FDZ372NZ [FAIRCHILD]

N-Channel 1.5 V Specified PowerTrench® Thin WL-CSP MOSFET; N沟道1.5 V额定PowerTrench®薄WL- CSP MOSFET
FDZ372NZ
型号: FDZ372NZ
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

N-Channel 1.5 V Specified PowerTrench® Thin WL-CSP MOSFET
N沟道1.5 V额定PowerTrench®薄WL- CSP MOSFET

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March 2010  
FDZ372NZ  
N-Channel 1.5 V Specified PowerTrench® Thin WL-CSP MOSFET  
20 V, 4.7 A, 50 mΩ  
Features  
General Description  
Designed on Fairchild's advanced 1.5 V PowerTrench® process  
with state of the art "fine pitch" Thin WLCSP packaging process,  
the FDZ372NZ minimizes both PCB space and rDS(on). This  
advanced WLCSP MOSFET embodies a breakthrough in  
packaging technology which enables the device to combine  
excellent thermal transfer characteristics, ultra-low profile  
„ Max rDS(on) = 50 mat VGS = 4.5 V, ID = 2 A  
„ Max rDS(on) = 60 mat VGS = 2.5 V, ID = 2 A  
„ Max rDS(on) = 72 mat VGS = 1.8 V, ID = 1 A  
„ Max rDS(on) = 93 mat VGS = 1.5 V, ID = 1 A  
packaging, low gate charge, and low rDS(on)  
.
„ Occupies only 1.0 mm2 of PCB area. Less than 30% of the  
area of 2x2 BGA  
Applications  
„ Ultra-thin package: less than 0.4 mm height when mounted  
„ Battery management  
„ Load switch  
to PCB  
„ HBM ESD protection level > 3200V (Note3)  
„ RoHS Compliant  
„ Battery protection  
Pin 1  
S
S
D
G
Pin 1  
TOP  
BOTTOM  
WL-CSP 1.0X1.0 Thin  
MOSFET Maximum Ratings TA = 25 °C unless otherwise noted  
Symbol  
VDS  
VGS  
Parameter  
Ratings  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
Drain Current -Continuous  
-Pulsed  
20  
V
V
±8  
4.7  
TA = 25 °C  
(Note 1a)  
ID  
A
12  
Power Dissipation  
TA = 25 °C  
TA = 25 °C  
(Note 1a)  
(Note 1b)  
1.7  
PD  
W
Power Dissipation  
0.5  
TJ, TSTG  
Operating and Storage Junction Temperature Range  
-55 to +150  
°C  
Thermal Characteristics  
RθJA  
RθJA  
Thermal Resistance, Junction to Ambient  
Thermal Resistance, Junction to Ambient  
(Note 1a)  
(Note 1b)  
75  
°C/W  
260  
Package Marking and Ordering Information  
Device Marking  
Device  
Package  
Reel Size  
7 ’’  
Tape Width  
8 mm  
Quantity  
L
FDZ372NZ  
WL-CSP 1.0x1.0 Thin  
5000 units  
1
©2010 Fairchild Semiconductor Corporation  
FDZ372NZ Rev.C2  
www.fairchildsemi.com  
Electrical Characteristics TJ = 25 °C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min  
Typ  
Max  
Units  
Off Characteristics  
BVDSS  
Drain to Source Breakdown Voltage  
ID = 250 µA, VGS = 0 V  
20  
V
BVDSS  
TJ  
Breakdown Voltage Temperature  
Coefficient  
I
D = 250 µA, referenced to 25 °C  
18  
mVC  
IDSS  
IGSS  
Zero Gate Voltage Drain Current  
Gate to Source Leakage Current  
VDS = 16 V, VGS = 0 V  
VGS = ±8 V, VDS = 0 V  
1
µA  
µA  
±10  
On Characteristics  
VGS(th)  
Gate to Source Threshold Voltage  
VGS = VDS, ID = 250 µA  
0.4  
0.7  
-3  
1
V
VGS(th)  
TJ  
Gate to Source Threshold Voltage  
Temperature Coefficient  
I
D = 250 µA, referenced to 25 °C  
VGS = 4.5 V, ID = 2 A  
GS = 2.5 V, ID = 2 A  
mV/°C  
40  
45  
53  
63  
57  
22  
50  
60  
72  
93  
81  
V
rDS(on)  
Drain to Source On Resistance  
Forward Transconductance  
VGS = 1.8 V, ID = 1 A  
mΩ  
VGS = 1.5 V, ID = 1 A  
VGS = 4.5V, ID = 2 A, TJ = 125°C  
VDS = 5 V, ID = 4.7 A  
gFS  
S
Dynamic Characteristics  
Ciss  
Coss  
Crss  
Input Capacitance  
515  
85  
685  
115  
100  
pF  
pF  
pF  
VDS = 10 V, VGS = 0 V,  
f = 1 MHz  
Output Capacitance  
Reverse Transfer Capacitance  
65  
Switching Characteristics  
td(on)  
tr  
td(off)  
tf  
Turn-On Delay Time  
Rise Time  
6.2  
3.6  
26  
12  
10  
42  
12  
9.8  
ns  
ns  
VDD = 10 V, ID = 4.7 A  
V
GS = 4.5 V, RGEN = 6 Ω  
Turn-Off Delay Time  
Fall Time  
ns  
5.6  
7
ns  
Qg  
Total Gate Charge  
Gate to Source Gate Charge  
Gate to Drain “Miller” Charge  
nC  
nC  
nC  
VGS = 4.5 V, VDD = 10 V  
D = 4.7 A  
Qgs  
Qgd  
0.8  
1.6  
I
Drain-Source Diode Characteristics  
VSD  
trr  
Source to Drain Diode Forward Voltage  
Reverse Recovery Time  
VGS = 0 V, IS = 1.4 A (Note 2)  
0.7  
11  
1.2  
20  
10  
V
ns  
nC  
IF = 4.7 A, di/dt = 100 A/µs  
Qrr  
Reverse Recovery Charge  
2.6  
Notes:  
2
1. R  
is determined with the device mounted on a 1 in pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R  
is guaranteed by design while R  
is determined by  
θJA  
θJC  
θCA  
the user's board design.  
b. 260 °C/W when mounted on a  
minimum pad of 2 oz copper.  
a. 75 °C/W when mounted on  
a 1 in pad of 2 oz copper.  
2
2. Pulse Test: Pulse Width < 300µs, Duty cycle < 2.0%.  
3. The diode connected between the gate and source serves only as protection ESD. No gate overvoltage rating is implied.  
©2010 Fairchild Semiconductor Corporation  
FDZ372NZ Rev.C2  
www.fairchildsemi.com  
2
Typical Characteristics TJ = 25 °C unless otherwise noted  
12  
2.0  
1.5  
1.0  
0.5  
VGS = 4.5 V  
VGS = 3 V  
VGS = 1.5 V  
VGS = 2.5 V  
VGS = 1.8 V  
VGS = 2 V  
VGS = 2 V  
8
VGS = 1.8 V  
VGS = 1.5 V  
4
VGS = 2.5 V  
VGS = 3 V  
VGS = 4.5 V  
PULSE DURATION = 80 µs  
DUTY CYCLE = 0.5% MAX  
PULSE DURATION = 80 µs  
DUTY CYCLE = 0.5% MAX  
0
0.0  
0.5  
1.0  
1.5  
0
4
8
12  
ID, DRAIN CURRENT (A)  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 1. On-Region Characteristics  
Figure2. N o r m a l i z e d O n - R e s i s ta n c e  
vs Drain Current and Gate Voltage  
1.6  
200  
ID = 2 A  
GS = 4.5 V  
PULSE DURATION = 80 µs  
V
DUTY CYCLE = 0.5% MAX  
ID = 2 A  
1.4  
1.2  
1.0  
0.8  
0.6  
150  
100  
50  
TJ = 125 o  
C
TJ = 25 o  
C
0
0.0  
-75 -50 -25  
TJ  
0
25 50 75 100 125 150  
1.5  
3.0  
4.5  
,
JUNCTION TEMPERATURE ( )  
oC  
VGS  
, GATE TO SOURCE VOLTAGE (V)  
F i gu re 3 . N orma li zed On - Res is ta nc e  
vs Junction Temperature  
Figure4. On-Resistance vs Gate to  
Source Voltage  
12  
20  
10  
PULSE DURATION = 80 µs  
DUTY CYCLE = 0.5% MAX  
VGS = 0 V  
VDS = 5 V  
1
8
4
0
TJ = 150 o  
C
TJ = 25 oC  
TJ = 150 o  
C
0.1  
TJ = 25 o  
C
0.01  
TJ = -55 o  
C
TJ = -55 o  
C
0.001  
0.5  
1.0  
1.5  
2.0  
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
VGS, GATE TO SOURCE VOLTAGE (V)  
VSD, BODY DIODE FORWARD VOLTAGE (V)  
Figure 5. Transfer Characteristics  
Figure6. Source to Drain Diode  
Forward Voltage vs Source Current  
©2010 Fairchild Semiconductor Corporation  
FDZ372NZ Rev.C2  
www.fairchildsemi.com  
3
Typical Characteristics TJ = 25 °C unless otherwise noted  
4.5  
1000  
100  
10  
ID = 4.7 A  
VDD = 8 V  
Ciss  
3.0  
VDD = 10 V  
Coss  
VDD = 12 V  
1.5  
Crss  
f = 1 MHz  
= 0 V  
V
GS  
0.0  
20  
0
2
4
6
8
0.01  
0.1  
1
10  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Qg, GATE CHARGE (nC)  
Figure 7. Gate Charge Characteristics  
Figure8. C a p a c i t a n c e v s D r a i n  
to Source Voltage  
20  
10  
10-1  
VDS = 0 V  
10-2  
10-3  
10-4  
10-5  
10-6  
10-7  
10-8  
10-9  
10-10  
100 us  
1 ms  
1
0.1  
TJ = 125 oC  
THIS AREA IS  
LIMITED BY r  
10 ms  
DS(on)  
SINGLE PULSE  
TJ = MAX RATED  
RθJA = 260 oC/W  
100 ms  
1 s  
10 s  
TJ = 25 o  
C
T
A = 25 oC  
DC  
0.01  
0.01  
0.1  
1
10  
100  
0
3
6
9
12  
15  
VDS, DRAIN to SOURCE VOLTAGE (V)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 10. Forward Bias Safe Operating Area  
Figure 9. Gate Leakage Current vs  
Gate to Source Voltage  
200  
100  
SINGLE PULSE  
RθJA = 260 oC/W  
T
A = 25 o  
C
10  
1
0.4  
10-4  
10-3  
10-2  
10-1  
t, PULSE WIDTH (sec)  
1
10  
100  
1000  
Figure 11. Single Pulse Maximum Power Dissipation  
©2010 Fairchild Semiconductor Corporation  
FDZ372NZ Rev.C2  
www.fairchildsemi.com  
4
Typical Characteristics TJ = 25 °C unless otherwise noted  
2
DUTY CYCLE-DESCENDING ORDER  
1
D = 0.5  
0.2  
0.1  
0.1  
P
DM  
0.05  
0.02  
0.01  
t
1
0.01  
t
2
SINGLE PULSE  
NOTES:  
DUTY FACTOR: D = t /t  
1 2  
R
θJA = 260 oC/W  
PEAK T = P  
J
x Z  
x R  
+ T  
DM  
θJA  
θJA A  
0.001  
10-4  
10-3  
10-2  
10-1  
t, RECTANGULAR PULSE DURATION (sec)  
1
10  
100  
1000  
Figure 12. Junction-to-Ambient Transient Thermal Response Curve  
©2010 Fairchild Semiconductor Corporation  
FDZ372NZ Rev.C2  
www.fairchildsemi.com  
5
Dimensional Outline and Pad Layout  
©2010 Fairchild Semiconductor Corporation  
FDZ372NZ Rev.C2  
www.fairchildsemi.com  
6
TRADEMARKS  
The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries, and is not  
intended to be an exhaustive list of all such trademarks.  
AccuPower™  
Auto-SPM™  
Build it Now™  
CorePLUS™  
CorePOWER™  
CROSSVOLT™  
CTL™  
F-PFS™  
FRFET  
Global Power Resource  
Green FPS™  
Green FPS™ e-Series™  
Gmax™  
Power-SPM™  
PowerTrench  
PowerXS™  
®*  
®
®
SM  
®
The Power Franchise  
®
Programmable Active Droop™  
®
QFET  
QS™  
Quiet Series™  
RapidConfigure™  
TinyBoost™  
TinyBuck™  
TinyCalc™  
GTO™  
Current Transfer Logic™  
IntelliMAX™  
ISOPLANAR™  
MegaBuck™  
MICROCOUPLER™  
MicroFET™  
®
DEUXPEED  
®
TinyLogic  
Dual Cool™  
TINYOPTO™  
TinyPower™  
TinyPWM™  
®
EcoSPARK  
Saving our world, 1mW/W/kW at a time™  
SignalWise™  
SmartMax™  
EfficentMax™  
ESBC™  
®
MicroPak™  
TinyWire™  
MicroPak2™  
MillerDrive™  
MotionMax™  
Motion-SPM™  
OptiHiT™  
SMART START™  
TriFault Detect™  
TRUECURRENT™*  
µSerDes™  
®
SPM  
®
STEALTH™  
SuperFET™  
SuperSOT™-3  
SuperSOT™-6  
SuperSOT™-8  
SupreMOS™  
SyncFET™  
Fairchild  
®
Fairchild Semiconductor  
FACT Quiet Series™  
®
®
OPTOLOGIC  
FACT  
FAST  
®
®
UHC  
®
OPTOPLANAR  
®
Ultra FRFET™  
UniFET™  
VCX™  
FastvCore™  
FETBench™  
tm  
®
Sync-Lock™  
FlashWriter  
FPS™  
*
PDP SPM™  
VisualMax™  
XS™  
*Trademarks of System General Corporation, used under license by Fairchild Semiconductor.  
DISCLAIMER  
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE  
RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY  
PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.  
THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY  
THEREIN, WHICH COVERS THESE PRODUCTS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE  
EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.  
As used here in:  
1. Life support devices or systems are devices or systems which, (a) are  
intended for surgical implant into the body or (b) support or sustain life,  
and (c) whose failure to perform when properly used in accordance with  
instructions for use provided in the labeling, can be reasonably  
expected to result in a significant injury of the user.  
2. A critical component in any component of a life support, device, or  
system whose failure to perform can be reasonably expected to cause  
the failure of the life support device or system, or to affect its safety or  
effectiveness.  
ANTI-COUNTERFEITING POLICY  
Fairchild Semiconductor Corporation’s Anti-Counterfeiting Policy. Fairchild’s Anti-Counterfeiting Policy is also stated on our external website,  
www.Fairchildsemi.com, under Sales Support.  
Counterfeiting of semiconductor parts is a growing problem in the industry. All manufactures of semiconductor products are experiencing counterfeiting of their  
parts. Customers who inadvertently purchase counterfeit parts experience many problems such as loss of brand reputation, substandard performance, failed  
application, and increased cost of production and manufacturing delays. Fairchild is taking strong measures to protect ourselves and our customers from the  
proliferation of counterfeit parts. Fairchild strongly encourages customers to purchase Fairchild parts either directly from Fairchild or from Authorized Fairchild  
Distributors who are listed by country on our web page cited above. Products customers buy either from Fairchild directly or from Authorized Fairchild  
Distributors are genuine parts, have full traceability, meet Fairchild’s quality standards for handing and storage and provide access to Fairchild’s full range of  
up-to-date technical and product information. Fairchild and our Authorized Distributors will stand behind all warranties and will appropriately address and  
warranty issues that may arise. Fairchild will not provide any warranty coverage or other assistance for parts bought from Unauthorized Sources. Fairchild is  
committed to combat this global problem and encourage our customers to do their part in stopping this practice by buying direct or from authorized distributors.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Datasheet contains the design specifications for product development. Specifications  
may change in any manner without notice.  
Advance Information  
Formative / In Design  
Datasheet contains preliminary data; supplementary data will be published at a later  
date. Fairchild Semiconductor reserves the right to make changes at any time without  
notice to improve design.  
Preliminary  
First Production  
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to  
make changes at any time without notice to improve the design.  
No Identification Needed  
Obsolete  
Full Production  
Datasheet contains specifications on a product that is discontinued by Fairchild  
Semiconductor. The datasheet is for reference information only.  
Not In Production  
Rev. I48  
www.fairchildsemi.com  
©2010 Fairchild Semiconductor Corporation  
FDZ372NZ Rev.C2  

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