FDS4141 [FAIRCHILD]

P-Channel PowerTrench㈢ MOSFET -40V, -10.8A, 13.0mヘ; P沟道MOSFET PowerTrench㈢ -40V , -10.8A , 13.0米ヘ
FDS4141
型号: FDS4141
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

P-Channel PowerTrench㈢ MOSFET -40V, -10.8A, 13.0mヘ
P沟道MOSFET PowerTrench㈢ -40V , -10.8A , 13.0米ヘ

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中文:  中文翻译
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November 2007  
FDS4141  
P-Channel PowerTrench® MOSFET  
-40V, -10.8A, 13.0mΩ  
Features  
General Description  
„ Max rDS(on) = 13.0mat VGS = -10V, ID = -10.5A  
„ Max rDS(on) = 19.0mat VGS = -4.5V, ID = -8.4A  
„ High performance trench technology for extremely low rDS(on)  
„ RoHS Compliant  
This P-Channel MOSFET has been produced using Fairchild  
Semiconductor’s proprietary PowerTrench® technology to  
deliver low rDS(on) and optimized BVDSS capability to offer  
superior performance benefit in the applications and optimized  
switching performance capability reducing power dissipation  
losses in converter/inverter applications.  
Applications  
„ Control switch in synchronous & non-synchronous buck  
„ Load switch  
„ Inverter  
D
D
G
S
S
S
D
D
5
6
7
8
4
3
2
1
D
D
D
D
G
SO-8  
S
S
Pin 1  
S
MOSFET Maximum Ratings TA = 25°C unless otherwise noted  
Symbol  
VDS  
VGS  
Parameter  
Ratings  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
Drain Current -Continuous  
-Pulsed  
-40  
±20  
V
V
-10.8  
-36  
ID  
A
mJ  
W
EAS  
PD  
Single Pulse Avalanche Energy  
Power Dissipation  
(Note 3)  
294  
TA = 25°C  
TA = 25°C  
(Note 1a)  
(Note 1b)  
5
Power Dissipation  
2.5  
TJ, TSTG  
Operating and Storage Junction Temperature Range  
-55 to +150  
°C  
Thermal Characteristics  
RθJC  
RθJA  
Thermal Resistance, Junction to Case  
Thermal Resistance, Junction to Ambient  
(Note 1)  
25  
50  
°C/W  
(Note 1a)  
Package Marking and Ordering Information  
Device Marking  
Device  
Package  
Reel Size  
Tape Width  
12mm  
Quantity  
FDS4141  
FDS4141  
SO-8  
13’’  
2500units  
1
©2007 Fairchild Semiconductor Corporation  
FDS4141 Rev.C  
www.fairchildsemi.com  
Electrical Characteristics TJ = 25°C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min  
Typ  
Max  
Units  
Off Characteristics  
BVDSS  
Drain to Source Breakdown Voltage  
ID = -250µA, VGS = 0V  
-40  
V
BVDSS  
TJ  
Breakdown Voltage Temperature  
Coefficient  
ID = -250µA, referenced to 25°C  
-33  
mV/°C  
IDSS  
IGSS  
Zero Gate Voltage Drain Current  
Gate to Source Leakage Current  
VDS = -32V,  
-1  
µA  
VGS = ±20V, VDS = 0V  
±100  
nA  
On Characteristics  
VGS(th)  
Gate to Source Threshold Voltage  
VGS = VDS, ID = -250µA  
-1.0  
-1.6  
5.3  
-3.0  
V
VGS(th)  
TJ  
Gate to Source Threshold Voltage  
Temperature Coefficient  
ID = -250µA, referenced to 25°C  
mV/°C  
VGS = -10V, ID = -10.5A  
VGS = -4.5V, ID = -8.4A  
11.0  
15.2  
16.8  
37  
13.0  
19.0  
19.9  
rDS(on)  
gFS  
Static Drain to Source On Resistance  
Forward Transconductance  
mΩ  
VGS = -10V, ID = -10.5A, TJ= 125°C  
VDD = -5V, ID = -10.5A  
S
Dynamic Characteristics  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
2005  
355  
190  
5
2670  
475  
pF  
pF  
pF  
VDS = -20V, VGS = 0V,  
f = 1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate Resistance  
285  
f = 1MHz  
Switching Characteristics  
td(on)  
tr  
td(off)  
tf  
Turn-On Delay Time  
Rise Time  
10  
5
20  
10  
68  
22  
49  
27  
ns  
ns  
VDD = -20V, ID = -10.5A,  
VGS = -10V, RGEN = 6Ω  
Turn-Off Delay Time  
Fall Time  
42  
12  
35  
19  
6
ns  
ns  
Qg  
Total Gate Charge  
Total Gate Charge  
Gate to Source Charge  
Gate to Drain “Miller” Charge  
VGS = 0V to -10V  
nC  
nC  
nC  
nC  
Qg  
VGS = 0V to -5V  
VDD = -20V,  
ID = -10.5A  
Qgs  
Qgd  
7
Drain-Source Diode Characteristics  
VGS = 0V, IS = -10.5A  
VGS = 0V, IS = -2.1A  
(Note 2)  
(Note 2)  
-0.8  
-0.7  
26  
-1.3  
-1.2  
42  
VSD  
Source to Drain Diode Forward Voltage  
V
trr  
Reverse Recovery Time  
ns  
IF = -10.5A, di/dt = 100A/µs  
Qrr  
Reverse Recovery Charge  
14  
26  
nC  
NOTES:  
2
1. R  
is determined with the device mounted on a 1in pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R  
is guaranteed by design while R is determined by  
θCA  
θJA  
θJC  
the user's board design.  
a) 50°C/W when mounted on a  
1in pad of 2 oz copper.  
b) 125°C/W when mounted on a  
minimum pad.  
2
2. Pulse Test: Pulse Width < 300µs, Duty cycle < 2.0%.  
3. UIL condition: Starting T = 25°C, L = 3mH, I = -14A, V = -40V, V = -10V.  
J
AS  
DD  
GS  
www.fairchildsemi.com  
©2007 Fairchild Semiconductor Corporation  
FDS4141 Rev.C  
2
Typical Characteristics TJ = 25°C unless otherwise noted  
36  
4.0  
3.5  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
PULSE DURATION = 80µs  
DUTY CYCLE = 0.5%MAX  
VGS = -3.5V  
VGS = -4V  
VGS = -3V  
27  
VGS = -4.5V  
VGS = -10V  
VGS = -3.5V  
18  
VGS = -3V  
VGS = -4V  
9
VGS = -4.5V  
VGS = -10V  
PULSE DURATION = 80µs  
DUTY CYCLE = 0.5%MAX  
0
0
1
2
3
0
9
18  
27  
36  
-ID, DRAIN CURRENT(A)  
-VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 1. On-Region Characteristics  
Figure2. N o r m a l i z e d O n - R e s i s ta n c e  
vs Drain Current and Gate Voltage  
50  
1.8  
ID = -10.5A  
GS = -10V  
PULSE DURATION = 80µs  
ID = -10.5A  
V
DUTY CYCLE = 0.5%MAX  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
40  
30  
TJ = 125oC  
20  
10  
TJ = 25oC  
0
2
4
6
8
10  
-75 -50 -25  
0
25 50 75 100 125 150  
TJ, JUNCTION TEMPERATURE (oC)  
-VGS, GATE TO SOURCE VOLTAGE (V)  
Figure4. On-Resistance vs Gate to  
Source Voltage  
F i gu re 3 . N orma li zed On - Res is ta nc e  
vs Junction Temperature  
100  
36  
VGS = 0V  
PULSE DURATION = 80µs  
DUTY CYCLE = 0.5%MAX  
10  
1
27  
VDS = -5V  
TJ = 150oC  
TJ = 150oC  
TJ = 25oC  
18  
0.1  
TJ = 25oC  
9
TJ = -55oC  
0.01  
0.001  
TJ = -55oC  
0
0
1
2
3
4
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
-VSD, BODY DIODE FORWARD VOLTAGE (V)  
-VGS, GATE TO SOURCE VOLTAGE (V)  
Figure6. Source to Drain Diode  
Forward Voltage vs Source Current  
Figure 5. Transfer Characteristics  
www.fairchildsemi.com  
©2007 Fairchild Semiconductor Corporation  
FDS4141 Rev.C  
3
Typical Characteristics TJ = 25°C unless otherwise noted  
10  
5000  
1000  
ID = -10.5A  
Ciss  
8
VDD = -20V  
6
Coss  
VDD = -15V  
VDD = -25V  
4
2
0
Crss  
f = 1MHz  
= 0V  
V
GS  
100  
60  
0
5
10  
15  
20  
25  
30  
35  
40  
0.1  
1
10  
40  
-VDS, DRAIN TO SOURCE VOLTAGE (V)  
Q , GATE CHARGE(nC)  
g
Figure8. C a p a c i t a n c e v s D r a i n  
to Source Voltage  
Figure 7. Gate Charge Characteristics  
12  
9
20  
10  
VGS = -10V  
6
TJ = 25oC  
VGS = -4.5V  
TJ = 125oC  
3
R
θJA = 50oC/W  
0
25  
1
0.01  
50  
75  
100  
125  
150  
0.1  
1
10  
100 500  
TA, AMBIENT TEMPERATURE (oC)  
tAV, TIME IN AVALANCHE(ms)  
Figure9. U n c l a m p e d I n d u c t i v e  
Switching Capability  
Figure10. Maximum Continuous Drain  
Current vs Ambient Temperature  
100  
10  
2000  
1000  
100  
10  
VGS = -10V  
SINGLE PULSE  
θJA = 125oC/W  
TA = 25oC  
R
1ms  
10ms  
100ms  
1
THIS AREA IS  
LIMITED BY r  
DS(on)  
SINGLE PULSE  
TJ = MAX RATED  
1s  
0.1  
RθJA = 125oC/W  
TA = 25oC  
10s  
DC  
1
0.5  
0.01  
10-4  
10-3  
10-2  
t, PULSE WIDTH (sec)  
10-1  
1
10  
100 1000  
200  
100  
0.01  
0.1  
1
10  
-VDS, DRAIN to SOURCE VOLTAGE (V)  
Figure12. Single Pulse Maximum  
Power Dissipation  
Figure 11. Forward Bias Safe  
Operating Area  
www.fairchildsemi.com  
©2007 Fairchild Semiconductor Corporation  
FDS4141 Rev.C  
4
Typical Characteristics TJ = 25°C unless otherwise noted  
2
1
DUTY CYCLE-DESCENDING ORDER  
D = 0.5  
0.2  
0.1  
0.1  
0.05  
0.02  
0.01  
P
DM  
0.01  
t
1
t
2
NOTES:  
DUTY FACTOR: D = t /t  
SINGLE PULSE  
0.001  
1
2
R
θJA = 125oC/W  
PEAK T = P  
J
x Z  
x R  
+ T  
θJA A  
DM  
θJA  
0.0001  
10-4  
10-3  
10-2  
10-1  
t, RECTANGULAR PULSE DURATION (sec)  
1
10  
100  
1000  
Figure 13. Transient Thermal Response Curve  
www.fairchildsemi.com  
©2007 Fairchild Semiconductor Corporation  
FDS4141 Rev.C  
5
Preliminary Datasheet  
TRADEMARKS  
The following are registered and unregistered trademarks and service marks Fairchild Semiconductor owns or is authorized to use and  
is not intended to be an exhaustive list of all such trademarks.  
ACEx®  
Green FPS™  
Green FPS™ e-Series™  
GTO™  
i-Lo™  
IntelliMAX™  
ISOPLANAR™  
MegaBuck™  
MICROCOUPLER™  
MicroFET™  
Power247®  
SuperSOT™-8  
SyncFET™  
Build it Now™  
CorePLUS™  
CROSSVOLT™  
CTL™  
POWEREDGE®  
Power-SPM™  
PowerTrench®  
Programmable Active Droop™  
QFET®  
The Power Franchise®  
Current Transfer Logic™  
TinyBoost™  
TinyBuck™  
TinyLogic®  
TINYOPTO™  
TinyPower™  
TinyPWM™  
TinyWire™  
µSerDes™  
UHC®  
EcoSPARK®  
QS™  
®
QT Optoelectronics™  
Quiet Series™  
RapidConfigure™  
SMART START™  
SPM®  
STEALTH™  
SuperFET™  
SuperSOT™-3  
SuperSOT™-6  
Fairchild®  
Fairchild Semiconductor®  
FACT Quiet Series™  
FACT®  
MicroPak™  
MillerDrive™  
Motion-SPM™  
OPTOLOGIC®  
FAST®  
FastvCore™  
FPS™  
OPTOPLANAR®  
®
UniFET™  
VCX™  
FRFET®  
PDP-SPM™  
Power220®  
Global Power ResourceSM  
DISCLAIMER  
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS  
HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF  
THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE  
UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF  
FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE  
PRODUCTS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR  
SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.  
As used herein:  
1. Life support devices or systems are devices or systems  
which, (a) are intended for surgical implant into the body or  
(b) support or sustain life, and (c) whose failure to perform  
when properly used in accordance with instructions for use  
provided in the labeling, can be reasonably expected to  
result in a significant injury to the user.  
2. A critical component in any component of a life support,  
device, or system whose failure to perform can be  
reasonably expected to cause the failure of the life support  
device or system, or to affect its safety or effectiveness.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
tm  
This datasheet contains the design specifications for product  
development. Specifications may change in any manner without notice.  
Advance Information  
Formative or In Design  
This datasheet contains preliminary data; supplementary data will be pub-  
lished at a later date. Fairchild Semiconductor reserves the right to make  
changes at any time without notice to improve design.  
Preliminary  
First Production  
Full Production  
Not In Production  
This datasheet contains final specifications. Fairchild Semiconductor reserves  
the right to make changes at any time without notice to improve design.  
No Identification Needed  
Obsolete  
This datasheet contains specifications on a product that has been discontin-  
ued by Fairchild Semiconductor. The datasheet is printed for reference infor-  
mation only.  
Rev. I31  
6
©2007 Fairchild Semiconductor Corporation  
FDS4141 Rev.C  
www.fairchildsemi.com  

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