MK51DX128CMB7 [FREESCALE]
K51 Sub-Family; K51次家庭
| 型号： | MK51DX128CMB7 |
| 厂家： | 
Freescale |
| 描述： | K51 Sub-Family |
| 文件： | 总77页 (文件大小：1911K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
Document Number: K51P81M72SF1
Rev. 2, 4/2012
Freescale Semiconductor
Data Sheet: Technical Data
K51P81M72SF1
K51 Sub-Family
Supports: MK51DX128CLK7,
MK51DX256CLK7, MK51DX128CMB7,
MK51DX256CMB7
Features
Analog modules
– Two 16-bit SAR ADCs
– Programmable gain amplifier (PGA) (up to x64)
integrated into each ADC
– 12-bit DAC
– Two operational amplifiers
– One transimpedance amplifier
– Three analog comparators (CMP) containing a 6-bit
DAC and programmable reference input
– Voltage reference
•
•
•
Operating Characteristics
– Voltage range: 1.71 to 3.6 V
– Flash write voltage range: 1.71 to 3.6 V
– Temperature range (ambient): -40 to 85°C
•
•
•
Clocks
– 3 to 32 MHz crystal oscillator
– 32 kHz crystal oscillator
– Multi-purpose clock generator
System peripherals
Timers
– 10 low-power modes to provide power optimization
based on application requirements
– 16-channel DMA controller, supporting up to 63
request sources
– External watchdog monitor
– Software watchdog
– Programmable delay block
– Eight-channel motor control/general purpose/PWM
timer
– Two 2-channel quadrature decoder/general purpose
timers
– Periodic interrupt timers
– 16-bit low-power timer
– Carrier modulator transmitter
– Real-time clock
– Low-leakage wakeup unit
Security and integrity modules
– Hardware CRC module to support fast cyclic
redundancy checks
•
•
Communication interfaces
– USB full-/low-speed On-the-Go controller with on-
chip transceiver
– Two SPI modules
– Two I2C modules
– 128-bit unique identification (ID) number per chip
Human-machine interface
– Segment LCD controller supporting up to 36
frontplanes and 8 backplanes, or 40 frontplanes and
4 backplanes, depending on the package size
– Low-power hardware touch sensor interface (TSI)
– General-purpose input/output
– Four UART modules
– I2S module
Freescale reserves the right to change the detail specifications as may be
required to permit improvements in the design of its products.
© 2012 Freescale Semiconductor, Inc.
Table of Contents
1 Ordering parts...........................................................................4
6.1 Core modules....................................................................23
6.1.1 Debug trace timing specifications.........................23
6.1.2 JTAG electricals....................................................24
6.2 System modules................................................................26
6.3 Clock modules...................................................................26
6.3.1 MCG specifications...............................................26
6.3.2 Oscillator electrical specifications.........................29
6.3.3 32kHz Oscillator Electrical Characteristics............31
6.4 Memories and memory interfaces.....................................32
6.4.1 Flash electrical specifications................................32
6.4.2 EzPort Switching Specifications............................36
6.5 Security and integrity modules..........................................37
6.6 Analog...............................................................................37
6.6.1 ADC electrical specifications.................................38
6.6.2 CMP and 6-bit DAC electrical specifications.........46
6.6.3 12-bit DAC electrical characteristics.....................48
6.6.4 Op-amp electrical specifications...........................51
6.6.5 Transimpedance amplifier electrical
1.1 Determining valid orderable parts......................................4
2 Part identification......................................................................4
2.1 Description.........................................................................4
2.2 Format...............................................................................4
2.3 Fields.................................................................................4
2.4 Example............................................................................5
3 Terminology and guidelines......................................................5
3.1 Definition: Operating requirement......................................5
3.2 Definition: Operating behavior...........................................6
3.3 Definition: Attribute............................................................6
3.4 Definition: Rating...............................................................7
3.5 Result of exceeding a rating..............................................7
3.6 Relationship between ratings and operating
requirements......................................................................7
3.7 Guidelines for ratings and operating requirements............8
3.8 Definition: Typical value.....................................................8
3.9 Typical value conditions....................................................9
4 Ratings......................................................................................10
4.1 Thermal handling ratings...................................................10
4.2 Moisture handling ratings..................................................10
4.3 ESD handling ratings.........................................................10
4.4 Voltage and current operating ratings...............................10
5 General.....................................................................................11
5.1 AC electrical characteristics..............................................11
5.2 Nonswitching electrical specifications...............................12
5.2.1 Voltage and current operating requirements.........12
5.2.2 LVD and POR operating requirements.................13
5.2.3 Voltage and current operating behaviors..............13
5.2.4 Power mode transition operating behaviors..........14
5.2.5 Power consumption operating behaviors..............15
5.2.6 Designing with radiated emissions in mind...........19
5.2.7 Capacitance attributes..........................................19
5.3 Switching specifications.....................................................20
5.3.1 Device clock specifications...................................20
5.3.2 General switching specifications...........................20
5.4 Thermal specifications.......................................................21
5.4.1 Thermal operating requirements...........................21
5.4.2 Thermal attributes.................................................22
6 Peripheral operating requirements and behaviors....................23
specifications — full range....................................52
6.6.6 Transimpedance amplifier electrical
specifications — limited range..............................54
6.6.7 Voltage reference electrical specifications............54
6.7 Timers................................................................................56
6.8 Communication interfaces.................................................56
6.8.1 USB electrical specifications.................................56
6.8.2 USB DCD electrical specifications........................56
6.8.3 USB VREG electrical specifications......................56
6.8.4 DSPI switching specifications (limited voltage
range)....................................................................57
6.8.5 DSPI switching specifications (full voltage range).59
6.8.6 I2C switching specifications..................................60
6.8.7 UART switching specifications..............................61
6.8.8 I2S/SAI Switching Specifications..........................61
6.9 Human-machine interfaces (HMI)......................................65
6.9.1 TSI electrical specifications...................................65
6.9.2 LCD electrical characteristics................................66
7 Dimensions...............................................................................67
7.1 Obtaining package dimensions.........................................67
8 Pinout........................................................................................68
8.1 K51 Signal Multiplexing and Pin Assignments..................68
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
2
Freescale Semiconductor, Inc.
8.2 K51 Pinouts.......................................................................73
9 Revision History........................................................................75
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
3
Ordering parts
1 Ordering parts
1.1 Determining valid orderable parts
Valid orderable part numbers are provided on the web. To determine the orderable part
numbers for this device, go to http://www.freescale.com and perform a part number
search for the following device numbers: PK51 and MK51.
2 Part identification
2.1 Description
Part numbers for the chip have fields that identify the specific part. You can use the
values of these fields to determine the specific part you have received.
2.2 Format
Part numbers for this device have the following format:
Q K## A M FFF R T PP CC N
2.3 Fields
This table lists the possible values for each field in the part number (not all combinations
are valid):
Field
Description
Values
Q
Qualification status
• M = Fully qualified, general market flow
• P = Prequalification
K##
A
Kinetis family
Key attribute
• K51
• D = Cortex-M4 w/ DSP
• F = Cortex-M4 w/ DSP and FPU
M
Flash memory type
• N = Program flash only
• X = Program flash and FlexMemory
Table continues on the next page...
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
4
Freescale Semiconductor, Inc.
Terminology and guidelines
Values
Field
Description
Program flash memory size
FFF
• 32 = 32 KB
• 64 = 64 KB
• 128 = 128 KB
• 256 = 256 KB
• 512 = 512 KB
• 1M0 = 1 MB
R
Silicon revision
• Z = Initial
• (Blank) = Main
• A = Revision after main
T
Temperature range (°C)
Package identifier
• V = –40 to 105
• C = –40 to 85
PP
• FM = 32 QFN (5 mm x 5 mm)
• FT = 48 QFN (7 mm x 7 mm)
• LF = 48 LQFP (7 mm x 7 mm)
• LH = 64 LQFP (10 mm x 10 mm)
• MP = 64 MAPBGA (5 mm x 5 mm)
• LK = 80 LQFP (12 mm x 12 mm)
• MB = 81 MAPBGA (8 mm x 8 mm)
• LL = 100 LQFP (14 mm x 14 mm)
• ML = 104 MAPBGA (8 mm x 8 mm)
• MC = 121 MAPBGA (8 mm x 8 mm)
• LQ = 144 LQFP (20 mm x 20 mm)
• MD = 144 MAPBGA (13 mm x 13 mm)
• MJ = 256 MAPBGA (17 mm x 17 mm)
CC
N
Maximum CPU frequency (MHz)
Packaging type
• 5 = 50 MHz
• 7 = 72 MHz
• 10 = 100 MHz
• 12 = 120 MHz
• 15 = 150 MHz
• R = Tape and reel
• (Blank) = Trays
2.4 Example
This is an example part number:
MK51DN512ZVMD10
3 Terminology and guidelines
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
5
Terminology and guidelines
3.1 Definition: Operating requirement
An operating requirement is a specified value or range of values for a technical
characteristic that you must guarantee during operation to avoid incorrect operation and
possibly decreasing the useful life of the chip.
3.1.1 Example
This is an example of an operating requirement, which you must meet for the
accompanying operating behaviors to be guaranteed:
Symbol
Description
Min.
Max.
Unit
VDD
1.0 V core supply
voltage
0.9
1.1
V
3.2 Definition: Operating behavior
An operating behavior is a specified value or range of values for a technical
characteristic that are guaranteed during operation if you meet the operating requirements
and any other specified conditions.
3.2.1 Example
This is an example of an operating behavior, which is guaranteed if you meet the
accompanying operating requirements:
Symbol
Description
Min.
Max.
Unit
IWP
Digital I/O weak pullup/ 10
pulldown current
130
µA
3.3 Definition: Attribute
An attribute is a specified value or range of values for a technical characteristic that are
guaranteed, regardless of whether you meet the operating requirements.
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
6
Freescale Semiconductor, Inc.
Terminology and guidelines
3.3.1 Example
This is an example of an attribute:
Symbol
Description
Min.
Max.
Unit
CIN_D
Input capacitance:
digital pins
—
7
pF
3.4 Definition: Rating
A rating is a minimum or maximum value of a technical characteristic that, if exceeded,
may cause permanent chip failure:
• Operating ratings apply during operation of the chip.
• Handling ratings apply when the chip is not powered.
3.4.1 Example
This is an example of an operating rating:
Symbol
Description
Min.
Max.
Unit
VDD
1.0 V core supply
voltage
–0.3
1.2
V
3.5 Result of exceeding a rating
40
30
The likelihood of permanent chip failure increases rapidly as
soon as a characteristic begins to exceed one of its operating ratings.
20
10
0
Operating rating
Measured characteristic
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
7
Terminology and guidelines
3.6 Relationship between ratings and operating requirements
Fatal range
Degraded operating range
Normal operating range
Degraded operating range
Fatal range
Expected permanent failure
- No permanent failure
- Possible decreased life
- Possible incorrect operation
- No permanent failure
- Correct operation
- No permanent failure
- Possible decreased life
- Possible incorrect operation
Expected permanent failure
–∞
∞
Operating (power on)
Fatal range
Handling range
Fatal range
Expected permanent failure
No permanent failure
Expected permanent failure
–∞
∞
Handling (power off)
3.7 Guidelines for ratings and operating requirements
Follow these guidelines for ratings and operating requirements:
• Never exceed any of the chip’s ratings.
• During normal operation, don’t exceed any of the chip’s operating requirements.
• If you must exceed an operating requirement at times other than during normal
operation (for example, during power sequencing), limit the duration as much as
possible.
3.8 Definition: Typical value
A typical value is a specified value for a technical characteristic that:
• Lies within the range of values specified by the operating behavior
• Given the typical manufacturing process, is representative of that characteristic
during operation when you meet the typical-value conditions or other specified
conditions
Typical values are provided as design guidelines and are neither tested nor guaranteed.
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
8
Freescale Semiconductor, Inc.
Terminology and guidelines
3.8.1 Example 1
This is an example of an operating behavior that includes a typical value:
Symbol
Description
Min.
Typ.
Max.
Unit
IWP
Digital I/O weak
pullup/pulldown
current
10
70
130
µA
3.8.2 Example 2
This is an example of a chart that shows typical values for various voltage and
temperature conditions:
5000
4500
4000
TJ
3500
150 °C
3000
105 °C
2500
25 °C
2000
–40 °C
1500
1000
500
0
0.90
0.95
1.00
1.05
1.10
VDD (V)
3.9 Typical value conditions
Typical values assume you meet the following conditions (or other conditions as
specified):
Symbol
Description
Value
Unit
TA
Ambient temperature
25
°C
V
VDD
3.3 V supply voltage
3.3
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
9
Ratings
4 Ratings
4.1 Thermal handling ratings
Symbol
Description
Min.
Max.
Unit
Notes
TSTG
Storage temperature
–55
150
°C
1
TSDR
Solder temperature, lead-free
—
260
°C
2
1. Determined according to JEDEC Standard JESD22-A103, High Temperature Storage Life.
2. Determined according to IPC/JEDEC Standard J-STD-020, Moisture/Reflow Sensitivity Classification for Nonhermetic
Solid State Surface Mount Devices.
4.2 Moisture handling ratings
Symbol
Description
Min.
Max.
Unit
Notes
MSL
Moisture sensitivity level
—
3
—
1
1. Determined according to IPC/JEDEC Standard J-STD-020, Moisture/Reflow Sensitivity Classification for Nonhermetic
Solid State Surface Mount Devices.
4.3 ESD handling ratings
Symbol
Description
Min.
Max.
Unit
Notes
VHBM
Electrostatic discharge voltage, human body model
-2000
+2000
V
1
VCDM
ILAT
Electrostatic discharge voltage, charged-device model
Latch-up current at ambient temperature of 105°C
-500
-100
+500
+100
V
2
mA
1. Determined according to JEDEC Standard JESD22-A114, Electrostatic Discharge (ESD) Sensitivity Testing Human Body
Model (HBM).
2. Determined according to JEDEC Standard JESD22-C101, Field-Induced Charged-Device Model Test Method for
Electrostatic-Discharge-Withstand Thresholds of Microelectronic Components.
4.4 Voltage and current operating ratings
Symbol
Description
Min.
Max.
Unit
VDD
Digital supply voltage
–0.3
3.8
V
Table continues on the next page...
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
10
Freescale Semiconductor, Inc.
General
Unit
Symbol
Description
Min.
Max.
IDD
Digital supply current
—
185
mA
V
VDIO
VAIO
Digital input voltage (except RESET, EXTAL, and XTAL)
–0.3
–0.3
5.5
VDD + 0.3
25
Analog1, RESET, EXTAL, and XTAL input voltage
Maximum current single pin limit (applies to all port pins)
Analog supply voltage
V
ID
–25
mA
V
VDDA
VDD – 0.3
–0.3
VDD + 0.3
3.63
VUSB_DP
VUSB_DM
VREGIN
VBAT
USB_DP input voltage
V
USB_DM input voltage
–0.3
3.63
V
USB regulator input
–0.3
6.0
V
RTC battery supply voltage
–0.3
3.8
V
1. Analog pins are defined as pins that do not have an associated general purpose I/O port function.
5 General
5.1 AC electrical characteristics
Unless otherwise specified, propagation delays are measured from the 50% to the 50%
point, and rise and fall times are measured at the 20% and 80% points, as shown in the
following figure.
Figure 1. Input signal measurement reference
All digital I/O switching characteristics assume:
1. output pins
• have CL=30pF loads,
• are configured for fast slew rate (PORTx_PCRn[SRE]=0), and
• are configured for high drive strength (PORTx_PCRn[DSE]=1)
2. input pins
• have their passive filter disabled (PORTx_PCRn[PFE]=0)
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
11
General
5.2 Nonswitching electrical specifications
5.2.1 Voltage and current operating requirements
Table 1. Voltage and current operating requirements
Symbol
Description
Min.
Max.
Unit
Notes
VDD
Supply voltage
1.71
3.6
V
VDDA
Analog supply voltage
1.71
–0.1
–0.1
1.71
3.6
0.1
0.1
3.6
V
V
V
V
VDD – VDDA VDD-to-VDDA differential voltage
VSS – VSSA VSS-to-VSSA differential voltage
VBAT
VIH
RTC battery supply voltage
Input high voltage
• 2.7 V ≤ VDD ≤ 3.6 V
• 1.7 V ≤ VDD ≤ 2.7 V
0.7 × VDD
—
—
V
V
0.75 × VDD
VIL
Input low voltage
• 2.7 V ≤ VDD ≤ 3.6 V
• 1.7 V ≤ VDD ≤ 2.7 V
—
—
0.35 × VDD
0.3 × VDD
V
V
VHYS
IICDIO
Input hysteresis
0.06 × VDD
-5
—
—
V
Digital pin negative DC injection current — single pin
• VIN < VSS-0.3V
1
3
mA
Analog2, EXTAL, and XTAL pin DC injection current
— single pin
IICAIO
mA
-5
—
• VIN < VSS-0.3V (Negative current injection)
• VIN > VDD+0.3V (Positive current injection)
—
+5
IICcont
Contiguous pin DC injection current —regional limit,
includes sum of negative injection currents or sum of
positive injection currents of 16 contiguous pins
-25
—
—
mA
• Negative current injection
• Positive current injection
+25
VRAM
VDD voltage required to retain RAM
1.2
—
—
V
V
VRFVBAT
VBAT voltage required to retain the VBAT register file
VPOR_VBAT
1. All 5 V tolerant digital I/O pins are internally clamped to VSS through a ESD protection diode. There is no diode connection
to VDD. If VIN greater than VDIO_MIN (=VSS-0.3V) is observed, then there is no need to provide current limiting resistors at
the pads. If this limit cannot be observed then a current limiting resistor is required. The negative DC injection current
limiting resistor is calculated as R=(VDIO_MIN-VIN)/|IIC|.
2. Analog pins are defined as pins that do not have an associated general purpose I/O port function.
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
12
Freescale Semiconductor, Inc.
General
3. All analog pins are internally clamped to VSS and VDD through ESD protection diodes. If VIN is greater than VAIO_MIN
(=VSS-0.3V) and VIN is less than VAIO_MAX(=VDD+0.3V) is observed, then there is no need to provide current limiting
resistors at the pads. If these limits cannot be observed then a current limiting resistor is required. The negative DC
injection current limiting resistor is calculated as R=(VAIO_MIN-VIN)/|IIC|. The positive injection current limiting resistor is
calcualted as R=(VIN-VAIO_MAX)/|IIC|. Select the larger of these two calculated resistances.
5.2.2 LVD and POR operating requirements
Table 2. VDD supply LVD and POR operating requirements
Symbol Description
Min.
Typ.
Max.
Unit
Notes
VPOR
Falling VDD POR detect voltage
0.8
1.1
1.5
V
VLVDH
Falling low-voltage detect threshold — high
range (LVDV=01)
2.48
2.56
2.64
V
Low-voltage warning thresholds — high range
• Level 1 falling (LVWV=00)
1
VLVW1H
VLVW2H
VLVW3H
VLVW4H
2.62
2.72
2.82
2.92
2.70
2.80
2.90
3.00
2.78
2.88
2.98
3.08
V
V
V
V
• Level 2 falling (LVWV=01)
• Level 3 falling (LVWV=10)
• Level 4 falling (LVWV=11)
VHYSH
Low-voltage inhibit reset/recover hysteresis —
high range
—
80
—
mV
V
VLVDL
Falling low-voltage detect threshold — low range
(LVDV=00)
1.54
1.60
1.66
Low-voltage warning thresholds — low range
• Level 1 falling (LVWV=00)
1
VLVW1L
VLVW2L
VLVW3L
VLVW4L
1.74
1.84
1.94
2.04
1.80
1.90
2.00
2.10
1.86
1.96
2.06
2.16
V
V
V
V
• Level 2 falling (LVWV=01)
• Level 3 falling (LVWV=10)
• Level 4 falling (LVWV=11)
VHYSL
Low-voltage inhibit reset/recover hysteresis —
low range
—
60
—
mV
VBG
tLPO
Bandgap voltage reference
0.97
900
1.00
1.03
V
Internal low power oscillator period — factory
trimmed
1000
1100
μs
1. Rising thresholds are falling threshold + hysteresis voltage
Table 3. VBAT power operating requirements
Symbol Description
Min.
Typ.
Max.
Unit
Notes
VPOR_VBAT Falling VBAT supply POR detect voltage
0.8
1.1
1.5
V
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
13
General
5.2.3 Voltage and current operating behaviors
Table 4. Voltage and current operating behaviors
Symbol
Description
Min.
Max.
Unit
Notes
VOH
Output high voltage — high drive strength
• 2.7 V ≤ VDD ≤ 3.6 V, IOH = -9mA
• 1.71 V ≤ VDD ≤ 2.7 V, IOH = -3mA
VDD – 0.5
VDD – 0.5
—
—
V
V
Output high voltage — low drive strength
• 2.7 V ≤ VDD ≤ 3.6 V, IOH = -2mA
• 1.71 V ≤ VDD ≤ 2.7 V, IOH = -0.6mA
VDD – 0.5
VDD – 0.5
—
—
V
V
IOHT
VOL
Output high current total for all ports
—
100
mA
Output low voltage — high drive strength
• 2.7 V ≤ VDD ≤ 3.6 V, IOL = 9mA
• 1.71 V ≤ VDD ≤ 2.7 V, IOL = 3mA
—
—
0.5
0.5
V
V
Output low voltage — low drive strength
• 2.7 V ≤ VDD ≤ 3.6 V, IOL = 2mA
• 1.71 V ≤ VDD ≤ 2.7 V, IOL = 0.6mA
—
—
0.5
0.5
V
V
IOLT
IIN
Output low current total for all ports
—
—
100
1
mA
μA
Input leakage current (per pin) for full temperature
range except TRI0_DM, TRI0_DP, TRI1_DM,
TRI1_DP
1
IIN
Input leakage current (per pin) at 25°C except
TRI0_DM, TRI0_DP, TRI1_DM, TRI1_DP
—
—
0.025
5
μA
nA
1
1
IILKG_A
Input leakage current (per pin) for TRI0_DM,
TRI0_DP, TRI1_DM, TRI1_DP
IOZ
RPU
RPD
Hi-Z (off-state) leakage current (per pin)
Internal pullup resistors
—
20
20
1
μA
kΩ
kΩ
50
50
2
3
Internal pulldown resistors
1. Measured at VDD=3.6V
2. Measured at VDD supply voltage = VDD min and Vinput = VSS
3. Measured at VDD supply voltage = VDD min and Vinput = VDD
5.2.4 Power mode transition operating behaviors
All specifications except tPOR, and VLLSx→RUN recovery times in the following table
assume this clock configuration:
• CPU and system clocks = 72 MHz
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
14
Freescale Semiconductor, Inc.
General
• Bus clock = 36 MHz
• Flash clock = 24 MHz
Table 5. Power mode transition operating behaviors
Symbol
Description
Min.
Max.
Unit
Notes
tPOR
After a POR event, amount of time from the point VDD
reaches 1.71 V to execution of the first instruction
across the operating temperature range of the chip.
—
300
μs
1
—
—
—
—
—
—
112
74
μs
μs
μs
μs
μs
μs
• VLLS1 → RUN
• VLLS2 → RUN
• VLLS3 → RUN
• LLS → RUN
73
5.9
5.8
4.2
• VLPS → RUN
• STOP → RUN
1. Normal boot (FTFL_OPT[LPBOOT]=1)
5.2.5 Power consumption operating behaviors
Table 6. Power consumption operating behaviors
Symbol Description
Min.
Typ.
Max.
Unit
Notes
IDDA
Analog supply current
—
—
See note
mA
1
IDD_RUN Run mode current — all peripheral clocks
disabled, code executing from flash
2
• @ 1.8V
• @ 3.0V
—
—
21.5
21.5
25
30
mA
mA
IDD_RUN Run mode current — all peripheral clocks
enabled, code executing from flash
3, 4
• @ 1.8V
• @ 3.0V
• @ 25°C
• @ 125°C
—
31
34
mA
—
—
—
31
32
34
39
—
mA
mA
mA
IDD_WAIT Wait mode high frequency current at 3.0 V — all
peripheral clocks disabled
12.5
2
5
IDD_WAIT Wait mode reduced frequency current at 3.0 V
— all peripheral clocks disabled
—
7.2
—
mA
Table continues on the next page...
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
15
General
Table 6. Power consumption operating behaviors (continued)
Symbol Description
Min.
Typ.
Max.
Unit
Notes
IDD_VLPR Very-low-power run mode current at 3.0 V — all
peripheral clocks disabled
—
0.996
—
mA
6
IDD_VLPR Very-low-power run mode current at 3.0 V — all
peripheral clocks enabled
—
—
1.46
0.61
—
—
mA
mA
7
8
IDD_VLPW Very-low-power wait mode current at 3.0 V — all
peripheral clocks disabled
IDD_STOP Stop mode current at 3.0 V
• @ –40 to 25°C
—
—
—
0.35
0.384
0.628
0.567
0.793
1.2
mA
mA
mA
• @ 70°C
• @ 105°C
IDD_VLPS Very-low-power stop mode current at 3.0 V
• @ –40 to 25°C
• @ 70°C
—
—
—
5.9
32.7
59.8
188
μA
μA
μA
26.1
98.1
• @ 105°C
IDD_LLS
Low leakage stop mode current at 3.0 V
• @ –40 to 25°C
9
9
—
—
—
2.6
8.6
μA
μA
μA
• @ 70°C
10.3
42.5
29.1
92.5
• @ 105°C
IDD_VLLS3 Very low-leakage stop mode 3 current at 3.0 V
• @ –40 to 25°C
• @ 70°C
—
—
—
1.9
6.9
5.8
μA
μA
μA
12.1
41.9
• @ 105°C
28.1
IDD_VLLS2 Very low-leakage stop mode 2 current at 3.0 V
• @ –40 to 25°C
• @ 70°C
—
—
—
1.59
4.3
5.5
9.5
34
μA
μA
μA
• @ 105°C
17.5
IDD_VLLS1 Very low-leakage stop mode 1 current at 3.0 V
• @ –40 to 25°C
• @ 70°C
—
—
—
1.47
2.97
5.4
8.1
32
μA
μA
μA
• @ 105°C
12.41
IDD_VBAT Average current with RTC and 32kHz disabled at
3.0 V
• @ –40 to 25°C
• @ 70°C
—
—
—
0.19
0.49
2.2
0.22
0.64
3.2
μA
μA
μA
• @ 105°C
Table continues on the next page...
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
16
Freescale Semiconductor, Inc.
General
Table 6. Power consumption operating behaviors (continued)
Symbol Description
Min.
Typ.
Max.
Unit
Notes
IDD_VBAT Average current when CPU is not accessing
RTC registers
10
• @ 1.8V
• @ –40 to 25°C
• @ 70°C
—
—
—
0.57
0.90
2.4
0.67
1.2
μA
μA
μA
• @ 105°C
• @ 3.0V
3.5
• @ –40 to 25°C
• @ 70°C
—
—
—
0.67
1.0
0.94
1.4
μA
μA
μA
• @ 105°C
2.7
3.9
1. The analog supply current is the sum of the active or disabled current for each of the analog modules on the device. See
each module's specification for its supply current.
2. 72MHz core and system clock, 36MHz bus clock, and 24MHz flash clock. MCG configured for FEE mode. All peripheral
clocks disabled.
3. 72MHz core and system clock, 36MHz bus clock, and 24MHz flash clock. MCG configured for FEE mode. All peripheral
clocks enabled.
4. Max values are measured with CPU executing DSP instructions.
5. 25MHz core, system, bus and flash clock. MCG configured for FEI mode.
6. 4 MHz core and system clock, 4 MHz and bus clock, and 1 MHz flash clock. MCG configured for BLPE mode. All
peripheral clocks disabled. Code executing from flash.
7. 4 MHz core and system clock, 4 MHz and bus clock, and 1 MHz flash clock. MCG configured for BLPE mode. All
peripheral clocks enabled but peripherals are not in active operation. Code executing from flash.
8. 4 MHz core and system clock, 4 MHz and bus clock, and 1 MHz flash clock. MCG configured for BLPE mode. All
peripheral clocks disabled.
9. Data reflects devices with 128 KB of RAM. For devices with 64 KB of RAM, power consumption is reduced by 2 μA.
10. Includes 32kHz oscillator current and RTC operation.
5.2.5.1 Diagram: Typical IDD_RUN operating behavior
The following data was measured under these conditions:
• MCG in FBE mode for 50 MHz and lower frequencies. MCG in FEE mode at greater
than 50 MHz frequencies.
• USB regulator disabled
• No GPIOs toggled
• Code execution from flash with cache enabled
• For the ALLOFF curve, all peripheral clocks are disabled except FTFL
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
17
General
Figure 2. Run mode supply current vs. core frequency
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
18
Freescale Semiconductor, Inc.
General
Figure 3. VLPR mode supply current vs. core frequency
5.2.6 Designing with radiated emissions in mind
To find application notes that provide guidance on designing your system to minimize
interference from radiated emissions:
1. Go to http://www.freescale.com.
2. Perform a keyword search for “EMC design.”
5.2.7 Capacitance attributes
Table 7. Capacitance attributes
Symbol
Description
Min.
Max.
Unit
CIN_A
Input capacitance: analog pins
—
7
pF
Table continues on the next page...
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
19
General
Table 7. Capacitance attributes (continued)
Symbol
CIN_D
Description
Input capacitance: digital pins
Min.
Max.
Unit
—
7
pF
5.3 Switching specifications
5.3.1 Device clock specifications
Table 8. Device clock specifications
Symbol
Description
Min.
Max.
Unit
Notes
Normal run mode
fSYS
System and core clock
—
72
—
MHz
MHz
fSYS_USB
System and core clock when Full Speed USB in
operation
20
fBUS
Bus clock
—
—
—
50
25
25
MHz
MHz
MHz
fFLASH
fLPTMR
Flash clock
LPTMR clock
VLPR mode1
fSYS
fBUS
System and core clock
Bus clock
—
—
—
—
—
—
—
—
—
4
4
MHz
MHz
MHz
MHz
MHz
MHz
MHz
MHz
MHz
fFLASH
fERCLK
fLPTMR_pin
Flash clock
1
External reference clock
LPTMR clock
16
25
16
8
fLPTMR_ERCLK LPTMR external reference clock
fFlexCAN_ERCLK FlexCAN external reference clock
fI2S_MCLK
fI2S_BCLK
I2S master clock
I2S bit clock
12.5
4
1. The frequency limitations in VLPR mode here override any frequency specification listed in the timing specification for any
other module.
5.3.2 General switching specifications
These general purpose specifications apply to all signals configured for GPIO, UART,
CMT, and I2C signals.
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
20
Freescale Semiconductor, Inc.
General
Table 9. General switching specifications
Symbol
Description
Min.
Max.
Unit
Notes
GPIO pin interrupt pulse width (digital glitch filter
disabled) — Synchronous path
1.5
—
Bus clock
cycles
1, 2
GPIO pin interrupt pulse width (digital glitch filter
disabled, analog filter enabled) — Asynchronous path
100
16
—
—
ns
ns
ns
3
3
3
GPIO pin interrupt pulse width (digital glitch filter
disabled, analog filter disabled) — Asynchronous path
External reset pulse width (digital glitch filter disabled)
100
2
—
—
Mode select (EZP_CS) hold time after reset
deassertion
Bus clock
cycles
Port rise and fall time (high drive strength)
• Slew disabled
4
• 1.71 ≤ VDD ≤ 2.7V
• 2.7 ≤ VDD ≤ 3.6V
—
—
12
6
ns
ns
• Slew enabled
—
—
ns
ns
• 1.71 ≤ VDD ≤ 2.7V
• 2.7 ≤ VDD ≤ 3.6V
36
24
Port rise and fall time (low drive strength)
• Slew disabled
5
• 1.71 ≤ VDD ≤ 2.7V
• 2.7 ≤ VDD ≤ 3.6V
—
—
12
6
ns
ns
• Slew enabled
—
—
36
24
ns
ns
• 1.71 ≤ VDD ≤ 2.7V
• 2.7 ≤ VDD ≤ 3.6V
1. This is the minimum pulse width that is guaranteed to pass through the pin synchronization circuitry. Shorter pulses may or
may not be recognized. In Stop, VLPS, LLS, and VLLSx modes, the synchronizer is bypassed so shorter pulses can be
recognized in that case.
2. The greater synchronous and asynchronous timing must be met.
3. This is the minimum pulse width that is guaranteed to be recognized as a pin interrupt request in Stop, VLPS, LLS, and
VLLSx modes.
4. 75pF load
5. 15pF load
5.4 Thermal specifications
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
21
General
5.4.1 Thermal operating requirements
Table 10. Thermal operating requirements
Symbol
Description
Min.
Max.
Unit
TJ
Die junction temperature
–40
125
°C
TA
Ambient temperature
–40
85
°C
5.4.2 Thermal attributes
Board type
Symbol
Description
81 MAPBGA 80 LQFP
Unit
Notes
Single-layer
(1s)
RθJA
Thermal
resistance,
junction to
ambient (natural
convection)
74
42
62
38
23
51
36
41
30
20
°C/W
1, 2
1, 3
1,3
1,3
4
Four-layer
(2s2p)
RθJA
Thermal
resistance,
junction to
ambient (natural
convection)
°C/W
°C/W
°C/W
°C/W
Single-layer
(1s)
RθJMA
RθJMA
RθJB
Thermal
resistance,
junction to
ambient (200 ft./
min. air speed)
Four-layer
(2s2p)
Thermal
resistance,
junction to
ambient (200 ft./
min. air speed)
—
Thermal
resistance,
junction to
board
—
—
RθJC
Thermal
resistance,
junction to case
19
4
10
2
°C/W
°C/W
5
6
ΨJT
Thermal
characterization
parameter,
junction to
package top
outside center
(natural
convection)
1.
Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site
(board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board
thermal resistance.
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
22
Freescale Semiconductor, Inc.
Peripheral operating requirements and behaviors
2.
3.
Determined according to JEDEC Standard JESD51-2, Integrated Circuits Thermal Test Method Environmental
Conditions—Natural Convection (Still Air) with the single layer board horizontal. For the LQFP, the board meets the
JESD51-3 specification. For the MAPBGA, the board meets the JESD51-9 specification.
Determined according to JEDEC Standard JESD51-6, Integrated Circuits Thermal Test Method Environmental
Conditions—Forced Convection (Moving Air) with the board horizontal. For the LQFP, the board meets the JESD51-7
specification.
4.
5.
Determined according to JEDEC Standard JESD51-8, Integrated Circuit Thermal Test Method Environmental
Conditions—Junction-to-Board. Board temperature is measured on the top surface of the board near the package.
Determined according to Method 1012.1 of MIL-STD 883, Test Method Standard, Microcircuits, with the cold plate
temperature used for the case temperature. The value includes the thermal resistance of the interface material
between the top of the package and the cold plate.
6.
Determined according to JEDEC Standard JESD51-2, Integrated Circuits Thermal Test Method Environmental
Conditions—Natural Convection (Still Air).
6 Peripheral operating requirements and behaviors
6.1 Core modules
6.1.1 Debug trace timing specifications
Table 11. Debug trace operating behaviors
Symbol
Description
Min.
Max.
Unit
Tcyc
Clock period
Frequency dependent
MHz
Twl
Twh
Tr
Low pulse width
High pulse width
Clock and data rise time
Clock and data fall time
Data setup
2
2
—
—
3
ns
ns
ns
ns
ns
ns
—
—
3
Tf
3
Ts
—
—
Th
Data hold
2
Figure 4. TRACE_CLKOUT specifications
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
23
Peripheral operating requirements and behaviors
TRACE_CLKOUT
Ts
Th
Ts
Th
TRACE_D[3:0]
Figure 5. Trace data specifications
6.1.2 JTAG electricals
Table 12. JTAG voltage range electricals
Symbol
Description
Min.
Max.
Unit
V
Operating voltage
TCLK frequency of operation
• JTAG
2.7
5.5
J1
MHz
—
—
10
5
• CJTAG
J2
J3
TCLK cycle period
TCLK clock pulse width
• JTAG
1/J1
—
ns
100
200
—
—
ns
ns
ns
ns
ns
• CJTAG
J4
J5
TCLK rise and fall times
—
1
TMS input data setup time to TCLK rise
53
112
8
—
—
—
• JTAG
• CJTAG
J6
J7
TDI input data setup time to TCLK rise
ns
ns
TMS input data hold time after TCLK rise
3.4
3.4
3.4
—
—
—
• JTAG
• CJTAG
J8
J9
TDI input data hold time after TCLK rise
ns
ns
TCLK low to TMS data valid
• JTAG
—
—
—
—
48
85
48
3
• CJTAG
J10
J11
TCLK low to TDO data valid
ns
ns
Output data hold/invalid time after clock edge1
1. They are common for JTAG and CJTAG. Input transition = 1 ns and Output load = 50pf
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
24
Freescale Semiconductor, Inc.
Peripheral operating requirements and behaviors
J2
J4
J3
J3
TCLK (input)
J4
Figure 6. Test clock input timing
TCLK
J5
J6
Input data valid
Data inputs
J7
Output data valid
Data outputs
Data outputs
Data outputs
J8
J7
Output data valid
Figure 7. Boundary scan (JTAG) timing
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
25
Peripheral operating requirements and behaviors
TCLK
J9
J10
Input data valid
TDI/TMS
TDO
J11
Output data valid
J12
J11
TDO
Output data valid
TDO
Figure 8. Test Access Port timing
TCLK
TRST
J14
J13
Figure 9. TRST timing
6.2 System modules
There are no specifications necessary for the device's system modules.
6.3 Clock modules
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
26
Freescale Semiconductor, Inc.
Peripheral operating requirements and behaviors
6.3.1 MCG specifications
Table 13. MCG specifications
Symbol Description
Min.
Typ.
Max.
Unit
Notes
fints_ft Internal reference frequency (slow clock) —
—
32.768
—
kHz
factory trimmed at nominal VDD and 25 °C
fints_t
Internal reference frequency (slow clock) — user
trimmed
31.25
—
—
39.0625
0.6
kHz
Δfdco_res_t Resolution of trimmed average DCO output
frequency at fixed voltage and temperature —
using SCTRIM and SCFTRIM
0.3
%fdco
1
1
Δfdco_res_t Resolution of trimmed average DCO output
frequency at fixed voltage and temperature —
using SCTRIM only
—
0.2
0.5
—
%fdco
Δfdco_t
Total deviation of trimmed average DCO output
frequency over voltage and temperature
—
—
+0.5/-0.7
%fdco
%fdco
1
1
Δfdco_t
Total deviation of trimmed average DCO output
frequency over fixed voltage and temperature
range of 0–70°C
fintf_ft
Internal reference frequency (fast clock) —
factory trimmed at nominal VDD and 25°C
—
3
4
—
5
MHz
MHz
kHz
kHz
fintf_t
Internal reference frequency (fast clock) — user
trimmed at nominal VDD and 25 °C
—
—
—
floc_low
Loss of external clock minimum frequency —
RANGE = 00
(3/5) x
fints_t
—
—
floc_high
Loss of external clock minimum frequency —
RANGE = 01, 10, or 11
(16/5) x
fints_t
FLL
ffll_ref
fdco
FLL reference frequency range
31.25
20
—
39.0625
25
kHz
DCO output
Low range (DRS=00)
640 × ffll_ref
20.97
MHz
2, 3
frequency range
Mid range (DRS=01)
1280 × ffll_ref
40
60
80
41.94
62.91
83.89
50
75
MHz
MHz
MHz
Mid-high range (DRS=10)
1920 × ffll_ref
High range (DRS=11)
2560 × ffll_ref
100
Table continues on the next page...
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
27
Peripheral operating requirements and behaviors
Table 13. MCG specifications (continued)
Symbol Description
Min.
Typ.
Max.
Unit
Notes
fdco_t_DMX3 DCO output
Low range (DRS=00)
732 × ffll_ref
—
23.99
—
MHz
4, 5
frequency
2
Mid range (DRS=01)
1464 × ffll_ref
—
—
—
47.97
71.99
95.98
—
—
—
MHz
MHz
MHz
ps
Mid-high range (DRS=10)
2197 × ffll_ref
High range (DRS=11)
2929 × ffll_ref
Jcyc_fll
FLL period jitter
—
—
180
150
—
—
• fVCO = 48 MHz
• fVCO = 98 MHz
tfll_acquire FLL target frequency acquisition time
—
—
1
ms
6
PLL
fvco
Ipll
VCO operating frequency
48.0
—
—
100
—
MHz
µA
PLL operating current
7
7
1060
• PLL @ 96 MHz (fosc_hi_1 = 8 MHz, fpll_ref
2 MHz, VDIV multiplier = 48)
=
=
Ipll
PLL operating current
—
600
—
—
µA
• PLL @ 48 MHz (fosc_hi_1 = 8 MHz, fpll_ref
2 MHz, VDIV multiplier = 24)
fpll_ref
PLL reference frequency range
2.0
4.0
MHz
Jcyc_pll
PLL period jitter (RMS)
• fvco = 48 MHz
8
8
—
—
120
50
—
—
ps
ps
• fvco = 100 MHz
Jacc_pll
PLL accumulated jitter over 1µs (RMS)
• fvco = 48 MHz
—
—
1350
600
—
—
ps
ps
• fvco = 100 MHz
Dlock
Dunl
Lock entry frequency tolerance
Lock exit frequency tolerance
Lock detector detection time
1.49
4.47
—
—
—
—
2.98
5.97
%
%
s
150 × 10-6
+ 1075(1/
tpll_lock
9
fpll_ref
)
1. This parameter is measured with the internal reference (slow clock) being used as a reference to the FLL (FEI clock
mode).
2. These typical values listed are with the slow internal reference clock (FEI) using factory trim and DMX32=0.
3. The resulting system clock frequencies should not exceed their maximum specified values. The DCO frequency deviation
(Δfdco_t) over voltage and temperature should be considered.
4. These typical values listed are with the slow internal reference clock (FEI) using factory trim and DMX32=1.
5. The resulting clock frequency must not exceed the maximum specified clock frequency of the device.
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
28
Freescale Semiconductor, Inc.
Peripheral operating requirements and behaviors
6. This specification applies to any time the FLL reference source or reference divider is changed, trim value is changed,
DMX32 bit is changed, DRS bits are changed, or changing from FLL disabled (BLPE, BLPI) to FLL enabled (FEI, FEE,
FBE, FBI). If a crystal/resonator is being used as the reference, this specification assumes it is already running.
7. Excludes any oscillator currents that are also consuming power while PLL is in operation.
8. This specification was obtained using a Freescale developed PCB. PLL jitter is dependent on the noise characteristics of
each PCB and results will vary.
9. This specification applies to any time the PLL VCO divider or reference divider is changed, or changing from PLL disabled
(BLPE, BLPI) to PLL enabled (PBE, PEE). If a crystal/resonator is being used as the reference, this specification assumes
it is already running.
6.3.2 Oscillator electrical specifications
This section provides the electrical characteristics of the module.
6.3.2.1 Oscillator DC electrical specifications
Table 14. Oscillator DC electrical specifications
Symbol Description
Min.
Typ.
Max.
Unit
Notes
VDD
Supply voltage
1.71
—
3.6
V
IDDOSC
Supply current — low-power mode (HGO=0)
1
• 32 kHz
—
—
—
—
—
—
500
200
300
950
1.2
—
—
—
—
—
—
nA
μA
μA
μA
mA
mA
• 4 MHz
• 8 MHz (RANGE=01)
• 16 MHz
• 24 MHz
• 32 MHz
1.5
IDDOSC
Supply current — high gain mode (HGO=1)
1
• 32 kHz
—
—
—
—
—
—
25
400
500
2.5
3
—
—
—
—
—
—
μA
μA
• 4 MHz
• 8 MHz (RANGE=01)
• 16 MHz
μA
mA
mA
mA
• 24 MHz
• 32 MHz
4
Cx
Cy
EXTAL load capacitance
XTAL load capacitance
—
—
—
—
—
—
2, 3
2, 3
Table continues on the next page...
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
29
Peripheral operating requirements and behaviors
Table 14. Oscillator DC electrical specifications (continued)
Symbol Description
Min.
Typ.
Max.
Unit
Notes
RF Feedback resistor — low-frequency, low-power
—
—
—
MΩ
2, 4
mode (HGO=0)
Feedback resistor — low-frequency, high-gain
mode (HGO=1)
—
—
—
—
—
—
10
—
—
—
—
—
—
—
MΩ
MΩ
MΩ
kΩ
Feedback resistor — high-frequency, low-power
mode (HGO=0)
Feedback resistor — high-frequency, high-gain
mode (HGO=1)
1
RS
Series resistor — low-frequency, low-power
mode (HGO=0)
—
Series resistor — low-frequency, high-gain mode
(HGO=1)
200
—
kΩ
Series resistor — high-frequency, low-power
mode (HGO=0)
kΩ
Series resistor — high-frequency, high-gain
mode (HGO=1)
—
—
0
—
—
kΩ
V
5
Peak-to-peak amplitude of oscillation (oscillator
mode) — low-frequency, low-power mode
(HGO=0)
0.6
Vpp
Peak-to-peak amplitude of oscillation (oscillator
mode) — low-frequency, high-gain mode
(HGO=1)
—
—
—
VDD
0.6
—
—
—
V
V
V
Peak-to-peak amplitude of oscillation (oscillator
mode) — high-frequency, low-power mode
(HGO=0)
Peak-to-peak amplitude of oscillation (oscillator
mode) — high-frequency, high-gain mode
(HGO=1)
VDD
1. VDD=3.3 V, Temperature =25 °C
2. See crystal or resonator manufacturer's recommendation
3. Cx,Cy can be provided by using either the integrated capacitors or by using external components.
4. When low power mode is selected, RF is integrated and must not be attached externally.
5. The EXTAL and XTAL pins should only be connected to required oscillator components and must not be connected to any
other devices.
6.3.2.2 Oscillator frequency specifications
Table 15. Oscillator frequency specifications
Symbol Description
Min.
Typ.
Max.
Unit
Notes
fosc_lo Oscillator crystal or resonator frequency — low
32
—
40
kHz
frequency mode (MCG_C2[RANGE]=00)
Table continues on the next page...
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
30
Freescale Semiconductor, Inc.
Peripheral operating requirements and behaviors
Table 15. Oscillator frequency specifications (continued)
Symbol Description
Min.
Typ.
Max.
Unit
Notes
fosc_hi_1 Oscillator crystal or resonator frequency — high
3
—
8
MHz
frequency mode (low range)
(MCG_C2[RANGE]=01)
fosc_hi_2
Oscillator crystal or resonator frequency — high
frequency mode (high range)
8
—
32
MHz
(MCG_C2[RANGE]=1x)
fec_extal
tdc_extal
tcst
Input clock frequency (external clock mode)
Input clock duty cycle (external clock mode)
—
40
—
—
50
50
60
—
MHz
%
1, 2
3, 4
Crystal startup time — 32 kHz low-frequency,
low-power mode (HGO=0)
750
ms
Crystal startup time — 32 kHz low-frequency,
high-gain mode (HGO=1)
—
—
250
0.6
—
—
ms
ms
Crystal startup time — 8 MHz high-frequency
(MCG_C2[RANGE]=01), low-power mode
(HGO=0)
Crystal startup time — 8 MHz high-frequency
(MCG_C2[RANGE]=01), high-gain mode
(HGO=1)
—
1
—
ms
1. Other frequency limits may apply when external clock is being used as a reference for the FLL or PLL.
2. When transitioning from FBE to FEI mode, restrict the frequency of the input clock so that, when it is divided by FRDIV, it
remains within the limits of the DCO input clock frequency.
3. Proper PC board layout procedures must be followed to achieve specifications.
4. Crystal startup time is defined as the time between the oscillator being enabled and the OSCINIT bit in the MCG_S register
being set.
6.3.3 32kHz Oscillator Electrical Characteristics
This section describes the module electrical characteristics.
6.3.3.1 32kHz oscillator DC electrical specifications
Table 16. 32kHz oscillator DC electrical specifications
Symbol
Description
Min.
Typ.
Max.
Unit
VBAT
Supply voltage
1.71
—
3.6
V
RF
Internal feedback resistor
—
—
—
100
5
—
7
MΩ
pF
V
Cpara
Parasitical capacitance of EXTAL32 and XTAL32
Peak-to-peak amplitude of oscillation
1
0.6
—
Vpp
1. The EXTAL32 and XTAL32 pins should only be connected to required oscillator components and must not be connected to
any other devices.
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
31
Peripheral operating requirements and behaviors
6.3.3.2 32kHz oscillator frequency specifications
Table 17. 32kHz oscillator frequency specifications
Symbol Description
Min.
—
Typ.
32.768
1000
Max.
—
Unit
kHz
ms
Notes
fosc_lo
tstart
Oscillator crystal
Crystal start-up time
—
—
1
1. Proper PC board layout procedures must be followed to achieve specifications.
6.4 Memories and memory interfaces
6.4.1 Flash electrical specifications
This section describes the electrical characteristics of the flash memory module.
6.4.1.1 Flash timing specifications — program and erase
The following specifications represent the amount of time the internal charge pumps are
active and do not include command overhead.
Table 18. NVM program/erase timing specifications
Symbol Description
thvpgm4 Longword Program high-voltage time
thversscr Sector Erase high-voltage time
Min.
Typ.
Max.
Unit
Notes
—
7.5
18
μs
—
—
—
13
52
113
452
904
ms
ms
ms
1
1
1
thversblk32k Erase Block high-voltage time for 32 KB
thversblk256k Erase Block high-voltage time for 256 KB
104
1. Maximum time based on expectations at cycling end-of-life.
6.4.1.2 Flash timing specifications — commands
Table 19. Flash command timing specifications
Symbol Description
Read 1s Block execution time
Min.
Typ.
Max.
Unit
Notes
trd1blk32k
• 32 KB data flash
—
—
—
—
0.5
1.7
ms
ms
• 256 KB program flash
trd1blk256k
trd1sec1k
Read 1s Section execution time (data flash
sector)
—
—
—
—
60
60
μs
μs
1
1
trd1sec2k
Read 1s Section execution time (program flash
sector)
Table continues on the next page...
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
32
Freescale Semiconductor, Inc.
Peripheral operating requirements and behaviors
Table 19. Flash command timing specifications (continued)
Symbol Description
tpgmchk Program Check execution time
trdrsrc
Min.
Typ.
Max.
Unit
Notes
—
—
45
μs
1
Read Resource execution time
—
—
—
30
μs
μs
1
2
tpgm4
Program Longword execution time
65
145
Erase Flash Block execution time
• 32 KB data flash
tersblk32k
—
—
55
465
985
ms
ms
• 256 KB program flash
122
tersblk256k
tersscr
Erase Flash Sector execution time
—
14
114
ms
2
Program Section execution time
• 512 B program flash
• 512 B data flash
tpgmsec512p
tpgmsec512d
tpgmsec1kp
tpgmsec1kd
—
—
—
—
2.4
4.7
4.7
9.3
—
—
—
—
ms
ms
ms
ms
• 1 KB program flash
• 1 KB data flash
trd1all
Read 1s All Blocks execution time
Read Once execution time
—
—
—
—
—
—
—
1.8
25
ms
μs
μs
ms
μs
trdonce
1
tpgmonce Program Once execution time
65
175
—
—
tersall
Erase All Blocks execution time
1500
30
2
1
tvfykey
Verify Backdoor Access Key execution time
Swap Control execution time
• control code 0x01
• control code 0x02
• control code 0x04
• control code 0x08
tswapx01
tswapx02
tswapx04
tswapx08
—
—
—
—
200
70
70
—
—
150
150
30
μs
μs
μs
μs
Program Partition for EEPROM execution time
• 32 KB FlexNVM
tpgmpart32k
—
70
—
ms
Set FlexRAM Function execution time:
• Control Code 0xFF
tsetramff
tsetram8k
tsetram32k
—
—
—
50
0.3
0.7
—
μs
ms
ms
• 8 KB EEPROM backup
• 32 KB EEPROM backup
0.5
1.0
Byte-write to FlexRAM for EEPROM operation
teewr8bers Byte-write to erased FlexRAM location execution
time
—
175
260
μs
3
Table continues on the next page...
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
33
Peripheral operating requirements and behaviors
Table 19. Flash command timing specifications (continued)
Symbol Description
Byte-write to FlexRAM execution time:
Min.
Typ.
Max.
Unit
Notes
teewr8b8k
teewr8b16k
teewr8b32k
• 8 KB EEPROM backup
• 16 KB EEPROM backup
• 32 KB EEPROM backup
—
—
—
340
385
475
1700
1800
2000
μs
μs
μs
Word-write to FlexRAM for EEPROM operation
teewr16bers Word-write to erased FlexRAM location
execution time
—
175
260
μs
Word-write to FlexRAM execution time:
teewr16b8k
teewr16b16k
teewr16b32k
• 8 KB EEPROM backup
• 16 KB EEPROM backup
• 32 KB EEPROM backup
—
—
—
340
385
475
1700
1800
2000
μs
μs
μs
Longword-write to FlexRAM for EEPROM operation
teewr32bers Longword-write to erased FlexRAM location
execution time
—
360
540
μs
Longword-write to FlexRAM execution time:
teewr32b8k
teewr32b16k
teewr32b32k
• 8 KB EEPROM backup
• 16 KB EEPROM backup
• 32 KB EEPROM backup
—
—
—
545
630
810
1950
2050
2250
μs
μs
μs
1. Assumes 25MHz flash clock frequency.
2. Maximum times for erase parameters based on expectations at cycling end-of-life.
3. For byte-writes to an erased FlexRAM location, the aligned word containing the byte must be erased.
6.4.1.3 Flash current and power specfications
Table 20. Flash current and power specfications
Symbol
Description
Typ.
Unit
mA
IDD_PGM
Worst case programming current in program flash
10
6.4.1.4 Reliability specifications
Table 21. NVM reliability specifications
Typ.1
Symbol Description
Min.
Program Flash
Max.
Unit
Notes
tnvmretp10k Data retention after up to 10 K cycles
tnvmretp1k Data retention after up to 1 K cycles
nnvmcycp Cycling endurance
5
50
—
—
—
years
years
cycles
20
100
50 K
10 K
2
Table continues on the next page...
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
34
Freescale Semiconductor, Inc.
Peripheral operating requirements and behaviors
Table 21. NVM reliability specifications (continued)
Typ.1
Symbol Description
Min.
Data Flash
Max.
Unit
Notes
tnvmretd10k Data retention after up to 10 K cycles
tnvmretd1k Data retention after up to 1 K cycles
nnvmcycd Cycling endurance
5
50
—
—
—
years
years
cycles
20
10 K
100
50 K
2
3
FlexRAM as EEPROM
tnvmretee100 Data retention up to 100% of write endurance
tnvmretee10 Data retention up to 10% of write endurance
Write endurance
5
50
—
—
years
years
20
100
nnvmwree16
nnvmwree128
nnvmwree512
nnvmwree4k
nnvmwree8k
• EEPROM backup to FlexRAM ratio = 16
• EEPROM backup to FlexRAM ratio = 128
• EEPROM backup to FlexRAM ratio = 512
• EEPROM backup to FlexRAM ratio = 4096
• EEPROM backup to FlexRAM ratio = 8192
35 K
315 K
1.27 M
10 M
175 K
1.6 M
6.4 M
50 M
—
—
—
—
—
writes
writes
writes
writes
writes
20 M
100 M
1. Typical data retention values are based on measured response accelerated at high temperature and derated to a constant
25°C use profile. Engineering Bulletin EB618 does not apply to this technology. Typical endurance defined in Engineering
Bulletin EB619.
2. Cycling endurance represents number of program/erase cycles at -40°C ≤ Tj ≤ 125°C.
3. Write endurance represents the number of writes to each FlexRAM location at -40°C ≤Tj ≤ 125°C influenced by the cycling
endurance of the FlexNVM (same value as data flash) and the allocated EEPROM backup per subsystem. Minimum and
typical values assume all byte-writes to FlexRAM.
6.4.1.5 Write endurance to FlexRAM for EEPROM
When the FlexNVM partition code is not set to full data flash, the EEPROM data set size
can be set to any of several non-zero values.
The bytes not assigned to data flash via the FlexNVM partition code are used by the
FTFL to obtain an effective endurance increase for the EEPROM data. The built-in
EEPROM record management system raises the number of program/erase cycles that can
be attained prior to device wear-out by cycling the EEPROM data through a larger
EEPROM NVM storage space.
While different partitions of the FlexNVM are available, the intention is that a single
choice for the FlexNVM partition code and EEPROM data set size is used throughout the
entire lifetime of a given application. The EEPROM endurance equation and graph
shown below assume that only one configuration is ever used.
EEPROM – 2 × EEESPLIT × EEESIZE
Writes_subsystem =
× Write_efficiency × nnvmcycd
where
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
35
Peripheral operating requirements and behaviors
• Writes_subsystem — minimum number of writes to each FlexRAM location for
subsystem (each subsystem can have different endurance)
• EEPROM — allocated FlexNVM for each EEPROM subsystem based on DEPART;
entered with Program Partition command
• EEESPLIT — FlexRAM split factor for subsystem; entered with the Program
Partition command
• EEESIZE — allocated FlexRAM based on DEPART; entered with Program Partition
command
• Write_efficiency —
• 0.25 for 8-bit writes to FlexRAM
• 0.50 for 16-bit or 32-bit writes to FlexRAM
• nnvmcycd — data flash cycling endurance
Figure 10. EEPROM backup writes to FlexRAM
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
36
Freescale Semiconductor, Inc.
Peripheral operating requirements and behaviors
6.4.2 EzPort Switching Specifications
Table 22. EzPort switching specifications
Num
Description
Min.
Max.
3.6
Unit
V
Operating voltage
1.71
—
EP1
EZP_CK frequency of operation (all commands except
READ)
fSYS/2
MHz
EP1a
EP2
EP3
EP4
EP5
EP6
EP7
EP8
EP9
EZP_CK frequency of operation (READ command)
EZP_CS negation to next EZP_CS assertion
EZP_CS input valid to EZP_CK high (setup)
EZP_CK high to EZP_CS input invalid (hold)
EZP_D input valid to EZP_CK high (setup)
EZP_CK high to EZP_D input invalid (hold)
EZP_CK low to EZP_Q output valid
—
fSYS/8
—
MHz
ns
2 x tEZP_CK
5
5
—
ns
—
ns
2
—
ns
5
—
ns
—
0
16
—
ns
EZP_CK low to EZP_Q output invalid (hold)
EZP_CS negation to EZP_Q tri-state
ns
—
12
ns
EZP_CK
EZP_CS
EP3
EP4
EP2
EP9
EP8
EP7
EZP_Q (output)
EZP_D (input)
EP5
EP6
Figure 11. EzPort Timing Diagram
6.5 Security and integrity modules
There are no specifications necessary for the device's security and integrity modules.
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
37
Peripheral operating requirements and behaviors
6.6 Analog
6.6.1 ADC electrical specifications
The 16-bit accuracy specifications listed in Table 23 and Table 24 are achievable on the
differential pins ADCx_DP0, ADCx_DM0.
The ADCx_DP2 and ADCx_DM2 ADC inputs are connected to the PGA outputs and are
not direct device pins. Accuracy specifications for these pins are defined in Table 25 and
Table 26.
All other ADC channels meet the 13-bit differential/12-bit single-ended accuracy
specifications.
6.6.1.1 16-bit ADC operating conditions
Table 23. 16-bit ADC operating conditions
Typ.1
Symbol Description
Conditions
Absolute
Min.
1.71
-100
Max.
3.6
Unit
V
Notes
VDDA
Supply voltage
Supply voltage
—
ΔVDDA
Delta to VDD (VDD
-
0
+100
mV
2
2
VDDA
)
ΔVSSA
Ground voltage
Delta to VSS (VSS
-
-100
0
+100
mV
VSSA
)
VREFH
ADC reference
voltage high
1.13
VSSA
VREFL
VDDA
VSSA
—
VDDA
V
V
VREFL
Reference
voltage low
VSSA
VADIN
CADIN
Input voltage
VREFH
V
Input
capacitance
• 16 bit modes
—
—
8
4
10
5
pF
• 8/10/12 bit
modes
RADIN
RAS
Input resistance
—
—
2
5
5
kΩ
kΩ
Analog source
resistance
13/12 bit modes
fADCK < 4MHz
3
—
fADCK
ADC conversion ≤ 13 bit modes
clock frequency
4
4
1.0
2.0
—
—
18.0
12.0
MHz
MHz
fADCK
ADC conversion 16 bit modes
clock frequency
Table continues on the next page...
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
38
Freescale Semiconductor, Inc.
Peripheral operating requirements and behaviors
Table 23. 16-bit ADC operating conditions (continued)
Typ.1
Symbol Description
Conditions
Min.
Max.
Unit
Notes
Crate
ADC conversion ≤ 13 bit modes
5
rate
No ADC hardware
20.000
—
818.330
Ksps
averaging
Continuous
conversions enabled,
subsequent conversion
time
Crate
ADC conversion 16 bit modes
5
rate
No ADC hardware
37.037
—
461.467
Ksps
averaging
Continuous
conversions enabled,
subsequent conversion
time
1. Typical values assume VDDA = 3.0 V, Temp = 25°C, fADCK = 1.0 MHz unless otherwise stated. Typical values are for
reference only and are not tested in production.
2. DC potential difference.
3. This resistance is external to MCU. The analog source resistance should be kept as low as possible in order to achieve the
best results. The results in this datasheet were derived from a system which has <8 Ω analog source resistance. The RAS
/
CAS time constant should be kept to <1ns.
4. To use the maximum ADC conversion clock frequency, the ADHSC bit should be set and the ADLPC bit should be clear.
5. For guidelines and examples of conversion rate calculation, download the ADC calculator tool: http://cache.freescale.com/
files/soft_dev_tools/software/app_software/converters/ADC_CALCULATOR_CNV.zip?fpsp=1
SIMPLIFIED
INPUT PIN EQUIVALENT
ZADIN
CIRCUIT
SIMPLIFIED
CHANNEL SELECT
CIRCUIT
Pad
leakage
due to
input
protection
ZAS
ADC SAR
ENGINE
RAS
RADIN
VADIN
CAS
VAS
RADIN
RADIN
RADIN
INPUT PIN
INPUT PIN
INPUT PIN
CADIN
Figure 12. ADC input impedance equivalency diagram
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
39
Peripheral operating requirements and behaviors
6.6.1.2 16-bit ADC electrical characteristics
Table 24. 16-bit ADC characteristics (VREFH = VDDA, VREFL = VSSA
)
Conditions1
Typ.2
Symbol Description
Min.
Max.
Unit
Notes
IDDA_ADC Supply current
0.215
—
1.7
mA
3
ADC
asynchronous
clock source
• ADLPC=1, ADHSC=0
1.2
3.0
2.4
4.4
2.4
4.0
5.2
6.2
3.9
7.3
6.1
9.5
tADACK = 1/
fADACK
MHz
MHz
MHz
MHz
• ADLPC=1, ADHSC=1
• ADLPC=0, ADHSC=0
• ADLPC=0, ADHSC=1
fADACK
Sample Time
See Reference Manual chapter for sample times
LSB4
LSB4
TUE
DNL
Total unadjusted
error
• 12 bit modes
• <12 bit modes
—
—
4
6.8
2.1
5
5
1.4
Differential non-
linearity
• 12 bit modes
—
0.7
-1.1 to
+1.9
-0.3 to 0.5
• <12 bit modes
• 12 bit modes
—
—
0.2
1.0
LSB4
INL
EFS
Integral non-
linearity
-2.7 to
+1.9
5
-0.7 to
+0.5
• <12 bit modes
—
0.5
LSB4
LSB4
Full-scale error
• 12 bit modes
• <12 bit modes
—
—
-4
-5.4
-1.8
VADIN =
VDDA
-1.4
5
EQ
Quantization
error
• 16 bit modes
• ≤13 bit modes
—
—
-1 to 0
—
—
0.5
ENOB
Effective number 16 bit differential mode
6
of bits
• Avg=32
12.8
11.9
14.5
13.8
—
—
bits
bits
• Avg=4
16 bit single-ended mode
• Avg=32
12.2
11.4
13.9
13.1
—
—
bits
bits
• Avg=4
Signal-to-noise
plus distortion
See ENOB
SINAD
THD
6.02 × ENOB + 1.76
dB
Total harmonic
distortion
16 bit differential mode
• Avg=32
7
—
—
–94
-85
—
—
dB
dB
16 bit single-ended mode
• Avg=32
Table continues on the next page...
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
40
Freescale Semiconductor, Inc.
Peripheral operating requirements and behaviors
Table 24. 16-bit ADC characteristics (VREFH = VDDA, VREFL = VSSA) (continued)
Conditions1
Typ.2
Symbol Description
Min.
Max.
Unit
Notes
SFDR
Spurious free
dynamic range
16 bit differential mode
• Avg=32
7
82
95
—
dB
16 bit single-ended mode
• Avg=32
78
90
—
dB
EIL
Input leakage
error
IIn × RAS
mV
IIn =
leakage
current
(refer to
the MCU's
voltage
and
current
operating
ratings)
Temp sensor
slope
–40°C to 105°C
25°C
—
—
1.715
719
—
—
mV/°C
mV
VTEMP25 Temp sensor
voltage
1. All accuracy numbers assume the ADC is calibrated with VREFH = VDDA
2. Typical values assume VDDA = 3.0 V, Temp = 25°C, fADCK = 2.0 MHz unless otherwise stated. Typical values are for
reference only and are not tested in production.
3. The ADC supply current depends on the ADC conversion clock speed, conversion rate and the ADLPC bit (low power).
For lowest power operation the ADLPC bit should be set, the HSC bit should be clear with 1MHz ADC conversion clock
speed.
1 LSB = (VREFH - VREFL)/2N
4.
5. ADC conversion clock <16MHz, Max hardware averaging (AVGE = %1, AVGS = %11)
6. Input data is 100 Hz sine wave. ADC conversion clock <12MHz.
7. Input data is 1 kHz sine wave. ADC conversion clock <12MHz.
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
41
Peripheral operating requirements and behaviors
Figure 13. Typical ENOB vs. ADC_CLK for 16-bit differential mode
Figure 14. Typical ENOB vs. ADC_CLK for 16-bit single-ended mode
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
42
Freescale Semiconductor, Inc.
Peripheral operating requirements and behaviors
6.6.1.3 16-bit ADC with PGA operating conditions
Table 25. 16-bit ADC with PGA operating conditions
Typ.1
Symbol Description
VDDA Supply voltage
VREFPGA PGA ref voltage
Conditions
Min.
Max.
Unit
V
Notes
Absolute
1.71
—
3.6
VREF_OU VREF_OU VREF_OU
V
2, 3
T
T
T
VADIN
VCM
Input voltage
VSSA
VSSA
—
—
VDDA
VDDA
V
V
Input Common
Mode range
IN+ to IN-4
RPGAD
Differential input Gain = 1, 2, 4, 8
—
—
—
—
128
64
—
—
—
—
kΩ
impedance
Gain = 16, 32
Gain = 64
32
RAS
TS
Analog source
resistance
100
Ω
µs
5
6
7
ADC sampling
time
1.25
—
—
—
Crate
ADC conversion ≤ 13 bit modes
18.484
450
Ksps
rate
No ADC hardware
averaging
Continuous
conversions enabled
Peripheral clock = 50
MHz
16 bit modes
37.037
—
250
Ksps
8
No ADC hardware
averaging
Continuous
conversions enabled
Peripheral clock = 50
MHz
1. Typical values assume VDDA = 3.0 V, Temp = 25°C, fADCK = 6 MHz unless otherwise stated. Typical values are for
reference only and are not tested in production.
2. ADC must be configured to use the internal voltage reference (VREF_OUT)
3. PGA reference is internally connected to the VREF_OUT pin. If the user wishes to drive VREF_OUT with a voltage other
than the output of the VREF module, the VREF module must be disabled.
4. For single ended configurations the input impedance of the driven input is RPGAD/2
5. The analog source resistance (RAS), external to MCU, should be kept as minimum as possible. Increased RAS causes drop
in PGA gain without affecting other performances. This is not dependent on ADC clock frequency.
6. The minimum sampling time is dependent on input signal frequency and ADC mode of operation. A minimum of 1.25µs
time should be allowed for Fin=4 kHz at 16-bit differential mode. Recommended ADC setting is: ADLSMP=1, ADLSTS=2 at
8 MHz ADC clock.
7. ADC clock = 18 MHz, ADLSMP = 1, ADLST = 00, ADHSC = 1
8. ADC clock = 12 MHz, ADLSMP = 1, ADLST = 01, ADHSC = 1
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
43
Peripheral operating requirements and behaviors
6.6.1.4 16-bit ADC with PGA characteristics with Chop enabled
(ADC_PGA[PGACHPb] =0)
Table 26. 16-bit ADC with PGA characteristics
Typ.1
Symbol
Description
Conditions
Min.
Max.
Unit
Notes
IDDA_PGA Supply current
Low power
—
420
644
μA
2
(ADC_PGA[PGALPb]=0)
IDC_PGA
Input DC current
A
3
Gain =1, VREFPGA=1.2V,
VCM=0.5V
—
—
1.54
0.57
—
—
μA
μA
Gain =64, VREFPGA=1.2V,
VCM=0.1V
Gain4
G
• PGAG=0
• PGAG=1
• PGAG=2
• PGAG=3
• PGAG=4
• PGAG=5
• PGAG=6
0.95
1.9
1
2
1.05
2.1
R
AS < 100Ω
3.8
4
4.2
7.6
8
8.4
15.2
30.0
58.8
16
31.6
63.3
16.6
33.2
67.8
BW
Input signal
bandwidth
• 16-bit modes
• < 16-bit modes
—
—
—
—
—
4
kHz
kHz
dB
40
—
PSRR
Power supply
rejection ratio
Gain=1
-84
VDDA= 3V
100mV,
fVDDA= 50Hz,
60Hz
CMRR
Common mode
rejection ratio
• Gain=1
—
—
-84
-85
—
—
dB
dB
VCM=
500mVpp,
fVCM= 50Hz,
100Hz
• Gain=64
VOFS
TGSW
dG/dT
Input offset
voltage
—
—
0.2
—
—
mV
µs
Output offset =
VOFS*(Gain+1)
Gain switching
settling time
10
5
Gain drift over full
temperature
range
• Gain=1
• Gain=64
—
—
6
10
42
ppm/°C
ppm/°C
31
dG/dVDDA Gain drift over
supply voltage
• Gain=1
• Gain=64
—
—
0.07
0.14
0.21
0.31
%/V
%/V
VDDA from 1.71
to 3.6V
Table continues on the next page...
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
44
Freescale Semiconductor, Inc.
Peripheral operating requirements and behaviors
Table 26. 16-bit ADC with PGA characteristics (continued)
Typ.1
Symbol
Description
Conditions
Min.
Max.
Unit
Notes
EIL
Input leakage
error
All modes
IIn × RAS
mV
IIn = leakage
current
(refer to the
MCU's voltage
and current
operating
ratings)
VPP,DIFF
Maximum
V
6
differential input
signal swing
where VX = VREFPGA × 0.583
SNR
Signal-to-noise
ratio
• Gain=1
80
52
90
66
—
—
dB
dB
16-bit
differential
mode,
• Gain=64
Average=32
THD
Total harmonic
distortion
• Gain=1
85
49
100
95
—
—
dB
dB
16-bit
differential
mode,
• Gain=64
Average=32,
fin=100Hz
SFDR
ENOB
Spurious free
dynamic range
• Gain=1
85
53
105
88
—
—
dB
dB
16-bit
differential
mode,
Average=32,
fin=100Hz
• Gain=64
Effective number
of bits
• Gain=1, Average=4
11.6
7.2
13.4
9.6
—
—
—
—
—
—
—
—
—
bits
bits
bits
bits
bits
bits
bits
bits
bits
16-bit
differential
mode,fin=100H
z
• Gain=64, Average=4
• Gain=1, Average=32
• Gain=2, Average=32
• Gain=4, Average=32
• Gain=8, Average=32
• Gain=16, Average=32
• Gain=32, Average=32
• Gain=64, Average=32
12.8
11.0
7.9
14.5
14.3
13.8
13.1
12.5
11.5
10.6
7.3
6.8
6.8
7.5
SINAD
Signal-to-noise
plus distortion
ratio
See ENOB
6.02 × ENOB + 1.76
dB
1. Typical values assume VDDA =3.0V, Temp=25°C, fADCK=6MHz unless otherwise stated.
2. This current is a PGA module adder, in addition to ADC conversion currents.
3. Between IN+ and IN-. The PGA draws a DC current from the input terminals. The magnitude of the DC current is a strong
function of input common mode voltage (VCM) and the PGA gain.
Gain = 2PGAG
4.
5. After changing the PGA gain setting, a minimum of 2 ADC+PGA conversions should be ignored.
6. Limit the input signal swing so that the PGA does not saturate during operation. Input signal swing is dependent on the
PGA reference voltage and gain setting.
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
45
Peripheral operating requirements and behaviors
6.6.2 CMP and 6-bit DAC electrical specifications
Table 27. Comparator and 6-bit DAC electrical specifications
Symbol
Description
Min.
Typ.
Max.
Unit
VDD
Supply voltage
1.71
—
3.6
V
IDDHS
IDDLS
VAIN
VAIO
VH
Supply current, High-speed mode (EN=1, PMODE=1)
Supply current, low-speed mode (EN=1, PMODE=0)
Analog input voltage
—
—
—
—
—
—
200
20
μA
μA
V
VSS – 0.3
—
VDD
20
Analog input offset voltage
mV
Analog comparator hysteresis1
• CR0[HYSTCTR] = 00
• CR0[HYSTCTR] = 01
• CR0[HYSTCTR] = 10
• CR0[HYSTCTR] = 11
—
—
—
—
5
—
—
—
—
mV
mV
mV
mV
10
20
30
VCMPOh
VCMPOl
tDHS
Output high
Output low
VDD – 0.5
—
—
50
—
0.5
200
V
V
—
Propagation delay, high-speed mode (EN=1,
PMODE=1)
20
ns
tDLS
Propagation delay, low-speed mode (EN=1,
PMODE=0)
80
250
600
ns
Analog comparator initialization delay2
6-bit DAC current adder (enabled)
6-bit DAC integral non-linearity
—
—
—
7
40
—
μs
IDAC6b
INL
μA
LSB3
LSB
–0.5
–0.3
—
—
0.5
0.3
DNL
6-bit DAC differential non-linearity
1. Typical hysteresis is measured with input voltage range limited to 0.6 to VDD-0.6V.
2. Comparator initialization delay is defined as the time between software writes to change control inputs (Writes to DACEN,
VRSEL, PSEL, MSEL, VOSEL) and the comparator output settling to a stable level.
3. 1 LSB = Vreference/64
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
46
Freescale Semiconductor, Inc.
Peripheral operating requirements and behaviors
0.08
0.07
0.06
0.05
0.04
0.03
0.02
0.01
0
HYSTCTR
Setting
00
01
10
11
0.1
0.4
0.7
1
1.3
1.6
1.9
2.2
2.5
2.8
3.1
Vinlevel (V)
Figure 15. Typical hysteresis vs. Vin level (VDD=3.3V, PMODE=0)
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
47
Peripheral operating requirements and behaviors
0.18
0.16
0.14
0.12
0.1
HYSTCTR
Setting
00
01
10
11
0.08
0.06
0.04
0.02
0
0.1
0.4
0.7
1
1.3
1.6
1.9
2.2
2.5
2.8
3.1
Vinlevel (V)
Figure 16. Typical hysteresis vs. Vin level (VDD=3.3V, PMODE=1)
6.6.3 12-bit DAC electrical characteristics
6.6.3.1 12-bit DAC operating requirements
Table 28. 12-bit DAC operating requirements
Symbol
Desciption
Min.
Max.
Unit
Notes
VDDA
Supply voltage
1.71
3.6
V
VDACR
TA
Reference voltage
Temperature
1.13
−40
—
3.6
105
100
1
V
1
°C
pF
mA
CL
Output load capacitance
Output load current
2
IL
—
1. The DAC reference can be selected to be VDDA or the voltage output of the VREF module (VREF_OUT)
2. A small load capacitance (47 pF) can improve the bandwidth performance of the DAC
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
48
Freescale Semiconductor, Inc.
Peripheral operating requirements and behaviors
6.6.3.2 12-bit DAC operating behaviors
Table 29. 12-bit DAC operating behaviors
Symbol Description
Min.
Typ.
Max.
150
Unit
Notes
IDDA_DACL Supply current — low-power mode
—
—
μA
P
IDDA_DAC Supply current — high-speed mode
—
—
700
μA
HP
tDACLP
Full-scale settling time (0x080 to 0xF7F) —
low-power mode
—
—
—
100
15
200
30
1
μs
μs
μs
1
1
1
tDACHP Full-scale settling time (0x080 to 0xF7F) —
high-power mode
tCCDACLP Code-to-code settling time (0xBF8 to
0xC08) — low-power mode and high-speed
mode
0.7
Vdacoutl DAC output voltage range low — high-
speed mode, no load, DAC set to 0x000
—
—
—
—
—
—
100
mV
mV
Vdacouth DAC output voltage range high — high-
speed mode, no load, DAC set to 0xFFF
VDACR
−100
VDACR
INL
DNL
DNL
Integral non-linearity error — high speed
mode
—
—
—
8
1
1
LSB
LSB
LSB
2
3
4
Differential non-linearity error — VDACR > 2
V
Differential non-linearity error — VDACR
VREF_OUT
=
VOFFSET Offset error
—
—
60
—
—
—
0.4
0.1
0.8
0.6
90
%FSR
%FSR
dB
5
5
EG
PSRR
TCO
TGE
Gain error
Power supply rejection ratio, VDDA > = 2.4 V
Temperature coefficient offset voltage
Temperature coefficient gain error
Output resistance load = 3 kΩ
3.7
0.000421
—
—
μV/C
%FSR/C
Ω
6
—
Rop
SR
250
Slew rate -80h→ F7Fh→ 80h
V/μs
• High power (SPHP
• Low power (SPLP
)
1.2
1.7
—
—
0.05
0.12
)
CT
Channel to channel cross talk
3dB bandwidth
—
—
-80
dB
BW
kHz
• High power (SPHP
• Low power (SPLP
)
550
40
—
—
—
—
)
1. Settling within 1 LSB
2. The INL is measured for 0+100mV to VDACR−100 mV
3. The DNL is measured for 0+100 mV to VDACR−100 mV
4. The DNL is measured for 0+100mV to VDACR−100 mV with VDDA > 2.4V
5. Calculated by a best fit curve from VSS+100 mV to VDACR−100 mV
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
49
Peripheral operating requirements and behaviors
6. VDDA = 3.0V, reference select set for VDDA (DACx_CO:DACRFS = 1), high power mode(DACx_C0:LPEN = 0), DAC set
to 0x800, Temp range from -40C to 105C
Figure 17. Typical INL error vs. digital code
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
50
Freescale Semiconductor, Inc.
Peripheral operating requirements and behaviors
Figure 18. Offset at half scale vs. temperature
6.6.4 Op-amp electrical specifications
Table 30. Op-amp electrical specifications
Symbol
Description
Min.
Typ.
Max.
Unit
VDD
Operating voltage
1.71
—
3.6
V
ISUPPLY
ISUPPLY
VOS
Supply current (IOUT=0mA, CL=0), low-power mode
Supply current (IOUT=0mA, CL=0), high-speed mode
Input offset voltage
—
—
—
—
—
106
545
3
125
630
10
μA
μA
mV
μV/C
pA
αVOS
IOS
Input offset voltage temperature coefficient
10
—
Typical input offset current across the following temp
range (0–50°C)
500
—
IOS
Typical input offset current across the following temp
range (-40–105°C)
—
4
—
nA
Table continues on the next page...
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
51
Peripheral operating requirements and behaviors
Table 30. Op-amp electrical specifications (continued)
Symbol
Description
Min.
Typ.
Max.
Unit
IBIAS
Typical input bias current across the following temp
range (0–50°C)
—
500
—
pA
IBIAS
Typical input bias current across the following temp
range (-40–105°C)
—
4
—
nA
VCML
VCMH
RIN
Input common mode voltage low
Input common mode voltage high
Input resistance
0
—
—
—
—
V
V
VDD
—
500
—
MΩ
pF
171
50
—
CIN
Input capacitance
—
—
|XIN|
AC input impedance (fIN=100kHz)
Input common mode rejection ratio
Power supply rejection ratio
Slew rate (ΔVIN=500mV), low-power mode
Slew rate (ΔVIN=500mV), high-speed mode
Unity gain bandwidth, low-power mode
Unity gain bandwidth, high-speed mode
DC open-loop voltage gain
—
—
MΩ
dB
CMRR
PSRR
SR
60
60
0.1
1.5
0.15
1
—
—
—
dB
—
—
V/μs
V/μs
MHz
MHz
dB
SR
4
—
GBW
GBW
AV
—
—
—
—
80
—
90
100
1500
—
—
CL(max)
ROUT
VOUT
IOUT
Load capacitance driving capability
Output resistance @ 100 kHz, high speed mode
Output voltage range
—
pF
—
—
Ω
0.12
—
VDD - 0.12
V
Output load current
0.5
20
56
5.7
—
—
—
—
mA
dB
GM
Gain margin
—
PM
Phase margin
45
—
deg
μs
Settling time2 (Buffer mode, low-power mode)
(To<0.1%, Vin=1.65V)
Tsettle
Settling time2 (Buffer mode, high-speed mode)
(To<0.1%, Vin=1.65V)
Tsettle
—
3.0
—
μs
Vn
Vn
Voltage noise density (noise floor) 1kHz
Voltage noise density (noise floor) 10kHz
—
—
350
90
—
—
nV/√Hz
nV/√Hz
1. The input capacitance is dependant on the package type used.
2. Settling time is measured from the time the Op-amp is enabled until the output settles to within 0.1% of final value. This
time includes Op-amp startup time, output slew, and settle time.
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
52
Freescale Semiconductor, Inc.
Peripheral operating requirements and behaviors
6.6.5 Transimpedance amplifier electrical specifications — full range
Table 31. TRIAMP full range operating requirements
Symbol
VDDA
Description
Min.
Max.
Unit
Notes
Supply voltage
1.71
-0.1
—
3.6
V
V
pf
VIN
CL
Input voltage range
VDDA-1.4
100
Output load capacitance
Table 32. TRIAMP full range operating behaviors
Symbol Description
Min.
Typ.
Max.
Unit
Notes
ISUPPLY
Supply current (IOUT=0mA, CL=0) — Low-power
mode
—
60
80
μA
ISUPPLY
Supply current (IOUT=0mA, CL=0) — High-speed —
mode
280
450
μA
VOS
αVOS
IOS
Input offset voltage
—
—
—
—
3
4.8
0.3
0.3
—
5
—
5
mV
Input offset voltage temperature coefficient
Input offset current
μV/C
nA
IBIAS
RIN
Input bias current
5
nA
Input resistance
500
—
—
—
1500
MΩ
pF
CIN
Input capacitance
17
—
ROUT
Output AC impedance
—
Ω
@
100kHz,
High
speed
mode
|XIN|
CMRR
PSRR
SR
AC input impedance (fIN=100kHz)
—
60
60
0.1
1
159
—
—
kΩ
Input common mode rejection ratio
Power supply rejection ratio
—
dB
—
—
dB
Slew rate (ΔVIN=100mV) — Low-power mode
Slew rate (ΔVIN=100mV) — High speed mode
—
—
V/μs
V/μs
MHz
MHz
dB
SR
—
—
GBW
GBW
AV
Unity gain bandwidth — Low-power mode 50pF 0.15
—
—
Unity gain bandwidth — High speed mode 50pF
DC open-loop voltage gain
Output voltage range
1
—
—
80
0.15
—
—
50
—
—
—
—
VOUT
IOUT
GM
—
VDD-0.15
—
V
Output load current
0.5
20
60
280
100
mA
Gain margin
—
dB
PM
Phase margin
—
deg
nV/√Hz
nV/√Hz
Vn
Voltage noise density (noise floor) 1kHz
Voltage noise density (noise floor) 10kHz
—
Vn
—
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
53
Peripheral operating requirements and behaviors
6.6.6 Transimpedance amplifier electrical specifications — limited
range
Table 33. TRIAMP limited range operating requirements
Symbol
VDDA
Description
Min.
Max.
Unit
Notes
Supply voltage
2.4
0.1
0
3.3
V
V
C
pf
VIN
TA
Input voltage range
Temperature
VDDA-1.4
50
CL
Output load capacitance
—
100
Table 34. TRIAMP limited range operating behaviors
Symbol Description
Min.
Typ.
Max.
Unit
Notes
VOS
αVOS
IOS
Input offset voltage
—
—
—
—
—
3
5
mV
Input offset voltage temperature coefficient
Input offset current
4.8
—
μV/C
pA
300
300
600
600
IBIAS
ROUT
Input bias current
pA
Output AC impedance
—
1500
Ω
@
100kHz,
High
speed
mode
|XIN|
CMRR
PSRR
SR
AC input impedance (fIN=100kHz)
—
159
70
70
—
—
—
—
—
—
—
—
—
—
—
kΩ
Input common mode rejection ratio
Power supply rejection ratio
—
dB
—
dB
Slew rate (ΔVIN=500mV) — Low-power mode
Slew rate (ΔVIN=500mV) — High speed mode
0.1
1.5
V/μs
V/μs
MHz
MHz
dB
SR
3.5
—
GBW
GBW
AV
Unity gain bandwidth — Low-power mode 50pF 0.15
Unity gain bandwidth — High speed mode 50pF
DC open-loop voltage gain
Gain margin
1
—
80
—
60
—
GM
20
69
dB
PM
Phase margin
deg
6.6.7 Voltage reference electrical specifications
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
54
Freescale Semiconductor, Inc.
Peripheral operating requirements and behaviors
Table 35. VREF full-range operating requirements
Symbol
Description
Min.
1.71
−40
Max.
3.6
105
Unit
Notes
VDDA
Supply voltage
V
TA
CL
Temperature
°C
nF
Output load capacitance
100
1, 2
1. CL must be connected to VREF_OUT if the VREF_OUT functionality is being used for either an internal or external
reference.
2. The load capacitance should not exceed +/-25% of the nominal specified CL value over the operating temperature range of
the device.
Table 36. VREF full-range operating behaviors
Symbol Description
Min.
Typ.
Max.
Unit
Notes
Vout
Voltage reference output with factory trim at
1.1915
1.195
1.1977
V
nominal VDDA and temperature=25C
Voltage reference output — factory trim
Voltage reference output — user trim
Voltage reference trim step
Vout
Vout
1.1584
1.193
—
—
—
1.2376
1.197
—
V
V
Vstep
Vtdrift
0.5
—
mV
mV
Temperature drift (Vmax -Vmin across the full
temperature range)
—
80
Ibg
Ilp
Bandgap only current
—
—
—
—
—
—
80
360
1
µA
uA
mA
µV
1
1
Low-power buffer current
High-power buffer current
Ihp
1
ΔVLOAD Load regulation
• current = 1.0 mA
1, 2
—
200
—
Tstup
Buffer startup time
—
—
—
2
20
—
µs
Vvdrift
Voltage drift (Vmax - Vmin across the full voltage
range)
mV
1
1. See the chip's Reference Manual for the appropriate settings of the VREF Status and Control register.
2. Load regulation voltage is the difference between the VREF_OUT voltage with no load vs. voltage with defined load
Table 37. VREF limited-range operating requirements
Symbol
Description
Min.
Max.
Unit
Notes
Notes
TA
Temperature
0
50
°C
Table 38. VREF limited-range operating behaviors
Symbol
Description
Min.
Max.
Unit
Vout
Voltage reference output with factory trim
1.173
1.225
V
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
55
Peripheral operating requirements and behaviors
Symbol
VREFH
Description
Min
Max
Unit
Notes
Voltage reference 1.173
output with factory
trim
1.225
V
VREFL
Voltage reference 0.38
output
0.42
4.5µ
V
A
IBIASP_AFE_4µA P-bias current
output
3.5µ
6.7 Timers
See General switching specifications.
6.8 Communication interfaces
6.8.1 USB electrical specifications
The USB electricals for the USB On-the-Go module conform to the standards
documented by the Universal Serial Bus Implementers Forum. For the most up-to-date
standards, visit http://www.usb.org.
6.8.2 USB DCD electrical specifications
Table 40. USB DCD electrical specifications
Symbol
Description
Min.
Typ.
Max.
Unit
VDP_SRC
USB_DP source voltage (up to 250 μA)
0.5
—
0.7
V
VLGC
Threshold voltage for logic high
USB_DP source current
USB_DM sink current
0.8
7
—
10
2.0
13
V
IDP_SRC
IDM_SINK
μA
μA
kΩ
V
50
100
—
150
24.8
0.4
RDM_DWN D- pulldown resistance for data pin contact detect
VDAT_REF Data detect voltage
14.25
0.25
0.33
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
56
Freescale Semiconductor, Inc.
Peripheral operating requirements and behaviors
6.8.3 USB VREG electrical specifications
Table 41. USB VREG electrical specifications
Typ.1
—
Symbol Description
Min.
Max.
Unit
V
Notes
VREGIN Input supply voltage
2.7
—
5.5
IDDon
IDDstby
IDDoff
Quiescent current — Run mode, load current
equal zero, input supply (VREGIN) > 3.6 V
120
186
μA
Quiescent current — Standby mode, load
current equal zero
—
1.1
1.54
μA
Quiescent current — Shutdown mode
• VREGIN = 5.0 V and temperature=25C
• Across operating voltage and temperature
—
—
650
—
—
4
nA
μA
ILOADrun Maximum load current — Run mode
ILOADstby Maximum load current — Standby mode
—
—
—
—
120
1
mA
mA
VReg33out Regulator output voltage — Input supply
(VREGIN) > 3.6 V
• Run mode
3
3.3
2.8
—
3.6
3.6
3.6
V
V
V
• Standby mode
2.1
2.1
VReg33out Regulator output voltage — Input supply
(VREGIN) < 3.6 V, pass-through mode
2
COUT
ESR
External output capacitor
1.76
1
2.2
—
8.16
100
μF
External output capacitor equivalent series
resistance
mΩ
ILIM
Short circuit current
—
290
—
mA
1. Typical values assume VREGIN = 5.0 V, Temp = 25 °C unless otherwise stated.
2. Operating in pass-through mode: regulator output voltage equal to the input voltage minus a drop proportional to ILoad
.
6.8.4 DSPI switching specifications (limited voltage range)
The DMA Serial Peripheral Interface (DSPI) provides a synchronous serial bus with
master and slave operations. Many of the transfer attributes are programmable. The tables
below provide DSPI timing characteristics for classic SPI timing modes. Refer to the
DSPI chapter of the Reference Manual for information on the modified transfer formats
used for communicating with slower peripheral devices.
Table 42. Master mode DSPI timing (limited voltage range)
Num
Description
Min.
2.7
—
Max.
3.6
Unit
V
Notes
Operating voltage
Frequency of operation
25
MHz
Table continues on the next page...
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
57
Peripheral operating requirements and behaviors
Table 42. Master mode DSPI timing (limited voltage range) (continued)
Num
Description
DSPI_SCK output cycle time
Min.
Max.
Unit
Notes
DS1
2 x tBUS
—
ns
DS2
DS3
DSPI_SCK output high/low time
(tSCK/2) − 2 (tSCK/2) + 2
ns
ns
DSPI_PCSn valid to DSPI_SCK delay
(tBUS x 2) −
2
—
1
2
DS4
DSPI_SCK to DSPI_PCSn invalid delay
(tBUS x 2) −
2
—
ns
DS5
DS6
DS7
DS8
DSPI_SCK to DSPI_SOUT valid
DSPI_SCK to DSPI_SOUT invalid
DSPI_SIN to DSPI_SCK input setup
DSPI_SCK to DSPI_SIN input hold
—
−2
15
0
8.5
—
—
—
ns
ns
ns
ns
1. The delay is programmable in SPIx_CTARn[PSSCK] and SPIx_CTARn[CSSCK].
2. The delay is programmable in SPIx_CTARn[PASC] and SPIx_CTARn[ASC].
DSPI_PCSn
DS1
DS3
DS2
DS4
DSPI_SCK
(CPOL=0)
DS8
DS7
Data
Last data
First data
DSPI_SIN
DS5
DS6
First data
Data
Last data
DSPI_SOUT
Figure 19. DSPI classic SPI timing — master mode
Table 43. Slave mode DSPI timing (limited voltage range)
Num
Description
Min.
Max.
3.6
Unit
V
Operating voltage
2.7
Frequency of operation
12.5
—
MHz
ns
DS9
DSPI_SCK input cycle time
4 x tBUS
DS10
DS11
DS12
DS13
DS14
DS15
DS16
DSPI_SCK input high/low time
(tSCK/2) − 2
(tSCK/2) + 2
ns
ns
ns
ns
ns
ns
ns
DSPI_SCK to DSPI_SOUT valid
DSPI_SCK to DSPI_SOUT invalid
DSPI_SIN to DSPI_SCK input setup
DSPI_SCK to DSPI_SIN input hold
DSPI_SS active to DSPI_SOUT driven
DSPI_SS inactive to DSPI_SOUT not driven
—
0
10
—
—
—
14
14
2
7
—
—
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
58
Freescale Semiconductor, Inc.
Peripheral operating requirements and behaviors
DSPI_SS
DS10
DS9
DSPI_SCK
(CPOL=0)
DS15
DS12
DS16
DS11
First data
DS14
Last data
Last data
DSPI_SOUT
Data
Data
DS13
First data
DSPI_SIN
Figure 20. DSPI classic SPI timing — slave mode
6.8.5 DSPI switching specifications (full voltage range)
The DMA Serial Peripheral Interface (DSPI) provides a synchronous serial bus with
master and slave operations. Many of the transfer attributes are programmable. The tables
below provides DSPI timing characteristics for classic SPI timing modes. Refer to the
DSPI chapter of the Reference Manual for information on the modified transfer formats
used for communicating with slower peripheral devices.
Table 44. Master mode DSPI timing (full voltage range)
Num
Description
Min.
1.71
Max.
3.6
Unit
V
Notes
Operating voltage
1
Frequency of operation
—
12.5
—
MHz
ns
DS1
DS2
DS3
DSPI_SCK output cycle time
DSPI_SCK output high/low time
DSPI_PCSn valid to DSPI_SCK delay
4 x tBUS
(tSCK/2) - 4 (tSCK/2) + 4
ns
ns
(tBUS x 2) −
4
—
2
3
DS4
DSPI_SCK to DSPI_PCSn invalid delay
(tBUS x 2) −
4
—
ns
DS5
DS6
DS7
DS8
DSPI_SCK to DSPI_SOUT valid
DSPI_SCK to DSPI_SOUT invalid
DSPI_SIN to DSPI_SCK input setup
DSPI_SCK to DSPI_SIN input hold
—
-4.5
20.5
0
10
—
—
—
ns
ns
ns
ns
1. The DSPI module can operate across the entire operating voltage for the processor, but to run across the full voltage
range the maximum frequency of operation is reduced.
2. The delay is programmable in SPIx_CTARn[PSSCK] and SPIx_CTARn[CSSCK].
3. The delay is programmable in SPIx_CTARn[PASC] and SPIx_CTARn[ASC].
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
59
Peripheral operating requirements and behaviors
DSPI_PCSn
DS1
DS3
DS2
DS4
DSPI_SCK
DS8
DS7
(CPOL=0)
Data
Last data
First data
DSPI_SIN
DS5
DS6
First data
Data
Last data
DSPI_SOUT
Figure 21. DSPI classic SPI timing — master mode
Table 45. Slave mode DSPI timing (full voltage range)
Num
Description
Min.
1.71
Max.
3.6
Unit
V
Operating voltage
Frequency of operation
—
6.25
—
MHz
ns
DS9
DSPI_SCK input cycle time
8 x tBUS
DS10
DS11
DS12
DS13
DS14
DS15
DS16
DSPI_SCK input high/low time
(tSCK/2) - 4
(tSCK/2) + 4
ns
ns
ns
ns
ns
ns
ns
DSPI_SCK to DSPI_SOUT valid
DSPI_SCK to DSPI_SOUT invalid
DSPI_SIN to DSPI_SCK input setup
DSPI_SCK to DSPI_SIN input hold
DSPI_SS active to DSPI_SOUT driven
DSPI_SS inactive to DSPI_SOUT not driven
—
0
20
—
—
—
19
19
2
7
—
—
DSPI_SS
DS10
DS9
DSPI_SCK
(CPOL=0)
DS15
DS12
DS16
DS11
First data
DS14
Last data
DSPI_SOUT
Data
Data
DS13
First data
Last data
DSPI_SIN
Figure 22. DSPI classic SPI timing — slave mode
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
60
Freescale Semiconductor, Inc.
Peripheral operating requirements and behaviors
I2C switching specifications
6.8.6
See General switching specifications.
6.8.7 UART switching specifications
See General switching specifications.
6.8.8 I2S/SAI Switching Specifications
This section provides the AC timing for the I2S/SAI module in master mode (clocks are
driven) and slave mode (clocks are input). All timing is given for noninverted serial clock
polarity (TCR2[BCP] is 0, RCR2[BCP] is 0) and a noninverted frame sync (TCR4[FSP]
is 0, RCR4[FSP] is 0). If the polarity of the clock and/or the frame sync have been
inverted, all the timing remains valid by inverting the bit clock signal (BCLK) and/or the
frame sync (FS) signal shown in the following figures.
6.8.8.1 Normal Run, Wait and Stop mode performance over the full
operating voltage range
This section provides the operating performance over the full operating voltage for the
device in Normal Run, Wait and Stop modes.
Table 46. I2S/SAI master mode timing in Normal Run, Wait and Stop modes
(full voltage range)
Num.
Characteristic
Min.
Max.
Unit
Operating voltage
1.71
40
3.6
—
V
S1
S2
S3
S4
S5
I2S_MCLK cycle time
ns
I2S_MCLK pulse width high/low
45%
80
55%
—
MCLK period
I2S_TX_BCLK/I2S_RX_BCLK cycle time (output)
I2S_TX_BCLK/I2S_RX_BCLK pulse width high/low
ns
45%
—
55%
15
BCLK period
ns
I2S_TX_BCLK/I2S_RX_BCLK to I2S_TX_FS/
I2S_RX_FS output valid
S6
I2S_TX_BCLK/I2S_RX_BCLK to I2S_TX_FS/
I2S_RX_FS output invalid
-1.0
—
ns
S7
S8
S9
I2S_TX_BCLK to I2S_TXD valid
I2S_TX_BCLK to I2S_TXD invalid
—
15
—
—
ns
ns
ns
0
I2S_RXD/I2S_RX_FS input setup before
I2S_RX_BCLK
20.5
S10
I2S_RXD/I2S_RX_FS input hold after I2S_RX_BCLK
0
—
ns
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
61
Peripheral operating requirements and behaviors
S1
S2
S2
I2S_MCLK (output)
S3
S4
I2S_TX_BCLK/
I2S_RX_BCLK (output)
S4
S5
S6
I2S_TX_FS/
I2S_RX_FS (output)
S10
S9
I2S_TX_FS/
I2S_RX_FS (input)
S7
S8
S7
S8
I2S_TXD
I2S_RXD
S9
S10
Figure 23. I2S/SAI timing — master modes
Table 47. I2S/SAI slave mode timing in Normal Run, Wait and Stop modes
(full voltage range)
Num.
Characteristic
Min.
Max.
Unit
Operating voltage
1.71
80
3.6
—
V
S11
I2S_TX_BCLK/I2S_RX_BCLK cycle time (input)
ns
S12
S13
S14
I2S_TX_BCLK/I2S_RX_BCLK pulse width high/low
(input)
45%
5.8
2
55%
MCLK period
I2S_TX_FS/I2S_RX_FS input setup before
I2S_TX_BCLK/I2S_RX_BCLK
—
ns
ns
I2S_TX_FS/I2S_RX_FS input hold after
I2S_TX_BCLK/I2S_RX_BCLK
—
S15
S16
S17
S18
S19
I2S_TX_BCLK to I2S_TXD/I2S_TX_FS output valid
I2S_TX_BCLK to I2S_TXD/I2S_TX_FS output invalid
I2S_RXD setup before I2S_RX_BCLK
—
0
20.6
—
ns
ns
ns
ns
ns
5.8
2
—
I2S_RXD hold after I2S_RX_BCLK
—
I2S_TX_FS input assertion to I2S_TXD output valid1
—
25
1. Applies to first bit in each frame and only if the TCR4[FSE] bit is clear
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
62
Freescale Semiconductor, Inc.
Peripheral operating requirements and behaviors
S11
S12
I2S_TX_BCLK/
S12
I2S_RX_BCLK (input)
S15
S16
I2S_TX_FS/
I2S_RX_FS (output)
S13
S19
S14
I2S_TX_FS/
I2S_RX_FS (input)
S15
S16
S15
S16
I2S_TXD
I2S_RXD
S17
S18
Figure 24. I2S/SAI timing — slave modes
6.8.8.2 VLPR, VLPW, and VLPS mode performance over the full operating
voltage range
This section provides the operating performance over the full operating voltage for the
device in VLPR, VLPW, and VLPS modes.
Table 48. I2S/SAI master mode timing in VLPR, VLPW, and VLPS modes
(full voltage range)
Num.
Characteristic
Min.
Max.
Unit
Operating voltage
1.71
62.5
3.6
—
V
S1
S2
S3
S4
S5
I2S_MCLK cycle time
ns
I2S_MCLK pulse width high/low
45%
250
45%
—
55%
—
MCLK period
I2S_TX_BCLK/I2S_RX_BCLK cycle time (output)
I2S_TX_BCLK/I2S_RX_BCLK pulse width high/low
ns
55%
45
BCLK period
ns
I2S_TX_BCLK/I2S_RX_BCLK to I2S_TX_FS/
I2S_RX_FS output valid
S6
I2S_TX_BCLK/I2S_RX_BCLK to I2S_TX_FS/
I2S_RX_FS output invalid
0
—
ns
S7
S8
S9
I2S_TX_BCLK to I2S_TXD valid
I2S_TX_BCLK to I2S_TXD invalid
—
0
45
—
—
ns
ns
ns
I2S_RXD/I2S_RX_FS input setup before
I2S_RX_BCLK
53
S10
I2S_RXD/I2S_RX_FS input hold after I2S_RX_BCLK
0
—
ns
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
63
Peripheral operating requirements and behaviors
S1
S2
S2
I2S_MCLK (output)
S3
S4
I2S_TX_BCLK/
I2S_RX_BCLK (output)
S4
S5
S6
I2S_TX_FS/
I2S_RX_FS (output)
S10
S9
I2S_TX_FS/
I2S_RX_FS (input)
S7
S8
S7
S8
I2S_TXD
I2S_RXD
S9
S10
Figure 25. I2S/SAI timing — master modes
Table 49. I2S/SAI slave mode timing in VLPR, VLPW, and VLPS modes (full
voltage range)
Num.
Characteristic
Min.
Max.
Unit
Operating voltage
1.71
250
3.6
—
V
S11
I2S_TX_BCLK/I2S_RX_BCLK cycle time (input)
ns
S12
S13
S14
I2S_TX_BCLK/I2S_RX_BCLK pulse width high/low
(input)
45%
55%
MCLK period
I2S_TX_FS/I2S_RX_FS input setup before
I2S_TX_BCLK/I2S_RX_BCLK
30
—
ns
ns
I2S_TX_FS/I2S_RX_FS input hold after
I2S_TX_BCLK/I2S_RX_BCLK
7.6
—
S15
S16
S17
S18
S19
I2S_TX_BCLK to I2S_TXD/I2S_TX_FS output valid
I2S_TX_BCLK to I2S_TXD/I2S_TX_FS output invalid
I2S_RXD setup before I2S_RX_BCLK
—
0
67
—
—
—
72
ns
ns
ns
ns
ns
30
6.5
—
I2S_RXD hold after I2S_RX_BCLK
I2S_TX_FS input assertion to I2S_TXD output valid1
1. Applies to first bit in each frame and only if the TCR4[FSE] bit is clear
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
64
Freescale Semiconductor, Inc.
Peripheral operating requirements and behaviors
S11
S12
I2S_TX_BCLK/
S12
I2S_RX_BCLK (input)
S15
S16
I2S_TX_FS/
I2S_RX_FS (output)
S13
S19
S14
I2S_TX_FS/
I2S_RX_FS (input)
S15
S16
S15
S16
I2S_TXD
I2S_RXD
S17
S18
Figure 26. I2S/SAI timing — slave modes
6.9 Human-machine interfaces (HMI)
6.9.1 TSI electrical specifications
Table 50. TSI electrical specifications
Symbol Description
VDDTSI Operating voltage
CELE
Min.
Typ.
Max.
Unit
Notes
1.71
—
3.6
V
Target electrode capacitance range
Reference oscillator frequency
Electrode oscillator frequency
Internal reference capacitor
Oscillator delta voltage
1
20
8
500
15
pF
MHz
MHz
pF
1
fREFmax
fELEmax
CREF
—
—
—
—
2, 3
2, 4
1
1.8
—
1
VDELTA
IREF
500
—
mV
μA
2, 5
2, 6
Reference oscillator current source base current
• 2 μA setting (REFCHRG = 0)
—
—
2
3
36
50
• 32 μA setting (REFCHRG = 15)
IELE
Electrode oscillator current source base current
• 2 μA setting (EXTCHRG = 0)
μA
2, 7
—
—
2
3
36
50
• 32 μA setting (EXTCHRG = 15)
Pres5
Electrode capacitance measurement precision
Electrode capacitance measurement precision
—
8.3333
8.3333
8.3333
12.5
38400
38400
38400
—
fF/count
fF/count
fF/count
fF/count
bits
8
9
Pres20
—
Pres100 Electrode capacitance measurement precision
MaxSens Maximum sensitivity
—
10
11
0.003
—
Res
Resolution
—
16
Table continues on the next page...
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
65
Peripheral operating requirements and behaviors
Table 50. TSI electrical specifications (continued)
Symbol Description
Min.
Typ.
Max.
Unit
Notes
TCon20
Response time @ 20 pF
8
15
25
μs
12
ITSI_RUN Current added in run mode
—
—
55
—
μA
μA
ITSI_LP
Low power mode current adder
1.3
2.5
13
1. The TSI module is functional with capacitance values outside this range. However, optimal performance is not guaranteed.
2. Fixed external capacitance of 20 pF.
3. REFCHRG = 2, EXTCHRG=0.
4. REFCHRG = 0, EXTCHRG = 10.
5. VDD = 3.0 V.
6. The programmable current source value is generated by multiplying the SCANC[REFCHRG] value and the base current.
7. The programmable current source value is generated by multiplying the SCANC[EXTCHRG] value and the base current.
8. Measured with a 5 pF electrode, reference oscillator frequency of 10 MHz, PS = 128, NSCN = 8; Iext = 16.
9. Measured with a 20 pF electrode, reference oscillator frequency of 10 MHz, PS = 128, NSCN = 2; Iext = 16.
10. Measured with a 20 pF electrode, reference oscillator frequency of 10 MHz, PS = 16, NSCN = 3; Iext = 16.
11. Sensitivity defines the minimum capacitance change when a single count from the TSI module changes, it is equal to (Cref
* Iext)/( Iref * PS * NSCN). Sensitivity depends on the configuration used. The typical value listed is based on the following
configuration: Iext = 6 μA (EXTCHRG = 2), PS = 128, NSCN = 2, Iref = 16 μA (REFCHRG = 7), Cref = 1.0 pF. The
minimum sensitivity describes the smallest possible capacitance that can be measured by a single count (this is the best
sensitivity but is described as a minimum because it’s the smallest number). The minimum sensitivity parameter is based
on the following configuration: Iext = 2 μA (EXTCHRG = 0), PS = 128, NSCN = 32, Iref = 32 μA (REFCHRG = 15).
12. Time to do one complete measurement of the electrode. Sensitivity resolution of 0.0133 pF, PS = 0, NSCN = 0, 1
electrode, EXTCHRG = 7.
13. REFCHRG=0, EXTCHRG=4, PS=7, NSCN=0F, LPSCNITV=F, LPO is selected (1 kHz), and fixed external capacitance of
20 pF. Data is captured with an average of 7 periods window.
6.9.2 LCD electrical characteristics
Table 51. LCD electricals
Symbol Description
fFrame LCD frame frequency
CLCD
Min.
Typ.
Max.
Unit
Notes
28
30
58
Hz
LCD charge pump capacitance — nominal value
LCD bypass capacitance — nominal value
LCD glass capacitance
—
—
—
100
100
—
—
nF
nF
pF
1
1
2
3
CBYLCD
CGlass
VIREG
2000
8000
VIREG
—
—
—
1.11
1.01
0.91
—
—
—
V
V
V
• HREFSEL=0, RVTRIM=1111
• HREFSEL=0, RVTRIM=1000
• HREFSEL=0, RVTRIM=0000
—
—
—
1.84
1.69
1.54
—
—
—
V
V
V
• HREFSEL=1, RVTRIM=1111
• HREFSEL=1, RVTRIM=1000
• HREFSEL=1, RVTRIM=0000
ΔRTRIM
VIREG TRIM resolution
—
—
3.0
% VIREG
Table continues on the next page...
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
66
Freescale Semiconductor, Inc.
Dimensions
Notes
Table 51. LCD electricals (continued)
Symbol Description
Min.
Typ.
Max.
Unit
—
VIREG ripple
• HREFSEL = 0
—
—
—
—
30
50
mV
mV
• HREFSEL = 1
IVIREG
IRBIAS
VIREG current adder — RVEN = 1
RBIAS current adder
—
1
—
µA
4
—
—
10
1
—
—
µA
µA
• LADJ = 10 or 11 — High load (LCD glass
capacitance ≤ 8000 pF)
• LADJ = 00 or 01 — Low load (LCD glass
capacitance ≤ 2000 pF)
RRBIAS
RBIAS resistor values
• LADJ = 10 or 11 — High load (LCD glass
capacitance ≤ 8000 pF)
—
—
0.28
2.98
—
—
MΩ
MΩ
• LADJ = 00 or 01 — Low load (LCD glass
capacitance ≤ 2000 pF)
VLL2
VLL3
VLL2 voltage
• HREFSEL = 0
• HREFSEL = 1
2.0 − 5%
3.3 − 5%
2.0
3.3
—
—
V
V
VLL3 voltage
• HREFSEL = 0
• HREFSEL = 1
3.0 − 5%
5 − 5%
3.0
5
—
—
V
V
1. The actual value used could vary with tolerance.
2. For highest glass capacitance values, LCD_GCR[LADJ] should be configured as specified in the LCD Controller chapter
within the device's reference manual.
3. VIREG maximum should never be externally driven to any level other than VDD - 0.15 V
4. 2000 pF load LCD, 32 Hz frame frequency
7 Dimensions
7.1 Obtaining package dimensions
Package dimensions are provided in package drawings.
To find a package drawing, go to http://www.freescale.com and perform a keyword
search for the drawing’s document number:
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
67
Pinout
If you want the drawing for this package
Then use this document number
98ASS23174W
98ASA00344D
80-pin LQFP
81-pin MAPBGA
8 Pinout
8.1 K51 Signal Multiplexing and Pin Assignments
The following table shows the signals available on each pin and the locations of these
pins on the devices supported by this document. The Port Control Module is responsible
for selecting which ALT functionality is available on each pin.
81
80
Pin Name
Default
ALT0
ALT1
ALT2
ALT3
ALT4
ALT5
ALT6
ALT7
EzPort
MAP
BGA
LQFP
E7
F7
E6
G7
L6
—
—
1
VDD
VDD
VDD
VSS
VDD
VSS
VSS
VSS
VSS
VDD
VDD
2
VSS
VSS
—
3
VSS
VSS
F1
F2
G1
G2
H1
USB0_DP
USB0_DM
VOUT33
VREGIN
USB0_DP
USB0_DM
VOUT33
VREGIN
USB0_DP
USB0_DM
VOUT33
VREGIN
4
5
6
7
ADC0_DP1/
OP0_DP0
ADC0_DP1/
OP0_DP0
ADC0_DP1/
OP0_DP0
H2
J1
8
9
ADC0_DM1/
OP0_DM0
ADC0_DM1/
OP0_DM0
ADC0_DM1/
OP0_DM0
ADC1_DP1/
OP1_DP0/
OP1_DM1
ADC1_DP1/
OP1_DP0/
OP1_DM1
ADC1_DP1/
OP1_DP0/
OP1_DM1
J2
10
11
ADC1_DM1/
OP1_DM0
ADC1_DM1/
OP1_DM0
ADC1_DM1/
OP1_DM0
K1
PGA0_DP/
ADC0_DP0/
ADC1_DP3
PGA0_DP/
ADC0_DP0/
ADC1_DP3
PGA0_DP/
ADC0_DP0/
ADC1_DP3
K2
L1
12
13
PGA0_DM/
ADC0_DM0/
ADC1_DM3
PGA0_DM/
ADC0_DM0/
ADC1_DM3
PGA0_DM/
ADC0_DM0/
ADC1_DM3
PGA1_DP/
ADC1_DP0/
ADC0_DP3
PGA1_DP/
ADC1_DP0/
ADC0_DP3
PGA1_DP/
ADC1_DP0/
ADC0_DP3
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
68
Freescale Semiconductor, Inc.
Pinout
81
80
Pin Name
Default
ALT0
ALT1
ALT2
ALT3
ALT4
ALT5
ALT6
ALT7
EzPort
MAP
BGA
LQFP
L2
14
PGA1_DM/
ADC1_DM0/
ADC0_DM3
PGA1_DM/
ADC1_DM0/
ADC0_DM3
PGA1_DM/
ADC1_DM0/
ADC0_DM3
F5
G5
G6
F6
J3
15
16
17
18
19
VDDA
VREFH
VREFL
VSSA
VDDA
VREFH
VREFL
VSSA
VDDA
VREFH
VREFL
VSSA
ADC1_SE16/
OP1_OUT/
CMP2_IN2/
ADC0_SE22/
OP0_DP2/
OP1_DP2
ADC1_SE16/
OP1_OUT/
CMP2_IN2/
ADC0_SE22/
OP0_DP2/
OP1_DP2
ADC1_SE16/
OP1_OUT/
CMP2_IN2/
ADC0_SE22/
OP0_DP2/
OP1_DP2
H3
20
ADC0_SE16/
OP0_OUT/
CMP1_IN2/
ADC0_SE21/
OP0_DP1/
OP1_DP1
ADC0_SE16/
OP0_OUT/
CMP1_IN2/
ADC0_SE21/
OP0_DP1/
OP1_DP1
ADC0_SE16/
OP0_OUT/
CMP1_IN2/
ADC0_SE21/
OP0_DP1/
OP1_DP1
L3
K3
21
22
VREF_OUT/
CMP1_IN5/
CMP0_IN5/
ADC1_SE18
VREF_OUT/
CMP1_IN5/
CMP0_IN5/
ADC1_SE18
VREF_OUT/
CMP1_IN5/
CMP0_IN5/
ADC1_SE18
TRI0_OUT/
OP1_DM2
TRI0_OUT/
OP1_DM2
TRI0_OUT/
OP1_DM2
H4
J4
23
24
25
26
27
TRI0_DM
TRI0_DP
NC
TRI0_DM
TRI0_DP
NC
TRI0_DM
TRI0_DP
NC
H5
J5
NC
NC
NC
H6
CMP2_IN5/
ADC1_SE22
CMP2_IN5/
ADC1_SE22
CMP2_IN5/
ADC1_SE22
K5
K4
L7
28
29
—
DAC0_OUT/
CMP1_IN3/
ADC0_SE23/
OP0_DP4/
OP1_DP4
DAC0_OUT/
CMP1_IN3/
ADC0_SE23/
OP0_DP4/
OP1_DP4
DAC0_OUT/
CMP1_IN3/
ADC0_SE23/
OP0_DP4/
OP1_DP4
CMP0_IN4/
CMP2_IN3/
ADC1_SE23/
OP0_DP5/
OP1_DP5
CMP0_IN4/
CMP2_IN3/
ADC1_SE23/
OP0_DP5/
OP1_DP5
CMP0_IN4/
CMP2_IN3/
ADC1_SE23/
OP0_DP5/
OP1_DP5
RTC_
RTC_
RTC_
WAKEUP_B
WAKEUP_B
WAKEUP_B
L4
L5
K6
30
31
32
XTAL32
EXTAL32
VBAT
XTAL32
EXTAL32
VBAT
XTAL32
EXTAL32
VBAT
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
69
Pinout
81
80
Pin Name
Default
ALT0
ALT1
ALT2
ALT3
ALT4
ALT5
ALT6
ALT7
EzPort
MAP
BGA
LQFP
J6
33
PTA0
JTAG_TCLK/
SWD_CLK/
EZP_CLK
TSI0_CH1
PTA0
UART0_CTS_
b/
UART0_COL_
b
FTM0_CH5
JTAG_TCLK/
SWD_CLK
EZP_CLK
H8
J7
34
35
PTA1
PTA2
JTAG_TDI/
EZP_DI
TSI0_CH2
TSI0_CH3
PTA1
PTA2
UART0_RX
FTM0_CH6
FTM0_CH7
JTAG_TDI
EZP_DI
JTAG_TDO/
TRACE_SWO/
EZP_DO
UART0_TX
JTAG_TDO/
TRACE_SWO
EZP_DO
H9
J8
36
37
PTA3
JTAG_TMS/
SWD_DIO
TSI0_CH4
TSI0_CH5
PTA3
UART0_RTS_
b
FTM0_CH0
FTM0_CH1
JTAG_TMS/
SWD_DIO
PTA4/
NMI_b/
PTA4/
NMI_b
EZP_CS_b
LLWU_P3
EZP_CS_b
LLWU_P3
E5
G3
—
—
38
39
40
41
VDD
VDD
VDD
VSS
VSS
VSS
L10
K10
L11
K11
VDD
VDD
VDD
VSS
VSS
VSS
PTA18
PTA19
EXTAL0
XTAL0
EXTAL0
XTAL0
PTA18
PTA19
FTM0_FLT2
FTM1_FLT0
FTM_CLKIN0
FTM_CLKIN1
LPTMR0_
ALT1
J11
42
43
RESET_b
RESET_b
RESET_b
G11
PTB0/
LCD_P0/
LCD_P0/
PTB0/
LLWU_P5
I2C0_SCL
I2C0_SDA
FTM1_CH0
FTM1_CH1
FTM1_QD_
PHA
LCD_P0
LCD_P1
LLWU_P5
ADC0_SE8/
ADC1_SE8/
TSI0_CH0
ADC0_SE8/
ADC1_SE8/
TSI0_CH0
G10
44
PTB1
LCD_P1/
LCD_P1/
PTB1
FTM1_QD_
PHB
ADC0_SE9/
ADC1_SE9/
TSI0_CH6
ADC0_SE9/
ADC1_SE9/
TSI0_CH6
G9
G8
45
46
PTB2
PTB3
LCD_P2/
ADC0_SE12/
TSI0_CH7
LCD_P2/
ADC0_SE12/
TSI0_CH7
PTB2
PTB3
I2C0_SCL
I2C0_SDA
UART0_RTS_
b
FTM0_FLT3
FTM0_FLT0
LCD_P2
LCD_P3
LCD_P3/
LCD_P3/
UART0_CTS_
ADC0_SE13/
TSI0_CH8
ADC0_SE13/
TSI0_CH8
b/
UART0_COL_
b
D11
E10
D10
C10
B10
E9
47
48
49
50
51
52
PTB8
LCD_P8
LCD_P9
LCD_P8
LCD_P9
PTB8
UART3_RTS_
b
LCD_P8
LCD_P9
LCD_P10
LCD_P11
LCD_P12
LCD_P13
PTB9
PTB9
SPI1_PCS1
SPI1_PCS0
SPI1_SCK
SPI1_SOUT
SPI1_SIN
UART3_CTS_
b
PTB10
PTB11
PTB16
PTB17
LCD_P10/
ADC1_SE14
LCD_P10/
ADC1_SE14
PTB10
PTB11
PTB16
PTB17
UART3_RX
UART3_TX
UART0_RX
UART0_TX
FTM0_FLT1
FTM0_FLT2
EWM_IN
LCD_P11/
ADC1_SE15
LCD_P11/
ADC1_SE15
LCD_P12/
TSI0_CH9
LCD_P12/
TSI0_CH9
LCD_P13/
LCD_P13/
EWM_OUT_b
TSI0_CH10
TSI0_CH10
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
70
Freescale Semiconductor, Inc.
Pinout
81
80
Pin Name
Default
ALT0
ALT1
ALT2
ALT3
ALT4
ALT5
ALT6
ALT7
EzPort
MAP
BGA
LQFP
D9
C9
B9
53
54
55
PTB18
LCD_P14/
TSI0_CH11
LCD_P14/
TSI0_CH11
PTB18
FTM2_CH0
FTM2_CH1
PDB0_EXTRG
I2S0_TX_
BCLK
FTM2_QD_
PHA
LCD_P14
LCD_P15
LCD_P20
PTB19
PTC0
LCD_P15/
TSI0_CH12
LCD_P15/
TSI0_CH12
PTB19
PTC0
I2S0_TX_FS
FTM2_QD_
PHB
LCD_P20/
ADC0_SE14/
TSI0_CH13
LCD_P20/
ADC0_SE14/
TSI0_CH13
SPI0_PCS4
SPI0_PCS3
SPI0_PCS2
I2S0_TXD1
I2S0_TXD0
I2S0_TX_FS
D8
C8
56
57
PTC1/
LLWU_P6
LCD_P21/
ADC0_SE15/
TSI0_CH14
LCD_P21/
ADC0_SE15/
TSI0_CH14
PTC1/
LLWU_P6
UART1_RTS_
b
FTM0_CH0
FTM0_CH1
LCD_P21
LCD_P22
PTC2
LCD_P22/
LCD_P22/
PTC2
UART1_CTS_
b
ADC0_SE4b/
CMP1_IN0/
TSI0_CH15
ADC0_SE4b/
CMP1_IN0/
TSI0_CH15
B8
58
PTC3/
LLWU_P7
LCD_P23/
CMP1_IN1
LCD_P23/
CMP1_IN1
PTC3/
LLWU_P7
SPI0_PCS1
UART1_RX
FTM0_CH2
CLKOUT
I2S0_TX_
BCLK
LCD_P23
—
59
60
61
62
63
64
65
VSS
VSS
VSS
A11
A10
A9
VLL3
VLL3
VLL3
VLL2
VLL2
VLL2
VLL1
VLL1
VLL1
B11
C11
A8
VCAP2
VCAP1
VCAP2
VCAP1
LCD_P24
VCAP2
VCAP1
LCD_P24
PTC4/
PTC4/
LLWU_P8
SPI0_PCS0
SPI0_SCK
SPI0_SOUT
SPI0_SIN
UART1_TX
FTM0_CH3
I2S0_RXD0
CMP1_OUT
CMP0_OUT
I2S0_MCLK
LCD_P24
LCD_P25
LCD_P26
LCD_P27
LCD_P28
LLWU_P8
D7
C7
B7
A7
66
67
68
69
PTC5/
LLWU_P9
LCD_P25
LCD_P25
PTC5/
LLWU_P9
LPTMR0_
ALT2
PTC6/
LLWU_P10
LCD_P26/
CMP0_IN0
LCD_P26/
CMP0_IN0
PTC6/
LLWU_P10
PDB0_EXTRG I2S0_RX_
BCLK
PTC7
PTC8
LCD_P27/
CMP0_IN1
LCD_P27/
CMP0_IN1
PTC7
PTC8
USB_SOF_
OUT
I2S0_RX_FS
LCD_P28/
LCD_P28/
I2S0_MCLK
ADC1_SE4b/
CMP0_IN2
ADC1_SE4b/
CMP0_IN2
D6
70
PTC9
LCD_P29/
ADC1_SE5b/
CMP0_IN3
LCD_P29/
ADC1_SE5b/
CMP0_IN3
PTC9
I2S0_RX_
BCLK
FTM2_FLT0
LCD_P29
C6
C5
D4
D3
C3
B3
71
72
73
74
75
76
PTC10
LCD_P30/
ADC1_SE6b
LCD_P30/
ADC1_SE6b
PTC10
I2C1_SCL
I2C1_SDA
SPI0_PCS0
SPI0_SCK
SPI0_SOUT
SPI0_SIN
I2S0_RX_FS
I2S0_RXD1
LCD_P30
LCD_P31
LCD_P40
LCD_P41
LCD_P42
LCD_P43
PTC11/
LLWU_P11
LCD_P31/
ADC1_SE7b
LCD_P31/
ADC1_SE7b
PTC11/
LLWU_P11
PTD0/
LLWU_P12
LCD_P40
LCD_P40
PTD0/
LLWU_P12
UART2_RTS_
b
PTD1
LCD_P41/
ADC0_SE5b
LCD_P41/
ADC0_SE5b
PTD1
UART2_CTS_
b
PTD2/
LLWU_P13
LCD_P42
LCD_P43
LCD_P42
LCD_P43
PTD2/
LLWU_P13
UART2_RX
PTD3
PTD3
UART2_TX
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
71
Pinout
81
80
Pin Name
Default
ALT0
ALT1
ALT2
ALT3
ALT4
ALT5
ALT6
ALT7
EzPort
MAP
BGA
LQFP
A3
77
PTD4/
LLWU_P14
LCD_P44
LCD_P44
PTD4/
LLWU_P14
SPI0_PCS1
SPI0_PCS2
UART0_RTS_
b
FTM0_CH4
FTM0_CH5
EWM_IN
LCD_P44
LCD_P45
A2
78
PTD5
LCD_P45/
LCD_P45/
PTD5
UART0_CTS_
EWM_OUT_b
ADC0_SE6b
ADC0_SE6b
b/
UART0_COL_
b
B2
79
PTD6/
LLWU_P15
LCD_P46/
ADC0_SE7b
LCD_P46/
ADC0_SE7b
PTD6/
LLWU_P15
SPI0_PCS3
CMT_IRO
UART0_RX
FTM0_CH6
FTM0_CH7
FTM0_FLT0
FTM0_FLT1
LCD_P46
LCD_P47
A1
E4
E3
E2
F4
80
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
PTD7
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
LCD_P47
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
LCD_P47
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
PTD7
UART0_TX
H7
G4
F3
K7
J9
K8
L8
K9
L9
J10
H10
H11
F11
E11
F10
F9
F8
E8
B6
A6
A5
B5
B4
A4
B1
C2
C1
D2
D1
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
72
Freescale Semiconductor, Inc.
Pinout
81
80
Pin Name
Default
ALT0
ALT1
ALT2
ALT3
ALT4
ALT5
ALT6
ALT7
EzPort
MAP
BGA
LQFP
E1
D5
C4
—
—
—
NC
NC
NC
NC
NC
NC
NC
NC
NC
8.2 K51 Pinouts
The below figure shows the pinout diagram for the devices supported by this document.
Many signals may be multiplexed onto a single pin. To determine what signals can be
used on which pin, see the previous section.
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
73
Pinout
1
VDD
VSS
60
59
58
57
56
55
54
53
52
51
50
49
48
47
46
45
44
43
42
41
VLL3
2
VSS
3
USB0_DP
PTC3/LLWU_P7
PTC2
4
USB0_DM
5
VOUT33
PTC1/LLWU_P6
PTC0
6
VREGIN
7
ADC0_DP1/OP0_DP0
ADC0_DM1/OP0_DM0
ADC1_DP1/OP1_DP0/OP1_DM1
ADC1_DM1/OP1_DM0
PGA0_DP/ADC0_DP0/ADC1_DP3
PGA0_DM/ADC0_DM0/ADC1_DM3
PGA1_DP/ADC1_DP0/ADC0_DP3
PGA1_DM/ADC1_DM0/ADC0_DM3
VDDA
PTB19
8
PTB18
9
PTB17
10
11
12
13
14
15
16
17
18
19
20
PTB16
PTB11
PTB10
PTB9
PTB8
PTB3
VREFH
PTB2
VREFL
PTB1
VSSA
PTB0/LLWU_P5
RESET_b
PTA19
ADC1_SE16/OP1_OUT/CMP2_IN2/ADC0_SE22/OP0_DP2/OP1_DP2
ADC0_SE16/OP0_OUT/CMP1_IN2/ADC0_SE21/OP0_DP1/OP1_DP1
Figure 27. K51 80 LQFP Pinout Diagram
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
74
Freescale Semiconductor, Inc.
Revision History
1
2
3
4
5
6
7
8
9
10
11
PTD4/
PTC4/
A
B
C
D
E
F
G
H
J
PTD7
PTD5
NC
NC
NC
PTC8
VLL1
VLL2
VLL3
A
B
C
D
E
F
G
H
J
LLWU_P14
LLWU_P8
PTD6/
PTC3/
NC
NC
NC
NC
PTD3
NC
NC
NC
NC
PTC7
PTC0
PTB19
PTB18
PTB17
NC
PTB16
PTB11
PTB10
PTB9
NC
VCAP2
VCAP1
PTB8
NC
LLWU_P15
LLWU_P7
PTD2/
PTC11/
PTC6/
NC
NC
NC
PTC10
PTC9
VDD
PTC2
LLWU_P13
LLWU_P11
LLWU_P10
PTD0/
PTC5/
PTC1/
PTD1
NC
NC
VDD
VDDA
VREFH
NC
LLWU_P12
LLWU_P9 LLWU_P6
NC
NC
VDD
VSS
VSS
NC
NC
NC
USB0_DP USB0_DM
NC
VSSA
VREFL
NC
PTB0/
VOUT33
VREGIN
VSS
NC
PTB3
PTA1
PTB2
PTA3
NC
PTB1
NC
LLWU_P5
ADC0_SE16/
OP0_OUT/
ADC0_DP1/ ADC0_DM1/ CMP1_IN2/
CMP2_IN5/
ADC1_SE22
TRI0_DM
NC
ADC0_SE21/
OP0_DP1/
OP1_DP1
OP0_DP0 OP0_DM0
ADC1_SE16/
OP1_OUT/
CMP2_IN2/
ADC1_DP1/
OP1_DP0/
OP1_DM1
ADC1_DM1/
PTA4/
TRI0_DP
NC
PTA0
PTA2
NC
NC
RESET_b
PTA19
OP1_DM0 ADC0_SE22/
OP0_DP2/
LLWU_P3
OP1_DP2
CMP0_IN4/ DAC0_OUT/
CMP2_IN3/ CMP1_IN3/
ADC1_SE23/ADC0_SE23/ VBAT
OP0_DP5/ OP0_DP4/
PGA0_DP/ PGA0_DM/
ADC0_DP0/ ADC0_DM0/
ADC1_DP3 ADC1_DM3
TRI0_OUT/
OP1_DM2
K
L
NC
NC
VSS
K
L
OP1_DP5 OP1_DP4
VREF_OUT/
CMP1_IN5/
CMP0_IN5/
ADC1_SE18
PGA1_DP/ PGA1_DM/
ADC1_DP0/ ADC1_DM0/
PADC0_DP3ADC0_DM3
RTC_
WAKEUP_B
XTAL32
4
EXTAL32
5
VSS
6
NC
8
NC
9
VDD
10
PTA18
11
1
2
3
7
Figure 28. K51 81 MAPBGA Pinout Diagram
9 Revision History
The following table provides a revision history for this document.
Table 52. Revision History
Rev. No.
Date
Substantial Changes
1
3/2012
Initial public release
Table continues on the next page...
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
Freescale Semiconductor, Inc.
75
Revision History
Table 52. Revision History (continued)
Rev. No.
Date
Substantial Changes
2
4/2012
• Replaced TBDs throughout.
• Updated "Power consumption operating behaviors" table.
• Updated "ADC electrical specifications" section.
• Updated "VREF full-range operating behaviors" table.
• Updated "I2S/SAI Switching Specifications" section.
• Updated "TSI electrical specifications" table.
K51 Sub-Family Data Sheet, Rev. 2, 4/2012.
76
Freescale Semiconductor, Inc.
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Document Number: K51P81M72SF1
Rev. 2, 4/2012
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