FDMF6705B [FAIRCHILD]

Extra-Small, High-Performance, High- Frequency DrMOS Module; 超小型,高性能,高频率的DrMOS模块
FDMF6705B
型号: FDMF6705B
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

Extra-Small, High-Performance, High- Frequency DrMOS Module
超小型,高性能,高频率的DrMOS模块

驱动器 接口集成电路 服务器主板节能技术
文件: 总19页 (文件大小:1510K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
March 2012  
FDMF6705B - Extra-Small, High-Performance, High-  
Frequency DrMOS Module  
Benefits  
Description  
The XS™ DrMOS family is Fairchild’s next-generation,  
fully optimized, ultra-compact, integrated MOSFET plus  
driver power stage solution for high-current, high-  
frequency, synchronous buck DC-DC applications. The  
FDMF6705B integrates a driver IC, two power MOSFETs,  
.
Ultra-Compact 6x6mm PQFN, 72% Space-Saving  
Compared to Conventional Discrete Solutions  
.
.
.
Fully Optimized System Efficiency  
Clean Switching Waveforms with Minimal Ringing  
High-Current Handling  
and  
a bootstrap Schottky diode into a thermally  
enhanced, ultra-compact 6x6mm PQFN package.  
With an integrated approach, the complete switching  
power stage is optimized with regards to driver and  
MOSFET dynamic performance, system inductance,  
and power MOSFET RDS(ON). XS™ DrMOS uses  
Fairchild's high-performance PowerTrench® MOSFET  
technology, which dramatically reduces switch ringing,  
eliminating the need for a snubber circuit in most buck  
converter applications.  
Features  
.
.
.
.
.
.
.
Over 93% Peak-Efficiency  
High-Current Handling of 40A at 12VIN  
High-Current Handling of 38A at 19VIN  
High-Performance PQFN Copper-Clip Package  
3-State 3.3V PWM Input Driver  
A
new driver IC with reduced dead times and  
Skip-Mode SMOD# (Low-Side Gate Turn-Off) Input  
propagation delays further enhances the performance of  
this part. A thermal warning function warns of a potential  
over-temperature situation. The FDMF6705B also  
incorporates features, such as Skip Mode (SMOD), for  
improved light-load efficiency, along with a three-state  
3.3V PWM input for compatibility with a wide range of  
PWM controllers.  
Thermal Warning Flag for Over-Temperature  
Condition  
.
.
Driver Output Disable Function (DISB# Pin)  
Internal Pull-Up and Pull-Down for SMOD# and  
DISB# Inputs, Respectively  
.
.
Fairchild PowerTrench® Technology MOSFETs for  
Clean Voltage Waveforms and Reduced Ringing  
Applications  
Fairchild SyncFET™ (Integrated Schottky Diode)  
Technology in the Low-Side MOSFET  
.
.
.
High-Performance Gaming Motherboards  
Notebook Computers, V-Core and Non-V-Core  
.
.
Integrated Bootstrap Schottky Diode  
Compact Blade Servers, V-Core and Non-V-Core  
DC-DC Converters  
Adaptive Gate Drive Timing for Shoot-Through  
Protection  
.
Desktop Computers, V-Core and Non-V-Core  
DC-DC Converters  
.
.
.
.
.
Under-Voltage Lockout (UVLO)  
Optimized for Switching Frequencies up to 1MHz  
Low-Profile SMD Package  
.
.
Workstations  
High-Current DC-DC Point-of-Load (POL)  
Converters  
Fairchild Green Packaging and RoHS Compliance  
Based on the Intel® 4.0 DrMOS Standard  
.
Small Form-Factor Voltage Regulator Modules  
Ordering Information  
Part Number Current Rating  
Package  
Top Mark  
FDMF6705B  
40A  
40-Lead, Clipbond PQFN DrMOS, 6.0x6.0mm Package  
FDMF6705B  
© 2011 Fairchild Semiconductor Corporation  
FDMF6705B • Rev. 1.0.2  
www.fairchildsemi.com  
Typical Application Circuit  
VIN  
3V ~ 24V  
V5V  
CVIN  
CVDRV  
VDRV  
VCIN  
VIN  
RBOOT  
DISB#  
DISB#  
BOOT  
CBOOT  
PWM  
PWM Input  
FDMF6705B  
PHASE  
VSWH  
OFF  
SMOD#  
ON  
VOUT  
LOUT  
Open-Drain  
THWN#  
Output  
COUT  
CGND  
PGND  
Figure 1. Typical Application Circuit  
DrMOS Block Diagram  
VDRV  
BOOT  
VIN  
VCIN  
UVLO  
Q1  
HS Power  
MOSFET  
DBoot  
DISB#  
GH  
GH  
Logic  
Level Shift  
10µA  
VCIN  
30kΩ  
PHASE  
RUP_PWM  
Dead Time  
Control  
Input  
3-State  
Logic  
VSWH  
PWM  
VDRV  
RDN_PWM  
GL  
GL  
Logic  
THWN#  
30kΩ  
VCIN  
Q2  
LS Power  
MOSFET  
Temp.  
Sense  
10µA  
CGND  
SMOD#  
PGND  
Figure 2. DrMOS Block Diagram  
© 2011 Fairchild Semiconductor Corporation  
FDMF6705B • Rev. 1.0.2  
www.fairchildsemi.com  
2
Pin Configuration  
Figure 3. Bottom View  
Figure 4. Top View  
Pin Definitions  
Pin #  
Name  
Description  
When SMOD#=HIGH, the low-side driver is the inverse of PWM input. When SMOD#=LOW,  
1
SMOD# the low-side driver is disabled. This pin has a 10µA internal pull-up current source. Do not add a  
noise filter capacitor.  
2
3
VCIN IC bias supply. Minimum 1µF ceramic capacitor is recommended from this pin to CGND.  
Power for gate driver. Minimum 1µF ceramic capacitor is recommended, connected as close as  
VDRV  
possible from this pin to CGND.  
Bootstrap supply input. Provides voltage supply to high-side MOSFET driver. Connect a  
bootstrap capacitor from this pin to PHASE.  
4
BOOT  
5, 37, 41 CGND IC ground. Ground return for driver IC.  
6
7
GH  
For manufacturing test only. This pin must float; must not be connected to any pin.  
PHASE Switch node pin for bootstrap capacitor routing. Electrically shorted to VSWH pin.  
No connect. The pin is not electrically connected internally, but can be connected to VIN for  
convenience.  
8
NC  
9 - 14, 42  
VIN  
Power input. Output stage supply voltage.  
15, 29 -  
35, 43  
Switch node input. Provides return for high-side bootstrapped driver and acts as a sense point  
for the adaptive shoot-through protection.  
VSWH  
16 – 28  
36  
PGND Power ground. Output stage ground. Source pin of low-side MOSFET.  
GL  
For manufacturing test only. This pin must float; must not be connected to any pin.  
Thermal warning flag, open collector output. When temperature exceeds the trip limit, the  
output is pulled LOW. THWN# does not disable the module.  
38  
THWN#  
Output disable. When LOW, this pin disables power MOSFET switching (GH and GL are held  
39  
40  
DISB# LOW). This pin has a 10µA internal pull-down current source. Do not add a noise filter  
capacitor.  
PWM PWM signal input. This pin accepts a three-state logic-level PWM signal from the controller.  
© 2011 Fairchild Semiconductor Corporation  
FDMF6705B • Rev. 1.0.2  
www.fairchildsemi.com  
3
Absolute Maximum Ratings  
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be  
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.  
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.  
The absolute maximum ratings are stress ratings only.  
Symbol  
Parameter  
Min.  
Max.  
Unit  
VCIN  
VDRV  
Supply Voltage  
Drive Voltage  
Referenced to CGND  
-0.3  
-0.3  
-0.3  
-0.3  
-0.3  
-0.3  
-0.3  
-0.3  
-0.3  
-0.3  
-0.3  
-0.3  
-0.3  
-0.3  
-8.0  
6.0  
6.0  
V
V
Referenced to CGND  
VDISB#  
VPWM  
Output Disable  
PWM Signal Input  
Referenced to CGND  
6.0  
V
Referenced to CGND  
6.0  
V
VSMOD# Skip Mode Input  
Referenced to CGND  
6.0  
V
VGL  
Low Gate Manufacturing Test Pin  
Referenced to CGND  
6.0  
V
VTHWN# Thermal Warning Flag  
Referenced to CGND  
6.0  
V
VIN  
Power Input  
Referenced to PGND, CGND  
Referenced to VSWH, PHASE  
Referenced to CGND  
30.0  
6.0  
V
V
VBOOT  
Bootstrap Supply  
30.0  
6.0  
V
Referenced to VSWH, PHASE  
Referenced to CGND  
V
VGH  
VPHS  
VSWH  
High Gate Manufacturing Test Pin  
PHASE  
30.0  
30.0  
30.0  
33.0  
22.0  
25.0  
7.0  
V
Referenced to CGND  
V
Referenced to PGND, CGND (DC Only)  
Referenced to PGND, <20ns  
Referenced to VDRV  
V
Switch Node Input  
V
V
VBOOT  
ITHWN#  
IO(AV)  
Bootstrap Supply  
THWN# Sink Current  
Output Current(1)  
Referenced to VDRV, <20ns  
V
-0.1  
-40  
mA  
fSW=300kHz, VIN=19V, VO=1.0V  
fSW=1MHz, VIN=19V, VO=1.0V  
38  
A
35  
θJPCB  
TA  
Junction-to-PCB Thermal Resistance  
Ambient Temperature Range  
Maximum Junction Temperature  
Storage Temperature Range  
3.5  
°C/W  
°C  
+125  
+150  
+150  
TJ  
°C  
TSTG  
-55  
°C  
Human Body Model, JESD22-A114  
Charged Device Model, JESD22-C101  
2000  
1000  
ESD  
Electrostatic Discharge Protection  
V
Note:  
1. IO(AV) is rated using Fairchild’s DrMOS evaluation board, TA = 25°C, natural convection cooling. This rating is limited  
by the peak DrMOS temperature, TJ = 150°C, and varies depending on operating conditions and PCB layout. This  
rating can be changed with different application settings.  
Recommended Operating Conditions  
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended  
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not  
recommend exceeding them or designing to Absolute Maximum Ratings.  
Symbol  
Parameter  
Min.  
4.5  
Typ.  
5.0  
Max.  
5.5  
Unit  
V
VCIN  
VDRV  
VIN  
Control Circuit Supply Voltage  
Gate Drive Circuit Supply Voltage  
Output Stage Supply Voltage  
4.5  
5.0  
5.5  
24.0(2)  
V
3.0  
12.0  
V
Note:  
2. Operating at high VIN can create excessive AC overshoots on the VSWH-to-GND and BOOT-to-GND nodes  
during MOSFET switching transients. For reliable DrMOS operation, VSWH-to-GND and BOOT-to-GND must  
remain at or below the Absolute Maximum Ratings shown in the table above. Refer to the “Application  
Information” and “PCB Layout Guidelines” sections of this datasheet for additional information.  
© 2011 Fairchild Semiconductor Corporation  
FDMF6705B • Rev. 1.0.2  
www.fairchildsemi.com  
4
Electrical Characteristics  
Typical values are VIN = 12V, VCIN = 5V, VDRV = 5V, and TA = +25°C unless otherwise noted.  
Symbol  
Parameter  
Condition  
Min. Typ. Max. Unit  
Basic Operation  
IQ  
Quiescent Current  
UVLO Threshold  
IQ=IVCIN+IVDRV, PWM=LOW or HIGH or Float  
VCIN Rising  
2
mA  
V
UVLO  
2.9  
3.1  
0.4  
3.3  
UVLO_Hyst UVLO Hysteresis  
PWM Input (VCIN = VDRV = 5V ±10%)  
RUP_PWM Pull-Up Impedance  
RDN_PWM Pull-Down Impedance  
V
26  
12  
kΩ  
kΩ  
V
VIH_PWM  
VTRI_HI  
VTRI_LO  
VIL_PWM  
PWM High Level Voltage  
3-State Upper Threshold  
3-State Lower Threshold  
PWM Low Level Voltage  
1.88 2.25 2.61  
1.84 2.20 2.56  
0.70 0.95 1.19  
0.62 0.85 1.13  
V
V
V
tD_HOLD-OFF 3-State Shut-off Time  
VHiZ_PWM 3-State Open Voltage  
PWM Input (VCIN = VDRV = 5V ±5%)  
RUP_PWM Pull-Up Impedance  
RDN_PWM Pull-Down Impedance  
160  
200  
ns  
V
1.40 1.60 1.90  
26  
kΩ  
kΩ  
V
12  
VIH_PWM  
VTRI_HI  
VTRI_LO  
VIL_PWM  
PWM High Level Voltage  
3-State Upper Threshold  
3-State Lower Threshold  
PWM Low Level Voltage  
2.00 2.25 2.50  
1.94 2.20 2.46  
0.75 0.95 1.15  
0.66 0.85 1.09  
V
V
V
tD_HOLD-OFF 3-State Shut-off Time  
VHiZ_PWM 3-State Open Voltage  
DISB# Input  
160  
200  
ns  
V
1.45 1.60 1.80  
VIH_DISB  
VIL_DISB  
IPLD  
High-Level Input Voltage  
Low-Level Input Voltage  
Pull-Down Current  
2
V
V
0.8  
10  
µA  
PWM=GND, Delay Between DISB# from  
HIGH to LOW to GL from HIGH to LOW  
tPD_DISBL Propagation Delay  
tPD_DISBH Propagation Delay  
25  
25  
ns  
ns  
PWM=GND, Delay Between DISB# from  
LOW to HIGH to GL from LOW to HIGH  
SMOD# Input  
VIH_SMOD High-Level Input Voltage  
VIL_SMOD Low-Level Input Voltage  
2
V
V
0.8  
10  
IPLU  
Pull-Up Current  
µA  
PWM=GND, Delay Between SMOD# from  
HIGH to LOW to GL from HIGH to LOW  
tPD_SLGLL Propagation Delay  
tPD_SHGLH Propagation Delay  
10  
10  
ns  
ns  
PWM=GND, Delay Between SMOD# from  
LOW to HIGH to GL from LOW to HIGH  
Continued on the following page…  
© 2011 Fairchild Semiconductor Corporation  
FDMF6705B • Rev. 1.0.2  
www.fairchildsemi.com  
5
Electrical Characteristics  
Typical values are VIN = 12V, VCIN = 5V, VDRV = 5V, and TA = +25°C unless otherwise noted.  
Symbol  
Parameter  
Condition  
Min. Typ. Max. Unit  
Thermal Warning Flag  
TACT  
TRST  
Activation Temperature  
150  
135  
30  
°C  
°C  
Reset Temperature  
RTHWN  
Pull-Down Resistance  
IPLD=5mA  
250ns Timeout Circuit  
tD_TIMEOUT Timeout Delay  
High-Side Driver  
SW=0V, Delay Between GH from HIGH to  
LOW and GL from LOW to HIGH  
250  
ns  
RSOURCE_GH Output Impedance, Sourcing Source Current=100mA  
RSINK_GH Output Impedance, Sinking Sink Current=100mA  
1
0.8  
6
tR_GH  
tF_GH  
Rise Time  
Fall Time  
GH=10% to 90%, CLOAD=1.1nF  
GH=90% to 10%, CLOAD=1.1nF  
ns  
ns  
5
GL going LOW to GH going HIGH,  
1V GL to 10% GH  
tD_DEADON LS to HS Deadband Time  
10  
16  
30  
30  
ns  
ns  
ns  
ns  
PWM LOW Propagation  
PWM going LOW to GH going LOW,  
tPD_PLGHL  
Delay  
30  
V
IL_PWM to 90% GH  
PWM going HIGH to GH going HIGH,  
VIH_PWM to 10% GH (SMOD=LOW)  
PWM HIGH Propagation  
tPD_PHGHH  
Delay (SMOD Held LOW)  
Exiting 3-State Propagation PWM (from 3-State) going HIGH to GH  
Delay going HIGH, VIH_PWM to 10% GH  
tPD_TSGHH  
Low-Side Driver  
RSOURCE_GL Output Impedance, Sourcing Source Current=100mA  
1
0.5  
10  
8
RSINK_GL Output Impedance, Sinking  
Sink Current=100mA  
tR_GL  
tF_GL  
Rise Time  
Fall Time  
GL=10% to 90%, CLOAD=2.7nF  
GL=90% to 10%, CLOAD=2.7nF  
ns  
ns  
SW going LOW to GL going HIGH,  
2.2V SW to 10% GL  
tD_DEADOFF HS to LS Deadband Time  
12  
9
ns  
ns  
ns  
PWM-HIGH Propagation  
PWM going HIGH to GL going LOW,  
tPD_PHGLL  
Delay  
25  
VIH_PWM to 90% GL  
Exiting 3-State Propagation PWM (from 3-State) going LOW to GL  
tPD_TSGLH  
20  
Delay  
going HIGH, VIL_PWM to 10% GL  
Boot Diode  
VF  
VR  
Forward-Voltage Drop  
Breakdown Voltage  
IF=10mA  
IR=1mA  
0.35  
V
V
22  
© 2011 Fairchild Semiconductor Corporation  
FDMF6705B • Rev. 1.0.2  
www.fairchildsemi.com  
6
V IH_PWM  
VIL_PWM  
PWM  
GL  
90%  
1.0V  
10%  
90%  
GH  
to  
VSWH  
1.2V  
10%  
tD_TIMEOUT  
(250ns Timeout)  
2.2V  
VSWH  
tPD PLGHL  
tPD PHGLL  
tD_DEADOFF  
tD_DEADON  
Figure 5. PWM Timing Diagram  
© 2011 Fairchild Semiconductor Corporation  
FDMF6705B • Rev. 1.0.2  
www.fairchildsemi.com  
7
Typical Performance Characteristics  
Test Conditions: VIN=12V, VOUT=1.0V, VCIN=5V, VDRV=5V, LOUT=320nH, TA=25°C, and natural convection cooling,  
unless otherwise specified.  
11  
10  
9
45  
40  
35  
30  
25  
20  
15  
10  
5
VIN = 12V, VOUT = 1V  
300kHz  
500kHZ  
800kHz  
1MHz  
fSW = 300kHz  
8
7
6
fSW = 1MHz  
5
4
3
2
VIN = 12V, VOUT = 1.0V  
JPCB = 3.5°C/W  
1
Θ
0
0
0
5
10  
15  
20  
25  
30  
35  
40  
0
25  
50  
75  
100  
125  
150  
PCB Temperature (°C)  
Output Current, IOUT (A)  
Figure 6. Safe Operating Area  
Figure 7. Module Power Loss vs. Output Current  
12  
11  
10  
9
9
VIN = 19V, VOUT = 1V  
300kHz  
500kHz  
800kHz  
1MHz  
Vin = 19V, Iout = 30A  
8
Vin = 12V, Iout = 30A  
7
Vin = 19V, Iout = 20A  
8
Vin = 12V, Iout = 20A  
6
5
4
3
2
1
7
6
5
4
3
2
1
0
200  
300  
400  
500  
600  
700  
800  
900  
1000  
0
5
10  
15  
20  
25  
30  
35  
40  
Module Switching Frequency, fSW (kHz)  
Output Current, IOUT (A)  
Figure 8. Module Power Loss vs. Output Current  
Figure 9. Module Power Loss vs. Switching  
Frequency  
1.20  
1.15  
IOUT = 30A, fSW = 300kHz  
VIN = 12V, IOUT = 30A, fSW = 300kHz  
1.15  
1.10  
1.05  
1.00  
0.95  
1.10  
1.05  
1.00  
0.95  
0.90  
4.50  
4.75  
5.00  
5.25  
5.50  
4
6
8
10  
12  
14  
16  
18  
20  
Driver Supply Voltage, VDRV and VCIN (V)  
Module Input Voltage, VIN (V)  
Figure 10. Normalized Power Loss vs. Input Voltage  
Figure 11. Normalized Power Loss vs. Driver  
Supply Voltage  
© 2011 Fairchild Semiconductor Corporation  
FDMF6705B • Rev. 1.0.2  
www.fairchildsemi.com  
8
Typical Performance Characteristics (Continued)  
Test Conditions: VIN=12V, VOUT=1.0V, VCIN=5V, VDRV=5V, LOUT=320nH, TA=25°C, and natural convection cooling,  
unless otherwise specified.  
1.9  
1.7  
1.5  
1.3  
1.1  
0.9  
1.05  
1.04  
1.03  
1.02  
1.01  
1.00  
0.99  
0.98  
VIN = 12V, IOUT = 30A, fSW = 300kHz  
VIN = 12V, IOUT = 30A, fSW = 300kHz  
225  
275  
325  
375  
425  
0.5  
1.0  
1.5  
2.0  
2.5  
3.0  
3.5  
Output Inductance, LOUT (nH)  
Output Voltage, VOUT (V)  
Figure 12. Normalized Power Loss vs.  
Output Voltage  
Figure 13. Module Power Loss vs.  
Output Inductance  
34  
30  
26  
22  
18  
14  
10  
6
12  
11  
10  
9
VIN = 12V, IOUT = 0A, fSW = 300kHz  
VIN = 12V, IOUT = 0A, fSW = 300kHz  
4.5  
4.75  
5
5.25  
5.5  
200  
400  
600  
800  
1000  
Driver Supply Voltage, VDRV & VCIN (V)  
Module Switching Frequency, fSW (kHz)  
Figure 14. Driver Supply Current vs. Frequency  
Figure 15. Driver Supply Current vs. Driver  
Supply Voltage  
3.0  
1.10  
TA = 25°C  
300kHz  
1MHz  
2.5  
1.08  
VIH_PWM  
2.0  
1.06  
VTRI_HI  
VHiZ_PWM  
1.5  
1.0  
0.5  
0.0  
1.04  
1.02  
1.00  
0.98  
VTRI_LO  
VIL_PWM  
0
5
10  
15  
20  
25  
30  
35  
40  
4.50  
4.75  
5.00  
5.25  
5.50  
Module Output Current, IOUT (A)  
Driver Supply Voltage, VCIN (V)  
Figure 16. Normalized Driver Supply Current vs.  
Output Current  
Figure 17. PWM Thresholds vs. Driver  
Supply Voltage  
© 2011 Fairchild Semiconductor Corporation  
FDMF6705B • Rev. 1.0.2  
www.fairchildsemi.com  
9
Typical Performance Characteristics (Continued)  
Test Conditions: VIN=12V, VOUT=1.0V, VCIN=5V, VDRV=5V, LOUT=320nH, TA=25°C, and natural convection cooling,  
unless otherwise specified.  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
2.2  
2.0  
1.8  
1.6  
1.4  
1.2  
VCIN = 5V  
TA = 25°C  
VIH_PWM  
VTRI_HI  
VIH_SMOD  
VTRI_LO  
VIL_SMOD  
VIL_PWM  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
4.50  
4.75  
5.00  
5.25  
5.50  
Driver IC Junction Temperature, TJ (oC)  
Driver Supply Voltage, VCIN (V)  
Figure 18. PWM Thresholds vs. Temperature  
Figure 19. SMOD# Thresholds vs. Driver Supply  
Voltage  
2.0  
-9.0  
VCIN = 5V  
VCIN = 5V  
1.9  
-9.5  
-10.0  
-10.5  
-11.0  
-11.5  
-12.0  
1.8  
VIH_SMOD  
1.7  
1.6  
VIL_SMOD  
1.5  
1.4  
1.3  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
Driver IC Junction Temperature (oC)  
Driver IC Junction Temperature, TJ (oC)  
Figure 20. SMOD# Thresholds vs. Temperature  
Figure 21. SMOD# Pull-Up Current vs. Temperature  
2.1  
2.00  
TA = 25oC  
2.0  
VCIN = 5V  
1.90  
VIH_DISB  
1.9  
1.80  
VIH_DISB  
1.8  
1.7  
1.70  
VIL_DISB  
1.6  
1.60  
VIL_DISB  
1.5  
1.4  
1.3  
1.50  
1.40  
4.50  
4.75  
5.00  
5.25  
5.50  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
Driver Supply Voltage, VCIN (V)  
Driver IC Junction Temperature, TJ (°C)  
Figure 22. DISB# Thresholds vs. Driver  
Supply Voltage  
Figure 23. DISB# Thresholds vs. Temperature  
© 2011 Fairchild Semiconductor Corporation  
FDMF6705B • Rev. 1.0.2  
www.fairchildsemi.com  
10  
Typical Performance Characteristics (Continued)  
Test Conditions: VIN=12V, VOUT=1.0V, VCIN=5V, VDRV=5V, LOUT=320nH, TA=25°C, and natural convection cooling,  
unless otherwise specified.  
11.5  
VCIN = 5V  
11.0  
IPLD  
10.5  
10.0  
9.5  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
Driver IC Junction Temperature, TJ (°C)  
Figure 24. DISB# Pull-Down Current vs. Temperature  
© 2011 Fairchild Semiconductor Corporation  
FDMF6705B • Rev. 1.0.2  
www.fairchildsemi.com  
11  
Functional Description  
The FDMF6705B is a driver-plus-FET module optimized  
for the synchronous buck converter topology. A single  
PWM input signal is all that is required to properly drive  
the high-side and the low-side MOSFETs. Each part is  
capable of driving speeds up to 1MHz.  
3-State PWM Input  
The FDMF6705B incorporates a three-state PWM input  
gate drive design. The three-state gate drive has both  
logic HIGH level and LOW level, along with a three-state  
shutdown window. When the PWM input signal enters  
and remains within the three-state window for a defined  
hold-off time (tD_HOLD-OFF), both GL and GH are pulled  
LOW. This feature enables the gate drive to shut down  
both high-and low-side MOSFETs to support features  
such as phase shedding, which is a common feature on  
multiphase voltage regulators.  
VCIN and Disable  
The VCIN pin is monitored by an Under-Voltage Lockout  
(UVLO) circuit. When VCIN rises above ~3.1V, the driver  
is enabled. When VCIN falls below ~2.7V, the driver is  
disabled (GH, GL=0). The driver can also be disabled by  
pulling the DISB# pin LOW (DISB# < VIL_DISB), which  
holds both GL and GH LOW regardless of the PWM  
input state. The driver can be enabled by raising the  
DISB# pin voltage HIGH (DISB# > VIH_DISB).  
Operation when Exiting Three-State  
Condition  
When exiting  
a
valid three-state condition, the  
FDMF6705B design follows the PWM input command. If  
the PWM input goes from three-state to LOW, the low-  
side MOSFET is turned on. If the PWM input goes from  
three-state to HIGH, the high-side MOSFET is turned  
on. This is illustrated in Figure 26. The FDMF6705B  
design allows for short propagation delays when exiting  
the three-state window (see Electrical Characteristics).  
Table 1. UVLO and Disable Logic  
UVLO DISB#  
Driver State  
0
X
0
Disabled (GH, GL=0)  
Disabled (GH, GL=0)  
Enabled (See Table 2)  
Disabled (GH, GL=0)  
1
1
1
Low-Side Driver  
1
Open  
The low-side driver (GL) is designed to drive a ground-  
referenced low RDS(ON) N-channel MOSFET. The bias  
for GL is internally connected between VDRV and  
CGND. When the driver is enabled, the driver's output is  
180° out of phase with the PWM input. When the driver  
is disabled (DISB#=0V), GL is held LOW.  
Note:  
3. DISB# internal pull-down current source is 10µA.  
Thermal Warning Flag  
The FDMF6705B provides a thermal warning flag  
(THWN) to warn of over-temperature conditions. The  
thermal warning flag uses an open-drain output that  
pulls to CGND when the activation temperature (150°C)  
is reached. The THWN output returns to a high-  
impedance state once the temperature falls to the reset  
temperature (135°C). The THWN output requires a pull-  
up resistor, which can be connected to VCIN. THWN  
does NOT disable the DrMOS module.  
High-Side Driver  
The high-side driver is designed to drive a floating N-  
channel MOSFET. The bias voltage for the high-side  
driver is developed by a bootstrap supply circuit,  
consisting of the internal Schottky diode and external  
bootstrap capacitor (CBOOT). During startup, VSWH is  
held at PGND, allowing CBOOT to charge to VDRV  
through the internal diode. When the PWM input goes  
HIGH, GH begins to charge the gate of the high-side  
MOSFET (Q1). During this transition, the charge is  
removed from CBOOT and delivered to the gate of Q1. As  
Q1 turns on, VSWH rises to VIN, forcing the BOOT pin to  
VIN + VBOOT, which provides sufficient VGS enhancement  
for Q1. To complete the switching cycle, Q1 is turned off  
by pulling GH to VSWH. CBOOT is then recharged to  
VDRV when VSWH falls to PGND. GH output is in-  
phase with the PWM input. The high-side gate is held  
LOW when the driver is disabled or the PWM signal is  
held within the three-state window for longer than the  
150°C  
Activation  
Temperature  
135°C  
Reset  
HIGH  
THWN  
Logic  
State  
Normal  
Operation  
Thermal  
Warning  
LOW  
TJ_driverIC  
Figure 25. THWN Operation  
three-state hold-off time, tD_HOLD-OFF  
.
© 2011 Fairchild Semiconductor Corporation  
FDMF6705B • Rev. 1.0.2  
www.fairchildsemi.com  
12  
Adaptive Gate Drive Circuit  
The driver IC advanced design ensures minimum  
MOSFET dead time, while eliminating potential shoot-  
through (cross-conduction) currents. It senses the state  
of the MOSFETs and adjusts the gate drive adaptively  
to ensure they do not conduct simultaneously. Figure 26  
provides the relevant timing waveforms. To prevent  
overlap during the LOW-to-HIGH switching transition  
(Q2 off to Q1 on), the adaptive circuitry monitors the  
voltage at the GL pin. When the PWM signal goes  
HIGH, Q2 turns off after a propagation delay (tPD_PHGLL).  
Once the GL pin is discharged below ~1V, Q1 turns on  
To preclude overlap during the HIGH-to-LOW transition  
(Q1 off to Q2 on), the adaptive circuitry monitors the  
voltage at the VSWH pin. When the PWM signal goes  
LOW, Q1 turns off after a propagation delay (tPD_PLGHL).  
Once the VSWH pin falls below ~2.2V, Q2 turns on after  
adaptive delay, tD_DEADOFF  
. Additionally, VGS(Q1) is  
monitored. When VGS(Q1) is discharged below ~1.2V, a  
secondary adaptive delay is initiated, which results in  
Q2 being driven on after tD_TIMEOUT, regardless of SW  
state. This function is implemented to ensure CBOOT is  
recharged each switching cycle in the event that the SW  
voltage does not fall below the 2.2V adaptive threshold.  
after adaptive delay, tD_DEADON  
.
Secondary delay tD_TIMEOUT is longer than tD_DEADOFF  
.
VIH_PWM  
VIH_PWM  
VIH_PWM  
VIH  
VTRI_HI  
PWM  
VTRI_HI  
VTRI_LO  
VIL_PWM  
IL_PWM  
V
tR_GH  
tF_GH  
PWM  
less than  
tD_HOLD  
90%  
10%  
tD_HOLD -  
OFF  
OFF  
-
GH  
to  
VSWH  
VIN  
DCM  
CCM  
DCM  
VOUT  
2.2V  
VSWH  
GL  
90%  
90%  
10%  
1.0V  
10%  
tPD_PLGHL  
tPD_PHGLL  
tD_DEADON  
less than  
tD_HOLD  
tF_GL  
tR_GL  
tPD_TSGHH  
tD_HOLD  
tPD_TSGHH tD_HOLD -OFF  
-OFF tPD_TSGLH  
OFF  
-
tD_DEADOFF  
Exit  
3 S t a t e  
Enter  
3-State  
Enter  
Enter  
3 -State  
Exit  
3-State  
Exit  
3-State  
3 -State  
Notes:  
PD_xxx = propagation delay from external signal (PWM, SMOD#, etc.) to IC generated signal.  
tD_xxx = delay from IC generated signal to IC generated signal. Example (tD_DEADON – LS VGS (GL) LOW to HS VGS (GH) HIGH)  
t
Example (tPD_PHGLL – PWM going HIGH to LS VGS (GL) going LOW)  
PWM  
PD_PHGLL = PWM rise to LS VGS fall, VIH_PWM to 90% LS VGS  
tPD_PLGHL = PWM fall to HS VGS fall, VIL_PWM to 90% HS VGS  
PD_PHGHH = PWM rise to HS VGS rise, VIH_PWM to 10% HS VGS (SMOD# held LOW)  
Exiting 3-state  
t
tPD_TSGHH = PWM 3-state to HIGH to HS VGS rise, VIH_PWM to 10% HS VGS  
tPD_TSGLH = PWM 3-state to LOW to LS VGS rise, VIL_PWM to 10% LS VGS  
t
SMOD#  
Dead Times  
tPD_SLGLL = SMOD# fall to LS VGS fall, VIL_SMOD to 90% LS VGS  
tPD_SHGLH = SMOD# rise to LS VGS rise, VIH_SMOD to 10% LS VGS  
tD_DEADON = LS VGS fall to HS VGS rise, LS-comp trip value (~1.0V GL) to 10% HS VGS  
tD_DEADOFF = VSWH fall to LS VGS rise, SW-comp trip value (~2.2V VSWH) to 10% LS VGS  
Figure 26. PWM and 3-StateTiming Diagram  
© 2011 Fairchild Semiconductor Corporation  
FDMF6705B • Rev. 1.0.2  
www.fairchildsemi.com  
13  
Skip Mode (SMOD)  
The SMOD function allows higher converter efficiency  
under light-load conditions. During SMOD, the low-side  
FET gate signal is disabled (held LOW), preventing  
discharging of the output capacitors as the filter inductor  
current attempts reverse current flow – also known as  
Diode Emulation Mode. When the SMOD# pin is pulled  
HIGH, the synchronous buck converter works in  
Synchronous Mode, gating on the low-side FET. When  
the SMOD# pin is pulled LOW, the low-side FET is  
gated off. The SMOD# pin is connected to the PWM  
controller, which enables or disables SMOD  
automatically when the controller detects light-load  
condition from output current sensing. Normally this pin  
is active LOW. See Figure 27 for timing delays.  
Table 2. SMOD Logic  
DISB#  
PWM  
SMOD#  
GH  
0
GL  
0
0
1
1
1
1
1
X
X
X
0
0
1
1
3-State  
0
0
0
1
0
1
0
0
1
0
0
1
1
0
Note:  
4. The SMOD feature is intended to have low  
propagation delay between the SMOD signal and  
the low-side FET VGS response time to control  
diode emulation on a cycle-by-cycle basis.  
SMOD#  
VIH_SMOD  
VIL_SMOD  
VIH_PWM  
VIH_PWM  
VIL_PWM  
PWM  
90%  
GH  
to  
VSWH  
10%  
10%  
DCM  
VOUT  
CCM  
CCM  
2.2V  
VSWH  
GL  
90%  
1.0V  
10%  
10%  
tPD_PLGHL  
tPD_PHGLL  
tPD_PHGHH  
tPD_SHGLH  
tPD_SLGLL  
tD_DEADOFF  
tD_DEADON  
Delay from SMOD# going  
LOW to LS VGS LOW  
Delay from SMOD# going  
HIGH to LS V HIGH  
GS  
HS turn -on with SMOD# LOW  
Figure 27. SMOD Timing Diagram  
© 2011 Fairchild Semiconductor Corporation  
FDMF6705B • Rev. 1.0.2  
www.fairchildsemi.com  
14  
Application Information  
Supply Capacitor Selection  
For the supply inputs (VDRV and VCIN), a local ceramic  
bypass capacitor is required to reduce noise and to  
supply peak transient currents during gate drive  
switching action. It is recommended to use a minimum  
capacitor value of 1µF X7R or X5R. Keep this capacitor  
close to the VCIN and VDRV pins and connect it to the  
GND plane with vias.  
VCIN Filter  
The VDRV pin provides power to the gate drive of the  
high-side and low-side power MOSFETs. In most cases,  
VDRV can be connected directly to VCIN, which  
supplies power to the logic circuitry of the gate driver.  
For additional noise immunity, an RC filter can be  
inserted between VDRV and VCIN. Recommended  
values of 10(RVCIN) placed between VDRV and VCIN  
and 1µF (CVCIN) from VCIN to CGND, Figure 28.  
Bootstrap Circuit  
Power Loss and Efficiency  
The bootstrap circuit uses a charge storage capacitor  
(CBOOT), as shown in Figure 28. A bootstrap capacitance  
of 100nF X7R or X5R capacitor is typically adequate. A  
series bootstrap resistor may be needed for specific  
applications to improve switching noise immunity. The  
boot resistor (RBOOT) may be required when operating  
near the maximum rated VIN and is effective at  
controlling the high-side MOSFET turn-on slew rate and  
VSHW overshoot. Typical RBOOT values from 0.5 to 3.0Ω  
are effective in reducing VSWH overshoot.  
Measurement and Calculation  
Refer to Figure 29 for power-loss testing method. Power  
loss calculations are:  
(1)  
PIN=(VIN x IIN) + (V5V x I5V) (W)  
SW=VSW x IOUT (W)  
POUT=VOUT x IOUT (W)  
LOSS_MODULE=PIN - PSW (W)  
P
(2)  
(3)  
(4)  
(5)  
(6)  
(7)  
P
PLOSS_BOARD=PIN - POUT (W)  
EFFMODULE=100 x PSW/PIN (%)  
EFFBOARD=100 x POUT/PIN (%)  
V5V  
VIN  
A
A
RV  
CIN  
I5V  
IIN  
CVIN  
CVDRV  
CV  
CIN  
VDRV  
VCIN  
VIN  
DISB#  
DISB#  
RBOOT  
PWM  
Input  
OFF  
BOOT  
PWM  
FDMF6705B  
CBOOT  
VSWH  
OUT  
I
SMOD#  
ON  
A
LOUT  
Open-  
Drain  
PHASE  
THWN  
VOUT  
Output  
V VSW  
CGND  
PGND  
COUT  
Figure 28. Block Diagram with VCIN Filter  
V5V  
A
A
V
IN  
I5V  
IIN  
CVDRV  
CVIN  
VDRV  
VCIN  
VIN  
DISB#  
DISB#  
RBOOT  
BOOT  
VSWH  
PWM  
Input  
OFF  
PWM  
FDMF6705B  
CBOOT  
IOUT  
SMOD  
ON  
A
LOUT  
Open-  
Drain  
PHASE  
THWN#  
Output  
V VSW  
CGND  
PGND  
COUT  
Figure 29. Power Loss Measurement  
© 2011 Fairchild Semiconductor Corporation  
FDMF6705B • Rev. 1.0.2  
www.fairchildsemi.com  
15  
PCB Layout Guidelines  
Figure 30 provides an example of a proper layout for  
critical components. All of the high-current paths, such  
as VIN, VSWH, VOUT, and GND copper, should be short  
and wide for low inductance and resistance. This  
technique achieves a more stable and evenly distributed  
current flow, along with enhanced heat radiation and  
system performance.  
BOOT-to-VSWH loop size, including RBOOT and  
BOOT, should be as small as possible. The boot  
C
resistor may be required when operating near the  
maximum rated VIN. The boot resistor is effective at  
controlling the high-side MOSFET turn-on slew rate  
and VSHW overshoot. RBOOT can improve noise  
operating margin in synchronous buck designs that  
have noise issues due to ground bounce or high  
positive and negative VSWH ringing. However,  
inserting a boot resistance lowers the DrMOS  
efficiency. Efficiency versus noise trade-offs must be  
considered. RBOOT values from 0.5 to 3.0Ω are  
typically effective in reducing VSWH overshoot.  
The following guidelines are recommendations for the  
PCB designer:  
1. Input ceramic bypass capacitors must be placed  
close to the VIN and PGND pins. This helps reduce  
the high-current power loop inductance and the input  
current ripple induced by the power MOSFET  
switching operation.  
The VIN and PGND pins handle large current  
transients with frequency components greater than  
100MHz. If possible, these pins should be connected  
directly to the VIN and board GND planes. The use  
of thermal relief traces in series with these pins is  
discouraged since this adds inductance to the  
power path. This added inductance in series with  
either the VIN or PGND pin degrades system noise  
immunity by increasing positive and negative VSWH  
ringing.  
2. The VSWH copper trace serves two purposes. In  
addition to being the high-frequency current path  
from the DrMOS package to the output inductor, it  
also serves as a heat sink for the low-side MOSFET  
in the DrMOS package. The trace should be short  
and wide enough to present a low-impedance path  
for the high-frequency, high-current flow between the  
DrMOS and inductor to minimize losses and  
temperature rise. Note that the VSWH node is a  
high-voltage and high-frequency switching node with  
high noise potential. Care should be taken to  
minimize coupling to adjacent traces. Since this  
copper trace also acts as a heat sink for the lower  
FET, balance using the largest area possible to  
8. CGND pad and PGND pins should be connected to  
the GND plane copper with multiple vias for stable  
grounding. Poor grounding can create a noise  
transient offset voltage level between CGND and  
PGND. This could lead to faulty operation of the  
gate driver and MOSFETs.  
improve  
DrMOS  
cooling  
while  
maintaining  
acceptable noise emission.  
9. Ringing at the BOOT pin is most effectively  
controlled by close placement of the boot capacitor.  
Do not add an additional BOOT to the PGND  
capacitor. This may lead to excess current flow  
through the BOOT diode.  
3. An output inductor should be located close to the  
FDMF6705B to minimize the power loss due to the  
VSWH copper trace. Care should also be taken so  
the inductor dissipation does not heat the DrMOS.  
10. The SMOD# and DISB# pins have weak internal  
pull-up and pull-down current sources, respectively.  
These pins should not have any noise filter  
capacitors. Do not to float these pins unless  
absolutely necessary.  
4. PowerTrench® MOSFETs are used in the output  
stage. The power MOSFETs are effective at  
minimizing ringing due to fast switching. In most  
cases, no VSWH snubber is required. If a snubber is  
used, it should be placed close to the VSWH and  
PGND pins. The resistor and capacitor need to be of  
proper size for the power dissipation.  
11. Use multiple vias on each copper area to  
interconnect top, inner, and bottom layers to help  
distribute current flow and heat conduction. Vias  
should be relatively large and of reasonably low  
inductance. Critical high-frequency components,  
such as RBOOT, CBOOT, the RC snubber, and bypass  
capacitors should be located as close to the  
respective DrMOS module pins as possible on the  
top layer of the PCB. If this is not feasible, they  
should be connected from the backside through a  
network of low-inductance vias.  
5. VCIN, VDRV, and BOOT capacitors should be  
placed as close as possible to the VCIN to CGND,  
VDRV to CGND, and BOOT to PHASE pins to  
ensure clean and stable power. Routing width and  
length should be considered.  
6. Include a trace from PHASE to VSWH to improve  
noise margin. Keep the trace as short as possible.  
7. The layout should include a place holder to insert a  
small-value series boot resistor (RBOOT) between the  
boot capacitor (CBOOT) and DrMOS BOOT pin. The  
© 2011 Fairchild Semiconductor Corporation  
FDMF6705B • Rev. 1.0.2  
www.fairchildsemi.com  
16  
Top View  
Bottom View  
Figure 30. PCB Layout Example  
© 2011 Fairchild Semiconductor Corporation  
FDMF6705B • Rev. 1.0.2  
www.fairchildsemi.com  
17  
Physical Dimensions  
B
PIN#1  
0.10 C  
2X  
INDICATOR  
6.00  
5.80  
4.50  
A
30  
21  
31  
20  
11  
6.00  
2.50  
1.60  
0.40  
0.65  
0.25  
0.10 C  
40  
2X  
1
0.50 TYP  
10  
TOP VIEW  
0.60  
0.35  
SEE  
DETAIL 'A'  
0.15  
2.10  
2.10  
LAND PATTERN  
RECOMMENDATION  
FRONT VIEW  
4.40±0.10  
(2.20)  
0.10  
0.05  
C A B  
C
0.30  
0.40  
(40X)  
0.20  
31  
21  
30  
20  
(0.70)  
0.50  
2.40±0.10  
0.20  
PIN #1 INDICATOR  
0.50  
1.50±0.10  
40  
(40X)  
0.30  
11  
10  
1
0.40  
2.00±0.10  
0.50  
(0.20)  
2.00±0.10  
(0.20)  
NOTES: UNLESS OTHERWISE SPECIFIED  
BOTTOM VIEW  
A) DOES NOT FULLY CONFORM TO JEDEC  
REGISTRATION MO-220, DATED  
MAY/2005.  
B) ALL DIMENSIONS ARE IN MILLIMETERS.  
C) DIMENSIONS DO NOT INCLUDE BURRS  
OR MOLD FLASH. MOLD FLASH OR  
BURRS DOES NOT EXCEED 0.10MM.  
D) DIMENSIONING AND TOLERANCING PER  
ASME Y14.5M-1994.  
1.10  
0.90  
0.10 C  
0.08 C  
0.30  
0.20  
0.05  
0.00  
E) DRAWING FILE NAME: PQFN40AREV2  
C
SEATING  
PLANE  
DETAIL 'A'  
SCALE: 2:1  
Figure 31. 40-Lead, Clipbond PQFN DrMOS, 6.0x6.0mm Package  
Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner  
without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or  
obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specifically the  
warranty therein, which covers Fairchild products.  
Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:  
http://www.fairchildsemi.com/packaging/.  
© 2011 Fairchild Semiconductor Corporation  
FDMF6705B • Rev. 1.0.2  
www.fairchildsemi.com  
18  
© 2011 Fairchild Semiconductor Corporation  
FDMF6705B • Rev. 1.0.2  
www.fairchildsemi.com  
19  

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