ④  
Junction-to-Ambient (PCB mounted, steady-state) ④  
RθJA  
40  
Electrical Characteristics @TA=25unless otherwise specified  
Symbol Parameter  
Min.  
75  
2
Typ.  
Max.  
5
Units  
Conditions  
V(BR)DSS Drain-to-Source breakdown voltage  
V
VGS = 0V, ID = 250μA  
VGS=10V,ID = 30A  
TJ = 125℃  
3.3  
6.25  
RDS(on)  
VGS(th)  
IDSS  
Static Drain-to-Source on-resistance  
Gate threshold voltage  
mΩ  
V
4
VDS = VGS, ID = 250μA  
TJ = 125℃  
-100  
2.0  
1
VDS = 75V,VGS = 0V  
TJ = 125°C  
Drain-to-Source leakage current  
Gate-to-Source forward leakage  
μA  
nA  
50  
100  
VGS =20V  
IGSS  
VGS = -20V  
Qg  
Total gate charge  
Gate-to-Source charge  
Gate-to-Drain("Miller") charge  
Turn-on delay time  
Rise time  
221  
42  
ID = 30A,  
nC  
ns  
VDS=30V,  
Qgs  
Qgd  
td(on)  
tr  
VGS = 10V  
70  
25  
VGS=10V, VDS=30V,  
24  
RL=15Ω,  
GEN=2.55Ω  
td(off)  
tf  
Turn-Off delay time  
Fall time  
125  
53  
R
Ciss  
Coss  
Crss  
Input capacitance  
Output capacitance  
Reverse transfer capacitance  
9139  
757  
669  
VGS = 0V  
pF  
VDS = 25V  
ƒ = 600KHz  
Source-Drain Ratings and Characteristics  
Symbol  
Parameter  
Continuous Source Current  
(Body Diode)  
Min.  
Typ.  
Max.  
Units  
Conditions  
MOSFET symb
showing the  
IS  
170  
A
integral reverse  
p-n junction diode.  
IS=30A, VGS=0V  
TJ = 25°C, IF =75A, di/dt =  
100A/μs  
Pulsed Source Current  
(Body Diode)  
ISM  
670  
A
VSD  
trr  
Diode Forward Voltage  
Reverse Recovery Time  
Reverse Recovery Charge  
0.84  
47  
1.3  
V
ns  
nC  
Qrr  
97  
www.goodark.com  
Page 2 of 7  
Rev.1.0  
SSF7505  
75V N-Channel MOSFET  
Test Circuits and Waveforms  
aveforms:  
Notes:  
The maximum current rating is limited by bond-wires.  
Repetitive rating; pulse width limited by max. junction temperature.  
The power dissipation PD is based on max. junction temperature, using junction-to-case thermal  
resistance.  
The value of RθJA is measured with the device mounted on 1in 2 FR-4 board with 2oz. Copper, in a  
still air environment with TA =25°C  
These curves are based on the junction-to-case thermal impedence which is measured with the  
device mounted to a large heatsink, assuming a maximum junction temperature of TJ(MAX)=175°C.  
The maximum current rating is limited by bond-wires.  
www.goodark.com  
Page 3 of 7  
Rev.1.0  
SSF7505  
75V N-Channel MOSFET  
Typical Electrical and Thermal Characteristics  
Figure 2. Gate to source cut-off voltage  
Figure 1: Typical Output Characteristics  
Figure 3. Drain-to-Source Breakdown Voltage vs.  
Temperature  
Figure 4: Normalized On-Resistance Vs. Case  
Temperature  
www.goodark.com  
Page 4 of 7  
Rev.1.0  
SSF7505  
75V N-Channel MOSFET  
Typical Electrical and Thermal Characteristics  
Figure 5. Maximum Drain Current Vs. Case  
Temperature  
Figure 6.Typical Capacitance Vs. Drain-to-Source  
Voltage  
Figure7. Maximum Effective Transient Thermal Impedance, Junction-to-Case  
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Page 5 of 7  
Rev.1.0  
SSF7505  
75V N-Channel MOSFET  
Mechanical Data  
TO220 PACKAGE OUTLINE DIMENSION  
Dimension In Millimeters  
Nom  
Dimension In Inches  
Symbol  
Min  
4.400  
1.270  
2.590  
0.770  
1.230  
0.480  
15.100  
9.000  
0.050  
10.060  
-
Max  
Min  
0.173  
0.050  
0.102  
0.030  
0.048  
0.019  
-
0.354  
0.002  
0.396  
-
Nom  
0.179  
0.051  
0.106  
-
Max  
0.185  
0.052  
0.110  
0.035  
0.054  
0.020  
-
0.362  
0.020  
0.404  
-
A
A1  
A2  
b
b2  
c
4.550  
1.300  
2.690  
-
4.700  
1.330  
2.790  
0.900  
1.360  
0.520  
15.700  
9.200  
0.520  
10.260  
-
-
-
0.500  
15.400  
9.100  
0.285  
10.160  
8.700  
1.500  
2.54BSC  
5.08BSC  
0.020  
0.606  
0.358  
0.011  
0.400  
0.343  
0.059  
0.1BSC  
0.2BSC  
D
D1  
DEP  
E
E1  
ФP1  
1.400  
1.600  
0.055  
0.063  
e
e1  
H 1  
6.100  
12.750  
-
6.300  
12.960  
-
6.500  
13.170  
3.950  
0.240  
0.502  
-
0.248  
0.510  
-
0.256  
0.519  
0.156  
L
L1  
L2  
ФP  
Q
1.85REF  
3.600  
2.800  
0.200  
0.073REF  
0.142  
0.110  
0.008  
3.570  
2.730  
-
3.630  
2.870  
-
0.141  
0.107  
-
50  
10  
0.143  
0.113  
-
90  
50  
Q 1  
ϴ1  
ϴ2  
50  
10  
70  
30  
90  
50  
70  
30  
www.goodark.com  
Page 6 of 7  
Rev.1.0  
SSF7505  
75V N-Channel MOSFET  
Ordering and Marking Information  
Device Marking: SSF7505  
Package (Available)  
TO-220  
Operating Temperature Range  
C : -55 to 175 ºC  
Devices per Unit  
Packag Units/Tu Tubes/Inner  
Units/Inner Inner  
Box  
Units/Carton  
Boxes/Carton Box  
Box  
e Type be  
Box  
TO-220  
50  
20  
1000  
6
6000  
Reliability Test Program  
Test Item  
High  
Conditions  
Tj=125to 175@  
Duration Sample Size  
168 hours  
500 hours  
1000 hours  
3 lots x 77 devices  
Temperature  
Reverse  
80% of Max  
VDSS/VCES/VR  
Bias(HTRB)  
High  
Tj=150or 175@  
168 hours  
500 hours  
1000 hours  
3 lots x 77 devices  
Temperature  
Gate  
100% of Max VGSS  
Bias(HTGB)  
www.goodark.com  
Page 7 of 7  
Rev.1.0  

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